201022692 六、發明說明： . 【發明所屬之技術領域】 本發明有關於-種顯示模組之老化測試裝置。更 的是’本發明有關於能夠同時執行顯示模組老化試」 顯示模組老化測試裝置。 ° 【先前技術】 在顯示模組之製造處理期間中，使用藉由施加電壓與 訊號給予模卜段預定的時間週期㈣試每個模組的操作 狀態與耐用性之處理，而該處理被指稱為—種老化測試。201022692 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to an aging test apparatus for a display module. What is more, the present invention relates to a display module aging test device capable of simultaneously performing a display module aging test. [Prior Art] During the manufacturing process of the display module, the processing of the operating state and durability of each module is performed by applying a voltage and a signal to the die for a predetermined period of time (4), and the process is referred to as For an aging test.
就顯示模組而言，於切Μ备相松A 固模組之刖，在模組架置 於其上的母板單元之上，勃杆去彳 執行老化測試。由於具有測試便 於執行而且能夠透過發生故障的映射位置簡易地檢測到故 障之優點’因此經常制如此的母板單元老化測試。然而， 由於要在串聯耗合且彼此並聯的 I聯的諸多模組上執行測試，因 此串聯或並聯迴路會存在於镱政士 ，， 隹於線路中。如此的迴路會在訊號 中產生雜訊，並且產生會影摩网沒 土 H譬周邊模組的漏電流。所以， 並不能夠執行準確的測試。再去 丹者，當母板的某些模組發生 問題時，周邊的模組與後路可At 兴琛路可忐會受到該問題的影響，致 使整體母板的老化測試不能夠順暢地執行。 其間，根據顯示器尺寸的描 孬人了的増加，而增大了模組之尺寸。 然而，當每個模組的尺寸增心 ’傳統測試整體母板的方法 便會有所不利。例如，増大卷彻 曰穴母個模組的尺寸，將致使某一 母板中所包含的模組數目減少。 攸而生產力會下降。此外， 201022692 隨著模組尺寸增大，因應模組的改變，測試裝置應該要有 所改變1而’在傳統母板單元測試方法卜根據模組的 改變而改變測試裝置乃是困難的。 在此先前技術段落中，以上所揭露的資訊僅為增強了 解本發明之Μ，因而可能包含並非來自本國熟知該項技 術者已知的習知技術資訊。 【發明内容】 已從事本發明，藉以盡力提供一種具有同時執行每個 顯示模組單元老化測試優點之裝置。 根據本發明典範實施例之顯示模組老化測試裝置包 含：以彼此相距固定距離所配置的兩個或者多個框架、一 可轉動地架置於框架上之轉動支撐單元、一由轉動支撐單 元與每個皆與一個顯示模組組合的測試模組所支撐之測試 單元、一將轉動電力傳輸至轉動支撐單元的電力傳輸單 元、將電力供應至電力傳輸單元與測試單元的電源供應 單元、一配置於轉動支撐單元的空心軸上並且電連接至電 源供應單元與測試單元的第一連接單元、以及一控制著電 力傳輸單元與電源供應單元並且分析測試單元所量測到的 資料之控制器。 顯示模組老化測試裝置可進一步包含一圍繞著顯示模 組老化測試裝置之測試室。 該測試室可以包含一將顯示模組架置或者卸除於測試 單元之出入口。 201022692 該測試單元於其中心可以包含—空心抽以為 轉動支撐單元的轉動之用。 了於 顯不模組老化測謎駐m 忒裝置可以進一步包含一電連接至第 一連接單元並且配置於棘 、轉動支撐皁兀之上藉以相應於測試 單元的空心轴之第二連接單元。 該顯示模誕老化測試裝置可以進一步包含一傳輸電力 藉以保持測試單元水平位置之辅助電力傳輸單元。 該轉動支推單具有一圓形或橢圓形的形狀。 該模組電連接至電源供應單元或第一連接單元。 該測試單①可以包含—其中設有顯示模組之組合單 兀、-將電力供應至顯示模組之電源供應單元 '一將訊號 供應至顯示模組之訊號板麻结_ ^ 筑供應單兀、以及一將所產生的資料 從顯示模組傳輸至控制器之訊號傳輸單元。 該測試單元可以配置於轉動支撑單元之轉動預定尺寸 的半徑上。 該測試單元可以相距轉動支稽單元—固^距離來配置 之。 該第一連接單元配置於轉動支撐單元的轉動中心上， 並且可以包含電訊號之輸人與輸出單元，用於電訊號透過 轉動軸之傳輸。 透過第-連接單元，將從控制器所產生的電訊號以及 從電源供應單元所供應的電力傳輸至測試單元，並且透過 第一連接單元，將從顯示模組所產生的資料傳輸至控制器。 根據本發明典範實施例之老化測試系統可以包含兩個 201022692 或多個上述的顯示模紙老化測試裝置。 由於在其中&有測執單元之轉動支撐單元轉動的同 時執行測#疋以根據本發明典範實施例的顯示模組老 化測試裝置能夠連續地執行測試。因此，能夠改善測試效 率。 此外並不需要線路’因此線路所產生的雜訊干擾便 能夠降低，而且訊號延遲能夠減小。所以’能夠準破地執 行測試。 此外，由於針對每個模組執行測試，因此失效的模組 並不會影響其他的模組。所以，能狗更為迅速及有效地執 行測試。 由於測試裝置並不需要裝配架，因此該裝置能夠簡 因此！於將測试處理自動化’而且裝置的維護簡單。 一特：的是，當設有複數個測試單元時，藉由自動加載 、1古單7L至模組所架置之處，便能夠簡易地使整 裝置自動化。 【實施方式】 此後將參照顯示本發明典範實施例之附圖更為完整地 說明本發明。熟知該項技術者將會了解所說明的實施例可 以不違反本發明的精神或範疇之各種方式修改之。 所以，咸認為圖示與說明本質僅為闞述之用，且 制之。整個說明書中，相似的參考數字指示相似。 在整個說明書以及以下的申請專利範圍中，當說明某 201022692 一組件”耦合”至另一 .„ ^ 另組件時，則該組件可以是” ^ & 合至其他組件、或者經疋直接叙 ,,山al 步一組仔電耦合”至其他组 牛。此外，除非明確說明為相 詞，，包含m 物’否則將會了解字 杯打 形意指所敘述的組件之内涵物，而非 其他任何組件之内涵物。 干模圓…5來說明根據本發明典範實施例的顯 不模組老化測試裝置詳細的配置。 圖1至圖3顯示根據本發明典範實施例的顯示模组老 化測試裝置1丨為‘顯示模組老化測試裝置之概要透視圖， 而圖2則為除了測試室19〇之外的部分之概要前視圖。在 圖1 t冑試至！ 9〇圖解為透明的，以為說明内部裝置之 用。圖3為說明第一與第二連接單元16〇與⑽的架構之 概要側視圖。 參照圖卜根據本發明典範實施例的顯示模組老化測試 裝置包含一框架110、複數個測試單元120、一轉動支撐單 το 130、一電力傳輸單元14〇、一電源供應單元、一第 連接單元160(觀看圖3)、一控制器17〇、一第二連接單 元180(觀看圖3)、以及一測試室19〇。 框架110固定與支撐著其中所安裝之構成組件。兩個 或者多個框架110可以彼此固定的距離配置之，以為同時 執行模組的老化與測試之用。由於框架11〇應該耐得住每 個構成組件之重量，因此較佳藉由使用金屬基材質或者剛 硬的高分子聚合體材質來製造之。此外，較佳的是，框架 110具有固體的六面體形狀，用以穩定地支撐每個構成組 201022692 件。然而，只要沒有功能性的問題，框架〗ι〇可以具有角 錐體形狀或者四邊形的六面體形狀，而且框架ιι〇並不需 要一定是固體的。 。轉動支擇單7C 13G為-種會轉動同時支撐複數個測試 單70 12G的架構’其並且透過卜連接單&⑽而連接至 框架1H)。儘管未必如此，_動支撑單元ug可使用鍵條 或扣鏈齒輪之間的連接“以_ m圍繞著轉動支擇軍 凡130中心輪較之方式，連接至框冑1〇〇，其間的該連接方 法並不受限於此。轉動支樓單元13G為__種用以轉動測試 单疋120之構成組件，因而較佳的的是，轉動支擇單元130 具有一中心輪較，其具有相同於第—連接單元16G的空心 轴之形狀’而為原形或者橢圓形。然而，轉動支撐單元130 可以具有各種不同的其他架構，能夠允許其轉動，同時支 撺測試單元120。例如，轉動皮禮置 W動炎擇單7G 130可以具有八面體 或者六面體之架構’或者可以使僅具有一框架之架構，使 鏈條可以直接連接至框架。 力傳輸單元140的電轉^撑單7° 13°接收來自電 電力並且相對於第一連接單元16〇之 :心=1。較佳的是，電力傳輸單元140與轉動支推 ^ /、有簡I的架構，其中電力傳輸單元140的轉動 面直接接觸著轉動立措留_ 皁π 130之邊緣，以為電力傳輸之 用。