TW200951418A - Eccentricity measuring method - Google Patents

Eccentricity measuring method

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Publication number
TW200951418A
TW200951418A TW98117423A TW98117423A TW200951418A TW 200951418 A TW200951418 A TW 200951418A TW 98117423 A TW98117423 A TW 98117423A TW 98117423 A TW98117423 A TW 98117423A TW 200951418 A TW200951418 A TW 200951418A
Authority
TW
Taiwan
Prior art keywords
lens
eccentricity
slope
induced
axial
Prior art date
Application number
TW98117423A
Other languages
Chinese (zh)
Other versions
TWI396837B (en
Inventor
Ping Sun
Original Assignee
Fujinon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujinon Corp filed Critical Fujinon Corp
Publication of TW200951418A publication Critical patent/TW200951418A/en
Application granted granted Critical
Publication of TWI396837B publication Critical patent/TWI396837B/en

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Abstract

The present invention relates to an eccentricity measuring method using auto-collimation. The method can easily separate eccentricity induced by axial slope from that induced by axial offset, wherein said eccentricities are encountered in non-spherical lens. The method consists of following steps: First, (S1) adjust and reduce the slope of lens carrier 22. At this point, remove object lens 15. Then, (S2) place and install lens 10 at the lens carrier 22. (S3) Find the relative slope of the cutting terminal faces 10FA, 10FB on the lens 10. (S4) According to the relative slope of the cutting terminal faces obtained at step S3, calculate the eccentricity induced by the axial slope. (S5) Install the object lens 15 at device 1 in order to rotate the lens carrier 22 at a preset angle, find the central location of a rectile image during each rotation operation. Measure the trajectory circle radius of the rectile image so as to find total eccentricity of the lens 10. Finally, (S6) calculate the eccentricity induced by said axial offset by subtracting the eccentricity induced by said axial slope from the total eccentricity.
TW98117423A 2008-06-10 2009-05-26 Method for determination of eccentricity TWI396837B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008152296 2008-06-10
JP2009108549A JP5362431B2 (en) 2008-06-10 2009-04-27 Eccentricity measurement method

Publications (2)

Publication Number Publication Date
TW200951418A true TW200951418A (en) 2009-12-16
TWI396837B TWI396837B (en) 2013-05-21

Family

ID=41704865

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98117423A TWI396837B (en) 2008-06-10 2009-05-26 Method for determination of eccentricity

Country Status (2)

Country Link
JP (1) JP5362431B2 (en)
TW (1) TWI396837B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102221449A (en) * 2010-04-19 2011-10-19 鸿富锦精密工业（深圳）有限公司 Auxiliary device for measuring eccentric quantity
CN102822656A (en) * 2010-04-13 2012-12-12 柯尼卡美能达先进多层薄膜株式会社 Eccentric amount measuring method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015146634A1 (en) * 2014-03-28 2015-10-01 コニカミノルタ株式会社 Method for measuring amount of eccentricity of aspherical surface and method for analyzing shape of aspherical surface
CN105823625B (en) * 2016-04-27 2019-01-04 北京航天发射技术研究所 The detection method of self-collimating angle measuring light tube photo electric axis stability
CN112327471B (en) * 2018-10-30 2022-10-14 深圳市真迈生物科技有限公司 Microscope system, adjusting method thereof and sequencing system

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0875597A (en) * 1994-09-02 1996-03-22 Ricoh Co Ltd Non-spherical surface eccentricity measuring machine
US5854852A (en) * 1995-08-02 1998-12-29 Lucent Technologies Inc. Eccentricity determination system and method for accurately computing an offset of a central feature of an object
JP2003344219A (en) * 2002-05-29 2003-12-03 Nikon Corp Method and instrument for measuring eccentricity, manufacturing method for projection optical system, and projection optical system
US6990430B2 (en) * 2002-12-20 2006-01-24 Brooks Automation, Inc. System and method for on-the-fly eccentricity recognition
JP2005024254A (en) * 2003-06-30 2005-01-27 Mitsutoyo Corp Information processor, calibration method for the same, information processing program, record medium recording the program, and eccentricity measuring apparatus
JP2005055202A (en) * 2003-08-06 2005-03-03 Mitsutoyo Corp Eccentricity measuring device, lens mounting method, and eccentricity measuring method for lens
JP2007127473A (en) * 2005-11-02 2007-05-24 Hoya Corp Measuring method, device, and program of aspheric lens, manufacturing method of aspheric lens, and aspheric lens
JP4815273B2 (en) * 2006-06-02 2011-11-16 富士フイルム株式会社 Optical element rotation holding device
JP4774332B2 (en) * 2006-06-06 2011-09-14 富士フイルム株式会社 Eccentricity measurement method
JP4943946B2 (en) * 2007-06-04 2012-05-30 富士フイルム株式会社 Eccentricity measuring device
JP2008304200A (en) * 2007-06-05 2008-12-18 Fujinon Corp Method for adjusting height position of eccentricity measuring head

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102822656A (en) * 2010-04-13 2012-12-12 柯尼卡美能达先进多层薄膜株式会社 Eccentric amount measuring method
CN102822656B (en) * 2010-04-13 2016-05-11 柯尼卡美能达先进多层薄膜株式会社 Offset measuring method
CN102221449A (en) * 2010-04-19 2011-10-19 鸿富锦精密工业（深圳）有限公司 Auxiliary device for measuring eccentric quantity
CN102221449B (en) * 2010-04-19 2015-01-21 鸿富锦精密工业（深圳）有限公司 Auxiliary device for measuring eccentric quantity

Also Published As

Publication number Publication date
JP2010019832A (en) 2010-01-28
TWI396837B (en) 2013-05-21
JP5362431B2 (en) 2013-12-11

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