TW201123281A - Ultrasonic cleaning device, ultrasonic cleaning method, and recording medium that records computer program for executing the ultrasonic cleaning method - Google Patents

Ultrasonic cleaning device, ultrasonic cleaning method, and recording medium that records computer program for executing the ultrasonic cleaning method Download PDF

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Publication number
TW201123281A
TW201123281A TW99133730A TW99133730A TW201123281A TW 201123281 A TW201123281 A TW 201123281A TW 99133730 A TW99133730 A TW 99133730A TW 99133730 A TW99133730 A TW 99133730A TW 201123281 A TW201123281 A TW 201123281A
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Taiwan
Prior art keywords
holding
processed
wafer
ultrasonic
cleaning
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TW99133730A
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Chinese (zh)
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TWI490931B (en
Inventor
Yuji Kamikawa
Hiroaki Inadomi
Hideyuki Yamamoto
Hiroshi Komiya
Koji Egashira
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Tokyo Electron Ltd
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Priority claimed from JP2010070506A external-priority patent/JP5309066B2/en
Priority claimed from JP2010174604A external-priority patent/JP5450309B2/en
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW201123281A publication Critical patent/TW201123281A/en
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Publication of TWI490931B publication Critical patent/TWI490931B/en

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  • Cleaning Or Drying Semiconductors (AREA)

Abstract

This invention provides an ultrasonic cleaning device including a cleaning tank for storing cleaning liquid; a processed article holding device that can be inserted into the cleaning tank, and hold the processed article for immersing the processed article in the cleaning liquid; a vibrator provided at the bottom portion of the cleaning tank; and an ultrasonic oscillator that makes the vibrator generate ultrasonic vibration. In the cleaning tank is provided a lateral holding member for holding the processed article. Besides, the processed article holding device can be moved sideward by a driving device. A control device controls the driving device to move the processed article holding device sideward after the processed article is held by the lateral holding member, and meanwhile makes the vibrator generate ultrasonic vibration and propagates the ultrasonic vibration generated by the vibrator to the processed article.

