TW200948881A - Polymer particle, conductive particle, anisotropic conductive material, and connection structure - Google Patents

Polymer particle, conductive particle, anisotropic conductive material, and connection structure Download PDF

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Publication number
TW200948881A
TW200948881A TW98110269A TW98110269A TW200948881A TW 200948881 A TW200948881 A TW 200948881A TW 98110269 A TW98110269 A TW 98110269A TW 98110269 A TW98110269 A TW 98110269A TW 200948881 A TW200948881 A TW 200948881A
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Taiwan
Prior art keywords
monomer
particles
polymer particles
metal layer
polymer
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TW98110269A
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Chinese (zh)
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TWI522409B (en
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Shinya Uenoyama
Hiroshi Yamauchi
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Sekisui Chemical Co Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
    • H05K3/323Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J3/00Processes of treating or compounding macromolecular substances
    • C08J3/12Powdering or granulating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/02Fillers; Particles; Fibers; Reinforcement materials
    • H05K2201/0203Fillers and particles
    • H05K2201/0206Materials
    • H05K2201/0221Insulating particles having an electrically conductive coating

Abstract

Disclosed are polymer particles which can improve electrical conduction reliability when connection object members are electrically connected with each other by conductive particles obtained by forming a metal layer on the surfaces of the polymer particles or an anisotropic conductive material containing the conductive particles. Conductive particles using the polymer particles are also disclosed. Specifically, a polymer particle is obtained by polymerizing a monomer which is an alicyclic compound having at least two ring structures. A conductive particle (5) comprises the polymer particle and a metal layer coated over the surface of the polymer particle.

Description

200948881 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種藉由單體之聚合所形成之聚合物粒 子例如可用於用以將連接對象構件之電極間連接之導電 . 性粒子中之聚合物粒子,以及使用該聚合物粒子之導電性 粒子異向性導電材料及連接構造體。 • 【先前技術】 ❹ 異向性導電膏、異向性導電油墨、異向性導電黏接著 劑、異向性導電膜或異向性導電片材等之異向性導電材料 已廣為人知。該等異向性導電材料係於膏、油墨或樹脂中 刀散有導電性粒+。上述異向性^電材料例如用於將玻璃 基板或印刷基板等基板之電極間電性連接。 作為用於上述異向性導電材料中之導電性粒子之一例, 於下述專利文獻丨中揭示有具有基材粒子、及形成於該基 材粒子之表面上之導電層之導電性粒子。為了形成基材粒 ❹ 子,將二乙烯苯-乙基乙烯笨混合物用作單體之一部分。 族導電性粒子於粒子直徑位移丨〇%時之壓縮彈性模數為 . 2.5Xl〇9 N/m2以下,壓縮變形恢復率為30%以上,且破裂 、 應變為30%以上。於曰本專利特開2003_313304號公報中揭 示有,於使用上述導電性粒子將基板之電極間電性連接之 情形時,連接電阻值變低,連接可靠性得到提高 【發明内容】 [發明所欲解決之問題] 先前,印刷基板係使用於聚醯亞胺膜之表面上經由環氧 139450.doc 200948881 接著劑而貼合有㈣之3層可撓性印刷基板。 近年來伴隨電子设備之小型化,正在研究使設置有電 極之可撓性印刷基板變薄之方法。例如,使用於聚酿亞胺 膜上直接設置有電極之2層可撓性印刷基板。 右使用包含專利文獻丨中所揭示之導電性粒子之異向性 導電材料,將2層可撓性印刷基板與玻璃基板之電極連 接’則存在電極間之連接電阻值變高之情形。於先前之3 層可撓性印刷基板中,異向性導電材料貼合於環氧接著 劑故異向性導電材料之接著力較冑。然❿,於2層可挽 性印刷基板中,異向性導電材料直接貼合於聚醯亞胺膜, 故異向性導電材料之接著力容易變低。進而,若利用專利 文獻1中所揭示之導電性粒子將2層可撓性印刷基板與玻璃 基板之電極間連接,則存在如下情形,即,由於導電性粒 子之壓纟但變形恢復率較高,故會因導電性粒子之斥力而使 異向性導電材料剝離。因此’存在無法充分降低電極間之 連接電阻值之情形。 又,將2層可撓性印刷基板與玻璃基板之電極間連接 時,於基板上配置異向性導電材料後,以電極彼此相對向 之方式於該基板上重疊其他基板。繼而,藉由加壓而壓縮 導電性粒子,從而連接電極間。 存在專利文獻1中所揭示之導電性粒子所接觸之電極 上,於上述加壓時藉由施加壓力而產生之壓痕未充分形成 之情形。又,存在於導電性粒子之周邊產生空隙之情形。 因此’存在2層可撓性印刷基板與玻璃基板之電極間之導 139450.doc 200948881 電可靠性低之情形。 本發明之目的在於提供如下聚合 合物粒子之導雷m 使m 上導電材料及連接構造體, 包人;:雪粒子於利用表面形成有金屬層之導電性粒子或 包各该導電性粒子之異向性導 性連h W * 、⑴導電㈣,將連接對象構件電 連接之情形時’可提高導電可靠性。 ❹ 參 用之限紐目的在於提供如下聚合物粒子、以及使 物粒子之導電性粒子、異向性導電材料及連接構 上述聚合物粒子料用表面形成有金屬層之導電性 將2層可撓性印刷基板#可隸印刷基板與玻璃基 板之電極間電性連接之情形時,可降低電極間之連接電 阻,且導電性粒子可於所接觸之電極上形成壓痕。 又:本發明之其他限定性目的在於提供如下聚合物粒 1及使㈣聚合物粒子之導電性粒子、異向性導電材 4及連接構造體’上述聚合物粒子於使用表面形成有低溶 點金屬層之導電性粒子’將連接對象構件電性連接之情形 時’即便因落下等而受到衝擊,亦難以於低熔點金屬層上 產生龜裂。 [解決問題之技術手段] 根據本發明之較廣態樣,提供—種藉由使作為具有至少 衣、’口構之月曰環式化合物的單體聚合所得之聚合物粒 子。 於本毛明之聚合物粒子之某特定態樣中,上述至少2個 環結構為雙環結構或三環結構。 139450.doc 200948881 於本發明之聚合物粒子之其他特定態樣中,上述單體為 丙稀酸系單體。 ‘ 於本發明之聚合物粒子之其他特定態樣中壓縮恢復率 為50%以下,且經壓縮10%時之壓縮彈性模數為98〇〜七9〇〇 N/mm2之範圍内。 , 於本發明之聚合物粒子之進而其他之特定態樣中,屢縮 恢復率為1 〇〜50%之範圍内。 成本發明之聚合物粒子較好的是藉由使作為具有至少之個 =結構之脂環式化合物的單官能單體與多官能單體聚合所 得者’更好的是藉由使包含作為具有至少2個環結構之脂 環式化合物的單官能單體2G〜9G重量%與多官能單體Μ· 重量°/。之單體成分聚合所得者。 又,本發明之聚合物粒子亦較好的是藉由使作為具有至 刀個環結構之脂環式化合物的多官能單體聚合所得者。 於該情形時’較好的是藉由使包含作為具有至少2個環結 構之脂環式化合物之多官能單體2()重量%以上之單 聚合所得者。 進而,本發明之聚合物粒子亦較好的是藉由使作為具有 至v 2個環結構之脂環式化合物的單官能單體與作為具有 至少2個環結構之脂環式化合物的多官能單體聚合所獨 者0 本發月之導電性粒子具有根據本發明所構成之聚合物粒 子、被覆該聚合物粒子之表面之金屬層。 於本發明之導雷 冤生拉子之某特疋悲樣中,壓縮恢復率為 139450.doc 200948881 45%以下。 於本發明之導電性粒子之其他特定g樣中,上述金屬層 之外表面為包含鎳之金屬層、包含鈀之金屬層或包含低熔 點金屬之金屬層。 匕本發明之異向性導電材料包含導電性粒子與黏合劑樹 脂。 本發明之連接構造體包含第i連接對象構件、第2連接對 ❹ ❹ 冓牛以及將第1與第2連接對象構件連接且根據本發明 所構成之導電性粒子。 又,本發明之連接構造體包含^連接對象構件、第 立接對象構件、以及將第丨與第2連接對象構件連接之連接 部,,上述連接部係由根據本發明所構成之異向性導電材料 所形成。 [發明之效果] 根據本發明,藉由使作為具有至少2個環結構之脂環式 化合物的單體聚合而獲得聚合物粒子,故於利用在該聚人 物粒子表面形成有金屬層之導電性粒子或包含該導電㈣ 子之異向性導電材料,料接對象構件電性連接之❹ 時,可提高導電可靠性。 / 於利用使用本發明之聚合物粒子之上述導電性粒子,將 印刷基板與玻璃基板之電極間連接之情形時,電極間之連 接電阻值變低。進而,容县 唆 易於印刷基板之電極或玻璃基板 =之電極上形成導電性粒子接觸而成之壓痕。因此,可提 -印刷基板與玻璃基板之電極間之導電可靠性。尤其於上 139450.doc 200948881 述印刷基板為2層可撓性印刷基板之情形時,可提高電極 間之導通可靠性。 進而,於使用在本發明之聚合物粒子之表面形成有低熔 點金屬層之導電性粒子,將連接對象構件電性連接之情形 時,即便爻到落下等之衝擊,亦難以於低熔點金屬層上產 生龜裂。 【實施方式】 以下’對本發明加以詳細說明。 (聚合物粒子) 本發明之聚合物粒子係藉由使作為具有至少2個環結構 之脂環式化合物的單體聚合所得。 上述具有至少2個環結構之脂環式化合物較好的是多環 式化合物。 作為上述至少2個環結構,可列舉:雙環結構、三環結 構、螺%結構或二螺環結構。其中,上述至少2個環結構 較好的疋雙環結構或三環結構。若上述至少2個環結構為 雙環結構或三環結才冓’則彳降低聚合物粒子之壓縮恢復 率。因此,即便利用包含使用上述聚合物粒子之導電性粒 子之異向性導電材料,將2層可撓性印刷基板等印刷基板 與玻璃基板之電極間連接,亦會因導電性粒子之斥力而使 異向性導電材料變得難以剝離。進而,於導電性粒子所接 觸之電極上容易形成壓痕。再者’形成於電極上之壓痕係 導電!生粒子擠壓電極而成之電極之凹部。導電性粒子一般 為球狀,故電極之凹部一般為半球狀。又變得難以於導 139450.doc 200948881 電ί生粒子之周邊產生空隙。再者,上述空隙係由於接著層 等自基板或電極等之連接對象構件上界面剝離所產生。較 好的疋不產生上述空隙。但,亦可於不影響導電可靠性之 程度下產生上述空隙。 上述皁體若為具有至少2個環結構之脂環式化合物,則 並無特別限定。作為上述單體,可列舉:丙稀酸系單體、 乙烯_化合物、環氧化合物或異氰酸醋化合物等。其中, 由於可降低上述聚合物粒子之壓縮恢復率,故較好的是丙 烯酸系單體。 作為上述丙烯酸系單體,具體可列舉:二羥曱基·三環 癸烷二(甲基)丙烯酸酯、金剛烷二醇二(甲基)丙烯酸 酯、(甲基)丙烯酸異福酯、(甲基)丙烯酸二環戊烯醋、(甲 基)丙烯酸二環戊醋、(甲基)丙烯酸2_甲基_2_金剛烷醋、 (甲基)丙烯酸2-乙基-2·金剛烷酯或(曱基)丙烯酸3_羥基-^ 金剛烷酯等。再者,所謂(甲基)丙烯酸酯,係指甲基丙烯 酸酯或丙烯酸酯。 作為上述乙烯醚化合物,具體可列舉:三環癸烷乙烯醚 或三環癸烷單甲基乙烯醚等。 於本發明中,亦可與上述具有至少2個環結構之脂環式 化合物的單體一併使用該單體以外之其他單體來作為單體 成分。於單體成分100重量%中,作為具有至少2個環結構 之脂環式化合物的單體之含量較好的是5重量%以上,更 好的是20重量%以上。作為上述其他單體,例如可列舉苯 乙烯或二乙烯苯等。進而,作為上述其他單體,可列舉: 139450.doc 200948881 聚丁二酵二(甲基)丙烯酸酯、三羥甲基丙烷三(曱基)丙烯 酸酯、四羥甲基甲烷三(曱基)丙烯酸酯、季戊四醇三(曱 基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、(曱基)丙烯 酸曱酯、(甲基)丙烯酸乙酯、(曱基)丙烯酸丁酯、(甲基)丙 烯酸2-乙基己醋、乙二醇(甲基)丙稀酸醋、(甲基)丙烯酸 三氟乙酯、(曱基)丙烯酸五氟^丙酯或(甲基)丙稀酸環己酯 等。 於使用作為具有至少2個環結構之脂環式化合物的單官 能之丙烯酸系單體之情形時,於單體成分100重量。/〇中, 該單官能之丙烯酸系單體之含量較好的是4〇〜6〇重量0/〇之 範圍内。作為單官能之丙烯酸系單體,適宜使用:(曱基) 丙烯酸異葙酯、(甲基)丙烯酸二環戊烯酯、(曱基)丙烯酸 一環戊自曰、(甲基)丙烯酸2-甲基-2-金剛烧酯、(甲基)丙烯 酸2-乙基_2-金剛烷酯或(甲基)丙烯酸3_羥基_丨_金剛烷酯。 於使用作為具有至少2個環結構之脂環式化合物的二官 能之丙烯酸系單體之情形時,於單體成分1〇〇重量%中, 該二官能之丙烯酸系單體之含量較好的是2〇〜8〇重量%之 圍内。作為二官能之丙烯酸系單體,適宜使用:二經甲 基-三環癸烷二(曱基)丙烯酸酯或1,3-金剛烷二醇二(甲基) 丙烯酸醋。 本發明之聚合物粒子較好的是藉由使作為具有至少細 ,結構之脂環式化合物的單官能單體(以了,有時略記為 早“匕單體A)與多官能單體聚合所得者。上述單體成分較 好的是包含上述單官能單體A與多官能單體。作為上述多 139450.doc 200948881 官能單體,可列舉具有至少2個乙烯基之芳香族化合物或 多官能丙烯酸系單體等。作為上述芳香族化合物,可列 舉:1,2-二乙烯苯、ι,3-二乙烯苯或ι,4-二乙烯苯等。作為 上述芳香族化合物,市售有新日鐵化學公司製造之 . 「DVB960」等。上述多官能丙烯酸系單體較好的是具有_ (R-O)n-單元者,可列舉:聚丁二醇二(甲基)丙烯酸酯、三 羥曱基丙烷三(曱基)丙烯酸酯、四羥甲基甲燒三(甲基)丙 ❹ 烯酸酯、季戊四醇三(曱基)丙烯酸酯、季戊四醇四(甲基) 丙烯酸酯、三乙二醇二(曱基)丙烯酸酯或二季戊四醇六(甲 基)丙烯酸酯等。再者,上述汉係碳數為丨〜9之伸烷基,上 述η為1以上之整數。 若使上述單官能單體Α與多官能單體聚合,則與僅使上 述單官能單體A聚合之情形相比,可使1〇% κ值變得較 高,從而可將1〇% K值控制於較佳範圍,且可提高壓縮恢 復率。即,藉由將作為交聯劑之多官能單體與上述單官能 Ο 單體A一併使用,可控制10°/。K值及壓縮恢復率。 上述单體成分較好的是包含上述單官能單體八2〇,重 . 量%、多官能單體1G〜崎量%。於該情形時,可容易地獲 - #1〇% K值及壓縮恢復率顯示較佳值之聚合物粒子。上述 單體成分較好的是包含上述單官能單體Α2㈣重量%、多 官能單體20〜80重量%,更袢沾a a a200948881 VI. Description of the Invention: [Technical Field] The present invention relates to a polymer particle formed by polymerization of a monomer, for example, which can be used for conducting conductive particles between electrodes of a connecting member. Polymer particles, and conductive particle anisotropic conductive materials and bonded structures using the polymer particles. • [Prior Art] 异 Anisotropic conductive materials such as anisotropic conductive pastes, anisotropic conductive inks, anisotropic conductive adhesives, anisotropic conductive films, or anisotropic conductive sheets are widely known. The anisotropic conductive materials are in the paste, ink or resin with a conductive particle +. The anisotropic electrical material is used, for example, to electrically connect electrodes between substrates such as a glass substrate or a printed substrate. As an example of the conductive particles used in the above anisotropic conductive material, conductive particles having a substrate particle and a conductive layer formed on the surface of the substrate particle are disclosed in the following Patent Document. In order to form a substrate granule, a divinyl benzene-ethylethylene mixture is used as a part of the monomer. The group of conductive particles has a compressive elastic modulus at a particle diameter displacement of 丨〇% of 2.5 Xl 〇 9 N/m 2 or less, a compression deformation recovery ratio of 30% or more, and a crack and strain of 30% or more. In the case where the electrodes of the substrate are electrically connected by using the conductive particles described above, the connection resistance value is lowered, and the connection reliability is improved. [Invention] Solution to Problem] Previously, a printed circuit board was used on a surface of a polyimide film to bond a three-layer flexible printed circuit board of (4) via an epoxy 139450.doc 200948881. In recent years, with the miniaturization of electronic equipment, a method of thinning a flexible printed circuit board provided with an electrode has been studied. For example, a two-layer flexible printed circuit board on which an electrode is directly provided on a polyimide film is used. When the two-layer flexible printed circuit board is connected to the electrode of the glass substrate by using the anisotropic conductive material containing the conductive particles disclosed in the patent document, the connection resistance between the electrodes is increased. In the previous three-layer flexible printed circuit board, the anisotropic conductive material was bonded to the epoxy adhesive, and the adhesion of the anisotropic conductive material was relatively poor. Then, in the two-layer printable printed circuit board, the anisotropic conductive material is directly bonded to the polyimide film, and the adhesion of the anisotropic conductive material is likely to be low. Further, when the two layers of the flexible printed circuit board and the electrodes of the glass substrate are connected by the conductive particles disclosed in Patent Document 1, there is a case where the deformation of the conductive particles is high but the deformation recovery rate is high. Therefore, the anisotropic conductive material is peeled off due to the repulsive force of the conductive particles. Therefore, there is a case where the connection resistance value between the electrodes cannot be sufficiently reduced. Further, when the two-layer flexible printed circuit board is connected to the electrodes of the glass substrate, the anisotropic conductive material is placed on the substrate, and the other substrates are superposed on the substrate so that the electrodes face each other. Then, the conductive particles are compressed by pressurization to connect the electrodes. In the electrode which is in contact with the conductive particles disclosed in Patent Document 1, the indentation generated by the application of pressure at the time of the pressurization is not sufficiently formed. Further, there is a case where a void is formed around the conductive particles. Therefore, there is a case where there is a conduction between the two layers of the flexible printed circuit board and the electrodes of the glass substrate. 139450.doc 200948881 The electrical reliability is low. An object of the present invention is to provide a conductive material of a polymerized particle, m, a conductive material and a bonded structure, and a coated structure; the snow particles are coated with a conductive layer having a metal layer on the surface or each of the conductive particles. The anisotropic conductivity is connected to h W * and (1) is electrically conductive (four), and when the connection member is electrically connected, the conductivity reliability can be improved.限 The purpose of the reference is to provide the following polymer particles, and the conductive particles of the particles, the anisotropic conductive material and the connection structure. The polymer particles are formed with a metal layer on the surface to make the two layers flexible. When the printed substrate is electrically connected to the electrodes of the printed substrate and the glass substrate, the connection resistance between the electrodes can be reduced, and the conductive particles can form an indentation on the electrode to be contacted. Further, another limited object of the present invention is to provide a polymer particle 1 and a conductive particle of the (four) polymer particle, an anisotropic conductive material 4, and a connection structure, wherein the polymer particle has a low melting point on the surface of use. When the conductive particles of the metal layer are electrically connected to the connection member, even if they are impacted by dropping or the like, it is difficult to cause cracks in the low-melting-point metal layer. [Technical means for solving the problem] According to a broader aspect of the present invention, polymer particles obtained by polymerizing a monomer having a cyclic oxime cyclic compound having at least a coating and a mouth structure are provided. In a particular aspect of the polymer particles of Benming, the at least two ring structures are bicyclic or tricyclic. 139450.doc 200948881 In other specific aspects of the polymer particles of the present invention, the above monomer is an acrylic monomer. The compression recovery ratio in the other specific aspects of the polymer particles of the present invention is 50% or less, and the compression elastic modulus at the time of compression of 10% is in the range of 98 Å to 7.9 Å N/mm 2 . Further, in other specific aspects of the polymer particles of the present invention, the recovery rate is from 1 〇 to 50%. The polymer particles of the invention are preferably obtained by polymerizing a monofunctional monomer having at least one constitutive alicyclic compound with a polyfunctional monomer, preferably by having the inclusion as having at least 2 ring-shaped alicyclic compound monofunctional monomer 2G to 9G% by weight and polyfunctional monomer Μ·weight °/. The monomer component is obtained by polymerization. Further, the polymer particles of the present invention are also preferably obtained by polymerizing a polyfunctional monomer which is an alicyclic compound having a ring structure to a knife. In this case, it is preferred to obtain a monopolymer obtained by including a polyfunctional monomer 2 (% by weight or more) as an alicyclic compound having at least two ring structures. Further, the polymer particles of the present invention are also preferably obtained by using a monofunctional monomer as an alicyclic compound having a ring structure of v 2 and a polyfunctional compound as an alicyclic compound having at least two ring structures. The monomer particles of the present invention have the polymer particles composed of the present invention and the metal layer covering the surface of the polymer particles. In the special sadness of the thundering puller of the present invention, the compression recovery rate is 139450.doc 200948881 45% or less. In another specific g sample of the electroconductive particle of the present invention, the outer surface of the metal layer is a metal layer containing nickel, a metal layer containing palladium or a metal layer containing a low melting point metal. The anisotropic conductive material of the present invention comprises conductive particles and a binder resin. The connection structure of the present invention includes an i-th connection target member, a second connection pair ❹ 冓 yak, and conductive particles configured by connecting the first and second connection target members according to the present invention. Further, the connection structure according to the present invention includes a connection target member, a first connection target member, and a connection portion that connects the second and second connection target members, and the connection portion is anisotropic according to the present invention. A conductive material is formed. [Effects of the Invention] According to the present invention, by polymerizing a monomer which is an alicyclic compound having at least two ring structures to obtain polymer particles, conductivity of a metal layer formed on the surface of the poly-person particles is utilized. The particles or the anisotropic conductive material containing the conductive (tetra) can improve the electrical conductivity reliability when the material is electrically connected to the object member. When the conductive substrate of the polymer particles of the present invention is used to connect the printed circuit board to the electrodes of the glass substrate, the connection resistance between the electrodes is lowered. Further, Rongxian 易于 is easy to print the electrode of the substrate or the glass substrate = the indentation formed by the contact of the conductive particles on the electrode. Therefore, it is possible to improve the electrical conductivity between the printed substrate and the electrode of the glass substrate. In particular, in the case where the printed substrate is a two-layer flexible printed circuit board, the conduction reliability between the electrodes can be improved. Further, when the conductive particles having the low-melting-point metal layer formed on the surface of the polymer particles of the present invention are used to electrically connect the connection member, it is difficult to form a low-melting metal layer even if the impact is dropped. Cracks appear on it. [Embodiment] Hereinafter, the present invention will be described in detail. (Polymer particles) The polymer particles of the present invention are obtained by polymerizing a monomer which is an alicyclic compound having at least two ring structures. The above alicyclic compound having at least two ring structures is preferably a polycyclic compound. Examples of the at least two ring structures include a bicyclic structure, a tricyclic structure, a spiro% structure, and a two-spiro ring structure. Among them, the above at least two ring structures are preferably an anthracene bicyclic structure or a tricyclic structure. If at least two of the above ring structures are bicyclic or tricyclic, then the reduction of the compression recovery of the polymer particles is reduced. Therefore, even if an anisotropic conductive material containing conductive particles using the polymer particles is used, a printed circuit board such as a two-layer flexible printed circuit board is connected to an electrode of a glass substrate, and the repulsive force of the conductive particles is also caused. The anisotropic conductive material becomes difficult to peel off. Further, an indentation is likely to be formed on the electrode that the conductive particles are in contact with. Furthermore, the indentation formed on the electrodes is electrically conductive! A concave portion of an electrode formed by extruding an electrode. Since the conductive particles are generally spherical, the concave portion of the electrode is generally hemispherical. It has become difficult to guide. 139450.doc 200948881 Electricity creates a gap around the particles. Further, the voids are caused by peeling of the interface from the connection member such as the substrate or the electrode by the adhesive layer or the like. Better 疋 does not create the above gap. However, the above voids can also be produced to the extent that the electrical reliability is not affected. The above soap body is not particularly limited as long as it is an alicyclic compound having at least two ring structures. Examples of the monomer include an acrylic acid monomer, an ethylene compound, an epoxy compound, and an isocyanate compound. Among them, an acrylic monomer is preferred because the compression recovery ratio of the above polymer particles can be lowered. Specific examples of the acrylic monomer include dihydroxyindenyl tricyclodecane di(meth)acrylate, adamantanediol di(meth)acrylate, and isobutyl (meth)acrylate; Methyl)dicyclopentene vinegar, dicyclopentanyl (meth)acrylate, 2-methyl-2-amantane vinegar (meth)acrylate, 2-ethyl-2·adamantane (meth)acrylate Ester or (mercapto)acrylic acid 3-hydroxy-^adamantyl ester and the like. Further, the term "(meth)acrylate" means methacrylate or acrylate. Specific examples of the vinyl ether compound include tricyclodecane vinyl ether or tricyclodecane monomethyl vinyl ether. In the present invention, a monomer other than the monomer may be used as a monomer component together with the monomer having at least two ring structure alicyclic compounds. The content of the monomer which is an alicyclic compound having at least two ring structures is preferably 5% by weight or more, and more preferably 20% by weight or more, based on 100% by weight of the monomer component. Examples of the other monomer include styrene, divinylbenzene, and the like. Further, examples of the other monomer include: 139450.doc 200948881 polybutylene di(meth)acrylate, trimethylolpropane tris(decyl)acrylate, tetramethylol methane tris(fluorenyl) Acrylate, pentaerythritol tri(decyl) acrylate, dipentaerythritol hexa(meth) acrylate, decyl decyl acrylate, ethyl (meth) acrylate, butyl (meth) acrylate, (methyl) 2-ethylhexyl acrylate, ethylene glycol (meth) acrylate vinegar, trifluoroethyl (meth) acrylate, pentafluoro propyl (meth) acrylate or (meth) acrylate Ester and the like. In the case of using a single-functional acrylic monomer as an alicyclic compound having at least two ring structures, it is 100 parts by weight based on the monomer component. In the oxime, the content of the monofunctional acrylic monomer is preferably in the range of 4 〇 to 6 〇 by weight 0 / 。. As the monofunctional acrylic monomer, it is suitable to use: (fluorenyl) isodecyl acrylate, dicyclopentenyl (meth)acrylate, monocyclopentanyl (meth) acrylate, 2-methyl (meth) acrylate Base-2-adamantate, 2-ethyl 2 -adamantyl (meth)acrylate or 3-hydroxy-indole-adamantyl (meth)acrylate. When a difunctional acrylic monomer as an alicyclic compound having at least two ring structures is used, the content of the difunctional acrylic monomer is preferably 1% by weight of the monomer component. It is within 2〇~8〇% by weight. As the difunctional acrylic monomer, di-methyl-tricyclodecane bis(indenyl) acrylate or 1,3-adamantanediol di(meth)acrylic acid vinegar is suitably used. The polymer particles of the present invention are preferably polymerized by reacting a monofunctional monomer (hereinafter sometimes referred to as "monic acid monomer A") as an alicyclic compound having at least a fine structure. The monomer component preferably contains the above-mentioned monofunctional monomer A and a polyfunctional monomer. Examples of the above-mentioned multi-139450.doc 200948881 functional monomer include aromatic compounds or polyfunctional groups having at least two vinyl groups. Examples of the aromatic compound include 1,2-divinylbenzene, iota, 3-divinylbenzene, iota, 4-divinylbenzene, etc. As the aromatic compound, a new one is commercially available. Manufactured by Nippon Steel Chemical Co., Ltd. "DVB960". The polyfunctional acrylic monomer preferably has a _(RO)n-unit, and examples thereof include polybutylene glycol di(meth)acrylate, trishydroxypropylpropane tris(decyl)acrylate, and four. Methylol tris(meth)propionate, pentaerythritol tris(decyl) acrylate, pentaerythritol tetra(meth) acrylate, triethylene glycol bis(indenyl) acrylate or dipentaerythritol hexa Methyl) acrylate or the like. Further, the above-mentioned Chinese carbon number is an alkylene group of 丨~9, and η is an integer of 1 or more. When the above monofunctional monomer oxime is polymerized with a polyfunctional monomer, the 〇% κ value can be made higher than in the case where only the above-mentioned monofunctional monomer A is polymerized, so that 1% K can be obtained. The value is controlled within a preferred range and the compression recovery rate can be improved. Namely, by using a polyfunctional monomer as a crosslinking agent together with the above monofunctional fluorene monomer A, it is possible to control 10 ° /. K value and compression recovery rate. The monomer component preferably contains the above-mentioned monofunctional monomer 8%, weight %, and polyfunctional monomer 1G to the amount of sacrificial %. In this case, it is possible to easily obtain polymer particles having a value of -1 〇% K and a compression recovery ratio showing a preferred value. The above monomer component preferably contains the above-mentioned monofunctional monomer Α2 (four)% by weight, and the polyfunctional monomer is 20 to 80% by weight, more a a a a

