TW201328818A - Glass plate-polishing device - Google Patents

Glass plate-polishing device Download PDF

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Publication number
TW201328818A
TW201328818A TW101145118A TW101145118A TW201328818A TW 201328818 A TW201328818 A TW 201328818A TW 101145118 A TW101145118 A TW 101145118A TW 101145118 A TW101145118 A TW 101145118A TW 201328818 A TW201328818 A TW 201328818A
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Taiwan
Prior art keywords
polishing
polishing pad
glass plate
hardness
density
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TW101145118A
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Chinese (zh)
Inventor
Tetsushi Yokoyama
Shotaro Watanabe
Tatsuhiko Kai
Yutaka Fukuhara
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Asahi Glass Co Ltd
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Publication of TW201328818A publication Critical patent/TW201328818A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials

Abstract

The invention provides a glass plate-polishing device. The polishing pad (26) used in the polishing device (10) of the invention is made of a soft polyurethane resin. Type A hardness is 80 or higher and density is 0.7 g/cm3 or higher. Furthermore, Type A hardness of the polishing pad (26) is 90 or less and density is 0.9 g/cm3 or less. As a result, the polishing device (10) according to the invention is able to polish a glass plate (G) using a polishing pad (26) provided with both a flattening ability and a scratch-reducing ability. Therefore, processing time can be shortened by the time that would be expended in a precision grinding process using a second polishing pad provided with only a scratch-reducing ability. Consequently, the polishing device (10) is able to significantly improve glass plate (G) polishing efficiency compared to conventional polishing devices.

Description

玻璃板之研磨裝置 Glass plate grinding device

本發明係關於一種玻璃板之研磨裝置。 The present invention relates to a polishing apparatus for a glass sheet.

於專利文獻1、2等中揭示有利用藉由使熔融玻璃流入熔融錫浴上而製造玻璃板之浮式法之玻璃板之製造裝置。又,自先前亦已知有將由浮式法製造之玻璃板研磨成液晶顯示器或電漿料顯示器等FPD(Flat Panel Display,平板顯示器)用玻璃基板之研磨裝置。 Patent Document Nos. 1, 2, and the like disclose a manufacturing apparatus for a glass plate using a floating method in which a glass plate is produced by flowing molten glass into a molten tin bath. Further, a polishing apparatus for polishing a glass plate manufactured by a floating method into a glass substrate for an FPD (Flat Panel Display) such as a liquid crystal display or an electric paste display has been known.

由浮式法製造之玻璃板係於其表面存在微小之凹凸或起伏(3~30 mm之間距,且最大高度為0.3 μm之起伏)、及劃痕,而此種微小之凹凸或起伏、及劃痕成為對圖像造成扭曲或色差之原因。因此,必需藉由研磨裝置來去除微小之凹凸或起伏、及劃痕。 The glass plate manufactured by the floating method has a slight unevenness or undulation (a distance of 3 to 30 mm and a maximum height of 0.3 μm) and scratches on the surface thereof, and such minute irregularities or undulations, and Scratches are the cause of distortion or chromatic aberration in the image. Therefore, it is necessary to remove minute irregularities or undulations and scratches by the grinding device.

專利文獻3中揭示之研磨裝置係將保持於玻璃保持構件上之玻璃板抵住安裝於壓盤上之研磨墊,並且使上述壓盤及玻璃保持構件相對地移動,從而去除玻璃板之微小之凹凸或起伏。 The polishing apparatus disclosed in Patent Document 3 holds the glass plate held on the glass holding member against the polishing pad attached to the pressure plate, and relatively moves the pressure plate and the glass holding member, thereby removing the minute glass plate. Bumps or undulations.

又,於專利文獻4中,揭示有如下技術:於玻璃板之研磨步驟中包括兩個步驟,且於前段之粗研磨步驟中使用硬度較高之(70~80度)樹脂製之研磨墊對玻璃板之表面進行平滑加工,其後,於後段之精密研磨步驟中使用硬度較低之(20度)樹脂製之研磨墊,將存在於玻璃板之表面之劃痕研磨去除。即,先前之玻璃板之研磨裝置係通常實施如下 處理,即,使用硬質樹脂之研磨墊,將玻璃板之微小之凹凸或起伏之去除後,藉由使用軟質樹脂之研磨墊而提昇研磨率,將上述劃痕去除。又,於專利文獻5中揭示有硬質樹脂之研磨墊包含胺基甲酸酯,且軟質樹脂之研磨墊包含發泡胺基甲酸酯之情況。 Further, Patent Document 4 discloses a technique of including two steps in the polishing step of the glass sheet, and using a polishing pad pair having a higher hardness (70 to 80 degrees) in the coarse grinding step of the preceding stage. The surface of the glass plate is subjected to smoothing processing, and thereafter, the polishing pad made of a resin having a low hardness (20 degrees) is used in the precision grinding step of the subsequent stage to remove the scratches existing on the surface of the glass plate. That is, the polishing apparatus of the prior glass plate is generally implemented as follows The treatment, that is, using a polishing pad of a hard resin, removes minute irregularities or undulations of the glass plate, and then removes the scratch by using a polishing pad of a soft resin to increase the polishing rate. Further, Patent Document 5 discloses that a polishing pad having a hard resin contains a urethane, and a polishing pad of a soft resin contains a foaming urethane.

