TW201350875A - Vibration-testing apparatus for circuit - Google Patents

Vibration-testing apparatus for circuit Download PDF

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TW201350875A
TW201350875A TW101120026A TW101120026A TW201350875A TW 201350875 A TW201350875 A TW 201350875A TW 101120026 A TW101120026 A TW 101120026A TW 101120026 A TW101120026 A TW 101120026A TW 201350875 A TW201350875 A TW 201350875A
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tested
circuit
vibration
connection module
value
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TW101120026A
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Chinese (zh)
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TWI453431B (en
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Gwun-Jin Lin
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Adv Flexible Circuits Co Ltd
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  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

A circuit testing device comprises one or more connection modules which are provided with one or more lead wire terminals or connectors, with each lead wire terminal or connector having one or more connection terminals; a tested object is electrically connected with the connection modules by a lead wire terminal or connector or a plurality of lead wire terminals or connectors for performing circuit measurement, such as current, voltage, or resistance, and determining whether there is an open circuit or short circuit or whether component soldering is good; and a poking device or a vibration platform produces an intermittent force or vibration to the tested object to allow it to generate intermittent reciprocating vibration or bending deformation. Therefore, this invention can effectively find out circuit defects of the tested object during a circuit measurement.

Description

電路測試震動裝置 Circuit test vibration device

本發明係為一種電路測試裝置,尤指一種用於測試電子元件之訊號線路是否有短、斷路之測試裝置。 The invention relates to a circuit testing device, in particular to a testing device for testing whether a signal line of an electronic component has a short or broken circuit.

目前在電子裝置中已廣泛地採行多種模組的組合來實現各種功能的應用,而各個模組之間則是藉由各種訊號線路與主機板連接,以達到各種資料訊號的相互傳遞,而訊號線路包括了有軟性電路板、排線或纜線等等。 At present, a combination of various modules has been widely used in electronic devices to realize various functions, and each module is connected to a motherboard through various signal lines to achieve mutual transmission of various data signals. Signal lines include flexible boards, cables or cables.

鑑於訊號線路的品質在電子裝置的使用中佔有極為重要的角色,電子裝置中各電子元件及功能模組皆需要靠各種的訊號線路來維持訊號的傳遞及接收,當訊號線路因品管不良而有斷路或短路的情形時,則將造成電子裝置的功能部分或全部失效,因此為了確保訊號線路的功能運作正常,訊號線路皆會事先經由電性測試,以確保其訊號傳遞的品質為良好。 In view of the fact that the quality of the signal line plays an extremely important role in the use of electronic devices, the electronic components and functional modules in the electronic device need to rely on various signal lines to maintain the transmission and reception of signals, and the signal lines are poor due to poor quality control. In the case of a disconnection or short circuit, some or all of the functions of the electronic device will be invalidated. Therefore, in order to ensure the normal operation of the signal line, the signal line will be electrically tested beforehand to ensure that the quality of the signal transmission is good.

現有對於訊號線路的測試方式,則是設計藉由一組測試治具來進行測試,測試治具一般而言具有一組或多組連接介面,用以連接待測物,即訊號線路的至少一端,而由其中一組連接介面輸入電流後,使電流經由待測物後再回至另一連接介面或某一零件上,如IC或LED燈,藉此量測待測物的電阻值的變化,如量測結果有異常時,即表示待測物具有短、斷路等異常情形而必需被判定不良品,因而達到檢測的目的。 The existing test method for signal lines is designed to be tested by a set of test fixtures. Generally, the test fixture has one or more sets of connection interfaces for connecting the object to be tested, that is, at least one end of the signal line. After inputting current from one of the connection interfaces, the current is passed through the object to be tested and then returned to another connection interface or a part, such as an IC or an LED lamp, thereby measuring the resistance value of the object to be tested. If the measurement result is abnormal, it means that the object to be tested has an abnormal situation such as short or open circuit, and it is necessary to determine the defective product, thereby achieving the purpose of detection.

