TW201001581A - Testing seat and testing equipment for semiconductors having a variable temperature device - Google Patents
Testing seat and testing equipment for semiconductors having a variable temperature device Download PDFInfo
- Publication number
- TW201001581A TW201001581A TW97123059A TW97123059A TW201001581A TW 201001581 A TW201001581 A TW 201001581A TW 97123059 A TW97123059 A TW 97123059A TW 97123059 A TW97123059 A TW 97123059A TW 201001581 A TW201001581 A TW 201001581A
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor
- temperature
- connector
- semiconductor component
- top surface
- Prior art date
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- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97123059A TW201001581A (en) | 2008-06-20 | 2008-06-20 | Testing seat and testing equipment for semiconductors having a variable temperature device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97123059A TW201001581A (en) | 2008-06-20 | 2008-06-20 | Testing seat and testing equipment for semiconductors having a variable temperature device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201001581A true TW201001581A (en) | 2010-01-01 |
TWI364085B TWI364085B (ko) | 2012-05-11 |
Family
ID=44824913
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW97123059A TW201001581A (en) | 2008-06-20 | 2008-06-20 | Testing seat and testing equipment for semiconductors having a variable temperature device |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW201001581A (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI718815B (zh) * | 2019-12-18 | 2021-02-11 | 四方自動化機械股份有限公司 | 多晶片多功能測試系統 |
TWI732433B (zh) * | 2020-01-21 | 2021-07-01 | 四方自動化機械股份有限公司 | 利用金屬載盤進行晶片自動化測試分類的系統及方法 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108666230B (zh) * | 2017-03-28 | 2020-12-18 | 至成精密工业股份有限公司 | 用于电子产品的整平设备 |
-
2008
- 2008-06-20 TW TW97123059A patent/TW201001581A/zh unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI718815B (zh) * | 2019-12-18 | 2021-02-11 | 四方自動化機械股份有限公司 | 多晶片多功能測試系統 |
TWI732433B (zh) * | 2020-01-21 | 2021-07-01 | 四方自動化機械股份有限公司 | 利用金屬載盤進行晶片自動化測試分類的系統及方法 |
Also Published As
Publication number | Publication date |
---|---|
TWI364085B (ko) | 2012-05-11 |
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