先前技術文獻Prior technical literature 專利文獻Patent literature

專利文獻1:日本專利特開2008-239370號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2008-239370

專利文獻2:日本專利特開2009-46366號公報 Patent Document 2: Japanese Patent Laid-Open Publication No. 2009-46366

專利文獻3:WO 2007/020859號公報 Patent Document 3: WO 2007/020859

專利文獻4:日本專利特開平7-244947號公報 Patent Document 4: Japanese Patent Laid-Open No. Hei 7-244947

專利文獻5:日本專利特開2009-211782號公報 Patent Document 5: Japanese Patent Laid-Open Publication No. 2009-211782

然而,如先前之研磨裝置般,於使硬質樹脂之研磨墊具備平坦化能力,且使軟質樹脂之研磨墊具備抑制劃痕能力之情形時,即由兩個研磨墊分擔平坦化能力及抑制劃痕能力之情形時,軟質樹脂之研磨墊之劃痕去除所耗費之加工時間變長,故而存在研磨效率降低之類的問題。 However, as in the case of the prior art polishing apparatus, when the polishing pad of the hard resin is provided with a flattening ability and the polishing pad of the soft resin is provided with the ability to suppress the scratch, the polishing pad can share the flattening ability and suppress the stroke. In the case of the traceability, the processing time required for the scratch removal of the polishing pad of the soft resin becomes long, and there is a problem that the polishing efficiency is lowered.

本發明係鑒於上述情況而成者,其目的在於提供一種可提昇研磨效率之玻璃板之研磨裝置。 The present invention has been made in view of the above circumstances, and an object thereof is to provide a polishing apparatus for a glass sheet which can improve polishing efficiency.

本發明為達成上述目的,而提供一種玻璃板之研磨裝置,其係藉由樹脂製之研磨墊研磨玻璃板者,其特徵在 於:上述研磨墊之樹脂之密度為0.7 g/cm3以上,且參照ISO(International Organization for Standardization,國際標準組織)7619之A硬度為80以上。 In order to achieve the above object, the present invention provides a polishing apparatus for a glass sheet which is obtained by polishing a glass sheet by a polishing pad made of a resin, wherein the density of the resin of the polishing pad is 0.7 g/cm 3 or more, and The A hardness of the ISO (International Organization for Standardization) 7619 is 80 or more.

又,根據本發明,上述研磨墊之A硬度為90以下。 Further, according to the invention, the polishing pad has an A hardness of 90 or less.

進而,根據本發明,上述研磨墊之樹脂之密度為0.9 g/cm3以下。 Further, according to the invention, the density of the resin of the polishing pad is 0.9 g/cm 3 or less.

進而,又,根據本發明,上述樹脂較佳為聚胺基甲酸酯。 Further, according to the invention, the above resin is preferably a polyurethane.

於研磨墊進行之玻璃板研磨中,為發揮抑制劃痕能力,例如較佳為軟質樹脂之聚胺基甲酸酯,但為發揮平坦化能力,樹脂之A硬度必需為80以上。 In the glass plate polishing by the polishing pad, in order to exhibit the ability to suppress scratches, for example, a soft resin urethane is preferable, but in order to exhibit flatness, the A hardness of the resin must be 80 or more.

因此,本發明係藉由使用軟質樹脂作為研磨墊,且將該軟質樹脂之密度設為0.7 g/cm3以上,而使A硬度達到80以上。 Therefore, in the present invention, by using a soft resin as a polishing pad and setting the density of the soft resin to 0.7 g/cm 3 or more, the A hardness is 80 or more.

藉此,根據本發明,由於可藉由兼具平坦化能力及抑制劃痕能力之研磨墊來研磨玻璃板,故而,可縮短僅具備抑制劃痕能力之後段之研磨墊之精密研磨步驟中耗費之加工時間。由此,根據本發明之玻璃板之研磨裝置,可提昇研磨效率。 According to the present invention, since the glass sheet can be polished by the polishing pad having both the flattening ability and the scratch-reducing ability, it is possible to shorten the precision polishing step of the polishing pad having only the back portion capable of suppressing the scratching ability. Processing time. Thus, according to the polishing apparatus for a glass plate of the present invention, the polishing efficiency can be improved.

又,由於將上述樹脂之A硬度之上限值規定為90,故抑制劃痕能力更進一步提昇。於此情形時,上述樹脂之密度之上限值為0.9 g/cm3Further, since the upper limit of the A hardness of the resin is set to 90, the scratch resistance is further improved. In this case, the upper limit of the density of the above resin is 0.9 g/cm 3 .

再者,作為軟質樹脂但密度或A硬度之中至少一者超過上述上限值之研磨墊、以及樹脂之A硬度為80以上90以下 但密度未達0.7 g/cm3之研磨墊係藉由實驗而確認抑制劃痕能力低下。 Further, as the soft resin, at least one of the density and the A hardness exceeds the above upper limit, and the polishing pad having a resin having an A hardness of 80 or more and 90 or less but a density of not more than 0.7 g/cm 3 is used . The experiment confirmed that the ability to suppress scratches was low.