然而,目前的檢測方式僅僅是以固定的方式,固定待測物的兩端進行檢測,由於待測物同時亦具有多個傳輸導線,尤其是不良品易於在彎折的過程中造成傳輸導 線的斷裂而造成訊號線路有短、斷路的情形,現有的測試裝置並無法檢測待測物於彎折或形變的情況下,是否仍保持正常的通路狀態,從而有積極改進的必要。 However, the current detection method only fixes the two ends of the object to be tested in a fixed manner, and since the object to be tested also has a plurality of transmission wires at the same time, especially the defective product is easy to cause the transmission guide during the bending process. The breakage of the line causes the signal line to be short and open. The existing test device cannot detect whether the object under test is still in a normal path state under the condition of bending or deformation, so that there is a need for positive improvement.

因此為了能夠有效克服前述所提到的缺點,本發明提供一種可對待測物產生間歇性的施力或震動,使該待測物產生間歇性的往復震動或形變彎折的電路測試震動裝置。 Therefore, in order to effectively overcome the aforementioned drawbacks, the present invention provides a circuit test vibration device that generates intermittent force or vibration to the object to be tested, and causes the object to be tested to generate intermittent reciprocating vibration or deformation bending.

本發明的另一目的是提供一種可對待測物進行動態的電性測試,以檢測出待測物在動態時的電性測試。 Another object of the present invention is to provide a dynamic electrical test of a test object to detect an electrical test of the test object while it is dynamic.

本發明的另一目的是提供一種可對待測物進行靜態及動態的雙重測試,進而能提供更有效而全面性的檢測方式。 Another object of the present invention is to provide a static and dynamic double test of a testable object, thereby providing a more efficient and comprehensive detection method.

本發明揭露一種測試震動裝置,為簡化說明,僅以最常使用的兩個電連接端做為說明。其包括至少一連接模組,設有連接端,該第一連接端具有複數連接端子;一測試裝置藉由導線與該連接模組電連接,用以執行待測物之電路值之量測及判別線路是否有斷路或短路。一撥動裝置設置於該連接模組的一側邊鄰近位置處,對連接於該連接模組的待測物產生間歇性的施力,使該待測物產生間歇性的往復震動,或形變彎折。 The present invention discloses a test vibration device. For the sake of simplicity of explanation, only the two most commonly used electrical connections are used for illustration. The device includes at least one connection module, and is provided with a connection end. The first connection end has a plurality of connection terminals. A test device is electrically connected to the connection module by a wire to perform measurement of the circuit value of the object to be tested. Determine if the line has an open circuit or short circuit. A dialing device is disposed adjacent to one side of the connecting module, and intermittently applies a force to the object to be tested connected to the connecting module, so that the object to be tested generates intermittent reciprocating vibration or deformation Bend.

本發明所能增進之功效為:透過本發明的電路測試震動裝置,可對待測物進行動態的電性測試,如此可以達 到待測物的電路在一般習用靜態測試無法發現到的瑕疵。本發明也可以對待測物進行靜態及動態的雙重測試,進而能提供更有效而全面性的檢測方式。 The utility model can improve the effect of: testing the vibration device through the circuit of the invention, and performing dynamic electrical test on the object to be tested, so that the The circuit to the object under test is not found in the conventional static test. The invention can also perform static and dynamic double testing of the object to be tested, thereby providing a more effective and comprehensive detection method.

請參閱第1圖所示,為本發明第一實施例的立體圖。如圖所示,本發明的電路測試震動裝置包括有一第一連接模組10、一第二連接模組20、一測試裝置30及一撥動裝置40,其中第一連接模組10可具有至少一電路板12,並在電路板12上設有一第一連接端14,第一連接端14則具有複數連接端子(圖未示)。同樣地,第二連接模組20可具有至少一電路板22,電路板22上亦設有一第二連接端24,第二連接端24具有複數連接端子(圖未示),使得一待測物可以電連接於第一連接端14及第二連接端24之間以進行電性檢測。 Referring to Fig. 1, there is shown a perspective view of a first embodiment of the present invention. As shown in the figure, the circuit test vibration device of the present invention comprises a first connection module 10, a second connection module 20, a test device 30 and a toggle device 40, wherein the first connection module 10 can have at least A circuit board 12 is provided with a first connection end 14 on the circuit board 12, and the first connection end 14 has a plurality of connection terminals (not shown). Similarly, the second connection module 20 can have at least one circuit board 22, and the circuit board 22 is also provided with a second connection end 24, and the second connection end 24 has a plurality of connection terminals (not shown) for making a test object. It can be electrically connected between the first connection end 14 and the second connection end 24 for electrical detection.

