201245690 六、發明說明： L 明所屬冬好々貝】 發明領域 本發明係有關於一種以非破壞性方法測定強化破螭之 物體表面壓縮應力量的玻璃表面應力測定裝置及玻璃之表 面應力測定方法。201245690 VI. INSTRUCTION DESCRIPTION: L Ming Ming belongs to the winter good mussel] FIELD OF THE INVENTION The present invention relates to a glass surface stress measuring device for measuring the amount of surface compressive stress of an object that is strengthened and destroyed by a non-destructive method, and a method for measuring surface stress of glass .
L -^tr ~J 發明背景 自習知，AV機器.〇A機器等操作面板或開關門等係多 使用金屬色系面板或黑色面板。該等面板係以所需的顏色 塗料塗裝在樹脂或金屬上，因此在耐久性如因長期間使用 而造成剝離等方面上存有課題。 又，將該等面板作為構造材使用或作為開關門使用 時’係要求其為具備有高強度者。 就適合用於要求兼具上述耐久性與高強度的用途之呈 現黑色的玻璃的部分，本申請人有提出如專利文獻丨中記栽 之玻璃的專利申請。 然而，作為提高玻璃強度之方法，一般廣為大眾知曉 之方法係使玻璃表面上形成壓縮應力層者^為使破填表 面上形成壓縮應力層之手法，代表上有：風冷強化法(物理 強化法）’其係藉由風冷等將已加熱到軟化點附近的玻璃板 表面、、速冷卻者，及化學強化法’其係在玻璃轉移點以下 的溫度，藉由離子交換將玻璃板表面之離子半徑小的鹼金 屬離子(典型上為u離子、Na離子）交換成離子半徑較大的驗 201245690 離子（典型上相對於Li離子為Na離子或K離子，相對於!^3離 子則為Κ離子）。 藉由於前述玻璃表面上形成壓縮應力層所獲得的玻璃 在品質管理上’為了確認具備一定以上之強度的目的下測 疋壓縮應力量是很重要的。 例如’在專利文獻2中有提議並實用化之一種以非破壞 性方式來測定玻璃的壓縮應力量之表面壓縮應力（以下亦 稱為CS)及表面壓縮應力層深度（以下亦稱為d〇L)之方法。 該測定法係利用已形成於玻璃表面之壓縮應力層的折射率 不同於不具壓縮應力層之其他玻璃部分的折射率，來顯示 光波導效果者。 先前技術文獻 專利文獻 專利文獻1 :日本特願2009-285377號 專利文獻2 :日本特開昭53-136886號公報 【智^明内溶^】 發明概要 發明欲解決之課題 然而’以非破壞方式測定CS及DOL之前述裝置則另確 認具有下述問題，即：由於以非破壞方式測定(：8及〇〇1^之 前述裝置係使玻螭表面層傳播之光射出而進行觀察，因 此’無法對前述如呈現黑色之可見區透射率低的著色玻璃 進打測定。此時’除了使用會伴隨撓曲強度或裂縫形成負 載專破壞的強度測定試驗、或必須用以測定雙折射之試料 4 201245690 加工的需求·’或對化學強化玻璃使用EPMA(Electron Probe Micro Analyzer:電子探針微量分析儀）來測定鉀之擴散層深 度等非常耗費時力的方法以外，沒有其他可測定玻璃之壓 縮應力量與強度的方法，且測定資料的精度又低、缺乏可 靠性。 本發明之目的在於提供一種測定可見區之透射率低的 著色玻璃之表面應力之裳置與方法。 用以欲解決課題之手段 本發明係提供一種玻璃之表面應力測定裝置（以下有 時亦稱為本發明之玻璃之表面應力測定裝置），其特徵在於 具備.光源；光供給構件，係使源自於前述光源之光入射 至強化玻璃的表面層内；光擷取構件，係使在前述強化玻 璃的表面層内傳播之光往前述強化玻璃之外射出；及光轉 換構件，係使前述已射出之光分離為相對於前述強化玻璃 與前述光擷取構件之邊界面作平行及垂直振動的 二種光成 刀，並使其等轉換成明線列或暗線列；且，往前述光轉換 構件入射之光係在前述強化玻璃之吸光係數為 下的波長區具有中心波長之單色光。 又，本發明之玻璃之表面應力測定裝置，其特徵在於： 前述強化玻璃為著色玻璃。 又，本發明之玻璃之表面應力測定裝置，其特徵在於： 源自於則述光源之光係在前述強化玻璃之吸光係數為 4.5mm以下的波長區具有中心波長之單色光。 又，本發明之玻璃之表面應力測定裴置，其特徵在於： 201245690 其係在前述光源與前述強化玻璃之間或在前述光擷取構件 與前述光轉換構件之間備有帶通濾波器或單光儀，且該帶 通濾波器或單光儀係自前述已射出之光擷取出前述強化玻 璃之吸光係數為4.5mm·1以下的波長區之單色光。 又’本發明之玻璃之表面應力測定裝置，其特徵在於： 源自於前述光源之光係波長區7〇〇nm以上的單色光。 又，本發明之玻璃之表面應力測定裝置，其特徵在於： 源自於前述光源之光係波長區2〇〇〇nm以下的單色光。 又，本發明之玻璃之表面應力測定裝置，其特徵在於： 前述光源係發光二極體。 又’本發明之玻璃之表面應力測定裝置，其特徵在於： 前述光源係雷射。 又’本發明之玻璃之表面應力測定裝置，其特徵在於： 前述強化玻璃在波長550nm〜650nm下之吸光係數的最小 值超過1.7mm·1。 又’本發明之玻璃之表面應力測定裝置，其特徵在於： 前述強化玻璃係藉由含有金屬離子而著色。 又，本發明之玻璃之表面應力測定裝置，其特徵在於： 前述強化玻璃係藉由析出金屬膠體而著色。 又’本發明之玻璃之表面應力測定裝置，其特徵在於： 前述強化玻璃係藉由析出結晶而著色。 又’本發明之玻璃之表面應力測定裝置，其特徵在於： 前述強化玻璃業經化學強化處理。 又，本發明之玻璃之表面應力測定裝置，其特徵在於 201245690 ^ 其更具備：攝像元件，其用以將已藉由前述光轉換構件作 轉換之明線列或暗線列予以攝像；及圖像處理裝置，其係 自藉由前述攝像元件所獲得之圖像，強調出前述明線列或 暗線列者。 又，本發明之玻璃之表面應力測定裝置，其特徵在於 其具備.測定機構’係依據業經前述光轉換構件轉換之前 述明線列或暗線列來測定前述強化玻璃之表面應力；且， 前述測定機構使用下述波長下之前述強化玻璃的光彈性常 數：與在前述強化玻璃之吸光係數為4.5mm-1以下之波長區 具有中心波長的單色光大致相同的波長。 本發明提供一種玻璃之表面應力測定方法（以下有時 - 亦稱為本發明之玻璃之表面應力測定方法），係用以測定強 化玻璃之表面應力者’其具有下述步驟：使源自於光源之 光入射至則述強化玻璃的表面層内之步驟；使前述光在前 述強化玻璃的表面層内傳播之步驟；使傳播後之光射出至 外部之步驟；將前述已射出之光分離成相對於玻璃面作平 行及垂直振動的二種光成分之步驟；將前述已分離之二種 光成分分別轉換成暗線列或明線列之步驟；及依據前述暗 線列或明線列來測定前述強化玻璃之表面應力之步驟； 且’會在前述分離步驟受到分離之光係單色光，其在前述 強化玻璃之吸光係數為4.5mm·1以下的波長區具有中心波 長。 又’本發明之玻璃之表面應力測定方法，其特徵在於： 前述強化玻璃業經著色處理。 201245690 又，本發明之玻璃之表面應力測定方法，其特徵在於： 源自於前述光源之光係單色光，其在前述強化玻璃之吸光 係數為4.5mm-1以下的波長區具有中心波長。 又，本發明之玻璃之表面應力測定方法，其特徵在於： 其係將使用帶通滤波器或單光儀所擷取之前述強化玻璃之 吸光係數為4.5mm—1以下的波長區之單色光，入射至前述強 化玻璃的表面層内° 又，本發明之玻璃之表面應力測定方法，其特徵在於： 其係將使用帶通濾波器或單光儀所擷取之前述強化玻璃之 吸光係數為4.5mm·1以下的波長區之單色光，分離成相對於 玻璃面作平行及垂直振動的二種光成分。 又，本發明之玻璃之表面應力測定方法，其特徵在於： 前述單色光係使用波長區700mn以上的單色光。 又’本發明之玻璃之表面應力測定方法，其特徵在於： 源自於前述光源之光係波長區2000nm以下的單色光。 又’本發明之玻璃之表面應力測定方法，其特徵在於： 前述強化玻璃在波長550nm〜650nm下之吸光係數的最小 值超過1.7mm·1。 又’本發明之玻璃之表面應力測定方法，其特徵在於： 前述強化玻璃係藉由含有金屬離子而著色。 又’本發明之玻璃之表面應力測定方法，其特徵在於： 前述強化玻璃係藉由析出金屬膠體而著色。 又’本發明之玻璃之表面應力測定方法，其特徵在於： 前述強化玻璃係藉由析出結晶而著色。 201245690 又，本發明之玻璃之表面應力測定方法，其特徵在於： 前述強化玻璃業經化學強化處理。 又，本發明之玻璃之表面應力測定方法，其特徵在於 其具有：將前述已轉換之明線列或暗線列予以攝像之步 驟；及進行圖像處理之步驟，該圖像處理係自藉由前述攝 像所獲得之圖像，強調出前述明線列或前述暗線列者；且， 依據前述已強調之前述明線列或前述暗線列來測定強化玻 璃之表面應力。 又，本發明之玻璃之表面應力測定方法，其特徵在於： 前述測定強化玻璃之表面應力之步驟係使用下述波長下之 前述強化玻璃的光彈性常數：在與前述強化玻璃之吸光係 - 數為4.5mm_1以下之波長區具有中心波長的單色光大致相 同之波長。 發明效果 依據本發明，即便為可見區之透射率低且業經著色的 強化玻璃，亦可以非破壞性的方式測定表面壓縮應力及表 面壓縮應力層深度。 圖式簡單說明 第1圖係顯示本發明中之玻璃之表面應力測定裝置及 玻璃之表面應力測定方法的第1實施形態之概略圖。 第2圖係顯示本發明中之玻璃之表面應力測定裝置及 玻璃之表面應力測定方法的第2實施形態之概略圖。 第3圖係顯示本發明中之玻璃之表面應力測定裝置及 玻璃之表面應力測定方法的第3實施形態之概略圖。 201245690 第4圖係顯示本發明中之玻璃之表面應力測定裝置所 備有的之光轉換構件的構成之概略圖。 第5圖係顯示本發明中之玻璃之表面應力測定裝置所 備有的之圖像處理裝置的構成之概略圖。 第6圖係顯示於本發明中之玻璃之表面應力測定裝置 所備有的顯示器中干涉條紋（明線列或暗線列）之示意圖。 第7圖係用以說明本發明中之光彈性常數Kc的測定方 法之圖。 第8圖係顯示實施例中所使用之著色玻璃的吸光係數 與波長之關係圖。 第9圖係實施例之著色玻璃C在波長600nm下之干涉條 紋的圖像。 第10圖係實施例之著色玻璃D在波長600nm下之干涉 條紋的圖像。 第11圖係實施例之著色玻璃C在波長790nm下之干涉 條紋的圖像。 第12圖係實施例之著色玻璃D在波長790nm下之干涉 條紋的圖像。 【實施方式3 用以實施發明之形態 (第1實施形態） 第1圖中顯示本發明之第1實施形態之玻璃之表面應力 測定裝置10的概略圖。 作為使光入射至被測定體之強化玻璃表面的媒體（光 10 201245690 供給構件）’係在光學破璃製_鏡㈣化玻璃表面呈光學 接觸的狀態下而絲。同樣地，作為使在強化玻璃的表面 層傳播之光射出至強化玻璃外部的媒體(光擷取構件），係在 光學破璃製的稜猶強化玻财面呈料關的狀態下而 ^載。在強化玻璃表面，為了使光可透過料稜鏡進行光 學性入射及射出，乃使用該等錄之折射率大於強化玻璃 之折射率者。光源係錢光可從光供給構件之稜鏡入射至 強化破璃的表面層的方式硫置。光轉換構件係以使在強 玻璃的表面層傳播之光可從光擷取構件之稜鏡射出之方 向之方式而配置。光轉換構件係於在強化玻璃的表面層傳 播之光的射出方向’將其傳播光分離為相對於強化玻璃表 面”光供給構件之稜鏡間的邊界面—亦即射出面—作平行 及垂直振動的2種光成分，並將該等各成分分別轉換成明線 列或暗線列。而且，該光轉換構件具備將明㈣或暗線列 作為干涉條紋像加峨察的機構。 使用°亥等裝置構成來測定強化玻璃之壓縮應力量 (CS、DOL)。 系經化學強化處理或風冷強化處理的強化玻璃，於表 備有！縮應力層 <> 轉壓縮應力層與壓縮應力層以外的 玻璃部分相較之下，折射率較高。而且，該等折射率係從 壓縮應力層的底部朝向表面單調地增加。X’該壓縮應力 曰的又斤射亦疋朝向表面單調地增加絕對值。所以，會有 :條分:相對於朝破螭表面作垂直振動之光與平行於破螭 的衣度相對折射率曲線，而產生不同的光波導效 201245690 果，藉由將依該等所形成的干涉條紋像作比較，可求算強 化玻璃的表面壓縮應力、及表面壓縮應力層深度。 因此，在前述使用光波導效果之表面應力測定裝置⑺ 中，必須獲得由朝玻璃表面作垂直振動之光及對玻璃表面 作平行振動之光形成的明線列或暗線列所構成之干涉條紋 像0 然而，在既存的玻璃表面應力測定裝置中，當強化破 璃為業經著色時，會有源自於光源之光在強化玻璃的表面 層傳播時被著色成分之金屬離子等所吸收，而難以利用所 射出之光來辨識干涉條紋像的問題。 相對於此，在本發明之表面應力測定裝置1〇中，源自 於入射至光供給構件之光源之光的波長，係使用在被測定 體之強化玻璃的吸光係數為45mm-i以下的波長區具有中 心波長的單色光，因此即便為業經著色的強化玻璃，仍可 清晰地觀察干涉條紋像’故而可非破壞地且精度良好地測 定強化玻璃之CS及DOL，亦即者。 本發明中之吸光係數的算出方法如下。將玻璃板之兩 面予以鏡面研磨並測定厚度t。並測定該玻璃板之分光透射 率T(如使用日本分光股份有限公司製、紫外可見近紅外線 分光光度計V_57〇)。然後’使用τ=1〇•、關係式算出吸光 係數J3。 如前述，光源宜使用可射出在被測定體之強化玻璃的 吸光係數為以軸·1以下的波長區具有中心波長的單色光 者。當強化朗為業經著色時，會有因含有之金屬離子或 12 201245690 前述 乃飞…凌辨硪之情況產生。相對於此，藉由如 ^法來處理光源’可減少在強化玻璃中之光吸收的影 此可進行精度良好的表面應力層之測定。—旦於光 "、強化破璃之吸光係數超過4.5mm·1之波長之光，便會 因前述理山 〜收曰 ―由使所射出之光變得微弱而難以辨識干涉條紋 —’尤作為本發明之光源而言，並非理想。又於光源 二吏用強化麵之吸光係數為4麵·丨以下的波長之光，於光 源較宜使㈣化玻叙吸光係數為^、下的波長之 光源更宜使用強化玻璃之吸光餘為2晒，丨以下的波 長之光。 光1原/、要疋光源本身可射出在強化玻璃之吸光係數為 ^5晴Μ下的波長區具有中讀長之單色光者即可。又， 光源非單色光，亦可在光源與強化玻璃之間使用帶通 '慮波器或單光儀等可將光予以單色化之機構，藉此將源自 於：射至強化玻璃之光源的光作為單色光。又，即便光源 °°色光為了使源自於光源之光為半值寬度較狹窄的單 色光’亦可使料聽波器解域料將光予以單色化 之機構。藉由使用半值寬度較狹窄的單色光作為光源，可 極力排除其他波長的㈣’而獲得較鮮明的干涉條紋像。 源自於光源之光宜使用波長區700nm以上的單色光。夢 此，即便為幾乎不能透射可見光之如呈黑色的玻璃，仍可 精度良好地測定表面應力層之CS與DOL。又，以習知的表 面應力測Μ置與方法而言，即便為因測定波長的關係而 13 201245690 無法辨識干涉條紋像之可透射可見光的—部分之著色玻 璃，仍可進行測定。而，源自於光源之光只要為波長區7〇〇嫌 以上的單色㈣可使用，且宜使用在紅外線區之波長中波 長更短者。其理由在於’若於光源使用波長較長之光恐 有相對於玻璃之折射率變動的變化變得遲鈍而使獲得之干 涉條紋的條數減少、DOL之測定精度降低之傾向。又，攝 像元件的感度在紅外線區中以波長愈短者感度愈佳，且可 提升裝置之精度。此外，使用帶通濾波器時，波長較短者 較可獲得半值寬度狹窄的濾波器，且可提高裝置之精度。 由以上可知，源自於光源之光理想為波長區2〇〇〇nm以下的 單色光’較理想為波長區1500nm以下的單色光，且最理扠 為波長區950nm以下的單色光。 光源只要為可獲得所需的單色光者，任何種類皆可使 用，例如可適當使用發光二極體或雷射。由於發光二極體 可獲得各式各樣的中心波長者，因此可適當選擇因應強化 玻璃之吸光係數特性的光源。又，由於光源之壽命長，因 此可降低交換頻率。 由於雷射可獲得輸出高、半值寬度狹窄、且直線偏光 的單色光’因此即便未使用帶通濾波器等仍可提高測定精 度。又，藉由併用帶通濾波器其中一種的雷射線濾波器與 雷射，亦可作出半值寬度非常狹窄的單色光。其他，在使 用如帶通濾波器或單光儀等可將光予以單色化的機構時， 可使用氙燈、金屬齒素燈、水銀燈等的光源。 光供給構件、與光擷取構件分別可使用折射率高於強 14 201245690 化玻璃的光學玻璃製稜鏡。λ，光供給構件用稜鏡與光掏 取構件稜鏡可如第1圖為個別體，亦可為一體結構。I，亦 可在垓等稜鏡之間挾持有遮光機構的前提下，使該等為L 體結構。遮光機構之使用目的在於排除周圍不需要的光入 射至光擷取構件之稜鏡。遮光機構可使用由金屬等構成的 遮蔽板、或由金屬薄膜構成的遮蔽膜。又，當僅使強化破 璃的表面與各稜鏡密著而仍無法使光順利入射或射出時， 可使折射率與各稜鏡近似驗體介於強化玻璃與各棱鏡之 間來進行光學性接觸。 光轉換構件係用以觀測源自於光源之光入射至強化破 璃的表面層、在表面層傳播、且從表面層所射出之光者。 從強化玻璃射出之光因表面層的表面壓縮應力，會於振動 面沿著玻璃表面之方向之光、與垂直於該之方向之光之間 產生雙折射。該兩者雖然漸變折射率相同，但有效折射率 相異’故而折射角相異1以，藉由觀察在射出光之入射 面平行方向作振動之光卿成的暗線、及在射出光之入射 面垂直方向作振動之光所形成的暗線兩者，可測定二與 DOL。就從已射出之光擷取出該等2種光成分之方法而一〃 可使用單-或複數的偏光板4，就觀㈣所獲得^總 列構成的干涉較像之手段而言，可使打述方法：^用 目鏡測微計財動讀取職之料；或藉由錢點面配置 CCD或CMOS等固體攝像元件，將已獲得之干涉條紋 行圖像解析，以算出CS與DOL之方法等。又，在浐 之光僅棘出特定波長之單色光的目的下村在m 15 201245690 之前方配置帶通濾波器或單光儀等。而，有關光轉換構件 之構成並不限於上述形態，亦可使用公知者。 (第2實施形態） 接下來，說明本發明之第2實施形態的玻璃之表面應力 測定裝置20及玻璃之表面應力測定方法。第2圖中顯示本發 明之第2實施形態的玻璃之表面應力測定裝置2〇之概略圖。 第2實施形態之玻璃之表面應力測定裝置2〇在光擷取 構件與光轉換構件之間備有帶通濾波器或單光儀，該举通 濾波器或單光儀可從已射出光擷取構件之光來擷取出測定 對象之強化玻璃的吸光係數為4.5mm·1以下之波長區的單 色光’而且源自於光源之光不限於單色光，除上述兩點以 外’其構成與參照第1圖所説明之第1實施形態的玻璃之表 面應力測定裝置10相同，故省略説明。 在測定幾乎不透射可見光之玻璃一例如呈現黑色之玻 璃―時’因在測定係使用可透射玻璃之波長區之光，故以 使用光量較大之光源為宜。屆時，即便光源本身不是發射 單色光者，但因在光擷取構件與光轉換構件之間備有可擷 取出特定波長之單色光的帶通濾波器或單光儀，而可獲得 —定以上光量之單色光，又，藉此可獲得鮮明的干涉條紋 像。又，藉由在光轉換構件之近前切斷與測定無關的波長 之光’可排除因無關測定之波長之光所造成的雜波，而可 獲得蛘明的干涉條紋像。以帶通濾波器或單光儀擷取出的 單色光必須為測定對象之強化玻璃的吸光係數為4.SmnT1 以下之波長區之光。若使用強化玻璃的吸光係數超過 16 201245690 4.5mm 1之波長區的單色光，則進入光轉換構件之光會變微 弱而難以辨識干涉條紋像，故非理想。作為光量較大之光 源，可使用氙燈、金屬_素燈、及水銀燈等公知光源。又， 為了自以光擷取構件所射出之光排除所需波長以外的影 響’帶通渡波器或單光儀以可擷取出半值寬度極度狹窄之 單色光者為佳。 使用帶通渡波器或單光儀所擷取出的單色光宜使用波 長區70〇nm以上的單色光。藉此，即便為幾乎不透射可見光 之玻璃一如呈現黑色之玻璃，仍可精度良好地測定表面應 力層之CS與DOL。又’以習知的表面應力測定裝置與方法 而吾’即便為因測定波長的關係無法辨識干涉條紋像之可 透射可見光的一部分之著色玻璃，仍可進行測定。而，使 用帶通渡波器或單光儀所擷取出的單色光只要為波長區 700nm以上的單色光即可使用，且宜使用在紅外線區之波長 中波長較短者。其理由在於，若於光源使用波長較長之光， 恐有相對於破璃之折射率變動的變化變得遲鈍而使獲得之 干涉條紋的條數減少、DOL之測定精度降低之傾向。又， 攝像70件的感度在紅外線區中以波長愈短者感度愈佳，且 可提升裝置之精度。此外’使用帶通滤波器時，波長較短 者較可獲得半值寬度狹窄的濾波器，且可提高裝置之精 度。由以上可知，單色光理想為波長區2000nm以下的單色 光，較理想為波長區15〇〇nm以下的單色光，最理想為波長 區950nm以下的單色光。 (第3實施形態） 17 201245690 第3圖係本發明之第3實施形態的玻璃之表面應力測定 裝置30之概略圖。在此，就本發明之第3實施形態的玻璃之 表面應力測定裝置30及玻璃之表面應力測定方法加以說 明。以著色破璃來說，與習知的透明玻璃相較之下，由於 前者的光透射率會變低，因此以光轉換構件所獲得之明線 列或暗線列的邊界會變模糊，而有無法算出正確的表面應 力量（CS、D〇L)之虞。例如，表面壓縮應力深度(DOL)係以 從深度方向之最深部反射之光所形成的干涉條紋而特定。 然而’從最深部反射之光在玻璃中傳播的光程長度長，因 此光（免度）之衰減會增大而難以作為干涉條紋進行明確地 辨識。爰此，在該第3實施形態中’係將所獲得之明線列或 暗線列的圖像進行圖像處理，強調出明線列或暗線列，藉 以具出較正確的表面應力量(CS、DOL)。以下，將參照第3 圖’針對第3實施形態的玻璃之表面應力測定裝置3〇之構成 加以説明’而有關同於參照第1圖、第2圖所説明之第1、2 實施形態的玻璃之表面應力測定裝置1〇的構成，係賦予相 同符號並省略重複説明。 (玻璃之表面應力測定裝置3〇之構成） 第3實施形態的玻璃之表面應力測定裝置3 〇具備光源 2、帶通濾波器3、光供給構件4、光擷取構件5、光轉換構 件6A、及圖像處理裝置η。 第4圖係顯示玻璃之表面應力測定裝置3 〇所備有之光 轉換構件6Α之構成的概略圖。光轉換構件6八具備透鏡以、 偏光板6b、攝像元件6c、及框體6d。透鏡6a係使從光擷取 201245690 構件5射出之光會聚。