經濟部中央標準局员工消費合作社印製 ¢^398¾__B6_—發日減明説明（丨） 由於電路的工作頻率愈來愈快，當設計人員在使用示波器的測試 棒（Probe)時，便不能忽略測試棒本身的電容及電感，對量測波形所 造成的失真。圖一為測試棒的等效電路，本發明便是欲使測試棒在量 測時的電感L儘量降低。 圖示的簡要說明 圖一為測試棒之等效電路示意圖。 圖二到圖三為傳統的測試棒或測試夾具。 圖四為本發明測試裝置使用例的簡要示意圖。 圔五為本發明測試裝置的接地迴路示意圖。 圖六為本發明測試裝置電感部份的等效電路圖。 圖七為本發明實施例（一）中測試棒的結構圖。 圖八為本發明實施例（二）之示意圖。 圖九為本發明與待統測試棒之使用效果之比較。 傳統技術及其缺點 —般的測試棒如圖二，將接地線1連接於地（Ground)之後，再以 測試針去接觸待測點，以便量出波形。其缺點為過長的接地線1造成 極大的電感量。若將接地線的長度縮短，則又使測試棒的_痛循受 到限制。 對於降低電感量，以往也有如圖三的作法。此種方式傜將接地線 縮短，以便減少電感量。藉著轉動接地線2以便將其接觸待測點附近 的接地點，同時再用測試針去接觸待測點以便量取波形。其缺點為： 需由人將接地線調整至適當位置以便接地，較浪費時間，且亦不適> 使用於自動潮試中。 ........................#····#····#····.............-·· ·V (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度逍用中國國家標準(CNS)甲4規格(210X297公¢) _ 經濟部中央標準局员工消費合作社印製 五、發明説明（2J 發明說明 本發明係除去傳統測試棒上的接地線，而使其前端具有金屬碟形 Η31的結構並配合接地柱4進行量測。在測試時以測試針5接觸電路 板10上之測試點，而碟型Η31則與接地柱4接觸，形成迴路。測試電 路板時之實際情形則見圖四。由圖四可知碟型Η31可同時接觸多根揍 地柱4，使得'測試棒的接地迴路及等效電路分別為圖五及圖六，此時 總電感置為各値接地迴路電慼董的__值，且當某一接地迴路較小時 ，因並聯之故會使總電感量趨近於此最小接地迴路的電感量，如此便 可使測試棒的電感量大大降低而達到本發明的目的。 實施例（一） 本發明之低電感測試裝置中的測試棒實施例之一如圖七所示，可 利用傳統測試棒，在前端加裝一金屬套筒3，使測試棒6之接地極61 與套筒3相連。褰筒3底端為一碟型之金屬Η31，如此套筒3之碟型 金屬Η31即成為測試棒接地極61的延伸，其半徑大小約在4到6 cm之 間。索简3之中心則裝置一揮簧探針51，與傳統測試棒6之測試針62 相接，以做為測試時之壓力缓衝，套筒3與彈簧探針51之間，則以介 電質33材料填充。套筒之内部尺寸可藉阻抗控制之設計，使其阻抗與 原測試棒之阻抗一致，而減少信號反射的問題，例如内徑（半徑）約在 8到12mro，長度15到25ππη，介電質材料可使用鐵弗龍。 接地柱4為一金屬針，市面上測試針床所使用的彈簧針即可。通 常其一端較細可插入電路板佈線時所留的孔位，另一端則較粗，而且 頂端為圓角，再加上内含的彈簧，當接觸測試棒的碟型金屬K31時， 可以緊密的接觸。此接地柱之間的距離以40到60mm之間為宜。 ..................······裝·· ••訂····線 9 (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度逍用中國國家標準(CNS)甲4規格(210X297公釐) 813983 五、發明説明（3) (請先閲讀背面之注意事項再填寫本頁} 本發明最適當的使用時機是在電路板的最初開發階段，此時對電 路中各處的信號如何尚不清楚。可以在電路板佈線時先在其上以固定 距離預留接地柱所需之接地孔位。以便往後在組裝零件時，將接地柱 裝在電路板的焊錫面或零件面。若是希望量取電路板各處的信號則將 接地柱遍插在整個板面上，倘若只對某處信號有興趣，則只需在該測 試點附近加裝接地柱。 * 經過前述之預備後，便可在電路板上隨意量取所需之波形，而不 必顧忌因電感太大所造成的信號失真，同時也不必擔心臨時想要童測 某一量測夾具未設計的測試點時所造成的困擾。 ^ 實施例（二） 在量取少量測試點時可用人工方式量取信號，但當測試點數目 龐大時若再用人工方式便很容易在電路板上量錯點而産生錯誤。 最好能用自動測試的方式來進行量測。 ' 如圖八之示意圖，本發明極適合裝置在一自動定位機7上 測試.，欲量測點的位置座標可經由佈線的資料庫中取得，再轉助自$ 定位条統將測試棒帶至定位後，將測試棒下降接觸待測點暈取波$ > 送至示波器8。此時因接地柱具有彈性，可吸收因裝配時所産生^_ 柱的高低差，而使碟型Η可與之緊密接觸。而各測試墊（Test Pad)g| 製造或焊錫所造成的高低差則可由測試針的彈簧來補償，當測試針g 過多的測試而磨損時則可抽換新品。 使用效果 請參考圖九，以一般的測試棒使用15cm的接地線，本發明之測試 裝置在均勻接觸4根間距為5cm的情況下，針對一上昇時間為 本紙張尺度边用中困國家標準(CNS)甲4規格(210x297公龙) A 6 B6 21¾¾¾3- 五、發明説明 (午） 波形，分別進行量測。由結果可看出，本發明之測試裝置量出之上昇 時間為1.9ns，而一般測試棒則為2.85ns。此外波型的平坦度亦以本 發明之測試裝置較優，故對於信號量測時之失真而言，本發明之測試 裝置功能確有改善。 (請先閲讀背面之注意事項再填寫本頁) 裝- 訂_ 經濟部中央標準局員工消費合作社印製 本紙張尺度通用中國國家標準(CNS)甲4規格(210x297公龙)Printed by the Employee Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economy ¢ ^ 398 ¾ B6_—Issues of the Lightening and Brightening (丨) As the operating frequency of the circuit is getting faster and faster, when designers use the oscilloscope test probe (Probe), they cannot ignore the test The capacitance and inductance of the rod itself distorts the measurement waveform. Figure 1 shows the equivalent circuit of the test rod. The present invention is to reduce the inductance L of the test rod during measurement as much as possible. Brief description of the figure Figure 1 is a schematic diagram of the equivalent circuit of the test rod. Figures 2 to 3 are traditional test rods or test fixtures. Fig. 4 is a schematic diagram of a use example of the test device of the present invention. Fig. 5 is a schematic diagram of the ground loop of the testing device of the present invention. FIG. 6 is an equivalent circuit diagram of the inductance part of the test device of the present invention. Figure 7 is a structural diagram of a test rod in embodiment (1) of the present invention. FIG. 8 is a schematic diagram of Embodiment 2 of the present invention. Figure 9 is a comparison between the use effect of the present invention and the test