好的疋包含上述單官能單體A 40〜60重量%、多官能單體40〜60重量%。 本發明之聚合物粒子較妊的θ 丁牧好的疋由作為具有至少2個環結 構之脂環式化合物的多官能單 匕早體(以下,有時略記為多官 139450.doc -11 - 200948881 能單體B)所得者。上述單體成分㈣的是包含上述多官能 單體B即便僅使上述多官能單體B聚合,亦可使1〇% κ值 變得較高,從而將1()% κ值控制於較佳範圍,且可使壓縮 恢復率變得較馬。#中,亦可將其他單體與上述多官能單 體Β —併使用。Preferably, the fluorene comprises 40 to 60% by weight of the above monofunctional monomer A and 40 to 60% by weight of the polyfunctional monomer. The polymer particles of the present invention are more precisely composed of polyfunctional monoterpenoids having an alicyclic compound having at least two ring structures (hereinafter, sometimes abbreviated as a plurality of 139450.doc -11 - 200948881 Can be the monomer B). In the monomer component (4), even if the polyfunctional monomer B is polymerized, the 1% κ value can be made higher, and the 1 (% κ value) can be controlled to be preferable. The range and the compression recovery rate can be made larger. In #, other monomers may also be used together with the above-mentioned polyfunctional monomer.

、上述單體成分較好的是包含上述多官能單體Β 20重量% 以上。若上述多官能單體k含量為20重量%以上,則聚 合物粒子不會變得過於柔軟,可提高㈣K值,從而將 ίο% κ值控制於較佳範圍。又,於將上述多官能單體β與 具有2個官能基之聚丁二醇二(甲基)丙稀酸醋等之丙稀酸系 單體併用之情形時,可將1G%K值控制於較佳範圍。又, 於將"^多S此單體哗芳香族環及具有至少2個官能基之 稀苯等之乙稀基單體併用之情形時可提高i 〇% K值 與壓縮恢復率。上述單體成分100重量❶/。中之上述多官能 〇 3量之更好下限為20重量%,較好上限為80重量The monomer component preferably contains 20% by weight or more of the above polyfunctional monomer. When the content of the polyfunctional monomer k is 20% by weight or more, the polymer particles are not too soft, and the (IV) K value can be increased to control the ίο% κ value to a preferred range. Further, when the polyfunctional monomer β is used in combination with an acrylic monomer such as polybutylene glycol di(meth)acrylic acid vinegar having two functional groups, the 1 G% K value can be controlled. In the preferred range. Further, in the case where the monomer monocyclic aromatic ring and the ethylene-based monomer having at least two functional groups such as dilute benzene are used in combination, the i 〇 % K value and the compression recovery ratio can be improved. The above monomer component is 100% by weight. The lower limit of the above polyfunctional 〇 3 is 20% by weight, and the upper limit is 80% by weight.

% ’更好上限為6〇重量%。上述單體成分⑽重量財之上 述多官能單體Β之含量亦可為1〇〇重量%。 一上述夕g此單體Β併用之其他單體亦可為作為具有至 /二固衣、’·σ構之月曰環式化合物的單官能單體A。藉由併用上 述單B此單體A與上述多官能單體B,可將㈣K值及廢縮 恢復率控制於較佳範圍。 聚合方法並無特別限^。作為聚合方法,具體可列舉: 心浮聚合法、孔化聚合法、種子聚合法或分散聚合法等之 先前公知之聚合方法。 139450.doc •12- 200948881 由於粒度分布較廣,可獲 述懸浮聚合法及乳化聚合法對製造;=粒子,故上 之目的而^^ 對裟以夕。口種之粒徑之微粒子 之目的而吕較好。於使用懸浮聚合 時,較好的是對藉由聚合所得 隹。法之情形 別# + n侍之聚口物粒子進行分級,分 別選出,、有所需粒徑或粒度分布之聚合物粒子。The % upper limit is 6% by weight. The content of the above-mentioned monomer component (10) may be 1% by weight based on the weight of the polyfunctional monomer. Further, the other monomer used in combination with the above monomer may be a monofunctional monomer A which is a cyclic compound of a ruthenium having a to-two-coating structure. By using the above-mentioned monomer B and the above-mentioned polyfunctional monomer B in combination, the (4) K value and the shrinkage recovery ratio can be controlled to a preferred range. The polymerization method is not particularly limited. Specific examples of the polymerization method include a previously known polymerization method such as a heart floating polymerization method, a pore polymerization method, a seed polymerization method or a dispersion polymerization method. 139450.doc •12- 200948881 Due to the wide particle size distribution, the suspension polymerization method and the emulsion polymerization method can be used to manufacture; = particles, so the purpose of the above is ^^. The purpose of the fine particles of the particle size of the mouth is better. When suspension polymerization is used, it is preferred to obtain hydrazine by polymerization. In the case of the law, the particles of the agglomerate are classified, and the polymer particles having the desired particle size or particle size distribution are selected.