偏光板6b係將自光擷取構件5射出之 光分離成相對於強化玻璃1與光擷取構件5之邊界面作平行 及垂直振動的二種光成分。已通過偏光板6b之光可作為明 線列或暗線列而辨識。使已分離之光成分通過時係辨識為 明線列’使已分離之光成分以外的光成分通過時則是辨識 為暗線列。而，偏光板6b宜使用IR(紅外線)偏光板。 攝像元件6c係用以將明線列或暗線列作為干涉條紋像 加以觀察的影像感測器（例如，CCD (Charge Coupled Device :電荷耦合裝置）影像感測器、CMOS(Complementary Metal Oxide Semiconductor :互補金氧半導體）影像感測 器）。攝像元件6c係將已受光之光進行光電轉換，並將構成 圖像之複數像素中每一像素的亮度值作為數位圖像資料， 輸出至圖像處理裝置11。 第5圖係顯示玻璃之表面應力測定裝置3〇所備有之圖 像處理裝置11之構成的概略圖。圖像處理裝置丨丨具備圖像 補正部11a、強調部lib、D/A轉換器'及顯示器ud。 圖像補正部11a係對從攝像元件6C輸出之數位圖像資 料進行白色平衡調整及γ補正。 強調部lib係強調出補正後之數位圖像資料之對比，並 強調出明線列或暗線列。強調出明線列或暗線列之對比的 方法可採用如下述方法。而’下述方法可適用在以攝像裝 置6c所獲得的干涉條紋像整體’亦可僅適用在光衰減較大 的特定圖像區域。例如’為了特定出表面壓縮應力深度的 最深部，亦可進行僅強調出相當於最深部周邊之圖像區域 19 201245690 的圖像處理。 (第1方法） 在第1方法中，係猎由將構成圖像之各像素的亮度值與 預先所§己憶之閾值作比較並進行二元化處理來強調出明線 列或暗線列。例如，將亮度值設定為0(最小亮度：黑）〜 255(最大亮度：白）時，可令具有超過閾值(如127)之亮度值 的像素之亮度值為255’並令具有閾值(如127)以下之亮度值 的像素之亮度值為0 ’藉以進行二元化處理。 (第2方法） 在第2方法中’係藉由強調出輪廓（邊緣）來強調明線列 或暗線列。在該輪廓的強調中，使用既存的邊緣強調濾波 器（如銳度濾波器）即可。 D/A轉換器1 lc係將已強調出明線列或暗線列之數位圖 像資料’轉換成可在顯示器Ud中顯示的類比圖像資料。例 如，顯不器lid為液晶顯示器或CRT(Cath〇deRayTube :陰 極射線管）’可將對應於自D / A㈣器丨丨e輸出之類比圖像資 料的圖像顯示於畫面。 (CS及DOL之算出） 第6圖係顯示於顯示器1 Id之明線列或暗線列的示意 圖。而’第6圖左側的明線列或暗線列，係相對於強化玻璃 1與光操取構件5之邊界面作垂直振㈣誠分之明線列或 暗線歹J X第6圖右側的明線列或暗線列係相對於強化 玻璃1與光娜構件5之邊界㈣平行振動的減分之明線 列或暗線列。 20 201245690 自顯示於顯示器lld之干涉條紋，可算出表面壓縮應力 (cs)及表面壓縮應力層深度(DOL)。具體而言，可從藉由光 轉換構件6 A所分離之明線列或暗線列的距離差△ t (參照第 6圖）算出表面壓縮應力（cs)，且該明線列或暗線列係相對於 強化玻璃1與光擷取構件5之邊界面作平行及垂直振動的二 種光成分者。又，可從明線列或暗線列的數量算出表面壓 縮應力層深度(DOL)。 而’要算出表面壓縮應力（CS)及表面壓縮應力層深度 (D〇L)會用到光彈性常數Kc，而該光彈性常數Kc實際上宜 為與在入射至強化玻璃之光源大致相同的波長下之前述強 化玻璃的光彈性常數。即，係與在入射至光轉換構件之單 色光大致相同之波長下的前述強化玻璃之光彈性常數，且 該單色光係在強化玻璃之吸光係數為4_5mm-1以下的波長 &具有中心波長者。此乃因為依所使用之波長而獲得的光 彈性常數會有所不同之緣故。而，在此所謂的「大致相同 之波長」表示以相同波長為中心，在數nm〜數十nm之範圍 内的波長。 (光彈性常數Kc之測定方法） 在此，光彈性常數Kc係表示應力F與因雙折射所造成之 光程差(5之關係的常數，且在令玻璃厚度為d時，滿足以下 (1)式之關係。 δ =Kc · d · F---(l) 亦即’欲測定強化玻璃的光彈性常數Kc時，必須於強 化坡螭加上應力來測定光彈性常數KC。但，若如本實施_ 21 201245690 態’表面壓縮應力（CS)及表面壓縮應力層深度(d〇l)之測定 對象的強化玻璃為著色玻璃時，一旦強化玻璃過厚，恐有 通過強化玻璃之光量不夠充分而無法測定光彈性常數Kc之 虞，或無法獲得正確的光彈性常數5^值之虞。另一方面， 一旦強化玻璃太薄’則有強化玻璃無法承受所施加之應力 而破損之虞。 第7圖係用以說明本發明中之光彈性常數1^的測定方 法之圖。以下’將參照第7圖就本實施形態中之光彈性常數 Kc的測定方法加以説明。而，在此係以4點撓曲法為例就光 彈性常數K c的測定方法作説明，且該4點撓曲法係對光彈性 常數Kc的強化玻璃1從4點施加力jp，藉以賦予撓曲應力。 從光源101會射出在強化玻璃1的吸光係數為4 5nim-i 以下之波長區具有中心波長、且在波長區7〇〇nm以上且 2000nm以下的單色光，較理想係射出波長區7〇〇nm以上且 1500nm以下的單色光。而，光源1〇1的單色光之波長與入射 至玻璃之表面應力測定裝置之光轉換構件中之光之波長大 致相同。 偏光板102、104係夾著光彈性常數1(^的測定對象之強 化玻璃1及巴比内補正板103，且配置成彼此正交—亦即相 位偏差90度一的態樣。偏光板1〇2僅會使從光源1〇1射出之 光中偏光於特定方向的光成分通過。又，偏光板1〇4僅會使 透射出強化玻璃1之光中，偏光於與偏光板1〇2的偏光方向 作正交之方向的光成分通過。巴比内補正板1()3係由水晶構 成之補償板。光偵測器105係接受已通過偏光板1〇4之光。 22 201245690 . 而，力F係藉由加載器等負荷施加機構(未圖示）來施加。 如第7圖顯示，在本發明中，係將強化玻璃〗的厚度製 作成源自於光源101之光可透射程度的厚度，並且將負荷之 施加方向設為從強化玻璃1的厚度側面—而非強化玻璃i的 厚度方向一來施加力F。因此，可抑制通過強化玻璃之光量 不夠充分而無法測定光彈性常數Kc的問題，或可抑制無法 獲得正確的光彈性常數Kc之值的問題。又，亦可抑制強化 玻璃1因無法承受所施加的負荷而破損的問題。 如上述，在本發明中有進行圖像處理來強調出明線列 或暗線列，因此可更正確地測定強化玻璃丨的表面應力量 (CS、DOL)。又，在算出表面壓縮應力（cs)及表面壓縮應 * 力層深度(D0L)時使用的光彈性常數Kc之測定，實際上是 . 使用與入射至強化玻璃1的表面應力測定裝置之光轉換構 件中之光大致相同之波長之光，即，在強化玻璃的吸光係 數為4.5mm·1以下的波長區具有中心波長、且在波長區 700nm以上且2000nm以下的單色光。因此，可更正確地測 定強化玻璃1的表面應力量（CS、DOL)。而，使用於光彈性 常數Kc測定之光’較宜使用波長區7〇〇nm以上且2〇〇〇nmW 下的單色光。 本發明之目的在於測定玻璃本身業經著色處理的強化 玻璃之表面應力。作為業經著色處理的強化玻璃例如有以 下形態。 就第1形態而言，係於強化玻璃中含有金屬離子者，且 乃係藉由金屬離子之特定波長之光吸收而著色之玻璃。當 23 201245690 玻璃中所含之過渡金>1元素或稀均元素隸有複數原子 價之兀素時’玻璃會因電子過渡時·擇吸收之光波長的 影響而具備特定的顏色。由於熔人玻射的過渡金屬離子 會強烈受到與其外殼鄰接之陰離子的影響，因此依基礎玻 璃組成、舰«、及添加成分等因素㈣擇吸收之光的 波長會受到影響。x，由於稀土類元素之原子其在離外殼 近的電子減會完顿電子㈣，使得其位於較内部的電 子軌域存有不70全性，而在内部的軌域激發電子躍遷並進 行光波長之選擇吸收’ gj此不會影_基礎玻璃或炫融環 i兄等而可大致穩疋地進行著色。例如，使用過渡金屬離子 時’藉由玻璃中含有Cu2+，而可製出著色成藍色的玻璃。 又’使用稀土類元素時，藉由玻璃中含有Er3+，而可製出著 色成粉紅色的玻璃。 沈第2形L、而。，係於強化玻璃中含有金屬膠體者，且 乃係藉由金屬膠體而著色之玻璃。若玻璃中存有波長小於 光的波長的膠體，則因會吸收特定(波長)之光而玻璃會著 色。例如’藉妓錢鋼之賴析出於玻射，可製作紅 色系的著色玻璃。 就第3形態而言’係藉由將結晶的微粒子析出至強化玻 璃中，使入射光散射而辨識為乳白色之玻璃。 以上業經著色的強化玻璃之吸收波長會因著色成分等 而異。在本發明之坡璃之表面應力測定裝置及方法中，係 藉由將源自於光源之光的波長設成在前述強化玻璃的吸光 係數為4.5mm·1以下之波長區具有中心波長的單色光，使已 24 201245690 入射之光在表面層傳播時不會被著色成分所吸收，進而可 從所射出之光清晰地辨識干涉條紋像。又，強化玻璃亦可 為波長550nm〜650nm之光之吸光係數的最小值超過 1者。具有如上述的吸光係數的玻璃在習知的表面應 力測定裝置中並無法辨識干涉條紋像；或，即便可辨識干 涉條紋像，亦有不清晰且難以進行圖像自動處理之問題。 本發明人使用習知的表面應力測定裝置來測定波長550nm 〜650nm之光的吸光係數的最小值略微超過umm·1之業經 著色的強化玻璃之結果，並無法辨識干涉條紋像。但藉由 使用本發明之表面應力測定裝置、及方法來測定波長55〇nm 〜65011〇1之光之吸光係數的最小值超過1.7mm-1之強化玻璃 時，可明確地辨識干涉條紋像，且可進行正確的表面應力 測定。 就強化玻璃中之強化方法而言，有風冷強化法及化學 強化法本發明不論是以何種方法進行強化處理的玻璃皆 可適用ϋΐ冷強化法係對已經過一次加熱處理之玻璃板釋L -^tr ~J Background of the Invention Self-learning, AV machines, 〇A machines and other operation panels or switch doors are often used with metallic panels or black panels. These panels are coated on a resin or a metal with a desired color paint, and therefore have problems in terms of durability such as peeling due to use over a long period of time. Moreover, when these panels are used as a structural material or as a switch door, it is required to have high strength. In the case of a portion which is suitable for use in the case of a black glass which is required to have both the above-mentioned durability and high strength, the applicant has filed a patent application as a glass of the patent document. However, as a method for increasing the strength of the glass, it is generally known that the method for forming a compressive stress layer on the surface of the glass is a method for forming a compressive stress layer on the surface of the broken surface, and represents: air-cooling strengthening method (physical Strengthening method) 'The glass plate is heated to the surface of the glass plate near the softening point by air-cooling, etc., and the temperature is cooled, and the temperature is below the glass transition point, and the glass plate is ion exchanged. Alkali metal ions with a small ionic radius on the surface (typically u ions, Na ions) are exchanged for the 201245690 ion with a larger ionic radius (typically Na or K ions relative to Li ions, relative to !^3 ions) It is a cesium ion). It is important to measure the amount of compressive stress in the quality control by the glass obtained by forming the compressive stress layer on the surface of the glass in order to confirm the strength of a certain amount. For example, in Patent Document 2, a surface compressive stress (hereinafter also referred to as CS) and a surface compressive stress layer depth (hereinafter also referred to as d〇) for measuring the compressive stress amount of glass in a non-destructive manner are proposed and put into practical use. L) method. The measurement method uses the refractive index of the compressive stress layer formed on the surface of the glass to be different from the refractive index of other glass portions having no compressive stress layer to exhibit the effect of the optical waveguide. CITATION LIST Patent Literature Patent Literature 1: Japanese Patent Application No. 2009-285377 Patent Document 2: JP-A-53-136886, No. 53-136886, the present invention, the subject of the invention, but in a non-destructive manner The above-mentioned devices for measuring CS and DOL have further confirmed that the above-mentioned devices are measured in a non-destructive manner (the devices of 8 and ^1 are observed by emitting light of the surface layer of the glass raft, so that ' It is impossible to measure the aforementioned colored glass having a low transmittance in a visible region exhibiting black color. At this time, 'except for the use of the strength measurement test which is accompanied by the deflection strength or crack formation load damage, or the sample 4 which must be used for the measurement of birefringence 201245690 The need for processing · or the use of EPMA (Electron Probe Micro Analyzer) for chemically strengthened glass to measure the depth of the diffusion layer of potassium is a very time-consuming method. The method of strength and strength, and the accuracy of the measured data is low and lacks reliability. The object of the present invention is to provide a measurement of the visible region. The present invention provides a glass surface stress measuring device (hereinafter sometimes referred to as a surface stress measuring device for glass of the present invention) which is used for solving the problem of the surface stress of the colored glass having a low transmittance. The light supply member is configured such that light from the light source is incident into a surface layer of the tempered glass; and the light extraction member causes light propagating in a surface layer of the tempered glass to be And emitting the light outside the tempered glass; and separating the emitted light into two kinds of optical knives that are parallel and perpendicular to the boundary surface between the tempered glass and the light absorbing member, and so on Converted into a bright line or a dark line; and the light incident on the light conversion member is monochromatic light having a central wavelength in a wavelength region in which the light absorption coefficient of the tempered glass is lower. Further, the surface stress measurement of the glass of the present invention The device is characterized in that: the tempered glass is colored glass. Further, the surface stress measuring device for glass of the present invention is characterized by: The light source is a monochromatic light having a central wavelength in a wavelength region in which the light absorption coefficient of the tempered glass is 4.5 mm or less. Further, the surface stress measurement device of the glass of the present invention is characterized in that: 201245690 A band pass filter or a single light meter is provided between the light source and the tempered glass or between the light extraction member and the light conversion member, and the band pass filter or the single light meter is from the