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201123281 六、發明說明: [交叉參考之相關申請案] • 雙依據2〇09年1〇月5日申請之日本專利申枝笛 2009-231668號案、及2_年3月25 清第 2_儀〇6號案主張優先權,並引用其全^内日容本國專利出願第 【發明所屬之技術領域】 超音於潰;fr的被處理體清洗之 清洗方法之電腦程式之記錄媒體。心彔有用於執仃此超音波 【先前技術】 用玻璃 並 超音波清洗裝置中將被處理體清洗時,將被處理體浸 以往已知一種超音波清洗裝置,將半導 ,處理體浸潰到貯存在清洗槽的液 楗粒荨。如此將被處理體超音波清洗。 【發明内容】 處理ΐί 音波清洗裝置將被處理體超音波清洗時,被 ’保=。,因此’從下方照射的超音波振動被晶圓舟的保持棒遮 ’、Ρ ’攸機子傳制超音波振動直雜钱。因此,、具有 201123281 狀切區域傳 本發明考慮到此點,目的在於提供能將被處理 法,= '、土-本之第1解決方式提供一種超音波清洗裝置,包含:、、主 ;:J,f 2振動子產生超音波振動;;部 將來超她“ mi#上料1解決対之超音H洗裝置巾可如下:今側邻 里體保持裝置接受並保持該被,;= 體保持裝置,從保持該被處理體的保持位置3 動二i位於該保持位置側方的側方位置,該控 =ίίί理體保持裝置移交給該側部保持構件後= 縣置及馳練置,令·處频簡n 域。此時,將浸潰到清洗槽内的清洗液中'、^置保持的區 m持裝置從保持位置移_侧方位置,並 理體保持裝置保持的區域。因此動==== 201123281 波清洗。 該被處 該 成對的 理體保持^具有置亦可如下 各被處理體鱗部係可_地自對的被處理體保持部, 該被處理體保^寺部才音波清洗裝一 _ 又,上述第! 約略對稱的的方式移動。 ^控制該超音波振I裝置及^動亦可如下:該控制 置從該保持位置移_位於該㈣,綠被處理體保持裝 下降位置往該側方位置移動里fif裝置從該 又,上述第1魅冰士^ 4振動子產生超音波振動。 裝置控制該超音波振盪裝裝f亦可如下:該控制 從該側方位該下降位令該被處謂保持裳置 動。 移動』間亦令該振動子產生超音波振 保持構件裝置亦可如下:該側部 理體的退置之被處理體㈣讓位置、以及退離該被處 下:該侧部 體側面並夾持該被 保持二式之超音波清洗裝置亦可如 處理體/、有成的爽持部’抵接於該被處理 保持構件解決方式之超音波清洗裝置亦可如下:該側邻 保持裝置接受並保持該被處理體,該i動 位於該保持:置從保持該被處理體的保持位置移_ «裝置及該m:?被纽體,該控制裝置控制該超音波 移交給該側部保置 被處理體保持部從該保持位置往』方位置移該 201123281 置時,令該振動子產生超音波 到該-邊的被處簡持部播:;被處崎之受 的被處理細=======—邊 之受到此一邊的被處傳播到被處理體中 理體全_勻地超音波=持稍保持_域。因此,能將被處 理體保持裝自可如下:該被處 被處理體保“,亥被處理體保持裳置的該第! 該第!保持位,第1保持位置移動到位於 持部,從保持該被處理體的第^位該第2被處理體保 位置側方的第2側方位到位於該第2保持 被處理體保持在該側部保持構件工驅動農置,在將該 第!被處理體保持部從持部後,令該 ΪίΠ:第二保持位置,並且控制該超^振:ΐ置?動二 该第1被處理體保持部位於該第 ^対置,至少在 被處理體保持部位於該第2側方位置 在該第2 振動,並將來自該振動子的超音波振動傳產生超音波 f亥第1被處理體保持部及該第2 =理體中之受 Ϊ 置:被 被處理體保持部,被處理 201123281 第2保持位置,再來, 位置時、以及至少在理體保持部位於第i側方 控制裝置令振動子巧部位於第2側方位置時, 音波振動傳播到被處理體中之受到第ft成將來自振動子的超 所保持_心===: 清洗槽,貯存清洗超音=裝置,包含: 令該被處频轉健往#jn子產切音波絲;鶴裝置, 波振盪裝置及該驅動裝置2、二及控制裝置’控制該超音 部=== 設在與該第U呆持棒相、2^被^體中心的垂直方向軸線而 保持棒配置在鲜1被處理體鱗部的該第2 該第2被處理體保^分被處理體保持部及 控制該驅動裝置,令該被里體,該控制裝置 振盪裝置,令該振動子移動’並且控制該超音波 音波振動傳播到該被處理體。。曰波振動’並將來自該振動子的超 裝置控制該音波清洗裝置亦可如下:該控制 中之後,令該第^ 體浸潰到該清洗槽内的清洗液 位置,移動到位於今第=持#保持該被處理體的第1保持 吻第1保持位·方的第2側方位置,其後回 201123281 到6亥弟1保持位置,再今兮笛^* 體的第2保持位置,銘私二 被處理體保持部從保持該被處理 位置,其後回到該第^持^該^ 2保持位置側方的第2侧方 至少在該第1被處理體保持舰超音波紐裝置’ 該第2被處理體保持部位^ 1側方位置時、及至少在 超音波振動,並將來自$袒二f側方位置時,令該振動子產生 體中之受到該第1被的超音波振動’傳播到該被處理 持的區域。被處理體保持部及該第2被處理體保持部所保 被處理體偏^及超m絲置亦可如下:該第1 其設於該第1保持^與該部分別具有第3保持棒, 該第2保持棒辆鱗該被·^。之間’並與該第1保持棒及 該第共同保棒之間,並與該第1保持^ 被處理體波清洗裝置亦可如下:在該第1 保持棒,設有V字形^t的該第2保持棒及該第3 字形剖面,在該第1被處理體、伴被處理體的V 该第1保持棒,設有Y字形溝5夺f被處理體保持部的 體的Y字形剖面。 #槽聽有可自由卡合於該被處理 置控制該ΐίϋ麵歸財可如T :控制裝 第1下降位置,ΐίί3夺、過位於該第】保持位置下方的 與該第2側方位置之間移^被處,體保持部在該第2保持位置 第2下降位置。置之間移動時,經過位於該第2保持位置下方的 裝置控制該超音波振盪置亦可如下:該控制 下降位置與該第!側方 破歧體保持部在該第1 持部在該第2下降位置與 & =、及該第2被處理體保 振動子產生超音波振動:… 置之間移動期間,亦令該 又’本翻之第3解財式提供—_音波清洗方法,其包 201123281 將受到被處31里體保持裝置保持並浸潰到、Ί柚允 理體保持裝置往側方移冼;並且令該被處 側部保持構^㈣之超音n洗方㈣可如下:在以該 保持裝置往側方移該構件’在令_處理體 被處理體触純"被纽雜縣置係從保持該 少在該被處理該保持位置側方的側方位置,』 的區域。此時,將浸潰到、、主=被處理體保持裝置保持 保持褒置保持的被處理體心L二月洗,中並^受到被處理體 件,被處理_持打從 父署=於〉月洗槽内的側部保持構 理體保持裝置位於側方位置,至少在被處 到此-邊的被處理體保持:所振動傳播到被處理體中之受 全區均勻地超音波清洗。’ ”、的區域。因此,能將被處理體 理體保持亦可如下:該被處 各被處理體保持部係可個別地自相保持該被處理體,該 該被處理體保持部青洗方法亦可如下:成對的 又,上述第3解決方式里肢主以、树對稱的方式移動。 被處理體保持裝置往側方移動H中月可如下:在令該 該保持位置移_位於該簡位i下方處理體保持裝置從 降位置往簡雜置_ #下降位置’其後從該下 往該側方位置移動期間,亦令ϋ動t產體=夺4置=亥。下降位置 201123281 令該被處理方法亦可如下:更包含 土該被處理體保持裝置從該側方位置置之步驟’ 令§亥振動子產生超音波振動。牛位置期間,亦 側部保持構ί二青洗:法亦可如下:在以該 並保持該被處理體 又,上述第3 :被⑽’心 保持構件具‘成對:夹、^方3亦可如下:該側部 理體,在以該側部保持構件保該夹持該被處 =將成對的該夾持部抵接於該 ,破處理體保持部位於該側方位置時,32的该- ί振s播受到該被處理體“裝ί:=ί 梦番& 2 &將到/月洗槽内的清洗液中並且受到被處理靜仅# i理體保持ϊΐϊ J丄J於ί洗槽:的側部保持構件:被 振動產超音波振動。藉此,能將來自振動子的翻j 區x域專ϊΞ被ϊ;ί?:之受到此一邊的被處理體保持部所保‘ 一因此,此將被處理體全區均勻地超音波清洗。 該被處 又’上述第3解決方式之超音波清洗方法柯如下 12 201123281 5部C在該側部保持構細第1二: 側方位置,其後回到該第2俾2保持位置側方的第2 ==士 及至少在該第2被處理體位置時、 持的區域。此時,= 設於清洗^理 第2側方位呆持部從第2保持位置移動到 能將被處理體全區均勻地超^清=^°卩所保持的區域。因此, 含以下步決方式提供-種超音波清洗方法,其包 第2被處理體“置的第1被處理體保持部及 液;將該被處理體mi 理體浸潰到清洗槽内的清洗 理體保持部往側^:在部,令該第!被處 超音波振動而將該_理體超音&洗:机底部的振動子產生 另,上述第4解決方式之超音波清洗方法亦可如下:更包含 201123281 以下步驟:在令該第i被處理 理體保持在該第i被處理體=持郝動之步驟後,將該被處 移動。 处里體保持部,並令該第2被處理體保持部 第1被處理體保持Ιίίίί:波3 f 下:在令該 持該被處理_第1保持位置,理持部從保 的第1側方位置,1後回雜,職於相1保持位置側方 體保持部移動之步^中,抑持位置’在令該第2被處理 體的第2保持位置,轉^ ^理體保持部從保持該被處理 位置,其後回到該第亥弟2保持位置侧方的第2側方 清洗ΐ步法亦可如下··超音波 行,並將來自該振動子的超音波方位置時進 該第丄被土,持部及該第2被處 又’上述第4解決方式之超音持的_ ° 第1被處理體保持部移動之步曰皮如下··在令該 方的第1下降位置,並且在令過位於該第1保持位置下 經過位於該第2保持位置下方的^ 保持部移動之步驟’ ,之步如下··超音波 第1側方位置之間移動期間、以^在I1下降位置與該 下降位置與該第2側方位置之間體保持部在該第2 又,本發明之第5解決方式提供一 執行超音波清洗方法之電腦程式,該超己錄有用於 被處理體保持在設於貝到清洗槽内的清洗液之 保持裝置往側方移動;持構件,·令該被處理體 =而將該被處理體超音:清=底==產生超音波 側方移動之步驟與超音波清洗之步驟,係在 14 201123281 - 持該被處理體之步驟後進行。 -於執6解決方式提供一種記錄媒體,記錄有用 被處理理體浸潰到清洗槽内的清洗液;將該 部往側3,處理體保持部,令該第1被處理體保持 動而將該^處理體清補底躺縣子產生超音波振 體佯,將被處理體保持在側部保持構件後,令被處理 ΪΪ2 此此將被處理體全區均勻地超音波清洗。 【實施方式】 (第1實施形態) 明第日林發㈣1實歸態。圖1至圖14係說 錄有用的超音波清洗裝置、超音波清洗方法、及記 ^執^此超g波清洗綠之·喊之記錄媒體。 ^ ’猎由圖1說明超音波清洗裝置i之全 1包含:清洗靠,貯存清洗 插入、生替ίf,UA晶圓舟(被處賴鋪敍)2G,設為可 有U子其中清洗槽1G之底板(底部)14的外面設 4;:r40連接有超音波振繼《,以令振動子 J眚巧10言史有將清洗液供給到清 -14 ^ «it: ^ -人使用圖1至圖3說明各部分詳細構造。 壁11二圖上至圖3所示’清洗槽10具有4個側壁11,以及在各側 且藉由固見墊12而以氣水兩密(氣密•水密)的方式密接並 口疋螺栓13而固定的底板14,行程約略直方體狀。並中側 15 201123281 壁11的上端形成有凹槽15,在清洗液的液面到達 使得清洗液從清洗槽10流出。 土 1上端時, 清洗槽10的側壁11係以具有高度抗藥品 氯乙烯(PTFE)或氟樹脂(PFA)等形成。又,底板的,例如^四 抗藥品性及音,皮穿透性的材料例如非晶碳或碳化料^度 成。藉此’即使採用後述氨水雙氧水水溶液、 :巧科形 或稀釋氫氟酸等作為藥液,清洗槽1G的側壁 1乳水水溶液 有抗藥品性。因此,能防止側壁u及底板14受到产 ί ί金f 又’底板14之材料因為如上所述穿 透性,故能令振動子4〇所產生的超音波振動確實地有曰波穿 清洗槽10收容於容器16。此容器16的底^ ^回收從形成在清洗槽1G側壁„上端之凹槽j 液’此回收盤設有排渠(未圖示)以翻所回 =出的>月洗 如圖1、圖2及圖5所示,晶圓舟2〇且 f 部(被處理體保持部)21a、21b,保持L (例^保持 基部22a、22b,分別連結到各晶圓保持部21γ 21Γ且3 ,在垂直方向延伸。其中成對的晶圓保持部2la = ;b=之垂直方向軸線只參照圖6至圖,約略對= 24b編'。久紐^ 持棒3心231)前端的連結構件施、 保=23a t /的基端分別連結基部瓜、孤。各 、 刀別开>成有可自由卡合於晶圓W的吝童4·粗;Mr兽 狀及^ ’各保持溝仏、25b,具有約略相同形 字曰Ϊ 圓W卡合於此種保持溝25a、祝, ^因w保持在約略正交於保持棒23a、23b的方向,亦即垂直 圓舟2〇各部分’採用高抗藥品性的石英來形成,並 氣古龍(註冊商標)錢膜或Sic(碳化石夕)鑛膜。 日日囫舟20雜有驅動裝置26以升降驅動晶圓舟2〇。亦即, 16 201123281 ..驅動農置26具有:升降驅動部27a、27b,分別升降 邻 、21b ;以及升降驅動力傳達部28a、挪 ,.驅動部27a、27b與各基部22a、22b之間,以傳達升降^=^降 27b之驅動力。其中各升降驅動力傳達部28a、2此 座29a、29b而連結到基部22a、咖。如此,各晶圓保=由=接 21b構成為彼此可個別自由移動(自由升降)。另,可利用 動部27&、2713’藉而調整各晶圓保持部21&、211)的位置關係。-、、各升降驅動部27a、27b連接有控制裝置44,控制裝置44播 成為同步並驅動各升降驅動部27a、27b。如此,升降驅動 27b依據來自控制裝置44的控制信號,令晶圓保持部21&、2化 降而將晶圓W插入清洗槽10内並浸潰到清洗液,或令晶 部21a、21b上升而將晶圓W從清洗槽1〇搬出。 ”寺 又,晶圓舟20係藉由驅動裝置26而在清洗槽丨〇内 W的保持位置(將晶圓w移交給後述洗滌臂5〇的位置及: 此保持位置稍下方之下降位置之間’沿約略垂直方向自 = 由升降)。亦即’依據來自控制裝置44的控制信號,令各 部21a、21b藉由升降驅動部27a、27b而在保持位置與下降位置 又,晶圓舟20亦在下降位置、以及位於下降位置 側方的侧方位置之間往約略水平方向自由移動,各晶圓保^ 21a、21b亦在約略水平方向彼此個別自由移動。另,本明奎 為「側方」者並非嚴格意指水平方向,例如晶圓w之中,尸 晶圓保持部20a、20b從振動子40傳播的超音波振動被晶 部施、20b遮蔽的區域位雜度能將超音波振動傳播到试'、 可,亦指包含相對於水平方向傾斜的方向。 n °°埤叫 連結到晶圓舟20的驅動裝置26,令晶圓舟2〇在下降位 側方位置之㈤飾。亦即,驅練置26具有:财移動驅 ^ 3〇b ’分別令晶圓保持部2la、21b在下降位置與侧方位置 動;以及侧方驅動力傳達部31a、31b,分別連結在該侧方移I 動部30a、30b與升降驅動力傳達部施、28b之間,傳達側方彩 17 201123281 動驅動部30a、30b的驅動力。 矛夕動動驅動部施、勘連接有控制裝置44。如此,側方 =晶圓保===:動二; 方向軸線Y而以約略對稱的方式移動。 掊槿及圖6至圖14所示,清洗槽1G内設有洗滌臂(側部保 内可圓Λ10接受晶圓w。此洗蘇臂50在清洗槽10 退避你罢ϋ保持曰曰圓w攸讓位置、以及脫離並退開晶圓貿的 水牲却之間在約略水平方向移動。亦即,洗蘇臂50具有成對的 ’曰圓於ΐ持在晶圓舟20上的晶圓w的兩個側方並抵接在 曰^ f持晶圓W。各夹持部51包含:2根抵接棒52, $tr 面;連結構件53,連結各抵接棒2。其中各夾 2。卩51的2根抵接棒52,相對於通過晶圓w中心之水平方 至圖14)而讀稱的方式配置,並且在晶圓t 5 W形成下方傳播來的超音波振動受到各夾持 域,而能將晶圓W全區均勻地超音波清洗。 勺區 ^匕=條臂50各部分與晶圓舟2〇相同地採用高抗藥品性 、央來形成’並分別在表面施以鐵氟龍鍍膜或Sic鍍膜。 偏^各夾持部51連財臂驅動部(未圖示)使各夾持部51在受 培置/、退避位置之間連動,臂驅動部連結有控制裝置44。如此, ^動部依據來自控制裝置44的控制信號使各夹持部5 叉讓位置與退避位置之間。 動在 清洗液供給裝置60具有2個清洗液供給喷嘴61沿著 設置。各清洗液供給喷嘴61包含:管 ^,繼11而在約略水平方向延伸;多數第1 、奋A L lb及第2贺嘴孔61c’形成在此管狀噴嘴本體61a,並以 適虽間隔沿長邊方向配設。其中,第i喷嘴孔仙朝向 w 心側噴射清洗液,第2喷嘴孔61e朝向清洗槽1G的底板^ ^ 18 201123281 清洗液。 清洗液供給喷嘴61經由清洗液供給管62而連結有切換 0二63經由純水供給管64而連結有純水供給源65,、並 連ίΐϊίί給管66而連結有藥液供給源(藥液槽)67。切換閥63 >月洗,i給管62之供給管(純水供給管64或藥液供給管66)。 士水,給管64言史有開閉閥68以調整通過純水供給管64的純 ^ ^^°^開+閉閥68連接到控制裝置44,控制裝置44藉由開閉 Γ —二|攸純水供給源65往清洗槽ίο的純水供給。 荜液^供^!/ 7設有藥液栗69以將藥液供給到清洗槽10。此 ίί; 67 tXT!^4,mmE 44 69 而使用气水雔Τ Λ的樂液供給。在此,藥液因應於清洗目的 鹽酸雙液了j _蘭2〇2_, 酸(DHF)等。 _ 。為瓶2〇2沮2〇) ’或稀釋氫氟 制裝ί if重f液ί69 ’並在藥液槽67内依據來自控201123281 VI. Description of the invention: [Related application of cross-reference] • Double-based application of Japanese patent Shen Zhidi 2009-231668, filed on January 5, 2009, and 2_year, March 25, 2nd The Yizheng No. 6 case claims priority, and cites the entire Chinese patents of the Japanese patents. [Technical field of the invention] The recording medium of the computer program of the cleaning method of the object cleaning. The heart is used to slap the ultrasonic wave. [Prior Art] When the object to be treated is cleaned by a glass and ultrasonic cleaning device, the object to be treated is immersed in a conventional ultrasonic cleaning device to immerse the semiconductor and the semiconductor body. To the liquid granules stored in the washing tank. In this way, the object to be processed is ultrasonically cleaned. SUMMARY OF THE INVENTION When the ΐί sound wave cleaning device ultrasonically cleans the object to be processed, it is ‘guarantee=. Therefore, the ultrasonic vibration irradiated from below is covered by the holding rod of the wafer boat, and the ultrasonic vibration is transmitted to the machine. Therefore, the invention has the 201123281 shape cut region. The present invention has been made in view of the above, and an object of the present invention is to provide an ultrasonic cleaning device capable of providing a method for processing, = ', and soil-based, including:, main; J, f 2 vibrator produces ultrasonic vibration;; the future will exceed her " mi #上料1解対超超H wash device towel can be as follows: the current side neighborhood retaining device accepts and holds the quilt;; = body retention The device moves from the holding position 3 of the object to be processed to the side position on the side of the holding position, and the control device is handed over to the side holding member. The frequency is simply n-field. At this time, the area m holding device that is dipped in the cleaning liquid in the cleaning tank is moved from the holding position to the side position, and the body holding device holds the area. Therefore, the moving body is replaced by the object to be processed, and the object to be processed can be placed in the same manner as the body to be processed. ^ Temple is only sound wave cleaning equipment _ Again, the above! The approximate symmetrical way The control of the ultrasonic vibration device and the movement may also be as follows: the control is moved from the holding position _ located in the (four), the green object is held in the lowered position to the side position, and the fif device is moved from the The first enchanting sorcerer 4 vibrator generates ultrasonic vibration. The device controls the ultrasonic oscillating device f as follows: the control lowers the position from the side orientation so that the swaying position is kept moving. The apparatus for generating the ultrasonic vibration holding member of the vibrator may also be as follows: the object to be treated (4) of the side body is retracted from the position and retracted from the side of the side body: The ultrasonic cleaning device that is held in the second type can also be as follows: the processing body/the successful holding portion of the ultrasonic cleaning device that abuts the solution of the processed holding member can also be as follows: the side adjacent holding device accepts and holds The object to be processed is located in the holding: the holding device is moved from the holding position of the object to be processed, and the m:? is the button body, and the control device controls the ultrasonic wave to be handed over to the side portion. The processing body holding portion is moved from the holding position When the position of the square shifts to 201123281, the vibrator is generated to the supersonic wave to the side of the side of the side: the processed part of the victim is:=======—the side is affected by this side The position of the object is propagated to the body of the object to be processed, and the object is kept as follows: Therefore, the object to be processed can be loaded as follows: the body to be treated is protected, and the object to be processed is Keep the first place! The first! In the holding position, the first holding position is moved to the holding portion, and the second holding object is held in the second side of the second processed object position from the first position of the object to be processed. The side holding member drives the farm, in the first! After the object holding portion holds the holding portion, the second holding position is controlled, and the super-vibration is controlled: the first object to be processed holding portion is located at the second position, at least in the object to be processed The second vibration is generated by the holding portion at the second lateral position, and the ultrasonic vibration from the vibrator is transmitted to generate the ultrasonic wave, the first object to be processed body and the second body. : the object to be processed portion is processed, 201123281, the second holding position, and the position, and at least when the physical body holding portion is located at the i-th side control device, the vibrating sub-portion is located at the second lateral position, the sound wave The vibration propagates into the object to be processed and is subjected to the ft to maintain the super-resonance from the vibrator. _ heart ===: cleaning tank, storage cleaning supersonic = device, including: let the frequency be transferred to #jn 子子Cut acoustic wave; crane device, wave oscillating device and the driving device 2, 2 and control device 'control the supersonic part === is set in the vertical axis with the U-holding rod phase, 2^ the body center In the second, the second object to be processed, which is placed on the scale of the fresh body, the second object is protected. And a processing unit for controlling the holder driving means enabling the body to be in, the control means oscillating means enabling the transducer movement 'and controlling the vibration transmission to the ultrasonic sound waves to be processed. . The chopper vibration 'and controls the ultrasonic device from the vibrator to control the sonic cleaning device as follows: after the control, the body is immersed in the cleaning liquid in the cleaning tank, and moved to the present position = Hold # hold the first side position of the first holding position of the first holding position of the object to be processed, and then return to the position of the second holding position of the 亥 ^ * 2011 2011 2011 , , , The second object to be processed holding unit holds the processed position, and then returns to the second side of the holding position of the second holding unit to hold the ship ultrasonic wave device at least in the first object to be processed. When the second object to be processed is held at the side position of the portion 1 and at least in the ultrasonic wave, and the position from the side of the 袒2f is obtained, the first object is received by the vibrator. The acoustic vibration 'propagates' to the area being treated. The object to be processed and the second to-be-processed body holding unit may be provided with the processed body and the ultra-m wire. The first one of the first holding member and the third holding member may be provided with the third holding bar. , the second holding stick scales should be ^. Between the first holding bar and the first co-protecting bar, and the first holding body wave cleaning device may be as follows: the first holding bar is provided with a V-shaped shape In the second holding rod and the third-shaped cross-section, the first object to be processed and the first holding rod of the object to be processed are provided with a Y-shaped groove in which the Y-shaped groove 5 receives the body to be processed. section. #槽听有可可可可在此处理设置控制 The ϋ ϋ 归 归 归 归 归 归 归 T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T T The intermediate holding portion is placed at the second lowered position of the second holding position. When moving between the sets, the ultrasonic oscillation can be controlled by the device located below the second holding position as follows: the control down position and the first! The side obstacle retaining portion moves the first holding portion between the second lowering position and the &=, and the second processed object vibrator generates ultrasonic vibration: 'The third solution of this turn is provided - _ sonic cleaning method, the package 201123281 will be held by the 31 body holding device and immersed, and the Ί 允 允 允 保持 保持 冼 冼 冼; The supersonic n-washing (4) of the side holding structure (4) can be as follows: the member is moved sideways by the holding device, and the body is touched by the processing body. This is less in the area where the side position of the holding position is processed. At this time, the body L to be processed which is immersed in the main body to be held by the body to be held by the body is held in February, and is subjected to the body to be processed, and is processed. The side retaining body retaining means in the monthly washing tank is located at a side position, at least in the object to be treated which is placed at the side to be maintained: the vibration is propagated to the object to be processed and uniformly ultrasonically cleaned by the entire area. Therefore, the body to be treated can be held as follows: the object to be treated can hold the object to be processed individually, and the body to be treated is washed The method may also be as follows: in pairs, in the third solution, the limbs are moved in a tree-symmetrical manner. The object holding device moves to the side in the H. The month may be as follows: During the movement of the processing body holding device below the simple position i from the lowering position to the simple _#down position, and then moving from the lower side to the side position, the turbulent t-production body==4 set=hai. 201123281 The method to be processed can also be as follows: the step of placing the object holding device from the lateral position is further included to cause the ultrasonic vibration of the § hai vibrator. During the cattle position, the side portion is also maintained. The washing method may also be as follows: in addition to the object to be treated, the third: the (10) 'heart holding member' is paired: the clip, the square 3 may also be as follows: the side body is in The side holding member keeps the position of the holder = abutting the pair of holding portions When the breaking treatment body holding portion is located at the lateral position, the vibration of the object is received by the object to be processed by the object to be processed: ί:=ί 梦 番 & 2 & In the middle of the body, it is only treated as a static body. The side holding member of the washing tank is vibrated by ultrasonic vibration. Thereby, the x-zone x domain from the vibrator can be specifically smashed; ί?: it is protected by the object-retaining body holding portion of the one side. Therefore, the entire region of the object to be processed is uniformly ultrasonically cleaned. . The ultrasonic cleaning method of the above-mentioned third solution is as follows: 12 201123281 The fifth part C holds the second part of the side portion: the side position, and then returns to the side of the second side 2 holding position. The second == and the area to be held at least in the position of the second object to be processed. At this time, the cleaning position of the second side is moved from the second holding position to the area where the entire area of the object to be processed can be uniformly super-cleared = ^°. Therefore, the ultrasonic cleaning method is provided by the following method, which includes the first object to be processed holding unit and the liquid to be placed in the second object to be processed; and the object to be processed is impregnated into the cleaning tank. Cleaning the body holding portion to the side ^: at the portion, so that the ultrasonic wave is vibrated, and the vibrator at the bottom of the washing machine is generated, and the ultrasonic cleaning of the fourth solution is performed. The method may also be as follows: further includes 201123281. The following steps are performed: after the step of the i-th processed object is held in the i-th processed object = the move is moved, the body is moved. The second object to be processed holding unit is held by the first object to be processed Ι ί ί 波 f : : : : f f f f f f f f f f f f f f f f f f f f f f f f f f f 第 f f 第 f 第 第 第 第In the step of moving the phase 1 holding position side body holding portion, the holding position 'in the second holding position of the second object to be processed is changed, and the body holding portion is held from the processed position. Then, returning to the side of the second side of the second position of the second jersey 2, the cleaning method can also be as follows: When the position of the ultrasonic wave from the vibrator is at the position of the second object, the holding portion and the second portion are moved by the _° first object to be processed holding portion of the fourth solution. The skin is as follows: The step of moving the holding portion that is located below the second holding position at the first lowering position of the side is as follows: · Ultrasonic The first embodiment of the present invention provides an ultrasonic cleaning process during the movement between the lateral positions, the lowering position of the I1, and the body holding portion between the lowered position and the second lateral position. In the computer program of the method, the holding device for holding the cleaning liquid held in the cleaning tank in the cleaning chamber is moved to the side; the holding member, the object to be processed = the object to be processed Supersonic: Clear = bottom == The steps of generating the side movement of the ultrasonic wave and the step of ultrasonic cleaning are performed after the step of holding the object to be processed in 14 201123281 - Providing a recording medium and recording in the solution It is useful to be immersed in the cleaning tank by the treated body. The washing liquid is placed on the side 3, and the body holding portion is held, and the first object to be processed is held, and the ultrasonic body vibrating body is generated by the bottom body of the body, and the object to be processed is held on the side. After the holding member is held, the processed object 2 is uniformly ultrasonically cleaned in the entire region of the object to be processed. [Embodiment] (First Embodiment) The first day of the day, the forest hair (four) 1 is returned to the state. Fig. 1 to Fig. 14 Record the useful ultrasonic cleaning device, ultrasonic cleaning method, and record the memory of the ultra-g wave cleaning green and shouting. ^ 'Hunting from Figure 1 illustrates the ultrasonic cleaning device i: 1 , storage cleaning insert, raw ίf, UA wafer boat (being ruined) 2G, set to have U sub-cleaning tank 1G bottom plate (bottom) 14 outside the 4;: r40 connected with ultrasonic vibration Following "to make the vibrator J 眚 10 10 10 10 10 10 10 10 10 10 « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « « From the wall 11 to the top of FIG. 3, the cleaning tank 10 has four side walls 11 and is closely adhered to the air and water in a gas-tight and water-tight manner by means of the fixing mat 12 on each side. 13 and a fixed bottom plate 14, the stroke is approximately rectangular. And the middle side 15 201123281 The upper end of the wall 11 is formed with a groove 15 which reaches the level of the cleaning liquid so that the cleaning liquid flows out of the washing tank 10. At the upper end of the soil 1, the side wall 11 of the washing tank 10 is formed of a highly resistant chemical-resistant vinyl chloride (PTFE) or fluororesin (PFA). Further, the bottom plate is made of, for example, an anti-drug property and a sound-penetrating material such as amorphous carbon or a carbonized material. Therefore, even if the aqueous solution of ammonia aqueous hydrogen peroxide, the genus, or the diluted hydrofluoric acid described later is used as the chemical liquid, the aqueous solution of the side wall 1 of the cleaning tank 1G is resistant to chemicals. Therefore, it is possible to prevent the side wall u and the bottom plate 14 from being subjected to the production of the material and the material of the bottom plate 14 because of the permeability as described above, so that the ultrasonic vibration generated by the vibrator 4 确实 can surely have the chopping wave cleaning groove. 10 is housed in the container 16. The bottom of the container 16 is recovered from the groove j liquid formed at the upper end of the side wall „ of the cleaning tank 1G. This recovery tray is provided with a drain (not shown) to turn back and return. As shown in FIG. 2 and FIG. 5, the wafer boat 2's and the f-parts (subjects to be processed) 21a and 21b hold L (for example, the holding base portions 22a and 22b are connected to the respective wafer holding portions 21γ and 3, respectively. , extending in the vertical direction, wherein the pair of wafer holding portions 2la = ; b = the vertical direction axis only refers to FIG. 6 to the figure, approximately the pair = 24b, 'the long-term holding rod 3 231) the front end of the connecting member Shi, Bao = 23a t / the base end is connected to the base melon, orphan, each, the knife does not open; the child can be freely engaged in the wafer W 4 · thick; Mr animal and ^ 'each holding groove仏, 25b, having approximately the same shape 曰Ϊ circle W is engaged with such a retaining groove 25a, wish, because w is maintained in a direction approximately orthogonal to the retaining bars 23a, 23b, that is, the vertical round 2 'Using high-resistance quartz to form, and gas Gu Long (registered trademark) money film or Sic (carbonized stone shi) mineral film. The day and night boat 20 miscellaneous drive device 26 to lift and drive the wafer boat 2 〇. 16 201123281. The driving farm 26 has: the lifting and lowering drive units 27a and 27b are respectively raised and lowered, 21b; and the lifting/lowering driving force transmitting portion 28a, the moving portion, the driving portions 27a and 27b, and the base portions 22a and 22b. The driving force of the lifting/lowering voltage 27b is transmitted, and the lifting/lowering force transmitting portions 28a and 2 are connected to the base portion 22a and the coffee chamber. Thus, each of the wafers is configured to be individually connected to each other. Free movement (free lifting). Further, the positional relationship of each of the wafer holding portions 21 & 211 can be adjusted by the moving portions 27 & 2713 '. - The respective lifting and lowering driving portions 27a and 27b are connected to the control device 44. The control device 44 broadcasts and drives the respective lift driving units 27a and 27b. Thus, the lift drive 27b causes the wafer holding portions 21&, 2 to be lowered to insert the wafer W into the cleaning tank in accordance with a control signal from the control unit 44. 10 is immersed in the cleaning liquid, or the crystal portions 21a and 21b are raised to carry the wafer W out of the cleaning tank 1 ”. Further, the wafer boat 20 is in the cleaning tank by the driving device 26 Hold position of W (hand over the wafer w to the position of the wash arm 5〇 described later) : This holding position between a lowered position slightly below the 'roughly in the vertical direction by the lift from =). That is, in accordance with the control signal from the control device 44, the portions 21a, 21b are held in the holding position and the lowered position by the elevation driving portions 27a, 27b, and the wafer boat 20 is also at the lowered position and at the side of the descending position. The lateral positions are freely moved in the approximate horizontal direction, and the wafers 21a and 21b are also freely movable individually in the approximate horizontal direction. In addition, Ben Mingkui is a "side" and does not strictly mean a horizontal direction. For example, in the wafer w, the ultrasonic vibration transmitted from the vibrator 40 by the cadaver holding portions 20a and 20b is shielded by the crystal portion 20b. The regional bit noise can propagate the ultrasonic vibration to the test, and can also refer to the direction that is inclined with respect to the horizontal direction. n ° ° squeaking Connected to the drive unit 26 of the wafer boat 20, the wafer boat 2 is placed at the side of the lowering position (five). In other words, the drive unit 26 has a front side drive for moving the wafer holding units 21a and 21b at the lowering position and the side position, and the side driving force transmitting units 31a and 31b are respectively connected to the The lateral movements of the movable portions 30a and 30b are transmitted between the lateral movement units 30a and 30b and the elevation driving force transmission unit and the spring 28a. A control device 44 is connected to the spear-moving drive unit. Thus, the side = wafer security ===: motion two; the direction axis Y moves in an approximately symmetrical manner.至 and as shown in FIG. 6 to FIG. 14, the washing tank 1G is provided with a washing arm (the side portion can be rounded and received by the wafer w. The washing arm 50 is retracted from the washing tank 10 to keep it rounded. The position, and the waters that detached from and retreat from the wafer trade, are moved in an approximately horizontal direction. That is, the wash arm 50 has a pair of wafers that are held on the wafer boat 20 The two sides are abutted against the wafer W. Each of the clamping portions 51 includes: two abutting rods 52, a $tr surface; and a connecting member 53 that connects the respective abutting rods 2. Each of the clips 2 The two abutting bars 52 of the crucible 51 are arranged so as to be read by the horizontal direction of the center of the wafer w to FIG. 14), and the ultrasonic vibration propagating below the wafer t 5 W is subjected to each clip. The domain is maintained, and the entire area of the wafer W can be uniformly ultrasonically cleaned. The scoop area ^ 匕 = each part of the bar arm 50 is formed by high chemical resistance and the same as the wafer boat 2, and the surface is respectively coated with a Teflon coating or a Sic coating. Each of the nip portions 51 is connected to the arm holding portion (not shown) so that the nip portions 51 are interlocked between the accommodating/retracting positions, and the arm driving unit is connected to the control device 44. In this manner, the moving portion causes the respective clamping portions 5 to be forked between the position and the retracted position in accordance with a control signal from the control device 44. The cleaning liquid supply device 60 has two cleaning liquid supply nozzles 61 disposed along it. Each of the cleaning liquid supply nozzles 61 includes a tube extending in a substantially horizontal direction in accordance with 11; a plurality of first, first, and second nozzle holes 61c' are formed in the tubular nozzle body 61a, and are spaced apart at appropriate intervals. Arranged in the side direction. Among them, the i-th nozzle hole ejects the cleaning liquid toward the w-side, and the second nozzle hole 61e faces the bottom plate of the cleaning tank 1G. The cleaning liquid supply nozzle 61 is connected to the pure water supply source 65 via the pure water supply pipe 64 via the cleaning liquid supply pipe 62, and is connected to the chemical supply source 65 via the pure water supply pipe 64. Slot) 67. The switching valve 63 > monthly washing, i is supplied to the supply pipe of the pipe 62 (pure water supply pipe 64 or chemical liquid supply pipe 66). Shishui, the pipe 64 has a history of opening and closing valve 68 to adjust the pure ^ ^ ^ ° open + closed valve 68 through the pure water supply pipe 64 is connected to the control device 44, the control device 44 by opening and closing Γ - 2 | 攸 pure The water supply source 65 is supplied to the pure water of the washing tank ίο. The sputum liquid ^ supply ^! / 7 is provided with a liquid medicine chest 69 to supply the chemical liquid to the washing tank 10. This ίί; 67 tXT!^4,mmE 44 69 and the use of gas water Λ Λ music supply. Here, the chemical solution is used for the purpose of cleaning, and the hydrochloric acid is mixed with j _ blue 2 〇 2 _, acid (DHF) and the like. _. For the bottle 2〇2沮2〇) ’ or dilute the hydrogen fluoride device ί if heavy f liquid ί69 ’ and in the liquid tank 67 according to the control

