TW201039928A - Substrate coating apparatus and substrate coating method - Google Patents

Substrate coating apparatus and substrate coating method Download PDF

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Publication number
TW201039928A
TW201039928A TW099106182A TW99106182A TW201039928A TW 201039928 A TW201039928 A TW 201039928A TW 099106182 A TW099106182 A TW 099106182A TW 99106182 A TW99106182 A TW 99106182A TW 201039928 A TW201039928 A TW 201039928A
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Taiwan
Prior art keywords
substrate
nozzle
coating
gas flow
platform
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TW099106182A
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Chinese (zh)
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TWI433731B (en
Inventor
Yoshinori Takagi
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Dainippon Screen Mfg
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C5/00Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
    • B05C5/02Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
    • B05C5/0225Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work characterised by flow controlling means, e.g. valves, located proximate the outlet
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B05C11/10Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
    • B05C11/1002Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
    • B05C11/1015Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves responsive to a conditions of ambient medium or target, e.g. humidity, temperature ; responsive to position or movement of the coating head relative to the target
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C13/00Means for manipulating or holding work, e.g. for separate articles
    • B05C13/02Means for manipulating or holding work, e.g. for separate articles for particular articles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C9/00Apparatus or plant for applying liquid or other fluent material to surfaces by means not covered by any preceding group, or in which the means of applying the liquid or other fluent material is not important
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor

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  • Coating Apparatus (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Liquid Crystal (AREA)
  • Optical Filters (AREA)

Abstract

The present invention provides a suspension transporting type substrate coating treatment apparatus, which can start coating treatment from the substrate end part and prevent the front end of the nozzle from drying. The solution means is to divide the coating platform 4 for the coating treatment of substrate W into front coating platform 40 and rear coating platform 41. Each coating platform has small holes, which are used for the ejection and discharge of air for the formation of air flow to suspend the substrate W. The front end of the substrate W is located and stopped at the boundary line of the front coating platform 40 and rear coating platform 41 so that the slit nozzle 55 at the top of the rear coating platform 41 is allowed to descend and move towards the coating start position of the substrate end part. At this point, the air ejection and suction from the rear coating platform 41 is temporarily suspended.

Description

201039928 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種例如對液晶用方形玻璃基板、半導體 基板、薄膜液晶用可撓性基板、光罩用基板、彩色濾光片 用基板等之精密電子裝置用基板、或與其類似之各種基板 之表面塗佈處理液之基板塗佈裝置。 【先前技術】 先前’於各種基板之製造步驟中,使用有對基板之表面 塗佈處理液之基板塗佈裝置。作為上述基板塗佈裝置,已 知一種狹縫塗佈機,其係一邊自狹縫喷嘴噴出處理液,一 邊使該狹縫喷嘴相對於基板而進行相對地直進移動,以對 整個基板塗佈處理液。尤其在對大型基板塗佈處理液時, 難以採用一邊使基板旋轉一邊塗佈處理液之旋塗方式,因 此’該種狹縫塗佈機為主流。 在該種直進型(線性塗佈方式;)之基板塗佈裝置中,於產 距時間(takt time)短縮化之觀點上,相較吸附保持基板而 進行塗佈處理而言,更理想的是使基板懸浮搬送而進行塗 佈處理。 又’於以線性塗佈方式進行抗蝕劑塗佈處理時,由於狹 縫噴嘴與基板表面異物之接觸而導致的噴嘴之損傷或塗佈 不良成為問題,因此對於喷嘴,需要一些保護機構。 於專利文獻1中,揭示有一種基板塗佈裝置,其在對吸 附保持於吸附平台上之基板進行塗佈處理時,於噴嘴之行 進方向前面設置有保護機構,在自基板之端部起掃描基板 146775.doc 201039928 表面時’能夠檢測到基板前面之異物,保護喷嘴之前端。 [先前技術文獻] [專利文獻] [專利文獻1]曰本專利特開2007-105623號公報 【發明内容】 [發明所欲解決之問題] 然而’在以懸浮搬送方式對基板進行抗蝕液等之處理液 塗佈處理之情形時’欲使用噴嘴保護機構自基板之端部起 掃描基板表面,則於噴嘴之下方不存在基板之狀態下必需 使懸子平台下降。因此,噴嘴前端之處理液會因自懸浮平 台噴出、排放之空氣之流動而乾燥,從而在對基板進行塗 佈處理時有塗佈不良之虞。 又,於喷嘴正下方存在有基板端部之狀態下,在使噴嘴 下降時’不會產生上述問題’但無法測定開始塗佈之基板 端部之貫際的懸浮高度。又,如圖28所示,無法自基板之 端。P起對保護機構之間的基板表面進行異物檢測。 本發明係鑒於上述問題而完成者,其第1目的在於,在 、W浮搬送方式對基板進行處理液之塗佈處理時,防止因 噴嘴前端之處理液之乾燥而導致的塗佈不良。 本發明之第2目的在於,可進行基板前端部之異物檢 貝1J並且防止因嗔嘴前端之處理液之乾燥而導致的塗佈不 良。 [解決問題之技術手段] 為m述問題’技術方案1之發明係-種基板塗佈裝 146775.doc 201039928 置,其特徵在於··其係用以對基板塗佈處理液者;其包 含.懸浮平台,其藉由通過平台面上所設置之氣體孔之氣 體流而於上述平台面上形成壓力氣體層,並藉由上述壓力 氣體層而使基板懸浮;處理液供給機構,其自相對於上述 基板進行相對移動之嘴嘴將特定之處理液喷出至上述基板 上,藉以將上述處理液塗佈於上述基板上;及氣體流控制 機構,其在上述氣體流之形成狀態與停止狀態間進行切 換’且在與上述相對移動並行進行之上述處理液喷出之 月'j ’没疋空轉期間’其係在停止自上述喷嘴噴出上述處理 液之狀態下,使上述噴嘴自上述懸浮平台上之偏離基板存 在區域之位置相對移動至上述基板存在區域;上述氣體流 控制機構係在上述空轉期間中之至少一部分期間内,暫時 停止在上述喷嘴之正下方區域進行之上述氣體流之形成。 技術方案2之發明係如技術方案1之基板塗佈裝置,其中 更包含使上述噴嘴在上述懸浮平台之上方空間升降之升降 機構;上述空轉期間包含:上述喷嘴自特定之等待高度下 降之下降期間、及在上述喷嘴成為下降狀態後於水平方向 使上述噴嘴相對於上述基板而相對接近之水平移動期間; 對上述基板上之上述處理液之塗佈,係在上述下降狀態下 進行;在上述空轉期間中之至少上述水平移動期間内,停 止上述氣體流之形成。 技術方案3之發明係如技術方案1或技術方案2之基板塗 佈裝置’其中在上述懸浮平台上,將分別形成有氣體孔之 複數之氣體流形成區域鄰接配置作為另一張板或_張板之 U6775.doc 201039928 另一部分;對應於上述複數之氣體流形成區域之各者而設 置有氣體流路之開閉機構;上述氣體流控制機構係僅針對 上述複數之氣體流形成區域令、位在上述喷嘴之正下方且 於其上不存在上述基板之區域,進行使用上述開閉機構之 上述氣體流之形成之暫時停止。 技術方案4之發明係如技術方案j或技術方案&基板塗 佈裝置’其中於上述氣體流暫時停止之後,使用上述懸浮 平台上所有的氣體孔重新開始形成氣體流,I至上述喷嘴 自上述基板之塗佈開始位置開始噴出上述處理液為止。 技術方案5之發明係如技術方案15戈技術方案以基板塗 =置八中更包3測疋上述基板之懸浮高度之懸浮高度 測疋機構;並且上述處理液供給機構中更包含保護構件, 其安裝於上述喷嘴中在進行上述相對移動時相當於前方之 :’保護上述喷嘴之前端;在上述懸浮高度測定機構檢測 出上述基板端部之塗佈開始位置之懸浮高度並且使上述喷 嘴下降後,使上述喷嘴盘卜奸,装化、& 7 、 嘴萬與上述基板進行相對移動,藉此使 述保護構件較上述喷嘴更先進人至基板端部。 技術方案6之發明係如技術方 ^ ^ , 杈珩方案1或技術方案2之基板塗 佈裝置,其係預先決定因暫時 $μ、+. a ^ 于1T止上述軋體流之形成所致 述基板之)皿度變動之容許值,上述氣體流之形成之上 述暫時停止狀態的持續__以 述容許值以下之時間。 又變動成為上 技術方案7之發明係如技術方 佈奘W ^ u 系次技術方案2之基板塗 佈裴置,其中於上述懸浮平台 也《形成有噴出上述氣 146775.doc 201039928 體之複數喷出孔、及抽吸上述氣體之複數抽吸孔;上述氣 體流係在自上述複數喷出孔喷出之壓力氣體由上述複數抽 吸孔抽吸的過程中產生;上述氣體流控制機構係藉由開閉 - 對上述複數喷出孔之氣體供給路徑、與開閉由上述複數抽 - 吸孔之氣體抽吸路徑,而在上述氣體流之形成狀態與停止 狀態間進行切換。 技術方案8之發明係一種基板塗佈方法,其特徵在於: ❹ 其係用以將自特定之喷嘴喷出之處理液塗佈於基板者;其 包括以下步驟:第1步驟,藉由通過平台面上所設置之氣 體孔之氣體流而於上述平台面上形成壓力氣體層,並藉由 上述壓力氣體層而使基板懸浮;針對上述平台面中偏離基 板存在區域且為噴嘴之正下方之特定區域,暫時停止上述 氣體流;使噴嘴自特定之等待高度朝向上述特定區域下 降;使上述喷嘴與上述基板相對移動而使上述噴嘴到達上 述基板之塗佈開始位置之上,開始自上述喷嘴噴出上述處 〇 if液;及重新開始針對上述特定區域進行上述氣體流之形 成,直至開始進行上述處理液之噴出為止。 [發明之效果] 根據技術方案1至技術方案8之發明,於停止自喷嘴喷出 處理液之狀態下,在使喷嘴自懸浮平台上之偏離基板存在 區域之位置起相對移動至基板存在區域上方之空轉期間的 至少一部分期間内,暫時停止偏離基板存在區域之區域中 至少包含喷嘴正下方之區域之範圍内的氣體流之形成。因 此,可抑制因用於形成氣體壓力層之氣體流之影響而導致 146775.doc 201039928 喷嘴前端之處理液教極 '、,且在進行塗佈處理時導致基板上 發生塗佈不均之可能性。 又’尤其根據技術方宰2之格日日, ^^^-Μ., 案2之毛明,由於停止在最易受到 氣體/瓜衫響之水平移私g 間内的氣體流之形成,因此處理 液之防乾操效果特別高。 又’尤其根據技術方宰3之路aa _ 柔之發明,可進行各別控制,在 複數之氣體流形成區域中, 肖噴嘴正下方區域暫時停止氣 體/爪之形成。因此,在使嗜 # > ^ u 使赁嘴接近基板時,可根據氣體流 形成區域而變更氣體孔 炙刀布狀况,從而可部分地利用廉 價的板或板區劃。[Technical Field] The present invention relates to, for example, a prismatic glass substrate for a liquid crystal, a semiconductor substrate, a flexible substrate for a thin film liquid crystal, a substrate for a photomask, a substrate for a color filter, and the like. A substrate coating device for coating a surface of a substrate for a precision electronic device or a surface of various substrates similar thereto. [Prior Art] In the manufacturing steps of various substrates, a substrate coating device having a coating liquid applied to the surface of the substrate was used. As the substrate application device, there is known a slit coater that relatively moves the slit nozzle relative to the substrate while ejecting the processing liquid from the slit nozzle to coat the entire substrate. liquid. In particular, when a treatment liquid is applied to a large substrate, it is difficult to apply a spin coating method in which a treatment liquid is applied while rotating the substrate. Therefore, such a slit coater is mainly used. In the substrate coating apparatus of such a straight type (linear coating method), it is more preferable that the coating process is performed by adsorbing and holding the substrate from the viewpoint of shortening the takt time. The substrate is suspended and transported to carry out a coating process. Further, when the resist coating treatment is performed by the linear coating method, damage of the nozzle or poor coating due to contact between the slit nozzle and foreign matter on the surface of the substrate becomes a problem, and therefore some protective mechanism is required for the nozzle. Patent Document 1 discloses a substrate coating apparatus which is provided with a protective mechanism in front of a traveling direction of a nozzle when a substrate is adsorbed and held on an adsorption stage, and is scanned from an end portion of the substrate. Substrate 146775.doc 201039928 When the surface is 'can detect foreign matter in front of the substrate, protect the front end of the nozzle. [Prior Art] [Patent Document 1] [Patent Document 1] JP-A-2007-105623 SUMMARY OF INVENTION [Problems to be Solved by the Invention] However, the substrate is subjected to a liquid-repellent solution or the like by a suspension transfer method. In the case of the treatment liquid coating treatment, when the nozzle protection mechanism is to be used to scan the surface of the substrate from the end portion of the substrate, the suspension platform must be lowered in the state where the substrate is not present under the nozzle. Therefore, the treatment liquid at the tip end of the nozzle is dried by the flow of the air ejected from the suspension platform and discharged, so that there is a coating failure when the substrate is coated. Further, in the state where the end portion of the substrate is present immediately below the nozzle, the above problem does not occur when the nozzle is lowered. However, the flying height of the end portion of the substrate to be coated cannot be measured. Further, as shown in Fig. 28, it is not possible from the end of the substrate. P acts to detect foreign matter on the surface of the substrate between the protection mechanisms. The present invention has been made in view of the above-mentioned problems, and the first object of the present invention is to prevent coating failure due to drying of the treatment liquid at the tip end of the nozzle when the W-floating method performs a coating treatment on the substrate. A second object of the present invention is to prevent foreign matter inspection at the tip end portion of the substrate and to prevent coating failure due to drying of the treatment liquid at the tip end of the nozzle. [Technical means for solving the problem] The invention relates to the invention of the first aspect of the invention, and the substrate coating device 146775.doc 201039928 is characterized in that it is used to apply a treatment liquid to a substrate; a suspension platform, which forms a pressure gas layer on the platform surface by a gas flow through a gas hole provided on the platform surface, and suspends the substrate by the pressure gas layer; the treatment liquid supply mechanism is self-relative with respect to a nozzle for relatively moving the substrate, ejecting a specific processing liquid onto the substrate, thereby applying the processing liquid to the substrate; and a gas flow control mechanism between the forming state and the stopping state of the gas stream Performing the switching 'and the period of the discharge of the processing liquid in parallel with the relative movement described above, 'n' during the idling period', in the state where the discharge of the processing liquid from the nozzle is stopped, the nozzle is caused to be from the floating platform Moving relative to the substrate presence region relative to the substrate presence region; the gas flow control mechanism being at least a portion of the idling period The room, temporarily stops the flow of gas is formed for the area immediately below the nozzle of. The invention of claim 2 is the substrate coating apparatus of the first aspect, further comprising: a lifting mechanism for raising and lowering the nozzle above the floating platform; wherein the idling period includes: a period during which the nozzle is lowered from a specific waiting height And moving the nozzle to a horizontal direction relatively close to the substrate in a horizontal direction after the nozzle is in a lowered state; applying the processing liquid on the substrate to the lowering state; and performing the idling The formation of the gas flow is stopped during at least the horizontal movement period of the period. The invention of claim 3 is the substrate coating apparatus of the first aspect or the second aspect, wherein the gas flow forming regions in which the plurality of gas holes are respectively formed are adjacently disposed as another plate or sheet on the floating platform. U6775.doc 201039928, another part; an opening and closing mechanism for a gas flow path is provided corresponding to each of the plurality of gas flow forming regions; and the gas flow control mechanism is configured only for the plurality of gas flow forming regions A region where the substrate is not present directly under the nozzle and a temporary stop of formation of the gas flow using the opening and closing mechanism is performed. The invention of claim 4 is the technical solution j or the technical solution & substrate coating device, wherein after the gas flow is temporarily stopped, the gas flow is restarted using all the gas holes on the suspension platform, and the nozzle is from the above The processing start liquid is discharged from the application start position of the substrate. The invention of claim 5 is a suspension height measuring mechanism for measuring the levitation height of the substrate by using a substrate coating method; and the processing liquid supply mechanism further includes a protective member. When the relative movement is performed in the nozzle, it corresponds to the front side: 'protects the front end of the nozzle; and after the levitation height measuring means detects the levitation height of the application start position of the end portion of the substrate, and lowers the nozzle, The nozzle is smuggled, loaded, and the nozzle is moved relative to the substrate, whereby the protective member is advanced to the end of the substrate than the nozzle. The invention of claim 6 is the substrate coating apparatus of the technical method, the first embodiment or the second aspect, which is determined in advance by the formation of the above-mentioned rolling body flow due to temporary $μ, +. a ^ at 1T. The allowable value of the variation of the degree of the substrate is the duration of the temporary stop state in which the gas flow is formed, which is equal to or less than the allowable value. Further, the invention of the seventh aspect of the invention is the substrate coating device of the technical solution 2, wherein the floating platform is also formed with a plurality of sprays of the gas 146775.doc 201039928. And a plurality of suction holes for sucking the gas; the gas flow is generated during a process in which the pressure gas ejected from the plurality of ejection holes is sucked by the plurality of suction holes; and the gas flow control mechanism is The gas supply path for the plurality of discharge holes and the gas suction path for opening and closing the plurality of suction-suction holes are switched between the formation state and the stop state of the gas flow. The invention of claim 8 is a substrate coating method, which is characterized in that: a coating liquid for applying a treatment liquid sprayed from a specific nozzle to a substrate; the method comprising the following steps: the first step, by passing through the platform a gas flow of a gas hole provided on the surface forms a pressure gas layer on the surface of the platform, and suspends the substrate by the pressure gas layer; and is specific to the surface of the platform surface that is offset from the substrate and is directly below the nozzle a region temporarily stopping the gas flow; lowering the nozzle from the specific waiting height toward the specific region; moving the nozzle relative to the substrate to cause the nozzle to reach the application start position of the substrate, and starting to eject the nozzle from the nozzle The IF solution is re-started; and the formation of the gas stream is resumed for the specific region until the discharge of the treatment liquid is started. [Effects of the Invention] According to the inventions of the first aspect to the eighth aspect, in the state in which the processing liquid is ejected from the nozzle, the nozzle is relatively moved from the position on the floating platform from the substrate existence region to the substrate existence region. During at least a part of the idling period, the formation of a gas flow in a region including at least the region immediately below the nozzle in the region deviating from the substrate existence region is temporarily stopped. Therefore, it is possible to suppress the possibility of coating unevenness on the substrate when the coating process is performed due to the influence of the gas flow for forming the gas pressure layer, and the coating liquid at the tip end of the nozzle is 146775.doc 201039928. . And 'in particular, according to the technical party, the day of the 2nd, ^^^-Μ., the case of Mao Ming, due to the formation of gas flow in the most vulnerable to the gas / melon ringing level, Therefore, the anti-dry operation effect of the treatment liquid is particularly high. Further, in particular, according to the invention of the technical side, the road aa _ soft, the individual control can be performed, and in the gas flow forming region of the plural, the gas/claw is temporarily stopped in the area immediately below the oscillating nozzle. Therefore, when the nozzle is brought close to the substrate, the condition of the gas hole trowel can be changed according to the gas flow forming region, so that an inexpensive board or plate division can be partially utilized.

