TW201210078A - Light emitting diode - Google Patents
Light emitting diode Download PDFInfo
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- TW201210078A TW201210078A TW099128355A TW99128355A TW201210078A TW 201210078 A TW201210078 A TW 201210078A TW 099128355 A TW099128355 A TW 099128355A TW 99128355 A TW99128355 A TW 99128355A TW 201210078 A TW201210078 A TW 201210078A
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- emitting diode
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- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
- H01L25/0753—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
- H01L33/641—Heat extraction or cooling elements characterized by the materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/49105—Connecting at different heights
- H01L2224/49107—Connecting at different heights on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
- H01L33/54—Encapsulations having a particular shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Led Device Packages (AREA)
Description
201210078 六、發明說明: 【發明所屬之技術領威】 [0001] 本發明涉及一種發光二極體。 [先前技術3 _2]發光二極體(Light-emitting Diode ’ LED)的壽命是 一般燈泡要的5〇~1〇0倍’而其耗電量僅為—般燈泡的 1/3〜1/5,可望在二十一世紀取代現有的鎢絲燈、水銀燈 、冷陰極螢光燈等,成為既節能又環保的新照明光源。 〇 [0003]習知的LED結構,是將LED晶片封裝後黏著於印刷電路板 (Printed Circuit Board,PCB)上,然後將pcB與 金屬基板結合以散發LED晶片產生的熱量。然而,此種 LED結構中,LED晶片產生的熱量需要經過pcB才能傳遞 至基板,熱量傳遞的介面層較多,且PCB的材料一般為 FR-4(由環氧樹脂與玻璃纖維含浸壓覆而成),其熱傳導 性能不佳,因此LED晶片產生的熱量難以快速地傳導至基 板散發,導致LED晶片溫度的升高,嚴重影響LEJ)的發光 〇 效率及其使用壽命’因此如何供速有效地散發LED所產生 的熱量’已成為影響LED品質與壽命的關鍵因素。 【發明内容】 [0004] 有鑒於此,有必要提供一種具有良好的散熱效果的發光 一極體。 [0005] —種發光二極體,包括基板、設於基板上的晶片、及密 封所述晶片的封裝體,所述基板為不導電陶瓷材料,基 板上直接形成電路層’所述晶片直接黏結於基板上,所 述晶片設有電極並與電路層電性連接。 099128355 表單編號A0101 第3買/共20頁 0992049801-0 201210078 刚與習知技術減,本發明的發光二極體在基板上直接形 成電路,“直接結合於基板上,有效減小晶片與基板 之間的介面層,從而晶片產生的熱量能夠直接傳導至基 板散發,提升發光二極體的發光效率與使用壽命。 【實施方式】 [00〇7] f面參照附圖結合實施例對本發明路燈裝置作進一步說 明。 闺㈣1所示,本發„ —實❹!發光二極體〗⑽包括基板 10、設置在基板10上的晶片20、密封晶片2〇的封裝體3〇 、以及用於連接外界電源(圖未示)的外部電極40。 闺·基板’科電、冑解率、健賴係數的陶竟 材料,如氮化矽(Si/4)”碳化矽(Sic)、氧化銼( Zr〇2)、碳化棚(B4C)、二蝴化鈦(TiB^、氧化銘( AlxOy)、氮化鋁(A1N) '氧化鈹(Be〇)、賽隆(