it X 換閥63的樂液槽67不限於1個,亦可連结 1=::::=類的藥液供給到清洗二 構8〇以排出清洗液。各排設有2個排出閥機 在底板14的外面;閥體82 /、有.被抵接部81,安裝 接部81,·汽紅裝置84 方式自由抵接在此被抵 部81及底板μ貫穿料她動此閥體82的活塞桿83。被抵接 置糾,汽虹裝置控制裝 82。另,排液口 85配晋置44的控制信號而驅動閥體 清洗㈣的底板Μ之^;部之正下位置。藉此’ 排出閥機構80,可安裳振動子的位置上未配置有 本實施形態中,排液口 85 而此確貫地清洗晶圓W。另, 又,設於清洗槽10的排屮形’亦可為円形等任意形狀。The liquid tank 67 of the it X valve 63 is not limited to one, and a chemical solution of the type 1 =::::= may be supplied to the cleaning unit 8 to discharge the cleaning liquid. Each row is provided with two discharge valve machines on the outer surface of the bottom plate 14; the valve body 82 /, the abutted portion 81, the mounting joint portion 81, and the steam red device 84 are freely abutted against the abutted portion 81 and the bottom plate μ penetrates the piston rod 83 of the valve body 82. It is abutted and corrected, and the steaming device controls 82. In addition, the liquid discharge port 85 is provided with a control signal for the 44 to drive the valve body to clean (4) the bottom plate of the bottom portion; By the discharge valve mechanism 80, the liquid discharge port 85 in the present embodiment is not disposed at the position where the vibrator can be mounted, and the wafer W is surely cleaned. Further, the discharge shape of the cleaning tank 10 may be any shape such as a dome shape.

的排_鱗8〇之數封祕2個,亦可W 19 201123281 個或3個以上。 如圖1及圖2所示,清洗槽10的振動子 所==i〇· r r之外面対 音波缝裝置42。另,安裝在清洗槽1〇的振動$單體41=丄超 2ϋ的曰日Η W之位置即可’可為丨個,亦可為任意 振動子40連接有超音波振盈裝置42,此1 連接有麵電源部43以供給電力。又,置= 有^裝置44,超音波振錄置42依據來自控m妾 將咼頻驅動電力(驅動信號)輸送到振動子4〇。、 、曰不 控制裝置44將晶圓貨從晶圓舟^八 晶,^_圓保持部21a、鳥從保持^===置令 裝置44在下降位置細方位置之間移動 圓W之中受到曰曰圓二振動子40的超音波振動’傳播到晶 動均勻地傳播到晶1]W、“。1日使得超音波振 波清洗結束後,令晶圓保持部21a、flb ^ 曰曰, 位置,將晶圓W從洗務臂50移交給晶圓舟2〇降位置和動到保持 本貫施形態中,控制裝置44含有電腦,並藉 圓==先_ 45 _料波清洗‘ g晶 即本構成的本實施形態之作用,亦 以ri0 (第1步驟)。此時,首先如 將純水從純水供給源65=f=裝置44的控制信號而開啟, 61。此時,切換閥63受到;= 奐::, 而供給到清洗液供体嗔嘴 通到清洗液供給i 62文到控制裝置44控制而將純水供給管64連 20 201123281 供給純水後’藥液泵69接受爽白 =,將藥液«液槽67經由切換“ ^ 受到控制裝置44控制:將藥=1 槽二上端的凹 給。出U6外部。此後亦繼續從藥液槽67進行藥=供 時,將Ζξ圓= 曼潰到清洗槽10内的清洗液(第2步驟)。此 而保持在晶圓保持部21a、2lb(丧,保^冓25a、25b, 27b接受來自控制| f (:二。圖)。其-人,升降驅動部27a、The number of rows _ scales 8 封 is 2 secrets, or W 19 201123281 or more. As shown in Figs. 1 and 2, the vibrator of the cleaning tank 10 ==i〇·r r is the outer surface acoustic wave device 42. In addition, the vibration of the cleaning tank 1 41 单体 丄 丄 单体 单体 单体 单体 丄 丄 丄 丄 ϋ Η Η Η Η Η Η Η , , , , , , , , , , , , , , , , , , , , , , , , 1 The surface power supply unit 43 is connected to supply electric power. Further, the setting = device 44, the ultrasonic vibrating unit 42 transmits the 驱动 frequency driving power (drive signal) to the vibrator 4 in accordance with the control m 〇. And the control device 44 moves the wafer goods from the wafer boat, the round holding portion 21a, and the bird from the holding device to the lower position of the falling position. The ultrasonic vibration of the rounded vibrator 40 is propagated to the crystal to propagate uniformly to the crystal 1]W, "1. After the ultrasonic vibration cleaning is completed, the wafer holding portions 21a, flb ^ 曰曰, the position, the wafer W is handed over from the cleaning arm 50 to the wafer boat 2 and the moving position to the maintenance mode, the control device 44 contains the computer, and the circle == first _ 45 _ wave cleaning The g crystal is the action of the present embodiment of the present configuration, and is also ri0 (first step). At this time, first, pure water is turned on from the pure water supply source 65 = f = the control signal of the device 44, 61. The switching valve 63 receives; = 奂::, and the supply to the cleaning liquid supply nozzle passes to the cleaning liquid supply i 62 to the control device 44 to control the pure water supply pipe 64 to 20 201123281 after supplying pure water 'chemical liquid The pump 69 accepts the whitening =, and the liquid medicine 67 is controlled by the control device 44 via the switching "^: the concave of the upper end of the medicine = 1 slot. Out of U6 outside. Thereafter, the drug solution is supplied from the chemical solution tank 67, and the cleaning liquid in the cleaning tank 10 is collapsed (the second step). In this way, the wafer holding portions 21a and 2b are held (the sorrows, the protections 25a, 25b, and 27b are received from the control | f (: two). The person, the lifting drive unit 27a,

的晶圓保持部21二lb降^信t同步驅動,保持有晶圓W 晶圓W的保持貝if先液。此時,晶關持㈣a、训未在保持 此時4先將晶圓舟20移交給洗條臂5G(第3步驟)。 各夾持部51從退自控制裝置44的控制信號而.驅動, ,的側面二:置1=:置此 在保^圓w的保:置#。50。此時,晶圓保持部仏、训維持 升降驅動部曰2Hbn呆i寺/曰圓w的位置下降(第4步驟)。亦即, 動,晶圓保持部21a 自控制裝刀置?的控制信號而同步驅 21b離開晶圓w。此日士,^圖9麥照)。藉此’晶圓保持部2la、 的下降位置。 $ ’曰曰圓保持部21a、21b位在低於保持位置 步驟)其Ϊ時晶在下降位置與側方位置之間連續移動(第5 側方私動驅動部30a、30b接受來自控制裝置^的 21 201123281 控制信號而驅動,晶圓保持部21a、21b相對 的垂直方向軸線γ而以約略對稱的方式移動過晶圓w中心 保持部21a往圖9之中的左方向移動,並二^邊的晶圓 21b往右方向移動,晶圓保持部21a、2 =邊的晶圓保持部 1〇)。其後,移綱左方㈣—邊的晶圓保 芬照圖 並且移動到右方向的另-邊的晶圓保持部2 a^^右方向, 圓保持部21a、21b回到下降位置(參照圖 :方向移動,晶 21a、2lb在下降位置與側方位置之間以約略)^持部 tmml 6 日日laj保持。卩21a、21b回到下降位置。另 丄才门..、、占上 在下降位置與側方位置之間的往復次數不“=;21b 晶圓舟20在下降位置與财位置之 ^為多次。 置44令振動子40產生超音波振動 ^時 1移生超音波振動而超音波清洗晶圓w。如 於保持位置的下;:置又及=1之= 實地防止晶圓保持部21a、21b在下二動。猎此,能確 間接觸到晶圓W。 〃側方位置之間移動期 等。此段期液如此’去除附著於晶圓w的微粒等 ί去t f樂液供給到清洗槽10内。藉此,能使從晶圓 10的的微粒,隨著溢流的清洗液而從清洗槽 此’能將清洗液維持在潔淨的狀態,能提升 圓wlilt81 w的超音波清洗處理後’進行細曹ι〇内之晶 (第7步驟)。此時,首先停止藥液果69,阻止對 切拖門勺樂液供給。其次控制裂置44開啟開閉閥68並且令 切換閥63動作,將純水從純水供給源65供給到清洗槽1〇。其後 22 201123281 與上述第6步驟相同,人扭 動傳播到清洗液。7、子40產生超音波振動,將超音波振 9步驟)。此時,首先移交給晶圓舟20(第8步驟、第 的控制信號而同步驅動,:f 27a、27b接受來自控制裝置44 合於保持棒23a、23b 、21b上升,晶圓w卡 批(第8步驟,參昭圖^f 25a、25b*保持在晶圓保持部21a、 晶圓舟20。此時,晶圓):二°,,將晶圓W從洗梅臂50移交給 位置。 曰曰圓保持部21a、训位於保持晶圓W的保持 夾持5 St部置,:自,置44的控制信號而驅動,各 保持位置。 此時,晶圓保持部21a、21b維持在 其次,將浸潰到清洗液的晶圓 驟)。此時,升降驅動部27a、,:圓二::洗槽10搬出(第1〇步 號而同步驅動,保持晶圓W的曰圓二,制裝置44的控制信 圓W仰、、主、、土 4* ι.λ ία 的日日圓保持部21a、21b上升,脾曰 圖示的搬月送機。出。其後,將晶圓%從晶圓舟20移交給Ϊ 序超ίϊ清ί由適當重複上述步驟,在清洗槽^中將晶圓W依 如圖洗=央内白洗液係因應於必要而更換。此時,首先 80的汽缸裝置84,使閥工 控制信號’驅動排出閥機構 清洗液排出結束後,驅t汽1日裝置^ 1G内的清洗液。在 81,被抵接部81與閥體82之^ ㈤體82抵接在被抵接部 第1步驟相同,清洗水兩密。其後’與上述 如此依據本實施形態液。 由晶圓舟20之晶圓保持部21a H10内的〉月洗液中並且 於清洗槽⑴崎_ 5Qb W,移交給設 ,、设日日0保持部2la、21b從保持 23 201123281The wafer holding portion 21 is driven by two lbs of reduction, and the wafer W is held. At this time, the crystal holding (4) a, the training is not maintained, and the wafer boat 20 is first handed over to the washing arm 5G (third step). Each of the clamping portions 51 is driven from a control signal that is retracted from the control device 44. The side surface 2 is set to 1 =: set to be in the protection circle w. 50. At this time, the position of the wafer holding portion 仏, the training maintaining the lifting/lowering driving unit 曰2Hbn, and the position of the circle w (the fourth step) is lowered. That is, the wafer holding portion 21a is separated from the wafer w by the control drive signal for controlling the mounting of the blade. This Japanese, ^ Figure 9 Mai Zhao). This is the lowering position of the wafer holding portion 2la. $ '曰曰 round holding portions 21a, 21b are located below the holding position step), and the Ϊ time crystal continuously moves between the falling position and the side position (the fifth side private driving portions 30a, 30b receive the control device ^ 21 201123281 is driven by the control signal, and the wafer holding portions 21a and 21b are moved in a substantially symmetrical manner across the wafer w center holding portion 21a in the left direction in the left direction in FIG. The wafer 21b is moved in the right direction, and the wafer holding portions 21a and 2 are the wafer holding portions 1). Thereafter, the wafer on the left side (fourth) side is moved and moved to the other side of the wafer holding portion 2 in the right direction, and the circular holding portions 21a and 21b are returned to the lowered position (refer to Fig.: The direction is moved, and the crystals 21a, 2lb are held between the lowered position and the lateral position by about 7 days laj.卩21a, 21b return to the lowered position. The other is that the number of reciprocations between the falling position and the side position is not "=; 21b the wafer boat 20 is in the falling position and the financial position ^ is multiple times. Ultrasonic vibration ^1 1 shifting ultrasonic vibration and ultrasonic cleaning wafer w. As in the holding position;: set and = = = solidly prevent the wafer holding portions 21a, 21b from moving in the next two. Hunt this, It is possible to surely contact the wafer W. The movement period between the side positions of the crucible, etc. This period of liquid is such that 'the particles attached to the wafer w are removed, and the tf liquid is supplied to the cleaning tank 10. The particles from the wafer 10 can be maintained in a clean state from the cleaning tank with the overflowing cleaning liquid, and the ultrasonic cleaning process of the round wlilt81 w can be improved. Crystal (Step 7). At this time, the liquid fruit 69 is first stopped, and the supply of the liquid to the cutting door is prevented. Next, the control split 44 opens the opening and closing valve 68 and causes the switching valve 63 to operate, and the pure water is purified from pure water. The supply source 65 is supplied to the cleaning tank 1〇. Thereafter, 22 201123281 is the same as the sixth step described above, and the person is twisted and propagated to the clear 7. The sub-40 generates ultrasonic vibration and the ultrasonic vibration is 9 steps. At this time, it is first handed over to the wafer boat 20 (the 8th step and the first control signal are synchronously driven, and f 27a, 27b are controlled from the control). The device 44 is held in place by the holding bars 23a, 23b, and 21b, and the wafer w is in a batch (the eighth step, the image holding portion 21a, 25b* is held in the wafer holding portion 21a, the wafer boat 20. At this time, the wafer ): at 2°, the wafer W is transferred from the brace arm 50 to the position. The round holding portion 21a is held in the holding nip 5 St portion of the holding wafer W, and the control signal of 44 is set. At this time, the wafer holding portions 21a and 21b are maintained next, and the wafer is immersed in the cleaning liquid. At this time, the lifting/lowering driving unit 27a, the round two: the washing tank 10 is carried out. (The first step is synchronously driven to maintain the roundness of the wafer W, and the control circle of the device 44 is raised, and the sunday holding portions 21a and 21b of the main body and the soil 4* ι.λ ία rise. The spleen is shown in the image of the moving machine. After that, the wafer % is transferred from the wafer boat 20 to the 超 超 超 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由The circle W according to the figure washing = the central white washing liquid is replaced according to necessity. At this time, first, the cylinder device 84 of 80 causes the valve control signal to drive the discharge valve mechanism to discharge the cleaning liquid, and then drive the steam for 1 day. The cleaning liquid in the device ^1G. At 81, the abutting portion 81 abuts the (five) body 82 of the valve body 82 in the first step of the abutting portion, and the washing water is double-tight. The liquid is transferred to the cleaning tank (1) _ 5Qb W from the wafer holding portion 21a H10 in the wafer holding portion 21a H10, and the holding unit 23a and 21b are held from the holding unit 23 201123281