又,本發明係關於一種玻璃板,其係經上述研磨裝置研磨而成者,且於上述玻璃板之研磨面上,深度為0.1 μm以上、寬度為2 μm以上且長度為5 μm以上之劃痕為100個以下。 Further, the present invention relates to a glass plate which is obtained by polishing by the above-described polishing apparatus, and has a depth of 0.1 μm or more, a width of 2 μm or more, and a length of 5 μm or more on the polished surface of the glass plate. The mark is 100 or less.

進而,於上述玻璃板中,研磨前之研磨面之起伏高度為0.02 μm且起伏間距為P之玻璃板以1 μm之研磨量進行研磨時,將研磨後之研磨面之起伏高度設為H,則較佳為H/P為1.6×10-6以下。 Further, in the glass plate, when the glazed height of the polished surface before polishing is 0.02 μm and the glass plate having the undulation pitch of P is polished by a grinding amount of 1 μm, the undulation height of the polished surface after the polishing is set to H, Preferably, H/P is 1.6 × 10 -6 or less.

根據本發明之玻璃板之研磨裝置,由於可藉由兼具平坦化能力與抑制劃痕能力之研磨墊來研磨玻璃板,故而可提昇研磨效率。 According to the polishing apparatus for a glass sheet of the present invention, since the glass sheet can be polished by the polishing pad having both the flattening ability and the scratch resistance, the polishing efficiency can be improved.

以下,根據隨付圖式,詳細說明本發明之玻璃板之研磨裝置之較佳實施形態。 Hereinafter, preferred embodiments of the polishing apparatus for a glass sheet of the present invention will be described in detail based on the accompanying drawings.

圖1係表示實施形態之玻璃板之研磨裝置10的整體構成之立體圖。圖2係圖1所示之研磨裝置10之側視圖。 Fig. 1 is a perspective view showing the overall configuration of a polishing apparatus 10 for a glass sheet according to an embodiment. Figure 2 is a side elevational view of the polishing apparatus 10 of Figure 1.

該等圖所示之研磨裝置10係將藉由浮式法而製造之玻璃板G,且使用樹脂製之研磨墊26,將例如厚度為1.1 mm以下且1邊之長度為300 mm以上之矩形之玻璃板G之表面研磨成FPD用玻璃基板所需之平坦度。即,該研磨裝置10係對存在3~30 mm之間距且最大高度為0.3 μm之起伏之玻璃 板G的研磨面進行研磨,將該起伏之最大高度降低至0.05 μm以下,並且將劃痕研磨去除,藉此,製造最佳之玻璃板作為未對圖像造成扭曲或色差之FPD用玻璃基板之裝置。 The polishing apparatus 10 shown in the drawings is a glass plate G manufactured by a floating method, and a resin-made polishing pad 26 is used, for example, a rectangle having a thickness of 1.1 mm or less and a length of one side of 300 mm or more. The surface of the glass plate G is ground to a flatness required for the glass substrate for FPD. That is, the polishing apparatus 10 is a pair of undulating glass having a distance of 3 to 30 mm and a maximum height of 0.3 μm. The polished surface of the plate G is ground, the maximum height of the undulation is reduced to 0.05 μm or less, and the scratch is removed by grinding, thereby producing an optimum glass plate as a glass substrate for FPD which does not cause distortion or chromatic aberration to the image. Device.

再者,上述起伏之測定方法係JIS(Japanese Industrial Standard,日本工業標準)B0601:2001中記載之方法。 In addition, the measuring method of the said undulation is the method of JIS (Japanese Industrial Standard) B0601:2001.

又,用以使上述起伏之最大高度成為0.05 μm以下之研磨量係根據研磨墊26之硬度決定。由於研磨墊26之硬度越高,平坦化能力越高,故而若為上述研磨量,則至少可降低起伏之最大高度。又,作為研磨墊26之材料之樹脂單體之硬度越低,越可發揮抑制劃痕能力。關於研磨墊26於以下敍述。 Further, the amount of polishing for setting the maximum height of the undulation to 0.05 μm or less is determined according to the hardness of the polishing pad 26. The higher the hardness of the polishing pad 26, the higher the flattening ability. Therefore, if the polishing amount is the above, the maximum height of the undulation can be reduced. Moreover, the lower the hardness of the resin monomer which is the material of the polishing pad 26, the more the scratch resistance can be exhibited. The polishing pad 26 will be described below.

研磨裝置10係包含研磨頭12與壓盤14。研磨頭12係包含保持玻璃板G之非研磨面之玻璃保持構件16、介隔片材18安裝著玻璃保持構件16之玻璃保持壓盤20、及安裝有玻璃保持壓盤20之載具22。由載具22固定旋轉軸24,且藉由使旋轉軸24以作為其軸心之自轉軸P1為中心進行旋轉,而使研磨頭12進行自轉,並且藉由使旋轉軸24以公轉軸P2為中心進行公轉,而使研磨頭12進行自轉及公轉。 The polishing apparatus 10 includes a polishing head 12 and a platen 14. The polishing head 12 includes a glass holding member 16 that holds the non-abrasive surface of the glass sheet G, a glass holding platen 20 on which the glass holding member 16 is attached to the intervening sheet 18, and a carrier 22 on which the glass holding platen 20 is attached. The carrier 22 is fixed to the rotary shaft 24, and by the rotating shaft 24 as its axis of rotation axis P as the center. 1 rotates, the rotation of the polishing head 12, and by the rotary shaft 24 to the revolution axis P 2 is the center revolution, and the grinding head 12 is rotated and revolved.

