TW201018955A - Optical imaging system, exposure device and device manufacturing method - Google Patents
Optical imaging system, exposure device and device manufacturing method Download PDFInfo
- Publication number
- TW201018955A TW201018955A TW098133825A TW98133825A TW201018955A TW 201018955 A TW201018955 A TW 201018955A TW 098133825 A TW098133825 A TW 098133825A TW 98133825 A TW98133825 A TW 98133825A TW 201018955 A TW201018955 A TW 201018955A
- Authority
- TW
- Taiwan
- Prior art keywords
- mirror
- optical system
- imaging optical
- light
- imaging
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
- G02B17/0657—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors off-axis or unobscured systems in which all of the mirrors share a common axis of rotational symmetry
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70233—Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008287356 | 2008-11-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201018955A true TW201018955A (en) | 2010-05-16 |
Family
ID=42152771
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW098133825A TW201018955A (en) | 2008-11-10 | 2009-10-06 | Optical imaging system, exposure device and device manufacturing method |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW201018955A (fr) |
WO (1) | WO2010052961A1 (fr) |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003015040A (ja) * | 2001-07-04 | 2003-01-15 | Nikon Corp | 投影光学系および該投影光学系を備えた露光装置 |
JP2004170869A (ja) * | 2002-11-22 | 2004-06-17 | Nikon Corp | 結像光学系、露光装置および露光方法 |
JP2006245148A (ja) * | 2005-03-01 | 2006-09-14 | Canon Inc | 投影光学系、露光装置及びデバイスの製造方法 |
JP4366151B2 (ja) * | 2003-09-09 | 2009-11-18 | キヤノン株式会社 | 投影光学系、露光装置及びデバイスの製造方法 |
JP2006243197A (ja) * | 2005-03-01 | 2006-09-14 | Canon Inc | 投影光学系、露光装置及びデバイスの製造方法 |
JP4438060B2 (ja) * | 2003-09-02 | 2010-03-24 | キヤノン株式会社 | 投影光学系、露光装置及びデバイスの製造方法 |
JP4387902B2 (ja) * | 2004-09-09 | 2009-12-24 | キヤノン株式会社 | 反射型投影光学系、当該投影光学系を有する露光装置、並びに、デバイス製造方法 |
JP2006245147A (ja) * | 2005-03-01 | 2006-09-14 | Canon Inc | 投影光学系、露光装置及びデバイスの製造方法 |
US7973908B2 (en) * | 2005-05-13 | 2011-07-05 | Carl Zeiss Smt Gmbh | Six-mirror EUV projection system with low incidence angles |
JP2008158211A (ja) * | 2006-12-22 | 2008-07-10 | Canon Inc | 投影光学系及びそれを用いた露光装置 |
-
2009
- 2009-08-10 WO PCT/JP2009/064104 patent/WO2010052961A1/fr active Application Filing
- 2009-10-06 TW TW098133825A patent/TW201018955A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2010052961A1 (fr) | 2010-05-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US11467501B2 (en) | Image-forming optical system, exposure apparatus, and device producing method | |
TWI328719B (en) | A sensor for use in a lithographic apparatus | |
TWI468838B (zh) | 成像光學系統與包含此類型成像光學系統之用於微影的投影曝光裝置 | |
JP6221160B2 (ja) | ミラーの配置 | |
TW200931061A (en) | Spatial light modulation unit, illumination optical apparatus, exposure apparatus, and device manufacturing method | |
JP2003233001A (ja) | 反射型投影光学系、露光装置及びデバイス製造方法 | |
TWI283798B (en) | A microlithography projection apparatus | |
US9146475B2 (en) | Projection exposure system and projection exposure method | |
CN102870030B (zh) | 成像光学系统和具有这种成像光学系统的用于微光刻的投射曝光设备 | |
TW200406593A (en) | Projection optical system and exposure device equipped with the projection optical system | |
TWI701458B (zh) | 反射折射光學系統、照明光學系統、曝光裝置及物品製造方法 | |
TW201018955A (en) | Optical imaging system, exposure device and device manufacturing method | |
JP6365723B2 (ja) | 反射結像光学系、結像方法、露光装置、露光方法、およびデバイス製造方法 | |
TW200915017A (en) | Illumination optical system, illumination optical apparatus, exposure apparatus, and device manufacturing method | |
TW530335B (en) | Image-forming optical system and exposure device equipped therewith | |
TW200907588A (en) | Catoptric reduction projection optical system, exposure apparatus, and method for manufacturing device |