又’由於無需進行分級,可獲得單分散之聚合物粒子, 故種子聚合法對於大量製造衫粒徑之聚合物粒子之目的 而言較好。所謂上述種子聚合法,係指利用作為具有至少 2:環結構之脂環式化合物的單體,使苯乙稀聚合物粒子 t之種子粒子進行膨潤、聚合之方法。因&,於使用種子 ^合法來製造本發明之聚合物粒子之情形時,本發明之聚 合物粒子亦可含有構絲子粒子之成分。例如,若使用苯 乙烯聚口物粒子作為種子粒子,則存在所得之聚合物粒子 中S有本乙稀聚合物之情形。 ;上述聚σ之,谷劑並無特別限定。溶劑可根據上述單 體成刀而適s選擇。作為上述溶劑,例如可列舉水、醇、 洛纖劑、酮或乙酸酯等。亦可使用該等溶劑以外之其他溶 劑。作為上述醇之具體例’可列舉甲#、乙醇或丙醇等。 作為上述溶纖劑之具體例,可列舉甲基溶纖劑或乙基溶纖 劑等。作為上述酮之具體例,可列舉丙酮、甲基乙基酮、 曱基丁基酮或2_丁酮等。作為上述乙酸酯之具體例,可列 舉乙酸乙酯或乙酸丁酯等。作為上述其他溶劑之具體例, 可列舉乙腈、N,N-二甲基曱醯胺或二曱基亞砜等。該等溶 劑可僅使用1種,亦可併用2種以上。 139450.doc -13- 200948881 聚合物粒子之平均粒徑較好的是0^,000 μιη之範圍 内。聚合物粒子之平均粒徑之更好下限為丨μιη,進而好之 下限為1.5 μιη,尤其好之下限為2 。聚合物粒子之平均 粒徑之更好上限為5〇〇 pm,進而好之上限為3〇〇 ,尤其 好之上限為30 μηι。若平均粒徑過小,則導電性粒子與電 極之接觸面積變小,故存在連接電阻值變高之情形。進 而,藉由非電解鍍敷而於聚合物粒子之表面形成金屬層 時,容易產生凝集,從而容易形成凝集之導電性粒子。若 平均粒徑過大,則導電性粒子變得難以充分壓縮,故存在 電極間之連接電阻值變高之情形。 上述平均粒徑表示數量平均粒徑。平均粒徑例如可使用 庫爾特計數器(貝克曼庫爾特(Beckman c〇uher)公司製造) 而測定。 聚口物粒子之cv值(粒度分布之變異係數)較好的是 以下,更好的是3%以下。scv值超過1〇%,則存在由導 電性粒子連接之電極間之間隔產生不均之情形。 上述CV值係以下述式所表示。 CV值(%)=(p/Dn)xlo〇 P :聚合物粒子之直徑之標準偏差Further, since it is not necessary to carry out classification, monodisperse polymer particles can be obtained, so the seed polymerization method is preferable for the purpose of mass-producing polymer particles having a mesh size. The seed polymerization method is a method in which seed particles of styrene polymer particles t are swelled and polymerized by using a monomer which is an alicyclic compound having at least a 2: ring structure. The polymer particles of the present invention may also contain components of the filament particles in the case where the polymer particles of the present invention are produced by the use of seeds. For example, when styrene agglomerate particles are used as the seed particles, there is a case where S has the present ethylene polymer in the obtained polymer particles. The above-mentioned poly-σ, the granule is not particularly limited. The solvent can be selected according to the above-mentioned single body forming knife. Examples of the solvent include water, alcohol, granules, ketones, and acetates. Other solvents than those solvents may also be used. Specific examples of the above alcohols include, for example, a#, ethanol or propanol. Specific examples of the cellosolve include methyl cellosolve or ethyl cellosolve. Specific examples of the ketone include acetone, methyl ethyl ketone, mercaptobutyl ketone or 2-butanone. Specific examples of the above acetates include ethyl acetate and butyl acetate. Specific examples of the other solvent include acetonitrile, N,N-dimethylguanamine or dimercaptosulfoxide. These solvents may be used alone or in combination of two or more. 139450.doc -13- 200948881 The average particle size of the polymer particles is preferably in the range of 0^000 μm. The lower limit of the average particle diameter of the polymer particles is 丨μιη, and preferably the lower limit is 1.5 μηη, and particularly preferably, the lower limit is 2. The upper limit of the average particle diameter of the polymer particles is 5 〇〇 pm, and the upper limit is preferably 3 〇〇, and particularly preferably, the upper limit is 30 μηι. When the average particle diameter is too small, the contact area between the conductive particles and the electrode becomes small, so that the connection resistance value becomes high. Further, when a metal layer is formed on the surface of the polymer particles by electroless plating, aggregation tends to occur, and aggregated conductive particles are easily formed. When the average particle diameter is too large, the conductive particles are less likely to be sufficiently compressed, and thus the connection resistance value between the electrodes is increased. The above average particle diameter represents a number average particle diameter. The average particle diameter can be measured, for example, using a Coulter counter (manufactured by Beckman Co., Ltd.). The cv value (coefficient of variation of the particle size distribution) of the agglomerate particles is preferably the following, more preferably 3% or less. When the scv value exceeds 1%, there is a case where the interval between the electrodes connected by the conductive particles is uneven. The above CV value is represented by the following formula. CV value (%) = (p / Dn) xlo 〇 P : standard deviation of the diameter of the polymer particles

Dn :平均粒徑 聚合物粒子之壓縮恢復率較好的是5〇%以下,更好的 桃以下1壓縮恢復率超,則存在因用於電極 導t性粒子之斥力而使得異向性導電材料自基 :1之情形。其結果,存在電極間之連接電阻值變 139450.doc 200948881 之情形。聚合物粒子之壓縮恢復率較好的是5%以上,更 好的是10%以上,進而更好的是20%以上。 上述壓縮恢復率可以如下方式而測定。 於試料台上散布聚合物粒子。針對所散布之1個聚合物 粒子,使用微小壓縮試驗機,於聚合物粒子之中心方向施 加負荷,直至達到反向荷重值(5.00 mN)。其後,解除負 ' 荷,直至達到原點用荷重值(0.40 mN)。對該期間之荷重- 壓縮位移進行測定,可由下述式求出壓縮恢復率。再者, ❹ 將負荷速度設為0.33 mN/秒。上述微小壓縮試驗機例如可 使用Fischer公司製造之「Fischerscope H-100」等。 壓縮恢復率 χ 100 :施加負荷時,自原點用荷重值至反向荷重值為止之 壓縮位移 L2 :解除負荷時,自反向荷重值至原點用荷重值為止之 壓縮位移Dn: The average recovery of the average particle size of the polymer particles is preferably less than 5% by weight, and the better compression recovery rate of the lower peach 1 is superior, and there is an anisotropic conduction due to the repulsive force of the electrode-conducting particles. Material from base: 1 case. As a result, there is a case where the connection resistance value between the electrodes is changed to 139450.doc 200948881. The compression recovery ratio of the polymer particles is preferably 5% or more, more preferably 10% or more, and still more preferably 20% or more. The above compression recovery rate can be measured as follows. Polymer particles are dispersed on the sample stage. For the dispersed polymer particles, a small compression tester was used to apply a load in the center of the polymer particles until the reverse load value (5.00 mN) was reached. Thereafter, the negative load is released until the origin load value (0.40 mN) is reached. The load-compression displacement during this period was measured, and the compression recovery ratio was obtained by the following formula. Furthermore, ❹ set the load speed to 0.33 mN/sec. For the above-mentioned micro compression tester, for example, "Fischerscope H-100" manufactured by Fischer Co., Ltd. or the like can be used. Compression recovery rate χ 100 : Compression displacement from the origin load value to the reverse load value when the load is applied L2 : Compression displacement from the reverse load value to the origin load value when the load is released

@ 聚合物粒子之直徑位移10%時之壓縮彈性模數(10% K 值)較好的是196〜6,860 N/mm2之範圍内。10% K值之更好 之下限為980 N/mm2,更好之上限為4,900 N/mm2。聚合物 粒子之直徑位移20%時之壓縮彈性模數(20% K值)較好的是 196-6,860 N/mm2之範圍内。20% K值之更好之下限為600 N/mm2,進而好之下限為980 N/mm2,更好之上限為4,900 N/mm2,進而好之上限為3,900 N/mm2。聚合物粒子之直徑 位移30°/。時之壓縮彈性模數(30% K值)較好的是196〜6,860 N/mm2之範圍内。30% K值之更好之下限為600 N/mm2,進 139450.doc -15- 200948881 而好之下限為980 N/mm2,更好之上限為4,900 N/mm2。 若壓縮彈性模數(10% K值、20% K值及30% K值)過低, 則存在經壓縮時,聚合物粒子受到破壞之情形。若壓縮彈 性模數(10% K值、20% K值及30% K值)過高,則存在電極 間之連接電阻值變高之情形。 上述壓縮彈性模數(10% K值、20% K值及30% K值)可以 * 如下方式而測定。 . 使用微小壓縮試驗機’於直徑為5〇 μιη之金剛石製圓柱 之平滑壓頭端面,於壓縮速度為2 6 mN/秒及最大試驗荷 〇 重為10 g之條件下’對聚合物粒子進行壓縮。測定此時之 荷重值(N)及壓縮位移(mm)。可藉由下述式,由所得之測 疋值求出上述壓縮彈性模數。上述微小壓縮試驗機例如可 使用Fischer公司製造之rFischersc〇peH1〇〇」等。 K值(N/mm2)=(3/21/2).F· S.3/2.R-1/2 F .聚合物粒子壓縮變形丨〇%、2〇%或3〇%時之荷重值 (N) s .聚合物粒子壓縮變形10%、2〇%或3〇%時之壓縮位移 Ο (mm) R :聚合物粒子之半徑 上述壓縮彈性模數普遍且定量地表示聚合物粒子之硬 · 度。藉由使用上述壓縮彈性模數,可定量且唯一地表示聚 合物粒子之硬度。 (導電性粒子) 本發明之導電性粒子具有上述聚合物粒子與被覆該聚合 139450.doc •16- 200948881 物粒子表面之金屬層。 構成上述金屬層之金屬並無特別限^。作為金屬,例如 可列舉:金、銀、銅、鉑、辞、鐵、鉛、錫、鋁、鈷、 銦、鎳、鉻、鈦、銻、鉍、鍺、鎘、鈀、錫·鉛合金、錫_ =金、錫·銀合金或錫I銀合金等。其中,構成上述金 層之金屬較好的是鎳、銅、鈀或金。 一於聚合物粒子表面形成上述金屬層之方法並無特別限 :。:為形成上述金屬層之方法,例如可列舉非電解鍵 述金屬:或:鑛等方法。其中’於聚合物粒子表面形成上 、 之方法較好的是藉由非電解鍍敷而形成之方法。 或性粒子之上述金屬層之外表面較好的是金層、錄層 :由鐘,較好的是錦層或把層。進而’上述金屬層較好的 :較好::::於該錄層表面之纪層所形成。藉由形成該 、屬層,由導電性粒子所連接之電極間 阻值變低。又 運接電 ❹ 日士,於金屬層之外表面為鎳層或鈀層之情形 I 冑性粒子與電極接觸時,可容易地去除覆蓋電極 屬之氧化物。因此’金屬層之外表面與電極表面 之金屬變得容易接觸,連接電阻值變低。 金屬層之外表面亦較好的是包含鎳之金屬層、包含 ’’之金屬層或包含低熔點金屬之金屬$。於金屬層之外表 :為包3鎳之金屬層或包含鈀之金屬層之情形時可容易 地去除覆蓋電極丰而 表面之金屬之氧化物,金屬層之外表面與 „面之金屬變得容易接觸,故連接電阻值變低。於金 層之外表面為包含低熔點金屬之金屬層之情形時,藉由 139450.doc •17· 200948881 回流焊而使包含低溶點金屬之金屬層與電極並非為點接觸 而為面接觸,故連接電阻值變低。進而,於使用在聚合物 粒子之表面形成有低炫點金屬層之導電性粒子,將連接對 象構件電性連接之情形時,即便受到落下等之衝擊,亦難 以於低熔點金屬層上產生龜裂。 、 上述金屬層可為單層,亦可具有2層以上之積層結構。 作為上述金屬層具有2層積層結構之情形時之金屬層,内 層/外層可列舉··鎳層/金層、錄層&層、或㈣/低㈣ 金屬層。 作為低熔點金屬層即包含低熔點金屬之金屬層,可列 舉:包含錫之金屬層,包含錫與銀之金屬層,包含錫與銅 之金屬層,包含錫、銀及銅之金屬層,或包含錫、銀及錄 之金屬層等。所謂低溶點金屬,表示溶點為则。c以下之 金屬。又,於上述包含低炼點金屬之金屬層中所含之金屬 爾量%中,錫之含量較好的是5〇重量%以上更好的是 70重ϊ %以上,進而好的是9〇重量%以上。 ㈣聚合㈣子表面之金屬層之外表面為低溶點金屬層 之情形時’可緩和施加於導電性粒子之應力故可容易地 連接電極間。 ;利用在使用本發明之聚合物粒子的導電性粒子之金屬 層之外表面形成有低溶點金屬層之導電性粒子,將連接對 象構件電性連接之情形時,即便因落下等受到衝擊,亦難 、於低熔點金屬層上產生龜裂。因此,可提高導電可靠 性0 139450.doc 200948881 上述金屬層之厚度較好的是5〜7〇,〇〇〇nm之範圍内。上述 金屬層之厚度之更好之下限為1〇 nm,進而好之下限為2〇 nm,更好之上限為4〇,〇〇〇 nm,更好之上限為5〇〇 nm,進 而好之上限為200 nm。若上述金屬層之厚度過薄,則存在 無法充为獲彳于導電性之情形。若上述金屬層之厚度過厚, 則存在聚合物粒子與金屬層之熱膨脹係數之差變大,金屬 層變得谷易自聚合物粒子上剝離之情形。於上述金屬層具 ❹The compressive elastic modulus (10% K value) when the diameter of the polymer particles is 10% is preferably in the range of 196 to 6,860 N/mm 2 . The lower limit of 10% K is 980 N/mm2, and the upper limit is 4,900 N/mm2. The compressive elastic modulus (20% K value) at a 20% displacement of the polymer particles is preferably in the range of 196-6,860 N/mm2. The lower limit of the 20% K value is 600 N/mm2, and the lower limit is 980 N/mm2, and the upper limit is 4,900 N/mm2, and the upper limit is 3,900 N/mm2. The diameter of the polymer particles is shifted by 30°/. The compressive elastic modulus (30% K value) is preferably in the range of 196 to 6,860 N/mm2. The lower limit of the 30% K value is 600 N/mm2, and the lower limit is 980 N/mm2, and the upper limit is 4,900 N/mm2. If the compression modulus (10% K value, 20% K value, and 30% K value) is too low, the polymer particles are destroyed when compressed. If the compressive elastic modulus (10% K value, 20% K value, and 30% K value) is too high, the connection resistance between the electrodes becomes high. The above compression elastic modulus (10% K value, 20% K value, and 30% K value) can be measured as follows. Using a micro-compression tester's smooth end face of a diamond cylinder with a diameter of 5 μμηη, at a compression speed of 26 mN/s and a maximum test load of 10 g, 'polymer particles compression. The load value (N) and the compression displacement (mm) at this time were measured. The above-described compressive elastic modulus can be obtained from the obtained measured value by the following formula. For the above-mentioned micro compression tester, for example, rFischersc〇peH1® manufactured by Fischer Co., Ltd. or the like can be used. K value (N/mm2)=(3/21/2).F·S.3/2.R-1/2 F. Load of polymer particles under compression deformation 丨〇%, 2〇% or 3〇% Value (N) s. Compressive displacement 聚合物 (mm) when the polymer particles are compressed and deformed by 10%, 2〇% or 3〇% R: radius of the polymer particles The above-mentioned compressive elastic modulus generally and quantitatively indicates the polymer particles Hard degree. By using the above-described compression elastic modulus, the hardness of the polymer particles can be quantitatively and uniquely expressed. (Electrically conductive particles) The electroconductive particles of the present invention have the above polymer particles and a metal layer covering the surface of the particles of the polymer 139450.doc • 16-200948881. The metal constituting the above metal layer is not particularly limited. Examples of the metal include gold, silver, copper, platinum, rhodium, iron, lead, tin, aluminum, cobalt, indium, nickel, chromium, titanium, ruthenium, osmium, iridium, cadmium, palladium, tin, lead alloy, Tin _ = gold, tin · silver alloy or tin I silver alloy. Among them, the metal constituting the above gold layer is preferably nickel, copper, palladium or gold. The method of forming the above metal layer on the surface of the polymer particles is not particularly limited: The method for forming the above metal layer may, for example, be a method of electrolessly intercalating a metal: or a mineral. Among them, the method of forming the surface of the polymer particles is preferably a method of forming by electroless plating. The outer surface of the above metal layer of the orthoparticle is preferably a gold layer or a recording layer: a bell, preferably a layer or a layer. Further, the above metal layer is preferably: preferably::: formed on the surface of the recording layer. By forming the genus layer, the inter-electrode resistance value connected by the conductive particles becomes low. In addition, when the surface of the metal layer is a nickel layer or a palladium layer, the surface of the metal layer is in contact with the electrode, and the oxide covering the electrode is easily removed. Therefore, the outer surface of the metal layer and the metal of the electrode surface are easily contacted, and the connection resistance value becomes low. The outer surface of the metal layer is also preferably a metal layer containing nickel, a metal layer containing '' or a metal $ containing a low melting point metal. Outside the metal layer: in the case of a metal layer containing nickel or a metal layer containing palladium, the oxide of the metal covering the surface of the electrode can be easily removed, and the outer surface of the metal layer and the metal of the surface become easy. Contact, so the connection resistance value becomes low. When the outer surface of the gold layer is a metal layer containing a low melting point metal, the metal layer and the electrode containing the low melting point metal are reflowed by 139450.doc •17·200948881 When the surface contact is not in contact with the point contact, the connection resistance value is lowered. Further, when the conductive particles having a low-spot metal layer are formed on the surface of the polymer particle and the connection target member is electrically connected, even It is also difficult to cause cracks in the low-melting-point metal layer by the impact of falling, etc. The metal layer may be a single layer or a laminated structure of two or more layers. When the metal layer has a two-layered structure, The metal layer, the inner layer/outer layer may be a nickel layer/gold layer, a recording layer & layer, or a (four)/low (four) metal layer. As the low melting point metal layer, that is, a metal layer containing a low melting point metal, a metal layer comprising tin, comprising a metal layer of tin and silver, a metal layer comprising tin and copper, a metal layer comprising tin, silver and copper, or a tin, silver and a recorded metal layer, etc. The so-called low melting point metal, It is a metal having a melting point of less than c. Further, in the metal amount % contained in the metal layer containing the low-refining metal, the content of tin is preferably 5% by weight or more, more preferably 70%. It is more than 5% by weight, and more preferably 9% by weight or more. (4) When the outer surface of the metal layer of the sub-surface is a low-melting-point metal layer, the stress applied to the conductive particles can be relaxed, so that it can be easily connected. Between the electrodes, when the conductive particles having a low melting point metal layer are formed on the surface of the metal layer of the conductive particles of the polymer particles of the present invention, and the connection member is electrically connected, even if it is dropped, etc. It is difficult to generate cracks on the low-melting-point metal layer by impact. Therefore, the reliability of the conductive layer can be improved. 139450.doc 200948881 The thickness of the above metal layer is preferably in the range of 5 to 7 〇, 〇〇〇 nm. Thickness of the above metal layer The lower limit of the better is 1 〇 nm, and the lower limit is preferably 2 〇 nm, and the upper limit is preferably 4 〇, 〇〇〇 nm, and the upper limit is 5 〇〇 nm, and the upper limit is 200 nm. If the thickness of the metal layer is too thin, there is a case where the conductivity cannot be obtained. If the thickness of the metal layer is too thick, the difference in thermal expansion coefficient between the polymer particles and the metal layer becomes large, and the metal layer becomes large. The case where the glutinous rice is peeled off from the polymer particles.