又,載具22之空氣室23中,經由中空之旋轉軸24自氣泵(未圖示)供給壓縮空氣,且將該壓縮空氣之壓力經由玻璃保持壓盤20、片材18、及玻璃保持構件16傳遞至玻璃板G。 Further, in the air chamber 23 of the carrier 22, compressed air is supplied from an air pump (not shown) via a hollow rotating shaft 24, and the pressure of the compressed air is held by the glass holding platen 20, the sheet 18, and the glass holding member. 16 is transferred to the glass plate G.

壓盤14係包含研磨墊26、介隔片材28安裝有研磨墊26之 研磨墊保持壓盤30,且研磨墊26之表面與玻璃板G之研磨面對向。片材28係軟質且提昇吸附保持性之樹脂製(例如聚胺基甲酸酯製造)之片材。研磨墊保持壓盤30亦可在研磨墊26之表面之面內方向上擺動。 The platen 14 includes a polishing pad 26, and the spacer sheet 28 is mounted with a polishing pad 26. The polishing pad holds the platen 30, and the surface of the polishing pad 26 faces the grinding of the glass plate G. The sheet 28 is a sheet made of a resin (for example, made of a polyurethane) which is soft and has an adsorption-retaining property. The polishing pad holding platen 30 can also be swung in the in-plane direction of the surface of the polishing pad 26.

因此,實施形態之研磨裝置10係藉由上述壓縮空氣之壓力而以均勻之壓力將玻璃板G之研磨面擠壓至研磨墊26,並且藉由使研磨頭12進行自轉及公轉而對玻璃板G之研磨面進行研磨。 Therefore, the polishing apparatus 10 of the embodiment presses the polishing surface of the glass sheet G to the polishing pad 26 with a uniform pressure by the pressure of the compressed air, and the glass plate is rotated and revolved by the polishing head 12 Grinding surface of G is ground.

再者,實施形態之研磨裝置10係例示藉由1片研磨墊26來研磨玻璃板G,並且使用壓縮空氣(加壓流體)之研磨裝置,但本發明之研磨裝置並不限於上述研磨裝置10。例如,亦可應用於排列複數個研磨墊,一面沿著排列之複數個研磨墊使玻璃板G移動,一面藉由複數個研磨墊來研磨玻璃板G之連續式研磨裝置。 Further, the polishing apparatus 10 of the embodiment is a polishing apparatus that uses a single polishing pad 26 to polish the glass sheet G and uses compressed air (pressurized fluid), but the polishing apparatus of the present invention is not limited to the above-described polishing apparatus 10 . For example, it can also be applied to a continuous polishing apparatus in which a plurality of polishing pads are arranged to move the glass sheet G along a plurality of polishing pads arranged to polish the glass sheet G by a plurality of polishing pads.

研磨墊26係軟質樹脂之聚胺基甲酸酯製,且A硬度(參照ISO 7619:2004)為80以上[D硬度(參照ISO 7619)時為30以上],密度為0.7 g/cm3以上(參照JIS K 7222:2005)。又,研磨墊26係A硬度為90以下(D硬度時為50以下),且密度為0.9 g/cm3以下。 The polishing pad 26 is made of a soft resin polyurethane, and has an A hardness (refer to ISO 7619:2004) of 80 or more [D hardness (refer to ISO 7619), 30 or more], and a density of 0.7 g/cm 3 or more. (Refer to JIS K 7222:2005). Further, the polishing pad 26 has an A hardness of 90 or less (50 or less in D hardness) and a density of 0.9 g/cm 3 or less.

於研磨墊26進行之玻璃板G之研磨中,為發揮抑制劃痕能力,而較佳為軟質樹脂之聚胺基甲酸酯,但為發揮平坦化能力,必需樹脂之A硬度達到80以上。 In the polishing of the glass sheet G by the polishing pad 26, in order to exhibit the ability to suppress scratches, a soft resin urethane is preferable, but in order to exhibit flatness, the resin A hardness must be 80 or more.

因此,實施形態之研磨裝置10係藉由使用軟質樹脂之聚胺基甲酸酯作為研磨墊26,並將聚胺基甲酸酯之密度設為 0.7 g/cm3以上,而將A硬度提昇至80以上。 Therefore, in the polishing apparatus 10 of the embodiment, the hardness of the polyurethane is increased by using the polyurethane of the soft resin as the polishing pad 26 and the density of the polyurethane to be 0.7 g/cm 3 or more. To 80 or more.