然而，諸如鏈條、扣鏈齒輪、或者傳動帶之辅助裝置 可替代地使用於電力傳 f之補助裝置 傳輸單元140與轉動支撞„環境而疋’例如，在電力 觸之位置時。 冑早兀m定位於彼此難以直接接 201022692 之單nr12G為—種其中設有顯示模組並且執行測試 棘^ 心轴連接至轉動支撲單元13G，並且執行 130算2試所需的—段時間週期。可以從轉動支擇單元 7算起的相等或隨機距離來設置複數個測試單元12〇,該 =且具有充分的尺寸’藉以在其中組合具有預定尺寸 個模組。較佳的是，測試單元12〇包含複數個以彼 此相同距離配置在相對於轉動支_ 13〇中心的轉動半 徑上之測試裝置。In the case of the display module, after cutting the A-solid module, the aging test is performed on the motherboard unit on which the module is mounted. Such a motherboard unit burn-in test is often performed because it has the convenience of testing and can easily detect the advantages of the fault through the mapped position where the fault occurred. However, since the test is to be performed on a number of modules that are connected in series and connected in parallel with each other, the series or parallel circuit will exist in the line, and will be in the line. Such a loop will generate noise in the signal and cause leakage current in the surrounding module of the camera. Therefore, it is not possible to perform an accurate test. When you go to Dan, when some modules of the motherboard have problems, the surrounding modules and the rear roads can be affected by the problem, so that the aging test of the whole motherboard can not be performed smoothly. . In the meantime, the size of the module is increased according to the description of the size of the display. However, when the size of each module is increased, the traditional method of testing the overall motherboard is disadvantageous. For example, the size of a large module that is rolled into a hole will result in a reduction in the number of modules included in a motherboard. The productivity will drop. In addition, 201022692 As the size of the module increases, the test device should have a change 1 in response to the change of the module. It is difficult to change the test device according to the change of the module in the conventional motherboard unit test method. In the prior art paragraphs, the information disclosed above is only for enhancement of the invention and may include prior art information that is not known to those skilled in the art. SUMMARY OF THE INVENTION The present invention has been made in an effort to provide an apparatus having the advantages of simultaneously performing the aging test of each display module unit. A display module burn-in test apparatus according to an exemplary embodiment of the present invention includes: two or more frames disposed at a fixed distance from each other, a rotating support unit rotatably mounted on the frame, and a rotating support unit and a test unit supported by a test module combined with a display module, a power transmission unit that transmits rotational power to the rotation support unit, a power supply unit that supplies power to the power transmission unit and the test unit, and a configuration And a first connection unit that is electrically connected to the hollow shaft of the support unit and electrically connected to the power supply unit and the test unit, and a controller that controls the power transmission unit and the power supply unit and analyzes the data measured by the test unit. The display module burn-in test apparatus can further include a test chamber surrounding the display mold burn-in test apparatus. The test chamber can include an access port for mounting or unloading the display module to the test unit. 201022692 The test unit can include at its center - hollow pumping for the rotation of the rotating support unit. The display module may further include a second connection unit electrically connected to the first connection unit and disposed on the spine and the rotating support sap to thereby correspond to the hollow shaft of the test unit. The display aging test apparatus can further include an auxiliary power transfer unit that transmits