rod to be unified. Traditional technology and its shortcomings. The general test rod is shown in Figure 2. After connecting the ground wire 1 to the ground, touch the test point with a test pin to measure the waveform. The disadvantage is that the long ground wire 1 causes a great inductance. If the length of the ground wire is shortened, the _ pain cycle of the test rod is restricted. For reducing the inductance, there have been methods like Figure 3 in the past. In this way, the ground wire is shortened to reduce the inductance. By turning the ground wire 2 so that it contacts the ground point near the point to be measured, at the same time, the test pin is used to touch the point to be measured to measure the waveform. The disadvantages are as follows: the grounding wire needs to be adjusted to a proper position by the person for grounding, which is a waste of time and is not suitable for use in automatic tide test. ........................ # ···· # ···· # ···· .................... ..- ··· V (Please read the precautions on the back before filling in this page) This paper is used in accordance with Chinese National Standard (CNS) A4 specifications (210X297) ¢ _ Printed by the Staff Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs V. Description of the invention (2J Description of the invention The present invention removes the ground wire on the traditional test rod, and has a metal dish-shaped H31 structure at the front end and measures with the ground post 4. The test pin 5 is used to contact the circuit board during the test The test point on 10, and the dish-shaped H31 is in contact with the ground post 4 to form a loop. The actual situation when testing the circuit board is shown in Figure 4. From Figure 4, it can be seen that the dish-shaped H31 can contact multiple beating ground posts 4 at the same time, making 'The ground loop and equivalent circuit of the test rod are shown in Figure 5 and Figure 6, respectively. At this time, the total inductance is set to the value of the electrical value of each ground loop, and when a ground loop is small, it is due to parallel connection. The total inductance will be close to the minimum inductance of the ground loop, so that the inductance of the test rod can be greatly reduced to achieve the purpose of the present invention. Embodiment (1) The invention One of the embodiments of the test rod in the inductance test device is shown in FIG. 7, a traditional test rod can be used, and a metal sleeve 3 is added at the front end, so that the ground electrode 61 of the test rod 6 is connected to the sleeve 3. The barrel 3 The bottom end is a dish-shaped metal H31, so the dish-shaped metal H31 of the sleeve 3 becomes an extension of the test rod ground electrode 61, and its radius is about 4 to 6 cm. The center of the cable simple 3 is equipped with a wave spring The probe 51 is connected to the test pin 62 of the traditional test rod 6 as a pressure buffer during the test, and the sleeve 3 and the spring probe 51 are filled with a dielectric material 33. The inside of the sleeve The size can be controlled by the impedance design to make the impedance consistent with the impedance of the original test rod, and reduce the problem of signal reflection, such as the inner diameter (radius) of about 8 to 12mro, the length of 15 to 25ππη, dielectric materials can use iron Fron. The grounding post 4 is a metal pin, and the spring pin used in the test needle bed on the market can be used. Usually, one end is thinner and can be inserted into the hole left by the circuit board wiring, the other end is thicker, and the top is Rounded corners, plus the