藉此,根據實施形態之研磨裝置10,由於可藉由兼具平坦化能力及抑制劃痕能力之研磨墊26研磨玻璃板G,故而可縮短僅具備抑制劃痕能力之後段之研磨墊(未圖示)之精加工研磨所耗費之加工時間。由此,根據研磨裝置10,與先前之研磨裝置相比,可明顯提昇玻璃板G之研磨效率。 According to the polishing apparatus 10 of the embodiment, since the glass sheet G can be polished by the polishing pad 26 having both the flattening ability and the scratch resistance, the polishing pad having only the ability to suppress the scratching ability can be shortened (not The processing time of the finishing polishing shown in the figure). Thus, according to the polishing apparatus 10, the polishing efficiency of the glass sheet G can be remarkably improved as compared with the prior grinding apparatus.

又,已判明藉由將研磨墊26之樹脂之A硬度之上限值規定為90,而使抑制劃痕能力更進一步提昇。於此情形時,上述樹脂之密度之上限值為0.9 g/cm3Further, it has been found that by suppressing the upper limit of the A hardness of the resin of the polishing pad 26 to 90, the ability to suppress scratching is further improved. In this case, the upper limit of the density of the above resin is 0.9 g/cm 3 .

即,作為軟質樹脂但密度或A硬度之中至少一者超過上述上限值之研磨墊係藉由下述實驗而確認抑制劃痕能力低下。又,同樣地,樹脂之A硬度為80以上90以下但密度未達0.7 g/cm3之研磨墊係藉由下述實驗而確認抑制劃痕能力低下。 In other words, as a soft resin, at least one of the density and the A hardness exceeds the above upper limit, and it is confirmed by the following experiment that the scratch resistance is lowered. Further, in the same manner, the polishing pad having a resin having an A hardness of 80 or more and 90 or less and having a density of less than 0.7 g/cm 3 was confirmed to have a low scratch resistance by the following experiment.

雖例示了聚胺基甲酸酯作為軟質樹脂之材料,但並未特別限定,可例示胺基甲酸酯、發泡聚胺基甲酸酯。 Although the polyurethane is exemplified as the material of the soft resin, it is not particularly limited, and examples thereof include a urethane and a foamed polyurethane.

以下,表示試驗例。 The test examples are shown below.

圖3係表示樣品No.1~18之發泡聚胺基甲酸酯製造之研磨墊之密度及A硬度、以及各樣品之藉由研磨墊之研磨而產生於玻璃板G之表面之劃痕個數之清單之表,圖4係表示樣品No.1~18之密度與A硬度之相關性之表。基於該等表說明實施形態之研磨墊26之優異性。 Figure 3 is a graph showing the density and A hardness of the polishing pad made of the foamed polyurethane of Sample Nos. 1 to 18, and the scratches on the surface of the glass plate G by the polishing of the polishing pad of each sample. The table of the list of the numbers, FIG. 4 is a table showing the correlation between the density of the samples No. 1 to 18 and the A hardness. The superiority of the polishing pad 26 of the embodiment will be described based on these tables.

評價對象之玻璃板G係實質上不含鹼性成分之玻璃板,且其尺寸係長邊為470 mm,短邊為370 mm,厚度為0.7 mm。 The glass plate G to be evaluated is a glass plate which does not substantially contain an alkaline component, and has a size of 470 mm on the long side, 370 mm on the short side, and a thickness of 0.7. Mm.

研磨墊之大小係直徑為1690 mm之圓形,且於其表面形成有將研磨漿料供給至研磨墊之表面之研磨漿料供給孔、及用以使研磨漿料遍佈於研磨墊整面上之槽。槽之形狀係寬度為1.5 mm,間距為4.5 mm,深度為1.5 mm。 The size of the polishing pad is a circle having a diameter of 1690 mm, and a polishing slurry supply hole for supplying the polishing slurry to the surface of the polishing pad is formed on the surface thereof, and the polishing slurry is spread over the entire surface of the polishing pad. Slot. The groove shape has a width of 1.5 mm, a pitch of 4.5 mm and a depth of 1.5 mm.

研磨條件係研磨壓力為3 kPa,自轉速度為50 rpm,公轉速度為120 rpm,墊公轉半徑為75 mm,研磨漿料供給量為每分鐘40升。研磨漿料係將利用水將氧化鈰分散而成之分散液。 The grinding conditions were a grinding pressure of 3 kPa, a rotation speed of 50 rpm, a revolution speed of 120 rpm, a pad revolution radius of 75 mm, and a polishing slurry supply amount of 40 liters per minute. The polishing slurry is a dispersion obtained by dispersing cerium oxide with water.

與實施形態之研磨墊26對應之樣品係稱作軟質樹脂墊之No.14~18之研磨墊。即,No.14之研磨墊之A硬度為86.6,密度為0.8 g/cm3,No.15之研磨墊之A硬度為85.4,密度為0.8 g/cm3,No.16之研磨墊之A硬度為84.7,密度為0.8 g/cm3,No.17之研磨墊之A硬度為85.5,密度為0.7 g/cm3,No.18之研磨墊之A硬度為86.0,密度為0.8 g/cm3The sample corresponding to the polishing pad 26 of the embodiment is referred to as a polishing pad of No. 14 to 18 of a soft resin pad. That is, the polishing pad of No. 14 has an A hardness of 86.6, a density of 0.8 g/cm 3 , a polishing pad of No. 15 having an A hardness of 85.4, a density of 0.8 g/cm 3 , and a No. 16 polishing pad A. The hardness is 84.7, the density is 0.8 g/cm 3 , the polishing pad of No. 17 has an A hardness of 85.5, the density is 0.7 g/cm 3 , and the No. 18 polishing pad has an A hardness of 86.0 and a density of 0.8 g/cm. 3 .