aforementioned emitted light 撷The monochromatic light in the wavelength region of the tempered glass having a light absorption coefficient of 4.5 mm·1 or less is taken out. Further, the surface stress measuring device for glass of the present invention is characterized in that: the light-based wavelength region derived from the light source is 7〇〇 Further, the surface stress measuring apparatus for glass of the present invention is characterized in that monochromatic light having a light-based wavelength region of 2 〇〇〇 nm or less is derived from the light source. Moreover, the surface stress measuring apparatus for glass of the present invention is characterized in that the light source is a light-emitting diode. Further, the surface stress measuring apparatus for glass of the present invention is characterized in that the light source is a laser. Further, the surface stress measuring apparatus for glass of the present invention is characterized in that the minimum value of the light absorption coefficient of the tempered glass at a wavelength of 550 nm to 650 nm exceeds 1.7 mm·1. Further, the surface stress measuring apparatus for glass of the present invention is characterized in that the tempered glass is colored by containing a metal ion. Moreover, the surface stress measuring apparatus for glass of the present invention is characterized in that the tempered glass is colored by depositing a metal colloid. Further, the surface stress measuring apparatus for glass of the present invention is characterized in that the tempered glass is colored by precipitation of crystals. Further, the surface stress measuring apparatus for glass of the present invention is characterized in that the tempered glass is chemically strengthened. Further, the surface stress measuring apparatus for glass of the present invention is characterized in that: 201245690 ^ further includes: an image pickup element for imaging an open line or a dark line which has been converted by the light conversion member; and an image The processing device emphasizes the line of the bright line or the dark line from the image obtained by the image pickup element. Further, the surface stress measuring apparatus for glass of the present invention is characterized in that: the measuring means' measures the surface stress of the tempered glass according to the open line or the dark line converted by the light converting member; and the measurement The mechanism uses a photoelastic constant of the tempered glass at a wavelength that is substantially the same as a monochromatic light having a central wavelength in a wavelength region in which the absorbing glass has an absorption coefficient of 4.5 mm-1 or less. The present invention provides a method for measuring surface stress of glass (hereinafter sometimes referred to as a method for measuring surface stress of glass of the present invention) for determining surface stress of tempered glass, which has the following steps: a step of incident light of the light source into the surface layer of the tempered glass; a step of causing the light to propagate in the surface layer of the tempered glass; a step of emitting the propagated light to the outside; separating the emitted light into a step of causing two kinds of light components to be vibrated in parallel and perpendicular to the glass surface; a step of converting the separated two kinds of light components into a dark line column or an open line column; and measuring the foregoing according to the dark line column or the bright line column a step of strengthening the surface stress of the glass; and 'the monochromatic light which is separated in the separation step, and having a central wavelength in a wavelength region in which the absorption coefficient of the tempered glass is 4.5 mm·1 or less. Further, the method for measuring the surface stress of the glass of the present invention is characterized in that the tempered glass is subjected to a coloring treatment. Further, in the method for measuring the surface stress of a glass according to the present invention, the light-based monochromatic light derived from the light source has a center wavelength in a wavelength region in which the light absorption coefficient of the tempered glass is 4.5 mm-1 or less. Further, the method for measuring the surface stress of the glass of the present invention is characterized in that it is a monochrome color of a wavelength region of the tempered glass having a light absorption coefficient of 4.5 mm-1 or less which is obtained by using a band pass filter or a single light meter. Light is incident on the surface layer of the tempered glass. The method for measuring the surface stress of the glass of the present invention is characterized in that it absorbs the absorption coefficient of the tempered glass which is obtained by using a band pass filter or a single light meter. The monochromatic light in the wavelength region of 4.5 mm·1 or less is separated into two kinds of light components which are vibrated in parallel and perpendicular to the glass surface. Further, in the method for measuring the surface stress of a glass according to the present invention, the monochromatic light system uses monochromatic light having a wavelength region of 700 nm or more. Further, the method for measuring the surface stress of the glass of the present invention is characterized in that monochromatic light having a light-based wavelength region of 2000 nm or less is derived from the light source. Further, the method for measuring the surface stress of the glass of the present invention is characterized in that the minimum value of the absorption coefficient of the tempered glass at a wavelength of 550 nm to 650 nm exceeds 1.7 mm·1. Further, the method for measuring the surface stress of the glass of the present invention is characterized in that the tempered glass is colored by containing a metal ion. Further, the method for measuring the surface stress of the glass of the present invention is characterized in that the tempered glass is colored by precipitation of a metal colloid. Further, the method for measuring the surface stress of the glass of the present invention is characterized in that the tempered glass is colored by precipitation of crystals. 201245690 Further, the method for measuring surface stress of a glass according to the present invention is characterized in that the tempered glass is chemically strengthened. Further, the method for measuring the surface stress of a glass according to the present invention is characterized in that: the step of imaging the converted open line or dark line; and the step of performing image processing, the image processing is performed by The image obtained by the imaging described above emphasizes the line of the bright line or the line of the dark line; and the surface stress of the tempered glass is measured based on the above-mentioned bright line or the dark line. Further, in the method for measuring the surface stress of a glass according to the present invention, the step of measuring the surface stress of the tempered glass is to use a photoelastic constant of the tempered glass at a wavelength of the light absorbing system of the tempered glass. The wavelength region of 4.5 mm_1 or less has substantially the same wavelength as the monochromatic light of the center wavelength. EFFECT OF THE INVENTION According to the present invention, even if the transmittance is low in the visible region and the colored tempered glass is colored, the surface compressive stress and the surface compressive stress layer depth can be measured in a non-destructive manner. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view showing a first embodiment of a surface stress measuring device for glass and a method for measuring surface stress of glass according to the present invention. Fig. 2 is a schematic view showing a second embodiment of the surface stress measuring device for glass and the method for measuring the surface stress of glass in the present invention. Fig. 3 is a schematic view showing a third embodiment of the surface stress measuring device for glass and the method for measuring the surface stress of glass in the present invention. 