位置移動到下降位置並在下降位置與側方位置之間杏 晶圓保持部21a、21b在下降位置與側方位置之間移動期:= 裝置44令振動子4〇產生超音波振動。藉此 自B 的超音波振動傳播到晶圓W之中受到晶圓保持部= ?區域(遮蔽的_,並且將超音波振動均 二$ 區。因此,能將晶圓W全區均勻地超音波清洗。爾J曰曰固W全 又,依據本實施形態,晶圓保持部21a、21b W中心的垂直方向轴、線γ而以約略對稱的方式配置 位^與側方位置之間械於垂直方向軸線γ而以約略對稱^ 移動。错此,能縮短將晶圓w從晶圓舟20移交体劈冉1式 i圓,縮 的距離(保持位置與下降位k間t 形。谢她旨㈣進行各種變 亦即,描述本實施形態中,晶圓舟20的晶 itrif位置之間連續移動之例。但不限於^ 側^置後,停ίίί二晶=持=、m從下降位置到達 :?圓=自振動子4。的超音波振動傳播中置受 上:训保持的區域’並且將超音波振動均勻I; 又控制裝置44如上所述令到達側方位置的 2 =止規定時間時,亦可僅在娜 、= =期間令振動子4〇產生超音波振動。亦即,控止·^方 ^字^曰圓W從晶圓舟2移交給洗務臂5〇後 ^】可 21b從下降位置往側方位置移動,並至少在2la、 位於側方位置時令振動子40甚 _保持m训 21a、21b保持的區域’並且將超音波振動均勻地傳又播 24 201123281 區〇 又,本實施形態中係描述當晶圓保持部21&、2比 與側方位置之間連續移動期間,控制裝置44令振動子4U 音波振動之例。但不限於此,亦可僅在晶圓保持部21° 降位置往側雜置雜_令獅子4G產生超音波 2 晶圓保持部2la、2ib從側方位置往下降位置移動期間令振動H 產生超音賴動。這些場合下均能絲自絲 傳播到晶圓w之中受到晶圓保持部21a、21b保持的&皮= 將超音波振動均勻地傳播到晶圓W全區。 4 ϋ 又’本實施形態中係描述晶圓舟2〇具有成對的晶圓保 2U、21b且此晶圓保持部21a、21b個別地移動之例。但不限於此, 晶圓保持部21a、21b亦可形成為一體而在下降位置鱼側方位 2-體地移動。此時亦能將來自振動子4Q的超音波^ $ 中受到晶圓舟2G保持的區域,並^將超 = 傳播到晶圓W全區。 @ J J地 又’本實施形態中係描述晶圓保持部21a、21b經過低於 =置的下降位置而從簡位置賴綠置義,並且下降位 置而從側綠置往保躲置機之例。但不·此,亦可令^ ,持部21a、21b不經過下降位置而在保持位置與侧方位 動。此時能^圓保持部21a、21b的驅動控制簡約化。門移 又,本實施形態中係描述晶圓保持部21a、21b相對於通過曰 阳:中心日的垂直方向軸'線Y而以約略對稱的方式移動之例。但^ ^同匕部叫士、2化亦可在下降位置與側方位置之間彼 位置朝側方位置往左方向移動(參照圖= 人、,,7弟1晶圓保持部21&從侧方位置朝下降位置往右方 二=二Ϊ且令另一邊的晶圓保持部(第2晶圓保持部)鳥從下降 側方位L月右方向移·。其後’令第2晶圓保持部2ib從 21a、21b期門人;往左方向移動。亦可在如此移動晶圓保持部 21b期間令振動子4〇產生超音波振動。此時能將來自振動子 25 201123281 次數可定為任意次^ m在下降位置與側方位置之間往復移動的 圓舟20移交給洗蘇臂5〇後i 圓W從晶 =保持部21a,從下降位置往側綠置“ 在曰1 :置移‘;===== 爾位置往下降位置移=且= 生超立波㈣ri降,置_綠置義_,令振動子40產 晶=w ί中受來自振動子40的超音波振動傳播到 波振動均勻5傳播0保持的區域’並且將超音 16的又底述清洗槽1G收容於容器16,而此容器 例。,的清洗液之 清内的清洗液供給喷嘴,或設有將 喈μ又’本貧施形態中係描述清洗槽ι〇内設有2個清洗液供仏噴 又之t ί τ限r:亦可設有4個清洗液供給喷嘴(i i、示:) 10 Μ 本只轭形L中係描述藉由非晶碳或碳化矽來形成清洗样 2=板14,令此底板14較厚(例如,65mm)並直接安尥= 性^二但ΐ限於此,亦可令底板14厚度更薄,並隔著音波穿透 亦=八雜補強用板而將振動子40安裝在此底板14。此時, 亦月b令來自振動子40超音波有效率地穿透。 子 26 201123281 再者,本實施形態中,係將振動子40直接安裝λ、、杳法辦ι〇 的底板14。但不限於此,亦可在清洗槽1〇下方設^追加的^(未 圖7以貯存純水使其至少浸潰到清洗槽10的底部’並將振動子 40安^在此追加的槽之底部。此時,振動子4〇所產生的超音波振 動,藉由追加的槽之純水而傳播到清洗槽1〇,能在清洗槽1〇中確 實地將晶圓W超音波清洗。 曰 另’ ί見已描述上述實施形態數種變形例,亦能將 適當組合應用。 (弟2貫施形態) 心ϊϋ由圖15至圖17說明本發明之第2實施形態。圖15至圖口 施形態中立的超主音波清洗裝置、超音波清洗方法、以及 …条有用於執仃此超音波清洗方法之電腦程式之記錄媒體。 曰至圖1所不的第2貫施形態中,主要不同點在於,將 :固保持在絲臂及晶圓舟的第i晶圓保持部後 : 。弟1貝靶形態約略相同。另,圖15至圖i , 的第1實施形態相同的部分’標註相同元麵縣: 持邱t實ί形11中的晶81舟2G具有個別自由移動的成對的曰圓俾 曰n 置在將日日圓W保持在洗務臂5G及晶圓舟20的第] 曰日圓保持部21a後,控制驅動裝詈%八曰 的第1 ^部21b從第2保持位置經過第2 ^ $ G = 2晶圓保 其後從第2側方位置經過第2下降^位置钟2側方位置移動, 後’控制裝置44在將晶圓〜保^=”持位置。其 2lb後,控制驅動裝置26令第';、圓伴持及f晶圓保持部 經過第1下降位置而移動到第i 從弟1保持位置 位置經過第1下降位置而回到第i保持署/在其後從第1側方 ,制裝置44控制超音波振μ , 在弟2 τ降錄鮮⑽转置之 e 27 201123281 下降位置與第1側方位置之間移動期間,令振動子 m3 Α,ΐ二t 曰曰®保持部21a及第2晶圓保持部21b保持 的區域(遮敝的區域)。另,控制裝置* 曰 1^21a 2 2iJb ^ 到第2日曰日圓保持部21b遮蔽超音波振動的時間均等。又 .第1實施^ 的超音波清洗方法。在此主要說明與 持部液的晶圓w,藉由洗蘇臂5G的成對的夾 制裝置控 持部 晶圓W的超音 的第2晶圓保持部21_方移動並進行The position is moved to the lowered position and the apricot wafer holding portions 21a, 21b are moved between the lowered position and the side position between the lowered position and the side position: = The device 44 causes the vibrator 4 to generate ultrasonic vibration. Therefore, the ultrasonic vibration from B propagates to the wafer W and is subjected to the wafer holding portion = ? region (shadowed _, and the ultrasonic vibration is equal to two regions. Therefore, the wafer W can be uniformly over the entire region. In addition, according to the present embodiment, the vertical axis of the center of the wafer holding portions 21a and 21b, and the line γ, are arranged in a substantially symmetrical manner between the position and the lateral position. In the vertical direction, the axis γ is moved approximately symmetrically. In this case, the wafer w can be shortened from the wafer boat 20 to the circle of the formula i, and the distance is reduced (the holding position and the falling position k are t-shaped. In the present embodiment, an example in which the crystal itrif position of the wafer boat 20 is continuously moved is described. However, it is not limited to the side of the wafer, and the crystallization is stopped. Arrival: ? Circle = self-vibration 4 in the ultrasonic vibration propagation. The upper portion of the training is held and the ultrasonic vibration is uniform I; and the control device 44 makes the 2 = limit to the lateral position as described above. At the time of the time, the ultrasonic vibration can be generated only by the vibrator 4 during the period of Na and ==. ^方^字^曰圆 W is handed over from the wafer boat 2 to the washing arm 5〇^] 21b can be moved from the lowered position to the side position, and at least 2la, in the lateral position, the vibrator 40 is even _ Keeping the area where the m training 21a, 21b is maintained 'and transmitting the ultrasonic vibration uniformly and broadcasting 24 201123281. Further, in the present embodiment, the continuous movement between the wafer holding portion 21 & 2 ratio and the lateral position is described. In the meantime, the control device 44 oscillates the vibrator 4U sound wave. However, the present invention is not limited thereto, and the ultrasonic wave 2 wafer holding portion 2la may be generated only by the side of the wafer holding portion 21°. When the 2ib moves from the side position to the lowering position, the vibration H generates a supersonic motion. In these cases, the wire can be propagated from the wire to the wafer w and held by the wafer holding portions 21a and 21b. The acoustic vibration propagates uniformly to the entire area of the wafer W. 4 ϋ In the present embodiment, the wafer boat 2 has a pair of wafer holdings 2U, 21b and the wafer holding portions 21a, 21b are individually moved. For example, the wafer holding portions 21a and 21b may be formed integrally and lowered. The fish side orientation 2-body movement. At this time, the ultrasonic wave from the vibrator 4Q can be received by the wafer boat 2G, and the super= is propagated to the entire area of the wafer W. @JJ地地In the present embodiment, the wafer holding portions 21a and 21b are described as being lowered from the lower position by the lowering position than the lower position, and are lowered from the side position to the maintenance machine. However, this is not the case. Further, the holding portions 21a and 21b can be moved in the holding position and the side direction without passing through the lowered position. At this time, the drive control of the circular holding portions 21a and 21b can be simplified. The door shift is further described in the present embodiment. The wafer holding portions 21a and 21b are moved in a substantially symmetrical manner with respect to the vertical axis A of the center of the sun. However, ^ ^ 匕 叫 、 、 2 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 The side position is two to two on the right side toward the lower position, and the other side of the wafer holding portion (second wafer holding portion) is moved from the lower side of the lower side to the right side of the month. The holding portion 2ib moves from the 21a, 21b period door to the left direction. The vibrator 4〇 can also be subjected to ultrasonic vibration during the movement of the wafer holding portion 21b. The number of times from the vibrator 25 201123281 can be determined to be arbitrary. The boat 20 that reciprocates between the descending position and the side position is handed over to the wash arm 5〇, and the i circle W is from the crystal=holding portion 21a, and the green side is set from the lowered position to the side. ';===== The position is shifted to the descending position = and = the super-wave (four) ri is lowered, the _ green is set to _, the vibrator 40 is produced = w ί is transmitted by the ultrasonic vibration from the vibrator 40 The wave vibration is evenly spread 5 and the area held by 0' and the cleaning tank 1G of the supersonic 16 is accommodated in the container 16, and the container is cleaned. The cleaning liquid supply nozzle in the clearing or the setting of the cleaning tank 〇 in the 贫μ and 本 施 ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” 4 cleaning liquid supply nozzles (ii, show:) 10 Μ This yoke L describes the formation of a cleaning sample 2 = plate 14 by amorphous carbon or niobium carbide, so that the bottom plate 14 is thick (for example, 65 mm) And directly ampere = sex ^ 2, but limited to this, the bottom plate 14 can be made thinner, and the vibrator 40 is mounted on the bottom plate 14 via the sound wave penetration and the eight miscellaneous reinforcement plate. In the present embodiment, the vibrator 40 is directly attached to the bottom plate 14 of the λ, 杳 办 。 。 。 。 。 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 An additional ^ can be provided under the cleaning tank 1 (not shown in FIG. 7 to store at least pure water to the bottom of the cleaning tank 10) and the vibrator 40 is placed at the bottom of the additional tank. The ultrasonic vibration generated by the vibrator 4 is propagated to the cleaning tank 1 by the additional pure water of the groove, and the wafer W can be surely superseded in the cleaning tank 1清洗 ί ί ί ί 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 数 ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( The method of the neutral super-sonic cleaning device, the ultrasonic cleaning method, and the recording medium for the computer program for performing the ultrasonic cleaning method are shown in Fig. 1. The main difference is that the solid body is held behind the i-th wafer holding portion of the wire arm and the wafer boat: the shape of the first-shell target is approximately the same. In addition, the first embodiment of FIG. 15 to FIG. Partially labeled the same Yuanmian County: holding the Qiu t-solid 11-shaped crystal 81 boat 2G with individual free-moving pairs of round 俾曰n placed in the day of the yen W in the washing arm 5G and the wafer boat After the Japanese yen holding portion 21a of 20, the first ^ portion 21b that controls the driving device % 曰 is passed from the second holding position to the second ^ G = 2 wafer, and then passes through the second lateral position. 2 Falling position 2 The position of the clock 2 moves, and the 'control device 44 holds the wafer to the position of the wafer. After 2 lb, the control drive unit 26 causes the 'the circle' and the f-wafer holding unit to move to the i-th slave 1 holding position position through the first lowering position and return to the i-th holding unit. / Thereafter, from the first side, the device 44 controls the ultrasonic vibration μ, and the vibrator m3 is moved during the movement between the descending position of the e 27 201123281 and the first lateral position. In other words, the region (the concealed region) held by the second holding portion 21a and the second wafer holding portion 21b. Further, the control device * 曰 1^21a 2 2iJb ^ is equal to the second day of the day when the yen holding portion 21b shields the ultrasonic vibration. Further, the ultrasonic cleaning method of the first embodiment. Here, it is mainly explained that the wafer w holding the liquid portion is moved by the second wafer holding portion 21_ of the pair of the gripping device control portion wafer W of the washing arm 5G.

