201120455 六、發明說明： 【發明所屬之技術領域】 [0001] 本發明涉及一種導電性測試棒。 【先前技術】 [0002] 隨著科技的進步，電子設備愈來愈趨向高精度及微型化 ，故電路板上出現了大量的插針式引腳，用於傳遞各元 件之間的訊號。習知的用於測試電路板電氣特性的設備 ，如萬用表等，其探頭為一尖狀的金屬針體。測試時， 需要測試人員一直按住該探頭使得該探頭緊貼待測的插 0 針式引腳，比較麻煩。另，由於各插針式引腳排列緊密 、 ，該探頭容易接觸到其他插針式引腳導致各插針式引腳 短路，造成測試失誤甚至電路板燒毀。 【發明内容】 [0003] 鑒於以上内容，有必要提供一種方便測試人員進行測試 的導電性測試棒。 [0004] 一種導電性測試棒，包括：201120455 VI. Description of the Invention: [Technical Field of the Invention] [0001] The present invention relates to a conductive test bar. [Prior Art] [0002] With the advancement of technology, electronic devices are becoming more and more precise and miniaturized. Therefore, a large number of pin pins appear on the circuit board for transmitting signals between components. Conventional devices for testing the electrical characteristics of a circuit board, such as a multimeter, have a pointed metal needle. During the test, it is more troublesome for the tester to keep pressing the probe so that the probe is close to the pin-type pin to be tested. In addition, since the pin pins are closely arranged, the probe easily contacts other pin pins, causing short-circuiting of the pin pins, causing test errors or even board burnout. SUMMARY OF THE INVENTION [0003] In view of the above, it is necessary to provide a conductive test bar that facilitates testing by a tester. [0004] A conductivity test stick comprising:
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[0005] 一觸頭，其為金屬材質且一端設一開口，該開口向内凹 陷形成一軸向孔，該觸頭的中部向該軸向孔的中心軸凹 陷形成一彈性的卡固部； [0006] 一連接頭，其固定連接於該觸頭遠離該開口的一端，該 連接頭透過一導線與一測試裝置相連；及 [0007] 一絕緣外殼，該絕緣外殼包覆在該觸頭及連接頭的外表 面。 [0008] 本發明導電性測試棒透過該卡固部卡住該插針式引腳， 098142802 表單編號A0101 第3頁/共10頁 0982073490-0 201120455 不需要測試人員一直按住該導電性測試棒。該觸頭外部 的絕緣外殼使得各插針式弓丨腳之間不會短路。 【實施方式】 [0009] [0010] [0011] [0012] [0013] [0014] [0015] 098142802 請參閱圖1 ’本發明導電性測試棒10用於接觸—電路板20 上的插針式引腳30以測試電路板20的電氣特性。 請一併參閱圖2及圖3，本發明導電性測試棒1 〇的較佳實 施方式包括一觸頭100、一連接頭200、一導線30〇及一 絕緣外殼400。 該觸頭100為金屬材質’其一端設一開口 12〇。該開口 120向内凹陷形成一軸向孔13〇，該觸頭1〇〇的中部向該 軸向孔130的中心轴140凹陷形成一彈性的卡固部11〇。 該連接頭200固定連接於該觸頭丨〇〇遠離該開口 12〇的一 端，該連接頭20 0與該導線3〇〇焊接並透過該導線3〇〇與 一測試裝置（圖未示），如一萬用表相連。 ' - ii· 該絕緣外殼400包覆在該觸頭1〇〇及連接頭2〇〇的外表面 。該絕緣外殼4 〇〇與該卡固部11 〇之間形成一間隙4 2 〇。 該絕緣外殼400上於該間隙420對應處開設有複數小孔 430。該絕緣外殼400靠近該連接頭200的一端設一通孔 440，該導線300穿過該通孔440與後端的測試裝置相連 〇 本發明導電性測試棒10使用過程如下： 測試人員首先握住導電性測試棒10的絕緣外殼4〇〇，使該 導電性測試棒1〇的開口 120對準該插針式引腳30，然後按 壓該導電性測試棒10使該插針式引腳3〇從該開口 12〇處插 表單編號A0101 第4頁/共頁 0982 201120455 入到該軸向孔130十，該導電性測試棒ι〇的卡固部11〇卡 住該插針式引腳30。該導電性測試棒1〇卡住該插針式引 腳30後，工作人員不需要再按住該導電性測試棒1〇即能 使得該導電性測試棒1〇與插針式引腳30固定相連。複數 小孔430用於使得該間隙420内壓強與外界大氣壓相等， 從而使得當插針式引腳30插入轴向孔130時，該卡固部 110能輕易變形，其他實施方式中亦可省略複數小孔43〇 〇 _] 另，由於該導電性測試棒1〇的外部為該絕緣外殼400 ,從 而可以避免測試時該導電性測試棒1〇與其他的插針式引 腳30相連通。 r：: · ' [0017]本發明導電性測試棒10透過該卡固部Π0卡住該插針式引 腳30，不需要測試人員按住該導電性測試棒1〇。而該觸 頭100外部的絕緣外殼400使得各插針式引腳30之間不會[0005] a contact, which is made of a metal material and has an opening at one end, the opening is recessed inwardly to form an axial hole, and the central portion of the contact is recessed toward the central axis of the axial hole to form an elastic locking portion; [0006] a connector fixedly coupled to an end of the contact away from the opening, the connector being connected to a test device through a wire; and [0007] an insulative housing overlying the contact and the connection The outer surface of the head. [0008] The conductive test bar of the present invention is stuck to the pin pin through the fixing portion, 098142802 Form No. A0101 Page 3 / 10 pages 0982073490-0 201120455 No tester is required to keep pressing the conductive test bar . The insulative housing on the outside of the contact prevents shorting between the pins of the pins. [0010] [0012] [0012] [0012] [0014] [0015] Please refer to FIG. 1 'The conductive test stick 10 of the present invention is used for contact-pin type on the circuit board 20. Pin 30 is used to test the electrical characteristics of circuit board 20. Referring to Figures 2 and 3, a preferred embodiment of the conductivity test strip 1 of the present invention includes a contact 100, a connector 200, a wire 30A, and an insulative housing 400. The contact 100 is made of a metal