power to maintain the horizontal position of the test unit. The rotating support has a circular or elliptical shape. The module is electrically connected to the power supply unit or the first connection unit. The test sheet 1 may include a combination unit of a display module, a power supply unit for supplying power to the display module, and a signal board for supplying the signal to the display module. And a signal transmission unit that transmits the generated data from the display module to the controller. The test unit may be disposed on a radius of a predetermined size of rotation of the rotary support unit. The test unit can be configured to be spaced apart from the pivoting unit. The first connecting unit is disposed on a rotating center of the rotating supporting unit, and may include an input and output unit of the electric signal for transmitting the electric signal through the rotating shaft. The electrical signal generated from the controller and the power supplied from the power supply unit are transmitted to the test unit through the first connection unit, and the data generated from the display module is transmitted to the controller through the first connection unit. The burn-in test system according to an exemplary embodiment of the present invention may comprise two 201022692 or more of the above-described display mold weathering test devices. The display module aging test apparatus according to the exemplary embodiment of the present invention can perform the test continuously because the rotation of the rotation support unit of the measurement unit is performed while it is being rotated. Therefore, the test efficiency can be improved. In addition, the line is not required. Therefore, the noise interference generated by the line can be reduced, and the signal delay can be reduced. Therefore, it is possible to perform tests on a ground-breaking basis. In addition, since the test is performed for each module, the failed module does not affect other modules. Therefore, dogs can perform tests more quickly and effectively. Since the test set does not require a mounting frame, the device can be simplified! To automate the test process' and the maintenance of the device is simple. One special: When a plurality of test units are provided, the entire device can be easily automated by automatically loading the 1L to the place where the module is mounted. [Embodiment] Hereinafter, the present invention will be described more fully with reference to the accompanying drawings, which illustrate. Those skilled in the art will appreciate that the described embodiments can be modified in various ways without departing from the spirit or scope of the invention. Therefore, Xian thinks that the nature of the illustrations and descriptions is only for the purpose of description, and it is made. Throughout the specification, like reference numerals indicate similar. Throughout the specification and the scope of the following patent application, when a component of "201022692" is "coupled" to another component, the component can be "^ & combined with other components, or directly, , the mountain a step is electrically coupled to other groups of cattle. In addition, unless explicitly stated as a phase, including m objects, otherwise it will understand that the word cup means the content of the component described, not the other A detailed configuration of a display module aging test apparatus according to an exemplary embodiment of the present invention. FIG. 1 to FIG. 3 show a display module aging test apparatus according to an exemplary embodiment of the present invention. 