的位=降,第2晶圓保持部21b從保持晶圓W 置44的控制信號而1區使、| ’曰升=區|部2几接受來自控制裝 藉此,晶圓W保持在H 0曰固保持部21b下降(參照圖15)。 21b ^ a ^ 2U 5 2 - 第2保持位置的第2 ^降位置。守第2曰曰圓保持部21b位在低於 之間連續移動(第曰^^部^1在第2下降位置與第2側方位置 44 Z7slTJ^〇b ^ 部21b往左方向移動ϋ在右方向移動的第2晶圓保持 期間,第1晶圓保|部2U 參照圖17)。另,此段 幻日日《保持部m在第2τ降位置與第2側= 28 201123281 置之間連續往復移動。另,令第2晶圓保 置與第2财位置之間往復的次數不限於丨次,亦^ 位 當第2晶圓保持部训在第2 ^^夕=。 連續移動期間,控制裝置44令振動子40產生置^間 如此:能將超音波振動傳播到晶圓3 持部21b遮蔽的區域。 j第2日日圓保 其次’第2晶圓保持部21b從第2 晶圓W的第2保持位置(第24步驟,炎 回到保持 動部27b接受來自控制震置4 : ^ = °此時,升降驅 持部训上升。藉此,第i晶圓^^ ^第2晶圓保 成為約略相同高度,晶圓w卡合於^ 2 j保持部2lb 持在第2晶圓保持部2!b。如此/藉由洗 心、^冓25b而保 =21a及第2晶圓保持部21b保持晶圓::^曰圓保持 邛21b位於保持晶圓w的第2保持位置。、弟2曰曰圓保持 往側芩令第1晶圓保軸a 25 , 遽而驅動,使第“日日圓保持部21a下降來上ΐΐ的控制信 此時,第i晶圓保持部21a位j 呆 =叫離開晶圓 降位置。 牡低於弟1保持位置的第1下 1 第1側方位置。其後,往固1D甲的左方向移動,到達 方向移動而回到第i 日圓保持部21a往右 4 21a在第!下降位置 :止如此’弟1晶圓保持 第1晶圓保持部2U在第1 ™置咖: 29 201123281 次數於1次,亦可定為多次。 連續移動期間在置與第1側方位置之間 _。如此,能=======27 持部21a遮蔽的區域。 j日曰圓W之中叉到第1晶圓保 曰圓t欠祕i1/曰圓保持部现從第1下降位置上升並回到伴持 广接受來自控制裝置44的控制信號f驅動)二’部 21a上升。藉此’第丨晶_铸21 f a ^ ^ ^持部 ΪΤΪ ^ "1; " ® W ^ ,Η:®,¾ 第1曰曰圓保持部21a。如此,藉由洗務臂5 ,待在 及第2晶圓保持部21b而保持晶圓w。此時曰曰/伴^ 21a、 位在保持晶圓W的第1保持位置。 曰曰圓保持邠21a 其-人,進行清洗槽1〇内的晶圓w之清 此時,排出清洗槽1G内的藥液並供 二329,。 第28步驟相同,令第!晶圓 2、曰步驟至 動且令超音波振動傳播到清洗液。衫2曰曰®保持部2化移 其後,將晶圓W從清洗槽10搬出。 如此依據本實施形態,浸潰到清洗槽1〇 圓舟20的第1晶圓保持部21a及第 姓且由晶 W ’保持在設於清洗槽1G内的洗物的晶圓 其後,第2晶圓保持部21b從第2保持位ί往第21a, 位置。再魏,_ 2保持 下降位置與第丨側方位置之間連續f 並在 1 ilf铸21a在第1下降位置與第丨=以= 間移動期間,控制裝置44令振動子4〇以:方位置之 能將來自振動子4〇的超音波振動傳播到曰曰曰圓起以g到以晶 201123281 - 圓保持部2la及第2晶圓保持部21b保持的區坫t 且能將超音波振動均勻地傳播到晶圓w全區°。5 [敗a的區域),並The position of the second wafer holding portion 21b is changed from the control signal for holding the wafer W to the first wafer, and the portion of the second wafer holding portion 21b is received from the control package, and the wafer W is held at the H. The 0 tamping holding portion 21b is lowered (see Fig. 15). 21b ^ a ^ 2U 5 2 - 2nd position of the 2nd holding position. The second round holding portion 21b is continuously moved between lower positions (the second portion ^1 moves to the left in the second lower position and the second side position 44 Z7slTJ^〇b^ portion 21b) In the second wafer holding period in the right direction, the first wafer holding portion 2U refers to FIG. 17). In addition, this section of the magic day "the holding portion m continuously reciprocates between the 2nd τ drop position and the 2nd side = 28 201123281. In addition, the number of times of reciprocation between the second wafer holding position and the second fiscal position is not limited to the number of times, and the second wafer holding unit is taught to be the second. During the continuous movement, the control unit 44 causes the vibrator 40 to be placed in such a manner that the ultrasonic vibration can be propagated to the area where the wafer holding portion 21b is shielded. Jnd day, the second round of the second wafer holding portion 21b is from the second holding position of the second wafer W (the second step, the inflammation returns to the holding portion 27b and receives the control from the vibration 4: ^ = ° The lift drive training is increased. Thereby, the i-th wafer is maintained at approximately the same height, and the wafer w is engaged with the holding portion 2lb in the second wafer holding portion 2! b. By holding the core, the second wafer holding portion 21b holds the wafer: the first holding position 21b is located at the second holding position of the holding wafer w. The circular holding axis 1 25 is driven to the side, and the first "Japanese yen holding portion 21a is lowered to the upper control signal. At this time, the i-th wafer holding portion 21a is left at the position j. The wafer is lowered in position. The oy is lower than the first lower side 1st position of the position where the younger brother 1 holds the position. Then, it moves to the left direction of the solid 1D, moves in the direction of arrival, and returns to the i-th yen holding portion 21a to the right. 21a is in the "down" position: the "first wafer holding unit 2U is held in the first 1st wafer: 29 201123281. The number of times is one or more times. 1 Between the side positions _. In this way, can =======27 The area covered by the holding part 21a. j 曰 曰 之中 W to the first wafer 曰 曰 t t i i i i i The portion is now raised from the first descending position and returned to the support signal f driven by the control device 44. The second portion 21a rises. By this, the first 丨 crystal_cast 21 fa ^ ^ ^ holding unit ΪΤΪ ^ "1;" ® W ^ , Η:®, 3⁄4 1st round holding portion 21a. Thus, the wafer w is held by the cleaning arm 5 and the second wafer holding portion 21b holds the wafer w.曰/compensation 21a is located at the first holding position of the holding wafer W. The round holding 邠21a is the person, and the wafer w in the cleaning tank 1 is cleaned, and the medicine in the cleaning tank 1G is discharged. The liquid is supplied to the second 329. The same as the 28th step, the first wafer 2, the 曰 step is moved, and the ultrasonic vibration is propagated to the cleaning liquid. After the shirt 2 曰曰 保持 2 is moved, the wafer W is transferred. According to the present embodiment, the first wafer holding portion 21a and the first surname which are immersed in the cleaning tank 1 of the cleaning tank 1 are held by the crystal W' in the washing tank 1G. Wafer followed by second wafer The holding portion 21b moves from the second holding position ί to the 21st position, and then wei, _ 2 keeps the falling position and the 丨 side position between the continuous f and at 1 ilf cast 21a at the first falling position and the third 以 = = During the inter-movement, the control device 44 causes the vibrator 4 to transmit the ultrasonic vibration from the vibrator 4〇 to the round to g to the crystal 201123281 - the circular holding portion 2la and the second crystal The region 坫t held by the circular holding portion 21b can uniformly propagate the ultrasonic vibration to the entire region w of the wafer w. 5 [the area that defeated a), and

- 全區均勻地超音波清洗。 °π。口此,能將晶圓W 又,依據本實施形態,將晶圓W超音 到洗滌臂50及晶圓舟20其中一邊之曰圓仅,晶圓W受 能穩定保持晶圓W。 逯之曰曰®保持部所保持。藉此, 另,上述第2實施形態,與第i實施 主旨範圍内進行各種變形。 心5樣此在本發明的 T7夂在第2實施形態中魏明當第2晶圓保持部21b在第9 在ϋ弟2側方位置之間移動期間、及第1晶圓伴持邻5 振;之例。但不限於此’峨置44亦可在令至Γ達^ 方位置、第2側方位置的第i晶_持部2ia j弟1側 日細狀態下,僅在第1 _則 :貝方,置期間、以及第2晶圓保持部 保持在_ 5G及第丨晶·^ 保持部2!b從第2保持位置往第2側方 後晶®- Uniform ultrasonic cleaning throughout the area. °π. In this way, the wafer W can be superimposed on one side of the washing arm 50 and the wafer boat 20 in accordance with the present embodiment, and the wafer W can stably hold the wafer W. It is maintained by the 逯 曰曰® Holder. As a result, various modifications are possible in the second embodiment described above and in the scope of the first embodiment. In the second embodiment, the second wafer holding portion 21b of the present invention moves between the ninth position of the younger brother 2 and the first wafer. Vibration; example. However, the present invention is not limited to the first _th: the square 状态 状态 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 The set period and the second wafer holding portion are held at _5G and the second crystal holding portion 2!b from the second holding position to the second side back crystal®