material having an opening 12〇 at one end. The opening 120 is recessed inwardly to form an axial hole 13〇, and a central portion of the contact 1〇〇 is recessed toward the central axis 140 of the axial hole 130 to form an elastic locking portion 11〇. The connector 200 is fixedly connected to an end of the contact 丨〇〇 away from the opening 12 ,, and the connector 20 is soldered to the lead 3 through the lead 3 and a test device (not shown). Such as a multimeter connected. ' - ii· The insulating case 400 is wrapped around the outer surface of the contact 1 and the connector 2 . A gap 4 2 形成 is formed between the insulating housing 4 〇〇 and the fastening portion 11 〇. A plurality of small holes 430 are defined in the insulating housing 400 at corresponding positions of the gap 420. A through hole 440 is defined in the insulating case 400 near the connecting end 200. The wire 300 is connected to the testing device of the rear end through the through hole 440. The conductive test bar 10 of the present invention is used as follows: The tester first holds the conductivity. The insulating case 4 of the test bar 10 is aligned with the pin 120 of the conductive test bar 1 对准, and then the conductive test bar 10 is pressed to make the pin 3 〇 The opening 12 is inserted into the form number A0101. The fourth page/total page 0982 201120455 is inserted into the axial hole 130, and the fixing portion 11 of the conductive test bar 〇 is stuck to the pin 30. After the conductive test rod 1 is stuck to the pin 30, the worker does not need to press the conductive test rod 1 to fix the conductive test rod 1〇 and the pin 30 Connected. The plurality of small holes 430 are used to make the internal pressure of the gap 420 equal to the external atmospheric pressure, so that when the pin-type pin 30 is inserted into the axial hole 130, the locking portion 110 can be easily deformed. In other embodiments, the plural number can also be omitted. The hole 43〇〇_] In addition, since the outside of the conductive test bar 1 is the insulating case 400, the conductive test bar 1〇 can be prevented from communicating with the other pin pins 30 during the test. r:: [0017] The conductive test bar 10 of the present invention is stuck to the pin type pin 30 through the fixing portion ,0, and does not require the tester to hold the conductive test bar 1〇. The insulative housing 400 on the outside of the contact 100 does not allow between the pin pins 30.
短路。 it S ◎ _8]綜上所述，本發明符合發明專利要件，爰㈣提出專利 巾請。惟’以上所述者僅棘發明之較佳實施例，舉凡 熟悉本案技藝之人士’於|依本發明精神所作之等效修 ㈣變化，皆應涵蓋於以下之㈣專利範圍内。 【圖式簡單說明】 _]圖1係本發明導電性崎棒的使用狀態圖。 [0020]圖2係本發明導電性測試棒的立體圖。 _圖3係本發明導電性測試棒的較佳實施方式剖視圖。 【主要元件符號說明】 0982073490-0 098142802 表單編號Α0101 第5頁/共1〇頁 201120455 [0022] 導電性測試棒：10 [0023] 電路板：20 [0024] 插針式引腳：30 [0025] 觸頭：100 [0026] 連接頭：200 [0027] 導線：300 [0028] 絕緣外殼：400 [0029] 開口 ： 120 [0030] 軸向孔：13 0 [0031] 卡固部：110 [0032] 間隙：420 [0033] 小孔：4 3 0 [0034] 通孔：440 098142802 表單編號A0101 第6頁/共10頁 0982073490-0Short circuit. It S ◎ _8] In summary, the present invention meets the requirements of the invention patent, and 爰 (4) proposes a patent towel. However, the above-mentioned preferred embodiments of the present invention are to be construed as being within the scope of the following four (4) patents. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a view showing a state of use of a conductive bar of the present invention. 2 is a perspective view of a conductive test bar of the present invention. Figure 3 is a cross-sectional view showing a preferred embodiment of the conductive test bar of the present invention. [Main component symbol description] 0982073490-0 098142802 Form number Α0101 Page 5/Total 1 page 201120455 [0022] Conductivity test stick: 10 [0023] Board: 20 [0024] Pin type pin: 30 [0025] Contact: 100 [0026] Connector: 200 [0027] Conductor: 300 [0028] Insulated Housing: 400 [0029] Opening: 120 [0030] Axial Hole: 13 0 [0031] Fastening: 110 [0032] ] Gap: 420 [0033] Small hole: 4 3 0 [0034] Through hole: 440 098142802 Form number A0101 Page 6 / Total 10 pages 0982073490-0