又’尤其根據技術方幸4夕恭nB 〃 毛月,在基板到達塗佈開始 位置後,於所有的懸浮平a Q上开/成壓力氣體層,因此即便 為了進行塗佈處理而搬谈其此 廷基板,亦不會有基板撓曲之疑 慮。 又,尤其根據技術方案5之發明,可使用喷嘴前端之保 護構件自基板之端部起掃描基板表面,因此能夠檢測到基 板整個面之異物。 又’尤其根據技術方案6之發明,可更定量地抑制因停 止懸浮平台上之壓力氣體層之形成而導致的基板溫度變動 之影響,因此於進行塗佈處料,可抑制因基板側之溫度 變動而導致的塗佈不均。 又,尤其根據技術方案7之發明,利用氣體之嗔出與抽 吸’藉由懸汁平台上之氣體流而形成壓力氣體層,因此, 可取得壓力氣體層之壓力平衡’從而能更穩定地進行基板 146775.doc 201039928 之懸浮。 【實施方式】 以下,一邊參照圖式一邊說明本發明之實施形態。 - 再者,於以下之說明中,在表示方向及朝向時,適當地 * 使用圖中所示之三維XYZ正交座標。此處,χ轴及γ轴方 向表示水平方向,Ζ轴方向表示錯垂方向(+ζ側為上側,_ζ 侧為下侧)。又,為方便起見,將χ軸方向作為左右方向 〇 (關於基板搬送,+χ侧為下游側,-X侧為上游側),將丫軸 方向作為深度方向(+ Υ側,-γ側)。 <1·基板處理裝置之概要> 圖1係表示本發明之實施形態之基板處理裝置丨之概略構 成的俯視圖。圖2係表示噴嘴單元5及喷嘴洗淨等待單元9 已卸除時的本發明之實施形態之基板處理裝置丨之概略構 成的俯視圖。 基板處理裝置1之構成為使噴出處理液且形成為狹縫之 〇 長條的喷嘴與基板進行相對移動以對基板之表面塗佈處理 液之裝置(狹縫塗佈機)。該裝置i係被利用於對基板塗佈作 為處理液之抗蝕液之製程等,來作為選擇性地蝕刻形成於 基板表面之電極層等之前處理。成為狹縫塗佈機之塗佈對 象之基板中,代表性的係用以於液晶顯示裝置中製造畫面 面板之方形的玻璃基板,但亦可為半導體基板、薄膜液晶 用可撓性基板、光罩用基板、彩色濾光片用基板等之其他 基板。 基板處理裝置1之機械性構成大致分為:接收自上游單 146775.doc 201039928 70搬运而來之水平姿勢之矩形基板w並朝(+X)方向搬送之 基板搬送裝置2 ·’對基板1塗佈處理液之塗佈裝置3 ;及出 w浮平σ 1 1 ^利用該基板處理裝置丨塗佈處理液後之基 板1自出口懸浮平台11藉由移載機械手36而移載至減壓乾 燥單幻7、38中之任—者,已塗佈之處理液受到減壓乾 燥。其後,將基板w移載至與減壓乾燥單元38於上下方向 上積層之父接位置39,進而交給用於下一步驟之其他裝 置。 ’、 基板搬送裝置2大致分為:搬送自上游單元傳送而來之 基板W之滚子輪送機3G ;藉由壓縮空氣而使基板W懸浮之 入口懸洋平台1G ;將基板W自滾子輸送機3G移載至入口懸 浮平〇 1 0之移載單元6 ;及吸附保持基板w之兩側端而將 其搬送至下游之基板搬送夾盤8。又,基板塗佈裝置3大致 7刀為·具備喷出處理液之狹縫喷嘴S5之喷嘴單元5;對狹 縫喷嘴55進行洗淨之噴嘴洗淨等待單元9 ;及進行塗佈處 理之塗佈平台4。 透過該基板處理裝置丨之整體而觀察時,基板搬送區間 TR根據基板支持方式之不同而大致分為3個區間。 (1)接觸支持區間TA : 上游側之接觸支持區間TA成為「滾子搬送方式」,其係 一方面以與基板霤之下表面接觸之滾子排列來支持基板 W,一方面藉由各滾子之旋轉而搬送基板。該「滾子搬送 方式」下的基板支持成為與基板评之下表面接觸而支持基 板W之「接觸支持形式」之一態樣。以存在於基板處理裝 146775.doc •10· 201039928 置ι前段側之上游單元進行之搬送亦成為滚子搬送方式。 (2) 懸浮支持區間TC1、TC2 : Ο Ο 夾持有後述之支持形式轉換區間TB而位於接觸支持區 間TA下游側之懸浮支持區間TC1、TC2係藉由壓縮空氣而 使基板懸浮來支持基板w。一般而言,使基板懸浮而支持 基板之形式係「懸浮支持形式」,但本實施形態中成為懸 汁搬送方式,其係一方面藉由加壓氣體(具體指壓縮空氣) 而實現懸浮支持形式一方面吸附保持基板之兩侧端而使 基板移動。區間TC1、TC2*之區間TC1係與處理液之塗佈 直接相關的塗佈用搬送區間,區間TC2係用以將基板交付 至移載機械手36之出口區間。 、In addition, the pressure gas layer is opened on all the suspension flats a Q after the substrate reaches the coating start position, so that even if it is coated, it is moved. There is no doubt that the substrate will be deflected. Further, in particular, according to the invention of claim 5, the surface of the substrate can be scanned from the end portion of the substrate by using the protective member at the tip end of the nozzle, so that foreign matter on the entire surface of the substrate can be detected. Further, in particular, according to the invention of claim 6, the influence of the temperature variation of the substrate caused by the formation of the pressure gas layer on the suspension platform can be more quantitatively suppressed, so that the temperature at the substrate side can be suppressed by performing coating. Uneven coating caused by changes. Further, in particular, according to the invention of claim 7, the pressure gas layer is formed by the gas flow and the suction by the gas flow on the suspension platform, so that the pressure balance of the pressure gas layer can be obtained, thereby enabling a more stable The suspension of the substrate 146775.doc 201039928 is performed. [Embodiment] Hereinafter, embodiments of the present invention will be described with reference to the drawings. - In the following description, when indicating the direction and orientation, the three-dimensional XYZ orthogonal coordinates shown in the figure are appropriately used. Here, the χ axis and the γ axis direction indicate the horizontal direction, and the Ζ axis direction indicates the sag direction (the ζ side is the upper side and the _ 侧 side is the lower side). Moreover, for the sake of convenience, the x-axis direction is referred to as the left-right direction 〇 (for the substrate transfer, the +χ side is the downstream side, the -X side is the upstream side), and the 丫-axis direction is the depth direction (+ Υ side, -γ side) ). <1. Outline of substrate processing apparatus> Fig. 1 is a plan view showing a schematic configuration of a substrate processing apparatus according to an embodiment of the present invention. Fig. 2 is a plan view showing a schematic configuration of a substrate processing apparatus according to an embodiment of the present invention when the nozzle unit 5 and the nozzle cleaning standby unit 9 have been removed. The substrate processing apparatus 1 is configured such that a nozzle that ejects the processing liquid and is formed as a slit of the slit moves relative to the substrate to apply a treatment liquid to the surface of the substrate (slit coater). This device i is used for a process of applying a resist liquid as a processing liquid to a substrate, and the like, as a process of selectively etching an electrode layer formed on the surface of the substrate. A substrate to be coated by a slit coater is typically used to produce a square glass substrate of a screen panel in a liquid crystal display device, but may be a semiconductor substrate, a flexible substrate for a thin film liquid crystal, or a light substrate. Other substrates such as a cover substrate and a color filter substrate. The mechanical configuration of the substrate processing apparatus 1 is roughly divided into a substrate transfer device 2 that receives a rectangular substrate w that is transported in a horizontal posture and is transported in the (+X) direction from the upstream sheet 146775.doc 201039928 70. The coating apparatus 3 for the cloth treatment liquid; and the float level σ 1 1 ^ The substrate 1 after the treatment liquid is applied by the substrate processing apparatus is transferred from the outlet suspension stage 11 to the decompression by the transfer robot 36 In the case of drying single illusion 7, 38, the applied treatment liquid is dried under reduced pressure. Thereafter, the substrate w is transferred to the parenting position 39 which is laminated in the up-and-down direction with the reduced-pressure drying unit 38, and is then transferred to another apparatus for the next step. The substrate transfer device 2 is roughly classified into a roller carrier 3G that transports the substrate W transferred from the upstream unit, an inlet suspension platform 1G that suspends the substrate W by compressed air, and a substrate W from the roller. The conveyor 3G is transferred to the transfer unit 6 of the inlet suspension level 10; and the both ends of the substrate w are held and transported to the downstream substrate transfer chuck 8. Further, the substrate application device 3 is substantially a nozzle unit 5 including a slit nozzle S5 for discharging the processing liquid, a nozzle cleaning waiting unit 9 for cleaning the slit nozzle 55, and a coating process for coating treatment. Cloth platform 4. When viewed through the entire substrate processing apparatus, the substrate transfer section TR is roughly divided into three sections depending on the substrate support method. (1) Contact support section TA: The contact support section TA on the upstream side is a "roller transfer method", which supports the substrate W on the one hand by the roller arrangement in contact with the lower surface of the substrate, on the one hand, by each roll The substrate is rotated to transport the substrate. The substrate support under the "roller transfer method" is one of the "contact support forms" for supporting the substrate W in contact with the surface under the substrate evaluation. The transfer by the upstream unit located on the front side of the substrate processing apparatus 146775.doc •10· 201039928 also becomes the roller transport mode. (2) Suspension support sections TC1 and TC2: Ο 悬浮 The suspension support sections TC1 and TC2 which are provided on the downstream side of the contact support section TA with the support form conversion section TB described later are suspended by the compressed air to support the substrate w. . Generally, the form in which the substrate is suspended and the supporting substrate is in a "suspended support form" is a suspension conveying mode in the present embodiment, which is realized by a pressurized gas (specifically, compressed air) in a suspension support form. On the one hand, the both ends of the substrate are adsorbed and held to move the substrate. The section TC1 of the sections TC1 and TC2* is a coating transport section directly related to the application of the treatment liquid, and the section TC2 is for delivering the substrate to the exit section of the transfer robot 36. ,