與此相對,稱作硬質墊之No.1~5之研磨墊係僅具備平坦化能力,且於先前之研磨裝置中用於粗研磨步驟者。即,No.1之研磨墊之A硬度為96.1,密度為1.1 g/cm3,No.2之研磨墊之A硬度為96.8,密度為1.0 g/cm3,No.3之研磨墊之A硬度為96.1,密度為0.9 g/cm3,No.4之研磨墊之A硬度為94.2,密度為0.9 g/cm3,No.5之研磨墊之A硬度為95.0,密度為1.0 g/cm3On the other hand, the polishing pads of Nos. 1 to 5, which are referred to as hard mats, have only the flattening ability and are used in the conventional polishing apparatus for the rough grinding step. That is, the polishing pad of No. 1 has an A hardness of 96.1, a density of 1.1 g/cm 3 , a polishing pad of No. 2 has an A hardness of 96.8, a density of 1.0 g/cm 3 , and a polishing pad of No. 3 The hardness is 96.1, the density is 0.9 g/cm 3 , the A hardness of the polishing pad of No. 4 is 94.2, the density is 0.9 g/cm 3 , the A hardness of the polishing pad of No. 5 is 95.0, and the density is 1.0 g/cm. 3 .

又,稱作軟質墊之No.6、7之研磨墊係僅具備抑制劃痕 能力,且於先前之研磨裝置中用於精密研磨步驟者。即,No.6之研磨墊之A硬度為37.4,密度為0.5 g/cm3,No.7之研磨墊之A硬度為60.0,密度為0.6 g/cm3Further, the polishing pads of Nos. 6 and 7 which are referred to as soft mats only have the ability to suppress scratches and are used in precision polishing steps in previous polishing apparatuses. That is, the polishing pad of No. 6 had an A hardness of 37.4 and a density of 0.5 g/cm 3 , and the polishing pad of No. 7 had an A hardness of 60.0 and a density of 0.6 g/cm 3 .

進而,稱作中等彈性墊之No.8~13之研磨墊係A硬度處於實施形態之研磨墊26之A硬度之範圍(80以上90以下)內,但密度未達0.7 g/cm3(0.5~0.6 g/cm3)之研磨墊。即,No.8之研磨墊之A硬度為88.8,密度為0.5 g/cm3,No.9之研磨墊之A硬度為86.6,密度為0.5 g/cm3,No.10之研磨墊之A硬度為88.8,密度為0.5 g/cm3,No.11之研磨墊之A硬度為82.9,密度為0.5 g/cm3,No.12之研磨墊之A硬度為84.3,密度為0.5 g/cm3,No.13之研磨墊之A硬度為89.8,密度為0.6 g/cm3Further, the polishing pad A hardness referred to as a medium elastic pad No. 8 to 13 is within the range of A hardness (80 or more and 90 or less) of the polishing pad 26 of the embodiment, but the density is less than 0.7 g/cm 3 (0.5). ~0.6 g/cm 3 ) of polishing pad. That is, the polishing pad of No. 8 has an A hardness of 88.8, a density of 0.5 g/cm 3 , a polishing pad of No. 9 has an A hardness of 86.6, a density of 0.5 g/cm 3 , and a polishing pad of No. 10 The hardness is 88.8, the density is 0.5 g/cm 3 , the polishing pad of No. 11 has an A hardness of 82.9, the density is 0.5 g/cm 3 , and the polishing pad of No. 12 has an A hardness of 84.3 and a density of 0.5 g/cm. 3 , No. 13 of the polishing pad has an A hardness of 89.8 and a density of 0.6 g/cm 3 .

根據作為實施形態之研磨墊26之No.14~18之研磨墊,因A硬度為80以上,故具備平坦化能力,並且因密度為0.7 g/cm3以上0.9 g/cm3以下,故如圖3之表所示,殘留於研磨後之玻璃板G之表面上之劃痕之個數為72、79、48、70、91個,劃痕之個數為100個以下。 According to the polishing pad No. 14 to 18 of the polishing pad 26 of the embodiment, since the A hardness is 80 or more, the flattening ability is provided, and since the density is 0.7 g/cm 3 or more and 0.9 g/cm 3 or less, As shown in the table of Fig. 3, the number of scratches remaining on the surface of the polished glass sheet G was 72, 79, 48, 70, and 91, and the number of scratches was 100 or less.

與此相對,殘留於由No.1~5之硬質墊研磨之玻璃板G之表面上之劃痕個數為634、10000、10000、178、214個。由此,上述硬質墊雖具備平坦化能力,但不具備抑制劃痕能力。 On the other hand, the number of scratches remaining on the surface of the glass sheet G polished by the hard mats Nos. 1 to 5 was 634, 10000, 10000, 178, and 214. Therefore, although the hard mat has flattening ability, it does not have the ability to suppress scratches.