有積層結構之情形時,上述金屬層之厚度表示各金屬層之 厚度之總計。 導電性粒子之壓縮恢復率較好的是5〇%以下,較好的是 45〇/〇以下,更好的是40%以下。若壓縮恢復率超過, 則存在因用於電極間之連接的導電性粒子之斥力而使得異 向性導電材料自基板等上剝離之情形。其結果’存在電極 間之連接電阻值變高之情形。若導電性粒子之壓縮恢復率 為45%以下,則可進—步降低電極間之連接電阻值。導電 性粒子之壓縮恢復率較好的是5%以1,更好的是ι〇%以 上’進而更好的是20%以上。 (異向性導電材料) 本發明之異向性導電材料包含上料電性粒子與黏合劑 樹脂。 上述黏合劑樹脂並無特別限定。例如制絕緣性樹脂作 為上述黏合劑樹脂。作為上述黏合劑樹脂,例如可列舉. 乙烯樹脂、熱塑性樹脂、硬化性樹脂、熱塑性嵌段1物 或彈性體等。上述黏合劑樹脂可僅使用】種,’用 I39450.doc 200948881 ❹ 作為上述乙烯樹脂之具體例,可列舉:乙酸乙烯酯樹 脂、丙稀酸系樹脂或苯乙烯樹脂等。作為上述熱塑性樹脂 之具體例’可列舉:聚烯烴樹脂、乙烯-乙酸乙烯酯共聚 物或聚酿胺樹脂等。作為上述硬化性樹脂之具體例,可列 舉·%氧樹脂、胺酯樹脂、聚醯亞胺樹脂或不飽和聚酯樹 脂等。再者’上述硬化性樹脂亦可為常溫硬化型樹脂、熱 硬化型樹脂、光硬化型樹脂或濕氣硬化型樹脂。上述硬化 性樹脂可與硬化劑㈣。料上述熱塑性嵌段共聚物之具 體例’可列舉:苯乙稀_丁二烯_苯乙烯嵌段共聚物、苯乙 烯-異戊二烯-苯乙烯嵌段共聚物、苯乙烯_ 丁二烯_苯乙烯 嵌段共聚物之氫化物或苯乙稀·異戊二稀_苯乙烯嵌段共聚 物之氫化物等。作為上述彈性體之具體例,可列舉:苯乙 烯-丁二烯共聚橡膠或丙烯腈_苯乙烯嵌段共聚橡膠等。 ❹ 異向性導電材料除了導電性粒子及黏合劑樹脂之外,例 :口亦可含有填充劑、增量劑、軟化劑、塑化劑、聚合觸 、硬化觸媒、著色劑、抗氧化劑、熱穩定劑、光穩定 加劑。…I劑、抗靜電劑或阻燃劑等各種添 作為於上述黏合劑樹脂中分散導電性粒 用先前公知之分散方法,並無特別限定。作為可使 劑樹脂中分散導電性粒子之方法,例如可列舉,;迷黏合 樹脂中添加導電性粒子後,利用行星式混合機等進劑 而使其分散之方法;使用均質器等,將 等進订混練 分散於水或有機溶劑中, 14粒子均勻地 然後添加絲合_骑中,利用 139450.doc •20· 200948881 行星式混合機蓉推t、n 戍荨進仃混練而使其分散之方法; 樹脂利用水或有播、.六杰丨站 ° ^ 行稀釋後,添加導電性粒子, 利,星式混合機等進行混練而使其分散之方法等。 本發明之異向性導電材 導電油黑η 異向性導電膏、異向性 導電片材等。於包含本發明之導電性::導電膜或異向性 料用作異向性導電 y之異向性導電材 ❿ ❹ 带時亦7 或異向性導電片材等膜狀接著劑之情 形時,亦可於包含該暮雷 w丨月 道m 導電陳子之膜狀接著劑上積層不含 導電性粒子之膜狀接著剤。 3 (連接構造體) 黏:=:用本發明之導電性粒子或包含該導電性粒子與 得連接構造體。 _將連接對象構件連接而獲 接造體較好的是包含第1連接對象構件、第2連 :對象構件以及將第1與第2連接對象構件電性連接之連接 和並且該連接部由本發明之導電性粒子或包含該導電2 :子與黏合劑樹脂之異向性導電材料所形成。於使 性粒子之情形時,連接部自身為導電性粒子。即,第卜 第2連接對象構件係由導電性粒子連接。 =接:象構件具體可列舉:半導體晶片、電容器及 一極體專之電子零件,以及印 玻璃基板等之電路基板等。 十生印刷基板及 作為設置於上述連接對象構件上之電極,可列舉 極、錄電極、錫電極、銘電極、銅電極、”極或鶴電極 139450.doc -21 . 200948881 等之金屬電極。於上述連接對象構件為可撓性印刷基板之 情形時,上述電極較好的是金電極、鎳電極、錫電極或銅 電極。於上述連接對象構件為玻璃基板之情形時,上述電 極較好的是鋁電極、銅電極、鉬電極或鎢電極。再者,於 上述電極為鋁電極之情形時,可為僅由鋁所形成之電極, 亦可為於金屬氧化物層表面積層有鋁層之電極。作為上述 金屬氧化物,可列舉:摻雜有三價金屬元素之氧化銦或摻 雜有三價金屬元素之氧化鋅等。作為上述三價金屬元素, 可列舉Sn、A1或Ga等。 若使用本發明之導電性粒子或包含該導電性粒子與黏合 劑樹脂之異向性導電材料,將形成有上述金屬電極之連接 對象構件電性連接,則連接電阻值變低。其中,較好的是 鋁電極或銅電極。 於圖1中,示意性地以正面剖面圖表示使用本發明之一 實施形態之導電性粒子的連接構造體之一例。 圖1所不之連接構造體〗具有於玻璃基板2之上面,經由 包含複數個導電性粒子5之異向性導電膜3而連接印刷基板 4之結構。於玻璃基板2之上面設置有複數個電極h。於印 刷基板4之下面設置有複數個電極乜。電極2a與電極乜係 由複數個導電性粒子5而連接。於本實施形態中,使用2層 可撓性印刷基板作為印刷基板4。其中,亦可使用2層可撓 生印刷基板以外之連接對象構件。再者,於圖〗中印刷 基板4及導電性粒子5係以簡圖表示。 電極2a 4a間之連接通常係藉由於玻璃基板2之電極2a 139450.doc •22- 200948881 上配置導電性粒子5後,以電極2a、4禮此相對向之方 於該玻璃基板2上重疊印刷基板4,並進行加M而進行。二 由加壓,導電性粒子5經壓縮。 轉 然而如上述專利文獻1申所揭示之先前之於聚合物粒 . 子表面形成有金屬層之導電性粒子,其壓縮恢復率較高。 . 如圖3所示,於使用先前之導電性粒子101將電極粍 間連接之情形時,於導電性粒子1〇1與電極h、鈍之周 φ 邊,因被壓縮之導電性粒子ιοί恢復形狀而容易產生空隙 A。進而,於電極2a、牦之與導電性粒子1〇1相接觸之部分 難以形成麗痕。因此,無法充分降低電極2a、43間之連接 電阻值。 與此相對,如圖2中將圖丨所示之連接構造體之導電性粒 子與電極之接觸部分放大而表示般,使用本實施形態之導 電性粒子5之情形時,於電極2&、牦之與導電性粒子5相接 觸之部分容易形成壓痕。因此,可充分降低電極2a、心間 參 之連接電阻值。進而,難以產生上述空隙A。 以下,列舉實施例及比較例,對本發明加以具體說明。 本發明並非僅限定於以下實施例。 . 準備以下材料作為用以獲得聚合物粒子之單體成分。 (作為具有至少2個環結構之脂環式化合物的單體) 二經甲基-三環癸烷二丙烯酸酯 i,3-金剛炫二醇二丙烯酸酯 丙烯酸異葙酯 甲基丙稀酸異袼酯 139450.doc •23· 200948881 丙烯酸二環戊烯酯 丙烯酸二環戊酯 三環癸烧乙稀趟 三環癸烷單曱基乙烯醚 (具有至少2個環結構之脂環式化合物的單體以外之其他 單體) 二乙烯苯(新日鐵化學公司製造,「DVB960」) 苯乙烯 聚丁二醇二丙烯酸酯(共榮社化學公司製造,「Light Acrylate PTMGA-250」) 丙烯酸環己酯 二乙-一酵—丙稀酸酉旨 三經甲基丙烧三丙烯酸酯 季戊四醇四丙烯酸酯 (實施例1) (聚合物種子粒子分散液之製作) 於可分離式燒瓶中添加離子交換水2500 g、苯乙烯250 g、 辛硫醇50 g及氣化鈉0.5 g ’於氮氣環境下進行攪拌。其 後’加熱至70°C ’添加過氧化鉀2.5 g,反應24小時,藉此 獲得聚合物種子粒子。 將所得之聚合物種子粒子5 g、離子交換水5〇〇 g、聚乙 烯醇5重量%水溶液100 g加以混合’藉由超音波使其分散 後,添加至分離式燒瓶中’進行攪拌而獲得聚合物種子粒 子分散液。 139450.doc -24· 200948881 (聚合物粒子之製作) 將一經曱基-三環癸烧二丙烯酸醋38 g、二乙烯苯152 g、 過氧化苯甲醯26 g、十二烷基硫酸三乙醇胺1〇 g、乙醇 130 g添加於離子交換水丨〇〇〇 g中’進行攪拌而獲得乳化 • 液。將所得之乳化液分數次添加至聚合物種子粒子分散液 . 中’挽拌12小時。其後,添加聚乙烯醇5重量%之水溶液 5〇〇 g,於85°C之氮氣環境下反應9小時,從而獲得聚合物 粒子。 ❿ (導電性粒子之製作) 將所得之聚合物粒子清洗、乾燥後,藉由非電解鍍敷 法,於聚合物粒子表面形成具有鎳層與積層於該鎳層表面 之金層之二層結構的金屬層’從而製作導電性粒子。再 者,鎳層之厚度為〇·07 μηι,金層之厚度為〇 〇2 μιη。 (異向性導電膜之製作) 將雙酚Α型環氧樹脂(Japan Epoxy Resins公司製造之 ® EPlkote 10〇9」)ι〇重量份、丙烯酸系橡膠(重量平均分子 量約為80萬)40重量份、甲基乙基酮2〇〇重量份、微膠囊型 更化劑(旭化成化學公司製造之「HX 3941 HP」)50重量 伤、矽烷偶合劑(Dow Corning Toray Silicone公司製造之 SH 6040」)2重量份加以混合,添加導電性粒子以使含 量成為3體積%,使其分散,從而獲得樹脂組合物。 將所得之樹脂組合物塗佈料面經過脫模處理之厚度為 叫之PET(聚對苯二甲酸乙二醋)膜上,以⑽之熱風乾 燥5分鐘,從而製作異向性導電膜。所得之異向性導電膜 139450.doc -25- 200948881 之厚度為12 。 (連接構造體之製作) 將所知之異向性導電膜切割成5 mm X 5 mm之大小。將所 切割之異向性導電膜,貼附於一側設置有具有電阻測定用 導引線之紹電極(高度為0.2 μιη,L/S=20 μηι/20 μιη)之玻璃 基板(寬度為3 cm,長度為3 cm)的鋁電極側之大致中央。 繼而’使設置有相同鋁電極之2層可撓性印刷基板(寬度為In the case of a laminate structure, the thickness of the above metal layer indicates the total thickness of each metal layer. The compression recovery ratio of the conductive particles is preferably 5% or less, preferably 45 Å/Å or less, more preferably 40% or less. When the compression recovery ratio is exceeded, there is a case where the anisotropic conductive material is peeled off from the substrate or the like due to the repulsive force of the conductive particles used for the connection between the electrodes. As a result, there is a case where the connection resistance value between the electrodes becomes high. When the compression recovery ratio of the conductive particles is 45% or less, the connection resistance value between the electrodes can be further reduced. The compression recovery ratio of the conductive particles is preferably 5% to 1, more preferably ι% or more and further preferably 20% or more. (Anisotropic Conductive Material) The anisotropic conductive material of the present invention comprises a chargeable electric particle and a binder resin. The above binder resin is not particularly limited. For example, an insulating resin is used as the above binder resin. The binder resin may, for example, be a vinyl resin, a thermoplastic resin, a curable resin, a thermoplastic block or an elastomer. The above-mentioned binder resin can be used only in the form of 'I39450.doc 200948881 ❹. Specific examples of the vinyl resin include a vinyl acetate resin, an acrylic resin, and a styrene resin. Specific examples of the thermoplastic resin include polyolefin resin, ethylene-vinyl acetate copolymer, and polyamine resin. Specific examples of the curable resin include a % oxygen resin, an amine ester resin, a polyimide resin, or an unsaturated polyester resin. Further, the curable resin may be a room temperature curing resin, a thermosetting resin, a photocurable resin or a moisture curing resin. The above curable resin can be combined with a hardener (4). Specific examples of the above thermoplastic block copolymers include styrene-butadiene-styrene block copolymer, styrene-isoprene-styrene block copolymer, and styrene-butadiene. a hydride of a styrene block copolymer or a hydride of a styrene-isopentadiene-styrene block copolymer or the like. Specific examples of the above elastomer include a styrene-butadiene copolymer rubber or an acrylonitrile-styrene block copolymer rubber. ❹ Anisotropic conductive materials In addition to conductive particles and binder resins, examples of the mouth may also contain fillers, extenders, softeners, plasticizers, polymeric touches, hardening catalysts, colorants, antioxidants, Heat stabilizer, light stabilizer. Various additions such as an agent, an antistatic agent, or a flame retardant The conductive particles are dispersed in the above-mentioned binder resin. The conventionally known dispersion method is not particularly limited. The method of dispersing the electroconductive particle in the resin can be, for example, a method in which conductive particles are added to the binder resin, and then dispersed by a carrier such as a planetary mixer; a homogenizer or the like is used; The ordering and kneading is dispersed in water or an organic solvent, and the 14 particles are evenly added and then added to the silky _ riding, and the 130050.doc •20·200948881 planetary mixer is used to push t and n into the kneading and dispersing it. Method; a method in which a resin is diluted with water or a broadcast, and a conductive particle, a star, a star mixer, or the like is mixed and dispersed. The anisotropic conductive material of the present invention is a conductive oil black η anisotropic conductive paste, an anisotropic conductive sheet or the like. In the case where the conductive property of the present invention is included: a conductive film or an anisotropic material is used as an anisotropic conductive material of an anisotropic conductive y, and a film-like adhesive such as an anisotropic conductive sheet is also used. Alternatively, a film-like adhesive containing no conductive particles may be laminated on the film-like adhesive containing the conductive film of the 暮雷丨. 3 (connection structure) Viscosity: =: The conductive particles of the present invention or the conductive particles are used to form a bonded structure. It is preferable to connect the connection target member and obtain the connection, preferably including the first connection target member, the second connection: the target member, and the connection that electrically connects the first and second connection target members, and the connection portion is the present invention The conductive particles or the anisotropic conductive material comprising the conductive 2:-substrate and the binder resin. In the case of an achievable particle, the connecting portion itself is a conductive particle. That is, the second connection target member is connected by conductive particles. = Connection: The specific components of the device include semiconductor chips, capacitors, and electronic components for the monolithic body, and circuit boards such as a glass substrate. The tenth printed circuit board and the electrode provided on the connection target member include a metal electrode such as a pole, a recording electrode, a tin electrode, an electrode, a copper electrode, or a pole or a crane electrode of 139450.doc -21 . 200948881. When the connection target member is a flexible printed circuit board, the electrode is preferably a gold electrode, a nickel electrode, a tin electrode or a copper electrode. When the connection target member is a glass substrate, the electrode is preferably An aluminum electrode, a copper electrode, a molybdenum electrode or a tungsten electrode. Further, when the electrode is an aluminum electrode, the electrode may be an electrode formed only of aluminum, or may be an electrode having an aluminum layer on a surface layer of the metal oxide layer. Examples of the metal oxide include indium oxide doped with a trivalent metal element or zinc oxide doped with a trivalent metal element. Examples of the trivalent metal element include Sn, A1, Ga, and the like. The conductive particles of the invention or the anisotropic conductive material containing the conductive particles and the binder resin are electrically connected to the connection target member on which the metal electrode is formed, The connection resistance value is low. Among them, an aluminum electrode or a copper electrode is preferred. Fig. 1 is a front cross-sectional view schematically showing an example of a connection structure using conductive particles according to an embodiment of the present invention. The one or more connected structures have a structure in which the printed circuit board 4 is connected to the upper surface of the glass substrate 2 via the anisotropic conductive film 3 including a plurality of conductive particles 5. A plurality of electrodes are provided on the upper surface of the glass substrate 2. h. A plurality of electrode electrodes are provided on the lower surface of the printed circuit board 4. The electrode 2a and the electrode layer are connected by a plurality of conductive particles 5. In the present embodiment, a two-layer flexible printed circuit board is used as the printed circuit board 4. Further, a connection member other than the two-layer flexible printed circuit board may be used. Further, in the drawing, the printed circuit board 4 and the conductive particles 5 are schematically shown. The connection between the electrodes 2a to 4a is usually due to the glass. After the conductive particles 5 are placed on the electrodes 2a 139450.doc • 22-200948881 of the substrate 2, the printed boards 4 are superposed on the glass substrate 2 with the electrodes 2a and 4 facing each other, and M is performed by adding M. The conductive particles 5 are compressed by pressurization. However, as described in the above-mentioned Patent Document 1, the conductive particles formed on the surface of the sub-surface with a metal layer have a high compression recovery rate. As shown in Fig. 3, when the electrodes are connected to each other using the conductive particles 101, it is easy to restore the shape of the conductive particles 〇1 and the electrodes h and the blunt circumference φ by the compressed conductive particles ιοί. Further, voids A are generated. Further, it is difficult to form a sharp mark in the portion where the electrode 2a and the crucible are in contact with the conductive particles 1〇1. Therefore, the connection resistance between the electrodes 2a and 43 cannot be sufficiently reduced. In the case where the conductive particles 5 of the present embodiment are used in the case where the conductive particles of the connection structure shown in the figure are enlarged, the electrode 2&, the electrode and the conductive particle 5 are used. The contact portion is likely to form an indentation. Therefore, the connection resistance value of the electrode 2a and the intercardiac can be sufficiently reduced. Further, it is difficult to generate the above-described voids A. Hereinafter, the present invention will be specifically described by way of examples and comparative examples. The invention is not limited to the following examples. The following materials were prepared as a monomer component for obtaining polymer particles. (as a monomer having an alicyclic compound having at least two ring structures) dimethyl-tricyclodecane diacrylate i,3-adamantane diacrylate, isodecyl methacrylate, methyl acrylate袼ester 139450.doc •23· 200948881 dicyclopentenyl acrylate dicyclopentanyl acrylate tricyclic oxime acesulfame tricyclodecane monodecyl vinyl ether (single compound having at least 2 ring structures of alicyclic compounds) Other monomers other than the body) Divinylbenzene (manufactured by Nippon Steel Chemical Co., Ltd., "DVB960") Styrene polybutylene glycol diacrylate (manufactured by Kyoeisha Chemical Co., Ltd., "Light Acrylate PTMGA-250") Acrylic ring Ester Diethyl-Alpha-Acrylic Acid Trimethyl methacrylate triacrylate pentaerythritol tetraacrylate (Example 1) (Preparation of polymer seed particle dispersion) Ion exchange water was added to a separable flask 2500 g, 250 g of styrene, 50 g of octyl mercaptan and 0.5 g of sodium carbonate were stirred under a nitrogen atmosphere. Thereafter, 2.5 g of potassium peroxide was added by heating to 70 ° C, and the reaction was carried out for 24 hours, whereby polymer seed particles were obtained. 5 g of the obtained polymer seed particles, 5 g of ion-exchanged water, and 100 g of a 5 wt% aqueous solution of polyvinyl alcohol were mixed, and after being dispersed by ultrasonic waves, they were added to a separation flask and stirred to obtain Polymer seed particle dispersion. 139450.doc -24· 200948881 (Production of polymer particles) 38 g of decyl-tricyclic bismuth acrylate, 152 g of divinylbenzene, 26 g of benzamidine peroxide, triethanolamine lauryl sulfate 1 〇 g, 130 g of ethanol was added to the ion-exchanged water 丨〇〇〇g, and the mixture was stirred to obtain an emulsified liquid. The obtained emulsion was added in portions to the polymer seed particle dispersion. Thereafter, 5 〇〇 g of an aqueous solution of 5 wt% of polyvinyl alcohol was added, and the mixture was reacted for 9 hours under a nitrogen atmosphere at 85 ° C to obtain polymer particles. ❿ (Production of conductive particles) After the obtained polymer particles are washed and dried, a two-layer structure having a nickel layer and a gold layer laminated on the surface of the nickel layer is formed on the surface of the polymer particles by electroless plating. The metal layer 'produces conductive particles. Further, the thickness of the nickel layer is 〇·07 μηι, and the thickness of the gold layer is 〇 2 μιη. (Production of an anisotropic conductive film) A bisphenol oxime type epoxy resin (EPlkote 10〇9, manufactured by Japan Epoxy Resins Co., Ltd.), ι by weight, an acrylic rubber (weight average molecular weight of about 800,000), 40 parts by weight Methyl ethyl ketone 2 parts by weight, microcapsule type modifier ("HX 3941 HP" manufactured by Asahi Kasei Chemicals Co., Ltd.) 50 weight damage, decane coupling agent (SH 6040 manufactured by Dow Corning Toray Silicone Co., Ltd.) 2 parts by weight were mixed, and conductive particles were added so as to be 3% by volume, and dispersed to obtain a resin composition. The obtained resin composition coated dough was subjected to a release treatment to a thickness of PET (polyethylene terephthalate) film, and dried by hot air of (10) for 5 minutes to prepare an anisotropic conductive film. The resulting anisotropic conductive film 139450.doc -25- 200948881 has a thickness of 12 . (Production of Connection Structure) The known anisotropic conductive film was cut into a size of 5 mm X 5 mm. The cut-off anisotropic conductive film is attached to a glass substrate (having a height of 0.2 μm, L/S=20 μηι/20 μηη) having a guide wire for resistance measurement on one side (width is 3) The center of the aluminum electrode side of cm, 3 cm in length. Then, a 2-layer flexible printed substrate provided with the same aluminum electrode (width is