(3) 支持形式轉換區間:TB 設置於上述2種區間TA、(TC i、TC2)之間的支持形式轉 換區間TB係在接觸支持區間TA與懸浮支持區間仙、奶 之間用以轉換基板之支持方式的區間。從基板之搬送方式 而非基板之支持形式之觀點考慮’支持形式轉換區間邛係 在作為接觸支持區間TA中的「接觸搬送方式」之「滾子搬 送方式」、與懸浮支持區間TC1、TC2中的「懸浮搬'送方 式」之間,轉換基板之搬送方式的區間。 广係表示控制部7、及主要由該控制部7所控制 月&部之關係的示圖。控制部7係使 腦中所忠“ 一、 使用電胸而構成,根據電 細中所女裝之程式、裝置各部之特性資料、及 理順序(配方(recipe))而控制裝置各 " 夕、击病士 進仃一連串的基板 之連續處理。㈣作為控制對象之各部之功能,將於各, 146775.doc 201039928 之相關部位進行敍述。 <2_各部之構成> <•滾子輸送機30> 滾子輸送機30係接觸式之搬送裝置,其使旋轉之複數之 滾子301之外周面的最上部抵接於基板臀之下表面,以對 基板W賦予推進力,使其向下游方向移動。在作為驅動源 之馬達35與1根旋轉軸302、進而在分別鄰接之旋轉軸3〇2 彼此間,架設有正時皮帶32(參照圖6),因此,能夠以相同 的時序對各旋轉軸302賦予相同的旋轉速度。與後述之移 載單元6之滚子601不同,該等複數之滾子3〇1係設於固定 兩度而構成與基板之下表面接觸之滾子群。 於边滾子輸送機30中,在與X軸方向平行之兩端部之一 方設置有減速感測器(未圖示),在較該減速感測器之設置 位置更靠基板W之搬送方向下游側,設置有停止感測器(未 圖不)。所搬送之基板W之前端WE(參照圖12)被減速感測 益檢測到,藉此,滾子301之旋轉速度得以減速,停止感 測器檢測到基板貿之前端WE,從而使滾子3〇1之旋轉停 止。如此,藉由事前降低所搬送之基板貿之速度而可使施 加於基板w上之衝擊達到最小限度,之後可停止基板w。 <*移載單元6> 於滾子輸送機30之下游側設置有移載單以。該移載單 元6係設置於滾子輸送機3()與入〇懸浮平台⑺之間隔空間 内,並包含懸浮墊64與移載升降滾子輸送機6〇。 懸子塾64係自各上表面對基板w之下表面喷出壓縮氣 146775.doc 12 201039928 例如喷出空氣而使基板職浮,以非接觸狀態來支持 基板w之懸浮機構。懸浮墊64係由使用以喷出空氣之多數 之噴出孔64a(參照圖12)分布於上表面而設置之長方形狀之 斤構成,其上表面成為氣體嘴射面。自喷出孔不 冑噴出空氣。該懸浮墊64係以長度方向與基板歡搬送方 向平行之方式,沿γ軸方向隔開特定間隔而設置有複數 個。該等複數之懸浮塾64之集合體係作為基板歡懸浮平 台而發揮功能,各懸浮墊64成為其構成要素之單位懸浮平 ^ 台。 在隔開特定間隔而排列之懸浮墊64間之空隙中,移載升 降滾子輸送機6 0之包含複數之滾子6 〇丨之滾子群係位於使 各滾子601外周面之最上部之旋轉方向與懸浮墊64之長度 方向成平行的朝向,旋轉軸602貫通滾子6〇1之旋轉中心。 如後述之圖4及圖5所示,懸浮墊64存在於旋轉軸602之上 方’該旋轉軸602大致水平地排列,並且以與懸浮墊64之 Q 長度方向正交之方式而貫通複數之滾子601之旋轉中心。 關於滚子601及旋轉軸6〇2之驅動,與滾子輸送機3〇同樣 地’在作為驅動源之馬達65與1根旋轉軸6〇2、進而在各自 大致水平地鄰接之旋轉軸602彼此間,架設有正時皮帶62 (參照圖6),故能夠以相同的時序對構成移載升降滾子輸送 機60之各旋轉軸6〇2賦予相同的旋轉速度。 於各滚子601之旋轉軸602之下方,設置有例如油缸般之 升降機構66(參照圖4),該升降機構66與各滾子601之旋轉 軸602係經由構件而連結。因此’配合該升降機構66之驅 146775.doc -13- 201039928 動,移載升降滾子輸送機60 一邊保持大致水 方向升降。 遭於Z軸 圖4係移載升降滚子輸送機60上升時之移載單元6^z 二γ面^二5係移載升降滾子輸送機6G下降時之移載單元6 的YZ剖面圖。 如圖4所示,上升時滚子6〇1之位置係其外周面之最上部 之下表面接觸之位置’其係較藉由自喷出孔⑷ 、出空乳而使基板w懸浮之高度更高的位置。X,如圖5 所示,於下降時,滚子601之外周面之最上部下降至較縣 播手墊64之上表面更低的位置為止。於上升時,與滾子輸送 機3〇同樣地,旋轉之滾子術之外周面之最上部抿接於基 板W之下表面’以對基板w賦予推進力’使基板%向下游 方向移動。 該移載升降滾子輸送機6G於上升之狀態下旋轉,藉此, 基板W自滾子輸送機3〇向人σ懸浮平台職搬送。在基板 W通過滾子輸送機3G時,移載升降滾子輸送機6q會下降至 車乂懸斤墊64之上表面更下方。因& ’移載單元6對基板w 之支持僅成為懸浮墊64之懸浮力,與入口懸浮平台10上之 懸浮力協動而使基板W懸浮,從而轉變為與滾子等下部機 構為非接觸狀態。 該移載單元6之搬送方向(+χ方向)之長度、即圖(中之支 持形式轉換區間TB之長度變得短於搬送方向上之基板w之 長度。換言之,對搬送方向(+χ方向)上特定長度之基板w 進行處理之裝置1中,移载單元6之搬送方向(+Χ方向)之長 146775.doc -14· 201039928 因此,可縮短基板處理線之全 度變得短於該特定長度 長。 Ο 〇 -圖6係滾子輪送機3〇與移载單元6之側視圖。如圖6所 不’滾子輸送機30與移載單元6鄰接配置但並未連社,在 =間上完全分離作為各狀裝置。此時,料輸送支撑框 木69自側面觀察時看起來好像連結著,但實際上如^所 不之騎分之俯視圖,纟空間上並未連結。因此,伴隨滾 子輸达機30之滚子驅動而產生之振動不會由移載單元6傳 遞至下游側。其結果為’於後述之處理液塗佈處理中,可 防止因無用之振動而產生之塗佈不均。 <*入口懸浮平台1 〇> 於移載單元6之下游側設置有入口懸浮平台1G。該入口 w浮平σ 10上,遍及〗張板狀平台面之整個面而分布形成 有多數之空氣之噴出孔心’彳冑由壓縮空氣之喷出而產 生的氣體屢力使基板W懸浮,且可使基板w相對於入口懸 浮平σ 10之上表面即相對於氣體噴射面而成為非接觸狀 態。此時基板W之懸浮高度為10〜500微米。入口懸浮平台 10之上述基板懸浮原理係與移載單元6之懸浮塾64之平行 排列為相同。 如圖12所示,於基板處理裝置丨之基板搬送路徑上,在 較相對於基板W之搬送方向平行之基板w之兩邊沿γ軸方 向更外側的位置(以下稱為「側方位置」)上,設置有導輥 102ρ〜102s。於移載單元6之(+γ)側設置有導親ι〇2ρ,於 (-Υ)側a史置有導棍102r,於入口懸浮平台1 〇之(+γ)側設置 146775.doc -15- 201039928 有導輥102q ’於(-Y)側設置有導輕i〇2s。在未對入口懸浮 平台1 〇進行基板w之搬送之情形時,該導輥丨02p〜丨02s位 於退避位置(與相當於基板W之側邊之移動軌跡的線分離之 位置),但在基板搬送時,藉由安寰於導輥1〇2p〜1〇2s上之 導輥油缸(未圖示),使平行於搬送方向的基板W之兩邊以 朝向與X軸平行的基板W之中心線而自兩側擠壓之方式接 觸。導輥102P〜102s設置成其旋轉軸與z軸平行,藉此,自 移載單元6轉移至入口懸浮平台10時,可使藉由滾子輸送 機30及移載升降滾子輸送機6〇之滚子6〇1之旋轉所賦予之 推進力僅於搬送方向傳遞,因此可防止基板W之橫向偏 移。 於入口懸浮平台1〇之與X軸方向平行之兩端部的一方, 與滚子輸送機30同樣地設置有減速感測器(未圖示)與停止 感測器(未圖示)’可使基板W之搬送速度減速,並可在入 口懸洋平台10上之特定之停止位置使基板W之搬送停止。 如圖15所示,用以對藉由入口懸浮平台1〇之停止感測器 而停止之基板w進行對準處理之對準處理銷⑺氕〜丨〇5f係設 置於移載單元6與入口懸浮平台1〇之周圍。具體而言,與 相對於X軸方向平行的基板w之兩邊相接之對準處理銷 105g〜105j在移載單元6與入口懸浮平台1〇之側方位置上, 於(+γ)側設置有105g、i〇5h,於(_γ)側設置有1〇5i、 l〇5j,且與基板貨之與χ軸方向平行之兩邊相接。相對於 搬送方向而與後端之基板W之一邊相接的對準處理銷 105e ' 105f係在滾子輸送機3〇與移載單元6之邊界上沿γ轴 I46775.doc -16· 201039928 方向配置而且’相對於搬送方向而與前端之基板w之一 邊相接的對準處理㈣5e、㈣係設置於與對準處理銷 l〇5c、l〇5d相合之較大的凹部内,且沿¥軸方向而設置, 上述凹部形成於較人口懸浮平台1()上位於停止位置之基板 歡前端的—邊更靠近下游侧之人口懸浮平台10上。上述 的與平仃於γ軸方向之基板w之前端WE及後端之兩邊相接 的對準處理銷105c〜105f,在通常之搬送基板時,為了不 妨礙基板搬送而退避至滾子輸送機30與移載單元6之邊 界、且形成於人D懸浮平台1()上之凹部之下方。該等於進 饤對準處理時,因對準處理銷油缸(未圖示)之動作而於基 板搬送路徑之上方伸長至可與基板w抵接之位置,且與基 板W抵接之最上端之部分因會在基板方向上改變位置,故 而會與基板W之平行於丫轴方向之兩邊相接。如此一來, 基板W藉由设置於共計8處之各對準處理銷i〇5c〜i〇5f之動 作而被定位於正確的停止位置。 <•塗佈平台4> 二於入σ懸浮平台1G之下游存在塗佈平台4。於該塗佈平 上,自狹縫喷嘴55對基板w塗佈抗蝕液作為處理液。 該塗佈平台4與人口懸浮平台_樣地,於平台表面分 布形成有多數之小孔。惟在人σ m浮平㈣上小孔僅進 行:氣之喷出,而在塗佈平台4上,亦形成有不僅用於嘴 出空氣、亦用於抽吸空氣之小孔。亦即,如圖8所示,存 在於塗佈平台4上之多數之小孔(氣體孔)係分類為壓縮空氣 之噴出孔40a、41a與抽吸孔40b、411^如此進行空氣之噴 146775.doc •17- 201039928 出及抽吸,從而自喷出孔4〇a、41a噴出至平台面上之壓縮 空氣之空氣流在向水平方向擴散後,自與該等噴出孔 40a、41a鄰接之抽吸孔4〇b、41b被抽吸,懸浮之基板w與 塗佈平台4上表面之間的空氣層(壓力氣體層)中之壓力平衡 變得更加穩定。 該塗佈平台4被分為2部分,圖8係被分為2部分之塗佈平 台4之俯視圖。 對於停止於入口懸浮平台1〇上之基板w,一邊藉由基板 搬送夾盤8而抽吸保持其側端部,一邊於(+χ)方向被搬送 並暫時停止於塗佈平台4上。將該停止之基板w之前端we 之正下方的位置作為板邊界st,於該板邊界^上,將構成 塗佈平台4之板分為2部分。將較板邊界^更位於卜χ)方向 之板作為塗佈前平台40,並將更位於(+χ)方向之板作為塗 佈後平台41。 圖9表示塗佈前平台4〇及塗佈後平台41十之空氣之供給 流路與抽吸流路。空氣之供給流路係在以調溫單元2〇2而 使被壓縮機等壓縮機構201壓縮後的空氣達到特定之溫度 後,分支為塗佈前平台40與塗佈後平台41各自之流路。藉 由調溫單元2 0 2而將空氣設定為特定之溫度係為了與外部 氣溫無關地將空氣保持為一定之溫度狀態。分支後之空氣 在各自之流路中通過過濾器12、22而得以淨化,在經針閥 (needle valVe)13、23調節壓力之後,通過流量計14、24、 壓力计15 25軋動閥16、26後,自塗佈前平台4〇及塗佈 後平台41中之噴出孔4〇a及4la而噴出。空氣供給之開始及 146775.doc •18· 201039928 #止係藉由來自控制部7(圖3)之指令訊號而開閉氣動閥 16、26來執行。控制部7亦進行壓縮空氣之壓力控制。 Ο(3) Supporting the form conversion interval: TB is set between the above two types of intervals TA, (TC i, TC2). The support form conversion interval TB is used to convert the substrate between the contact support interval TA and the suspension support interval. The range of support methods. From the viewpoint of the substrate transfer method and the support form of the substrate, the 'support form conversion interval 邛 is in the "roller transfer method" of the "contact transfer method" in the contact support section TA, and the suspension support sections TC1, TC2. The section of the transfer method of the substrate is switched between the "suspension transfer method". The wide system shows the relationship between the control unit 7 and the month & control unit mainly controlled by the control unit 7. The control unit 7 is configured to use the electric chest in the brain. The control unit 7 controls the device according to the program of the women's clothing in the electric system, the characteristic data of each part of the device, and the order of the recipe (recipe). (4) The functions of each part of the control object will be described in the relevant parts of 146775.doc 201039928. <2_Composition of each part><•Roller Conveyor 30> The roller conveyor 30 is a contact type conveying device that abuts the uppermost surface of the outer peripheral surface of the plurality of rotating rollers 301 against the lower surface of the substrate buttocks to impart a propulsive force to the substrate W. Moving in the downstream direction, the motor 35 as the drive source, the one rotating shaft 302, and the adjacent rotating shafts 3〇2 are arranged with the timing belt 32 (see FIG. 6), so that they can be identical. The timings give the same rotational speed to each of the rotating shafts 302. Unlike the rollers 601 of the transfer unit 6 to be described later, the plurality of rollers 3〇1 are fixed at two degrees to form a roll in contact with the lower surface of the substrate. Subgroup. In the case of 30, a deceleration sensor (not shown) is provided at one of both end portions parallel to the X-axis direction, and a stop is provided on the downstream side of the transport direction of the substrate W from the installation position of the deceleration sensor. The sensor (not shown). The front end WE (refer to FIG. 12) of the substrate W that is transported is detected by the deceleration sense, whereby the rotation speed of the roller 301 is decelerated, and the sensor is detected by the stop sensor. The front end WE stops the rotation of the roller 3〇1. Thus, the impact applied to the substrate w can be minimized by reducing the speed of the substrate transported beforehand, and then the substrate w can be stopped. * Transfer unit 6> A transfer order is provided on the downstream side of the roller conveyor 30. The transfer unit 6 is disposed in the space between the roller conveyor 3 () and the inlet suspension platform (7), and includes The suspension pad 64 and the transfer lifting roller conveyor 6〇. The suspension 塾 64 is configured to eject compressed air from the upper surface of the substrate w to the lower surface of the substrate w. 146775.doc 12 201039928 For example, air is ejected to make the substrate float, in a non-contact state. To support the suspension mechanism of the substrate w. The suspension pad 64 is composed of A rectangular shape is provided which is disposed on the upper surface by a plurality of discharge holes 64a (see FIG. 12) for ejecting air, and the upper surface thereof is a gas nozzle surface. The air is ejected from the ejection holes. The 64 series is provided with a plurality of predetermined intervals along the γ-axis direction so that the longitudinal direction thereof is parallel to the substrate transfer direction. The plurality of suspension 塾 64 collective systems function as a substrate floating platform, and each suspension pad 64 is a unit suspension unit of the constituent elements. In the gap between the suspension mats 64 arranged at a predetermined interval, the roller group of the roller 6 including the plurality of rollers 6 of the lifting roller conveyor 60 is transferred. The rotation direction of the uppermost peripheral surface of each roller 601 is parallel to the longitudinal direction of the suspension pad 64, and the rotation shaft 602 penetrates the rotation center of the roller 6〇1. As shown in FIG. 4 and FIG. 5, which will be described later, the suspension pad 64 is present above the rotating shaft 602. The rotating shaft 602 is arranged substantially horizontally and passes through a plurality of rolls in a manner orthogonal to the Q length direction of the floating pad 64. The center of rotation of the child 601. The driving of the roller 601 and the rotating shaft 6〇2 is similar to that of the roller conveyor 3A. The motor 65 as a driving source and the one rotating shaft 6〇2 are further horizontally adjacent to each other. Since the timing belt 62 (see FIG. 6) is placed between the two, the same rotational speed can be given to each of the rotating shafts 6〇2 constituting the transfer lifting roller conveyor 60 at the same timing. Below the rotating shaft 602 of each roller 601, for example, a cylinder-like elevating mechanism 66 (see Fig. 4) is provided, and the elevating mechanism 66 and the rotating shaft 602 of each roller 601 are coupled via a member. Therefore, the transfer lifting roller conveyor 60 is held in a substantially water direction while being engaged with the 146775.doc -13-201039928 of the lifting mechanism 66. The ZZ cross-section of the transfer unit 6 when the Z-axis diagram 4 series transfer lifting roller conveyor 60 ascends ascends 6^z 2 γ surface ^ 2 5 series transfer lifting roller conveyor 6G descending . As shown in Fig. 4, the position of the roller 6〇1 when rising is the position at which the uppermost surface of the outer peripheral surface is in contact with the height of the substrate w by the self-ejection hole (4) and the empty milk. Higher position. X, as shown in Fig. 5, when descending, the uppermost portion of the outer peripheral surface of the roller 601 is lowered to a position lower than the upper surface of the hand pad 64. At the time of ascending, similarly to the roller conveyor 3, the outermost surface of the outer peripheral surface of the rotating roller is attached to the lower surface of the substrate W to impart a propulsive force to the substrate w, and the substrate % is moved in the downstream direction. The transfer lift roller conveyor 6G is rotated in an ascending state, whereby the substrate W is transported from the roller conveyor 3 to the human levitation platform. When the substrate W passes the roller conveyor 3G, the transfer lift roller conveyor 6q is lowered to the upper surface of the rudder pad 64. The support of the substrate w by the & 'transfer unit 6 only becomes the levitation force of the suspension pad 64, and cooperates with the suspension force on the inlet suspension platform 10 to suspend the substrate W, thereby converting to a lower mechanism such as a roller. Contact status. The length of the transfer direction (+χ direction) of the transfer unit 6, that is, the length of the support form change interval TB in the transfer unit 6 is shorter than the length of the substrate w in the transfer direction. In other words, the transfer direction (+χ direction) In the apparatus 1 for processing the substrate w of a specific length, the transport direction (+Χ direction) of the transfer unit 6 is 146775.doc -14· 201039928, so that the total length of the substrate processing line can be shortened to be shorter than the The specific length is long. Ο 〇 - Fig. 6 is a side view of the roller conveyor 3 〇 and the transfer unit 6. As shown in Fig. 6, the roller conveyor 30 is adjacent to the transfer unit 6 but is not connected. In the meantime, the material transporting support frame wood 69 looks like a joint when viewed from the side, but in fact, it is not connected to the top view of the ride. Therefore, the vibration generated by the roller driving of the roller conveyor 30 is not transmitted to the downstream side by the transfer unit 6. As a result, in the processing liquid coating process described later, it is possible to prevent useless vibration. Uneven coating produced. <*Inlet suspension platform 1 〇> An inlet suspension platform 1G is disposed on the downstream side of the transfer unit 6. The inlet w is floated on the σ 10 and distributed over the entire surface of the plate-like deck surface to form a plurality of air ejection orifices. The gas generated by the ejection of the air repeatedly suspends the substrate W, and the substrate w can be brought into a non-contact state with respect to the upper surface of the inlet σ 10 , that is, with respect to the gas ejection surface. At this time, the suspension height of the substrate W is 10 to 500 μm. The above-mentioned substrate suspension principle of the inlet suspension platform 10 is the same as the parallel arrangement of the suspension cassettes 64 of the transfer unit 6. As shown in Fig. 12, on the substrate transfer path of the substrate processing apparatus, relatively Guide rollers 102p to 102s are provided on the outer side of the substrate w in which the transfer direction of the substrate W is parallel (hereinafter referred to as "side position"). (+γ) of the transfer unit 6 The side is provided with a guide ι〇2ρ, and a guide stick 102r is placed on the (-Υ) side, and a 146775.doc -15-201039928 is placed on the (+γ) side of the inlet suspension platform 1 with a guide roller 102q '( -Y) side is provided with light guide i〇2s. When the stage 1 is transported by the substrate w, the guide rollers 丨02p to 丨02s are located at the retracted position (the position separated from the line corresponding to the movement trajectory of the side of the substrate W), but when the substrate is transported, A guide roller cylinder (not shown) mounted on the guide roller 1〇2p to 1〇2s, so that both sides of the substrate W parallel to the transport direction are squeezed from both sides toward the center line of the substrate W parallel to the X-axis The pressure rollers are in contact with each other. The guide rollers 102P to 102s are disposed such that their rotation axes are parallel to the z-axis, whereby when the transfer unit 6 is transferred to the inlet suspension platform 10, the roller conveyor 30 and the transfer lifting roller can be used. The propulsion force given by the rotation of the roller 6〇1 of the sub-conveyor 6 is transmitted only in the conveyance direction, so that the lateral shift of the substrate W can be prevented. A deceleration sensor (not shown) and a stop sensor (not shown) are provided in the same manner as the roller conveyor 30 in the one end portion of the inlet suspension platform 1 which is parallel to the X-axis direction. The conveyance speed of the substrate W is decelerated, and the conveyance of the substrate W can be stopped at a specific stop position on the inlet overhanging platform 10. As shown in FIG. 15, alignment processing pins (7) 氕 丨〇 f 5f for aligning the substrate w stopped by the stop sensor of the inlet floating platform 1 are provided in the transfer unit 6 and the inlet. The suspension platform is surrounded by 1 inch. Specifically, the alignment processing pins 105g to 105j that are in contact with both sides of the substrate w parallel to the X-axis direction are disposed on the (+γ) side at the lateral position of the transfer unit 6 and the inlet suspension stage 1〇. There are 105g, i〇5h, and 1〇5i, l〇5j are arranged on the (_γ) side, and they are connected to both sides of the substrate which are parallel to the axis direction. The alignment processing pin 105e '105f which is in contact with one side of the substrate W at the rear end with respect to the conveying direction is on the boundary of the roller conveyor 3〇 and the transfer unit 6 along the γ axis I46775.doc -16· 201039928 The alignment process (4) 5e and (4) which are arranged to be in contact with one side of the substrate w of the front end with respect to the conveyance direction are provided in a large concave portion which is aligned with the alignment processing pins 10a, 5c, and 10d, and is along the ¥ Provided in the axial direction, the concave portion is formed on the population floating platform 10 on the downstream side of the front side of the substrate at the stop position on the floating platform 1(). The alignment processing pins 105c to 105f that are in contact with the two sides of the front end WE and the rear end of the substrate w in the γ-axis direction are retracted to the roller conveyor so as not to hinder the substrate conveyance when the substrate is normally transferred. 30 is at the boundary with the transfer unit 6 and is formed below the recess on the person D suspension platform 1 (). When this is equal to the advance alignment process, the alignment process pin cylinder (not shown) is extended above the substrate transfer path to a position where it can abut against the substrate w, and the uppermost end of the substrate W is abutted. In part, the position is changed in the direction of the substrate, so that it is in contact with both sides of the substrate W parallel to the x-axis direction. In this manner, the substrate W is positioned at the correct stop position by the operation of the alignment processing pins i〇5c to i〇5f provided at a total of eight places. <•Coating Platform 4> The coating platform 4 is present downstream of the σ suspension platform 1G. On the coating, the resist liquid is applied to the substrate w from the slit nozzle 55 as a processing liquid. The coating platform 4 and the population suspension platform have a plurality of small holes formed in the surface of the platform. However, in the case where the person σ m floats (four), the small hole is only made: the gas is ejected, and on the coating platform 4, a small hole for not only the air for the mouth but also for sucking the air is formed. That is, as shown in FIG. 8, a plurality of small holes (gas holes) existing on the coating platform 4 are classified into compressed air discharge holes 40a, 41a and suction holes 40b, 411, and thus air spray 146775 .doc •17- 201039928 The suction and the suction, so that the air flow of the compressed air ejected from the ejection holes 4〇a, 41a onto the deck surface is diffused in the horizontal direction, adjacent to the ejection holes 40a, 41a The suction holes 4〇b, 41b are sucked, and the pressure balance in the air layer (pressure gas layer) between the suspended substrate w and the upper surface of the coating stage 4 becomes more stable. The coating stage 4 is divided into two parts, and Fig. 8 is a plan view of the coating stage 4 divided into two parts. The substrate w stopped on the inlet floating platform 1 is sucked and held by the substrate transfer chuck 8, and is conveyed in the (+χ) direction and temporarily stopped on the coating stage 4. The position immediately below the front end we of the stopped substrate w is defined as the board boundary st, and the board constituting the coating stage 4 is divided into two parts on the board boundary. The plate in the direction of the plate boundary is used as the pre-coating platform 40, and the plate in the (+χ) direction is used as the post-coating platform 41. Fig. 9 shows the supply flow path and the suction flow path of the air before the application of the platform 4〇 and the coated platform 41. The air supply flow path is set to a specific temperature by the temperature control unit 2〇2 and the air compressed by the compression mechanism 201 such as a compressor reaches a specific temperature, and then branched into a flow path of each of the pre-application stage 40 and the post-application stage 41. . The air is set to a specific temperature by the temperature adjustment unit 220, in order to maintain the air at a constant temperature state irrespective of the outside air temperature. The branched air is purified by the filters 12, 22 in the respective flow paths, and after the pressure is adjusted via the needle valves 13 and 23, the valves 16 are rolled by the flow meters 14, 24 and the pressure gauge 15 25 After 26, the discharge holes 4〇a and 4la in the front stage 4涂布 and the coated stage 41 are ejected. The start of the air supply and the 146775.doc •18· 201039928 #stop is performed by opening and closing the pneumatic valves 16 and 26 by the command signal from the control unit 7 (Fig. 3). The control unit 7 also performs pressure control of the compressed air. Ο