又,殘留於由No.6之軟質墊研磨之玻璃板G之表面上之劃痕個數為3個。由此,不具備平坦化能力之上述軟質墊具備抑制劃痕能力。 Further, the number of scratches remaining on the surface of the glass sheet G polished by the soft pad of No. 6 was three. Therefore, the soft mat which does not have the flattening ability has the ability to suppress scratches.

進而,殘留於由No.8~11、13之中等彈性墊研磨之玻璃板G之表面上之劃痕個數為442、1516、528、114514個。由此,上述中等彈性墊雖具備平坦化能力,但不具備抑制劃痕能力。 Further, the number of scratches remaining on the surface of the glass sheet G polished by the elastic mats such as Nos. 8 to 11, 13 is 442, 1516, 528, 1 1 4 and 514 . Therefore, although the above-mentioned medium elastic pad has flattening ability, it does not have the ability to suppress scratches.

如上所述,判明A硬度為80以上90以下且密度為0.7 g/cm3以上0.9 g/cm3以下之實施形態之研磨墊26兼具平坦化能力及抑制劃痕能力。 As described above, the polishing pad 26 of the embodiment in which the A hardness is 80 or more and 90 or less and the density is 0.7 g/cm 3 or more and 0.9 g/cm 3 or less is both flattening ability and scratch resistance.

繼而,一面參照圖5,一面對研磨墊之平坦化能力之評價方法進行說明。 Next, a method of evaluating the flattening ability of the polishing pad will be described with reference to Fig. 5 .

玻璃板之表面之起伏高度/起伏間距之比率越低,研磨墊之平坦化能力越高。 The lower the ratio of the undulation height/the undulation pitch of the surface of the glass plate, the higher the flattening ability of the polishing pad.

此處,對起伏高度/起伏間距之比率之計算方法進行說明。以1 μm之研磨量對研磨前之研磨面之起伏高度為0.02 μm且起伏間距為P之玻璃板進行研磨時,若將研磨後之研磨面之起伏高度設為H,則起伏高度H相對於起伏間距P之比率成為H/P。圖6之表係將470 mm×370 mm尺寸之玻璃板之一片中之劃痕個數與H/P之關係總結所得者。 Here, the calculation method of the ratio of the undulation height/the undulation pitch will be described. When the glass plate having an undulating height of 0.02 μm and a undulation pitch of P before grinding is polished at a grinding amount of 1 μm, if the undulation height of the polished surface after grinding is H, the undulation height H is relative to The ratio of the undulation pitch P becomes H/P. The graph of Fig. 6 summarizes the relationship between the number of scratches in a piece of 470 mm × 370 mm glass sheet and H/P.

根據圖6之表,可知軟質墊係H/P之比率高於其他,故而平坦化能力較低,但劃痕個數少於其他。可知硬質墊係H/P之比率低於其他,故而平坦化能力較高,但劃痕個數多於其他。可知中等彈性墊與相當於本發明之研磨墊之軟質樹脂墊相比,H/P之比率大致相同,但劃痕個數明顯較多。又,軟質樹脂墊之H/P之比率係H/P為1.6×10-6以下1.3×10-6以上,高於一部分硬質墊但低於軟質墊。 According to the table of Fig. 6, it can be seen that the ratio of the soft mat H/P is higher than the others, so the flattening ability is low, but the number of scratches is less than others. It can be seen that the ratio of the hard mat H/P is lower than the others, so the flattening ability is higher, but the number of scratches is more than others. It can be seen that the ratio of H/P is substantially the same as that of the soft resin pad corresponding to the polishing pad of the present invention, but the number of scratches is significantly larger. Further, the ratio of H/P of the soft resin pad is H/P of 1.6 × 10 -6 or less and 1.3 × 10 -6 or more, which is higher than a part of the hard pad but lower than the soft pad.

由此,判明相當於本發明之研磨墊之軟質樹脂墊與軟質墊相比,平坦化能力較高,且與硬質墊相比,平坦化能力較低,但可大幅度地削減劃痕個數。 Therefore, it was found that the soft resin pad corresponding to the polishing pad of the present invention has higher flattening ability than the soft pad, and has lower flattening ability than the hard pad, but the number of scratches can be greatly reduced. .

再者,本說明書中記載之所謂「劃痕」係指深度為0.1 μm以上、寬度為2 μm以上且長度為5 μm以上者。 In addition, the "scratch" described in the present specification means a depth of 0.1 μm or more, a width of 2 μm or more, and a length of 5 μm or more.

本申請案係基於2011年12月2日提出申請之日本專利申請2011-264901者,其內容以參照之形式取入至此。 The present application is based on Japanese Patent Application No. 2011-264901 filed on Dec. 2, 2011, the content of which is hereby incorporated by reference.

