CN102221449B - Auxiliary device for measuring eccentric quantity - Google Patents

Auxiliary device for measuring eccentric quantity Download PDF

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Publication number
CN102221449B
CN102221449B CN201010150021.3A CN201010150021A CN102221449B CN 102221449 B CN102221449 B CN 102221449B CN 201010150021 A CN201010150021 A CN 201010150021A CN 102221449 B CN102221449 B CN 102221449B
Authority
CN
China
Prior art keywords
optical
eyeglass
location division
offset
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201010150021.3A
Other languages
Chinese (zh)
Other versions
CN102221449A (en
Inventor
林宗瑜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Original Assignee
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CN201010150021.3A priority Critical patent/CN102221449B/en
Publication of CN102221449A publication Critical patent/CN102221449A/en
Application granted granted Critical
Publication of CN102221449B publication Critical patent/CN102221449B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The invention provides an auxiliary device for measuring eccentric quantity. The auxiliary device is used for auxiliary measurement on the eccentric quantity of a piece of eyeglass to be measured; the eyeglass to be measured comprises an optical part and a non-optical part that is surround the optical part; the optical part comprises an optical curved surface and an optical plane that are arranged back to back with each other; the non-optical part comprises a first positioning part that surrounds the optical plane and is coaxial to the optical plane; the auxiliary device for measuring the eccentric quantity comprises a caky body and an arch bulge arranged on the body; the arch bulge is coaxial to the body; a reference curved surface used for auxiliary measurement on the eccentric quantity of the eyeglass to be measured is arranged on the surface at the external side of the arch bulge; and a second positioning part matched with the first positioning part is arranged at the periphery of the body. The auxiliary device for measuring the eccentric quantity of the eyeglass to be measured can be used for measuring the eccentric quantity of the curved surface relative to the reference curved surface by the eccentricity measuring device after the first positioning part and the second positioning part are clamped mutually, thus obtaining the coaxiality of the curved surface and the first positioning part.

Description

Measure offset servicing unit
Technical field
The present invention relates to a kind of measurement offset servicing unit.
Background technology
Camera lens module generally comprises multiplely have been had the optics portion of optical effect and has formed around the eyeglass of the non-optical division in this optics portion, the non-optical division of each eyeglass generally comprises a location division coaxial with this optics portion, and the plurality of eyeglass is mutually engaged by this location division and realizes the accurate location between eyeglass.Generally include a curved surface towards object and a plane back to this curved surface near the optics portion of the first eyeglass of object in current camera lens module, and this position point is in this plane side.
In order to adapt to produce in enormous quantities, eyeglass is generally formed by mould model.For this first eyeglass, because this plane and location division are positioned at relative both sides with this curved surface, injection molded after therefore needing to be cooperatively interacted by public and master mold, but, because the positioning accurate accuracy of current male model and master mold is limited, the right alignment of this curved surface and this location division is difficult to ensure.Therefore, need to detect whether whether in allowed limits bias or offset by the curved surface of the eyeglass of mould model and plane.But, be the side-play amount of the relative optical axis of line of two curved surface focuses due to offset, so current eccentric measuring set directly cannot measure the offset of curved surface opposite planar.
Summary of the invention
In view of this, be necessary that providing a kind of measures offset servicing unit.
A kind of measurement offset servicing unit, it is for the offset of subsidiary eyeglass to be measured, and this eyeglass to be measured comprises an optics portion and a non-optical division around this optics portion.This optics portion comprise mutually back to an optical surface and an optical flat, this non-optical division comprises one around this optical flat and first location division coaxial with this optical flat.This measurement offset servicing unit comprises body and an arch projection of a pie.This body comprise mutually back to an end face and a bottom surface.This arch projection forms a reference surface for the offset of subsidiary eyeglass to be measured from this end face Vertical dimension extension, outer the placing of this bottom surface offers second location division matched with this first location division, and this reference surface is coaxial with this second location division.
After this eyeglass to be measured is engaged by first and second location division mutually with this measurement offset servicing unit, measure the offset of this optical surface this reference surface relative by eccentric measuring set, thus draw the optical surface of this eyeglass to be measured and the offset of this optical flat.
Accompanying drawing explanation
Fig. 1 is the structural representation that the measurement offset servicing unit of better embodiment of the present invention is arranged on eyeglass to be measured.
Main element symbol description
Measure offset servicing unit 10
Body 12
End face 12a
Bottom surface 12b
Arch projection 14
Reference surface 14a
Second location division 16
Eyeglass 20 to be measured
Optics portion 22
Curved surface 22a
Plane 22b
Non-optical division 24
First location division 24a
Probe 30
Embodiment
Please refer to Fig. 1, the eyeglass to be measured 20 of measurement offset servicing unit 10 subsidiaries of better embodiment of the present invention comprises an optics portion 22 and a non-optical division 24 around optics portion 22.Optics portion 22 comprises an optical surface 22a and the optical flat 22b back to optical surface 22a.Non-optical division 24 comprises one around optical flat 22b and the first location division 24a coaxial with optical flat 22b, and in the present embodiment, the first location division 24a is protruding from the vertical outward extending annulus of optical flat 22b.
Measure body 12 and an arch projection 14 be formed on body 12 that offset servicing unit 10 comprises a pie.Body 12 comprise mutually back to an an end face 12a and bottom surface 12b, the outside of arch projection 14 forms one and is used for the offset of subsidiary eyeglass 20 to be measured with the interconnective reference surface 14a of described end face 12a, reference surface 14a.Outer the placing of the bottom surface 12b of body 12 offers second location division 16 matched with the first location division 24a.In the present embodiment, the second location division 16 is for being opened in the outer ring groove placed of bottom surface 12b.Reference surface 14a is coaxial with the second location division 16.Measure offset servicing unit 10 to be accurately combined with the second location division 16 by the first location division 24a with eyeglass 20 to be measured.In order to ensure the right alignment measuring offset servicing unit 10, precision cutting mode can be adopted to make and measure offset servicing unit 10, its material used can be the solid material such as metal or plastics.
When testing, be arranged on eyeglass 20 to be measured by measurement offset servicing unit 10, and bottom surface 12b and optical flat 22b precision is fitted, reference surface 14a is away from optical flat 22b simultaneously.Because the first location division 24a mates mutually with the second location division 16, make to measure offset servicing unit 10 and be accurately arranged on eyeglass 20 to be measured, and it is accurately coaxial with the first location division 24a to measure offset servicing unit 10.Now, the probe 30 of eccentric measuring set is supported on the optical surface 22a of eyeglass 20 to be measured and the reference surface 14a of measurement offset servicing unit 10, just the offset of optical surface 22a relative reference curved surface 14a be can measure, thus the optical surface 22a of eyeglass 20 to be measured and the right alignment of the first location division 24a obtained.
Be appreciated that, the setting of the first location division 24a and the second location division 16 reference surface 14a can be made accurately coaxial with the second location division 16 in order to make measurement offset servicing unit 10 be arranged on after on eyeglass 20 to be measured, but the set-up mode of the first location division 24a and the second location division 16 is not limited to present embodiment.
Those skilled in the art will be appreciated that; above embodiment is only used to the present invention is described; and be not used as limitation of the invention; as long as within spirit of the present invention, the suitable change do above embodiment and change all drop within the scope of protection of present invention.