空氣之抽吸中,使用鼓風機18、28作為抽吸機構,驅動 馬達(未圖示)受到反相控制。在來自設置於塗佈前平台 及塗佈後平台41上之抽吸孔4〇b及41b之抽吸流路中,設置 有壓力計17、27,可測定抽吸流路中之壓力。又,於抽吸 流路中設置有泄放閥19、29。因此,在抽吸流路内之壓力 較由鼓風機18、28之旋轉所獲得之抽吸壓力更高時,可將 抽吸流路内之空氣自泄放閥19、29排放至外部,藉此進行 用以將抽吸流路内之壓力保持為一定之微調整。 作為空氣供給機構之壓縮機構201為is,藉由分支而可 針對每個平台分配流路。另—方面,作為抽吸機構之鼓風 機18、28係針對各平台中之每個抽吸流路而設置。 如此,塗佈平台4被分為2個,且内部之流路在塗佈前平 台㈣塗佈後平台辦被分割,故可針對每個平台來調節 空軋之喷出與抽吸。亦即’可各別地控制2個平台4〇、“ 中之壓力氣體層(空氣流),不僅可使壓縮空氣之喷出盘抽 吸之雙方同時進行,亦可僅對其中—方暫時停止^氣之喷 :如,在欲使塗佈後平台41之空氣之噴出及抽吸單獨停 止時,對於噴出,使氣動闕26全部關閉,對於插吸,使二 :支風^8之驅動馬達(未圖示)連接之反相器(未停 :作=實現上述的單獨控制。氣動閥26或上述反相器 作為控制用以形成壓力氣體層之空氣流之氣體流控制機 146775.doc •19· 201039928 構而發揮功能。 &lt;*喷嘴單元5&gt; 噴嘴單元5、ϋ嘴洗淨等待軍 圖ίο係基板搬送夾盤8 元9之YZ剖面圖。 對基板W之表面塗佈抗餘 羊心4之卜古 貝馮皁兀5係设置於塗佈 且具有圖10所示之橋接結構。該種橋接姓 例如將碳纖維增強樹脂作為骨材之喷嘴支持Γ: 支U端而使其升降之升降機構所構成。於噴嘴支持部 上設置有狹縫噴嘴55。該狹縫噴嘴㈣自形狀其下端: 狹缝狀的嘴出口 55a朝基板w之上表面喷出由處理液供认 機構(未圖示)所供給之抗㈣。該噴出口…相對於塗佈平 台4為大致水平,且沿Y軸方向而延伸。 噴嘴之升降機構係設置於噴嘴支持部之兩端主要係由 作為驅動源之飼服馬達59及滚珠螺桿58而構成。藉由該飼 服馬達59,噴嘴支持部沿著在相ϋ於塗佈平台4之船垂方 &quot;L伸之滾珠螺桿5 8而受到升降驅動,狹縫噴嘴5 5之噴 出口 55a與基板w之間隔得到調節。 於垓升降機構中,在基板搬送路徑之兩端(-Y側、+Y側) /、土板不相接之位置上,沿χ軸方向設置有喷嘴單元行進 導引器51。 2個噴嘴單70線性馬達(-Y側、+Y侧)各自之固定片係在 本體裝置之Y軸方向之側面沿χ軸方向而設置,各自之移 動片係被IU設於升降機構之外側。在該等固定片與移動片 之間所產生之磁相互作用下,噴嘴單元5沿噴嘴單元行進 146775.doc •20· 201039928 導引is 51而移動。 關於2個噴嘴單兀線性標度尺52,亦分別設置於本體裝 置之兩端(-Y側、+Y#J)。該喷嘴單元線性標度践係檢測 .喷嘴單元5之移動位置’因此控制部7可根據該檢測結果而 控㈣嘴單元線性馬達53之職,控㈣嘴單元轴方 向上之移動,亦即控制狹縫喷嘴55對於基板表面之掃描。 於進行塗佈處理時,在自狹縫噴嘴55 〇 ^液之狀態下,使基板搬送夾盤8保持基板w之兩= 於(+X)軸方向以特定之速度進行水平移動。 基板搬送夾盤8係用以保持下表面為非接觸狀態之基板 W之邊緣並向下游方向搬送基板|之裝置。於原點狀態 下,基板搬送夾盤8位於橫跨懸浮墊64與入口懸浮平台ι〇 而停止的基板W之平行於X轴方向之兩端部的正下方。亦 即,為移載單元6與入口懸浮平台1〇位於夾持基板w之位 置之内側的結構。 〇 如圖1等所示,基板搬送夾盤8沿基板搬送路徑,不僅向 入口懸浮平台丨〇、塗佈平台4及出口懸浮平台11之兩側 P而且向移載單元6之兩側部延伸。又,藉由基板搬送 夾盤8而搬送基板w之搬送速度、藉由滾子輸送機3〇之各 滾子301之故轉而搬送基板的基板搬送速度、及藉由處於 上升狀態之移載單元6之各滾子601之旋轉而搬送基板的基 板搬送速度為相同速度,且被統一為特定的基準速度。其 中’此處所謂的「搬送速度」係規定為除搬送開始及結束 時之加減速期間以外的穩態速度區間之速度。藉此,於使 146775.doc -21 - 201039928 先後複數之基板在裝置1内同時移動之期間内,為防止基 板彼此碰撞’使基板間無多餘間隔即可。 如圖10所示,基板搬送夾盤8成為左右對稱(在+γ側與_γ 側對稱)結構’於左右分別包含:吸附保持基板貿之夾盤部 88 ;用以於X軸方向移動之搬送夾盤行進導引器81 ;產生 用於上述移動之驅動力的搬送炎盤線性馬達8 3 ;及用以檢 測基板W之位置的搬送夾盤線性標度尺82。 如圖4、圖5所示,夾盤部88可藉由夾盤升降油缸85之動 作而升降。由於夾盤部88上升,使得+γ側、_¥側之基板w 之兩端部之下表面受到支持並被吸附保持。 於該夾盤部88之下方’在基板搬送路徑之兩端(_γ側、 +Υ側),較喷嘴單元行進導引器5 1更靠内側之位置上,沿 X軸方向設置有搬送夾盤行進導引器81。 2個搬送夾盤線性馬達(_γ側、+Υ側)各自之固定片係在 基板處理裝置1之Υ轴方向上之最内側的側面沿X軸方向而 設置。各自之移動片係被固設於基板搬送夾盤8上。在該 等固定片與移動片之間所產生之磁相互作用下,基板搬送 夾盤8沿搬送夾盤行進導引器81而移動。 關於2個搬送夾盤線性標度尺82,亦分別設置於基板處 理裝置1之兩端(-Υ側、+γ侧)。該搬送夾盤線性標度尺82 係檢測基板搬送夾盤8之移動位置,因此控制部7可根據該 檢測結果而進行基板位置之控制。 噴嘴洗淨等待單元9係在狹縫噴嘴55對基板W之表面進 行塗佈處理之後,洗淨被抗蝕液污染之喷嘴前端,並用以 146775.doc -22- 201039928 2接下來的塗佈處理而調整狹縫喷嘴55之喷出口 55a之狀 態的裝置。因此,其包含成為來自狹縫喷嘴55之抗蚀液之 喷出對象的大致圓筒狀之輥95。 如圖10所示,該喷嘴洗淨等待單元9係沿X轴方向而設置 於較基板搬送路徑更外侧且較喷嘴單元5更内側之位置 上。於嘴嘴洗淨等待單元9中,亦於左右(_γ側、+γ側)分 別包含··噴嘴洗淨等待單元行進導引器91、喷嘴洗淨等待 〇 單元線性馬達93、及喷嘴洗淨等待單元線性標度尺92。 沿Υ軸方向觀察時’喷嘴洗淨等待單元行料引器91係 位於喷紫單元行進導引!151與搬送夾盤行進導引器81之 1且/σ X轴方向而设置於基板搬送路徑之兩端(_γ側、 +Υ側)。 設置於兩端(-丫側、作側)之喷嘴洗淨等待單元之2個線 !·生馬達93中’各自之固定片係在基板處理裝置!之丫轴方向 之内侧的侧面沿X軸方向而設置。又,各自之移動片係被 〇 @設於噴嘴洗淨等待單元9上。在該等㈣片與移動片之 間所產生之磁相互作用下,噴嘴洗淨等待單元9沿喷嘴洗 淨等待單元行進導引器91而移動。 關於2個喷嘴洗淨等待單元線性標度尺%,亦分別設置 於基板處理裝置1之兩端(_γ側、+γ側)。該噴嘴洗淨等待 早兀線性標度尺92係檢測噴嘴洗淨等待單元9之移動位 置,因此控制部7可根據該檢測結果而控制喷嘴 單元9之位置。 寺待 該喷嘴洗淨等待單元9中,主要包含輥 146775.doc -23- 201039928 1及輥槽崎。於該洗淨單元99巾,對塗佈處理後之狹 95外^ Η之喷出口…進行洗淨。在使狹縫噴嘴55接近輥 +周面之狀態下自喷出口 55a噴出-定的抗蝕液後,於 贺出口 55a會形成抗钱液之儲液。如此在嘴出口…均勾地 形成有儲液後’可高精度地進行其後之塗佈處理。如此一 /狹縫嗔嘴55之喷出口 55a被初始化(以下稱為「預嘴 出」)’ ϋ包含於接下來的塗佈處理中。輥%之旋轉係藉 由輥旋轉馬達98之驅動*進行^於輥95旋轉時將下端浸潰 於輥槽96内所儲存之洗淨液中,藉此去除附著於輥%上之 抗飯液。 如圖18所示,於噴嘴單元5之狹縫噴嘴”上,安裝有用 以保護噴嘴前端之保護構件57。其係在喷嘴單^婦描基 板表面夺-基板上存在異物的情況下,用以抑制噴嘴前 端與異物接觸而可能導致狹縫噴嘴55破損。因&amp; ,當狹縫 噴嘴55對基板上進行掃描時,在較噴嘴前端更先進入至基 板w之位置處安裴板狀之保護構件57,以使板面相對於基 板面而正父,且使板之下表面位於較狹縫噴嘴55之前端更 罪下方。當存在異物時,該異物會與保護構件57接觸而產 生振動,且該振動可傳遞至狹縫噴嘴55。於狹縫喷嘴55 上,設置有用以檢測振動之振動感測器55S,且所檢測到 之電氣訊號被輸入至控制部7,藉此瞭解異物之存在,從 而強制性地停止狹縫喷嘴5 5之掃描。 又,於狹縫喷嘴55上,在水平方向使基板w與狹縫喷嘴 55進行相對移動時,在較保護構件57更先進入至基板w上 146775.doc -24- 201039928 方區域之位置處,設置有用以非接觸地檢測出基板w之懸 浮高度之懸浮高度檢測感測器58。藉由該懸浮高度檢測感 測器58而可測定懸浮之基板W與塗佈平台4上表面之間隔 . 距離,並隨著該檢測值,經由控制部7而可調整狹縫喷嘴 5 5下降之位置。作為檢測感測器5 8,可使用光學式感測器 或超音波式感測器等。 如圖8及圖9所說明,塗佈平台4被分為2部分,可在各自 ❹ 之平台上各別地調節空氣之供給流路與抽吸流路。因此, 在基板W之前端WE朝塗佈前平台4〇之正上方移動之階 段,可維持該塗佈前平台4〇上之空氣之喷出抽吸,並且 對於在該階段基板W尚未到達上方之區域之塗佈後平台 41,可停止該塗佈後平台41上之空氣之喷出與抽吸。因 此,在喷嘴正下方不存在基板w之狀態下,即便使狹縫喷 觜55下降至塗佈開始高度,亦可防止由於該區域(塗佈後 平台4丨之存在區域)中之空氣之噴出與抽吸而導致的狹縫 〇 喷嘴55之噴出口 之處理液乾燥。因此,可防止由於噴 嘴前端之處理液之一部分乾燥而導致的處理液喷出不良, 從而可防止基板W之塗佈不良。 又,由於狹縫噴嘴55下降後可於水平方向對基板w進行 掃描,故最初進入至基板前端㈣之噴嘴高度檢測感測器 58可檢測出狹縫喷嘴55開始塗佈之基板之前端侧之實際 的正確的懸浮高度。因此,噴嘴單元5可對狹縫喷嘴“之 下降高度進行微調整,並且可使狹縫噴嘴55之喷出口 55&amp; 之高度對應於實際上進行塗佈處理時之嘴嘴前端與基板表 146775.doc -25- 201039928 面之特定間隔而進入至基板之前端WE,使喷嘴前端到達 塗佈開始位置SP〇通常,該塗佈開始位置sp係較基板之前 端WE稍罪近基板w中央側之位置,但亦可係與基板之前 端WE大致相同的位置。又,由於狹縫噴嘴”可自基板貨 之端部開始掃描,因此對於基板整個面上之異物,可藉由 保護構件57與振動感測器55S而進行異物之檢測。 一於塗佈平台4之下游設置有* 口懸浮平台11。該* 口懸 浮平台11上,與入口懸浮平台1〇同樣地形成有用以喷出氣 體之喷出孔11a,進而’以與基板w之整個面對向之方 弋牙過噴出孔11 a之間隙並隔開特定間隔地配置有提昇 銷U5。提昇銷U 5藉由設置於出口懸浮平台u下方之提昇 銷升降機構(未圖示)而於鉛垂方向(z軸方向)得以升降驅 動。於下降時,提昇銷H5之前端下降至出口懸浮平台u 之上表面以下,於上升時,提昇銷115之前端上升至將基 板父付至移載機械手36之位置為止。由於提昇銷115上 升,使得基板w之下表面受到支持而被提昇,因此基板w 自出口懸浮平.台u之上表面剝離。設置於出口懸浮平台Η 下游之移载機械手36於提昇銷115之間插入有移載叉,自 提昇銷115進行基板W之交接。 &lt;3.基板處理裝置之動作&gt; 其次,對基板處理裝置丨之基本動作之流程進行說明。 圖11係與基板w之處理狀況相應的主要功能部之動作之 時序圖。該時序圖表示在基板w受到連續處理之狀況下各 裝置之功能部之連動的情形。 146775.doc -26- 201039928 時序圖中之步驟分為(A)至(E)該5步驟。 •第1階段=(A)至(B): .使基板W0停止於塗佈開始位置sp而開始進行塗佈處 理為止的步驟; 將下處理預定之基板w自停止於滾子輸送機30之停 止位置之狀態起開始向移載單元6搬送為止的步驟。 •第2階段=(B)至(〇 : 〇 •對基板W0進行塗佈處理時之步驟; .將基板W轉置於入口懸浮平台1〇為止的步驟。 •第3階段=(〇至(D): 對基板wo之塗佈處理結束而停止於出口懸浮平台】i 為止的步驟; .對基板W進行對準處理之步驟。 •第4階段=(D)至(E): •將基板W0搬送至下游側之裝置之步驟; 〇 •對基板w進行對準處理後保持該狀態而進行塗佈處 理之準備步驟。 •第5階段= (E)至(A): •相當於將基板贾移動至塗佈開始位置卯為止的步 驟; .滾子輸送機30將進行下一處理之基板搬入至停止位 置為止。 以下具體地說明該等基板處理裝置丨之動作,為了說明 基板W相對於基板處理裝置丨而被搬入、搬出之情形,重 146775.doc -27- 201039928 複2人執仃圖11中之步驟(A)至⑻,以便容易理解。於第1 通期中,圖11中附有右上斜影線之基板机相當於注視美 板W ’於第2週期中,附有右下斜影線之基板叫目當於注 視基板W。 、 &lt;3-1·第 1次:階段(A)〜(B)&gt; 圖12係表示以滾子輸送機3G來搬送基板W之情形之俯視 圖。其中’除該圖12以外,圖13、圖15、圖17、圖23、圖 中為方便圖示,並未描繪出較所注視之基板W更領先之 基板。 :11及圖12中’於上游單元中經處理之基板W被轉移至 固定式之滾子輸送機3〇上,以便搬送至下游步驟。由該滾 子輸送機30之旋轉而使基板w之下表面與滾子之外周面: 最上部相接,因此基板W朝(+χ)方向被賦予推進力,並朝 下游方向被搬送。在滾子輸送機3〇之與χ軸方向平行之兩 端。Ρ的#,設置有減速感測器與停止感測器。若減速感 測器檢測到被搬送之基板w之前端WE,則滾子輸送㈣ 之旋轉速度將減速,從而基板胃之搬送速度變慢。而且, 右=止感_器檢測到基板w之前端WE,則滾子輸送機Μ 之旋轉將停止,從而停止基板W之搬送。 於步驟(B)之前,滾子輸送機30重新開始旋轉。此時, 移載升降滾子輸送機60成上升狀態,於步驟(B)中,滾子 輸送機3G與移載升降滾子輸送機6()為了搬送基板w而同時 進行旋轉驅動。於圖丨丨中,第丨週期中與該階段之噴嘴相 關之動作係關於對領先之基板Wa塗佈處理液者,因此與 146775.doc 201039928 對注視基板w之處理無關。 &lt;3-2·第1次:第2階段(B)〜(c)&gt; 圖13係表示基板W通過耗單元6而被搬人至人口懸浮 •+台之情形的俯視圖。圖14係表示基板w通過移載單元 . 6而被搬人至人口懸浮平台1G之情形的XZ剖面圖。 如圖叫示’空氣處於自移載單元6之懸浮㈣不斷喷 出之狀’於步驟(B)〜(c)之期間,移載升降滾子輸送機 ❹6G存在於上升位置。滾子輸送機3績移載升降滚子輸送機 6〇係以相同的旋轉速度旋轉,將基板W搬送至設置於移载 单以下游之入口懸浮平台1〇上。圖u中未表示入口懸 '序平台1〇之空氣亦處於不斷喷出之狀態。因此,基板” 之進入至入口懸浮平台10之部分係以懸浮於入口懸浮平台 10上之狀態而行進。 口 此時,設置於移載單元6與入口懸浮平台ι〇之側方之導 輥1〇2ρ〜進出,並與基板1之平行於χ軸方向之兩邊抵 ❹接。基板W之平行於又軸方向之兩邊受到導輥i〇2p〜i〇2k 擠壓,因此基板W於橫穿基板搬送路徑之方向上之位置受 到限制,故不會朝該方向偏移而是被搬送至下游方向。如 此-來,由於存在導輥1〇2p〜1〇2s,故傳遞至基板以之推 進力藉由滾子輪送機30與移載升降滾子輪送機的而全部一 致地朝向下游方向,從而可防止基板w偏移。 此時,滾子輸送機30與移載單元6作為各別的裝置而完 全刀開(即在工間上非接觸),故滾子輸送機%之振動不 會傳遞至移載單元6。因此,可防止因無用之振動而對領 146775.doc •29· 201039928 先的基板之塗佈處理造成惡劣影響。 於入口懸洋平台10中,與滾子輸送機3〇同樣地設置有減 速感測器與停止感測器。藉由減速感測器檢測到被搬送之 基板W之前端WE而降低移載單元6之移載升降滾子輸送機 60之旋轉速度。 於被搬送之基板W之後端已通過滾子輸送機3〇之停止感 測器之階段,停止滚子輸送機3〇之驅動。而且,基板…僅 藉由移載升降滾子輸送機6〇之驅動而被搬送至入口懸浮平 台10,直至入口懸浮平台10之停止感測器檢測到被搬送之 基板W之前端WE為止。由於被入口懸浮平台1〇之停止感 測器檢測到,故移載升降滾子輸送機6〇之旋轉停止。 再者,第1週期中之步驟(B)〜(D)中,基板搬送夾盤8之 動作係用以搬送領先的基板者,因此說明該階段之省略。 &lt;3-3.第1次:第3階段〜(D)&gt; 圖15係表示將基板w轉置於移載單元6中並停止之情形 的俯視圖。圖16係表示移載單元6下降從而基板w成為非 接觸狀態之情形的XZ剖面圖。 若將被搬送之基板W之後端完全轉置於移載單元6上, 基板W在橫跨移載單元6與入口懸浮平台1〇之狀態下停 止,則已上升的移載升降滾子輸送機6〇會下降至滾子6〇ι 之外周面之最上部較懸浮墊64之上表面更下方之位置為 止。如此一來,基板W之整個面會因懸浮墊64與入口懸浮 平台10之空氣噴出而懸浮,從而懸浮墊64或入口懸浮平台 10成為非接觸狀態。 146775.doc •30· 201039928 移載單元6較基板w之長度更短,故於移载單元6上之基 板W中i在移載升降滾子輪送機6()之上方與懸浮墊料之二 方,因氣流之溫度下降程度之不同而導致的基板w之溫度 • 不均勻性變低1此’可抑制因基板W之温度分布(溫度之 . 不均勻性)而導致的塗伟不均。 在非接觸狀態下停止的基板w之搬送方向《前後及左 右,設置有用以於特定之停止位置上進行定位之對準處理 〇 銷1〇5C〜1〇5j。在基板W之側方位置上,設置於(+Y)側之對 準處理銷105g、105h及設置於(_γ)側之對準處理銷i〇5i、 105j係藉由對準處理銷油缸(未圖示)而於水平方向朝基板 W移動,並與基板W之與X軸方向平行之兩邊相接。用於 月il後定位之對準處理銷1 05cm 05f在較基板w之搬送路徑更 下方等待,故藉由對準處理銷升降油缸之上升驅動,上述 對準處理銷l〇5c〜l〇5f上升至平台上表面與基板貿抵接之位 置為止,進而,與基板|抵接之最上端之部分藉由在基板 〇 方向上改變位置而與基板W之前端WE及後端之兩邊相 接。如此一來,基板w藉由各對準處理銷i〇5c〜1〇5j之動作 而被定位於正確的停止位置。 &lt;3-4.第1次:第4階段(D)〜(E)&gt; 基板W係藉由對準處理銷i〇5c〜1〇5j而進行對準處理。其 間’對於已搬送之前經塗佈處理之基板W〇(圖11之基板 Wa)之基板搬送炎盤8 ’停止炎盤部88之吸附,在使災盤部 88下降至較基板w〇之邊緣更低之高度的狀態下,為了進 行基板W之搬送而朝向初始位置於(_χ)方向移動。圖丨!之 146775.doc •31- 201039928 基板搬送夾盤8之動作中,標註有(_)記號之期間相當於 此。再者,基板搬送夾盤8之動作之步驟(C)等中,標註有 (+)記號之期間係基板搬送夾盤8朝(-X)方向之移動期間。 對於已進行基板W0之塗佈處理之狹縫噴嘴55,為了進 行喷嘴之洗淨與預噴出而於(+χ)方向水平移動,且朝向塗 佈後平台41之上方移動。 &lt;3-5·第1次:第5階段(E)〜(A)&gt; 圖1 7係表示基板W於塗佈開始位置SP上停止,且下一處 理預疋之基板W1存在於滚子輸送機3〇之停止位置之情形 的俯視圖。 朝(-X)方向移動之基板搬送夾盤8係在藉由對準處理銷 105c〜105f而被正確地定位並已停止之基板w之與搬送方向 平行的基板W之兩端之兩邊下方的位置上停止。而且,基 板搬送夹盤8藉由夾盤升降油缸85之動作而使夾盤部88上 升並吸附於基板W下表面之兩端。如圖Γ1中所示,該用於 吸附之抽吸係在與基板W接觸之前開始。因此,基板1被 夾盤部88保持,基板搬送夾盤8朝向(+χ)方向移動,基板 W係在懸浮之狀態下被搬送至塗佈平台4。 塗佈平台4因構成該平台之板被分為2張而被分為塗佈前 平台40與塗佈後平台41。藉由基板搬送夾盤8,基板貿被 搬送至其前端WE位於該2張板之邊界線st之上方為止。 圖18係表示狹縫噴嘴55進行預喷出之情形的χζ剖面 圖。圖19係表示噴嘴洗淨等待單元9移動至退避位置之情 形的XZ剖面圖。 146775.doc -32- 201039928 噴嘴單元5係在狹缝噴嘴55存在於塗佈後平台41的上方 之位置上停止。噴嘴洗淨等待單元9根據狹縫喷嘴55之位 置而移動,進行狹縫噴嘴55之噴出口 55a之洗淨及預喷 出。藉由預喷出而使狹缝喷嘴55之前端初始化後,喷嘴洗 淨等待單元9朝向(-X)方向移動而退避。 又,與用以使基板W移動至塗佈開始位置sp之基板搬送 夹盤8之移動同步,亦驅動滚子輸送機3〇,於圖μ所示之 ❹ 上游單元中,將已進行前處理之下一處理預定之基板W1 搬送至滾子輸送機30上之停止位置為止。 &lt;3-6.第2次:第1階段(a)〜(B)&gt; 圖20係表示狹縫噴嘴55下降至塗佈開始高度之情形的 xz剖面圖。圖21係表示狹縫喷嘴55朝塗佈開始位置卯水 平移動之情形的XZ剖面圖。又,圖26中表示出圖21之部 刀放大圖,圖27所示的圖相當於狹縫喷嘴μ到達塗佈開始 位置S P而開始塗佈後平台4丨之壓縮空氣之喷出與抽吸之情 〇 形的部分放大圖。於看作第2週期之圖11中’領先之基板 Wa相當於此處所注視之基板研·。 由於噴嘴洗淨等待單元9退避,使得狹縫喷嘴55與塗佈 後平σ 41之間可空出空間。狹縫噴嘴5 5於該空間内下降至 設定之下降位置,亦即下降至塗佈開始高度為止。下降至 塗佈開始高度之狹縫噴嘴55會於(_χ)方向移動至基板臀之 前端WE附近之塗佈開始位置sp。 虽狹縫喷嘴55移動至塗佈開始位置SP時,首先由喷嘴高 度檢測感測器58進入至基板w之前端WEm塗佈開始位置 146775.doc -33- 201039928 sp。由於可藉由噴嘴高度檢測感測器58而檢測出塗佈開始 位置SP之實際懸浮咼度,因此狹縫喷嘴5 5會一面進行用以 將狹縫噴嘴55之高度設為實際塗佈高度之微調整,並於 (-X)方向移動。繼而,板形狀之保護構件57自基板之前端 WE進入而對基板表面上進行掃描。由於是從基板之前端 WE起進行掃描’故可檢測到基板整個面上之異物。此時 狹縫噴嘴55之高度與實際進行塗佈時之高度為同等之位 置。當狹縫喷嘴55到達塗佈開始位置“時,狹縫喷嘴55朝 (-X)方向之移動便停止。 在自狹縫噴嘴55開始下降起直至到達塗佈開始位置”為 止之期間,暫時停止先前為了將周圍溫度保持—定而進行 之自塗佈後平台41之喷出孔41a噴出壓縮空氣、及由抽吸 孔41b抽吸空氣。藉此,空氣流(氣體流)之形成(乃至於壓 力氣體層之形成)亦暫時停止。 即’狹縫噴嘴55自等待位置開始下降直至結束下降之下 降期間,及狹縫喷嘴55在下降結束後保持未喷出處理液之 狀態下開始水平移動直至狹縫噴嘴5 5到達基板w之塗佈開 始位置SP為止的水平移動期間之任一者,均屬於狹縫噴嘴 55未喷出處理液而移動之「空轉期間」,於該空轉期間中 之至少一部分期間内,停止在相當於狹縫喷嘴5 5之正下方 區域進行之塗佈後平台41之空氣流之形成(壓力空氣層之 形成)(設為OFF(斷開)狀態)。 較好的是,在上述下降期間中直到狹縫噴嘴55下降結束 為止,使空氣之噴出及抽吸轉為0FF狀態,並且在狹縫噴 146775.doc -34· 201039928 嘴55水平移動直到到達基板w之塗佈開始位置”為止,持 續空氣流之OFF狀態。 更好的是,將上述下降期間與上述水平移動期間兩者設 為空氣流之暫時停止期間。 上述空氣流之暫時停止之進行範圍,係包含偏離基板存 在區域之區域中的至少噴嘴正下方之區域。In the suction of air, the blowers 18 and 28 are used as the suction mechanism, and the drive motor (not shown) is subjected to the reverse phase control. In the suction flow path from the suction holes 4〇b and 41b provided on the pre-coating stage and the post-coating stage 41, pressure gauges 17, 27 are provided to measure the pressure in the suction flow path. Further, relief valves 19 and 29 are provided in the suction flow path. Therefore, when the pressure in the suction flow path is higher than the suction pressure obtained by the rotation of the blowers 18, 28, the air in the suction flow path can be discharged to the outside from the relief valves 19, 29, whereby A fine adjustment is performed to maintain the pressure in the suction flow path constant. The compression mechanism 201 as the air supply mechanism is is, and the flow path can be assigned to each platform by branching. On the other hand, the blowers 18 and 28 as the suction mechanisms are provided for each of the suction passages of the respective platforms. Thus, the coating platform 4 is divided into two, and the internal flow path is divided after the coating stage (4) is applied, so that the ejection and suction of the empty rolling can be adjusted for each stage. That is to say, 'the two pressures of the two platforms, the pressure gas layer (air flow), can be controlled separately, not only can the two sides of the compressed air pumping disc simultaneously be carried out, but only the middle side can be temporarily stopped.喷喷喷: For example, when the air ejection and suction of the platform 41 after coating is to be stopped separately, the pneumatic cymbal 26 is completely closed for the ejection, and for the insertion, the driving motor of the second: tributary wind 8 (not shown) connected inverter (not stopped: do = achieve the above separate control. Pneumatic valve 26 or the above-mentioned inverter as a gas flow controller 146775.doc that controls the flow of air to form a pressurized gas layer. 19· 201039928 Functions and functions. &lt;*Nozzle unit 5&gt; Nozzle unit 5, ϋ 洗 等待 等待 ί ί ί 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 Y Y Y Y Y Y Y Y Y Y The core 4 of the Gubeifeng saponin 5 is disposed on the coating and has the bridging structure shown in Fig. 10. The bridging name of the bridge is, for example, a carbon fiber reinforced resin as a nozzle support for the aggregate: the U end is raised and lowered A lifting mechanism is formed. A slit spray is arranged on the nozzle support portion. 55. The slit nozzle (4) is formed from the lower end of the shape: the slit-shaped nozzle outlet 55a ejects the anti-(4) supplied from the treatment liquid supply mechanism (not shown) toward the upper surface of the substrate w. The discharge port is opposed to the coating The cloth table 4 is substantially horizontal and extends in the Y-axis direction. The nozzle lifting mechanism is provided at both ends of the nozzle support portion mainly by a feeding motor 59 and a ball screw 58 as driving sources. In the motor 59, the nozzle support portion is driven to be lifted and lowered along the ball screw 58 of the ship's vertical side of the coating platform 4, and the interval between the discharge port 55a of the slit nozzle 55 and the substrate w is adjusted. In the 垓 lifting mechanism, at both ends (-Y side, +Y side) of the substrate conveying path / at a position where the soil plates are not in contact with each other, the nozzle unit traveling guide 51 is provided along the y-axis direction. Each of the fixed sheets of the nozzle unit 70 linear motor (-Y side, +Y side) is disposed on the side surface of the main body device in the Y-axis direction along the x-axis direction, and each of the moving sheets is disposed on the outer side of the elevating mechanism by the IU. The magnetic interaction between the fixed piece and the moving piece The nozzle unit 5 travels along the nozzle unit 146775.doc •20· 201039928 to guide the is 51 to move. About the two nozzles, the single linear scale 52 is also disposed at both ends of the body device (-Y side, +Y#) J). The nozzle unit linear scale is used to detect the movement position of the nozzle unit 5. Therefore, the control unit 7 can control (4) the position of the nozzle unit linear motor 53 according to the detection result, and control the movement of the nozzle unit axis direction. That is, the scanning of the surface of the substrate by the slit nozzle 55 is controlled. When the coating process is performed, the substrate transfer chuck 8 holds the substrate w in the state of the liquid from the slit nozzle 55 = (+X) The axis direction moves horizontally at a specific speed. The substrate transfer chuck 8 is a device for holding the substrate W with the lower surface in a non-contact state and transporting the substrate in the downstream direction. In the origin state, the substrate transfer chuck 8 is located immediately below the both ends of the substrate W which is stopped across the suspension pad 64 and the inlet floating stage ι. That is, the transfer unit 6 and the inlet suspension stage 1 are located inside the position where the substrate w is sandwiched. As shown in FIG. 1 and the like, the substrate transfer chuck 8 is along the substrate transfer path, and extends not only to the inlet floating platform 丨〇, the coating platform 4 and the both sides P of the outlet floating platform 11 but also to both sides of the transfer unit 6. . Moreover, the transport speed of the substrate w is transferred by the substrate transfer chuck 8, the substrate transport speed of the substrate is transferred by the rollers 301 of the roller conveyor 3, and the transfer speed is increased by the rising state. The substrate transfer speed of the substrate to be transferred by the rotation of each of the rollers 601 of the unit 6 is the same speed, and is unified to a specific reference speed. Here, the "transport speed" referred to herein is defined as the speed of the steady-state speed section other than the acceleration/deceleration period at the start and end of the transport. Therefore, in order to prevent the substrates from colliding with each other during the simultaneous movement of the substrates of 146775.doc - 21 - 201039928 in the apparatus 1, there is no unnecessary space between the substrates. As shown in FIG. 10, the substrate transfer chuck 8 is bilaterally symmetrical (symmetric on the +γ side and the _γ side). The structure includes a chuck portion 88 for adsorbing and holding the substrate, and is used for moving in the X-axis direction. The chuck guide guide 81 is transported; a transport linear motor 8 3 for generating the driving force for the above movement; and a transport chuck linear scale 82 for detecting the position of the substrate W are generated. As shown in Figs. 4 and 5, the chuck portion 88 can be raised and lowered by the action of the chuck lift cylinder 85. Since the chuck portion 88 is raised, the lower surfaces of both end portions of the substrate w on the +γ side and the _¥ side are supported and held by adsorption. Below the chuck portion 88, at the both ends (_γ side, +Υ side) of the substrate transfer path, the transfer chuck is disposed in the X-axis direction at a position further inside than the nozzle unit travel guide 51. The travel guide 81. The fixing pieces of the two transfer chuck linear motors (_γ side, +Υ side) are provided on the innermost side in the z-axis direction of the substrate processing apparatus 1 in the X-axis direction. The respective moving sheets are fixed to the substrate transfer chuck 8. The substrate transfer chuck 8 moves along the transport chuck travel guide 81 under the magnetic interaction generated between the fixed piece and the moving piece. The two transfer chuck linear scales 82 are also provided at both ends (-Υ side, + γ side) of the substrate processing apparatus 1, respectively. Since the transport chuck linear scale 82 detects the moving position of the substrate transfer chuck 8, the control unit 7 can control the substrate position based on the detection result. The nozzle cleaning waiting unit 9 washes the surface of the nozzle contaminated with the resist liquid after the slit nozzle 55 applies the surface treatment of the substrate W, and applies the coating treatment of 146775.doc -22-201039928 2 Further, a device for adjusting the state of the discharge port 55a of the slit nozzle 55 is provided. Therefore, it includes a substantially cylindrical roller 95 that serves as a discharge target of the resist liquid from the slit nozzle 55. As shown in Fig. 10, the nozzle cleaning standby unit 9 is disposed outside the substrate transport path and further inside the nozzle unit 5 in the X-axis direction. In the nozzle cleaning waiting unit 9, the nozzle cleaning standby unit travel guide 91, the nozzle cleaning wait unit linear motor 93, and the nozzle cleaning are also included in the right and left (_γ side, +γ side). Wait for the unit linear scale 92. When viewed in the direction of the Υ axis, the nozzle cleaning unit is the guide for the spray unit. 151 is provided at both ends (_γ side, + Υ side) of the substrate transport path with the transfer chuck travel guide 81 and the /σ X-axis direction. The two nozzles of the nozzle cleaning waiting unit are provided at both ends (-丫 side, the side). The respective fixed pieces of the raw motor 93 are attached to the substrate processing apparatus! The side surface on the inner side in the x-axis direction is provided along the X-axis direction. Further, the respective moving sheets are placed on the nozzle cleaning waiting unit 9. The nozzle cleaning waiting unit 9 moves along the nozzle cleaning waiting unit travel guide 91 under the magnetic interaction generated between the (four) sheets and the moving sheets. The two nozzle cleaning standby unit linear scale % are also provided at both ends (_γ side, + γ side) of the substrate processing apparatus 1, respectively. The nozzle cleaning waits early and the linear scale 92 detects the moving position of the nozzle cleaning waiting unit 9, so that the control unit 7 can control the position of the nozzle unit 9 based on the detection result. The temple is to be washed in the nozzle waiting unit 9, which mainly includes a roller 146775.doc -23-201039928 1 and a roller slot. The cleaning unit 99 wipes the spray outlets of the slits after the coating treatment. When the slit nozzle 55 is brought close to the roll + circumferential surface, a predetermined resist liquid is ejected from the discharge port 55a, and a liquid solution of the anti-money liquid is formed at the exit port 55a. Thus, after the liquid outlet is formed in the mouth outlet, the subsequent coating treatment can be performed with high precision. The discharge port 55a of the slit nozzle 55 is initialized (hereinafter referred to as "pre-mouth") ϋ in the subsequent coating process. The rotation of the roller % is performed by the driving of the roller rotation motor 98. When the roller 95 rotates, the lower end is immersed in the cleaning liquid stored in the roller groove 96, thereby removing the anti-rice liquid adhering to the roller %. . As shown in FIG. 18, a protective member 57 for protecting the tip end of the nozzle is attached to the slit nozzle of the nozzle unit 5, which is used in the case where there is a foreign matter on the substrate surface of the nozzle. Suppressing the tip end of the nozzle from contacting the foreign object may cause the slit nozzle 55 to be damaged. When the slit nozzle 55 scans the substrate, the slit nozzle 55 enters the position of the substrate w at the position closer to the substrate w. The member 57 is such that the plate surface is positively opposed to the substrate surface, and the lower surface of the plate is located below the front end of the slit nozzle 55. When foreign matter is present, the foreign matter may come into contact with the protective member 57 to generate vibration, and The vibration can be transmitted to the slit nozzle 55. On