201245690 Fig. 4 is a schematic view showing the configuration of a light conversion member provided in the surface stress measuring device for glass of the present invention. Fig. 5 is a schematic view showing the configuration of an image processing apparatus provided in the surface stress measuring apparatus for glass of the present invention. Fig. 6 is a view showing interference fringes (open line or dark line) in the display provided in the surface stress measuring device for glass of the present invention. Fig. 7 is a view for explaining the method of measuring the photoelastic constant Kc in the present invention. Fig. 8 is a graph showing the relationship between the absorption coefficient and the wavelength of the colored glass used in the examples. Fig. 9 is an image of the interference fringe of the colored glass C of the embodiment at a wavelength of 600 nm. Fig. 10 is an image of interference fringes of the colored glass D of the embodiment at a wavelength of 600 nm. Fig. 11 is an image of interference fringes of the colored glass C of the embodiment at a wavelength of 790 nm. Fig. 12 is an image of the interference fringe of the colored glass D of the embodiment at a wavelength of 790 nm. [Embodiment 3] The present invention is a schematic view of a surface stress measuring device 10 for a glass according to a first embodiment of the present invention. The medium (light 10 201245690 supply member) which causes light to enter the surface of the tempered glass of the object to be measured is in a state in which the surface of the optical glass-shield glass is in optical contact with each other. Similarly, the medium (light extraction member) that emits light propagating on the surface layer of the tempered glass to the outside of the tempered glass is in a state in which the edge of the optically creased glass is strengthened and the glass surface is closed. . In the tempered glass surface, in order to optically inject and eject the light-permeable material, the refractive index of the recorded glass is larger than that of the tempered glass. The light source can be placed in a sulfur manner from the ridge of the light supply member to the surface layer of the reinforced glass. The light conversion member is disposed such that light propagating on the surface layer of the strong glass can be emitted from the pupil of the light extraction member. The light-converting member is in a direction in which the light propagating in the surface layer of the tempered glass is 'separated from the propagating light to the boundary surface of the light-providing glass surface between the light-feeding members—that is, the exit surface—for parallel and vertical The two types of light components are vibrated, and each of the components is converted into a bright line or a dark line. The light conversion member is provided with a mechanism for adding a bright (four) or dark line as an interference fringe image. The device is configured to measure the compressive stress (CS, DOL) of the tempered glass. The tempered glass is chemically strengthened or air-cooled and reinforced. <> The refractive index layer has a higher refractive index than the glass portion other than the compressive stress layer. Moreover, the refractive indices monotonously increase from the bottom of the compressive stress layer toward the surface. X' of this compressive stress 曰 also unilaterally increases the absolute value toward the surface. Therefore, there will be: a score: relative to the vertical vibration of the surface of the broken surface and the relative refractive index curve parallel to the ruthenium, resulting in different optical waveguide effect 201245690, by the formation of The interference fringe image is compared to calculate the surface compressive stress of the tempered glass and the depth of the surface compressive stress layer. Therefore, in the surface stress measuring device (7) using the optical waveguide effect described above, it is necessary to obtain an interference fringe image composed of a bright line or a dark line formed by light that vibrates vertically toward the glass surface and light that vibrates in parallel to the glass surface. 0 However, in the existing glass surface stress measuring device, when the reinforced glass is colored, the light derived from the light source is absorbed by the metal ions of the colored component when the surface layer of the tempered glass propagates, and it is difficult to The problem of interference fringe images is identified by the emitted light. On the other hand, in the surface stress measurement device 1 of the present invention, the wavelength of the light from the light source incident on the light supply member is a wavelength at which the absorption coefficient of the tempered glass of the object to be measured is 45 mm or less. Since the region has monochromatic light of a central wavelength, even if the tempered glass is colored, the interference fringe image can be clearly observed. Therefore, the CS and DOL of the tempered glass can be measured non-destructively and accurately. The method of calculating the absorption coefficient in the present invention is as follows. Both sides of the glass plate were mirror-polished and the thickness t was measured. The spectral transmittance T of the glass plate (for example, an ultraviolet visible near-infrared spectrophotometer V_57〇 manufactured by JASCO Corporation) was measured. Then, the absorption coefficient J3 is calculated using τ = 1 、 and the relational expression. As described above, it is preferable to use a monochromatic light having a central wavelength in a wavelength range in which the tempered glass of the object to be measured is emitted in a wavelength range of 1 or less. When the fortified lang is colored, it will be caused by the presence of metal ions or 12 201245690. On the other hand, by treating the light source by the method of ', the light absorption in the tempered glass can be reduced, and the measurement of the surface stress layer with high precision can be performed. - In the light, "strengthen the light absorption coefficient of the wavelength of more than 4.5mm · 1 wavelength, it will be difficult to identify the interference fringe because of the weak light emitted by the above - mentioned It is not preferable as the light source of the present invention. Further, in the light source of the light source, the light absorption coefficient of the light-increasing surface is light of a wavelength of 4 Å or less, and it is preferable to use the light absorbing material of the tempered glass as the light source of the light source having a light absorption coefficient of ^ and lower. 2 sun, 丨 the following wavelength of light. The light 1 original /, the light source itself can be emitted in the wavelength region of the strengthened glass having a medium read length of monochromatic light in the wavelength region of ^5. Moreover, the light source is not monochromatic light, and a mechanism such as a band pass 'wave filter or a single light meter that can monochrome light between the light source and the tempered glass can be used, thereby being derived from: tempered glass The light of the light source is monochromatic light. Further, even if the light source of the light source is used to make the light from the light source have a single-color light having a narrow half-value width, the light-receiving device can be monochromaticized. By using a monochromatic light having a narrow half-value width as a light source, it is possible to eliminate the (four)' of other wavelengths as much as possible to obtain a sharper interference fringe image. It is preferable to use monochromatic light having a wavelength region of 700 nm or more from the light source. Dreaming, even if it is a black glass that hardly transmits visible light, the CS and DOL of the surface stress layer can be accurately measured. Further, in the case of the conventional surface stress measurement method and method, even if the color of the interference fringe image cannot be recognized due to the measurement wavelength, the measurement can be performed. On the other hand, the light originating from the light source can be used as long as the single color (four) of the wavelength region 7 or more, and it is preferable to use a shorter wavelength in the wavelength of the infrared region. The reason for this is that if the light having a long wavelength of the light source is used, the change in the refractive index fluctuation with respect to the glass becomes dull, and the number of the obtained interference fringes is reduced, and the measurement accuracy of the DOL tends to be lowered. Further, the sensitivity of the image pickup element is better in the infrared region as the wavelength is shorter, and the accuracy of the device can be improved. In addition, when a band-pass filter is used, a filter having a shorter wavelength can obtain a filter having a narrower half-value width, and the accuracy of the device can be improved. From the above, it is understood that the light originating from the light source is preferably monochromatic light having a wavelength region of 2 〇〇〇 nm or less, preferably monochromatic light having a wavelength region of 1500 nm or less, and the most suitable color is monochromatic light having a wavelength region of 950 nm or less. . The light source can be used in any kind as long as it can obtain a desired monochromatic light, and for example, a light-emitting diode or a laser can be suitably used. Since the light-emitting diodes can obtain a wide variety of center wavelengths, it is possible to appropriately select a light source that responds to the characteristics of the absorption coefficient of the tempered glass. Also, since the life of the light source is long, the switching frequency can be lowered. Since the laser can obtain monochromatic light having a high output, a narrow half-value width, and a linearly polarized light, the measurement accuracy can be improved even without using a band pass filter or the like. Further, by using the lightning ray filter and the laser of one of the band pass filters in combination, it is also possible to make a monochromatic light having a very narrow half-value width. Others, when a mechanism capable of monochromaticizing light such as a band pass filter or a single light meter is used, a light source such as a xenon lamp, a metal gutta lamp, or a mercury lamp can be used. An optical glass