測試裝置30分別藉由一第一導線32及一第二導線34與第一連接模組10及第二連接模組20電連接,用以執行待測物之電路值之量測及判別線路是否有斷路或短路,第一導線32及第二導線34則分別具有複數訊號線路(圖未示),且與第一連接端14及第二連接端24的複數端子相互對應連接。 The test device 30 is electrically connected to the first connection module 10 and the second connection module 20 by a first wire 32 and a second wire 34 for performing measurement of the circuit value of the object to be tested and determining whether the line is determined. The first wire 32 and the second wire 34 respectively have a plurality of signal lines (not shown), and are connected to the plurality of terminals of the first connection end 14 and the second connection end 24, respectively.

撥動裝置40設置於第一連接模組10及第二連接模組20之間的一側邊處,用於對連接於第一連接模組10及第二連接模組20之間的待測物產生一間歇性的撥動 力,使待測物產生間歇性的往復震動彎折或形變。撥動裝置40包括有一震動產生器42(如馬達)、一軸座44及一桿體46,其中震動產生器42具有一轉軸422,軸座44的一端係套設轉軸422上,軸座44的另一端則延伸有設置桿體46,使得桿體46保持水平延伸於第一連接模組10及第二連接模組20之間。 The dialing device 40 is disposed at a side between the first connection module 10 and the second connection module 20 for testing the connection between the first connection module 10 and the second connection module 20 Produce an intermittent shift The force causes the object to be tested to undergo intermittent reciprocating vibration bending or deformation. The slewing device 40 includes a vibration generator 42 (such as a motor), a shaft seat 44 and a rod body 46. The vibration generator 42 has a rotating shaft 422. One end of the shaft seat 44 is sleeved on the rotating shaft 422, and the shaft seat 44 is The other end is extended with a rod body 46 so that the rod body 46 is horizontally extended between the first connection module 10 and the second connection module 20.

另請同時參閱第2圖及第3圖所示,為本發明第一實施例進行檢測時的立體圖及側視圖。第一連接端14及第二連接端24之間是用以連接一待測物50,以便於對待測物50的電路進行電性的測試,其中待測物50具有複數導電線路,可以分別與第一連接端14及第二連接端24的連接端子逐一對應的呈一電連接。待測物50可選擇為一薄膜印刷電子排線、軟性扁平排線(FFC)、軟性印刷電路板(FPC)、電子線、鐵氟龍線、同軸電纜線、混合型線材、或其中兩種以上之組合線材之一。 Please also refer to FIGS. 2 and 3 for a perspective view and a side view of the first embodiment of the present invention. The first connecting end 14 and the second connecting end 24 are connected to a test object 50 for electrically testing the circuit of the object to be tested 50. The object to be tested 50 has a plurality of conductive lines, which can be respectively associated with The connection terminals of the first connection end 14 and the second connection end 24 are electrically connected one by one. The object to be tested 50 can be selected as a thin film printed electronic cable, a soft flat cable (FFC), a flexible printed circuit board (FPC), an electronic wire, a Teflon wire, a coaxial cable, a hybrid wire, or two of them. One of the above combinations of wires.

測試裝置30則是由第一導線32輸入電流,使得電流經由第一連接模組10、待測物50及第二連接模組20後,再透由第二導線34回至測試裝置30進行量測,測試裝置30則可藉此測量待測物50上每一條導電線路的電路值的變化,用以判別待測物50的線路是否有斷路或短路,由於該量測方式屬習知技術,於此不再細述。 The test device 30 inputs current from the first wire 32, so that the current passes through the first connection module 10, the object to be tested 50 and the second connection module 20, and then passes through the second wire 34 to the test device 30 for measurement. The test device 30 can thereby measure the change of the circuit value of each conductive line on the object to be tested 50 to determine whether the circuit of the object to be tested 50 has an open circuit or a short circuit, and the measurement method belongs to the prior art. It will not be described in detail here.