the slit nozzle 55, a vibration sensor 55S for detecting vibration is provided, and the detected electrical signal is input to the control portion 7, thereby understanding the existence of the foreign matter, Therefore, the scanning of the slit nozzles 5 is forcibly stopped. Further, when the substrate w and the slit nozzle 55 are relatively moved in the horizontal direction on the slit nozzle 55, the protective member 57 is further inserted onto the substrate w. 146775 .doc -24- 201039928 At the position of the square area, a levitation height detecting sensor 58 for detecting the levitation height of the substrate w in a non-contact manner is provided. The suspended height detecting sensor 58 can be used to measure the suspended substrate. The distance between W and the upper surface of the coating platform 4 is the distance, and the position at which the slit nozzle 55 is lowered can be adjusted via the control unit 7 with the detected value. As the detecting sensor 5 8, optical sensing can be used. Or ultrasonic sensor, etc. As illustrated in Fig. 8 and Fig. 9, the coating platform 4 is divided into two parts, and the supply flow path and the suction flow path of the air can be individually adjusted on the platforms of the respective turns. Therefore, at the stage in which the front end WE of the substrate W is moved directly above the pre-coating stage 4〇, the ejection of air on the pre-coating stage 4〇 can be maintained, and the substrate W has not yet arrived at this stage. The coated platform 41 in the upper region can stop the ejection and suction of the air on the coated platform 41. Therefore, even if the substrate w is not present directly under the nozzle, even the slit squirt 55 is lowered. To the coating start height, it can also be prevented due to the area (painting The treatment liquid of the discharge port of the slit 〇 nozzle 55 caused by the ejection and suction of air in the area where the cloth is placed in the rear of the cloth is dried. Therefore, the treatment due to the partial drying of the treatment liquid at the tip end of the nozzle can be prevented. The liquid ejection failure is good, so that the coating failure of the substrate W can be prevented. Further, since the substrate w can be scanned in the horizontal direction after the slit nozzle 55 is lowered, the nozzle height detecting sensor 58 that first enters the front end (four) of the substrate can be used. The actual correct levitation height of the front end side of the substrate on which the slit nozzle 55 starts to be applied is detected. Therefore, the nozzle unit 5 can finely adjust the lowering height of the slit nozzle and can make the ejection opening of the slit nozzle 55 The height of 55& corresponds to the front end WE of the substrate at the specific interval between the tip end of the nozzle and the substrate table 146775.doc -25-201039928 when the coating process is actually performed, so that the tip end of the nozzle reaches the coating start position SP? The coating start position sp is slightly closer to the center side of the substrate w than the front end WE of the substrate, but may be substantially the same position as the front end WE of the substrate. Further, since the slit nozzle can be scanned from the end portion of the substrate, the foreign matter can be detected by the protective member 57 and the vibration sensor 55S for the foreign matter on the entire surface of the substrate. A * port suspension platform 11 is disposed downstream of the inlet suspension platform 11. The ejection hole 11a for ejecting gas is formed in the same manner as the inlet suspension platform 1'', and is further disposed to face the entire substrate w. The lifting pin U5 is disposed at a predetermined interval between the square teeth and the gaps of the ejection holes 11a. The lifting pin U5 is vertically oriented by a lifting pin lifting mechanism (not shown) provided below the outlet floating platform u. (Z-axis direction) is driven up and down. When descending, the front end of the lifting pin H5 descends below the upper surface of the outlet floating platform u, and when rising, the front end of the lifting pin 115 rises to the parent to the transfer robot 36 Since the lifting pin 115 is raised, the lower surface of the substrate w is supported and lifted, so that the substrate w is peeled off from the upper surface of the outlet suspension plate. The transfer robot disposed downstream of the outlet floating platform Η 36, a transfer fork is inserted between the lift pins 115, and the substrate W is transferred from the lift pins 115. <3. Operation of the substrate processing apparatus> Next, the flow of the basic operation of the substrate processing apparatus will be described. 11 is a timing chart showing the operation of the main functional units corresponding to the processing state of the substrate w. This timing chart shows the interlocking of the functional units of the respective devices in the case where the substrate w is continuously processed. 146775.doc -26- 201039928 Timing The steps in the figure are divided into five steps (A) to (E). • First stage = (A) to (B): Steps before starting the coating process by stopping the substrate W0 at the application start position sp The step of starting the transfer of the predetermined substrate w from the stop position of the roller conveyor 30 to the transfer unit 6. The second stage = (B) to (〇: 〇 • to the substrate W0) The step of performing the coating treatment; the step of transferring the substrate W to the inlet suspension platform 1〇. • The third stage = (〇 to (D): the coating treatment of the substrate wo ends and stops at the exit suspension platform 】Steps until i; Aligning the substrate W • Stage 4 = (D) to (E): • The step of transporting the substrate W0 to the downstream device; • The step of performing the coating process after the substrate w is aligned and maintained in this state. Fifth stage = (E) to (A): • A step corresponding to moving the substrate to the coating start position ;; The roller conveyor 30 moves the substrate subjected to the next processing to the stop position. The operation of the substrate processing apparatus will be described, and in order to explain the case where the substrate W is carried in and out with respect to the substrate processing apparatus, the 146775.doc -27- 201039928 is repeated for two people to perform the step (A) in FIG. To (8) for easy understanding. In the first pass, the substrate machine with the upper right oblique hatching in Fig. 11 is equivalent to the gaze board W' in the second cycle, and the substrate with the right lower oblique hatching is called the viewing substrate W. &lt;3-1·First time: Stages (A) to (B)&gt; Fig. 12 is a plan view showing a state in which the substrate W is transported by the roller conveyor 3G. In addition to Fig. 12, Fig. 13, Fig. 15, Fig. 17, Fig. 23, and Fig. are diagrams for convenience of illustration, and a substrate which is more advanced than the substrate W to be observed is not depicted. The substrates W processed in the upstream unit in Fig. 11 and Fig. 12 are transferred to the fixed roller conveyor 3 to be transported to the downstream step. By the rotation of the roller conveyor 30, the lower surface of the substrate w and the outer peripheral surface of the roller are in contact with the uppermost portion. Therefore, the substrate W is biased in the (+χ) direction and transported in the downstream direction. At both ends of the roller conveyor 3 which are parallel to the direction of the x-axis. Ρ#, set with deceleration sensor and stop sensor. When the deceleration sensor detects the front end WE of the substrate w to be conveyed, the rotation speed of the roller conveyance (4) is decelerated, and the conveyance speed of the substrate stomach is slowed. Further, when the right = stop sensor detects the front end WE of the substrate w, the rotation of the roller conveyor 将 is stopped, and the conveyance of the substrate W is stopped. Prior to step (B), the roller conveyor 30 resumes rotation. At this time, the transfer lift roller conveyor 60 is raised, and in the step (B), the roller conveyor 3G and the transfer lift roller conveyor 6 () are simultaneously rotationally driven to convey the substrate w. In Fig. ,, the action associated with the nozzle of this stage in the second cycle is related to the application of the treatment liquid to the leading substrate Wa, and thus is independent of the processing of the gaze substrate w by 146775.doc 201039928. &lt;3-2·First time: Second stage (B) to (c)&gt; Fig. 13 is a plan view showing a state in which the substrate W is transported to the population by the consumption unit 6. Fig. 14 is a cross-sectional view showing the XZ of the case where the substrate w is moved to the population floating platform 1G by the transfer unit . As shown in the figure, the air is in the state of the self-transfer unit 6 (four) continuously ejected. During the steps (B) to (c), the transfer lift roller conveyor ❹6G is present in the raised position. The roller conveyor 3 is used to transfer the lift roller conveyor. The raft is rotated at the same rotational speed, and the substrate W is transported to the inlet suspension platform 1 that is disposed downstream of the transfer sheet. In Fig. u, the air of the inlet suspension platform 1 is not shown to be continuously ejected. Therefore, the portion of the substrate that enters the inlet suspension platform 10 travels in a state of being suspended on the inlet suspension platform 10. At this time, the guide roller 1 disposed on the side of the transfer unit 6 and the inlet suspension platform ι〇 〇2ρ~ enters and exits and abuts on both sides of the substrate 1 parallel to the x-axis direction. Both sides of the substrate W parallel to the axial direction are pressed by the guide rollers i〇2p~i〇2k, so the substrate W is traversed Since the position in the direction of the substrate transport path is restricted, it is not shifted in this direction but is transported to the downstream direction. Thus, since the guide rolls 1〇2p to 1〇2s are present, they are transferred to the substrate to be advanced. The force is prevented from being shifted in the downstream direction by the roller conveyor 30 and the transfer lifting roller carrier, so that the substrate w can be prevented from shifting. At this time, the roller conveyor 30 and the transfer unit 6 serve as respective The other device is completely cut open (ie, non-contact at the work station), so the vibration of the roller conveyor is not transmitted to the transfer unit 6. Therefore, it can prevent the use of the vibration due to useless vibration 146775.doc •29 · 201039928 The coating treatment of the first substrate causes adverse effects In the inlet overhanging platform 10, a deceleration sensor and a stop sensor are provided in the same manner as the roller conveyor 3. The transfer unit is lowered by detecting the front end WE of the substrate W being conveyed by the deceleration sensor. The rotation speed of the transfer roller conveyor 60 of 6 is stopped. The drive of the roller conveyor 3 is stopped by the roller conveyor 3 at the rear end of the conveyed substrate W. Further, the driving of the roller conveyor 3 is stopped. The substrate is transported to the inlet floating platform 10 only by the driving of the transfer lifting roller conveyor 6〇 until the stop sensor of the inlet floating platform 10 detects the front end WE of the substrate W being transported. When the stop sensor of the floating platform is detected, the rotation of the transfer lift roller conveyor 6 is stopped. Further, in steps (B) to (D) of the first cycle, the substrate transfer chuck 8 The operation is for transporting the leading substrate, so the omission of this stage will be described. &lt;3-3. The first time: the third stage to (D)&gt; Fig. 15 shows the transfer of the substrate w to the transfer unit 6 A top view of the case where the middle stop is stopped. Fig. 16 shows that the transfer unit 6 is lowered so that the substrate w XZ cross-sectional view of the case of being in a non-contact state. If the rear end of the substrate W to be transported is completely transferred to the transfer unit 6, the substrate W is stopped in a state of traversing the transfer unit 6 and the inlet floating platform. Then, the raised transfer roller conveyor 6〇 is lowered until the uppermost portion of the outer surface of the roller 6〇 is lower than the upper surface of the suspension pad 64. Thus, the entire surface of the substrate W is The suspension pad 64 and the inlet suspension platform 10 are suspended due to the air ejection from the suspension pad 64, so that the suspension pad 64 or the inlet suspension platform 10 is in a non-contact state. 146775.doc • 30· 201039928 The transfer unit 6 is shorter than the length of the substrate w, so The temperature of the substrate w caused by the difference in the degree of temperature drop of the airflow in the substrate W on the transfer unit 6 above the transfer lift roller conveyor 6 () and the floating pad The low level of the property 1 can suppress the unevenness of the coating due to the temperature distribution of the substrate W (temperature unevenness). In the conveyance direction of the substrate w which is stopped in the non-contact state, "forward and backward, left and right, alignment processing for positioning at a specific stop position is provided." Pins 1〇5C to 1〇5j. At the lateral position of the substrate W, the alignment processing pins 105g, 105h disposed on the (+Y) side and the alignment processing pins i〇5i, 105j disposed on the (_γ) side are aligned by the processing pin cylinder ( Not shown), it moves toward the substrate W in the horizontal direction, and is in contact with both sides of the substrate W which are parallel to the X-axis direction. The alignment processing pin 1 05cm 05f for positioning after the month il waits below the transport path of the substrate w, so the alignment processing pin l〇5c~l〇5f is driven by the alignment processing of the lift pin cylinder. The upper surface of the upper surface of the substrate is brought into contact with the substrate, and the uppermost portion of the substrate is brought into contact with both the front end WE and the rear end of the substrate W by changing the position in the direction of the substrate. As a result, the substrate w is positioned at the correct stop position by the action of the alignment processing pins i〇5c to 1〇5j. &lt;3-4. First: 4th stage (D) to (E)&gt; The substrate W is subjected to alignment processing by aligning the processing pins i〇5c to 1〇5j. In the meantime, 'the substrate transporting the disk 8' of the substrate W (the substrate Wa of FIG. 11) which has been subjected to the coating process before the transfer is stopped, and the adsorption of the disk portion 88 is stopped, and the disk portion 88 is lowered to the edge of the substrate. In the lower height state, the substrate W is moved toward the initial position in the (_χ) direction in order to transport the substrate W. Figure! 146775.doc •31- 201039928 During the operation of the substrate transfer chuck 8, the period marked with the (_) mark corresponds to this. In the step (C) of the operation of the substrate transfer chuck 8, the period in which the (+) mark is attached is the period in which the substrate transfer chuck 8 moves in the (-X) direction. The slit nozzle 55 which has been subjected to the coating treatment of the substrate W0 is horizontally moved in the (+χ) direction in order to perform nozzle cleaning and pre-discharging, and is moved upward toward the post-coating stage 41. &lt;3-5·First time: 5th stage (E) to (A)&gt; Fig. 1 shows that the substrate W is stopped at the application start position SP, and the substrate W1 of the next process is present in the roll. A top view of the position of the sub-conveyor 3's stop position. The substrate transfer chuck 8 that moves in the (-X) direction is positioned below the both sides of the substrate W that is correctly positioned by the alignment process pins 105c to 105f and that is stopped in parallel with the transfer direction. Stop at the location. Further, the substrate transfer chuck 8 is lifted by the chuck lift cylinder 85 and adsorbed to both ends of the lower surface of the substrate W by the action of the chuck lift cylinder 85. As shown in Fig. 1, the suction system for adsorption starts before contact with the substrate W. Therefore, the substrate 1 is held by the chuck portion 88, the substrate transfer chuck 8 is moved in the (+χ) direction, and the substrate W is transferred to the coating stage 4 while being suspended. The coating platform 4 is divided into a pre-coating stage 40 and a coated stage 41 by dividing the board constituting the platform into two sheets. By the substrate transfer chuck 8, the substrate trade is transported until the front end WE is positioned above the boundary line st of the two sheets. Fig. 18 is a cross-sectional view showing the state in which the slit nozzle 55 is pre-discharged. Fig. 19 is a cross-sectional view showing the XZ of the case where the nozzle washing standby unit 9 is moved to the retracted position. 146775.doc -32- 201039928 The nozzle unit 5 is stopped at a position where the slit nozzle 55 exists above the coated platform 41. The nozzle cleaning standby unit 9 moves in accordance with the position of the slit nozzle 55, and performs cleaning and pre-discharging of the discharge port 55a of the slit nozzle 55. After the front end of the slit nozzle 55 is initialized by the pre-discharging, the nozzle cleaning standby unit 9 moves in the (-X) direction and retreats. Further, in synchronization with the movement of the substrate transfer chuck 8 for moving the substrate W to the application start position sp, the roller conveyor 3 is also driven, and the pre-processing is performed in the upstream unit shown in Fig. The substrate W1 to be processed in the next process is transported to the stop position on the roller conveyor 30. &lt;3-6. Second: First stage (a) to (B)&gt; Fig. 20 is a cross-sectional view taken along line xz showing a state in which the slit nozzle 55 is lowered to the coating start height. Fig. 21 is an XZ sectional view showing a state in which the slit nozzle 55 is horizontally moved toward the application start position. Further, Fig. 26 shows an enlarged view of the portion of the blade of Fig. 21. Fig. 27 corresponds to the discharge and suction of the compressed air of the stage 4 after the application of the slit nozzle μ to the application start position SP. A partial enlargement of the situation. The substrate Wa, which is regarded as the 'leading' in Fig. 11 of the second cycle, corresponds to the substrate studied here. Since the nozzle cleaning waiting unit 9 retreats, a space can be made between the slit nozzle 55 and the coated flat σ 41 . The slit nozzle 55 is lowered in the space to the set down position, that is, to the coating start height. The slit nozzle 55 which has descended to the coating start height moves in the (_χ) direction to the coating start position sp near the front end WE of the substrate hip. When the slit nozzle 55 is moved to the coating start position SP, the nozzle height detecting sensor 58 first enters the substrate w front end WEm coating start position 146775.doc - 33 - 201039928 sp. Since the actual suspension enthalpy of the coating start position SP can be detected by the nozzle height detecting sensor 58, the slit nozzle 55 is performed on one side to set the height of the slit nozzle 55 to the actual coating height. Finely adjust and move in the (-X) direction. Then, the plate-shaped protective member 57 enters from the front end WE of the substrate to scan the surface of the substrate. Since the scanning is performed from the front end WE of the substrate, foreign matter on the entire surface of the substrate can be detected. At this time, the height of the slit nozzle 55 is equal to the height at which the coating is actually applied. When the slit nozzle 55 reaches the coating start position ", the movement of the slit nozzle 55 in the (-X) direction is stopped. The period from the start of the slit nozzle 55 until the coating start position is reached" is temporarily stopped. Previously, in order to keep the ambient temperature constant, the compressed air was ejected from the ejection hole 41a of the post-coating stage 41, and the air was sucked by the suction hole 41b. Thereby, the formation of the air stream (gas stream) (and even the formation of the pressure gas layer) is also temporarily stopped. In other words, the slit nozzle 55 is lowered from the waiting position until the end of the falling period, and the slit nozzle 55 is horizontally moved while the processing of the unprocessed liquid remains after the end of the lowering of the slit nozzle 55 until the slit nozzle 55 reaches the substrate w. Any one of the horizontal movement periods until the cloth start position SP belongs to the "idle period" in which the slit nozzle 55 does not discharge the processing liquid, and stops at the corresponding slit in at least a part of the idle period. The formation of the air flow (formation of the pressure air layer) of the platform 41 after the coating is performed in the area directly under the nozzle 55 (set to the OFF state). Preferably, during the descending period, the discharge and suction of the air are turned to the 0FF state until the slit nozzle 55 is lowered, and the nozzle 55 is horizontally moved until the substrate is reached at the slit spray 146775.doc -34·201039928. It is preferable that the air flow is in an OFF state until the application start position of w. The both the lowering period and the horizontal movement period are set as a temporary stop period of the air flow. And a region including at least the nozzle directly under the region where the substrate exists.