1丨 is a schematic perspective view of the 'display module aging test device, and Fig. 2 is a schematic front view of the part other than the test chamber 19〇. In Fig. 1 t胄 test to! 9〇 diagram is transparent, thought Figure 3 is a schematic side view showing the architecture of the first and second connecting units 16A and (10). Referring to Figure 2, the display module burn-in test apparatus according to an exemplary embodiment of the present invention includes a frame. 110, a plurality of test units 120, a rotating support unit το 130, a power transmission unit 14A, a power supply unit, a first connection unit 160 (see FIG. 3), a controller 17A, and a second connection unit 180 (View Figure 3), and a test chamber 19A. The frame 110 secures and supports the component components mounted therein. The two or more frames 110 can be configured at a fixed distance from each other to perform simultaneous aging and testing of the module. Since the frame 11〇 should withstand the weight of each constituent component, it is preferably manufactured by using a metal-based material or a rigid polymer material. Further, preferably, the frame 110 has Solid hexahedral shape to stably support each component group 201022692. However, as long as there is no functional problem, the frame can have a pyramid shape or a quadrilateral hexahedron shape, and the frame is ιι〇 It does not need to be solid. The rotation of the 7C 13G is a kind of structure that will rotate and support a plurality of test orders 70 12G, and it is connected by a single connection & (10) Connected to frame 1H). Although not necessarily, the _ movable support unit ug can use the connection between the key strip or the sprocket gear to "connect to the frame 较 1 by way of _ m around the rotation of the selected 130 center wheel Oh, the connection method in between is not limited to this. The rotating branch unit 13G is a component for rotating the test unit 120. Therefore, it is preferable that the rotation supporting unit 130 has a center wheel having a hollow shaft which is the same as the first connecting unit 16G. The shape 'is a prototype or an ellipse. However, the rotation support unit 130 may have various other structures that allow it to rotate while supporting the test unit 120. For example, a rotating singularity 7G 130 may have an octahedral or hexahedral structure or may have a frame with only one frame so that the chain can be directly attached to the frame. The electrical transfer unit 140 receives the electrical power from the electrical power and is relative to the first connecting unit 16: heart = 1. Preferably, the power transmission unit 140 and the rotating support structure have a simple structure, wherein the rotating surface of the power transmission unit 140 is in direct contact with the edge of the rotating erection _ π π 130 for power transmission. However, an auxiliary device such as a chain, a sprocket, or a belt may alternatively be used for the power transmission unit 140 to transmit the unit 140 to the slewing environment, for example, at the position of the power contact. The single nr12G located in a position that is difficult to directly connect to each other in 201022692 is a period in which a display module is provided and a test ratchet is connected to the rotating baffle unit 13G, and 130 is required to perform a test. The plurality of test units 12A are set by rotating the equal or random distances from the selection unit 7, which has a sufficient size 'to which a module having a predetermined size is combined therein. Preferably, the test unit 12 includes A plurality of test devices disposed at the same distance from each other at a radius of rotation relative to the center of the pivotal branch _ 13 。.