Sialon)或刚述材料的混令勒^。丨 ' . :.:!; [0010] 請同時參閱圖2 ,本實施例中,基板1〇呈方形薄板狀結構 。基板10的頂面12的中央位置向下凹陷形成容置槽14, 基板10於對應容置槽14的底部的位置上直接形成有電路 層1 6 〇 [0011] 所述電路層16可以是鎳(Ni )、金(All)、錫(Sn)、 鈹(Be)、銘(A1)、銦(in)、敛(Ti)、组(Ta) 、銀(Ag)、銅(Cu)等金屬或其合金,或者是透明導 電氧化物(Transparent Conductive Oxides,TC0 )’如銦錫金屬氧化物(Indium Tin Oxides,ITO) 099128355 表單編號A0101 第4頁/共20頁 0992049801-0 201210078 、鎵摻雜氧化鋅(GZO)、鋁摻雜氧化鋅(ΑΖΟ)等。 [0012] 形成所述電路層16的方法包括物理沉積法如濺射(Sput_ ter)、電子束蒸發沉積(E-beam Evaporation Deposition) , 化學沉積法如化學氣相沉積 (Chemical
Vapor Deposition,CVD)、電鍍電化學沉積等。亦可 採用網印技術將材料印製於基板1〇上,再經過乾燥、燒 結、鐳射等步驟形成所述電路層16。 [0013] Ο 本實施例中,所述晶片20呈陣列狀設置於基板10的容置 槽14内。為減小晶片20所產生的光線之間的相互影響, 晶片20之間的距離以不小於500um為宜_,__優_選的不小於 900um,更優選的不小於lOOOum。晶片20的尺寸以邊長 不大於350um、厚度不大於200um為宜,優選的邊長不大 於300um、厚度不大於150um,更優選'的邊長不大於 250um、厚度不大於100um。 [0014] Ο 所述晶片20可以是磷化物(AlkInyGa (卜x_y) P,其中〇 SxSl,OSySl,x+y S 1 ) _.專坤化物(AlxInyGa ( 卜x_y) As,其中OSxSl,ο彡,x+y^l) ’ 也可以 採用具有可發射足以激發螢光材料的長波長光的半導體 材料,如各種氧化物,如氧化鋅(ZnO) ’或氮化物,如 氮化鎵(GaN)等,或者採用可發射足以激發螢光材料的 短波長光的氮化物半導體(InxA1yGa u-x-y) N,其中〇 SxSl,OSySl,χ+y^1)。本實施例中,晶片20為 氮化物半導禮,可發射激發螢光材料的短波長光的紫外 光(UV)至紅光。 099128355 表單編號A0101 第5頁/共20頁 0992049801-0 201210078 [0015] 每一晶片20包括襯底22、PN接面24、以及兩電極26 (即 p型電極與N型電極)。本實施例中’晶片2〇與電路層16 呈交錯設置,晶片2〇的襯底22與基板10沒有電路層16的 部分形成直接接觸,晶片2〇的兩電極26均形成於晶片20 的出光面(頂面)上’並通過打線(Wire B〇nding)的 方式分別與電路層16相連,從而晶片20的熱量傳遞與電 流的路徑相互分離,互不干擾。 [0016] 為彌補晶片20與基板1〇之間的間隙,減小兩者的接觸熱 阻,加速晶片2〇的熱量的傳遞,基板1〇與晶片2〇的襯底 2 2之間設有一層銀膠(Ag ep〇xy ) 5 〇。在其他實施例中 ,也可將錫膏印刷於晶片2 〇與基板1 〇連接的位置再用熱 回焊使兩者黏結,或是錫球黏著製程將晶片2〇黏結於基 板10上。另外,還可利用共晶結合(Eutectic Bond_ ing)的方式將晶片2〇黏結於基板丨〇上降低兩者之間的接 觸熱阻,即先分別在晶片2〇及基板10上鍍上金屬層,然 後將這二金屬層在特定溫度下烘烤通過共晶結合(E u _ tectic Bondi^ig)相連,所使用的金屬層的材料可以為 •金(Au),錫(Sn),銦(In),鋁(A1),銀(Ag )’秘(Βι) ’鈹(Be)或者是前述金屬的合金等。 [0017] 晶片2〇的襯底22為本徵半導體(Intrinsic Semic〇n_ ductor)或者是不刻意摻雜其他雜質的半導體 tentionally Doped Semiconductor),如尖晶石、 碳化石夕(SiC)、石夕(Si)、氧化鋅(Zn0)、氮化鎵( GaN)、珅化鎵(GaAs)、磷化鎵(GaP)、氮化鋁( AIN)等,或者導熱性能佳且導電性能差的材料,如鑽石 099128355 表單編號A0101 第6頁/共20頁 0992049801-0 201210078 [0018] Ο 〇 [0019] [0020] 等。襯底22的熱膨脹係數與基板丨〇接近,從而基板丨^與 晶片20結合後可以抗熱衝擊,容許較大範圍的操作溫度 。襯底22的載子濃度(Carrier Concentration)以不 大於5xl〇6cm 3為宜,其載子濃度越低,導電率就越低, 就越能夠隔絕流經襯底22的電流。優選地,襯底22的載 子濃度不大於2xl〇6cm_3。 封裝體3〇包覆晶片20及電路層16,用以隔絕晶片2〇和外 界的水氣。封裝體30的材料包含:矽樹脂(SiHc〇ne) 、環氧樹脂(Epoxy Resin)、低熔點玻螭(L〇w Tem一 perature Melt Glass)、聚曱基丙烯酸甲醋(p〇ly_ methyl Methacrylate,PMMA)、聚合物(p〇lymer) 、聚碳酸醋(Polycarbonate,PC)寄熱固形透光材料 。