crucible having a refractive index higher than that of the strong glass of 201224690 can be used for the light supply member and the light extraction member, respectively. λ, the light supply member 稜鏡 and the light extraction member 稜鏡 may be an individual body as shown in Fig. 1, or may have an integral structure. I. It is also possible to make these L-body structures on the premise that there is a light-shielding mechanism between the 垓 and so on. The purpose of the shading mechanism is to eliminate the need for unwanted light to enter the pupil of the light extraction member. As the light shielding means, a shielding plate made of metal or the like or a shielding film made of a metal thin film can be used. Moreover, when only the surface of the reinforced glass is adhered to each other and the light cannot be smoothly incident or emitted, the refractive index and each of the 验-positive specimens are interposed between the tempered glass and the prisms for optical operation. Sexual contact. The light-converting member is for observing a surface layer from which light from a light source is incident to the reinforced glass, a light propagating on the surface layer, and emitted from the surface layer. The light emitted from the tempered glass generates birefringence between the light in the direction of the vibrating surface along the surface of the glass and the light perpendicular to the direction due to the surface compressive stress of the surface layer. Although the two have the same index of refraction, the effective refractive indices are different, so the angles of refraction are different by one, by observing the dark lines of the light that oscillate in the parallel direction of the incident surface of the emitted light, and the incidence of the emitted light. Both the dark line formed by the vibrating light in the vertical direction can measure the two and the DOL. In the method of taking out the two kinds of light components from the emitted light, a single- or plural-numbered polarizing plate 4 can be used, and the interference obtained by the total column obtained by (4) can be made. Method of description: ^ Use the eyepiece to measure the micro-country financial reading job; or use a solid-state imaging device such as CCD or CMOS to analyze the obtained interference fringe line image to calculate CS and DOL Method, etc. In addition, a band-pass filter or a single-light meter is disposed before the m 15 201245690 in the case where the light of the 浐 is only abruptly emits a monochromatic light of a specific wavelength. Further, the configuration of the light conversion member is not limited to the above embodiment, and a known one may be used. (Second Embodiment) Next, a glass surface stress measuring device 20 and a glass surface stress measuring method according to a second embodiment of the present invention will be described. Fig. 2 is a schematic view showing a surface stress measuring device 2 for glass according to a second embodiment of the present invention. In the glass surface stress measuring device 2 of the second embodiment, a band pass filter or a single light meter is provided between the light extraction member and the light conversion member, and the lift filter or the single light meter can be emitted from the exit pupil. The light of the member is taken out to extract the monochromatic light in the wavelength region of the tempered glass of the measurement object of 4.5 mm·1 or less and the light from the light source is not limited to the monochromatic light, except for the above two points. Since it is the same as the surface stress measuring apparatus 10 of the glass of the first embodiment described with reference to Fig. 1, the description thereof is omitted. In the case of measuring a glass which hardly transmits visible light, for example, a glass which exhibits black color, since a light in a wavelength region of the transmissive glass is used in the measurement system, it is preferable to use a light source having a large amount of light. At that time, even if the light source itself is not a person who emits monochromatic light, since a band pass filter or a single light meter capable of extracting monochromatic light of a specific wavelength is provided between the light extraction member and the light conversion member, it is obtained that - The monochromatic light of the above light amount is determined, and in this way, a sharp interference fringe image can be obtained. Further, by cutting off the light of the wavelength irrelevant to the measurement before the light conversion member, it is possible to eliminate the noise caused by the light of the wavelength which is not measured, and to obtain the interference fringe image of the invention. The monochromatic light extracted by the band pass filter or the single light meter must be the light having a light absorption coefficient of the tempered glass of the measurement target of 4.SmnT1 or less. When the monochromatic light in the wavelength region of the tempered glass exceeds the wavelength of 16 201245690 4.5 mm 1 , the light entering the light conversion member becomes weak and it is difficult to recognize the interference fringe image, which is not preferable. As a light source having a large amount of light, a known light source such as a xenon lamp, a metal lamp, or a mercury lamp can be used. Further, in order to remove the influence of the desired wavelength from the light emitted from the light-harvesting member, it is preferable that the band-passing wave or the single-light meter can extract a single-color light having an extremely narrow half-value width. It is preferable to use monochromatic light having a wavelength of 70 〇 nm or more in a monochromatic light taken out by using a band pass filter or a single illuminator. Thereby, even if the glass which hardly transmits visible light is a black glass, the CS and DOL of the surface stress layer can be measured accurately. Further, the conventional surface stress measuring apparatus and method can be measured even if the colored glass of the interference fringe image cannot be recognized by the measurement wavelength. Further, the monochromatic light extracted by the band pass filter or the single light meter can be used as long as it is monochromatic light having a wavelength region of 700 nm or more, and it is preferable to use a shorter wavelength in the wavelength of the infrared region. The reason for this is that when light having a long wavelength is used for the light source, there is a fear that the change in the refractive index fluctuation with respect to the glass becomes dull, and the number of obtained interference fringes is reduced, and the measurement accuracy of DOL tends to be lowered. Further, the sensitivity of the image pickup 70 is better in the infrared region as the wavelength is shorter, and the accuracy of the device can be improved. In addition, when a band-pass filter is used, a filter having a shorter wavelength can obtain a filter having a narrower half-value width, and the accuracy of the device can be improved. As described above, the monochromatic light is preferably monochromatic light having a wavelength region of 2000 nm or less, more preferably monochromatic light having a wavelength region of 15 Å or less, and most preferably monochromatic light having a wavelength region of 950 nm or less. (Third Embodiment) 17 201245690 Fig. 3 is a schematic view showing a glass surface stress measuring device 30 according to a third embodiment of the present invention. Here, the surface stress measuring device 30 for glass and the method for measuring the surface stress of glass according to the third embodiment of the present invention will be described. In the case of colored glass, compared with the conventional transparent glass, since the light transmittance of the former is low, the boundary of the bright line or the dark line obtained by the light conversion member becomes blurred, and It is impossible to calculate the correct amount of surface stress (CS, D〇L). For example, the surface compressive stress depth (DOL) is specified by interference fringes formed by light reflected from the deepest portion in the depth direction. However, the optical path length of light reflected from the deepest portion propagates in the glass is long, so that the attenuation of light (freeness) is increased and it is difficult to clearly recognize it as interference fringes. As described above, in the third embodiment, the image of the obtained bright line or dark line is image-processed, and the bright line or the dark line is emphasized, thereby giving a relatively accurate surface stress (CS). , DOL). Hereinafter, the glass of the surface stress measuring device 3A of the third embodiment will be described with reference to FIG. 3, and the glass of the first and second embodiments described with reference to FIGS. 1 and 2 will be described. The configuration of the surface stress measuring device 1A is denoted by the same reference numeral and the description thereof will not be repeated. (Structure of Surface Stress Measurement Device 3 of Glass) The surface stress measurement device 3 for glass according to the third embodiment includes a light source 2, a band pass filter 3, a light supply member 4, a light extraction member 5, and a light conversion member 