TW200951418A - Eccentricity measuring method - Google Patents
Eccentricity measuring methodInfo
- Publication number
- TW200951418A TW200951418A TW98117423A TW98117423A TW200951418A TW 200951418 A TW200951418 A TW 200951418A TW 98117423 A TW98117423 A TW 98117423A TW 98117423 A TW98117423 A TW 98117423A TW 200951418 A TW200951418 A TW 200951418A
- Authority
- TW
- Taiwan
- Prior art keywords
- lens
- eccentricity
- slope
- induced
- axial
- Prior art date
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008152296 | 2008-06-10 | ||
JP2009108549A JP5362431B2 (ja) | 2008-06-10 | 2009-04-27 | 偏芯量測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200951418A true TW200951418A (en) | 2009-12-16 |
TWI396837B TWI396837B (zh) | 2013-05-21 |
Family
ID=41704865
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW98117423A TWI396837B (zh) | 2008-06-10 | 2009-05-26 | Method for determination of eccentricity |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5362431B2 (zh) |
TW (1) | TWI396837B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102221449A (zh) * | 2010-04-19 | 2011-10-19 | 鸿富锦精密工业(深圳)有限公司 | 测量偏心量辅助装置 |
CN102822656A (zh) * | 2010-04-13 | 2012-12-12 | 柯尼卡美能达先进多层薄膜株式会社 | 偏心量测量方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015146634A1 (ja) * | 2014-03-28 | 2015-10-01 | コニカミノルタ株式会社 | 非球面の偏心量測定方法及び形状解析方法 |
CN105823625B (zh) * | 2016-04-27 | 2019-01-04 | 北京航天发射技术研究所 | 自准直测角光管光电轴稳定性的检测方法 |
CN112327471B (zh) * | 2018-10-30 | 2022-10-14 | 深圳市真迈生物科技有限公司 | 显微镜系统及其调校方法及测序系统 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0875597A (ja) * | 1994-09-02 | 1996-03-22 | Ricoh Co Ltd | 非球面偏心測定機 |
US5854852A (en) * | 1995-08-02 | 1998-12-29 | Lucent Technologies Inc. | Eccentricity determination system and method for accurately computing an offset of a central feature of an object |
JP2003344219A (ja) * | 2002-05-29 | 2003-12-03 | Nikon Corp | 偏心測定方法、偏心測定装置、投影光学系の製造方法、及び投影光学系 |
US6990430B2 (en) * | 2002-12-20 | 2006-01-24 | Brooks Automation, Inc. | System and method for on-the-fly eccentricity recognition |
JP2005024254A (ja) * | 2003-06-30 | 2005-01-27 | Mitsutoyo Corp | 情報処理装置、情報処理装置の校正方法、情報処理プログラム、このプログラムを記録した記録媒体、偏芯測定装置 |
JP2005055202A (ja) * | 2003-08-06 | 2005-03-03 | Mitsutoyo Corp | 偏芯測定装置、レンズ取付方法およびレンズ偏芯検査方法 |
JP2007127473A (ja) * | 2005-11-02 | 2007-05-24 | Hoya Corp | 非球面レンズの測定方法、非球面レンズの測定装置、非球面レンズの測定プログラム、非球面レンズの製造方法及び非球面レンズ |
JP4815273B2 (ja) * | 2006-06-02 | 2011-11-16 | 富士フイルム株式会社 | 被検光学素子回転保持装置 |
JP4774332B2 (ja) * | 2006-06-06 | 2011-09-14 | 富士フイルム株式会社 | 偏芯量測定方法 |
JP4943946B2 (ja) * | 2007-06-04 | 2012-05-30 | 富士フイルム株式会社 | 偏芯量測定装置 |
JP2008304200A (ja) * | 2007-06-05 | 2008-12-18 | Fujinon Corp | 偏芯測定用ヘッドの高さ位置調整方法 |
-
2009
- 2009-04-27 JP JP2009108549A patent/JP5362431B2/ja not_active Expired - Fee Related
- 2009-05-26 TW TW98117423A patent/TWI396837B/zh not_active IP Right Cessation
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102822656A (zh) * | 2010-04-13 | 2012-12-12 | 柯尼卡美能达先进多层薄膜株式会社 | 偏心量测量方法 |
CN102822656B (zh) * | 2010-04-13 | 2016-05-11 | 柯尼卡美能达先进多层薄膜株式会社 | 偏心量测量方法 |
CN102221449A (zh) * | 2010-04-19 | 2011-10-19 | 鸿富锦精密工业(深圳)有限公司 | 测量偏心量辅助装置 |
CN102221449B (zh) * | 2010-04-19 | 2015-01-21 | 鸿富锦精密工业(深圳)有限公司 | 测量偏心量辅助装置 |
Also Published As
Publication number | Publication date |
---|---|
JP5362431B2 (ja) | 2013-12-11 |
TWI396837B (zh) | 2013-05-21 |
JP2010019832A (ja) | 2010-01-28 |
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Legal Events
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MM4A | Annulment or lapse of patent due to non-payment of fees |