將參照圖4說明測試單元12〇詳細的配置。測試單元 120能夠相對於其空心軸而轉動，藉以在轉動支撐單元130 之轉動期間中保持其水平位置。測試單元12〇可以直接連 接至轉動支撐單元130’或者可以透過連接構件⑴連接至 轉動支撐早％ 13〇,而測試單元m與轉動支撑單元⑽之 間的連接方法能夠改變，只要連接能夠致能測試單元12〇 藉以和轉動支料A 13G __起轉動即可。此外，測試單元 120可以包含一輔助電力傳輸單元（並無顯示），藉以傳輸電 力進而保持其水平位置。 第一連接單元160透過第二連接單元18〇電連接至測 試單元120，並且包含電訊號之輸入單元16ι以及輸出單元 K3。第一連接單元16〇設於框架u〇上並且將轉動支撐 單π 130連接至框架11〇，同時將其空心轴吻合於轉動支撐 單兀13〇之中心輪轂。此外，第一連接單元160會透過電 訊號的輸入單元161接收從控制器17〇所產生的訊號以及 從電源供應單元150所產生的電力，並且透過電訊號的輸 10 201022692 出單元163 ’將所接收到的訊號與電力傳輪至測試單元 120。經由第一連接單元160的輸出單元163與輸入單元 161，將從測試單元120所產生的訊號傳輸至控制器ι7〇。 第二連接單元180設置於轉動支撐單元13〇之中以 便與測試單元120分享空心軸，致使將測試單元12〇強健 地連接至轉動支撐單元130’並且電連接著第一連接單元 160與測試單元120。 第一與第二連接單元160與180可以—種透過轉動軸 ® 來傳輸電訊號的滑環形成之。此外，在本發明中，滑環可 以鍵銅（Cu)的銀（Ag)所製作之材質來形成之。 電源供應單元150會將電力供應至測試單元12〇、電力 傳輸單元14〇、以及控制器17〇,並且可以根據測試單元的 電容量而使用典型的電源供應單元》 控制器170會提供一測試訊號給予測試單元12〇，並且 控制電力傳輸單元14〇。此外，控制器17〇會接收測試單元 e I20所量測到的資料，並且判斷執行測試是否沒有錯誤。控 制器170可以包含一個額外的顯示裝置（並無顯示），以為使 用者直接檢査測試處理之用。 電力傳輸單元140提供轉動支撐單元13〇轉動之電 力，並且包含DC或AC馬達以及傳輸電力之工具，例如傳 動帶、鏈條、傳動裝置或者扣鏈齒輪。根據電力傳輸單元 14〇與轉動支撐單元130的相對位置與形狀，有所選擇地應 用電力傳輸工具。 形成測試室19〇,藉以圍繞著框架11〇以及每個構成組 201022692 件，並且包含一出入口 191，用以將顯示模組附加/分離於 測試單元120。設置測試室190用以保護每個構成組件，並 且可以具有執行所需功能的各種不同之形狀。 圖4為測試單元12〇詳細的概要透視圖。根據本發明 典範實施例之測試單元120包含一組合單元123、一終端單 το 121、一電源供應單元（並無顯示）、一訊號供應單元（並無 顯示）、以及一訊號傳輸單元（並無顯示）。 組合單元123會組合顯示模組與測試單元丨2〇，並且根 據測試目標模組的形狀，可以具有各種不同的形狀。測試 ◎ 目標模組通常形成為六面體形狀，因而組合單元123可以 由圖4所示的組合凹槽所形成，而測試目標模組則可以置 於其中。 終端單元121由用以連接模組與電力傳輸單元的第一 終端1211、用以連接模組與訊號供應單元的第二終端 1213、以及用以連接模組與訊號傳輸單元的第三終端i2i5 所形成。 傳導性材質所製作的墊片可以用來充當每個終端 ❹ 1211、1213與1215,而且可以根據模組的架構而使用諸如 接腳或傳導橡膠之各種不同介面。 電源供應單元與訊號供應單元分別由處理及整流訊號 之電路所形成，並且重新處理與整流從控制器17〇與電源 供應單元150所提供的訊號與電力，藉以提供已重新處理 與整流後的訊號與電力給予每個模組。訊號傳輸單元由一 訊號處理電路所形成，並且根據測試而將模組所產生的資 12 201022692 料傳輸至控制器170。 如所說明的，由於能夠將電力與訊號分離地供應至每 個模組，因此能夠將輸入訊號中所產生的不必要雜訊最小 化。所以’測試能夠更為準確。此外’不像母板單元測試 -般，由於當模組中發生錯誤時，能夠選擇具有錯誤的模 組，因此能夠進一步改善測試的效率。 此時將說明根據本發明典範實施例的顯示模組老化測 試裝置之操作方法以及其相關優點。 參首先’透過測試室190的出入口 19卜將測試目標模組 依序地架置於測試單元120。接著，當電力透過控制器170 而供應至電源供應單元150時，將電力與訊號輸入至模組， 同時轉動支撐單元130會透過電力傳輸單元14〇以固定的 速度轉動。在預定時間週期内通過老化測試的模組則經由 出入口 191退出，並且輸送至下一個製造處理，並且透過 出入口 191，將新的模組架置於測試單元12〇上。由於將每 藝個模組架置於測試單元120上的次數互不相同’因此測試 完成的次數同樣互不相同。因此，除了將模組初始架置於 .整個測試單元120上的狀況之外，輸送已測試完成模組以 及架置新模組之全部處理為連續的，致使能夠明顯地改善 模組測試效率。此外，不似母板的是，老化與測試模組會 同時轉動’而且由於每個模組的尺寸不會大於母板的尺 寸’故而使根據本發明典範實施例的測試裝置值夠安裝於 相對較小的區域中，因此模組能夠垂直地轉動。 將參照圖5來說明由根據本發明典範實施例的顯示模 13 201022692 組老化測試裝置所形成的系統》 圖5顯示由根據本發明典範實施例的最小單元所形成 的老化測試系統1 00之概要透視圖。 根據本發明典範實施例的老化測試系統200由兩個或 者更多顯示模組老化測試裝置1〇〇所形成。每個顯示模組 老化測試裝置100傾斜地重疊於另一者，致使能夠外部開 啟出入口 191。由於每個模組皆能夠透過出入口 191附加與 分離，是以顯示模組老化測試裝置1〇〇彼此能夠整個重疊， 除了出入口 191之外’因而在小空間中能夠提供大量的測 試裝置因此，能夠進一步有效地執行同時的老化測試。 實驗範例 傳統的母板單元測試方法與根據本發明典範實施例的 測試方法能夠比較如下。 的老化行為平均耗費2.5小 均需0.5小時。換言之，去The detailed configuration of the test unit 12 will be explained with reference to FIG. The test unit 120 is rotatable relative to its hollow shaft to maintain its horizontal position during rotation of the rotary support unit 130. The test unit 12A may be directly connected to the rotation support unit 130' or may be connected to the rotation support early through the connection member (1), and the connection method between the test unit m and the rotation support unit (10) can be changed as long as the connection can be enabled The test unit 12 can be rotated by rotating the material A 13G __. In addition, test unit 120 can include an auxiliary power transfer unit (not shown) for transmitting power to maintain its horizontal position. The first connecting unit 160 is electrically connected to the test unit 120 through the second connecting unit 18, and includes an input unit 161 for the electrical signal and an output unit K3. The first connecting unit 16 is disposed on the frame u〇 and connects the rotating support unit π 130 to the frame 11〇 while the hollow shaft thereof is fitted to the center hub of the rotating support unit 13兀. In addition, the first connection unit 160 receives the signal generated from the controller 17A and the power generated from the power supply unit 150 through the input unit 161 of the electrical signal, and transmits the signal through the electrical signal 10 201022692 out unit 