6A. And an image processing device η. Fig. 4 is a schematic view showing the configuration of a light conversion member 6A provided in the surface stress measuring device 3 of the glass. The light conversion member 6 includes a lens, a polarizing plate 6b, an image sensor 6c, and a frame 6d. The lens 6a converges the light emitted from the light-collecting 201245690 member 5. The polarizing plate 6b separates the light emitted from the light extraction member 5 into two kinds of light components which are vibrated in parallel and perpendicular to the boundary surface between the tempered glass 1 and the light extraction member 5. The light that has passed through the polarizing plate 6b can be recognized as a bright line or a dark line. When the separated light component is passed, it is recognized as a bright line column. When the light component other than the separated light component is passed, it is recognized as a dark line. On the other hand, the polarizing plate 6b is preferably an IR (infrared) polarizing plate. The imaging element 6c is an image sensor for observing an open line or a dark line as an interference fringe image (for example, a CCD (Charge Coupled Device) image sensor, CMOS (Complementary Metal Oxide Semiconductor: Complementary) MOS) image sensor). The imaging element 6c photoelectrically converts the light that has received light, and outputs the luminance value of each of the plurality of pixels constituting the image as digital image data to the image processing apparatus 11. Fig. 5 is a schematic view showing the configuration of the image processing apparatus 11 provided in the surface stress measuring device 3 of the glass. The image processing device 丨丨 includes an image correcting unit 11a, an emphasis unit lib, a D/A converter', and a display ud. The image correcting unit 11a performs white balance adjustment and γ correction on the digital image data output from the image pickup device 6C. The emphasis section lib emphasizes the comparison of the digital image data after correction, and emphasizes the explicit or dark line. The method of emphasizing the comparison of the bright line or the dark line can be as follows. Further, the following method can be applied to the entire interference fringe image obtained by the image pickup device 6c. It is also applicable only to a specific image region in which light attenuation is large. For example, in order to specify the deepest portion of the surface compressive stress depth, image processing that emphasizes only the image region 19 201245690 corresponding to the deepest portion can be performed. (First method) In the first method, the brightness value of each pixel constituting the image is compared with a threshold value which is previously recalled, and the binarization processing is performed to emphasize the bright line or the dark line. For example, when the brightness value is set to 0 (minimum brightness: black) to 255 (maximum brightness: white), the brightness value of a pixel having a brightness value exceeding a threshold (such as 127) can be made 255' and has a threshold (such as 127) The luminance value of the pixel of the following luminance value is 0' for binarization processing. (Second method) In the second method, the highlight line or the dark line column is emphasized by emphasizing the outline (edge). In the emphasis of the contour, an existing edge emphasis filter (such as a sharpness filter) can be used. The D/A converter 1 lc converts the digital image data of the highlighted line or the dark line column into analog image data that can be displayed on the display Ud. For example, the display device may be a liquid crystal display or a CRT (Cath〇deRayTube), and an image corresponding to the analog image output from the D/A (four) device 丨丨e may be displayed on the screen. (Calculation of CS and DOL) Fig. 6 is a schematic view showing an open line or a dark line of the display 1 Id. And the bright line column or the dark line column on the left side of the sixth figure is a vertical line with respect to the boundary surface of the tempered glass 1 and the optical operation member 5 (four), the open line or the dark line 歹 JX the right side of the sixth figure The column or the dark line is a line or dark line of the points of the parallel vibration with respect to the boundary (4) of the tempered glass 1 and the Genna member 5. 20 201245690 From the interference fringes displayed on the display 11d, the surface compressive stress (cs) and the surface compressive stress layer depth (DOL) can be calculated. Specifically, the surface compressive stress (cs) can be calculated from the distance difference Δt (see FIG. 6) of the bright line column or the dark line column separated by the light conversion member 6 A, and the open line column or the dark line column is The two kinds of light components that are parallel and perpendicular to the boundary surface of the tempered glass 1 and the light extraction member 5 are vibrated. Further, the surface compressive stress layer depth (DOL) can be calculated from the number of open line columns or dark line columns. 'To calculate the surface compressive stress (CS) and the surface compressive stress layer depth (D〇L), the photoelastic constant Kc is used, and the photoelastic constant Kc is actually substantially the same as that of the light source incident on the tempered glass. The photoelastic constant of the aforementioned tempered glass at a wavelength. That is, the photoelastic constant of the tempered glass at a wavelength substantially the same as the monochromatic light incident on the light-converting member, and the monochromatic light has a wavelength at which the absorption coefficient of the tempered glass is 4_5 mm-1 or less. Center wavelength. This is because the photoelastic constant obtained depending on the wavelength used varies. Here, the "substantially the same wavelength" as used herein means a wavelength in the range of several nm to several tens of nm centering on the same wavelength. (Method for Measuring Photoelastic Constant Kc) Here, the photoelastic constant Kc is a constant indicating the relationship between the stress F and the optical path difference due to birefringence (5), and when the glass thickness is d, the following is satisfied (1) Relationship δ δ = Kc · d · F---(l) That is, when the photoelastic constant Kc of the tempered glass is to be measured, the photoelastic constant KC must be measured by adding stress to the reinforced slope. When the tempered glass to be measured for the surface compressive stress (CS) and the surface compressive stress layer depth (d〇l) is colored glass, if the tempered glass is too thick, there is a fear that the amount of light passing through the tempered glass is insufficient. If the photoelastic constant Kc is sufficient, the correct photoelastic constant 5^ cannot be obtained. On the other hand, if the tempered glass is too thin, the tempered glass cannot withstand the applied stress and is damaged. Fig. 7 is a view for explaining a method of measuring the photoelastic constant 1 in the present invention. Hereinafter, a method for measuring the photoelastic constant Kc in the present embodiment will be described with reference to Fig. 7. Taking the 4-point deflection method as an example The measurement method of the property constant K c is described, and the tempered glass 1 of the photoelastic constant Kc is applied with a force jp from four points to impart a flexural stress. The light source 101 is emitted from the light source 101. Monochromatic light having a center wavelength and a wavelength region of 7 〇〇 nm or more and 2000 nm or less in a wavelength region of 4 5 nm-i or less is preferably a monochromatic light having a wavelength region of 7 〇〇 nm or more and 1500 nm or less. The wavelength of the monochromatic light of the light source 1〇1 is substantially the same as the wavelength of the light in the light conversion member of the surface stress measuring device incident on the glass. The polarizing plates 102 and 104 are sandwiched by the photoelastic constant 1 (^ The tempered glass 1 and the Babinet correction plate 103 of the object are arranged to be orthogonal to each other, that is, a phase deviation of 90 degrees. The polarizing plate 1〇2 only polarizes light emitted from the light source 1〇1 to a specific one. The light component of the direction passes, and the polarizing plate 1〇4 transmits only the light which is transmitted through the tempered glass 1 and is polarized in a direction orthogonal to the polarization direction of the polarizing plate 1〇2. The Babinet correction plate 1()3 is a compensating plate made of crystal. Photodetector 105 is a light that has passed through the polarizing plate 1〇4. 