封裝體30可以通過射出成型的方式,製成各種形狀如 半球形、圓頂型或方形等。本實施例中〗,封裝體3〇填充 於基板10的容置槽14内,其外表面32為一與基板1〇的頂 面12相齊平的平面。 此外,為轉換讀晶片如出射光的我長,可以在封裝體3〇 内填充螢光材料’如硫化物(Sulfide)、銘酸鹽Alu_ minates)、氧化物(〇xides)、石夕酸鹽(siiicates )、氮化物(Nitrides)等。 所述外部電極40形成於基板1〇上且裸露於封裝體3〇之外 ’外部電極40的一端與電路層16電性連接,另一端用於 連接外界電源從而為晶片2〇提供電流。外部電極的材 料包含:鎳Ui),金(Au)、錫(Sn)、鍵(Be)、 銘(A1)、銦(ln)、鈦(Ti)、鈕(Ta)、銀(Ag) 099128355 表單編號A0101 第7頁/共20頁 0992049801-0 201210078 铜(Cu)等金屬或其合金,或者是透明導電氧化物, 如铟錫金屬氧化物、鎵播雜氧化鋅、銘摻雜氧化鋅等。 [0021] [0022] [0023] 099128355 發光moon外部電浦分別與外界電源(圖 未示)的正、負極相連對晶片20供電,注入晶片20的操 作電流不大於5GmA、操作電流密度不大於5QA/cm2,優 選的操作電流不大於3〇„A、操作電流密度不大於 40A/CM ’更優選的操作電流不大於2〇mA、操作電流密 度不大於30A/cm2。 當發光二極體1GG發先時,熱量亦隨之產生,由於本發明 的發光二極體100南晶片20是直接結合於基板1〇上有效 減小了晶片20與基板1〇之間的介面層,使晶片2〇產生的 熱量能夠快速直接地傳導至基板10並最终經由高導熱效 率的基板10散發出去,提高了發光二極體1〇〇的散熱效率 ,使晶片20維持在低溫的工作狀態,提升發光二極體 的性能及使用壽命。 如圖3所不’為本發明第二實每例發光二極體3QQ, 冬實 施例中,基板310上形成有多摘分每的容置槽Μ*,— 容置槽314容置 外漸擴狀’從而將晶片20產生的光線反射至外界。本實 施例中,容置槽314底部的面積大於晶片2〇的面積,曰 20的襯底22通過黏著材料350黏結於基板3i〇内,曰 曰曰片2 0 的侧面與基板31 0之間形成間隙’晶片2 〇的出光面輿^基^ 310的頂面312大致齊平。封裝體330密封所诚曰 义日曰月2 0, 封裝體3 3 0包括填充於晶片2 0與基板31 〇的間隙内 332以及位於基板的頂面312上的外層334。本實於 第8頁/共20頁 表單編號A0101 第8頁/共20頁 0992049801-0 201210078 中,外層334内分佈有螢光材料,其外表面336呈平面狀 〇 [0024] 如圖4所示,為發光二極體400第三實施例,其與前一實 施例的不同之處在於:本實施例中,晶片20的襯底22與 ‘ 基板410之間的間隙内填充有電氣絕緣的導熱膏460,增 加晶片20與基板410之間熱傳導效率。封裝體430包括填 充於晶片20的PN接面24與基板410之間的間隙内的底層 432以及位於基板410上的外層434。 〇 [0025] 如圖5所示,為發光二極體500第四實施例,本實施例中 ,封裝體530包括填充於晶片20的PN接面與基板410的間 隙内的底層532、黏結於基板510上的中間層534、及位 於中間層534上的外層536,其中外層536内填充有螢光 材料,中間層534内填充有分散劑,外層536的外表面 538為外凸的曲面,外層536與中間層534的介面535為一 平面。晶片20的襯底22與基板510之間同樣填充有電氣絕 緣的導熱膏560以增加兩者之間的熱傳導效率,加速晶片 Ο 20的熱量的散發。 [0026] 前述實施例中,晶片20完全收容於基板10 (310、410、 510)内,封裝體30 ( 330、430、530 )呈一體結構包覆 所有晶片20。圖6所示為本發明第五實施例,與前述實施 例不同的是:晶片20的PN接面24突出於基板610之外, 晶片20的襯底22與基板610之間形成有間隙,間隙内填充 有導熱膏660。封裝體630包括多個分離的封裝單體,每 一封裝單體密封其中一晶片20,從而晶片20產生的光線 不會相互干擾或吸收,因此晶片20的分佈也不再受到距 099128355 表單編號A0101 第9頁/共20頁 0992049801-0 201210078 離的限制,有效提升發光二極體600的出光率。 [0027] 以上實施例中,晶片20的兩電極26形成於晶片20同一側 面上,晶片20與基板10 (310、410、510、610)沒有 電路層16的部分直接接觸。在其他實施例中,晶片的P型 與N型電極也可分別形成於晶片的相對兩側面,如頂面與 底面上,在此種情形下,晶片的襯底可採用高參雜濃度 的半導體(Heavily Doped Semiconductor),其載 子濃度(Carrier Concentration)越高,導電率越好 ,一般以不小於5xl08cm 3為宜,優選的不小於lx 109cm-3,如此能夠讓電流流過襯底,晶片直接置於基板 的電路層上,位於晶片的底面上的電極與電路層形成電 連接,位於晶片頂面上的電極則可通過打線的方式與電 路層連接。 [0028] 綜上所述,本發明符合發明專利要件,爰依法提出專利 申請。惟,以上所述者僅為本發明之較佳實施例,舉凡 熟悉本案技藝之人士,在爰依本發明精神所作之等效修 飾或變化,皆應涵蓋於以下之申請專利範圍内。 【圖式簡單說明】 [0029] 圖1為本發明一較佳實施例發光二極體的立體結構示意圖 [0030] 圖2為圖1所示發光二極體的剖視圖。 [0031] 圖3為發光二極體第二實施例的剖視圖。 [0032] 圖4為發光二極體第三實施例的剖視圖。 [0033] 圖5為發光二極體第四實施例的剖視圖。 099128355 表單編號 A0101 第 10 頁/共 20 頁 0992049801-0 201210078 [0034] 圖6為發光二極體第五實施例的剖視圖。 【主要元件符號說明】 [0035] 發光二極體:100、300、400、500、600 [0036] 基板:1〇、310、410、510、610 [0037] 頂面:1 2、312 〇 〇 [0038] [0039] [0040] [0041] [0042] [0043] [0044] [0045] [0046] [0047] [0048] [0049] [0050] [0051] [0052] 容置槽:14、314 電路層:16 晶片:20 V 襯底:22 , - ΡΝ接面:24 .....vv ... 電極:26 封裝體:30、330、430、530、630 1;
外表面:32、336、538 底層:332、432、532 外層:334、434、536 黏著材料:350 外部電極:40 銀膠:50 導熱膏:460、560、660 中間層:534
099128355 表單編號A0101 第11頁/共20頁 0992049801-0 535 201210078 [0053] 介面 099128355 表單編號A0101 第12頁/共20頁 0992049801-0
Claims (1)
- 201210078 七、申請專利範圍: 1.—種發光二極體,包括基板、設於基板上的晶片、及密封 所述晶片的封裝體,其改良在於:所述基板為不導電陶瓷 材料’基板上直接形成電路層,所述晶片直接黏結於基板 上’所述晶片設有電極並與電路層電性連接。 2 ·如申晴專利範圍第1項所述的發光二極體,其中所述恭板 的材料為氮化矽、碳化矽、氧化锆、碳化硼、二硼化鉢、 氧化紹、氮化紹,氧化皱或賽隆。 〇 3 .如申請專利範圍第1項所述的發光二極體,其中所述晶片 與電路層呈錯開設置,所述晶片的電極均形成於出光面上 ’並通過打線與電路層連接* 4 .如申4專利範圍第丨項所述的發光二極體,其中所述晶片 的電極包括分別形成於晶片的頂面與底面上的兩電極,晶 片直接置於基板的電路層上,其中位於晶片的底面上的電 極直接與電路層相連,位於晶片的頂面上的電極通過打線 與電路層連接。 〇 5 · Μ請專利範圍第1項所述的發光二極體,其中所述基板 上設有收容槽’所述晶片收容於收容槽内,所述封裝體填 充於收容㈣’封裝體的外表面與基㈣絲面共面。 6. 如申請專利範圍第1項所述的發光二極體,其中所述基板 上設有若干收容槽,每-收容槽收容—晶片,所述收容槽 的尺寸大於晶片的尺寸,所述晶片包括概底及形成於襯底 上的ΡΝ接面’所述襯底位於收容槽内,概底與基板之間形 成間隙’所述間隙内填充有電氣絕緣的導熱膏。 7. 如申請專利範圍第6項所述的發光二極體,其中所述抑接 099128355 表單編號Α0101 第13頁/共2〇 0992049801-0 201210078 面突出於基板之外。 8 .如申請專利範圍第6項所述的發光二極體,其中所述PN接 面位於容置槽内且與基板形成間隙,所述封裝體包括填充 於PN接面與基板之間的底層以及形成於基板外的外層,所 述外層内分佈有螢光材料。 9 .如申請專利範圍第7項所述的發光二極體,其中所述封裝 體還包括形成於底層與外層之間的中間層,所述中間層内 分佈有分散劑。 10 .如申請專利範圍第1項所述的發光二極體,其中還包括形 成於基板上且裸露於封裝體之外的兩外部電極,所述外部 電極的一端與電路層連接,另一端用於連接外界電源。 099128355 表單編號A0101 第14頁/共20頁 0992049801-0
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TW099128355A TW201210078A (en) | 2010-08-25 | 2010-08-25 | Light emitting diode |
US12/900,497 US20120049204A1 (en) | 2010-08-25 | 2010-10-08 | Led module |
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TW099128355A TW201210078A (en) | 2010-08-25 | 2010-08-25 | Light emitting diode |