本發明的特點在於第一連接模組10及第二連接模組20之間的待測物50的一側邊鄰近位置處設有撥動裝置40,可用於對連接於第一連接模組10及第二連接模 組20之間的待測物50產生一間歇性的撥動力,使待測物50可以產生間歇性的往復彎折或形變,如第3圖所示,如此可達到使待測物50的導電線路在經由間歇性的往復彎折或形變的情況下進行檢測,便於待測物50在經由彎折或形變的情況下,可以更為確實地檢測出待測物50是否具有斷路或短路的情形。 The present invention is characterized in that a dialing device 40 is disposed adjacent to one side of the object to be tested 50 between the first connection module 10 and the second connection module 20, and can be used to connect to the first connection module 10 And second connection mode The object to be tested 50 between the groups 20 generates an intermittent driving force, so that the object to be tested 50 can generate intermittent reciprocating bending or deformation, as shown in FIG. 3, so that the conduction of the object to be tested 50 can be achieved. The line is detected in the case of intermittent reciprocating bending or deformation, so that the object to be tested 50 can more reliably detect whether the object to be tested 50 has an open or short circuit under the condition of bending or deformation. .

請同時參閱第4圖及第5圖所示,分別為本發明第二實施例的立體圖及進行檢測時的側視圖。如圖所示,相較於第一實施例,本發明的第二實施例中的相異點在於撥動裝置60的結構,第二實施例的撥動裝置60包括有一供氣源62及一導氣管64,其中供氣源62是可用於提供一高壓氣體之高壓氣體容器,導氣管64的一端連接於供氣源62,並延伸於第一連接模組10及第二連接模組20之間,並在導氣管64的另一端具有一噴氣口642朝向待測物50,又導氣管64上可另設置有一閥門66,可經由閥門66控制導氣管64內氣體流量,藉由上述的結構,當待測物50進行檢測時,撥動裝置60可藉由閥門66的控制,使得噴氣口642產生間歇性的高壓氣體朝向待測物50噴射,藉由高壓氣體直接噴射的壓力使得待測物50可以受力而產生往復性的震動彎曲或形變而達到檢測的效果。 Please refer to FIG. 4 and FIG. 5 simultaneously, which are respectively a perspective view of the second embodiment of the present invention and a side view when the detection is performed. As shown in the figure, the difference in the second embodiment of the present invention is the structure of the dialing device 60 compared to the first embodiment. The dialing device 60 of the second embodiment includes a gas supply source 62 and a The air supply pipe 64 is a high-pressure gas container that can be used to supply a high-pressure gas. One end of the air pipe 64 is connected to the air supply source 62 and extends to the first connection module 10 and the second connection module 20. At the other end of the air guiding tube 64, there is a jet port 642 facing the object to be tested 50. Further, a valve 66 can be disposed on the air guiding tube 64. The gas flow in the air guiding tube 64 can be controlled via the valve 66. When the object to be tested 50 is detected, the dialing device 60 can be controlled by the valve 66, so that the air outlet 642 generates intermittent high-pressure gas to be sprayed toward the object to be tested 50, and the pressure of the direct injection of the high-pressure gas makes the test object The object 50 can be subjected to a reciprocating vibration bending or deformation to achieve a detection effect.

第6圖為本發明第三實施例進行檢測時的側視圖。在此一實施例中,其包括有一承載平台70以及一平台震動機構72。當待測物50連結於第一連接模組10及 第二連接模組20之間之後,會置於承載平台70上。平台震動機構72可對承載平台70施加一水平震動方向I2或垂直震動方向I1的震動力,進而使待測物50產生間歇性的往復彎折或形變,再由測試裝置30對待測物50進行檢測。在本實施例之另一組立型態中,亦可將測試裝置30承置在該承載平台70上。 Fig. 6 is a side view showing the third embodiment of the present invention when it is detected. In this embodiment, it includes a carrying platform 70 and a platform shaking mechanism 72. When the object to be tested 50 is connected to the first connection module 10 and After being connected between the second connection modules 20, they are placed on the carrier platform 70. The platform vibration mechanism 72 can apply a vibration force of the horizontal vibration direction I2 or the vertical vibration direction I1 to the bearing platform 70, thereby causing the object 50 to be intermittently reciprocally bent or deformed, and then the test device 30 performs the object 50 to be tested. Detection. In another set of vertical forms of this embodiment, the test device 30 can also be mounted on the carrying platform 70.