10‧‧‧研磨裝置 10‧‧‧ grinding device

12‧‧‧研磨頭 12‧‧‧ polishing head

14‧‧‧壓盤 14‧‧‧ Platen

16‧‧‧玻璃保持構件 16‧‧‧Glass holding member

18‧‧‧片材 18‧‧‧Sheet

20‧‧‧玻璃保持壓盤 20‧‧‧ glass holding platen

22‧‧‧載具 22‧‧‧ Vehicles

23‧‧‧空氣室 23‧‧ Air Chamber

24‧‧‧旋轉軸 24‧‧‧Rotary axis

26‧‧‧研磨墊 26‧‧‧ polishing pad

28‧‧‧片材 28‧‧‧Sheet

30‧‧‧研磨墊保持壓盤 30‧‧‧ polishing pad to maintain pressure plate

G‧‧‧玻璃板 G‧‧‧glass plate

P1‧‧‧自轉軸 P 1 ‧‧‧Rotary axis

P2‧‧‧公轉軸 P 2 ‧‧‧ public axis

圖1係表示應用實施形態之研磨墊之研磨裝置的整體構成之立體圖。 Fig. 1 is a perspective view showing an overall configuration of a polishing apparatus to which a polishing pad according to an embodiment is applied.

圖2係圖1所示之研磨裝置之側視圖。 Figure 2 is a side view of the polishing apparatus shown in Figure 1.

圖3係表示樣品No.1~18之研磨墊之密度、A硬度之清單之表。 Fig. 3 is a table showing the list of the density and the A hardness of the polishing pads of Sample Nos. 1 to 18.

圖4係表示樣品No.1~18之密度與A硬度之相關性之表。 Fig. 4 is a table showing the correlation between the density of sample Nos. 1 to 18 and the A hardness.

圖5係用以說明研磨墊之平坦化能力之評價方法之說明圖。 Fig. 5 is an explanatory view for explaining a method of evaluating the flattening ability of the polishing pad.

圖6係將特定尺寸之玻璃板之一片中之劃痕個數與H/P之關係總結所得之表。 Fig. 6 is a table summarizing the relationship between the number of scratches in one piece of a glass plate of a specific size and H/P.

10‧‧‧研磨裝置 10‧‧‧ grinding device

12‧‧‧研磨頭 12‧‧‧ polishing head

14‧‧‧壓盤 14‧‧‧ Platen

16‧‧‧玻璃保持構件 16‧‧‧Glass holding member

18‧‧‧片材 18‧‧‧Sheet

20‧‧‧玻璃保持壓盤 20‧‧‧ glass holding platen

22‧‧‧載具 22‧‧‧ Vehicles

23‧‧‧空氣室 23‧‧ Air Chamber

24‧‧‧旋轉軸 24‧‧‧Rotary axis

26‧‧‧研磨墊 26‧‧‧ polishing pad

28‧‧‧片材 28‧‧‧Sheet

30‧‧‧研磨墊保持壓盤 30‧‧‧ polishing pad to maintain pressure plate

G‧‧‧玻璃板 G‧‧‧glass plate

P1‧‧‧自轉軸 P 1 ‧‧‧Rotary axis

P2‧‧‧公轉軸 P 2 ‧‧‧ public axis

Claims (4)

一種玻璃板之研磨裝置,其係藉由樹脂製之研磨墊來研磨玻璃板者,其特徵在於:上述研磨墊之樹脂之密度為0.7 g/cm3以上,且參照ISO 7619之A硬度為80以上,上述研磨墊之A硬度為90以下,上述研磨墊之樹脂之密度為0.9 g/cm3以下。 A polishing apparatus for a glass plate, wherein the glass plate is polished by a polishing pad made of a resin, wherein the resin of the polishing pad has a density of 0.7 g/cm 3 or more, and the hardness of the reference to ISO 7619 is 80. As described above, the polishing pad has an A hardness of 90 or less, and the polishing pad has a resin density of 0.9 g/cm 3 or less. 如請求項1之玻璃板之研磨裝置,其中上述樹脂係聚胺基甲酸酯。 A polishing apparatus for a glass plate according to claim 1, wherein the above resin is a polyurethane. 一種玻璃板,其係由如請求項2之玻璃板之研磨裝置研磨而成者,且於上述玻璃板之研磨面上,深度為0.1 μm以上、寬度為2 μm以上且長度為5 μm以上之劃痕為100個以下。 A glass plate which is obtained by polishing a polishing apparatus of a glass plate according to claim 2, and having a depth of 0.1 μm or more, a width of 2 μm or more, and a length of 5 μm or more on the polished surface of the glass plate. The scratch is 100 or less. 如請求項3之玻璃板,其中以1 μm之研磨量對研磨前之研磨面之起伏高度為0.02 μm且起伏間距為P之玻璃板進行研磨時,將研磨後之研磨面之起伏高度設為H,則H/P為1.6×10-6以下。 The glass plate of claim 3, wherein the undulation height of the polished surface after the grinding is set to a glazing thickness of 0.02 μm and a pacing pitch of P before grinding with a grinding amount of 1 μm H, H/P is 1.6 × 10 -6 or less.
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CN105793207A (en) * 2013-12-04 2016-07-20 旭硝子株式会社 Glass substrate finish-polishing method and alkali-free glass substrate that has been finish-polished by said method

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