藉此,當狹縫噴嘴55下降而接近塗佈後平台41時,可防 止因空氣之噴出與抽吸之影響而導致狹縫喷嘴“之噴出口 55a之處理液乾燥。因此,在實際對基板表面進行塗佈處 理時,可抑制條紋狀之不均或噴出不良之情形發生。 如圖28所不,假設:使狹縫噴嘴55自上方之等待位置下 降至基板之前端WE之正上方的情況下’即便不暫時停止 由塗佈後平台41所進行的空氣流之形成,狹縫噴嘴55前端 之處理液亦不會乾燥。然而,於此情形時, 由於保護構件 W不會對基板W之前端训附近之正上方進行掃描,因 此,即便於前端WE附近存在有異物,亦無法藉由保護構 件57而排除或檢測。因在匕’有可能會因異物而導致狹縫噴 嘴55之前端污損。所以,較理想較,使狹縫噴嘴η自基 板W之前端WE下降至偏離水平方向之位置後進入至 二 之前端WE,但就此點而言,以如上所述暫時停止在塗佈 後平台41所進行之空氣流之形成特別有效。 另一方面,於較上述下降期間更前 • v I j -y 》用_ 為〇N(接通)狀態。其原因在於,若空氣喷出之停止時㈣ 長’則環境溫度將變動’基之溫度將變化,隨此可能 146775.doc -35- 201039928 導致基板胃之熱變形或塗佈時之不均。㈣,較好的是, 將空氣流之形成之暫時的停止狀態之持續時間實驗性地決 定作為基板之溫度變動達到特定之容許值以下的時間,藉 此可防止因基板側之溫度變動而導致塗佈不良。 考慮到狹縫喷嘴55在越接近塗佈後平台41時,越容易受 到自塗佈後平台41噴出之空氣流之影響,故在僅針對上述 空轉期間之-部分而使空氣流暫時停止的情況下宜使上 述下降期間與水平移動期間中之水平移動期間包含於空氣 流之暫時停止期間。 在狹縫噴嘴55到達塗佈開始位置卯後,使之前已停止、 即已成為OFF狀態之塗佈後平台4丨重新開始進行空氣之噴 出及抽吸而成為ON狀態。因此,使用塗佈平台4上之所有 的空氣孔再次進行壓力空氣層之形成,於此狀態下,狹縫 喷嘴55開始實施自塗佈開始位置sp進行處理液之塗佈。 又,基板搬送夾盤8開始向塗佈後平台41側(+χ方向)移 動,藉此,開始進行基板臂相對於狭縫喷嘴55之相對移 動。因此,於實際之處理液之塗佈動作時,在塗佈平台4 之整個範圍内形成有壓力空氣層,從而穩定地進行基板… 之懸浮支持。 又,在基板搬送夾盤8開始移動之同時搬送下一處理預 定之基板W1,因此滾子輸送機3〇與位於上升位置之移載 升降滾子輸送機60開始驅動。 &lt;3-7.第2次:第2階段(Β)〜 圖22係表示進行塗佈處理之情形的χζ剖面圖。圖23係 146775.doc • 36 - 201039928 表示進行塗佈處理之情形的俯視圖。 如圖22所示,在爽盤部88保持有基板w之兩端之狀態 下,基板搬送夾盤8以特定之速度向下游方向移動。狹縫 • 喷嘴55在到達塗佈開始位置SP後被固定之狀態下,自喷出 . a55a持續供給抗#液,基板W於懸浮狀態下朝下游方向 移動,藉此對基板W之表面進行塗佈處理。即,直至狹縫 喷嘴55下降並到達塗佈開始位置sp為止,基板㈣浮並停 ❹ 纟,狹縫喷嘴55朝⑼方向移動,但在狹縫喷嘴55到達塗 佈開始位置SP之後,基板评朝㈣方向移動,藉此,利用 狹縫喷嘴55與基板W之相對移動而開始進行塗佈掃描。 此時,下一處理預定之基板贾丨自滾子輸送機3〇通過移 載單元6而被搬送至入口懸浮平台1〇。而且,橫跨入口懸 浮平台10與移載單元6而停止。 &lt;3-8.第2次:第3階段(〇〜⑴)〉 對於下-處理預定之基板W1,移載升降滾子輸送機⑽ ο τ降’從而成為整個面懸浮之狀態。而且,藉由對準處理 銷105c〜105j而進行對準處理。 基fW穿過狹縫喷嘴55之正下方,塗佈處理結束後,基 板w藉由基板搬送夹盤8之驅動而通過塗佈後平台*卜並 朝出口懸浮平台11被搬送。 &lt;3_9.第2次:第4階段(D)〜(E)&gt; 在進灯塗佈處理後,狹縫噴嘴55朝(+X)方向水平移動, 直至最初下降到的位置為止,然後自該位置上升至原先之 噴嘴间度。而且,已退避之噴嘴洗淨等待單元9朝(+χ)方 146775.doc -37- 201039928 向移動J十對下-塗佈處理而進行狹縫喷嘴$ 5之洗淨及預 喷出。 圖24係表示將基板w搬送至出口懸浮平台n之情形的俯 視圖。在將基板w搬送至出口懸浮平台丨丨後,夾盤部88會 因基板搬送夾盤8之夾盤升降油缸85之動作而降低至下降 位置,從而基板W兩端之吸附保持被解除。然後,在失盤 部88位於下降位置之狀態下,基板搬送夾盤8為了進行下 一處理預定之基板W1之搬送而向初始位置移動。由於基 板W與下一處理預定之基板貿丨之搬送間隔較密,故下一處 理預定之基板w 1在整個面已懸浮之狀態下等待基板搬送 夾盤8。因此,在已使夾盤部88上升之狀態下,為了接觸 到處於懸浮狀態下之下一處理預定之基板W1而使夾盤部 88下降’基板搬送夾盤8返回至初始位置。 藉由設置於出口懸浮平台11上之空氣之喷出孔lla,隔 開特定間隔而配置之提昇銷丨丨5群會相對於處於非接觸狀 態之基板W而上升,支持基板w之下表面並提昇。設置於 下游之移載機械手36之移載叉進入至提昇銷115之間隙而 接收基板W ’並移載至減壓乾燥單元37。移載機械手36將 基板W移載至減壓乾燥單元37,並且移載至減壓乾燥單元 38與減壓乾燥單元38之積層結構且朝向下游方向的交接位 置39等。 其後’基板W1以與基板W相同之方式被實施塗佈處理, 並向下游方向被搬送。以上為基板處理裝置1所進行之處 理之流程。 146775.doc -38- 201039928 &lt;4.變形例&gt; 於上述實施形態中,在基板W通過移載單元6後搬入下 一處理預定之基板W1,但並不限定於該種形態。 - 在由基板搬送夾盤8所搬送、且要進行塗佈處理之基板 . w之後端未通過移載單元6之狀態下,亦可進行下一處理 預定之基板W1之搬送。於此情形時,由於正進行塗佈處 理之基板W之後端仍殘留,故本來應上升之移載升降滾子 輸送機60必需於下降之狀態下將下一處理預定之基板冒1 ϋ 接收至移載單元6中。 因此,在進行塗佈處理之基板|之後端已通過移載單元 6之階段,移載升降滾子輸送機6〇之滾子6〇1會以與滾子輸 送機30之旋轉相同的旋轉速度而旋轉並上升。對於最初僅 以滾子輸送機30之旋轉所產生之推進力而向移載單元6搬 送之下一處理預定之基板W1,其下表面被自中途上升之 移載升降滾子輸送機60之滾子6〇1而支持,並且藉由滾子 〇 601之旋轉而被賦予推進力。然後,進行基板|丨之搬送, 直至入口懸洋平台10之停止感測器檢測到的位置為止。 如此一來,可同等地設定滾子輸送機3〇之滾子3〇1之旋 轉、移載升降滾子輸送機60之滾子6〇1之旋轉、及基板搬 送夾盤8之搬送速度,因此,在進行基板W之塗佈動作之 期間,可使下-處理預定之基板们搬入至移載單元6。藉 此,可使基板W與基板们之搬送間隔更密,因此可進一步 縮短處理所需之時間。 又於上述實施形態中,塗佈平台4之板係被分為2部分 146775.doc •39· 201039928 者’但並不限定於此。圖25係由被分為3部分之板 之塗佈平台130。此時,將各板作為塗佈前平台ιι〇、主塗 佈平台118、塗佈後平台12〇。 土 於主塗佈平台118上,設置於平台面上之氣體孔形成為 空氣之喷出孔118a與抽吸孔118]3變得密集之構成。相對於 此,於兩端之塗佈前平台11〇與塗佈後平台12〇上,為如下 之構成:與主塗佈平台118相比,噴出孔11〇&amp;與抽吸孔 nob、喷出孔i20a與抽吸孔12扑之密度較低,孔間之距離 較長。 於此情形時,基板w停止,以使搬送方向上之基板W之 前端WE位於主塗佈平台118之區域邊界Sc之位置。區域邊 界Sc並非不同的板之邊界,而是於丨張板之大致中央所規 定之概念性的區域邊界。狹縫噴嘴55位於較主塗佈平台 118之區域邊界Sc更靠下游側之塗佈後平台uo之上方。此 時,板被分為3份,但内部之空氣流路成為由較區域邊界 Sc更上游側、更下游側而分離為2個系統之結構。 與上述實施形態同樣地,狹縫喷嘴55自停止位置下降至 塗佈開始高度為止,然後自該位置朝(_χ)方向水平移動。 自該下降開始起,直至狹縫喷嘴55到達基板评上之塗佈開 始位置為止,使來自位於較區域邊界Sc更下游側的噴出孔 118a、120a及抽吸孔115b、120b之空氣之喷出及抽吸暫時 停止。如此一來’與上述實施形態同樣地,可防止在下降 期間狹縫喷嘴55之噴出口 55a乾燥。 關於板’提高喷出孔與抽吸孔之密度後,可使基板…更 146775.doc -40· 201039928 穩定地懸浮,但在加工上耗費成本。於此情形時,尤其欲 使基板w穩定地懸浮之區域係對所搬送之基板货進行塗佈 處理之區域。因此,僅對位於該區域下方之主塗佈平么 118採用喷出孔Ii8a與抽吸孔U8b之密度較高之精密的 板,便可充分地獲得必要之效果。如此將板分為3部分而 分開使S,藉此,於兩端之塗佈前平台i 1〇、與塗佈後平 台120中,可使用較主塗佈平台118之板而言空氣之嘴出孔Thereby, when the slit nozzle 55 is lowered to approach the coated platform 41, it is possible to prevent the processing liquid of the discharge port 55a of the slit nozzle from being dried due to the influence of the ejection and suction of air. Therefore, the actual substrate is When the surface is subjected to the coating treatment, unevenness in the stripe shape or ejection failure can be suppressed. As shown in Fig. 28, it is assumed that the slit nozzle 55 is lowered from the upper waiting position to the front side of the front end WE of the substrate. Next, even if the formation of the air flow by the coated platform 41 is not temporarily stopped, the processing liquid at the front end of the slit nozzle 55 is not dried. However, in this case, since the protective member W does not act on the substrate W The scanning is performed directly above the front end training. Therefore, even if there is foreign matter in the vicinity of the front end WE, it cannot be excluded or detected by the protective member 57. Since the front end of the slit nozzle 55 may be contaminated by foreign matter Therefore, it is preferable to make the slit nozzle η descend from the front end WE of the substrate W to the position deviated from the horizontal direction and then enter the second front end WE, but in this point, temporarily stop as described above. The formation of the air flow by the platform 41 after application is particularly effective. On the other hand, before the above-mentioned falling period, the first _ _ is the 〇N (on) state. When the air is stopped (4), the temperature will change. The temperature of the base will change. It may be 146775.doc -35- 201039928 which may cause uneven deformation or coating unevenness of the substrate stomach. (4), better In the meantime, the duration of the temporary stop state in which the air flow is formed is experimentally determined as the time when the temperature fluctuation of the substrate reaches a predetermined allowable value or less, thereby preventing coating failure due to temperature fluctuation on the substrate side. When the slit nozzle 55 is closer to the post-application stage 41, the more easily it is affected by the air flow ejected from the post-coating stage 41, so that the air flow is temporarily stopped only for the portion of the idling period described above. It is preferable that the horizontal movement period in the above-described falling period and horizontal movement period is included in the temporary stop period of the air flow. After the slit nozzle 55 reaches the coating start position ,, the previous stop is made, that is, it becomes After the application of the OFF state, the platform 4 restarts the air discharge and suction to be in the ON state. Therefore, the formation of the pressurized air layer is performed again using all the air holes on the coating platform 4, and in this state, the narrow The slit nozzle 55 starts to apply the coating liquid from the coating start position sp. Further, the substrate transfer chuck 8 starts moving toward the coated platform 41 side (+χ direction), thereby starting the substrate arm to be narrow. The relative movement of the slit nozzles 55. Therefore, during the application operation of the actual treatment liquid, a pressure air layer is formed over the entire range of the coating platform 4, thereby stably supporting the suspension of the substrate. When the chuck 8 starts moving, the substrate W1 for the next processing is transferred, and therefore the roller conveyor 3 is driven to start with the transfer lift roller conveyor 60 at the raised position. &lt;3-7. 2nd: 2nd stage (Β) - Fig. 22 is a cross-sectional view showing a state in which a coating process is performed. Fig. 23 is a plan view showing the case where the coating treatment is performed, 146775.doc • 36 - 201039928. As shown in Fig. 22, in a state in which both ends of the substrate w are held by the swash plate portion 88, the substrate transfer chuck 8 is moved in the downstream direction at a specific speed. Slot • The nozzle 55 is ejected in a state where it is fixed after reaching the coating start position SP. The a55a continuously supplies the anti-liquid, and the substrate W moves in the downstream direction in a suspended state, thereby coating the surface of the substrate W. Cloth processing. That is, until the slit nozzle 55 descends and reaches the coating start position sp, the substrate (four) floats and stops, and the slit nozzle 55 moves in the (9) direction, but after the slit nozzle 55 reaches the coating start position SP, the substrate evaluation Moving in the (four) direction, coating scanning is started by the relative movement of the slit nozzle 55 and the substrate W. At this time, the substrate for the next processing is transferred from the roller conveyor 3 to the inlet floating platform 1 through the transfer unit 6. Moreover, it stops across the inlet suspension platform 10 and the transfer unit 6. &lt;3-8. 2nd: 3rd stage (〇~(1))> For the lower-process predetermined substrate W1, the lift roller conveyor (10) ο τ drops ', and the entire surface is suspended. Further, alignment processing is performed by aligning the processing pins 105c to 105j. The base fW passes directly under the slit nozzle 55, and after the coating process is completed, the substrate w is conveyed by the substrate transfer chuck 8 through the coated platform and conveyed toward the exit suspension stage 11. &lt;3_9. 2nd: 4th stage (D) to (E)&gt; After the light application coating process, the slit nozzle 55 is horizontally moved in the (+X) direction until the position first lowered, and then From this position to the original nozzle interval. Further, the retracted nozzle cleaning waiting unit 9 performs cleaning and pre-discharging of the slit nozzle $5 toward (+χ) side 146775.doc -37-201039928 to the moving J ten-down-coating process. Fig. 24 is a plan view showing a state in which the substrate w is transported to the exit floating stage n. After the substrate w is transported to the exit floating stage ,, the chuck portion 88 is lowered to the lowered position by the operation of the chuck lift cylinder 85 of the substrate transfer chuck 8, and the suction holding at both ends of the substrate W is released. Then, in a state in which the disc loss portion 88 is at the lowered position, the substrate transfer chuck 8 is moved to the initial position for the conveyance of the substrate W1 to be processed in the next process. Since the substrate W is densely spaced from the substrate for the next processing, the substrate w 1 to be processed next is waiting for the substrate transfer chuck 8 while the entire surface has been suspended. Therefore, in a state where the chuck portion 88 has been raised, the chuck portion 88 is lowered to return to the initial position in order to contact the substrate W1 which is scheduled to be under a predetermined state in the suspended state. The group of lifting pins 5 disposed at a predetermined interval by the air ejection holes 11a provided on the outlet floating platform 11 rises relative to the substrate W in a non-contact state, and supports the lower surface of the substrate w and Upgrade. The transfer fork provided to the downstream transfer robot 36 enters the gap of the lift pin 115 to receive the substrate W' and is transferred to the reduced-pressure drying unit 37. The transfer robot 36 transfers the substrate W to the reduced-pressure drying unit 37, and transfers it to the laminated structure of the reduced-pressure drying unit 38 and the reduced-pressure drying unit 38, the transfer position 39 toward the downstream direction, and the like. Thereafter, the substrate W1 is subjected to a coating process in the same manner as the substrate W, and is transported in the downstream direction. The above is the flow of the processing performed by the substrate processing apparatus 1. 146775.doc -38- 201039928 &lt;4. Modifications&gt; In the above embodiment, the substrate W is carried into the next processing predetermined substrate W1 after passing through the transfer unit 6, but the invention is not limited to this embodiment. - In the state where the substrate to be coated and transported by the substrate transfer chuck 8 is not transferred to the transfer unit 6, the next substrate W1 can be transported. In this case, since the rear end of the substrate W which is being subjected to the coating process remains, the transfer lift roller conveyor 60 which should be raised as it is necessary must receive the next predetermined substrate in the lowered state. In the transfer unit 6. Therefore, at the stage where the coating processing substrate 7 has passed the transfer unit 6, the roller 6〇1 of the transfer lifting roller conveyor 6 is rotated at the same speed as the rotation of the roller conveyor 30. Rotate and rise. The substrate W1 that has been processed by the transfer unit 6 is transferred to the transfer unit 6 by the propulsion force generated by the rotation of the roller conveyor 30, and the lower surface thereof is rolled up by the transfer lift roller conveyor 60 which rises from the middle. Supported by the child 〇1, and the propulsive force is imparted by the rotation of the roller 〇601. Then, the substrate is transported until the position of the entrance suspension platform 10 is stopped by the sensor. In this way, the rotation of the roller 3〇1 of the roller conveyor 3, the rotation of the roller 6〇1 of the transfer lift roller conveyor 60, and the conveyance speed of the substrate transfer chuck 8 can be set equally. Therefore, during the coating operation of the substrate W, the substrates to be processed by the lower processing can be carried into the transfer unit 6. Thereby, the transfer interval between the substrate W and the substrate can be made denser, so that the time required for the processing can be further shortened. Further, in the above embodiment, the plate of the coating platform 4 is divided into two parts 146775.doc • 39· 201039928 'but is not limited thereto. Figure 25 is a coating platform 130 from a panel divided into three sections. At this time, each plate was used as a pre-coating stage ιι, a main coating stage 118, and a coated stage 12〇. On the main coating stage 118, the gas holes provided on the land surface are formed such that the air ejection holes 118a and the suction holes 118] 3 become dense. On the other hand, on the pre-application stage 11〇 and the post-application stage 12〇 at both ends, the configuration is as follows: the ejection hole 11〇&amp; and the suction hole nob, the spray are compared with the main coating stage 118. The outlet hole i20a and the suction hole 12 have a lower density, and the distance between the holes is longer. In this case, the substrate w is stopped so that the leading end WE of the substrate W in the transport direction is located at the position of the region boundary Sc of the main coating stage 118. The area boundary Sc is not the boundary of a different board, but a conceptual area boundary defined by the approximate center of the sheet. The slit nozzle 55 is located above the coated rear platform uo on the downstream side of the area boundary Sc of the main coating stage 118. At this time, the plate is divided into three parts, but the internal air flow path is separated into two systems from the upstream side and the further downstream side of the area boundary Sc. Similarly to the above-described embodiment, the slit nozzle 55 is lowered from the stop position to the application start height, and then horizontally moved from the position toward the (_χ) direction. From the start of the lowering, until the slit nozzle 55 reaches the coating start position on the substrate, the air is ejected from the ejection holes 118a and 120a and the suction holes 115b and 120b located on the downstream side of the region boundary Sc. And the suction is temporarily stopped. As described above, in the same manner as in the above embodiment, it is possible to prevent the discharge port 55a of the slit nozzle 55 from drying during the lowering period. With regard to the plate 'increasing the density of the ejection hole and the suction hole, the substrate can be stably suspended, but it is costly in processing. In this case, in particular, the region in which the substrate w is stably suspended is a region where the substrate material to be conveyed is subjected to coating treatment. Therefore, the necessary effect can be sufficiently obtained only by using a precision plate having a higher density of the discharge holes Ii8a and the suction holes U8b for the main coating plate 118 located below the area. Thus, the board is divided into three parts and separated by S, whereby at the both ends of the pre-coating platform i 1〇 and the coated platform 120, the mouth of the air can be used compared to the board of the main coating platform 118. Outlet