在應用方面,本發明可用於執行軟性電路板、軟排標準線、電路板、電子線材模組等待測物之電路值之量測,而該電路值係可包括有電阻值、電壓值、電流值、高頻TDR阻抗值、反射值之一,也可以用於判定待測物之電路是否斷路或短路,亦可判別待測物上之零件接觸是否良好。電路值之量測可為電阻值並用以判別電路是否有缺失,如斷路式短路,亦可判別待測物上之零件(如LED燈)是否正常。 In terms of application, the present invention can be used to perform measurement of circuit values of a flexible circuit board, a soft discharge standard line, a circuit board, and an electronic wire module waiting for a measurement, and the circuit value can include a resistance value, a voltage value, and a current. One of the value, the high-frequency TDR impedance value, and the reflection value can also be used to determine whether the circuit of the object to be tested is open or short-circuited, and whether the contact of the parts on the object to be tested is good. The measurement of the circuit value can be a resistance value and can be used to determine whether the circuit is missing, such as a short circuit type, and can also determine whether the component (such as an LED lamp) on the object to be tested is normal.

由前述說明可知,本發明經由撥動裝置的設置提供了下列的優點: As can be seen from the foregoing description, the present invention provides the following advantages via the setting of the toggle device:

1.藉由撥動裝置對待測物施以間歇性的往復震動彎折或形變的外力,可測試待測物的電路在其它靜態測試無法發現到的瑕疵。 1. By using the toggle device to apply an intermittent reciprocating vibration bending or deformation external force, the circuit of the object to be tested can be tested for defects that cannot be found in other static tests.

2.可對待測物進行靜態或動態的雙重測試,進而能提供更有效而全面性的檢測方式。 2. The static or dynamic double test of the object to be tested can provide a more effective and comprehensive detection method.

綜上所陳,僅為本發明之較佳實施例而已,並非用以限定本發明;凡其他未脫離本發明所揭示之精神下而完成的等效修飾或置換,均應包含於後述申請專利範圍 內。 The invention is not intended to limit the invention, and other equivalent modifications or substitutions that are not departing from the spirit of the invention are intended to be included in the appended claims. range Inside.

10‧‧‧第一連接模組 10‧‧‧First connection module

12‧‧‧電路板 12‧‧‧ boards

14‧‧‧第一連接端 14‧‧‧First connection

20‧‧‧第二連接模組 20‧‧‧Second connection module

22‧‧‧電路板 22‧‧‧ Circuit board

24‧‧‧第二連接端 24‧‧‧second connection

30‧‧‧測試裝置 30‧‧‧Testing device

32‧‧‧第一導線 32‧‧‧First wire

34‧‧‧第二導線 34‧‧‧Second wire

40‧‧‧撥動裝置 40‧‧‧Toggle device

42‧‧‧震動產生器 42‧‧‧Vibration generator

422‧‧‧轉軸 422‧‧‧ shaft

44‧‧‧軸座 44‧‧‧ shaft seat

46‧‧‧桿體 46‧‧‧ rod body

50‧‧‧待測物 50‧‧‧Test object

60‧‧‧撥動裝置 60‧‧‧Toggle device

62‧‧‧供氣源 62‧‧‧ gas supply

64‧‧‧導氣管 64‧‧‧ air duct

642‧‧‧噴氣孔 642‧‧‧jet holes

66‧‧‧閥門 66‧‧‧ Valve

70‧‧‧承載平台 70‧‧‧Loading platform

72‧‧‧平台震動機構 72‧‧‧ platform vibration mechanism

I1‧‧‧水平震動方向 I1‧‧‧ horizontal vibration direction

I2‧‧‧垂直震動方向 I2‧‧‧Vertical vibration direction

第1圖為本發明第一實施例的立體圖。 Fig. 1 is a perspective view showing a first embodiment of the present invention.

第2圖為本發明第一實施例進行檢測時的立體圖。 Fig. 2 is a perspective view showing the first embodiment of the present invention when it is detected.