/-V cm ’長度為1 cm)以電極彼此重疊之方式對準後貼合。/-V cm ' is 1 cm in length) Aligned and aligned after the electrodes overlap each other.

於1〇 N、i8(rc、及2〇秒之壓接條件下,將該玻璃基板與2 層可撓性印刷基板之積層體進行熱壓接,從而獲得連接構 造體。再者,使用在聚醯亞胺膜上直接形成有鋁電極之2 層可撓性印刷基板。 (實施例2〜16及比較例1〜4) 除了將製作聚合物粒子時所使用之單體成分之種類及其The laminated body of the glass substrate and the two-layer flexible printed circuit board was thermocompression-bonded under pressure conditions of 1 〇N and i8 (rc and 2 sec.) to obtain a bonded structure. A two-layer flexible printed circuit board on which an aluminum electrode is directly formed on a polyimide film (Examples 2 to 16 and Comparative Examples 1 to 4), except for the types of monomer components used in the production of polymer particles and

調配量變更為如下述表i、2所示以外,以與實施例丄相同 之方式製作聚合物種子粒子分散液、聚合物粒子、導電性 粒子、異向性導電膜及連接構造體。 (實施例17) 進行以下非電解鍍 使用實施例1中所得之聚合物粒子, 鎳步驟。 非電解鍍鎳步驟: 將所得之聚合物粒子利用離子吸附劑之Μ重量㈣$ 理5分鐘,繼而,添加至硫酸鈀〇〇1重量%水溶液中: 後,添加二曱基胺硼烷’進行還原處理、過濾、清洗, 139450.doc •26_ 200948881 此獲得附著有鈀之聚合物粒子。 繼而,製備於離子交換水500 mL中溶解有琥珀酸鈉之琥 珀酸鈉1重量%溶液。於該溶液中添加附著有鈀之聚合物 粒子10 g ’進行混合而製備漿料。於漿料中添加硫酸,將 漿料之pH值調整為5。The polymer seed particle dispersion liquid, the polymer particles, the conductive particles, the anisotropic conductive film, and the bonded structure were produced in the same manner as in Example 以外 except that the amounts were changed as shown in the following Tables i and 2. (Example 17) The following electroless plating was carried out using the polymer particles obtained in Example 1, a nickel step. Electroless nickel plating step: The obtained polymer particles are subjected to a weight of ionic adsorbent (iv) for 5 minutes, and then added to a 1% by weight aqueous solution of palladium sulfate: after adding dimercaptoamine borane Reduction treatment, filtration, cleaning, 139450.doc •26_ 200948881 This obtains polymer particles with palladium attached. Then, a 1 wt% solution of sodium succinate in which sodium succinate was dissolved in 500 mL of ion-exchanged water was prepared. To the solution, 10 g of polymer particles to which palladium was attached was added and mixed to prepare a slurry. Sulfuric acid was added to the slurry to adjust the pH of the slurry to 5.

作為鍍鎳液,製備包含硫酸鎳10重量。/❶、次磷酸鈉1〇重 量%、氫氧化鈉4重量%及琥珀酸鈉20重量%之前期鍍鎳溶 液。將pH值經調整為5之上述漿料加溫至肋它後,於漿料 中連續滴加前期鍍鎳溶液,攪拌2〇分鐘,藉此進行鍍敷反 應。確認未產生氫’結束鍍敷反應。 繼而,製備包含硫酸鎳20重量%、二甲基胺硼烷5重量% 及氳氧化鈉5重量%之後期鍍鎳溶液。於結束利用前期鍍 鎳溶液之鍍敷反應之溶液中,連續滴加後期鍍鎳液,攪拌 1小4,藉此進行鍍敷反應。如此般,於聚合物粒子表面 形成鎳層,從而獲得導電性粒子。再者,鎳層之厚度為 〇· 1 μηι。 矛、了使用所得之導電性粒子以外,以與實施例1相同之 方式製作異向料電膜及連接構造體。 (實施例18) 矛了以鎳層之厚度成為0.〇7 μηι之方式進行製備以外, 使用實施例17中所得之導電性粒子,進行以下之非電財 纪步驟。 ^ 非電解链纪步驟: 將所得之導雪1 , Λ 等電陵拉子10 g添加至離子交換水500 mL中, 139450.doc -27· 200948881 藉由超音波處理機使其分散充分,從而獲得粒子懸浮液。 一面將該懸浮液於50°C下進行攪拌,一面緩缓添加包含硫 酸鈀0.02 mol/L、作為錯合劑之乙二胺〇.〇4 mol/L、作為還 原劑之甲酸鈉0.06 mol/L及結晶調整劑之pH值為10.0之非 電解鍍敷液,進行非電解鍍鈀。於鈀層之厚度達到〇.〇3 μιη 之時點結束非電解鍵把。繼而,藉由清洗、真空乾燥而獲 , 得於錄層表面積層有纪層之導電性粒子。 除了使用所得之導電性粒子以外,以與實施例1相同之 方式製作異向性導電膜及連接構造體。再者,鎳層之厚度 ❽ 為0.07 μιη,鈀層之厚度為〇 〇3 μιη。 (實施例19) 除了將實施例1中所得之聚合物粒子變更為實施例5中所 得之聚合物粒子以外,以與實施例丨7相同之方式進行非電 解鍍鎳步驟,於聚合物粒子表面形成鎳層,從而獲得導電 性粒子。 除了使用所得之導電性粒子以外,以與實施例丨相同之 方式製作異向性導電膜及連接構造體。 ◎ (實施例20) 一除了以鎳層之厚度成為〇〇7叫之方式進行製備,士刀將 實施例17中所得之導電性粒子變更為實施例19中所得之導 電性粒子以外,以與實施例18相同之方式進行非電解铲 步驟’從而獲得於錄層表面積層有鈀層之導電性粒子广 除了使用所得之導電性粒子以外’以與實施例1相同之 方式製作異向性導電膜及連接構造體。 139450.doc •28· 200948881 (實施例21〜46及比較例5〜8) 除了將製作聚合物粒子時 μ 調配量變更為如下过矣,字所使用之早體成分之種類及其 ,^表3、4所示以外,以與實施例1相同 方式製作聚合物種子粒子分散液、聚合物粒子、導電性 粒子、異向性導電膜及連接構造體。 (實施例47) 於均勾分散有離子交換水1252 g、聚乙稀醇之ΗAs a nickel plating solution, 10 weights of nickel sulfate were prepared. /❶, sodium hypophosphite 1% by weight, sodium hydroxide 4% by weight, and sodium succinate 20% by weight nickel plating solution. After the above slurry having a pH adjusted to 5 was heated to the rib, the nickel plating solution was successively added dropwise to the slurry, and the mixture was stirred for 2 minutes to carry out a plating reaction. It was confirmed that no hydrogen was generated to end the plating reaction. Then, a nickel plating solution containing 20% by weight of nickel sulfate, 5% by weight of dimethylamine borane, and 5% by weight of sodium cerium oxide was prepared. At the end of the plating reaction using the nickel plating solution in the previous stage, the nickel plating solution was continuously added dropwise, and the plating reaction was carried out by stirring 1 time 4 . In this manner, a nickel layer is formed on the surface of the polymer particles to obtain conductive particles. Further, the thickness of the nickel layer is 〇·1 μηι. An anisotropic film and a connection structure were produced in the same manner as in Example 1 except that the obtained conductive particles were used. (Example 18) Using the conductive particles obtained in Example 17 except that the thickness of the nickel layer was changed to 0. 7 μηι, the following non-electrical energy step was carried out. ^ Non-electrolytic chain step: Add 10 g of the obtained guide snow 1 , Λ, etc. to 500 mL of ion-exchanged water, 139450.doc -27· 200948881 by the ultrasonic processor to make it fully dispersed, thus A particle suspension is obtained. While stirring the suspension at 50 ° C, slowly add 0.02 mol/L of palladium sulfate, ethylenediamine 〇.〇4 mol/L as a crosslinking agent, and 0.06 mol/L of sodium formate as a reducing agent. The electroless plating solution having a pH of 10.0 as a crystal modifier was subjected to electroless palladium plating. The non-electrolytic bond is terminated when the thickness of the palladium layer reaches 〇.〇3 μιη. Then, it is obtained by washing and vacuum drying to obtain conductive particles having a layer of the surface layer of the recording layer. An anisotropic conductive film and a bonded structure were produced in the same manner as in Example 1 except that the obtained conductive particles were used. Further, the thickness 镍 of the nickel layer is 0.07 μηη, and the thickness of the palladium layer is 〇 3 μιη. (Example 19) An electroless nickel plating step was carried out on the surface of the polymer particles in the same manner as in Example 7 except that the polymer particles obtained in Example 1 were changed to the polymer particles obtained in Example 5. A nickel layer is formed to obtain conductive particles. An anisotropic conductive film and a bonded structure were produced in the same manner as in Example except that the obtained conductive particles were used. ◎ (Example 20) The conductive particles obtained in Example 17 were changed to the conductive particles obtained in Example 19, except that the thickness of the nickel layer was changed to 〇〇7. In the same manner as in Example 1, except that the non-electrolytic shovel step was carried out in the same manner as in Example 18 to obtain a conductive particle having a palladium layer on the surface layer of the recording layer except that the obtained conductive particles were used, an anisotropic conductive film was produced in the same manner as in Example 1. And the connection structure. 139450.doc •28·200948881 (Examples 21 to 46 and Comparative Examples 5 to 8) In addition to the production of polymer particles, the amount of μ compounding was changed to the following, and the type of the early body component used in the word and its A polymer seed particle dispersion liquid, polymer particles, conductive particles, an anisotropic conductive film, and a bonded structure were produced in the same manner as in Example 1 except for the above. (Example 47) 125 Irrigation of ion-exchanged water of 1252 g and polyethylene glycol