163 ' The received signal and power are transmitted to the test unit 120. The signal generated from the test unit 120 is transmitted to the controller ι7 via the output unit 163 of the first connection unit 160 and the input unit 161. The second connecting unit 180 is disposed in the rotating support unit 13 以便 to share the hollow shaft with the testing unit 120 , so that the testing unit 12 〇 is strongly connected to the rotating supporting unit 130 ′ and electrically connected to the first connecting unit 160 and the testing unit 120. The first and second connecting units 160 and 180 can be formed by a slip ring that transmits an electrical signal through the rotating shaft ® . Further, in the present invention, the slip ring may be formed of a material made of copper (Ag) of copper (Cu). The power supply unit 150 supplies power to the test unit 12A, the power transfer unit 14A, and the controller 17A, and can use a typical power supply unit according to the capacitance of the test unit. The controller 170 provides a test signal. The test unit 12 is given and the power transfer unit 14 is controlled. In addition, the controller 17 receives the data measured by the test unit e I20 and determines whether the test is performed without errors. The controller 170 can include an additional display device (not shown) for the user to directly check the test process. The power transmission unit 140 provides power for rotating the support unit 13 and includes a DC or AC motor and a tool for transmitting power, such as a transmission belt, a chain, a transmission, or a sprocket. The power transmission tool is selectively applied in accordance with the relative position and shape of the power transmission unit 14A and the rotation support unit 130. A test chamber 19 is formed to surround the frame 11 and each of the constituent groups 201022692, and includes an entrance 191 for attaching/detaching the display module to the test unit 120. A test chamber 190 is provided to protect each of the constituent components and may have a variety of different shapes that perform the desired functions. 4 is a detailed schematic perspective view of the test unit 12A. The test unit 120 according to the exemplary embodiment of the present invention comprises a combination unit 123, a terminal unit το 121, a power supply unit (not shown), a signal supply unit (not shown), and a signal transmission unit (not display). The combination unit 123 combines the display module with the test unit 〇2〇, and may have various shapes depending on the shape of the test target module. Test ◎ The target module is usually formed in a hexahedral shape, so that the combining unit 123 can be formed by the combined recess shown in Fig. 4, and the test target module can be placed therein. The terminal unit 121 includes a first terminal 1211 for connecting the module and the power transmission unit, a second terminal 1213 for connecting the module and the signal supply unit, and a third terminal i2i5 for connecting the module and the signal transmission unit. form. Pads made of conductive materials can be used to act as each of the terminals 11 1211, 1213, and 1215, and various interfaces such as pins or conductive rubber can be used depending on the architecture of the module. The power supply unit and the signal supply unit are respectively formed by circuits for processing and rectifying signals, and reprocessing and rectifying the signals and power supplied from the controller 17 and the power supply unit 150, thereby providing the reprocessed and rectified signals. Give each module with power. The signal transmission unit is formed by a signal processing circuit, and transmits the resource 12 201022692 generated by the module to the controller 170 according to the test. As