第3圖為本發明第一實施例進行檢測時的側視圖。 Fig. 3 is a side view showing the first embodiment of the present invention when it is detected.

第4圖為本發明第二實施例的立體圖。 Figure 4 is a perspective view of a second embodiment of the present invention.

第5圖為本發明第二實施例進行檢測時的側視圖。 Fig. 5 is a side view showing the second embodiment of the present invention when it is detected.

第6圖為本發明第三實施例進行檢測時的側視圖。 Fig. 6 is a side view showing the third embodiment of the present invention when it is detected.

10‧‧‧第一連接模組 10‧‧‧First connection module

12‧‧‧電路板 12‧‧‧ boards

14‧‧‧第一連接端 14‧‧‧First connection

20‧‧‧第二連接模組 20‧‧‧Second connection module

22‧‧‧電路板 22‧‧‧ Circuit board

24‧‧‧第二連接端 24‧‧‧second connection

30‧‧‧測試裝置 30‧‧‧Testing device

32‧‧‧第一導線 32‧‧‧First wire

34‧‧‧第二導線 34‧‧‧Second wire

40‧‧‧撥動裝置 40‧‧‧Toggle device

42‧‧‧震動產生器 42‧‧‧Vibration generator

422‧‧‧轉軸 422‧‧‧ shaft

44‧‧‧軸座 44‧‧‧ shaft seat

46‧‧‧桿體 46‧‧‧ rod body

50‧‧‧待測物 50‧‧‧Test object

Claims (13)