❹ 水溶液2135 g之分邱、% * g刀放液中,添加二羥甲基-三環癸烷二丙烯 酸 Θ旨 38 g、二 γ «Μ* ^ 1 c-> 、 — 本52 g、作為聚合起始劑之Perbutyl 〇(曰 本油知a司製造)5.9 g,進行混合而獲得混合液。 奸於氮氣環& τ,以7(rc使所得之混合液聚合$小時後, 藉由^氣過據而取出粒子。使用離子交換水與丙_對粒子 進行清洗’藉此去除分散介質’繼而進行乾燥而獲得聚合 物粒子。 所。得之聚合物粒子之平均粒徑為240 _,CV值為 0.42/。。對聚合物粒子進行非電解㈣,於聚合物粒子表 面形成厚度為〇.3 ’之底層鍍鎳層。繼而,對形成有底層 鑛鎳層之聚合物粒子實施電解鍍銅,形成厚度為10 μηι之 銅層進而,使用含有錫及銀之電解電鍍液進行電解電 鍍,形成厚度為25 μηι之低溶點金屬層。如此般,製作於 聚口物粒子表面依序形成有銅層、低熔點金屬層(錫:銀 -96.5重里% : 3·5重量%)之導電性粒子。再者,導電性粒 子之平均粒彳空為3 1〇叫’ cv值為1 。再者,上述聚合 物粒子表面之金屬層之錫及銀之含量係藉由使用螢光X射 139450.doc •29- 200948881 線分析裝置(島津製作所公司製造之「EDX-800HS」)之分 析而求出。 (實施例48〜50及比較例9) 除了將製作聚合物粒子時所使用之單體成分之種類及其 調配量變更為如下述表5所示以外,以與實施例47相同之 方式製作聚合物粒子及導電性粒子。 (實施例51〜90) 除了將製作聚合物粒子時所使用之單體成分之種類及其 調配量變更為如下述表6〜8所示以外,以與實施例i相同之❹ 方式獲得聚合物粒子。 使用所得之聚合物粒子,以與實施例丨7相同之方式進行 非電解鍍錄步驟’於聚合物粒子表面形成錄層,從而獲得 導電性粒子。 除了使用所得之導電性粒子以外,以與實施例1相同之 方式製作異向性導電膜及連接構造體。 (實施例91〜13〇) 除了將作聚合物粒子時所使用之單❹ 2135 g of aqueous solution is divided into 2, g * g * knife discharge liquid, adding dimethylol-tricyclodecane diacrylic acid Θ purpose 38 g, two γ «Μ * ^ 1 c->, - this 52 g, As a polymerization initiator, 5.9 g of Perbutyl® (manufactured by Ayamoto Co., Ltd.) was mixed and mixed to obtain a mixed solution. Spoiled in a nitrogen ring & τ, and after 7 hours of arcing the resulting mixture for polymerization, the particles were taken out by the gas. The ion-exchanged water and the c-particles were washed to remove the dispersion medium. Then, the polymer particles are obtained by drying. The obtained polymer particles have an average particle diameter of 240 Å and a CV value of 0.42 /. The polymer particles are electrolyzed (4), and the thickness of the polymer particles is 〇. 3' of the underlying nickel plating layer. Then, the polymer particles forming the underlying mineral nickel layer are subjected to electrolytic copper plating to form a copper layer having a thickness of 10 μηι, and then electroplating is performed using an electrolytic plating solution containing tin and silver. A low-melting-point metal layer having a thickness of 25 μm. Thus, a conductivity of a copper layer and a low-melting-point metal layer (tin: silver-96.5 wt%: 3.9 wt%) is sequentially formed on the surface of the polymer particles. Further, the average particle hollow of the conductive particles is 3 1 ' 'cv value is 1. Further, the content of tin and silver of the metal layer on the surface of the polymer particles is by using fluorescent X-ray 139450 .doc •29- 200948881 Line Analysis The analysis was carried out by the analysis of "EDX-800HS" manufactured by Shimadzu Corporation. (Examples 48 to 50 and Comparative Example 9) The types of monomer components used in the production of polymer particles and the amount of blending thereof were changed. Polymer particles and conductive particles were produced in the same manner as in Example 47 except as shown in the following Table 5. (Examples 51 to 90) The types of the monomer components used in the production of the polymer particles and The blending amount was changed to the same as that shown in the following Tables 6 to 8, and polymer particles were obtained in the same manner as in Example i. Using the obtained polymer particles, an electroless plating step was carried out in the same manner as in Example 7 A conductive layer was formed on the surface of the polymer particles to obtain conductive particles. An anisotropic conductive film and a bonded structure were produced in the same manner as in Example 1 except that the obtained conductive particles were used. (Examples 91 to 13) 〇) In addition to the single used as polymer particles

139450.doc 守所使用之單體成分之種類及其 以與貫施例1相同 粒子’以鎳層之厚度成為〇 〇7 以與實施例17、18相同之方式 :解鍍鈀步驟,從而獲得於錄層 子0 子以外’以與實施例1相同之 • 30 - 200948881 方式製作異向性導電膜及連接構造體。 (評價) (1) 聚合物粒子之平均粒徑 使用庫爾特計數器(貝克曼庫爾特公司製造)來測定所得 聚合物粒子之平均粒彳查。 (2) 聚合物粒子之cv值 使用庫爾特計數器(貝克曼庫爾特公司製造)來測定所得 聚合物粒子之CV值。 Ο . (3 )聚合物粒子之壓縮彈性模數 使用微小壓Ifg试驗機(Fischer公司製造之「Fischersc〇pe H-100」)來測定所得聚合物粒子之壓縮彈性模數(1〇% κ 值、20% K值及30% K值)。 (4) 聚合物粒子及導電性粒子之壓縮恢復率 使用微小壓縮試驗機(Fischer公司製造之「Fisehersc〇pe H-100」)來測定所得聚合物粒子及導電性粒子之壓縮恢復 ❹ 率。 (5) 連接電阻值 利用4端子法來測定所得連接構造體之相對向之電極間 之連接電阻值。又,以下述評價基準對連接電阻值進行評 價。 [連接電阻值之評價基準] ◎:連接電阻值為2.0 Ω以下 〇:連接電阻值超過2.0 Ω且為3.0 Ω以下 △:連接電阻值超過3.0 Ω且為5.0 Ω以下 139450.doc -31- 200948881 x :連接電阻值超過5.0Ω (6)電極之觀察 使用微分干涉顯微鏡, , 厅侍之連接構造體之玻璃基板 置於玻璃基板之電極,以下述評價基準來評價導 觸之電極之壓痕形成之有無。又,使用金屬 顯微鏡,觀察導電性粒子 7钱觸之電極部分中之空隙產生 之有無。再者,關於電極壓 π < ~展形成之有無,係以電極面 積成為0.02 mm2之方式,利用外八 ^ 八⑴用被分干涉顯微鏡進行觀察, 鼻出母電極0.02 mm2之厭、磨加虹 之壓痕個數。利用微分干涉顯微鏡來 觀察任意10個邛位’算出每電極〇〇2咖2之壓痕個數之平 均值。 [壓痕形成之有無之評價基準] ◎.每電極0.02 mm2之壓痕為乃個以上 〇.每電極0.02 mm2之壓痕為20個以上且未滿25個 △.每電極0.02 mm2之壓痕為5個以上且未滿20個 X .每電極0.〇2 mm2之壓痕未滿5個 (7)落下強度試驗 準備以〇·5 mm之間隔設置有112個電極(直徑為280 μιη) 之矽晶片(縱6 mmx橫6 mm)。於該矽晶片之電極上塗佈助 焊劑(Cookson Electronics公司製造之「WS-9160-M7」)。 於所有電極上配置所得之導電性粒子,於加熱溫度為 25〇°C及30秒之條件下進行回流焊,將導電性粒子安裝於 電極上。 繼而’準備設置有銅電極(直徑為305 μιη)之印刷基板。 139450.doc -32- 200948881 於該印刷基板上塗佈焊錫膏(千住金屬 现喝丄某公司製造之 「M705_GRN360_K2_V」卜將15個於電極上安裝有導電性 粒子之石夕晶片安裝於塗佈有焊錫膏之印刷基板上,從:獲 得連接構造體^ 根據JEDEC規格JESD22-B111,進行所得之連接構造體 之落下強度試驗,以下述評價基準進行評價。 所得之連接構造體形成菊鍊電路,故即便於〗處產生電 極之斷線,亦可檢測出斷線。再者,電極係面向外表面而 依序形成有銅層、鎳-磷層及金層者。 [落下衝擊試驗之評價基準] 〇.於所有15個矽晶片中,電極斷線之落下次數為1〇〇次 以上 △:於所有15個矽晶片中’電極斷線之落下次數為5〇次 以上且未滿100次139450.doc The type of the monomer component used in the same manner as in Example 1 is the same as in the case of Example 1, in which the thickness of the nickel layer is 〇〇7 in the same manner as in Examples 17 and 18: the palladium plating step is obtained. An anisotropic conductive film and a connection structure were produced in the same manner as in Example 1 except for the recording layer 0. (Evaluation) (1) Average particle diameter of polymer particles The average particle size of the obtained polymer particles was measured using a Coulter counter (manufactured by Beckman Coulter Co., Ltd.). (2) Cv value of polymer particles The CV value of the obtained polymer particles was measured using a Coulter counter (manufactured by Beckman Coulter Co., Ltd.). Ο . (3) Compressive elastic modulus of polymer particles The compressive elastic modulus (1〇% κ) of the obtained polymer particles was measured using a micro pressure Ifg tester (Fischersc〇pe H-100) manufactured by Fischer Co., Ltd. Value, 20% K value and 30% K value). (4) Compression recovery ratio of polymer particles and conductive particles The compression recovery ratio of the obtained polymer particles and conductive particles was measured using a micro compression tester ("Fisehersc〇pe H-100" manufactured by Fischer Co., Ltd.). (5) Connection resistance value The connection resistance value between the opposing electrodes of the obtained connection structure was measured by a 4-terminal method. Further, the connection resistance value was evaluated on the basis of the following evaluation criteria. [Evaluation criteria for connection resistance value] ◎: Connection resistance value is 2.0 Ω or less 〇: Connection resistance value exceeds 2.0 Ω and is 3.0 Ω or less △: Connection resistance value exceeds 3.0 Ω and is 5.0 Ω or less 139450.doc -31- 200948881 x : The connection resistance value exceeds 5.0 Ω. (6) Observation of the electrode Using a differential interference microscope, the glass substrate of the connection structure of the hall is placed on the electrode of the glass substrate, and the indentation formation of the electrode of the guide is evaluated by the following evaluation criteria. Whether there is. Further, using a metal microscope, the presence or absence of voids in the electrode portion of the conductive particles 7 was observed. In addition, regarding the presence or absence of the electrode pressure π < ~ formation, the electrode area is 0.02 mm 2 , and the observation is performed by the interference microscope with the outer 8 8 (1), and the nose electrode 0.02 mm 2 is worn and milled. The number of rainbow indentations. The average value of the number of indentations per electrode 2 was calculated by observing any of the ten 邛 positions using a differential interference microscope. [Evaluation criteria for the presence or absence of indentation formation] ◎. The indentation of 0.02 mm2 per electrode is more than one. The indentation of 0.02 mm2 per electrode is 20 or more and less than 25 △. Indentation of 0.02 mm2 per electrode 5 or more and less than 20 X. Each of the electrodes has an indentation of less than 5 (2). The drop strength test preparation is provided with 112 electrodes (280 μm diameter) at intervals of 〇·5 mm. The wafer is then 6 mm long and 6 mm horizontal. A flux ("WS-9160-M7" manufactured by Cookson Electronics Co., Ltd.) was applied to the electrode of the wafer. The obtained conductive particles were placed on all the electrodes, and reflowed under the conditions of a heating temperature of 25 ° C and 30 seconds to mount the conductive particles on the electrodes. Then, a printed substrate provided with a copper electrode (305 μm in diameter) was prepared. 139450.doc -32- 200948881 Applying solder paste to the printed circuit board (Matsuya Metal is now drinking "M705_GRN360_K2_V" manufactured by 丄 公司 卜 将 15 15 15 15 15 15 15 15 15 15 15 15 15 15 15 15 15 15 15 15 On the printed circuit board of the solder paste, the connection structure was obtained: According to the JEDEC standard JESD22-B111, the drop strength test of the obtained connection structure was carried out, and the evaluation was performed based on the following evaluation criteria. The obtained connection structure forms a daisy chain circuit. That is to say, it is convenient to produce the disconnection of the electrode, and the disconnection can also be detected. Furthermore, the electrode layer faces the outer surface and sequentially forms a copper layer, a nickel-phosphorus layer and a gold layer. [Evaluation criteria for the drop impact test]于. In all 15 矽 wafers, the number of electrode breaks dropped more than 1 △ △: In all 15 矽 wafers, the number of drops of the electrode break is 5 以上 or more and less than 100 times.