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TW099128355A TW201210078A (en) | 2010-08-25 | 2010-08-25 | Light emitting diode |
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US (1) | US20120049204A1 (zh) |
TW (1) | TW201210078A (zh) |
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US10024530B2 (en) * | 2014-07-03 | 2018-07-17 | Sansi Led Lighting Inc. | Lighting device and LED luminaire |
US9633883B2 (en) | 2015-03-20 | 2017-04-25 | Rohinni, LLC | Apparatus for transfer of semiconductor devices |
US10141215B2 (en) | 2016-11-03 | 2018-11-27 | Rohinni, LLC | Compliant needle for direct transfer of semiconductor devices |
US10504767B2 (en) | 2016-11-23 | 2019-12-10 | Rohinni, LLC | Direct transfer apparatus for a pattern array of semiconductor device die |
US10471545B2 (en) | 2016-11-23 | 2019-11-12 | Rohinni, LLC | Top-side laser for direct transfer of semiconductor devices |
US10062588B2 (en) | 2017-01-18 | 2018-08-28 | Rohinni, LLC | Flexible support substrate for transfer of semiconductor devices |
US10410905B1 (en) | 2018-05-12 | 2019-09-10 | Rohinni, LLC | Method and apparatus for direct transfer of multiple semiconductor devices |
US11094571B2 (en) | 2018-09-28 | 2021-08-17 | Rohinni, LLC | Apparatus to increase transferspeed of semiconductor devices with micro-adjustment |
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US6874910B2 (en) * | 2001-04-12 | 2005-04-05 | Matsushita Electric Works, Ltd. | Light source device using LED, and method of producing same |
JP2005064104A (ja) * | 2003-08-08 | 2005-03-10 | Hitachi Cable Ltd | 発光ダイオードアレイ |
JP5192811B2 (ja) * | 2004-09-10 | 2013-05-08 | ソウル セミコンダクター カンパニー リミテッド | 多重モールド樹脂を有する発光ダイオードパッケージ |
US20090273004A1 (en) * | 2006-07-24 | 2009-11-05 | Hung-Yi Lin | Chip package structure and method of making the same |
KR100956888B1 (ko) * | 2008-01-24 | 2010-05-11 | 삼성전기주식회사 | 발광 다이오드 패키지 및 그 제조 방법 |
TWI389295B (zh) * | 2009-02-18 | 2013-03-11 | Chi Mei Lighting Tech Corp | 發光二極體光源模組 |
KR101092063B1 (ko) * | 2009-04-28 | 2011-12-12 | 엘지이노텍 주식회사 | 발광소자 패키지 및 그 제조방법 |
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