explained, since power and signals can be separately supplied to each module, unnecessary noise generated in the input signal can be minimized. So 'testing can be more accurate. In addition, unlike the motherboard unit test, the efficiency of the test can be further improved by selecting an error group when an error occurs in the module. The method of operation of the display module aging test apparatus and its related advantages in accordance with an exemplary embodiment of the present invention will now be described. The test target modules are sequentially placed in the test unit 120 through the entrances and exits 19 of the test chamber 190. Then, when the power is supplied to the power supply unit 150 through the controller 170, the power and the signal are input to the module, and the rotation support unit 130 is rotated by the power transmission unit 14 at a fixed speed. The module that passed the burn-in test during the predetermined time period exits via the entrance and exit 191 and is transported to the next manufacturing process, and the new module rack is placed on the test unit 12 through the entrance and exit 191. Since the number of times each of the module racks is placed on the test unit 120 is different from each other', the number of times the test is completed is also different from each other. Therefore, in addition to the condition that the initial frame of the module is placed on the entire test unit 120, the entire process of transporting the tested completion module and mounting the new module is continuous, so that the module test efficiency can be significantly improved. In addition, unlike the motherboard, the aging and test modules will simultaneously rotate 'and because each module is not larger than the size of the motherboard', so that the test device value according to the exemplary embodiment of the present invention is sufficient to be mounted on the relative In a smaller area, the module can be rotated vertically. A system formed by a display die 13 201022692 group burn-in test apparatus according to an exemplary embodiment of the present invention will be described with reference to FIG. 5. FIG. 5 shows an outline of an burn-in test system 100 formed by a minimum unit according to an exemplary embodiment of the present invention. perspective. The burn-in test system 200 in accordance with an exemplary embodiment of the present invention is formed from two or more display module burn-in test devices. Each of the display module burn-in test devices 100 is obliquely overlapped with the other, so that the entrance and exit 191 can be externally opened. Since each module can be attached and detached through the entrance and exit 191, the display module aging test device 1 整个 can completely overlap each other, except for the entrance and exit 191. Therefore, a large number of test devices can be provided in a small space. The simultaneous aging test is performed more efficiently. Experimental Example A conventional motherboard unit test method and a test method according to an exemplary embodiment of the present invention can be compared as follows. The average aging behavior takes 2.5 hours and takes 0.5 hours. In other words, go
的模組 首先，在傳統母板單元測試方法之狀況下，一個母板 小時，而測試已老化完成的母板平 老化與測試一個母板耗費三小時， 時，一個測試裝置中能夠測試8個 85%，而工作天數為3〇，則每個 丨進行204個母板之老化與測試。 去。將架置於一個測試單 而測試與重新放置架置於 鐘。因此，儘管第一測試 但在第一測試單元之後， 201022692 連續地執行之後的測試單元之測試與架置，因此應該認為 僅需ίο分鐘’此時間乃是用以測試與架置。儘管測試單元 的數目與架置於娜試單元的模組數目可能會導致某種差 異’然而在行動裝置中廣泛使用的16至4英相模組用作 參考。-般而言，測試裝置包含7個測試單元，而來自一 個母板的模組能夠架置於一個測試單元，因而處理該模組 耗費1.67小時。因此’當設備操作率設為85%，而工作天 瘳數為30 ’則在一個月内，一個裝置大約能夠處理別個母 板。特別的是，相較於母板單元測試方法，根據本發明典 2實施例的模組規格老化測試裝置佔據較小㈣間，因而 當藉由連接複數個測試裝置來形成系統時，能夠進一步有 效執行其測試。 儘f不考慮計算，不像其中具有故障的模組會影響周 i模组之傳統方法’能夠各別地供應每個模組之電力與訊 號’致使當藉由使用根據本發明典範實執 _測試時，能夠執行測試而沒有錯誤或延遲。 