included spring, when contacting the disc shape of the test rod When it is K31, it can be in close contact. The distance between this grounding post is preferably between 40 and 60mm ............................... ·· •• Order ···· Line 9 (please read the notes on the back before filling in this page) This paper scale uses the Chinese National Standard (CNS) A 4 specifications (210X297 mm) 813983 V. Invention description (3 ) (Please read the precautions on the back before filling in this page) The most appropriate time to use the invention is in the initial development stage of the circuit board. At this time, it is unclear how the signals are everywhere in the circuit. When wiring the circuit board First, reserve the grounding holes required for grounding posts at a fixed distance on it. In order to assemble the parts later, install the grounding post on the soldering surface or component surface of the circuit board. If you want to measure the signals from all parts of the circuit board, insert the grounding post all over the board. If you are only interested in a certain signal, you only need to install a grounding post near the test point. * After the above preparations, you can measure the desired waveform on the circuit board without worrying about signal distortion caused by too much inductance, and you do n’t have to worry about temporarily designing a measurement fixture that is not designed for children. Caused by the test point. ^ Embodiment (2) When measuring a small number of test points, the signal can be measured manually, but when the number of test points is large, if the method is used manually, it is easy to measure the wrong point on the circuit board and cause an error. It is best to use automatic testing to make measurements. 'As shown in the schematic diagram of FIG. 8, the present invention is very suitable for testing on an automatic positioning machine 7. The position coordinates of the measuring point to be measured can be obtained from the wiring database, and then transferred to the positioning bar to bring the test rod After positioning, send the test rod down to the point to be measured and send it to the oscilloscope 8. At this time, due to the elasticity of the grounding post, the height difference of the post due to assembly can be absorbed, so that the dish-shaped H can be in close contact with it. The height difference caused by each test pad (Test Pad) g | manufactured or soldered can be compensated by the spring of the test pin. When the test pin g wears too much, new products can be replaced. Please refer to Figure 9 for the effect of use. Use a general test rod with a 15cm ground wire. Under the condition that the test device of the present invention evenly touches 4 wires with a spacing of 5cm, the national standard for the paper is used for the rise time as the paper standard CNS) A 4 specifications (210x297 male dragons) A 6 B6 21¾¾¾3- V. Description of the invention (noon) Waveforms were measured separately. It can be seen from the results that the rise time measured by the test device of the present invention is 1.9 ns, while the general test rod is 2.85 ns. In addition, the flatness of the wave pattern is also superior to the test device of the present invention, so the function of the test device of the present invention is indeed improved with respect to the distortion during signal measurement. (Please read the precautions on the back before filling out this page) Binding-Order _ Printed by the Staff Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs This paper standard is the General Chinese National Standard (CNS) Grade 4 (210x297 male dragon)