ll〇a、120a及抽吸孔11〇b、㈣之密度更降低之廉價的 板。 塗佈平台m之構成為板被分為3部分,但與板被分為幾 P刀…、關 心可分為複數張。在狹縫噴嘴55自上升位置 起下降而到達基板W上之塗佈開始位置為止,只要可暫時 停錢搬送方向上之基板w前端之位置更下游側之區域的 空氣之噴出及抽吸,則内部之空氣流路亦可被分為 流路。 來 又,若構成為使内部之空氣流路分開而可獨立地進行 ΟΝ/OFF控制,則板亦可不進行物理性地分割。 就-般表現而言,為如下構成:分別形成有氣體孔之複 數之氣體流形成區域係作為其他板或一張板之其他部分而 接配置與„亥等複數之氣體流形成區域各自對應地設置 有氣體流路之開閉機構。而且,複數之氣體流形成區域 中’僅針對存在於喷嘴正下方且於其上不存在基板之區 域二使用上述開閉機構暫時停止氣體流之形成,藉此,可 獲知與上述實施形態相同之結果。 146775.doc -41 - 201039928 又,於上述實施形態中,狹縫喷嘴55下降並朝(_χ)方向 移動而到達基板W之塗佈開始位置sp,但亦可為如下之機 構:狹縫噴嘴55下降,基板W朝(+Χ)方向移動而使狹縫喷 嘴55之喷出口 55a到達塗佈開始位置SP。於此情形時,在 狹縫喷嘴55下降之期間,使來自上方不存在基板w之區域 之塗佈平台4的空氣之喷出及抽吸停止。而且,基板貨於 (+X)方向朝向狹縫噴嘴55移動,於狹縫噴嘴55之喷出口 55a已到達塗佈開始位置sp之階段,重新開始進行空氣之 噴出與抽吸。如此一來,可防止狹縫噴嘴55之噴出口 5化 乾燥。 又,使用空氣作為用以使基板w懸浮之壓縮氣體較為典 型’但在厭氧製程中之基板搬送中,亦可將氮氣等壓縮而 用作惰性氣體。 又,於上述實施形態之基板處理裝置中,在將由滾子搬 送機構所接收之基板交付至懸浮搬送機構時使用移載單 元’但本發明亦可適用於如下形態之裝置:藉由移载單元 (支持形式轉換機構)將由料搬送機構所接收之基板交付 至滾子搬送機構側。 進而,於本實施形態中,喷嘴洗淨等待單元9係沿X轴方 …移動之機構,但不可移動亦無妨。亦即,在噴嘴單元 ^多動之If形時,喷嘴洗淨等待單元9亦可被固定。於此情 —,成為未。又置喷嘴洗淨等待單元9之噴嘴洗淨等待單 =線性標度尺92、喷嘴洗淨等待單元線性馬達”之結構。 可手動地移動喷嘴洗淨等待單元9而僅設置喷嘴洗淨 146775.doc •42· 201039928 專待單元行進導引器91,為了於搬送過程中不發生移動而 以鎖機構來固定。 【圖式簡單說明】 .圖1係本發明之基板處理裝置之俯視圖。 圖2係噴嘴單元及喷嘴洗淨等待單元已卸除時的圖1之基 板處理裝置之俯視圖。 圖3係表示基板處理裝置之控制機構之方塊圖。 ❹ 圖4係上升時的移載單元之YZ刮面圖。 圖5係下降時的移載單元之γζ剖面圖。 圖6係滾子輸送機及移載單元之XZ側視圖。 圖7係升降輸送機支撐框架之俯視圖。 圖8係本實施形態之塗佈平台之俯視圖。 圖9係表示對圖8所示之塗佈平台供給及抽吸空氣之流路 的XZ剖面圖。 圖10係本發明之基板處理裝置之YZ剖面圖。 ◎ 圖11係表示本發明之基板處理裝置之動作的時序圖。 圖12係部分地表示本發明之基板處理裝置之處理流程的 俯視圖。 圖13係部分地表示本發明之基板處理裝置之處理流程的 俯視圖。 圖14係部分地表示本發明之基板處理裝置之處理流程的 ΧΖ剖面圖。 圖15係部分地表示本發明之基板處理裝置之處理流程的 俯視圖。 146775.doc -43- 201039928 圖1 6係部分地表示本發明之基板處理裝置之處理流程的 XZ剖面圖。 圖17係部分地表示本發明之基板處理裝置之處理流程的 俯視圖。 圖1 8係部分地表示本發明之基板處理裝置之處理流程的 XZ剖面圖。 圖1 9係部分地表示本發明之基板處理裝置之處理流程的 XZ剖面圖。 圖20係部分地表示本發明之基板處理裝置之處理流程的 XZ剖面圖。 圖2 1係部分地表示本發明之基板處理裝置之處理流程的 XZ剖面圖。 圖22係部分地表示本發明之基板處理裝置之處理流程的 XZ剖面圖。 圖23係部分地表示本發明之基板處理裝置之處理流程的 俯視圖。 圖24係部分地表示本發明之基板處理裝置之處理流程的 俯視圖。 圖25係變形例之塗佈平台之俯視圖。 圖26係表示根據喷嘴與基板之位置關係所進行的空氣流 之ΟΝ/OFF切換之部分放大圖。 圖27係表示根據噴嘴與基板之位置關係所進行的空氣流 之ΟΝ/OFF切換之部分放大圖。 圖28係表示使喷嘴在基板上下降之狀況之部分放大圖。 146775.doc -44- 201039928 〇 〇 【主要元件符號說明】 1 基板處理裝置 2 基板搬送裝置 3 基板塗佈裝置 4 塗佈平台 5 喷嘴單元 6 移載單元 7 控制部 8 基板搬送夾盤 9 噴嘴洗淨等待單元 10 入口懸浮平台 10a、 11a、 40a、 41a 喷出孔 11 出口懸浮平台 16 ' 26 氣動閥 18、28 鼓風機 40 塗佈前平台 40a '41a 喷出孔 40b 、 41b 抽吸孔 41 塗佈後平台 55 狹缝喷嘴 55a 喷出口 55S 振動感測器 57 保護構件 58 滾珠螺桿 146775.doc -45- 201039928 60 64 95 96 99 SP StThe inexpensive boards of ll〇a, 120a and the suction holes 11〇b and (4) have a lower density. The coating platform m is constructed such that the plate is divided into three parts, but the plate is divided into several P-knifes... and the heart can be divided into a plurality of sheets. When the slit nozzle 55 is lowered from the rising position and reaches the application start position on the substrate W, the air can be temporarily ejected and sucked in the region on the downstream side of the position of the tip end of the substrate w in the transport direction. The internal air flow path can also be divided into flow paths. Further, if the internal air flow path is separated and the ΟΝ/OFF control can be independently performed, the plate may not be physically divided. In the general performance, a gas flow forming region in which a plurality of gas holes are formed is provided as a separate portion of a gas flow forming region of a plurality of plates or other plates. An opening and closing mechanism for the gas flow path is provided. Further, in the plurality of gas flow forming regions, the gas flow is formed by using the opening and closing mechanism to stop the formation of the gas flow only in the region where the substrate is present immediately below the nozzle and there is no substrate thereon. Further, in the above embodiment, the slit nozzle 55 is lowered and moved in the (_χ) direction to reach the application start position sp of the substrate W, but also the result is the same as the above-described embodiment. 146775.doc -41 - 201039928 The mechanism may be such that the slit nozzle 55 is lowered, and the substrate W is moved in the (+Χ) direction to cause the discharge port 55a of the slit nozzle 55 to reach the coating start position SP. In this case, the slit nozzle 55 is lowered. During this period, the ejection and suction of the air from the coating platform 4 in the region where the substrate w is not present is stopped. Further, the substrate is moved in the (+X) direction toward the slit nozzle 55. When the discharge port 55a of the nozzle 55 has reached the coating start position sp, the air is ejected and sucked again. Thus, the discharge port 5 of the slit nozzle 55 can be prevented from being dried. The compressed gas in which the substrate w is suspended is typically 'in the case of the substrate transport in the anaerobic process, nitrogen gas or the like may be compressed and used as an inert gas. Further, in the substrate processing apparatus of the above embodiment, the roller is transported by the roller. The transfer unit is used when the substrate received by the mechanism is delivered to the suspension transport mechanism. However, the present invention is also applicable to a device in which the substrate received by the material transport mechanism is delivered to the roll by the transfer unit (support form conversion mechanism). Further, in the present embodiment, the nozzle cleaning standby unit 9 is a mechanism that moves along the X-axis side, but may not move. That is, when the nozzle unit is multi-moved, the nozzle is movable. The washing waiting unit 9 can also be fixed. In this case, it becomes no. The nozzle washing waiting unit of the nozzle washing waiting unit 9 is also placed. The linear scale 92 and the nozzle are cleaned. A structural unit linear motor to be "in. The nozzle washing standby unit 9 can be manually moved to set only the nozzle cleaning. 146775.doc • 42· 201039928 The unit traveling guide 91 is fixed by a lock mechanism so as not to move during the conveyance. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a plan view of a substrate processing apparatus of the present invention. Fig. 2 is a plan view of the substrate processing apparatus of Fig. 1 when the nozzle unit and the nozzle cleaning standby unit have been removed. Fig. 3 is a block diagram showing a control mechanism of the substrate processing apparatus. ❹ Figure 4 is a YZ scraping view of the transfer unit at the time of ascent. Figure 5 is a cross-sectional view of the gamma ζ of the transfer unit when it is lowered. Figure 6 is a side view of the XZ of the roller conveyor and the transfer unit. Figure 7 is a top plan view of the elevating conveyor support frame. Fig. 8 is a plan view of the coating platform of the embodiment. Fig. 9 is a cross-sectional view showing the flow path of the supply and suction air to the coating platform shown in Fig. 8. Figure 10 is a cross-sectional view showing the YZ of the substrate processing apparatus of the present invention. Fig. 11 is a timing chart showing the operation of the substrate processing apparatus of the present invention. Fig. 12 is a plan view partially showing the processing flow of the substrate processing apparatus of the present invention. Fig. 13 is a plan view partially showing the processing flow of the substrate processing apparatus of the present invention. Fig. 14 is a cross-sectional view partially showing the processing flow of the substrate processing apparatus of the present invention. Fig. 15 is a plan view partially showing the processing flow of the substrate processing apparatus of the present invention. 146775.doc -43- 201039928 Fig. 1 is a partial cross-sectional view showing the XZ cross section of the processing flow of the substrate processing apparatus of the present invention. Fig. 17 is a plan view partially showing the processing flow of the substrate processing apparatus of the present invention. Fig. 18 is a partially sectional view showing the XZ cross section of the processing flow of the substrate processing apparatus of the present invention. Fig. 19 is a partially sectional view showing the XZ cross section of the processing flow of the substrate processing apparatus of the present invention. Figure 20 is a cross-sectional view, partially in section, of the process flow of the substrate processing apparatus of the present invention. Fig. 2 is a partial cross-sectional view showing the XZ of the processing flow of the substrate processing apparatus of the present invention. Figure 22 is a cross-sectional view, partially in section, of the process flow of the substrate processing apparatus of the present invention. Fig. 23 is a plan view partially showing the processing flow of the substrate processing apparatus of the present invention. Fig. 24 is a plan view partially showing the processing flow of the substrate processing apparatus of the present invention. Figure 25 is a plan view of a coating platform of a modification. Fig. 26 is a partially enlarged view showing the ΟΝ/OFF switching of the air flow in accordance with the positional relationship between the nozzle and the substrate. Fig. 27 is a partially enlarged view showing the ΟΝ/OFF switching of the air flow in accordance with the positional relationship between the nozzle and the substrate. Fig. 28 is a partially enlarged view showing a state in which the nozzle is lowered on the substrate. 146775.doc -44- 201039928 〇〇【Main component symbol description】 1 Substrate processing device 2 Substrate transfer device 3 Substrate coating device 4 Coating platform 5 Nozzle unit 6 Transfer unit 7 Control unit 8 Substrate transfer chuck 9 Nozzle wash Net Waiting Unit 10 Inlet Suspension Platform 10a, 11a, 40a, 41a Discharge Hole 11 Outlet Suspension Platform 16 ' 26 Pneumatic Valves 18, 28 Blower 40 Pre-Coating Platform 40a '41a Discharge Holes 40b, 41b Suction Holes 41 Coating Rear platform 55 slit nozzle 55a discharge port 55S vibration sensor 57 protection member 58 ball screw 146775.doc -45- 201039928 60 64 95 96 99 SP St