Claims (2)

1. measure an offset servicing unit, it is for the offset of subsidiary eyeglass to be measured; This eyeglass to be measured comprises an optics portion and a non-optical division around this optics portion, this optics portion comprise mutually back to an optical surface and an optical flat, this non-optical division comprises one around this optical flat and first location division coaxial with this optical flat; This measurement offset servicing unit comprises body and an arch projection of a pie, this body comprise mutually back to an end face and a bottom surface, this arch projection forms a reference surface for the offset of subsidiary eyeglass to be measured from this end face Vertical dimension extension, outer the placing of this bottom surface offers second location division matched with this first location division, this reference surface is coaxial with this second location division, and this bottom surface and this optical flat precision are fitted.
2. as claimed in claim 1 measure offset servicing unit, it is characterized in that, this first location division be one protruding from the vertical outward extending annulus of this optical flat; This second location division is the outer ring groove placing Vertical dimension sunken inside from this bottom surface.
CN201010150021.3A 2010-04-19 2010-04-19 Auxiliary device for measuring eccentric quantity Expired - Fee Related CN102221449B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201010150021.3A CN102221449B (en) 2010-04-19 2010-04-19 Auxiliary device for measuring eccentric quantity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201010150021.3A CN102221449B (en) 2010-04-19 2010-04-19 Auxiliary device for measuring eccentric quantity

Publications (2)

Publication Number Publication Date
CN102221449A CN102221449A (en) 2011-10-19
CN102221449B true CN102221449B (en) 2015-01-21

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CN201010150021.3A Expired - Fee Related CN102221449B (en) 2010-04-19 2010-04-19 Auxiliary device for measuring eccentric quantity

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104833320B (en) * 2015-05-22 2016-05-25 丹阳丹耀光学有限公司 Anti-transmission Eccentric Instrument test platform and anti-transmission Eccentric Instrument
CN106706269B (en) * 2016-12-13 2019-01-18 歌尔科技有限公司 Double fish-eye detection method and device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1464984A (en) * 2001-07-09 2003-12-31 索尼株式会社 Objective lens, and optical pickup device using the objective lens
CN101149481A (en) * 2006-09-21 2008-03-26 一品光学工业股份有限公司 Molding glass installed with notch for eccentric detection and its eccentric detection method
CN101334334A (en) * 2007-06-25 2008-12-31 佛山普立华科技有限公司 Lens eccentricity detection system and method
TW200951418A (en) * 2008-06-10 2009-12-16 Fujinon Corp Eccentricity measuring method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006038589A (en) * 2004-07-26 2006-02-09 Konica Minolta Opto Inc Optical element, its eccentricity amount measuring method and its manufacturing method
JP5025106B2 (en) * 2005-07-28 2012-09-12 Hoya株式会社 Eccentricity measuring method, eccentricity measuring device, and manufacturing method of aspherical single lens

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1464984A (en) * 2001-07-09 2003-12-31 索尼株式会社 Objective lens, and optical pickup device using the objective lens
CN101149481A (en) * 2006-09-21 2008-03-26 一品光学工业股份有限公司 Molding glass installed with notch for eccentric detection and its eccentric detection method
CN101334334A (en) * 2007-06-25 2008-12-31 佛山普立华科技有限公司 Lens eccentricity detection system and method
TW200951418A (en) * 2008-06-10 2009-12-16 Fujinon Corp Eccentricity measuring method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JP特开2006-38589A 2006.02.09 *
JP特开2007-33343A 2007.02.08 *

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