x .於所有15個矽晶片中’電極斷線之落下次數未滿5〇 次 將結果示於下述表卜10中。再者,於下述表1〜1〇中,「_」 表示未作評價。 139450.doc •33· 200948881 【ϊ <】 實施例 (Ν CN v-i 00 m Ni/Au Ο cn 〇\ CN 3315 1775 1294 寸 <Ν 00 1—Η T—^ (N 〇 〇 1 1—1 寸 1—^ ι—1 Ni/Au Ο rn 卜 (Ν 3246 1746 1226 Ο 1—Η (N (N 〇 〇 1 Ο ν〇 寸 r^ Ni/Au Ο m* 〇〇 (Ν 3138 1559 m (Ν Ον 1-^ 寸 r4 〇 〇 1 Ον 00 m CN Ni/Au ο CO 00 oi 3177 1226 1069 oo Η ΓΟ 1—Η (Ν (Ν 〇 〇 4ί 1 00 (N ^Γί 〇〇 CO Ni/Au Ο rn 卜 (N 2471 m σ\ cn cn r»H ΓΟ (Ν 〇 〇 #. 1 卜 寸 Ni/Au Ο ro 00 CN 2687 cn in oo 1432 Ό (N 〇 (Ν 〇 〇 4ί 1 νο 寸 Τ"·Η Ni/Au Ο rn 卜 CN 2922 2030 1844 卜 m m 〇 (Ν 〇 〇 碟 1 <Ti 〇〇 CO (Ν yr> τ-^ Ni/Au Ο rn 00 c4 2991 2157 2206 〇 οο cn (Ν <Ν 〇 Ο 41 1 寸 CN 00 m Ni/Au ο CO 00 (N 3138 1-H 1942 寸 ο m Η (Ν 〇 〇 1 寸 1-Η Ι^Η v〇 Ni/Au ο 00 CN 3354 2030 Ί—^ o οο m <Ν CN 〇 〇 1 (Ν 寸 τ—Η r-H Ni/Au Ο rn (N 3638 2246 1912 m m (Ν 〇 〇 1 τ—Η 00 m (Ν in Ni/Au ο cn 00 (N 2295 2001 寸 Η (Ν 〇 〇 1 3 Q 3 3 3 ^Ξ〇 鍍敷方法(金屬層) 聚合物粒子之平均粒徑(μιη) 聚合物粒子之CV值(%) rO I Ο V 屮 餐 荽 Μ 荽 B 屮 契 1聚合物粒子之壓縮恢復率(%) i導電性粒子之壓縮恢復率(%) 連接電阻值 壓痕形成之有無 空隙產生之有無 落下強度試驗 二羥甲基-三環癸烷二丙烯酸酯 丙烯酸異芝葙酯 丙烯酸二環戊烯酯 丙烯酸二環戊酯 二乙烯苯 苯乙烯 聚丁二醇二丙烯酸酯 丙烯酸環己酯 S命; 駿噠令※1 139450.doc • 34- 200948881 【ζί 比較例 寸 ON ON Ni/Au Ο cn 00 (Ν 2981 1814 1755 in in <N rn <1 < 1 m Ni/Au ο rn 00 (Ν 5296 4472 4894 vn uS X X 1 CN OO cn (N Ni/Au Ο cn 00 (Ν (N in cn <3 X 1 00 m CN Ni/Au ο C^i 卜 (Ν 1422 | 1079 1402 寸 rn < X 1 實施例 00 m 152 Ni/Pd Ο cn 〇〇 oi | 2991 | 2157 2206 〇 CO r—H ◎ ◎ 1 oo m (N Ο rn 卜 (N | 2991 | 2157 [2206 | 〇 m O) H ◎ ◎ 1 〇〇 00 m (N i-H Ni/Pd Ο cn 00 (N | 3981 | 2295 2001 jn 卜 m CN ◎ ◎ 1 卜 00 CN ο ΓΟ 〇\ (N | 3981 | 2295 [2001 | 00 cn O) ◎ ◎ 1 v〇 <N 1—H 00 m Ni/Au Ο cn 卜 oi 3481 1775 1334 CN CN 寸 cs 〇 〇 m 1 ΙΟ 〇\ ON | Ni/Au Ο <ri 00 CN 4717 2746 2560 τ—< 寸 卜 m CN (N 〇 〇 1 寸 CN 00 m Ni/Au Ο rn 00 <N 3119 1569 1089 i-H CN 〇 〇 1 m On On Ni/Au Ο rn 00 (N 4050 2560 2099 r- m o —H CN 〇 〇 1 3 3 3 3 3 鍍敷方法(金屬層) 聚合物粒子之平均粒徑(μιη) 聚合物粒子之cv值(%) 聚合物粒子之10% K值(N/mm2) 聚合物粒子之20% K值(N/mm2) I § m 屮 輕 聚合物粒子之壓縮恢復率(%) 導電性粒子之壓縮恢復率(%) 連接電阻值 壓痕形成之有無 空隙產生之有無 落下強度試驗 二羥甲基-三環癸烷二丙烯酸酯 丙烯酸異蓓酯 丙烯酸二環戊烯酯 丙烯酸二環戊酯 二乙烯苯 苯乙烯 聚丁二醇二丙烯酸酯 丙烯酸環己酯 BQiL* V〇Y Β 鹤噠令※1 * 139450.doc ·35· 200948881 1 實施例 in cn 卜 Ni/Au| Ο ΓΠ ON <N 2087 1 1136 1 1088 | Ον 00 «〇 (Ν Ο 〇 碡 芝 (Ν >Ti 00 m Ni/Au ο cn 00 (Ν' 2460 1421 1156 »< 二 (Ν (Ν 0 ο 確 cn m 寸 T—^ v〇 Ni/Au ο ΓΟ 00 CN 2744 1744 1362 OO <N ο 〇 媒 (N cn VO 对 τ~^ Ni/Au ο rn Γ^ fN 2813 1989 1862 ON m oi ο ο 00 m <Ν m Ni/Au ο 00 (Ν 2930 2195 2136 o 00 m (N CN ο ο 碟 沄 〇 卜 Ni/Au Ο CO as CN 3010 2387 2387 qj Ό CN ο <] 碟 os CN (N 00 C^i Ni/Au ο rn 卜 (Ν [3254 | 1882 1245 v-j cs m <N 〇 〇 碟 00 CN 1-^ Ni/Au Ο Γ<*ΐ os CN 2793 1725 1186 cn (N ON (Ν oi 〇 〇 v〇 Ni/Au Ο Γ^ϊ Γ Η | 2666 | 1431 1147 ON cn oi 〇 〇 V〇 cs OO r4 Ni/Au Ο cn 00 (Ν [2185 | 1186 '1049 对 »—n 〇 寸 (Ν 〇 ο CN 卜 On Ni/Au ο cn cn [2186 | 1109 m V) 00 OO 卜 吁 r4 〇 ο ri (N 〇〇 m Ni/Au ο cn 卜 <N 2705 1548 〇 in Ό cn cn ο CN ο 〇 (N 寸 Ni/Au ο 00 (Ν [2881 | 1676 1656 $ (Ν CN ο 〇 m fN (N 寸 1—^ Ni/Au Ο ΓΛ 卜 CN 3067 1784 1597 1 ο m Ο oi 〇 ο CN OO m (N »n Ni/Au Ο ΓΛ OO CN 3342 1872 1686 <Ν (Ν 〇 ο 3 3 3 /*—N v25 3 3 3 3 W 3 s 3 2 3 /—s t$o 填 百 3 輕 為 g > U U 審 Φ rO 1 & o 屮 rC' 1 r<g B % U 荽 g 错· 费ί 塄 /—Ν … 4 趄 % 連接電阻值 歷痕形成之有無 空隙產生之有無 1 落下強度試驗 1二羥甲基-三環癸烷二丙烯酸酯 溜 爱 ,1 Ί 域 W 1 ΓΟ 溜 ¢- 趙 Ί μ 三環癸烷乙烯醚 三環癸烷單甲基乙烯醚 二乙烯苯 苯乙烯 遛 潜 Ί ,1 Η 溜 tO 楚 三乙二醇二丙烯酸酯 三羥甲基丙烷三丙烯酸酯 溜 0 «Γ S 缽額噠令※l Φ2ΐ * 139450.doc -36- 200948881 ο ο 【寸ΐ ¥ 餐 Jj 00 |Ni/Au| 〇 rn 〇\ (Ν 4518 4204 4528 m r*i X X 1 卜 § Ni/Au 〇 tn 00 (Ν 1813 1343 1813 s v-ϊ cn X X 1 1—^ Ni/Au ο rn 00 <Ν 1078 ο ON On 1215 On r~j cn < X 1 yn Ni/Au ο cn 00 (Ν s 寸 寸 ΓΟ S cn <] X 1 Ni/Au ο cn os (Ν 3406 1872 r-H m CN ο (Ν 〇 〇 1 〇\ f—Η 卜 Ni/Au ο cn 卜 (Ν 3306 2361 2405 卜 Η 〇 <] 1 S 1—^ |Ni/Au| Ο cn VO (Ν ο ζ> oo VO ΓΟ <N ΓΟ in CN 〇 <3 4ί 1 iNi/Aul ο ΓΟ οο (Ν ο ν〇 〇\ ON m m 寸 寸 〇\ CN 〇 < 碟 1 Ni/Au ο rn 卜 Η 2558 1509 1303 oo (N so (N Ο CS 〇 〇 1 ψ-^ 寸 ,丨丨丨叫 1—Η 〇\ Ni/Au Ο m" 00 (Ν 2142 1096 1045 OO t> οο (Ν 〇 〇 碟 1 〇 (Ν 00 m Ni/Au ο rn 00 CN 2391 1176 m cn (Ν 〇 〇 1 os m 寸 产— Ni/Au ο ΓΠ 卜 (Ν 2724 1872 1725 in (Ν Ο (Ν 〇 〇 1 oo cn v〇 寸 1—^ Ni/Au ο rn ν〇 (Ν 2920 2029 2254 Ό Ο c4 〇 〇 碟 1 〇〇 ΓΛ (N <n 1—^ Ni/Au Ο ΓΛ ΟΝ CN 2960 2185 2308 Os m 00 m cn <Ν 〇 〇 41 1 ^sO m os r—η 1—^ Ni/Au Ο ΓΛ 〇Ν CN 3276 2375 2401 等 rj Γ Η 〇 <] 1 3 /—N ^&C /—Ν bi 3 -w 3 s s 3 'w^ S 'W1 聚合物粒子之平均粒徑(μηι) g > Ο U 荟 ε ο 矣 ε δ 屮 # 1 & o m W 屮 2 费ί 屮 求 齋 屮 連接電阻值 壓痕形成之有無 1空隙產生之有無 落下強度試驗 丨 二羥甲基-三環癸烷二丙烯酸 酯 遛 Ί 鮏 Ί 鉍 W 塯 盤 蓑 遛 盤 蟹 B- 遛 Ί 裴 遛 Ί 潜 案 « 装 1〇 你 'Ί 三環癸烷單甲基乙烯醚 蓑 tO Ί 蓑 ο i4 聚丁二醇二丙烯酸酯 溫 t0 € 潜 装 Ί ή Ί ι0 π| 溜 韶 案 '·! S- 墩 !ί 溫 教 0 鮏 0 °斗韜噠令※】 %*. 139450.doc -37- 200948881 ^V-US3 00寸3 ix. The number of drops of the electrode break in all 15 wafers was less than 5 times. The results are shown in Table 10 below. Furthermore, in Tables 1 to 1 below, "_" indicates that no evaluation has been made. 139450.doc •33· 200948881 [ϊ <] Example (Ν CN vi 00 m Ni/Au Ο cn 〇\ CN 3315 1775 1294 inch <Ν 00 1—Η T—^ (N 〇〇1 1-1 Inch 1—^ ι—1 Ni/Au Ο rn 卜 (Ν 3246 1746 1226 Ο 1—Η (N (N 〇〇1 Ο ν〇 inch r^ Ni/Au Ο m* 〇〇 (Ν 3138 1559 m (Ν Ον 1-^ inch r4 〇〇1 Ον 00 m CN Ni/Au ο CO 00 oi 3177 1226 1069 oo Η ΓΟ 1—Η (Ν (Ν ί4ί 1 00 (N ^Γί 〇〇CO Ni/Au Ο rn卜(N 2471 m σ\ cn cn r»H ΓΟ (Ν 〇〇#. 1 卜寸 Ni/Au Ο ro 00 CN 2687 cn in oo 1432 Ό (N 〇(Ν 〇〇4ί 1 νο inchΤ"·Η Ni/Au Ο rn 卜 CN 2922 2030 1844 卜mm 〇(Ν 〇〇 1 1 <Ti 〇〇CO (Ν yr> τ-^ Ni/Au Ο rn 00 c4 2991 2157 2206 〇οο cn (Ν <Ν 〇Ο 41 1 inch CN 00 m Ni/Au ο CO 00 (N 3138 1-H 1942 inch ο m Η (Ν 〇〇1 inch 1-Η Ι^Η v〇Ni/Au ο 00 CN 3354 2030 Ί—^ o οο m <Ν CN 〇〇1 (Ν inchτ—Η rH Ni/Au Ο rn (N 3638 2246 1912 mm (Ν 1 τ—Η 00 m (Ν in Ni/Au ο 00 00 (N 2295 2001 inch Η (Ν 〇〇1 3 Q 3 3 3 ^Ξ〇 plating Application method (metal layer) Average particle diameter of polymer particles (μιη) CV value (%) of polymer particles rO I Ο V 屮 荽Μ 屮 B 压缩 1 1 Polymer compression recovery rate (%) i Conductive Compressive recovery rate of particles (%) Connection resistance value Indentation formation Whether or not voids are produced with or without drop strength Test Dimethylol-tricyclodecane diacrylate Acrylic acid isophthalic acid ester Dicyclopentene ester acrylic acid secondary ring Amyl divinyl styrene polybutylene glycol diacrylate hexyl hexyl acrylate S; 哒 哒 ※ ※ 139450.doc • 34- 200948881 [ζί Comparative example inch ON ON Ni/Au Ο cn 00 (Ν 2981 1814 1755 in in <N rn <1 < 1 m Ni/Au ο rn 00 (Ν 5296 4472 4894 vn uS XX 1 CN OO cn (N Ni/Au Ο cn 00 (Ν (N in cn <3 X 1 00 m CN Ni/Au ο C^i 卜 (Ν 1422 | 1079 1402 inch rn < X 1 Example 00 m 152 Ni/Pd Cn 〇〇oi | 2991 | 2157 2206 〇CO r—H ◎ ◎ 1 oo m (N Ο rn 卜 (N | 2991 | 2157 [2206 | 〇m O) H ◎ ◎ 1 〇〇00 m (N iH Ni/ Pd Ο cn 00 (N | 3981 | 2295 2001 jn 卜m CN ◎ ◎ 1 卜 00 CN ο ΓΟ 〇\ (N | 3981 | 2295 [2001 | 00 cn O) ◎ ◎ 1 v〇<N 1—H 00 m Ni/Au Ο cn 卜 3481 1775 1334 CN CN inch cs 〇〇m 1 ΙΟ 〇\ ON | Ni/Au Ο <ri 00 CN 4717 2746 2560 τ—< 寸卜 m CN (N 〇〇1 inch CN 00 m Ni/Au Ο rn 00 <N 3119 1569 1089 iH CN 〇〇1 m On On Ni/Au Ο rn 00 (N 4050 2560 2099 r- mo —H CN 〇〇1 3 3 3 3 3 Plating Method (metal layer) Average particle diameter of polymer particles (μιη) cv value (%) of polymer particles 10% of polymer particles K value (N/mm2) 20% of polymer particles K value (N/mm2) I § m 压缩 Light polymer particle compression recovery rate (%) Conductive particle compression recovery rate (%) Connection resistance value Indentation formation Whether or not voids are produced with or without drop strength test Dimethylol-tricyclic oxime Alkyl diacrylate isodecyl acrylate dicyclopentenyl acrylate dicyclopentanyl divinyl styrene polybutylene glycol diacrylate hexyl hexyl bromide BQiL* V〇Y Β 哒 哒 ※ ※ * 139450.doc ······· Ν' 2460 1421 1156 »<2(Ν(Ν 0 ο cn cn m inch T-^ v〇Ni/Au ο ΓΟ 00 CN 2744 1744 1362 OO <N ο 〇 ( (N cn VO to τ~^ Ni /Au ο rn Γ^ fN 2813 1989 1862 ON m oi ο ο 00 m <Ν m Ni/Au ο 00 (Ν 2930 2195 2136 o 00 m (N CN ο ο 沄〇 Ni Ni/Au Ο CO as CN 3010 2387 2387 qj Ό CN ο <] 碟 os CN (N 00 C^i Ni/Au ο rn 卜 (Ν [3254 | 1882 1245 vj cs m <N 〇〇碟00 CN 1-^ Ni/Au Ο Γ<*ΐ os CN 2793 1725 1186 cn (N ON (Ν oi 〇〇v〇Ni/Au Ο Γ^ϊ Γ Η | 2666 | 1431 1147 ON cn oi 〇〇V〇cs OO r4 Ni/Au Ο cn 00 (Ν [2185 | 1186 '1049 对»—n 〇 inch (Ν 〇ο CN 卜 On Ni/Au ο cn cn [2186 | 1109 m V) 00 OO Bu Yu r4 〇ο ri (N 〇〇m Ni/Au ο cn 卜 <N 2705 1548 〇in Ό cn cn ο CN ο 〇 (N inch Ni/Au ο 00 (Ν [2881 | 1676 1656 $ (Ν CN ο 〇m fN (N inch 1—^ Ni/Au Ο ΓΛ 卜 CN 3067 1784 1597 1 ο m Ο oi 〇ο CN OO m (N »n Ni/Au Ο ΓΛ OO CN 3342 1872 1686 <Ν (Ν 〇ο 3 3 3 /*-N v25 3 3 3 3 W 3 s 3 2 3 /-st$o Fill in 100 light as g > UU review Φ rO 1 & o 屮rC' 1 r<g B % U 荽g 错·费ί 塄/—Ν ... 4 趄% connection resistance value trace formation with or without void generation 1 drop strength test 1 dimethylol-tricyclodecane diacrylate slip Love, 1 Ί Domain W 1 ΓΟ ¢ ¢ - Zhao Wei μ Tricyclodecane vinyl ether tricyclodecane monomethyl vinyl ether divinyl phenyl styrene hydrazine, 1 Η slip tO Chu Sanethylene glycol diacrylate trimethylolpropane triacrylate slip 0 «Γ S 钵 哒 ※ ※ l Φ2ΐ * 139450.doc -36- 200948881 ο ο [inch ΐ ¥ Meal Jj 00 | Ni/Au| 〇rn 〇\ (Ν 4518 4204 4528 mr*i XX 1 卜 Ni/Au 〇tn 00 (Ν 1813 1343 1813 s v-ϊ cn XX 1 1—^ Ni/Au ο rn 00 <Ν 1078 ο ON On 1215 On r~j cn < X 1 yn Ni/Au ο cn 00 (Ν s inch inch ΓΟ S cn <] X 1 Ni/Au ο cn os (Ν 3406 1872 rH m CN ο (Ν 〇〇1 〇\ f—Η Ni Ni/Au ο cn 卜 (Ν 3306 2361 2405 Η 〇 〇 <] 1 S 1—^ |Ni/Au| Ο cn VO (Ν ο ζ> oo VO ΓΟ <N ΓΟ in CN 〇&lt ;3 4ί 1 iNi/Aul ο ΓΟ οο (Ν ο ν〇〇\ ON mm inch inch 〇 \ CN 〇< dish 1 Ni/Au ο rn Η 2558 1509 1303 oo (N so (N Ο CS 〇〇1 ψ -^ inch, howl 1丨丨丨Η Ni\ Ni/Au Ο m" 00 (Ν 2142 1096 1045 OO t> οο ( 〇〇 〇〇 1 〇 (Ν 00 m Ni/Au ο rn 00 CN 2391 1176 m cn (Ν 〇〇1 os m inch production - Ni/Au ο ΓΠ 卜 (Ν 2724 1872 1725 in (Ν Ο (Ν 〇〇 1 oo cn v〇 inch 1—^ Ni/Au ο rn ν〇(Ν 2920 2029 2254 Ό Ο c4 〇〇碟1 〇〇ΓΛ (N <n 1—^ Ni/Au Ο ΓΛ ΟΝ CN 2960 2185 2308 Os m 00 m cn <Ν 〇〇41 1 ^sO m os r—η 1—^ Ni/Au Ο ΓΛ 〇Ν CN 3276 2375 2401 et al rj Γ Η 〇<] 1 3 /—N ^&C / —Ν bi 3 -w 3 ss 3 'w^ S 'W1 Average particle size of polymer particles (μηι) g > Ο U ea ε ο 矣ε δ 屮# 1 & om W 屮2 费ί屮Connection resistance value The presence or absence of the formation of the indentation 1 The presence or absence of the void strength test 丨 Dimethylol-tricyclodecane diacrylate 遛Ί 铋 塯W 塯 蓑遛 蓑遛 蟹 B- 遛Ί 裴遛Ί 潜Case « Pack 1〇你'Ί Tricyclodecane monomethyl vinyl ether 蓑tO Ί 蓑ο i4 Polybutylene glycol diacrylate temperature t0 € Submersible Ί Ί ι ι0 π| 溜 韶 ' '·! S- pier ! ί 温教 0 鮏 0 ° 韬哒 韬哒 ※ ※ %*. 139450.doc -37- 200948881 ^V-US3 00 inch 3 i