來執仃 8在已經連結目前所認為的實際典範實施例說明了本發 2的同時’所要了解的是’本發明並不受限於所揭露的實 方例，但相反的是預期涵蓋各種不同的修改與等效佈置， 其包含於所附的申請專利範園之精神與㈣之内。 【圖式簡單說明】 於顯示模組的顯示模 圖1為根據本發明典範實施例用 組老化測試裝置之概要透視圖。 15 201022692 測試裝 圖2為根據本發明典範實施例的顯示模式老化 置之概要前視圖。 圖3為根據本發明典範實施例的顯示模式老化測試裝 置之概要側視囷。 圖4為測試單元之概要透視圖。 圖5為根據本發明典範實施例的老化測試系統之概要 透視圖。 【主 要元件符號說明】 100 _ 顯不模組老化 Π0 框架 111 連接構件 120 測試單元 121 終端單元 1211 第一終端 1213 第二終端 1215 第三終端 123 組合單元 130 轉動支撐單元 140 _ 150 160 電力傳輪單元 電源供應單元 第一連接單元 161 u 衔入單元 163 輸出單元 挪試裝置The module firstly, in the condition of the traditional motherboard unit test method, one motherboard time, and the test aging aging of the motherboard flat aging and testing a motherboard takes three hours, when a test device can test 8 85%, and the number of working days is 3〇, then each 丨 is subjected to aging and testing of 204 mother boards. go with. Place the rack on a test sheet and place the test and reposition rack in the clock. Therefore, despite the first test, after the first test unit, 201022692 continuously performs the test and mounting of the subsequent test unit, it should be considered that only ε minutes is required for testing and mounting. Although the number of test units and the number of modules placed on the test unit may cause some difference, the 16 to 4 inch modules widely used in mobile devices are used as a reference. In general, the test set contains 7 test units, and the module from one motherboard can be placed in a test unit, so it takes 1.67 hours to process the module. Therefore, when the equipment operating rate is set to 85% and the number of working days is 30 ’, one device can handle about another motherboard in one month. In particular, the module specification aging test apparatus according to the embodiment 2 of the present invention occupies a small (four) space compared to the motherboard unit test method, and thus can be further effective when the system is formed by connecting a plurality of test devices. Perform its tests. Do not consider calculations, unlike the traditional method in which the faulty module affects the module i can supply the power and signal of each module individually, so that by using the exemplary implementation according to the present invention _ When testing, the test can be performed without errors or delays. The present invention is not limited to the disclosed embodiments, but the contrary is intended to cover various differences while the present invention is described in the context of what has been described as a practical example. Modifications and equivalent arrangements are included in the spirit and (4) of the attached patent application. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic perspective view of a group aging test apparatus according to an exemplary embodiment of the present invention. 15 201022692 Test Pack Figure 2 is a schematic front view of a display mode aging arrangement in accordance with an exemplary embodiment of the present invention. 3 is a schematic side view of a display mode burn-in test apparatus in accordance with an exemplary embodiment of the present invention. Figure 4 is a schematic perspective view of the test unit. Figure 5 is a schematic perspective view of an burn-in test system in accordance with an exemplary embodiment of the present invention. [Main component symbol description] 100 _ display module aging Π 0 frame 111 connection member 120 test unit 121 terminal unit 1211 first terminal 1213 second terminal 1215 third terminal 123 combination unit 130 rotation support unit 140 _ 150 160 power transmission wheel Unit power supply unit first connection unit 161 u engagement unit 163 output unit
16 201022692 170 控制器 180 第二連接單元 190 測試室 191 出入口 200 老化測試系統16 201022692 170 Controller 180 Second connection unit 190 Test room 191 Entrance and exit 200 Aging test system
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