22 201245690 . However, the force F is applied by a load applying mechanism (not shown) such as a loader. As shown in Fig. 7, in the present invention, The thickness of the tempered glass is made to a thickness derived from the light transmissibility of the light source 101, and the load is applied in a direction from the thickness side of the tempered glass 1 instead of the thickness direction of the tempered glass i. Therefore, it is possible to suppress the problem that the photoelastic constant Kc cannot be measured by the insufficient amount of light in the tempered glass, or to suppress the problem that the value of the correct photoelastic constant Kc cannot be obtained. Further, it is also possible to suppress the tempered glass 1 from being unbearable. The problem of damage and damage. As described above, in the present invention, since the image processing is performed to emphasize the bright line or the dark line, the amount of surface stress (CS, DOL) of the tempered glass crucible can be more accurately measured. Further, the measurement of the photoelastic constant Kc used for calculating the surface compressive stress (cs) and the surface compression stress (D0L) is actually a light conversion using a surface stress measuring device incident on the tempered glass 1. Light having a wavelength of substantially the same wavelength in the member, that is, monochromatic light having a center wavelength in a wavelength region of the tempered glass having an absorption coefficient of 4.5 mm·1 or less and a wavelength region of 700 nm or more and 2000 nm or less. Therefore, the amount of surface stress (CS, DOL) of the tempered glass 1 can be measured more accurately. Further, the light used for the photoelastic constant Kc is preferably a monochromatic light having a wavelength region of 7 〇〇 nm or more and 2 〇〇〇 nm W. The object of the present invention is to determine the surface stress of the tempered glass which has been colored by the glass itself. The tempered glass which has been subjected to coloring treatment has, for example, the following forms. In the first embodiment, the tempered glass contains a metal ion, and is a glass which is colored by absorption of light of a specific wavelength of a metal ion. When the transition gold >1 element or the rare average element contained in the glass of 2012 2012690 is associated with a complex atomic valence, the glass will have a specific color due to the wavelength of the light absorbed during the electron transition. Since the transition metal ions of the fused glass are strongly affected by the anion adjacent to the outer shell, the wavelength of the light absorbed by the elemental glass composition, the ship «, and the additive component (4) is affected. x, because the atom of the rare earth element is reduced in electrons close to the outer shell to complete the electron (4), so that it is located in the inner electronic domain, there is not 70 fullness, and in the inner orbital domain, the electronic transition is excited and light is carried out. The selection of the wavelength absorbs 'gj, which does not affect the basic glass or the sleek ring, and can be colored substantially stably. For example, when a transition metal ion is used, a glass colored in blue can be produced by containing Cu2+ in the glass. Further, when a rare earth element is used, it is possible to produce a glass colored in pink by containing Er3+ in the glass. Shen 2nd shape L, and. It is a glass containing a metal colloid in tempered glass and is a glass colored by a metal colloid. If a colloid having a wavelength smaller than the wavelength of light exists in the glass, the glass will be colored by absorbing a specific (wavelength) light. For example, 'by borrowing money from steel, it is based on glass, and it can make red colored glass. In the third embodiment, the crystal particles are precipitated into the tempered glass, and the incident light is scattered to be recognized as a milky glass. The absorption wavelength of the above-mentioned colored tempered glass varies depending on the coloring component and the like. In the apparatus and method for measuring the surface stress of the glass of the present invention, the wavelength of the light derived from the light source is set to have a central wavelength in a wavelength region in which the absorption coefficient of the tempered glass is 4.5 mm·1 or less. The color light causes the incident light that has passed through the surface of the layer 201224690 to be absorbed by the colored component, and the interference fringe image can be clearly recognized from the emitted light. Further, the tempered glass may have a minimum value of the light absorption coefficient of light having a wavelength of 550 nm to 650 nm exceeding one. The glass having the light absorption coefficient as described above does not recognize the interference fringe image in the conventional surface stress measuring device; or, even if the interference fringe image can be recognized, there is a problem that it is unclear and it is difficult to perform automatic image processing. The inventors of the present invention measured the result of the colored tempered glass having a minimum value of the light absorption coefficient of light having a wavelength of 550 nm to 650 nm slightly exceeding umm·1 using a conventional surface stress measuring device, and the interference fringe image could not be recognized. However, when the tempered glass having a minimum value of the light absorption coefficient of light of 55 〇 nm to 65,011 Å exceeding 1.7 mm-1 is measured by using the surface stress measuring apparatus and method of the present invention, the interference fringe image can be clearly recognized. And the correct surface stress measurement can be performed. In the tempered glass tempering method, there are air-cooling strengthening method and chemical strengthening method. The glass which is reinforced by any method in the present invention can be applied to the tempering strengthening method for the glass sheet which has been subjected to one heat treatment.
、風進行冷卻，藉以在表面形成壓縮應力之方法。又， 化學強化法則是例如藉由將鈉舞玻璃放入已加熱到380°C 肖酸鉀祕鹽巾，引發驗料的離子錢(使玻璃成 離子與離子半徑較大⑽融鹽中之_子進行離子 私在«表㈣成壓誠力之方法。各強化 率不同^ =的表㈣形成表轉_，且該等之折射 门於表面壓縮層以外的坡 論是進P刀之折射率。因此，不 了何種強化處理的強化玻璃，皆可以已採用表面 25 201245690 層之光波導放果的本發明之表面壓縮測定裝置、及方法來 進行測定X，就強化玻璃而言，亦包含下述形態之玻璃： -種層積有不同熱膨脹係、數的玻璃之複層構造玻璃 ，且表 層玻璃為著色玻璃。又，著色玻璃之形態純含：在成為 核心之玻璃的表面上’塗佈有熱膨脹係數與成為核心 之玻 璃的熱膨脹係數不同之著色釉的玻璃。 實施例 作為業經著色的強化玻璃，係準備了下述4種玻璃， 即’以氧化物為基準之莫耳百分率表示計，由si〇2: 61 9%、The wind is cooled to form a compressive stress on the surface. Moreover, the chemical strengthening rule is, for example, by placing the sodium dance glass into a salt of potassium silicate which has been heated to 380 ° C, and causing the ion money of the sample (to make the glass ion and the ionic radius larger (10) melted in the salt _ The method of ion privacy is shown in Table (4). The table (4) with different enhancement rates is formed by the table (4), and the slope of the refraction gate outside the surface compression layer is the refractive index of the P-knife. Therefore, the tempered glass of the reinforced glass can be measured by the surface compression measuring apparatus and method of the present invention using the optical waveguide of the surface 25 201245690 layer, and the tempered glass is also included. The glass of the above-mentioned form: - a laminated glass having different thermal expansion systems and a number of layers, and the surface glass is colored glass. Further, the form of the colored glass is purely contained: 'coating on the surface of the glass which becomes the core There is a glass of a colored glaze having a coefficient of thermal expansion different from that of the glass which becomes the core. EXAMPLES As the tempered glass which is colored, the following four types of glass are prepared, that is, 'the oxide based on the oxide Fraction meter represented by si〇2: 619%
Na20 : 11.5%、κ2〇 : 3.9%、MgO : 10.6%、Al2〇3 : 5.8%、 ZrO : 2.4%、Co3〇4 : 0.4%、Fe203 : 3.3%及S03 : 0.4%所構 成且呈現黑色之板狀玻璃（玻璃A);由Si02 : 62.1%、Na20 : 11.6%、K20 : 3.9%、MgO : 10_6〇/〇、Al2〇3 : 5_80/〇、ZrO : 2·4°/〇、Fe203 : 3.3%及S03 : 0.4%所構成且呈現黑色之板狀 玻璃（玻璃B);由 Si02: 62.0%、Na20: 12.0%、K20: 3.9%、 MgO : 10.1%、Α12〇3 : 7.7%、ZrO : 0.5%、Co304 : 0.4%、 Fe203 : 3·3%及S03 : 0.1%所構成且呈現黑色之板狀玻璃（玻 璃C);以及由 Si02 : 63.8%、Na20 : 10_5%、K20 : 4.0%、 MgO : 10.4%、Α12〇3 : 8.0%、ZrO : 0.4%、Co3〇4 : 〇.〇5〇/〇、 Ti02 : 0.3%、NiO : 0.65%及S03 : 〇.1〇/。所構成且呈現黑色 之板狀玻璃（玻璃D)。 將該等玻璃A〜D浸潰於450°C溫度的KN〇3炫融鹽中ό 小時進行化學強化處理。對該等玻璃Α〜D使用ΕΡΜΑ進行 深度方向的鉀濃度分析結果發現’在自表面起至30/2 m左右 26 201245690 • 之深度為止之間，有產生離子交換且有生成壓縮應力層。 玻璃Α及玻璃Β的吸光係數與波長之關係顯示於第8圖 中〇 就玻璃A〜玻璃D，針對使用鈉燈作為光源，並使用波 長600nm作為測定光之情況，確認以表面應力測定裝置是否 可觀察到干涉條紋像。而，玻璃A在波長6〇〇nm下之吸光係 數為5.7mm·1 ’玻璃B在波長6〇〇nm下之吸光係數為 1.37mm 1。玻璃C在波長6〇〇nm下之吸光係數為5.47mm·1， 玻璃D在波長600nm下之吸光係數為丨37mm-i。 就結果而言，玻璃B有觀察到干涉條紋像，相對於此， 玻璃A則無法確認干涉條紋像。其原因認為是因為波長 - 600nm的入射光在玻璃A的表面層傳播時會被吸收，而使射 出光極度微弱。 接下來’就玻璃A，針對使用紅外線發光二極體作為光 源’並使用波長850nm作為測定光的情況，確認以表面應力 測定裝置是否可觀察到干涉條紋像。而，玻璃A在波長 850nm下之吸光係數為l.nmrrT1。 就結果而言，有確認出玻璃A的干涉條紋像。其原因認 為波長850nm的入射光在玻璃A的表面層傳播時，雖然一部 分會被吸收，但因其衰減量少，故仍可作為射出光被辨識。 接下來，就玻璃A，針對使用氙燈作為光源，並在光擷 取構件(稜鏡)與光轉換構件之間配置帶通濾波器，確認以表 面應力測定裝置是否可觀察到干涉條紋像。而，帶通濾波 器係使用僅選擇性地透射波長850nm附近之光者，藉此從已 27 201245690 射出玻璃A之光擷取出單色光。 就結果而言，有確認出玻璃A的干涉條紋像。其原因認 為波長850nm的入射光在玻璃A的表面層傳播時，雖然一部 分會被吸收，但因其衰減量少，故仍可作為射出光被辨識。 接著’將藉由表面應力測定裝置所觀察之玻璃c及玻璃D 的干涉條紋像顯示於第9圖及第10圖。就結果而言，玻璃c 並無法觀察出干涉條紋像。又，玻璃D則可確認干涉條紋 像。然而，干涉條紋像的右側邊界(顯示壓縮應力層之深度 之處）並不夠清晰，且無法以使用表面應力測定裝置之自動 處理的DOL之算出來獲得正確之值。 接下來，就玻璃C及玻璃D，使用紅外線發光二極體作 為光源’並使用波長790nm作為測定光之情況，確認以表面 應力測定裝置疋否可觀察到干涉條紋像。而，玻璃c在波長 790nm下之吸光係數為1.12mm·1，坡嶂〇在波長79〇nm下之 吸光係數為0.16mm’1。 將藉由表面應力測定裝置所觀察之玻璃c及玻璃〇的 干涉條蚊像顯示於第11圖及第12圖1結果而言，玻璃c 及玻璃D皆可確認到干涉條紋像。又，兩玻璃以使用表面應 力測定裝置之自動處理的DOL之算出，皆可獲得正確之值。 (其他實施形態） 上述之本發明开> 態僅為例示，本發明並不受限於該 等。光源或光轉換構件等形成各光學系之構成要素及該等 要素之組合並不特別限定如例示者，可在測定原理的範圍 内加以變更。 28 201245690 例如，亦可作為用以測定可見區之透射率低的著色強 化玻璃、及可見區之透射率高的透明強化玻璃之該兩者的 表面應力量（CS、DOL)之測定裝置來使用。藉此，便可以 相同的表面應力計來測定透明玻璃與著色玻璃。 產業上之可利用性 依據本發明之玻璃之表面應力測定裝置及玻璃之表面 應力測定方法，可非破壞性地且精度良好地測定可見區之 透射率低的著色強化玻璃之表面應力量（CS、DOL)。 