训後,令第丨晶圓保持部2 f保持。P 動,並於其後回到第!保持位置,1且=^弟曰置移 位於第1側方位置時、以及至少在^且?至曰曰固保持部仏 側方位晋h# 〆在第2日日圓保持部21b位於第2 區域(遮蔽的區域)’ 並且將超音波振 ,(第3實施形態) ★兒明至圖28說明本發明第3實施形態。圖18至圖28係 :兄明弟3貝__之中的超音波清洗裝置、超音 圆= 。己錄有用於執彳了此超音波清洗方法之電酿式之記錄媒體。 201123281 柄ΞI8曰至门圖28所示的第3實施形態中,主要差異點在於晶圓 ㈣t rf保持部及第2晶聽持部均能單獨保持·,其他 m 圖14所示的第1實施形態約略相同。另,圖18至 ㈣符第1實峨_的部分’標註相 液.’超*波清洗裝置1包含:清洗槽1G,貯存清洗 卿,謝―〇内,保 被處圖、21所示,晶圓舟120具有第1晶圓保持部(第1 28),s mm 2 aSa®^#^120b:^ i 平行於此第!保^ f=f伸;以及第2保持棒咖、, 磕X 、寺棒121a、121b,並相對於晶圓w的垂直方向鈾 ίί 咖(且高於後述第3保持棒&、=)’;>於第2保持棒122a、 持部= 第 第,保 2晶圓保持部120b㈣w二、口保符棒122b之間。此時,第 的第1保持棒⑵a與第第在第1晶圓保持部⑽a 彼此交錯配置:、保持棒既之間,各第2保持棒122a、 棒‘之ΐ ,的第1保持棒咖與第2保持 1·的第2保持棒“之間第=與第2晶圓保持部 持棒123a平行於第丨保梏 认f,3保持棒123a。此第3保 與第1保持棒121a及第2伴持/ 】,持棒122a而延伸,並 同樣,在第2曰圓夺棒共同保持晶圓W。 第aa®保持部㈣的第1保持棒咖與第2保 32 201123281 =122b之間,具體而言係在第i保 保持棒122a之間’設有第3保持棒 舆棒㈣而延伸, 圖2!所示,第i伴^22 fitL共同保持晶圓w。另,如 123b 〇 保持棒121b同於苐2保持棒㈣及第3保持棒 第Ϊ晶圓保持部12〇a的各保持棒121a ^方向延制基部124b,細轉ib^ =靠近晶圓w側的段差狀。如此 又!圓不相接觸而分別連結到基部124a、 盥第3保持榛^ Ι ί &的基部124&,在第2保持棒122a 部120b的基tp 124\,= 12如。同樣地’第2晶圓保持 2 - 的基部124b接觸到第!曰鬥·防止弟2曰曰圓保持部1勘 如此,第i曰圓持部施的第2保持棒咖。 單獨保持多片(例I 50、/)晶=及第2晶圓保持部1 士圖22(a)所示,第2保持棒i22a、122b及篦3 * 腿設有多數V字形溝槽127,其具有二 、 低於第i保持棒=t12ia、/22b及第3保持棒咖、咖 晶圓W的荷重,防止二二,用V字形溝槽_受 槽12=其 由棒121a、121b設有多數γ字形溝 有自由卡合於晶圓W的Y字形剖面。此γ字形溝 33 201123281 槽128係由下者構成:開口側推拔面128a,傾斜角度相對於被卡 合的晶圓W較大;深側推拔面128b,配置身於此開口側推拔面 128a侧,傾斜角度相對於晶圓w而言較小,溝槽寬度窄;並且剖 面形狀成Y子开>。藉由將此γ字形溝槽128卡合於晶圓w,晶圓 W卡合在溝槽寬度窄的深側推拔面128b,而能確實地卡合晶圓 W。又,因為此Y字形溝槽128高於承受荷重的V字形溝槽127, 故能有效地防止晶圓W倒下。藉此,晶圓舟120能使晶圓冒在 垂直方向豎立並穩定保持。 在此,晶圓舟120各部分採用高抗藥品性的石英來形成,各 自的表面施有鐵氟龍鑛膜或SiC(碳化石夕)錢膜。 如圖21所示,晶圓舟12〇連結有驅動裝置13〇以升降驅動晶 圓舟120 y亦即,驅動裝置13〇具有:升降驅動部131&、13比, 分別升降第1晶圓保持部12〇a及第2晶圓保持部12〇b;以及升降 驅動力傳達部132a、132b,分別連結在各升降驅動部131a、13比 與各基部124a、124b之間,傳達升降驅動部131a、的驅動 力。其中各升降驅動力傳達部132a、132b分別藉由轉接座133a、 =3b而連接到基部124a、124b。如此,第1晶圓保持部12如及 第j晶圓保持部120b彼此可個別地自由移動(自由升降)。另,藉 由,用各升降驅動部131a、咖,亦能調整第!晶圓保持部12〇曰& 及第2晶圓保持部i20b的位置關係。 穴各升降驅動部131a、131b連接有本實施形態之控制裝置44(參 照圖18、圖19)。如此,升降驅動部131a、131b依據來自控制^ 置44的控制信號,令第i晶圓保持部12〇a及第2晶圓保持部12肋 同步下降並將晶圓W插入清洗槽1〇内而浸潰到清洗液,戋令第i 晶圓保持部120a及第2晶圓保持部120b同步上升而將晶 從 清洗槽10搬出。 又,第1晶圓保持部120a藉由驅動裝置130,在清洗槽10内 保持晶圓W的第1保持位置與稍低於此第丨保持位置的第曰丨下降 位置之間,沿約略垂直方向自由移動(自由升降)。同樣,第2晶圓 保持部120b藉由驅動裝置130,在清洗槽1〇内保持晶圓w的第 34 201123281 2保持位置與稍低於此第2保持位 垂直方向自_動。如此,依據來 二7,沿約略 1晶圓保持部咖藉由升降鶴部131^置4 ^制信號,第 下降位置之間移動,第2晶圓 =在^保持位置與第1 而在第2保,置與第2下二置寺‘間移動稭由升降驅動部im 再者,第1晶圓保持部120a在第1下降介罢κ / 持位置側方的側方位置之間沿、^位於第1保 晶圓保持部120a可往圖 向自由移動。亦即,第1 必靠近第2晶圓二的 =向移動’直到第2保持棒 地,第2晶圓保持棒的位置。同樣 側方的第2側方位置之間位於第2保持位置 晶圓保持部㈣可往圖向自由移動。亦即,第2 彼此ΐ個及第2晶圓保持部120b,在約略水平方向亦 連結到晶圓舟120的驅動梦署ηΛ . _ 及第2晶圓保持部⑽在各第晶圓保持部驗 部120a在第i下降位動驅動部咖,令第i晶圓保持 力傳達部1祝,連έ士在令側方貝^方位置之間移動;以及側方驅動 部132a之間^遠。^亥^移動驅動部13知與升降驅動力傳達 動裝置13〇且有部i34a的驅動力。同樣地,驅 傳達部135b,連社右$如士位置之間分別移動;以及側方驅動力 ,間,_^====升_力傳達部 0 > ^,ι 制破置44,在將第1晶圓保持部120a及第2晶圓保持部 35 201123281 所保持的晶圓w浸潰到清 130,令第i晶圓保持部施從保‘曰内。f夜後,鶴裝置 ,第1下降位置而移動到第1側方位曰i卿f由位置,經 而回到第1保持位置。另,回到第 ;;幻下降位置 120a與第2晶圓保持部12〇b共持、日、1晶圓保持部 44控制驅動裝置13〇 /曰、W。其後’控制褒置 經過第2下降位置回到第2保持位置。 1 *置,其後 控制裝置44控制超音波振盪裝置42, ♦黛 在第工下降位置與第】側方位置之1動#= ^ 子仰產生超音波振動。如此間,令振動 播到晶圓w之中受到第】曰圓保^自 =動子;"〇的超音波振動傳 保祕域(遮Γ固保持部120a及第2晶圓保持部咖 本只施形悲中,控制裝置44含有電腦,並藉由此電 在記錄媒體45的程式,實施利用絲處理裝置i的晶 其次採用圖23至圖28說明說明此種構成的本實 用’亦即本實施賴之基板處理方法。 之作 與第1實施形態同樣將清洗液貯存在清洗槽1〇(第 將,Ί20的第1晶圓保持部12〇a及第2晶圓保持部 保持的晶圓w浸潰到清洗槽10内的清洗液(第1〇2步驟)。此 百先將藉由未圖示的搬送機構而搬送的多片晶圓w,例^ % / 保持在配置為約略相同高度配置的晶圓舟12〇之第】晶 _ 120a及第2晶圓保持部i2〇b。此時,晶圓w卡合於第2保持^ 122a、122b ’且卡合於形成在第3保持棒123a、123b的v ^形 槽127’並卡合於形成在第!保持棒121a、121b的γ字形溝槽 其次,升降驅動部131a、131b接受來自控制裝置44的控& 而同步驅動,令第1晶圓保持部12〇a及第2晶圓保持部12〇〔_^ 降,插入清洗槽10内(參照圖23)。如此,將晶圓w浸潰到清洗 36 201123281 液(參照圖24)。此時,第〗曰圓位 分別保持位===持部]鳥 而移動和側 ’從’保ίί: t;下:圓中;1晶圓保持部 保持晶圓W的狀態下上#弟2日日®保持部120b在 Γ位在第,下降;:置上 移動晶圓;置與第*側方位置之間 人’側方移動驅動部134a接受來 號而驅動,使第1晶圓保持部mag41的控制信 保持位置側方的第!側方位置之在^ 置^及位於第1 第1晶圓保持部ma從第i下降驟)。亦即, 當第i晶_部 號)輸送到清洗=0 裝^42將高頻驅動電力(驅動信 動,將晶,振動子40產生超音波振 ίί匕二ίίΐηΐΐ短時間内有效率地進行超音波清洗。 置之間ΐ if20a在第1下降位置與第1側方位 圓W之中&第音波振動傳播到晶 37 201123281 其次,如圖28所示.,笛1 s m 从 上升回到保持晶圓W _丨保二i 降位置 在保持晶圓W的狀態下,下降回 弟2 B曰®保持部120b 此時,第1晶圓伴持邦】川β黎。第2保持位置(第106步驟)。 部120b保持。 由弟1曰曰51保持部1施及第2晶圓保持 120 1 經過第2下降位A動呆持晶圓W的第2保持位置, 回到第2 移動到第2側方位置,其後經過第2下降位置 並且從保持晶圓W的位置下降, 驟)。此時,第2晶圓保持^2^=第\的_;=^上1(第搬步 圓W的第2保持位置。# ^弟2下降位置,低於保持晶 置之間ί續在第2下_與第2側方位 下降位置與第2側方位另的ϋ晶圓保持部120b在第2 多次。 成位置之間在復的次數不限於1次,亦可定為 連續移Ϊ期^位置與第2側方位置之間 步驟)。 :( 7振動子40產生超音波振動(第1〇9 置之=續ii 2=tn2〇b在第2下降位置與第2側方位 圓W之中間’月b將來自振動子40的超音波振動傳制晶 1 A中又至1弟2晶圓保持部12〇b遮蔽的區域。 上升並T從第2下降位置 曰laj w的弟2保持位置,並且第丨晶圓保持部12〇& 38 201123281 =持3 Γη的狀態下’下降回到第1保持位置(第⑽步驟)。 同古%上Γ 持部120a及第2晶圓保持部120b成為約略相 部:保曰持。’晶圓w由第1晶圓保持部120a及第2晶圓保持 此時其洗槽10内的晶圓w之清洗處理(第111步驟)。 綠泵69,停止往清洗槽1G的驗供給。其次, W8並且令切細63動作,從純水供給源 槐八楚1 '月洗槽10。其後,與第103步驟至第110步驟同 音波振動傳日_==絲2晶卩通雜,並將超 驟)到清洗液的晶圓W從清洗槽1G搬出(第12步 _ 131a、131b接受來自控職置44的控ί n5S= 動,保持晶圓W的第1晶圓保持部12〇a及第2工曰 ί L上升,從清洗槽10將晶圓w搬出。其後,將晶^曰 攸日日圓舟120移交給未圖示的搬送機構。 、、曰曰 清洗猎由重複上述步驟’能在清洗槽1G中將_ W依序超音波 i依據如此本實施形態,保持並將晶圓W浸潰到& 2 i2〇b^, ^ ! bWL· ,保持工i2〇b能分別單獨保持晶圓w。藉此,U S 第2晶圓保持部12〇b所保持的晶圓w浸潰到ί納ο ί持月1=圓w僅保持在第2晶圓簡部120心時 ,持部12〇a同時令第2晶圓保持讀移動。;ΐ上;: ,12%在第!下降位置與第u則方位置之間移動=、曰:圓, 晶圓保持部120b在第2下降位置盥第2側方位門1第 令設於清洗槽1〇之底板14 ,,After the training, the third wafer holding portion 2f is held. P moves, and then returns to the first! When the position is maintained, 1 and =^ are placed at the first lateral position, and at least at the position of the tamping holding portion 晋h# 〆 at the second day, the yen holding portion 21b is located at the second position The area (shaded area)' and the ultrasonic vibration are vibrated (third embodiment). The third embodiment of the present invention will be described with reference to FIG. Fig. 18 to Fig. 28 are: Ultrasonic cleaning devices and supersonic circles = in the brothers and sisters. An electro-acoustic recording medium for performing this ultrasonic cleaning method has been recorded. In the third embodiment shown in FIG. 28, the main difference is that the wafer (four) t rf holding portion and the second crystal listening portion can be separately held, and the other first embodiment shown in FIG. The shape is about the same. In addition, the parts of Fig. 18 to (4) are the first one to mark the phase liquid. The ultra-wave cleaning device 1 includes: the cleaning tank 1G, the storage cleaning, the Xie-Yi, the protection map, 21, The wafer boat 120 has a first wafer holding portion (No. 1 28), and s mm 2 aSa®^#^120b: ^ i is parallel to this! ^ = = ; 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及';> between the second holding bar 122a, the holding portion = the first, the second wafer holding portion 120b (four) w2, and the mouthguard bar 122b. At this time, the first holding bar (2)a and the first first wafer holding portion (10)a are alternately arranged with each other: the first holding bar between the holding bars and each of the second holding bars 122a and the rods The second and second wafer holding portion holding rods 123a are parallel to the second holding member 123, and the third holding rods 123a are provided between the second holding rods of the second holding member 1. The third holding member and the first holding rod 121a are provided. And the second mate/] is extended by the rod 122a, and similarly, the wafer W is held together in the second round. The first holding stick of the aa® holding part (four) and the second holding 32 201123281 = 122b Specifically, between the i-th retaining rod 122a, a third holding rod crowbar (four) is provided to extend, and as shown in FIG. 2!, the i-th accompanying 2222 fitL holds the wafer w together. The 123b 〇 holding rod 121b is the same as the 苐2 holding rod (4) and the holding rod 121a of the third holding rod second wafer holding portion 12A, and the base portion 124b is extended, and the fine rotation ib^ = the step difference near the wafer w side In this way, the bases 124 & which are respectively connected to the base portion 124a and the third holding member 不 ί & are not in contact with each other, and the base tp 124\, = 12 in the second holding rod 122a portion 120b is the same. Ground (2) The bottom portion 124b of the wafer holding 2 - is in contact with the 曰 曰 · 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 防止 第 第 第 第 第 第 第 第 第 第 第 第/ /) crystal = and the second wafer holding portion 1 shown in Figure 22 (a), the second holding rods i22a, 122b and 篦 3 * legs are provided with a plurality of V-shaped grooves 127, which have two, lower than the i keep the bar = t12ia, /22b and the third to maintain the load of the bar, coffee wafer W, to prevent the two, use V-shaped groove _ receiving groove 12 = it is provided by the rods 121a, 121b most γ-shaped groove has a free card The Y-shaped cross section of the wafer W. The γ-shaped groove 33 201123281 The groove 128 is composed of the following: the opening side pushing surface 128a, the inclination angle is larger than the wafer W to be engaged; the deep side pushing surface 128b is disposed on the side of the opening side push-out surface 128a, the inclination angle is smaller with respect to the wafer w, the groove width is narrow, and the cross-sectional shape is Y-sub-opening. By the γ-shaped groove 128 When the wafer w is engaged with the wafer w, the wafer W is stuck to the deep side pushing surface 128b having a narrow groove width, and the wafer W can be surely engaged. Moreover, since the Y-shaped groove 128 is higher than the load-bearing V word The groove 127 can effectively prevent the wafer W from falling down. Thereby, the wafer boat 120 can stand up and stably maintain the wafer in the vertical direction. Here, the parts of the wafer boat 120 are highly resistant to chemicals. The quartz is formed, and the respective surfaces are coated with a Teflon film or a SiC (carbonized stone) money film. As shown in Fig. 21, the wafer boat 12 is coupled with a driving device 13 to lift and drive the wafer boat 120 y. In other words, the driving device 13A has: the elevation driving units 131 & 13 ratio, respectively raising and lowering the first wafer holding unit 12a and the second wafer holding unit 12b; and the lifting and lower driving force transmitting units 132a and 132b. The driving force of the elevation driving unit 131a is transmitted between each of the elevation driving units 131a and 13 and the base units 124a and 124b. Each of the elevation driving force transmitting portions 132a and 132b is connected to the base portions 124a and 124b by the adapters 133a and =3b, respectively. In this manner, the first wafer holding portion 12 and the j-th wafer holding portion 120b are freely movable (freely movable). In addition, by using each of the elevation drive units 131a and coffee, it is also possible to adjust the number! The positional relationship between the wafer holding portion 12A & and the second wafer holding portion i20b. The control device 44 of the present embodiment is connected to each of the elevation driving units 131a and 131b (see Figs. 18 and 19). In this manner, the elevation drive units 131a and 131b synchronously lower the ribs of the i-th wafer holding unit 12a and the second wafer holding unit 12 according to the control signal from the control unit 44, and insert the wafer W into the cleaning tank 1〇. When the cleaning liquid is immersed, the i-th wafer holding portion 120a and the second wafer holding portion 120b are simultaneously raised to carry out the crystals from the cleaning tank 10. Further, the first wafer holding unit 120a holds between the first holding position of the wafer W and the third lowering position slightly lower than the second holding position in the cleaning tank 10 by the driving device 130, and is approximately vertical The direction moves freely (freely lifting). Similarly, the second wafer holding portion 120b holds the 34th 201123281 2 holding position of the wafer w in the cleaning tank 1A by the driving device 130, and moves in a direction slightly lower than the second holding position. In this way, according to the second 7th, along the approximately 1 wafer holding unit, the signal is moved by the lifting crane 131^, and the lowering position is moved. The second wafer = the holding position and the first one. 2, the movement between the second lower and the second two temples is moved by the elevation drive unit im, and the first wafer holding unit 120a is between the first position of the first lower side and the side of the holding position. The first wafer holding portion 120a is freely movable in the drawing direction. That is, the first wafer must be moved closer to the second wafer 2 to the second holding rod, and the second wafer holds the rod. Similarly, the second side position of the side is located at the second holding position. The wafer holding unit (4) is free to move in the direction of the drawing. In other words, the second wafer holding portion 120b is connected to the wafer boat 120 in the approximate horizontal direction, and the second wafer holding portion (10) is held in each wafer holding portion. The inspection unit 120a moves the driving unit in the i-th lower position, so that the i-th wafer holding force transmitting unit 1 wishes to move the gentleman between the side positions and the side driving unit 132a. . The mobile drive unit 13 is known to have a driving force of the portion i34a with the lifting/lowering driving force transmitting device 13. Similarly, the drive transmission unit 135b moves between the right and the right positions of the company; and the side drive force, and _^====liter_force transmission unit 0 > ^, ι breaks 44, The wafer w held by the first wafer holding portion 120a and the second wafer holding portion 35 201123281 is immersed in the clear 130, and the i-th wafer holding portion is applied to the inside of the wafer. After the night, the crane device moves to the first side position by the first descending position, and returns to the first holding position. In addition, the phantom descending position 120a and the second wafer holding portion 12b are held together, and the wafer holding unit 44 controls the driving devices 13〇/曰 and W. Thereafter, the control device returns to the second holding position after the second descending position. 1 *, after which the control device 44 controls the ultrasonic oscillating device 42, 黛 超 超 黛 第 第 第 第 第 第 第 = = = = = = = = = = = = = = = = = = = 。 。 。 。 。 In this way, the vibration is broadcasted onto the wafer w, and the ultrasonic vibration transmission secret domain (the concealing solid holding portion 120a and the second wafer holding portion coffee) is received. In the present invention, the control device 44 includes a computer, and the crystals of the wire processing device i are implemented by the program of the recording medium 45, and the present invention is described with reference to FIGS. 23 to 28. In the same manner as in the first embodiment, the cleaning liquid is stored in the cleaning tank 1 (the first wafer holding portion 12a and the second wafer holding portion of the crucible 20 are held). The wafer w is immersed in the cleaning liquid in the cleaning tank 10 (step 1 〇 2). This is a plurality of wafers w that are transported by a transport mechanism (not shown). The wafer 〇120a and the second wafer holding portion i2〇b of the wafer boat 12 are arranged at the same height. At this time, the wafer w is engaged with the second holders 122a and 122b' and is engaged with The v-shaped grooves 127' of the third holding bars 123a, 123b are engaged with the γ-shaped grooves formed in the first holding bars 121a, 121b, and the lifting drive portion 1 31a and 131b are controlled by the control device 44 and are synchronously driven to cause the first wafer holding unit 12A and the second wafer holding unit 12 to be lowered into the cleaning tank 10 (see Fig. 23). In this way, the wafer w is dipped into the cleaning 36 201123281 liquid (refer to Fig. 24). At this time, the first round position is kept at the position === holding part] the bird moves and the side 'from' secures: t; Lower: round; 1 wafer holding portion holds the wafer W in the state of the second day, the second holding unit 120b is in the first position, and is lowered; the moving wafer is placed; and the * side position is placed The person's side movement drive unit 134a is driven by the number, and the control position of the first wafer holding unit mag41 is held at the side of the first side of the control position and held at the first first wafer. The part ma is lowered from the i-th), that is, when the i-th crystal_section is transported to the cleaning = 0, the high frequency drive power is driven (the drive is activated, the crystal is vibrated, and the vibrator 40 produces the ultrasonic vibration). Ultrasonic cleaning is performed efficiently in a short time. Between if20a is in the first falling position and the first side azimuth circle W & the first acoustic vibration propagates to the crystal 37 201123281 Next, as shown in Fig. 28, the flute 1 sm rises from the rising back to the holding wafer W _ 丨 二 i i i 在 在 在 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持1 wafer is attached to the state] Chuan β Li. The second holding position (step 106). The portion 120b is held. The second holder 51 holds the second wafer holding 120 1 through the second falling position A. The second holding position of the wafer W is held, and the second moving position is returned to the second side position, and then passes through the second lowering position and is lowered from the position at which the wafer W is held. At this time, the second wafer holds ^2^=the first _;=^1 (the second holding position of the second moving step W. #^弟2lowing position, lower than the holding crystal. The second lower _ and the second side azimuth lowering position and the second side abutting ϋ wafer holding unit 120b are plural times. The number of times between the positions is not limited to one time, and may be determined as continuous movement. The step between the period ^ position and the second side position). : ( 7 vibrator 40 produces ultrasonic vibration (the first 置 9 = continuation ii 2 = tn2 〇 b in the middle of the second falling position and the second side azimuth circle W) month b will be the ultrasonic wave from the vibrator 40 In the vibration transmission crystal 1 A, the area which is blocked by the wafer holding portion 12 〇 b is raised to the position of the second holding position 曰laj w, and the second wafer holding portion 12 〇 & 38 201123281 = 'falling back to the first holding position in the state of 3 Γ η (step (10)). The same period of the uppermost portion 120a and the second wafer holding portion 120b are approximately phased: The wafer w is held by the first wafer holding unit 120a and the second wafer at the time of cleaning the wafer w in the washing tank 10 (step 111). The green pump 69 stops the supply of the cleaning tank 1G. Next, W8 and the shredder 63 are operated, and the pure water supply source is 槐 楚 1 1 ' ' ' ' ' ' 1 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 And the wafer W that has passed through the cleaning liquid is carried out from the cleaning tank 1G (the 12th step _131a, 131b receives the control from the control unit 44), and the first wafer holding portion of the wafer W is held. 12〇a and 2nd work曰ί L rises and the wafer w is carried out from the cleaning tank 10. Thereafter, the wafer boat 120 is handed over to a transport mechanism (not shown), and the cleaning step is repeated by repeating the above steps. In the slot 1G, the _W sequential ultrasonic wave i is maintained according to this embodiment, and the wafer W is held and immersed into & 2 i2〇b^, ^ ! bWL·, and the worker i2〇b can separately hold the wafer w. Thereby, the wafer w held by the US second wafer holding portion 12Ab is immersed in the 纳 ο 持 持 1 1 =============================== 〇a simultaneously keeps the read and move of the second wafer; ΐ上;:, 12% moves between the ...th drop position and the uth position =, 曰: circle, and the wafer holding portion 120b is at the second drop position盥The second side azimuth door 1 is arranged at the bottom plate 14 of the cleaning tank 1〇,