W、 WO、W1、Wa、Wb WEW, WO, W1, Wa, Wb WE

X、 Y、Z 移載升降滾子輸送機 懸浮墊 輥 親槽 洗淨單元 塗佈開始位置 板邊界 基板 基板之前端 方向 146775.doc 46 -X, Y, Z Transfer lifting roller conveyor Suspension pad Roller Inching cleaning unit Coating start position Plate boundary Substrate Front end of the substrate Direction 146775.doc 46 -

Claims (1)

201039928 七、申請專利範圍: 1. 一種基板塗佈裝置,其特徵在於: 其係用以對基板塗佈處理液者;其包含: 懸浮平台,其藉由通過平台面上所設置之氣體孔之氣 體流而於上述平台面上形成壓力氣體層,並藉由上述壓 力氣體層而使基板懸浮; 處理液供給機構,#自相對於上述基板進行相對移動 之喷嘴將特定之處理液喷出至上述基板上,藉以將上述 處理液塗佈於上述基板上;及 氣體流控制機冑,其在上述氣體流之形成狀態與停止 狀態間進行切換;且 在與上述相對移動並行進行之上述處理液噴出之前, 設定空轉期間,其係在停止自上述㈣噴出上述處理液 之狀態下,使上述喷嘴自上述懸浮平台上之偏離基板存 在區域之位置相對移動至上述基板存在區域; 上述氣體流控制機構係在上述空轉期間中之至少一部 刀’月間内,暫時停止在上述喷嘴之正下方區域進行之上 述氣體流之形成。 2.如請求項1之基板塗佈裝置,#中更包含使上述喷嘴在 上述懸浮平台之上方空間升降之升降機構; 上述空轉期間包含:上述喷嘴自特定之等待高度下降 之下降期間、及在上述噴嘴成為下降狀態後於水平方向 吏上述噴嘴相對於上述基板而相對接近之水平移動期 146775.doc 201039928 對上述基板上之上述處理液之塗佈,係在上述下降狀 態下進行; 在上述空轉期間中之至少上述水平移動期間内,停止 上述氣體流之形成。 3.如請求項1或2之基板塗佈裝置,其中 在上述懸浮平台上,將分別形成有氣體孔之複數之氣 體流形成區域鄰接配置作為另—張板或—張板之另一部 分; 對應於上述複數之氣體流形成區域之各者而設置有氣 體流路之開閉機構; 上述氣體流控制機構係 僅針對上述複數之氣體流形成區域中、位在上述喷嘴 之正下方且於其上不存在上述基板之區域,進行使用上 述開閉機構之上述氣體流之形成之暫時停止。 4_如請求項1或2之基板塗佈裝置,其中 於上述氣體流暫時停止之後,曹 進行使用上述 —μ、” 《孔體流之形成’直至開始進 订上述赁嘴自上述基板 為止。 师開始位置噴出上述處理液 5·如請求項U2之基板塗佈襄 ^ ^ /、T更包含測定上述基 板之懸净尚度之懸浮高度測定機構;並且 、基 上述處理液供給機構更包含 保護構件,其安裝於上述嘴嘴中在進行上述 時相當於前方之侧,保&amp; ナ移動 J保° 曼上迷噴嘴之前端; 146775.doc 201039928 在上述懸洋高度測定機構檢測出上述基板端部之塗佈 開始位置之懸浮咼度並且使上述噴嘴下降後,使上述喷 嘴與上述基板進行相對移動,藉此使上述保護構件較上 述噴嘴更先進入至基板端部。 6.如請求項1或2之基板塗佈裝置,其係預先決定因暫時停 止上述氣體流之形成所致之上述基板之溫度變動之容許 值, 。 上述氣體流之形成之上述暫時停止狀態的持續時間係 決定為上述溫度變動成為上述容許值以下之時間。 7·如請求項1或2之基板塗佈裝置,其中 於上述懸、矛平台上,混合形成有喷出上述氣體之複數 喷出孔、及抽吸上述氣體之複數抽吸孔; 上述氣體流係在自上述複數噴出孔噴出之壓力氣體由 上述複數抽吸孔抽吸的過程中產生; 上述氣體流控制機構係藉由開閉對上述複數喷出孔之 氣體供給路徑、與開閉由上述複數抽吸孔之氣體抽吸路 徑,而在上述氣體流之形成狀態與停止狀態間進行切 換。 8 · —種基板塗佈方法,其特徵在於: 其係用以將自特定之噴嘴喷出之處理液塗佈於墓板 者;其包括以下步驟: 藉由通過平台面上所設置之氣體孔之氣體流而於上述 平台面上形成壓力氣體層’並藉由上述壓力氣體層而使 基板懸浮之第1步驟; 146775.doc 201039928 針對上述平台面中偏離基板存在區域且為噴嘴正下方 之特定區域,暫時停止上述氣體流; 使喷嘴自特定之等待高度朝向上述特定區域下降; 使上述噴嘴與上述基板相對移動而使上述噴嘴到達上 述基板之塗佈開始位置之上,開始自上述噴嘴噴出上述 處理液;及 重新開始針對上述特定區域進行上述氣體流之形成, 直至開始進行上述處理液之喷出為止。 146775.doc201039928 VII. Patent application scope: 1. A substrate coating device, characterized in that: it is used for coating a processing liquid on a substrate; and the method comprises: a floating platform, which passes through a gas hole provided on the platform surface a gas flow is formed on the platform surface to form a pressure gas layer, and the substrate is suspended by the pressure gas layer; and the treatment liquid supply mechanism ejects a specific treatment liquid from the nozzle that relatively moves relative to the substrate to the above a substrate on which the processing liquid is applied; and a gas flow control device that switches between a state in which the gas stream is formed and a stopped state; and the processing liquid is ejected in parallel with the relative movement Before the idling period is set, the nozzle is relatively moved from the position on the floating platform offset from the substrate existence region to the substrate existence region while stopping the discharge of the processing liquid from the above (4); the gas flow control mechanism is Temporarily stopping at the above nozzle during at least one of the idling periods The area immediately below is formed by the above gas flow. 2. The substrate coating apparatus according to claim 1, further comprising: a lifting mechanism for raising and lowering the nozzle above the floating platform; wherein the idling period includes: a period during which the nozzle is lowered from a specific waiting height, and After the nozzle is in a lowered state, the horizontal movement period of the nozzle relative to the substrate in the horizontal direction is 146775.doc 201039928. The coating of the processing liquid on the substrate is performed in the descending state; The formation of the gas flow is stopped during at least the horizontal movement period of the period. 3. The substrate coating apparatus according to claim 1 or 2, wherein, on the floating platform, a plurality of gas flow forming regions respectively formed with gas holes are adjacently disposed as another portion of the other sheet or the sheet; An opening and closing mechanism for the gas flow path is provided in each of the plurality of gas flow forming regions; and the gas flow control mechanism is located only in the plurality of gas flow forming regions, directly below the nozzle, and not thereon The region where the substrate is present is temporarily stopped by the formation of the gas flow using the opening and closing mechanism. 4) The substrate coating apparatus according to claim 1 or 2, wherein after the gas flow is temporarily stopped, Cao performs the above-described "μ," "formation of the pore flow" until the start of the ordering of the nozzle from the substrate. The processing liquid 5 is sprayed out at the start position of the apparatus. The substrate coating 襄 ^ ^ / T of the request item U2 further includes a levitation height measuring means for measuring the hanging degree of the substrate; and the processing liquid supply means further includes protection a member that is mounted in the mouth of the mouth to perform the above-mentioned side corresponding to the front side, and the front end of the nozzle that is moved to the front of the nozzle; 146775.doc 201039928 The above-mentioned substrate end is detected by the above-mentioned overhanging height measuring mechanism After the nozzle is lowered in the coating start position and the nozzle is lowered, the nozzle is moved relative to the substrate, whereby the protective member enters the substrate end earlier than the nozzle. Or a substrate coating apparatus of 2, which determines an allowable value of temperature change of the substrate caused by temporarily stopping the formation of the gas flow; The duration of the temporary stop state in which the gas flow is formed is determined as the time when the temperature fluctuation is equal to or less than the allowable value. The substrate coating apparatus of claim 1 or 2, wherein the suspension and the spear platform are Mixing and forming a plurality of discharge holes for discharging the gas and a plurality of suction holes for sucking the gas; wherein the gas flow is generated during a process in which a pressure gas ejected from the plurality of discharge holes is sucked by the plurality of suction holes The gas flow control means switches between a gas supply path of the plurality of discharge holes and a gas suction path for opening and closing the plurality of suction holes by opening and closing the gas suction path of the plurality of suction holes. 8 - a substrate coating method, characterized in that it is used to apply a treatment liquid sprayed from a specific nozzle to a tomb; the method includes the following steps: by passing a gas hole provided on the platform surface a first step of forming a pressure gas layer on the platform surface and suspending the substrate by the pressure gas layer; 146775.doc 201039928 temporarily stopping the gas flow in a specific region of the platform surface deviating from the substrate existence region and directly below the nozzle; lowering the nozzle from the specific waiting height toward the specific region; moving the nozzle relative to the substrate to cause the nozzle Arranging the processing liquid from the nozzles above the application start position of the substrate, and restarting the formation of the gas flow in the specific region until the discharge of the processing liquid is started. 146775.doc
TW099106182A 2009-03-27 2010-03-03 Substrate coating apparatus and substrate coating method TWI433731B (en)

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