一種電路測試震動裝置,其包括:一第一連接模組,具有一第一連接端,一待測物連接於該第一連接端;一測試裝置,連接於該第一連接模組,用以執行該待測物之電路值之量測;以及一撥動裝置,對連接於該第一連接模組的該待測物產生間歇性的施力,使該待測物產生間歇性的往復震動或形變彎折。 A circuit test vibration device includes: a first connection module having a first connection end, a test object connected to the first connection end; a test device connected to the first connection module, Performing measurement of the circuit value of the object to be tested; and a dialing device for intermittently applying force to the object to be tested connected to the first connection module, so that the object to be tested generates intermittent reciprocating vibration Or deformation and bending. 如申請專利範圍第1項所述之電路測試震動裝置,其中在該撥動裝置包括有一震動產生器及一結合於該震動產生器的桿體,該桿體延伸於該待測物。 The circuit test vibration device of claim 1, wherein the toggle device comprises a vibration generator and a rod coupled to the vibration generator, the rod extending from the object to be tested. 如申請專利範圍第2項所述之電路測試震動裝置,其中在該震動產生器經由一軸座結合於該桿體。 The circuit test vibration device of claim 2, wherein the vibration generator is coupled to the shaft via a shaft seat. 如申請專利範圍第1項所述之電路測試震動裝置,其中在該撥動裝置包括一供氣源及一導氣管,該供氣源用於提供一高壓氣體,該導氣管的一端連接於該供氣源,並在該導氣管的另一端具有一噴氣口朝向該待測物。 The circuit test vibration device of claim 1, wherein the dialing device comprises a gas supply source and an air conduit for providing a high pressure gas, and one end of the air conduit is connected to the The air supply source has a jet port facing the object to be tested at the other end of the air duct. 如申請專利範圍第4項所述之電路測試震動裝置,其中該導氣管上設置有一閥門,經由該閥門控制該導氣管內氣體流量,使得該噴氣口產生間歇性的高壓氣體噴出。 The circuit testing vibration device of claim 4, wherein the air guiding tube is provided with a valve, and the gas flow in the air guiding tube is controlled through the valve, so that the air outlet generates intermittent high-pressure gas ejection. 如申請專利範圍第1項所述之電路測試震動裝置,其中該待測物係指薄膜印刷電子排線、軟性扁平排線(FFC)、軟性印刷電路板(FPC)、電子線、鐵氟龍線、同軸電纜線、 混合型線材、或其中兩種以上之組合線材之一。 The circuit test vibration device according to claim 1, wherein the object to be tested refers to a thin film printed electronic cable, a soft flat cable (FFC), a flexible printed circuit board (FPC), an electronic wire, and a Teflon. Wire, coaxial cable, One of a hybrid type of wire, or a combination of two or more of them. 如申請專利範圍第1項所述之電路測試震動裝置,其中該電路值包括有電阻值、電壓值、電流值、高頻TDR阻抗值、反射值之一。 The circuit test vibration device of claim 1, wherein the circuit value comprises one of a resistance value, a voltage value, a current value, a high frequency TDR impedance value, and a reflection value. 如申請專利範圍第1項所述之電路測試震動裝置,更包括有一第二連接模組,該第二連接模組具有一第二連接端,該待測物經由該第二連接端電連接於該第二連接模組。 The circuit test vibration device of claim 1, further comprising a second connection module, the second connection module having a second connection end, wherein the object to be tested is electrically connected to the second connection end The second connection module. 一種電路測試震動裝置,其包括:一承載平台;一第一連接模組,具有一第一連接端,一待測物連接於該第一連接端,且該第一連接模組及該待測物係承置在該承載平台上;一測試裝置,連接於該第一連接模組,用以執行該待測物之電路值之量測;一平台震動機構,連結於該承載平台,用以對該承載平台施加一震動力,使該待測物產生間歇性的往復震動或形變彎折。 A circuit test vibration device includes: a carrier platform; a first connection module having a first connection end, a test object connected to the first connection end, and the first connection module and the to-be-tested The system is mounted on the carrying platform; a test device is connected to the first connecting module for performing measurement of the circuit value of the object to be tested; and a platform vibration mechanism is coupled to the carrying platform for A vibration force is applied to the bearing platform to cause intermittent reciprocating vibration or deformation bending of the object to be tested. 如申請專利範圍第9項所述之電路測試震動裝置,其中該測試裝置亦承置在該承載平台上。 The circuit test vibration device of claim 9, wherein the test device is also mounted on the load bearing platform. 如申請專利範圍第9項所述之電路測試震動裝置,其中該待測物係指薄膜印刷電子排線、軟性扁平排線(FFC)、軟性印刷電路板(FPC)、電子線、鐵氟龍線、同軸電纜線、混合型線材、或其中兩種以上之組合線材之一。 The circuit test vibration device according to claim 9, wherein the object to be tested refers to a thin film printed electronic cable, a soft flat cable (FFC), a flexible printed circuit board (FPC), an electronic wire, and a Teflon. One of a wire, a coaxial cable, a hybrid wire, or a combination of two or more of them. 如申請專利範圍第9項所述之電路測試震動裝置,其中該電路值包括有電阻值、電壓值、電流值、高頻TDR阻抗值、反射值之一。 The circuit test vibration device of claim 9, wherein the circuit value comprises one of a resistance value, a voltage value, a current value, a high frequency TDR impedance value, and a reflection value. 如申請專利範圍第9項所述之電路測試震動裝置,更包括有一第二連接模組,該第二連接模組具有一第二連接端,該待測物經由該第二連接端電連接於該第二連接模組。 The circuit test vibration device of claim 9, further comprising a second connection module, the second connection module having a second connection end, wherein the object to be tested is electrically connected to the second connection end The second connection module.
TW101120026A 2012-06-04 2012-06-04 Circuit test vibration device TWI453431B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI575240B (en) * 2015-12-14 2017-03-21 I-Chin Motor Technology Co Ltd A wire test method
CN112484950A (en) * 2020-10-28 2021-03-12 苏州精实电子科技有限公司 Connector anti-vibration testing device and testing method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW508715B (en) * 2001-12-24 2002-11-01 Advanced Semiconductor Eng Test board for integrated circuit package structure and testing method
TWM268577U (en) * 2004-10-18 2005-06-21 Far East College Testing structure of shock counter
TWM404372U (en) * 2010-11-30 2011-05-21 Inventec Corp Apparatus for scuff testing

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI575240B (en) * 2015-12-14 2017-03-21 I-Chin Motor Technology Co Ltd A wire test method
CN112484950A (en) * 2020-10-28 2021-03-12 苏州精实电子科技有限公司 Connector anti-vibration testing device and testing method thereof
CN112484950B (en) * 2020-10-28 2023-05-26 苏州精实电子科技有限公司 Connector vibration resistance testing device and testing method thereof

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