自振動子4G的超音波振動傳播到晶圓wit?到ί 5 2 ,aK W 39 201123281 物轉翻晶圓W全區,其結果,能藉由超音波將 日日0 w全區進行均勻地清洗處理。 翻(曰波將 另上述員施形恶可在本發明的主旨範圚内進杆久插w jjy 以下描述代表性變形例。 J曰视圍内進订各種變形。 伴牲本實施形態中細說明第1晶圓保持部1施及第2曰圓 =持部mb分別具有第3保持棒123子 =^因 120a^^ 2 ’而能僅藉由第1保持棒121a、121b及第2保 122^亦/你、单獨保持晶圓W。此時’因為第2保持棒122a、、 亦相對於通過晶圓W中心的垂直方θ金綠y ^ 保持部120b能分別單獨保持晶圓w。 弟2 b曰Η 明第1晶圓鱗部施㈣3保持棒 仅姓加f在第1日日固保持部12〇a的第1保持棒Ula與第2日圓 的奉_之間’並且第2晶圓保持部G〇b 與第i 'a κ;[=在第2晶®鱗部1勘的第1保持棒121b 二虽^曰同 &的第2保持棒122a之間之例。但不限於 配置在笫::ϋ可將第1晶圓保持部i2〇a的第3保持棒— 部=的第Ba==b0a=2保持棒㈣與第2晶圓保持 第3储持棒之間,並且將第2晶圓保持部職的 持棒^本f2t形明f第2保持棒啦、⑽及第3保 二允123b故有V字形溝槽127,並且 121b設第有之例。但靴於此,第1保持棒心 溝槽的及第3保一 保持i = 實^態,中係描述當第1晶圓保持部施及第2晶圓 裝置44令錄之間她錄朗,控制 產生超θ波振動之例。但不限於此,亦可僅 201123281 ^第上晶,保持部12Ga及第2晶圓保 各側方位置移動期間令振動子4〇產 仗:置彺 振動子40的超音波振動傳播到 曰H自 1池及第2晶圓保持部職遮蔽⑷日日®保持部 及第描述晶圓舟120的第1晶圓保持部隱 ^ } 1 i2〇a^^ tilt 侧方位置彺各下降位置移動。此時 各 中受和晶_=:= 晶圓保持部㈣停: 3Ϊϊί侧方位置,而在第1晶圓保持部1施位於此IS 方位置時令振動子4G產生超音波鶴,並且 貝 120b從第2下降位置移動到第2側方位 曰曰曰®保持# :^立於此第2側方位置時令振動子4〇產 曰=:: 自振動子40的超音波振動傳播到晶圓w之中受到 了a及第2晶圓保持部12%遮蔽的區域, 波振動均勻地傳播到晶圓w全區。 儿將超曰 又,本實施形態中係說明晶圓舟12G之中 ” =保持晶圓W的第!保持位置經過第i下降位置=== 位i i置,亚且第/晶圓保持部腿從保持晶圓W的第^保持 例。ί Hi持部120a移動期間維持在此位置之 仁不限於此,苐丨邮保持部ma及第2晶圓 41 201123281 的移動不限於此。 具體及第2晶圓保持部1高 ,.. 心墙10内的清洗液Φ之尨,τ X μ ~ 所保持的純W及第保持部12 晶圓保持部UOb上升,並將曰 的凊洗液中之後,不令第2 的第1保持位置下降到下 曰曰圓保持部1施從保持晶圓从 以移動到側方移動時能避’θ、ρ ’只要令第1曰曰曰圓保持部12〇2 =下降到第i下降位置,;、圓 持部及第2晶圓保 保持部120b不經過各下降^第1曰曰,保持部職及第2晶圓 間移動。此時,能使第f各側方位置之 的驅動控制簡約化。 ,、、 a及第2 bb圓保持部120b 保持ί 1施及第2晶圓 不限於此,葬ώ八曰®資王區均勻地清洗處理之例。但 a 9 ^ 邊的晶圓保持部移動,能確實地將受到 H二保持部遮蔽的晶圓W區域進行清洗處理: 置44。葬由奸狀超音波清洗裝置1具有包含電腦的控制裳 並且’記錄有用於實施利用超音波清Ultrasonic vibration from the vibrator 4G propagates to the wafer wit? to ί 5 2 , aK W 39 201123281 The material turns over the wafer W, and as a result, the entire area can be uniformly distributed by ultrasonic waves. Cleaning treatment. Turning over (the chopping wave will cast another evil person into the above-mentioned member can enter the rod in the main scope of the invention for a long time to insert w jjy. The representative modification is described below. J 曰 围 进 进 各种 各种 各种 各种 各种 各种 各种 各种 各种 各种 各种 各种It is to be noted that the first wafer holding unit 1 applies the second round circle = the holding portion mb has the third holding rod 123 = ^ 120a ^ ^ 2 ', and can be used only by the first holding rods 121a, 121b and the second 122^ Also, you and the wafer W are held separately. At this time, the wafer W can be separately held by the second holding rod 122a and the vertical square θ gold green y ^ holding portion 120b passing through the center of the wafer W. The 2nd 曰Η 第 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 2 wafer holding portion G〇b and ith 'a κ; [= between the first holding rod 121b of the second crystal scalar 1 and the second holding rod 122a of the same & However, it is not limited to being arranged in the 笫::, the third holding bar of the first wafer holding portion i2〇a = the Ba==b0a=2 holding bar (four) and the second wafer holding the third holding bar Between the 2nd wafer holding part, the holding stick, this f2t The second retaining bar, the (10) and the third retaining 123b have a V-shaped groove 127, and the 121b is provided with a first example. However, the first retaining of the core groove and the third guarantee While maintaining the i = true state, the middle description describes an example in which the first wafer holding portion applies the second wafer device 44 to record the recording, and the control generates the super-theta wave vibration. However, the present invention is not limited thereto. Only in 201123281 ^The first crystal, the holding portion 12Ga and the second wafer are moved during the movement of each side position, and the vibrator 4 is produced: the ultrasonic vibration of the vibrator 40 is transmitted to the 曰H from the first cell and the second crystal. (4) The daily holding portion and the first wafer holding portion of the description wafer boat 120 are hidden. } 1 i2〇a^^ tilt The lateral position is moved at each lowering position. Crystal _=:= Wafer holding portion (4) stop: 3Ϊϊί side position, and when the first wafer holding unit 1 is placed at the IS side position, the vibrator 4G generates a supersonic crane, and the shell 120b is moved from the second lower position. Move to the 2nd side 曰曰曰 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 保持 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 曰 曰 曰In the region where the a and the second wafer holding portion are shielded by 12%, the wave vibration is uniformly propagated to the entire area of the wafer w. Further, in the present embodiment, the wafer boat 12G is described as "holding the wafer" The first holding position of W is set by the ith lowering position === bit ii, and the second and/the wafer holding portion leg is held from the holding example of the holding wafer W. ί is maintained at this position during the movement of the holding portion 120a It is not limited to this, and the movement of the postal maintenance unit ma and the second wafer 41 201123281 is not limited to this. Specifically, the second wafer holding portion 1 is high, and the cleaning liquid Φ in the core wall 10, the pure W held by τ X μ ~ and the wafer holding portion UOb of the holding portion 12 rise, and the 凊 凊After the washing liquid, the second holding position of the second holding portion is not lowered until the lower round holding portion 1 is applied to hold the wafer from moving to the side to avoid 'θ, ρ ' as long as the first 曰曰曰The circular holding portion 12〇2 = descends to the ith lowering position; and the holding portion and the second wafer holding portion 120b move between the holding portion and the second wafer without passing through each of the lower portions. At this time, the drive control of each of the f-side positions can be simplified. The , , a and the 2nd bb circle holding unit 120b hold the ί 1 and apply the second wafer. The present invention is not limited to this, and the case of the ώ ώ 资 资 资 均匀 均匀 。 。 。 。 。 。 。 。 。 。. However, the wafer holding portion on the side of a 9 ^ moves, and the wafer W region shielded by the H-two holding portion can be surely cleaned: 44. The burial by the adult-like ultrasonic cleaning device 1 has a control skirt containing a computer and is recorded for use in the implementation of ultrasonic cleaning

之_某體Γ5亦為電腦所執行的程式 ._ ΑΛ/Γ ^ 的對象。在此,記錄媒體45可為ROM = 雜憶體’又亦可為硬碟或cd_r〇m等碟片式的記錄媒 體45 0 、、另、’以JlS糊巾細示將本發明之超音波清洗裝置卜超音波 π洗方法、及錢有用來執行此超音波清洗方法之電腦程式之記 錄媒體45,應用於半導體晶圓w的清洗處理之例。但不限於此, 亦可將本發明細於LCD基板或CD基板等各種基板的清洗。 42 201123281 【圖式簡單說明】 圖1係顯示本發明第丨實施形態中的超音波清洗裝置。 圖2係圖1的側剖面圖。 圖3係圖1的俯視圖。 圖4係顯示本發明第1實施形態中的排出閥機構。 圖5係顯示本發明第丨實施形態中的被處理體保持裝置之構 成。 圖6係顯示本發明第丨實施形態中的超音波清洗方法將晶圓 插入到清洗槽内的狀態。The _ Γ Γ 5 is also the object of the program ._ ΑΛ / Γ ^ executed by the computer. Here, the recording medium 45 may be a ROM = memory or a disc-type recording medium 45 0 such as a hard disk or a cd_r〇m, and the other embodiment of the present invention will be described in detail with a JlS paste towel. The cleaning device Bu ultrasonic π washing method, and the recording medium 45 having a computer program for executing the ultrasonic cleaning method are applied to the cleaning processing of the semiconductor wafer w. However, the present invention is not limited thereto, and the present invention may be finer than the cleaning of various substrates such as an LCD substrate or a CD substrate. 42 201123281 [Brief Description of the Drawings] Fig. 1 shows an ultrasonic cleaning apparatus according to a third embodiment of the present invention. Figure 2 is a side cross-sectional view of Figure 1. Figure 3 is a plan view of Figure 1. Fig. 4 is a view showing a discharge valve mechanism in the first embodiment of the present invention. Fig. 5 is a view showing the configuration of a workpiece holding device in a third embodiment of the present invention. Fig. 6 is a view showing a state in which the ultrasonic cleaning method according to the embodiment of the present invention inserts a wafer into a cleaning tank.

圖7係顯示本發明第丨實施形態中的超音波 浸潰到清洗勒之清缝巾離態。 U 圖8係顯示本發明第i實施形態中的超音波清洗方法將晶圓 從晶圓舟移交給洗滌臂的狀態。 圖9係顯示本發明第1實施形態中的超音波清洗方法將晶 舟移動到下降位置的狀態。 圖10係顯示本發明第1實施形態中的超音波清洗方法將晶圓 舟移動到側方位置的狀態。 圖11係顯示本發明第1實施形態中的超音波清洗方法將晶圓 舟移動到下降位置的狀態。 w圖12係顯示本發明第1實施形態中的超音波清洗方法將 從洗滌臂移交給晶圓舟的狀態。 圖13係顯示本發明第1實施形態中的超音波清洗方法令渎 臂移動到退·置陳態。 〜先滌 圖14係顯示本發明第1實施形態中的超音波清洗方法從、、主 槽内取出晶圓的狀態。 心月洗 圖15係顯示本發明第2實施形態中的超音波清洗方法令楚 晶圓保持部移動到第2下降位置。 乐2 圖16係顯示本發明第2實施形態中的超音波清洗方法八 晶圓保持部移動到» 2側方位置的狀態。 1 2 圖丨7係顯示本發明第2實施形態中的超音波清洗方法令第^ 43 201123281 晶圓保持部移動到第2下降位置的狀態。 圖18係顯示本發明第3實施形態中的超音波清洗裝置。 圖19係圖18的側剖面圖。 圖20係顯示本發明第3實施形態中的排出閥機構。 圖21係顯示本發明第3實施形態中的晶圓舟之構成。 3伴林發明第3實施形態、中,設於第2保持棒及第 溝^持棒子形溝槽,圖22(b)係顯示設於第1保持棒的Y字形 插入第3實施形態中的超音波清洗方法將晶圓 浸形態中的超音波清洗方法將晶圓 晶圓超音波清洗方法令第1 晶圓i持^發?f 3實施形態中的超音波清洗方法令第1 圖27 動# 1側方位置的狀態。 晶圓保持部發明第3實施縣中的超音波清洗方法令第1 圖28 S頁下严位置陳態。 受到第1 a不本务明第3實施形態中的超音波清洗方法令晶 日日回保持部及第2晶圓保持部所保持的狀態。 1【主符號說明】 11. 12. 13. 14. Q’,攻清洗襄置 10*.·清洗槽 .側壁 •襯墊 .固定螺栓 .底极(底部) 15...凹槽 16··.容器 44 201123281 20.. ·晶圓舟(被處理體保持裝置) 20a、20b...晶圓保持部 21a、21b…晶圓保持部(被處理體保持部) 22a、22b、124a、124b...基部 23a、23b...保持棒 24a、24b、53、125a、125b...連結構件 25a、25b...保持溝 26、130...驅動裝置 27a、27b、131a、131b...升降驅動部 28a、28b、132a、132b...升降驅動力傳達部 29a、29b、133a、133b···轉接座 30a、30b、134a、134b…側方移動驅動部 31a、31b...侧方驅動力傳達部 40.. .振動子 41.. .振動單體 42.. .超音波振盪裝置 43.. .驅動電源部 44.. .控制裝置 45.. .記錄媒體 50.. .洗滌臂 51.. .夾持部 52.. .抵接棒 60.. .清洗液供給裝置 61.. .清洗液供給喷嘴 61a...管狀喷嘴本體 61b...第1喷嘴孔 61c...第2喷嘴孔 62.. .清洗液供給管 63.. .切換閥 64.. .純水供給管 45 201123281 65.. .純水供給源 66.. .藥液供給管 67…藥液供給源(藥液槽) 68.. .開閉閥 69.. .樂液栗 80.. .排出閥機構 81.. .被抵接部 82.. .閥體 83.. .活塞桿 84.. .汽缸裝置 85.. .排液口 120·..晶圓舟(被處理體保持裝置) 120a...第1晶圓保持部(第1被處理體保持部) 120b...第2晶圓保持部(第2被處理體保持部) 121a、121b...第 1 保持棒 122a、122b...第 2 保持棒 123a、123b...第 3 保持棒 126a、126b...凹部 127.. .V字形溝槽 128.. .Y字形溝槽 128a...開口側推拔面 128b…深側推拔面 W. ..晶圓 X. ..水平方向轴線 Y. ..垂直方向軸線 46Fig. 7 is a view showing the state in which the ultrasonic wave of the second embodiment of the present invention is impregnated into the cleaning towel. U Fig. 8 is a view showing a state in which the ultrasonic cleaning method in the i-th embodiment of the present invention transfers the wafer from the wafer boat to the washing arm. Fig. 9 is a view showing a state in which the ultrasonic cleaning method according to the first embodiment of the present invention moves the boat to the lowered position. Fig. 10 is a view showing a state in which the ultrasonic cleaning method according to the first embodiment of the present invention moves the wafer boat to the side position. Fig. 11 is a view showing a state in which the ultrasonic cleaning method according to the first embodiment of the present invention moves the wafer boat to the lowered position. Fig. 12 is a view showing a state in which the ultrasonic cleaning method according to the first embodiment of the present invention is transferred from the washing arm to the wafer boat. Fig. 13 is a view showing the ultrasonic cleaning method according to the first embodiment of the present invention, which causes the arm to move to the retracted state. In the ultrasonic cleaning method according to the first embodiment of the present invention, the state in which the wafer is taken out from the main groove is shown. In the ultrasonic cleaning method according to the second embodiment of the present invention, the wafer holding unit is moved to the second lowering position. [Embodiment 2] Fig. 16 shows a state in which the ultrasonic cleaning method in the ultrasonic cleaning method according to the second embodiment of the present invention is moved to the +2 side position. 1 2 is a state in which the ultrasonic cleaning method according to the second embodiment of the present invention causes the wafer holding unit to move to the second lowering position. Fig. 18 is a view showing an ultrasonic cleaning device according to a third embodiment of the present invention. Figure 19 is a side cross-sectional view of Figure 18. Fig. 20 is a view showing a discharge valve mechanism in a third embodiment of the present invention. Fig. 21 is a view showing the configuration of a wafer boat in a third embodiment of the present invention. In the third embodiment of the invention, the second holding rod and the second groove holding groove are formed, and FIG. 22(b) shows the Y-shaped insertion of the first holding rod in the third embodiment. Ultrasonic cleaning method Ultrasonic cleaning method in wafer immersion method The wafer wafer ultrasonic cleaning method is used to make the first wafer i. The ultrasonic cleaning method in the embodiment is shown in FIG. #1 The status of the side position. In the wafer holding unit, the ultrasonic cleaning method in the third implementation county is instructed to make the first page of FIG. In the first embodiment, the ultrasonic cleaning method in the third embodiment is in a state in which the crystal day return holding portion and the second wafer holding portion are held. 1 [Description of main symbols] 11. 12. 13. 14. Q', tapping cleaning device 10*.·Cleaning tank. Side wall • Liner. Fixing bolt. Bottom pole (bottom) 15... Groove 16·· Container 44 201123281 20.. Wafer boat (subject to be processed) 20a, 20b... Wafer holding portions 21a, 21b... Wafer holding portion (subject to be processed) 22a, 22b, 124a, 124b ...bases 23a, 23b... holding bars 24a, 24b, 53, 125a, 125b... connecting members 25a, 25b... holding grooves 26, 130... drive means 27a, 27b, 131a, 131b. .. lifting drive unit 28a, 28b, 132a, 132b... lifting drive force transmitting unit 29a, 29b, 133a, 133b... adapters 30a, 30b, 134a, 134b... side moving drive parts 31a, 31b. .. side drive force transmitting unit 40.. vibrator 41.. vibrating unit 42.. ultrasonic wave oscillating device 43.. drive power unit 44.. control device 45.. recording medium 50. . Washing arm 51.. Clamping portion 52.. Abutting bar 60.. Cleaning liquid supply device 61.. Cleaning liquid supply nozzle 61a... Tubular nozzle body 61b... First nozzle hole 61c ...the second nozzle hole 62.. cleaning liquid supply pipe 63.. switching valve 64.. pure water Feeding pipe 45 201123281 65.. . pure water supply source 66.. chemical liquid supply pipe 67... chemical liquid supply source (medicine liquid tank) 68.. . opening and closing valve 69.. . Le liquid chestnut 80.. . Mechanism 81.. Abutted part 82.. Valve body 83.. Piston rod 84.. Cylinder unit 85.. Discharge port 120·.. Wafer boat (subject to be processed) 120a. .. first wafer holding portion (first processed object holding portion) 120b... second wafer holding portion (second processed object holding portion) 121a, 121b... first holding bars 122a, 122b. .. 2nd holding bars 123a, 123b... 3rd holding bars 126a, 126b... recesses 127.. V-shaped grooves 128.. Y-shaped grooves 128a... Opening side push-out faces 128b... Deep side push surface W. .. wafer X. .. horizontal direction axis Y. .. vertical direction axis 46

Claims (1)