I：圖式簡單說明3 第1圖係顯示本發明中之玻璃之表面應力測定裝置及 玻璃之表面應力測定方法的第1實施形態之概略圖。 第2圖係顯示本發明中之玻璃之表面應力測定裝置及 玻璃之表面應力測定方法的第2實施形態之概略圖。 第3圖係顯示本發明中之玻璃之表面應力測定裝置及 玻璃之表面應力測定方法的第3實施形態之概略圖。 第4圖係顯示本發明中之玻璃之表面應力測定裝置所 備有的光轉換構件構成之概略圖。 第5圖係顯示本發明中之玻璃之表面應力測定裝置所 備有的圖像處理裝置構成之概略圖。 第6圖係顯示於本發明之玻璃之表面應力測定裝置所 備有的顯示器中之干涉條紋（明線列或暗線列）之示意圖。 第7圖係用以說明本發明中之光彈性常數Kc的測定方 法之圖。 第8圖係顯示實施例中所使用之著色玻璃的吸光係數 29 201245690 與波長之關係圖。 第9圖係實施例之著色玻璃C在波長600nm下之干涉條 紋的圖像。 第1 〇圖係實施例之著色玻璃D在波長600nm下之干涉 條紋的圖像。 第11圖係實施例之著色玻璃C在波長790nm下之干涉 條紋的圖像。 第12圖係實施例之著色玻璃D在波長790nm下之干涉 條紋的圖像。 【主要元件符號說明】 1·..強化玻璃 2…光源 3···帶通濾波器 4···光供給構件(稜鏡） 5…光擷取構件(稜鏡） 6、6A…光轉換構件 6a…透鏡 6b…偏光板 6c…攝像元件 6cl···框體 7···表面應力層 8…源自於光源之光(入射光） 9…射出光 10、20、30…玻璃之表面應 力測定裝置 11…圖像處理裝置 11a···圖像補正部 lib···強調部 11c…D/A轉換器 lid···顯示器 HH…光源 102、104···偏光板 103…巴比内補正板 105···光偵測器 F···應力、力 △ t· ··明線列或暗線列之距離 差 30Na20: 11.5%, κ2〇: 3.9%, MgO: 10.6%, Al2〇3: 5.8%, ZrO: 2.4%, Co3〇4: 0.4%, Fe203: 3.3%, and S03: 0.4%. Plate glass (glass A); from SiO 2 : 62.1%, Na20: 11.6%, K20: 3.9%, MgO: 10_6〇/〇, Al2〇3: 5_80/〇, ZrO: 2·4°/〇, Fe203: 3.3% and S03: 0.4% of black plate glass (glass B); from SiO 2 : 62.0%, Na20: 12.0%, K20: 3.9%, MgO: 10.1%, Α12〇3: 7.7%, ZrO : 0.5%, Co304: 0.4%, Fe203: 3.3%, and S03: 0.1%, which are black plate glass (glass C); and from SiO 2 : 63.8%, Na20: 10_5%, K20: 4.0% , MgO : 10.4%, Α12〇3 : 8.0%, ZrO : 0.4%, Co3〇4 : 〇.〇5〇/〇, Ti02: 0.3%, NiO: 0.65% and S03 : 〇.1〇/. It is composed of a black plate glass (glass D). These glasses A to D were immersed in KN〇3 dahnea salt at a temperature of 450 ° C for a chemical strengthening treatment. As a result of analyzing the potassium concentration in the depth direction of the glass crucibles to D, it was found that there was ion exchange and a compressive stress layer formed between the surface and the depth of about 30/2 m 26 201245690 . The relationship between the absorption coefficient of the glass crucible and the glass crucible and the wavelength is shown in Fig. 8 in the case of glass A to glass D. For the case where a sodium lamp is used as a light source and a wavelength of 600 nm is used as the measurement light, it is confirmed whether or not the surface stress measurement device can be used. An interference fringe image was observed. Further, the absorption coefficient of the glass A at a wavelength of 6 〇〇 nm was 5.7 mm·1 ′, and the absorption coefficient of the glass B at a wavelength of 6 〇〇 nm was 1.37 mm 1 . The absorption coefficient of glass C at a wavelength of 6 〇〇 nm is 5.47 mm·1, and the absorption coefficient of glass D at a wavelength of 600 nm is 丨37 mm-i. As a result, an interference fringe image was observed in the glass B, whereas the glass A could not confirm the interference fringe image. The reason for this is considered to be because the incident light having a wavelength of -600 nm is absorbed when it propagates through the surface layer of the glass A, and the emitted light is extremely weak. Next, in the case where the glass A was used as the light source using the infrared light-emitting diode and the wavelength of 850 nm was used as the measurement light, it was confirmed whether or not the interference fringe image was observed by the surface stress measuring device. Further, the absorption coefficient of the glass A at a wavelength of 850 nm was 1. nmrrT1. As a result, an interference fringe image of the glass A was confirmed. The reason for this is that when incident light having a wavelength of 850 nm propagates in the surface layer of the glass A, a part of it is absorbed, but since it has a small amount of attenuation, it can be recognized as emitted light. Next, in the glass A, a xenon lamp was used as a light source, and a band pass filter was disposed between the light extraction member and the light conversion member to confirm whether or not the interference fringe image was observed by the surface stress measuring device. On the other hand, the band pass filter uses a light that selectively transmits only light having a wavelength of around 850 nm, thereby extracting monochromatic light from the light exiting the glass A at 27 201245690. As a result, an interference fringe image of the glass A was confirmed. The reason for this is that when incident light having a wavelength of 850 nm propagates in the surface layer of the glass A, a part of it is absorbed, but since it has a small amount of attenuation, it can be recognized as emitted light. Next, the interference fringe images of the glass c and the glass D observed by the surface stress measuring device are shown in Fig. 9 and Fig. 10. As a result, the glass c could not observe the interference fringe image. Moreover, the glass D can confirm the interference fringe image. However, the right side boundary of the interference fringe image (where the depth of the compressive stress layer is displayed) is not clear enough, and the correct value cannot be obtained by calculation of the DOL using the automatic processing of the surface stress measuring device. Next, in the case of the glass C and the glass D, an infrared light-emitting diode was used as the light source ‘and a wavelength of 790 nm was used as the measurement light, and it was confirmed whether or not the interference fringe image was observed by the surface stress measuring device. Further, the absorption coefficient of the glass c at a wavelength of 790 nm was 1.12 mm·1, and the absorption coefficient of the slope at a wavelength of 79 〇 nm was 0.16 mm'1. The interference pattern of the glass c and the glass iridium observed by the surface stress measuring device is shown in Fig. 11 and Fig. 12, and the interference fringe image can be confirmed for both the glass c and the glass D. Further, the two glasses can be obtained with the correct value by the DOL calculation using the automatic processing of the surface stress measuring device. (Other Embodiments) The above-described state of the present invention is merely an example, and the present invention is not limited thereto. The constituent elements forming the respective optical systems, such as the light source or the light-converting member, and combinations of the elements are not particularly limited as examples, and can be changed within the scope of the measurement principle. 28 201245690 For example, it can be used as a measuring device for measuring the surface stress (CS, DOL) of both the colored tempered glass having a low transmittance in the visible region and the transparent tempered glass having a high transmittance in the visible region. . Thereby, the transparent glass and the colored glass can be measured by the same surface stress meter. INDUSTRIAL APPLICABILITY According to the glass surface stress measuring device and the glass surface stress measuring method of the present invention, the surface stress amount of the colored tempered glass having a low transmittance in the visible region can be measured nondestructively and accurately (CS) , DOL). I. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view showing a first embodiment of a surface stress measuring device for glass and a method for measuring surface stress of glass according to the present invention. Fig. 2 is a schematic view showing a second embodiment of the surface stress measuring device for glass and the method for measuring the surface stress of glass in the present invention. Fig. 3 is a schematic view showing a third embodiment of the surface stress measuring device for glass and the method for measuring the surface stress of glass in the present invention. Fig. 4 is a schematic view showing the configuration of a light conversion member provided in the surface stress measuring device for glass of the present invention. Fig. 5 is a schematic view showing the configuration of an image processing apparatus provided in the surface stress measuring apparatus for glass of the present invention. Fig. 6 is a view showing interference fringes (an open line or a dark line) in a display provided in the surface stress measuring device for glass of the present invention. Fig. 7 is a view for explaining the method of measuring the photoelastic constant Kc in the present invention. Fig. 8 is a graph showing the relationship between the absorption coefficient of the colored glass used in the examples 29 201245690 and the wavelength. Fig. 9 is an image of the interference fringe of the colored glass C of the embodiment at a wavelength of 600 nm. Fig. 1 is an image of the interference fringe of the colored glass D of the embodiment at a wavelength of 600 nm. Fig. 11 is an image of interference fringes of the colored glass C of the embodiment at a wavelength of 790 nm. Fig. 12 is an image of the interference fringe of the colored glass D of the embodiment at a wavelength of 790 nm. [Description of main component symbols] 1·.. tempered glass 2...light source 3··· bandpass filter 4···light supply member (稜鏡) 5...light extraction member (稜鏡) 6,6A...light conversion Member 6a...lens 6b...polarizing plate 6c...imaging element 6cl···frame 7·· surface stress layer 8...light from light source (incident light) 9...light emitting light 10,20,30...glass surface Stress measuring device 11...Image processing device 11a···Image correcting unit lib···emphasis unit 11c...D/A converter lid···display HH...light source 102,104···polarizer 103...Babinet Correction plate 105···Photodetector F···stress, force Δ t···distance difference between open line column or dark line column 30