201123281 七、申請專利範圍: l一種超音波清洗裝置,包含: 清洗槽,用以貯存清洗液; ,處理體保持裝置,設為可插人 並將其浸潰到清洗液; 〜門侏符破處理體 振動子,設於該清洗槽的底部; ,曰波振錄置,令雜動子產生超音波振動; 側f保持構件,設於該清洗槽内,用以保持該被處理體· 驅動裝置,令該被處理體保持裝置往側方版’ 控制裝置控繼超音波㈣裝置及馳動裝t 後侧部保持構件 振動子的超音波振動傳制該被處理體。 术自"玄 2. 如^請專利範圍第1項之超音波清洗裝置,其中, 體,該側聽持構件㈣被處理觀縣置接受祕持該被處理 持位令職處理魏縣置,鄕_被處理體的保 符位置私動到位於該保持位置側方的側方位置, 後在謂保繼移交給 ==ΐ從該保持位置往該侧方位置移動ϊϊ少= 動,並將來自;方位置時’令贿動子產生超音波振 兮> Ϊ將來自5亥振動子的超音波振動傳播到該被處理體中之受到 忒被處理體保持裝置保持的區域。 3. 士:申請專利範圍第2項之超音波清洗裝置,其中, 理體ίίί理體保持裝置具有用來保持該被處理體的一對之被處 該各被處理體保持部可個別地自由移動。 4. 如申請專概圍第3項之超音波清洗裝置,其巾,—對之該被處 47 201123281 被處··略__方式移動。 制該超音波振^裝置置,其中’該控制裝置控 位置往该側方位置移動,並在八 老牛 〃、後從该下降 置,側方位置移動_亦^二該下降位 制該超音她聽置及,編動w〜^置,射,該控制裝置控 該下降位置以 件具有置’其中,該側部保持構 體。謂卩抵接賊贼频❹城並續該被處理 圍第1項之超音波清洗展置,i中, 體,。/。呆持構件從該被處理體保持裝置接受並保持該被處理 δ亥驅動裝置令該被處理步 位置f動到位於該保持位置側方的被處理體的保持 理體保持ί里版保持裝置具有用以保持該被處理體的-對之被處 被處該驅練置,俾於將該 被處理II保持裝置中至少一=該側部保持構件後,令該 往該側方位置移動,並至理體保持部從該保持位置 方位置時,令該振動子產里體保持部位於該側 音波振動傳播到該被處°二到’ f將來自該振動子的超 保持的區域。 Μ之又到该-邊的被處理體保持部所 48 201123281 音波清洗裝置,其中, 保持部與第可個观自由移動之P被處理體 〇亥驅動裝置令該被處理<1#样姓胜罢# 部保練置,俾於將該被處理體保持在該側 第2保持位置往 保持構件及該第2被處理體^部^將;持在該側部 至少位於褒置’俾當該第1被處理體保持部 於該第2側方位置時,體保持部至少位 清洗槽,用以貯存清洗液; 並將置’設為可插人職勒,保持被處理體 振動子,設於該清洗槽底部; 盪ΐ置丄用以令該振動子產生超音波振動; ;4ίί ’ Ξ以ί該被處理體保持裝置往側方移動;以及 、,似置,肋控舰超n振聽置及鞠動裝置; 娜f雌被處理體保縣置具有可個獅自由移動之第1被产 理體保持部與第2被處理體保持部, ¥ 1被處 該第1被處理體保持部及該第2被處理體保持部分別具有: 49 201123281 第1保持棒;以及第2保持棒,ψ 處理體中心的垂直方向軸線而設目對於通過該被 並且該第1被處理體保持部的奉相反側; 被處理體保持部的該第1保持棒盘^棒,係配置在該第2 保持棒之間, 玄第2破處理體保持部的該第2 地保^^^雜持部及該第2被處理體保持部各自能單獨 該控制裝置控制該驅動庐署,a# ; + 被處理體鱗部及該第2理保縣置的該第1 ,制該超音波振盈裝置,令該振動子產移動,並且 =振動子的超音波振動傳播到該被處ΐ體日波振動,並將來自 2.如申請翻麵第u項之超音波清 控制該驅動裝置,在將受到哕 二,、中,该控制裝置 2 後’令該第1被處理體保持部從伴内的清洗液中之 保持位置,再令該第2被處理體,其後回到該第1 f夺位置,移動到位於該第2保持位置;的第2 被處理體保持部至少位於該第^= 立曰置^盛/:置,俾當該第i f保持部至少位於該第2侧方位置時,J:該2被處理 將來自錄動子的超讀麟,波振 =專利範圍第„項之超音波清洗:持=的區域。 ff第1保持棒與該第2保持棒之間,並^該有/ = 持棒’其設 保持棒共同保持該被處理體。 ^ 保持棒及該第2 項之超音波清洗裝置,其中, 破纽體簡部的料3鋪棒配置杨笛1 體保持。陶亥第1保持棒與該第2被處理體保持 201123281 棒之間, 體mi的;在該第2被處理 棒之間。 弟1被處理體保持部的該第2保持 15·1?ί=Γ13項之超音波清洗裝置 在忒弟1破處理體保持部及詨第 一中 保持棒及該第3保持棒,設有v ^皮^^保持部的該第2 该被處理體的V字形剖面, 槽,其具有可自由卡合於 ㈣ί該第1被處理體保持部及該第2被處理 ;^面财Υ物雜,料村自奸合^^^^的第; 該控制裝置 與該第2側方位置動亥第1保持位置 置與該第2側方位置之= ^ <呆持部在該第2保持位 下方的第2下降位置1移動時’令其㈣位於該第2保持位置 17. 如申請專利範圍第16項之 控制該超音波振盈裝置,俾者曰第/月其中,該控制裝置 持部在該第2下降位置辦“ 1曰’、及當該第2被處ί!體保 振動子產生超音波振動第側方位置之間移動期間,亦令該 18. 種超音波清洗方法,其包含以下步驟: 之被Ϊ 清洗液 處理體保===件加以保持; 體超ϋίίΓ洗槽底部的振動子產生超音波軸而將該被處理 =被處理體保持震置往侧方移動之步驟 驟,係在以該側部保持構件保持該被處理體保持側部忿 51 201123281 士在申以月牛’其中由 持該被處理體的保持位“::於= 動子的超音波振動傳將來自該振 置保持的區域。 γ之又到该被處理體保持裝 圍第19項之超音波清洗方法,其中, 理體保持部, _持裳置具有用以保持該被處理體中的-對之被處 ”體保持部係可個別地自由移動。 22.如在申圍第19項之超音波清洗方法t 保持ί ’該被處理體 其後再從該τ降位置_财位持置下方的下降位置, 在該被處理體保持裝置從該下 間’亦令該振動子產生超音波振動。 "访位置移動之期 23. 如申請專利範圍第22項之超音波清洗方法, 置之g含令該被處理體保持裝置從該側方位置移_該下降位 間,位置移動到該下降位置之期 24. 如申請專利範圍第18項之 保持構件保持該被處理體之步驟曰中,在以該側部 理體退避開的退避位置移動到接受並保持該 52 201123281 置,並保持該被處理體。 25. 如利範圍第24項之超音波清洗方法,直中, 體的二對具有抵接於該被處理體側面而失持該被處理 26. 如申=概圍㈣項之超音波清洗方法, 理體=理體保持裝置具有用以保持該被處理丄:對之被處 在以居側部保持構件保持該被處體 理體=裝置所保持的該被處理體;交=^^中^由該被處 在令該被處理體保持裝置往側方移動之:持,件’ 保持裝置至少-邊㈣被處麵 /被處理體 位置移動到位於該保持位置側方的持5亥破處理體的保持 田"亥被處理體保持裝置的該一邊 該側方位置時,將來自該振動子的夺部至少位於 中之受到該被處理體保持褒置保持$區曰域皮振動傳播到該被處理體 27·=、=利範_ 18項之超音波清洗方法, 鐘i被ί理體保持裝置具有可個別地自由移動之i】、士老 保持D卩與第2被處理體保持部, 第1被處理體 在令該被處理體保持裝置往側方 保持構件及該第!被處理體保持在以該側部 體保持裝置t的該第2被處理體保’該被處理 保持位置移動到位於該第2保持位置年二 的第2 回到該第2保持位置.又,/ 的弟2側方位置,其後 第2被處理體保持二持構件及該 從保持該被處理體的第i保持 二保持部 方的第^侧方位置,其後回到該第亥心保持位置側 當該被處理體保持裝置中的該第U 皮處理體保持部至少位於 53 201123281 ===自ίί以被處理體保持部至少位於該第2 之由該第1被ΐϋ伴超音波振動傳播到該被處理體中 域。弟被歧體簡部及雜2猶观簡觸保持的區 28.—種超音波清洗方法,其 將受到被處理體保持裝置的第i被處理 理體祕持的被處理體浸潰到ί洗槽第2被處 以该第2被處理體保持部保持誃 液, 體保持部往侧方移動;以及、' χ处—,7 5玄第1被處理 體超清洗槽底部的振動子產生超音波振動而將該被處理 罐綠,錢包含以下步 體保持部保二移動之步驟後’以該第1被處理 如f被處體’亚令該第2被處理體佯掊邮梦缸 30.如申請專利範圍第29項之超音波清洗方法,=寺㈣夕動。 在令该第〗被處理體保持部移動之 組保持部從保持該被處理體的第i保持位 二第被處理 保持3侧方的第i側方位置,其後_該第該第1 以第2被處理體保持部移動之步驟中,使Μ 9 體保持部從保持該被處理體的第2 ^^第2被處理 置=方,2/_置,其後回到該第’2保ίΓί該第2 =驟係當該第i被處理體洗 動的超音波振動傳播到該被處理體中之受· 二如體保持部所保持的區域, ^專利lniU 31項之超音波清洗方法,盆中, 保持== 體:部移動之步驟中,經過位於該第〗 並且在令該第2被處理體保持部移動之步驟,經過位於該第2 54 201123281 保持位置下方的第2下降位置。 33·如申請專利範圍第32項之超 之步驟,亦於該第U皮處理體保 >先方 =,其中,超音波清洗 侧方位置之間移動期間、以及;幻下降位置與該第1 降位置與鄕2财位置之間移^ =輯保持部在該第2下 3令一種記铩拔·§#,#拉士 m 助期間進行之。 該超音波清洗方法&‘清狀法之電腦程式, 將受到被處理體保持裝置所彳 液之被處理體,由設於竽持,並浸潰到清洗槽内的清洗 令該被處理鳴件加以称 理體ίίϊί;ί洗槽底部的振動子產生超音波振動,而將該被處 並且’該被處理體保持步 之步驟,係在以該側部保之步驟與超音波清洗 35.—種記錄媒體,^处理體之步驟後進行。 該超,^嫩嶋槪電腦程式, 理體保ί1被處理體保持部及第2被處 將該被處理體液; 理體保持部往側方移動;以12破處理體保持部,令該第1被處 體超ίΐΞ清洗舰㈣振料產生超音波振__被處理 圖式 55201123281 VII. Patent application scope: l An ultrasonic cleaning device, comprising: a cleaning tank for storing the cleaning liquid; and a processing body holding device, which is set to be inserted and dipped into the cleaning liquid; The treatment body vibrator is disposed at the bottom of the cleaning tank; the chopping wave is recorded to cause ultrasonic vibration of the hetero mover; and the side f holding member is disposed in the cleaning tank for holding the object to be processed and driving The apparatus causes the object to be processed to transmit the object to be processed to the ultrasonic wave (four) device and the ultrasonic vibration of the vibrator of the side holding member rear member of the control device. From the "Xiao 2", such as ^ please patent scope of the first item of the ultrasonic cleaning device, in which the body, the side of the listening component (four) was treated to Guanxian County to accept the secret to hold the position to handle the position of Wei County , 鄕 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The ultrasonic vibration from the 5 hai vibrator is transmitted to the region of the object to be processed and held by the sputum object holding device. 3. The ultrasonic cleaning device of claim 2, wherein the physical body holding device has a pair for holding the object to be processed, and the respective object holding portions are individually freely available. mobile. 4. If you apply for the ultrasonic cleaning device of item 3, the towel, which is the place to be moved, will be moved. The ultrasonic vibration device is arranged, wherein the control device moves to the lateral position, and is moved from the lower position to the side position after the eight old calf, and the position is moved by the lower position. She listens to the sound, and the control device controls the lowered position to have a position in which the side retains the structure. It is said that the thief is abutting the thief and the thief is rushing to the city and continues to be treated. The ultrasonic cleaning installation of the first item, i, body,. /. The holding member receives from the object holding device and holds the processed δH drive device to move the processed step position f to the holding body of the object to be processed located at the side of the holding position. The locating portion for holding the object to be processed is placed in the arranging position, and after at least one of the processed portion holding members is moved to the side position, the side position is moved, and When the physical body holding portion is at the position of the holding position, the vibrating child corpus holding portion is located in a region where the side sound wave vibration propagates to the position where the two are from the super-holding of the vibrator. 2011 Μ 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 In the second maintenance position, the object to be processed is held in the second holding position on the side to the holding member and the second object to be processed; and the side portion is at least located in the side When the first target object holding portion is in the second lateral position, the body holding portion is at least in the cleaning tank for storing the cleaning liquid; and the setting is set to be insertable, and the object vibrator is held. It is disposed at the bottom of the cleaning tank; the ΐ ΐ is used to cause the vibrator to generate ultrasonic vibration; ; 4 ίί ' Ξ ί the object to be treated to move the device to the side; and, like, the rib control ship super n The first and the second body to be held, and the first to be treated, the first to be treated Each of the body holding portion and the second target object holding portion has: 49 201123281 1st holding rod And the second holding rod, the vertical axis of the center of the processing body, and the opposite side to the first object to be processed holding portion; the first holding rod of the object holding portion And being disposed between the second holding rods, and the second ground holding body holding portion and the second processed object holding portion of the second hollow processed body holding portion can individually control the driving by the control device庐 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The body vibration of the body is oscillated, and the ultrasonic device is controlled from 2. The ultrasonic wave is applied to the motor device, and the first device is processed after the control device 2 is subjected to the second, middle, and second The holding portion is moved from the holding position in the cleaning liquid in the accompanying body, and then the second object to be processed is returned to the first position, and moved to the second object to be held at the second holding position. Located in the first ^= 立 ^ 盛 : : : : : : : : : : : : : : : : : : : : : When set, J: The 2 is processed to be super-reading from the recorder, wave vibration = ultrasonic cleaning of the patent range „item: holding the area. ff between the first holding rod and the second holding rod And ^ there should be / = hold the rod ' it holds the stick to keep the object to be treated together. ^ Keep the rod and the ultrasonic cleaning device of the second item, in which the material of the broken body is laid 1 body holding. The first holding rod of the Taohai and the second object to be processed are held between the 201123281 rods, the body mi; between the second rods to be treated. The second holding of the body 1 holding body holding portion 15 The ultrasonic cleaning device of the first and second holdings of the first and second holding rods and the third holding rod of the first and second holdings of the first and third holdings are provided with the second holding unit of the v ^ skin holding portion The V-shaped cross-section of the treatment body, the groove, which is freely engageable with (4) the first object-receiving body holding portion and the second object to be processed; The control device and the second lateral position move the first holding position and the second lateral position = ^ < the second falling position of the holding portion below the second holding position 1 when moving, 'make it (4) in the second holding position 17. Control the ultrasonic vibration device according to item 16 of the patent application, the first/month of the control device is in the second lowering position The "1曰", and when the second is located ί! During the movement between the side positions of the ultrasonic vibration generated by the body vibration vibrator, the 18. ultrasonic cleaning method is also included, which comprises the following steps:清洗 Cleaning solution treatment body ===pieces are kept; body vibrates 振动ίίΓ The vibrator at the bottom of the tank produces an ultrasonic axis and the processed object = the object to be treated is moved to the side to move to the side The side holding member holds the object to be treated to hold the side portion 51 201123281. In the application of the moon cow 'in which the holding position of the object is held, the ultrasonic vibration of the moving object will be maintained from the vibrating Area. And the ultrasonic cleaning method of the object to be processed, wherein the physical body holding portion, the holding body has a body holding portion for holding the pair of the object to be processed The system can move freely individually. 22. If the ultrasonic cleaning method t in item 19 of the application is held ί 'the object to be processed is then held from the τ drop position _ the position of the position below the financial position, in the The processing body holding device also causes ultrasonic vibration of the vibrator from the lower portion. "Visit position movement period 23. As described in the ultrasonic cleaning method of claim 22, the g is contained in the object to be processed The holding device moves from the lateral position _ between the falling positions, and the position moves to the falling position. 24. In the step of holding the object to be processed by the holding member of claim 18, in the side portion The retracted position of the body retreat moves to accept and maintain the 52 201123281 and maintains the object to be processed. 25. The ultrasonic cleaning method of claim 24, in the middle, the two pairs of the body have abutting The side of the object to be treated loses the position Processing 26. In the ultrasonic cleaning method of claim = (4), the physical body = physical body holding device has a means for maintaining the treated body: the body is held by the side holding member to hold the body body = the object to be processed held by the device; the intersection is controlled by the object to be moved to the side of the object to be processed: the holding member, at least the side (four) is being treated/processed When the body position is moved to the side position of the one side of the holding field holding device of the holding device on the side of the holding position, the portion from the vibrator is at least located in the middle position. The object to be processed maintains the ultrasonic wave cleaning method in which the vibration of the region is transmitted to the object to be processed 27·=,=利范_18, and the clock is held by the device to be freely movable. i], the old person holds the D卩 and the second object to be processed holding portion, and the first object to be processed holds the object holding device and the first object to be processed in the side body to be held by the side body The second object to be processed of the device t is 'processed to maintain positional shift When the second position is the second holding position in the second holding position, the second holding position is again, and the second object to be processed holds the second holding member and the holding member. The i-th retaining the second side position of the second holding portion, and then returning to the second sea-holding position side when the U-thick processing body holding portion in the processed object holding device is at least 53 201123281 ===From The 被 被 被 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少 至少An ultrasonic cleaning method for immersing a target object held by an ith to-be-processed body of a to-be-processed object holding device in a second position of the rinsing tank, and holding the sputum in the second object to be processed holder The body holding portion moves to the side; and, 'χ —,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, After the second step of moving, 'the first one is treated as f is the body', the second is the second Sleeper pretend treating body break up cylinder 30. Post Patent Application range of ultrasonic cleaning method of 29, (iv) Xi = Temple movable. The group holding unit that moves the first object to be processed holding unit is held at the i-th side position on the side of the third side from the i-th holding position of the object to be processed, and thereafter the first one is In the step of moving the second to-be-processed body holding portion, the ninth body holding portion is placed from the second, second, and second processes held by the object to be processed, 2/_, and then returned to the second The second sound is that the ultrasonic vibration of the i-th object to be processed is propagated to the area held by the body holding body in the object to be processed, and the ultrasonic cleaning of the patent lniU item 31 is performed. Method, in the pot, in the step of holding the body, the part is moved, and after the step of moving the second object to be processed, the second step is lowered below the holding position of the second 54 201123281. position. 33. If the step of claim 32 is exceeded, the first step is also to protect the movement between the side positions of the ultrasonic cleaning and the position of the phantom drop and the first The position of the drop position and the position of the 财2 ^ = = = = = = = = = = = = = = = = = = = = = = = = § § § § § § § The ultrasonic cleaning method & 'clearing method computer program, the object to be processed which is smashed by the object holding device, is processed by the cleaning device which is placed in the cleaning tank and dipped into the cleaning tank. The vibrator at the bottom of the tank is subjected to ultrasonic vibration, and the step of holding the portion of the object to be processed is followed by the step of cleaning with the side. - a kind of recording medium, after the step of processing the body. The super body, the computer program, the body protection unit and the second body are treated with the body fluid; the body holding unit is moved sideways; and the body is held by 12; 1 is over the body of the cleaning ship (four) vibration material produces ultrasonic vibration __ processed pattern 55
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TWI698290B (en) * 2015-12-17 2020-07-11 日商東麗工程股份有限公司 Applicator cleaning device and coating device
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