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Ί 鮏 Ί 〇 'Ί 避 Η δ- 'Ί 溜 爱 0 鮏 0 钿 -韜噠令※1 139450.doc -42- 200948881 φ 01—Iΐ ο m ι—Η |Ni/Pdl 〇 ΓΠ 〇\ CN 3406 I 1872 | 1—« 5 ΓΟ (N ◎ ◎ 1 0's (Ν 1—Η Os 卜 Ni/Pd 〇 cn 卜 CN 3306 2361 丨 2405 | Μ <N ◎ Ο 碡 1 οο (Ν t«H 1 Ni/Pd 1 〇 r^i 'sO (N ο Os 〇〇 VO vn CO fN ΓΛ 寸 00 1—^ ◎ < 1 »—Η Ni/Pd Ο r*i 00 CN ο ν〇 ON 〇\ ΓΛ m m 寸 寸 οο 1—^ ◎ 〈 1 Ό CN 1 Ni/Pd 1 Ο cn r- (Ν 1 2558 1 1509 1303 00 (Ν 00 in ◎ ◎ 1 (Ν 1—^ I Ni/Pd | ο cn 00 ri 2142 1096 1 1045 1 00 〇 卜 ◎ 〇 碡 1 艺 ί—Η (N Τ—^ 〇〇 丨 Ni/Pd 1 ο ΓΛ οο (Ν 2391 U519^ 1176 〇\ oo ◎ 〇 1 IK m (Ν 1—^ 寸 Ni/Pd Ο ΓΛ 卜 oi 2724 1872 1 1725 1 (N (N rn ◎ 〇 1 CN (Ν \〇 寸 r-^ I Ni/Pd | Ο rn Ό <N 2920 2029 12254 1 P: cn ◎ ◎ 1 (Ν ι—Η 00 m (N in I Ni/Pd | ο cn ON CN 2960 2185 1 2308 1 ON m 〇〇 rn ◎ ◎ 1 宕 τ—Η 1—H 卜 ί—^ σ^ Ni/Pd ο cn 〇s oi 2087 1136 1088 Os 〇〇 O) r*H ◎ 〇 1 σ\ (Ν W-) GC Γ^Ί I Ni/Pd | Ο ΓΛ 00 oi 2460 1156 t—^ 〇 OO ◎ 〇 1 ΟΟ ^-Η 寸 Ni/Pd Ο rn 00 CN 2744 1744 1362 00 (N (N (N (N ◎ ◎ 1 卜 *·**Η 寸 r-^ F··^ I Ni/Pd | ο cn 卜 CN 2813 1989 1 1862 1 ON m ΓΜ CN ◎ ◎ 1 Ό 00 m (Ν κη 1—1 Ni/Pd ο rn 00 CN 2930 2195 |2136| o P; (N ◎ ◎ 碟 1 /<—«· U "2 •w< 'w- W ^w> 3 /—s u /^Ν •3 ^2 Sw> Sw- 璨 1 勢 Μ Μ- /·—- > U 荽 <〇 ε % ο 荽 1 δ 荽 1 客 塄 # 式 竣| 屮 ά ±i — 連接電阻值 壓痕形成之有無 碡 1落下強度試驗 1 ζ 潜 案 Ί 你 Η| 械 B- '1 € '1 鮏 Ί 紱 瞧 cn^ 丙烯酸異梠酯 丨甲基丙烯酸異祜酯 爱 Ί 装 遝 Ί 毽 爱 W 装 Ο u| W 爱 1〇 &- 细!· 你 'Ί 裝 (0 Ί 丨笨乙烯 餵 Μ 装 « Ί 1& Ί Η 鉍 避 r0 褒 装 Ί 鮏 Ί Ο 'Ί 溜 盤 >Ί S- 葡 !«1 0 铨 0 缽雜噠令※1 Φ噠額★WK^sfc-'fl;吉屮齧荽Φ龄尝鉍* 139450.doc -43- 200948881 於表示實施例1〜46、51〜130之評價結果之表卜4、6〜10 中顯示,於使用2層可撓性印刷基板之情形時,可獲得良 好之結果。並確認,即便使用3層可撓性印刷基板來替代2 層可撓性印刷基板’亦可藉由使用實施例丨〜46、51〜13〇之 聚合物粒子及導電性粒子而獲得良好之結果。又,由表示 實施例47〜5 0之評價結果之表5可瞭解,即便受到落下之衝 擊’亦可抑制電極之斷線。 又,於表示實施例1〜46、51〜130之評價結果之表丨〜4、 6〜1〇中顯示,於鋁電極之情形時獲得良好之結果。並確 認,即便將設置於玻璃基板上之鋁電極變更為銅電極,亦 可藉由使用實施例1〜46、51〜13〇之聚合物粒子及導電性粒 子而獲得良好之結果。 【圖式簡單說明】 圖1係示意性地表示使用本發明之一實施形態之導電性 粒子的連接構造體之正面剖面圖; 圖2係將圖1所示之連接構造體之導電性粒子與電極之接 觸部分放大表示之正面剖面圖;及 圖3係示意性地表示於使用先前之導電性粒子之連接構 造體中產生空隙之狀態的部分切口正面剖面圖。 【主要元件符號說明】 1 連接構造體 2 玻璃基板 2a 電極 3 異向性導電膜 139450.doc -44 - 200948881 4 印刷基板 4a 電極 5 導電性粒子 11 壓痕 Ο 139450.doc -45-Ik ir> 1«—« 1—N 卜r"H 〇\ Ν Ο cn Ν (Ν 3341 1956 inch ro cn <N 00 ◎ 〇1 inch <N U-) r-^ 00 m Ni/Pd ο ΓΊ 卜 <Ν 3254 1882 1245 <N 〇〇IT) 1—^ ◎ 〇Carbon 1 m inch F—* 1—< ^〇Ni/Pd Ο rn ON <Ν 2793 1725 1186 m CN 00 1 »^ ◎ 〇·€ 1 <N JO inch 1-^ Ni/Pd Ο CO 卜 CS 2666 1—^ 1147 ON 卜vq y—^ ◎ 〇1 1—< 00 m (N Ni/Pd ο ΓΟ 00 <N 2185 1186 Il049 inch 〇〇OO ◎ 〇1 o 1-^ *-< (N iTi y—^ 00 cn Ni/Pd ο ΓΛ l> r4 3481 1775 Il334 CN CN π gas 1—* ◎ 〇1 s 1—« Os Ni/Pd Ο cn 00 cs 4717 2746 12560 mm "sh ◎ ◎ 1 g <Ν <η oo cn Ni/Pd Ο fn 00 CN 3119 1569 11089 v〇ο Bu ◎ 〇1 o r -< in On v〇o Ni/Pd ο cn 00 oi 4050 2560 2099 P; 〇s (Ν y-^ ◎ ◎ 1 g cs oo Ni/Pd ο ΓΊ 卜 <s 2705 1548 o IT) m 00 ( Ν ◎ ◎ 1 Inch 1—^ Ni/Pd Ο cn 00 fN 2881 1676 1656 00 m 1—* ◎ ◎ Disc 1 s inch Ni/Pd ο cn 卜 CN 3067 11784 Il597 00 cn y—^ ◎ 〇m 1 g 1—^ 00 m (S Ni/Pd ο ΓΠ 00 cs 3342 1872 1686 Write ψ^» ◎ 〇41 1 s CN 1—· 00 m Ni/Pd ο m* ON oi 3315 1775 丨1294 ◎ 〇1 IH inch Ni/Pd Ο cn卜 oi 3246 1746 丨1226 卜r-; 1—< ◎ 〇ro VO inch^―< r-* Ni/Pd Ο rn 00 01 3138 1559 gm CN 〇〇, — ◎ 〇41 1 OS Os 00 m &lt ;N Ni/Pd Ο rn 00 (N 3177 1226 丨1069 00 〇〇碡1 @ /<—Ν 3 W /—s 3 3 3 3 /—s ¥ /g' Sg Μ ίΓ 屮Μ δ4 I &gt u 屮荽c^TB % ο 屮4° 1 δ Μ 屮 φ T T T φ ¥ ¥ ¥ ¥ ¥ ¥ ¥ 屮 屮 屮 屮 屮 屮 屮 屮 1 压 压 压 压 压 压 强度 强度 强度 强度 强度 » » » » » » » » » » » » » » » » » » » » » 1 S- '1 屯 屯: Ί 鮏Ί 铋 W 1 iW «3 A<jr Ττ- 琳 装 methacrylate isothermal ester Ί - -< Ί love ve three ring 癸Alkyl Ether Love*0®- You Ο Ο 苯乙烯 Styrene Ί Ί Ί h Dm ten r0 Love Avoidance V? Ί 鮏Ί 〇'Ί Η Η δ Ί 溜 爱 爱 爱 钿 韬哒 韬哒 韬哒 韬哒*1 139450.doc -42- 200948881 φ 01—Iΐ ο m ι—Η |Ni/Pdl 〇ΓΠ 〇\ CN 3406 I 1872 | 1—« 5 ΓΟ (N ◎ ◎ 1 0's (Ν 1—Η Os 卜 Ni /Pd 〇cn 卜CN 3306 2361 丨2405 | Μ <N ◎ Ο 碡1 οο (Ν t«H 1 Ni/Pd 1 〇r^i 'sO (N ο Os 〇〇VO vn CO fN ΓΛ inch 00 1 —^ ◎ < 1 »—Η Ni/Pd Ο r*i 00 CN ο ν〇ON 〇\ ΓΛ mm inch inch οο 1—^ ◎ 〈 1 Ό CN 1 Ni/Pd 1 Ο cn r- (Ν 1 2558 1 1509 1303 00 (Ν 00 in ◎ ◎ 1 (Ν 1—^ I Ni/Pd | ο cn 00 ri 2142 1096 1 1045 1 00 〇卜◎ 〇碡1 艺ί—Η (N Τ—^ 〇〇丨Ni/ Pd 1 ο ΓΛ οο (Ν 2391 U519^ 1176 〇\ oo ◎ 〇1 IK m (Ν 1—^ inch Ni/Pd ΓΛ 卜 卜 oi 2724 1872 1 1725 1 (N (N rn ◎ 〇1 CN (Ν \〇寸r-^ I Ni/Pd | rn rn Ό <N 2920 2029 12254 1 P: cn ◎ ◎ 1 (Ν ι—Η 00 m (N in I Ni/Pd | ο cn ON CN 2960 2185 1 2308 1 ON m 〇〇rn ◎ ◎ 1 宕τ—Η 1—H 卜—^ σ^ Ni/Pd ο cn 〇 s oi 2087 1136 1088 Os 〇〇O) r*H ◎ 〇1 σ\ (Ν W- GC Γ^Ί I Ni/Pd | Ο 00 00 oi 2460 1156 t—^ 〇OO ◎ 〇1 ΟΟ ^-Η inch Ni/Pd Ο rn 00 CN 2744 1744 1362 00 (N (N (N (N ◎ ◎ ◎ 1 卜*·**Η inch r-^ F··^ I Ni/Pd | ο cn 卜 CN 2813 1989 1 1862 1 ON m ΓΜ CN ◎ ◎ 1 Ό 00 m (Ν κη 1-1 Ni/Pd ο rn 00 CN 2930 2195 |2136| o P; (N ◎ ◎ Disc 1 /<-«· U "2 •w< 'w- W ^w> 3 /—su /^Ν •3 ^2 Sw> Sw - 璨1 Μ Μ /- /·-- > U 荽<〇ε % ο 荽1 δ 荽1 塄# 竣 竣 | 屮ά ±i — connection resistance value indentation formation 碡 1 drop strength test 1 潜 潜 Ί Ί Η | B B- '1 € '1 鮏Ί 绂瞧cn^ Isodecyl acrylate 祜 isoamyl methacrylate love Ί 遝Ί 毽 W W W Ο u| W love 1〇 &- fine!· You're loaded (0 Ί 丨 stupid vinyl feed « « Ί 1& Ί 铋 r r r0 褒 Ί Ο Ί 'Ί & > Ί S- Portuguese! «1 0 铨0 钵 哒 ※ ※ ※ Φ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ ★ Tricks* 139450.doc -43- 200948881 It is shown in Tables 4 and 6 to 10 which show the evaluation results of Examples 1 to 46 and 51 to 130, in the case of using a two-layer flexible printed substrate, Good results. It was confirmed that good results can be obtained by using the polymer particles and conductive particles of Examples 46 46, 51 to 13 即便 even if a three-layer flexible printed substrate is used instead of the two-layer flexible printed substrate ′. . Further, from Table 5 showing the evaluation results of Examples 47 to 50, it can be understood that the disconnection of the electrodes can be suppressed even if the impact is dropped. Further, in Tables 4 to 4 and 6 to 1 showing the evaluation results of Examples 1 to 46 and 51 to 130, good results were obtained in the case of an aluminum electrode. It was confirmed that even if the aluminum electrode provided on the glass substrate was changed to a copper electrode, good results were obtained by using the polymer particles of Examples 1 to 46 and 51 to 13 Å and the conductive particles. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a front cross-sectional view schematically showing a connection structure using conductive particles according to an embodiment of the present invention; FIG. 2 is a view showing conductive particles of the connection structure shown in FIG. A front cross-sectional view of the contact portion of the electrode is shown in an enlarged manner; and FIG. 3 is a partial cross-sectional front cross-sectional view schematically showing a state in which a void is generated in the connection structure using the previous conductive particles. [Description of main components] 1 Connection structure 2 Glass substrate 2a Electrode 3 Anisotropic conductive film 139450.doc -44 - 200948881 4 Printed substrate 4a Electrode 5 Conductive particles 11 Indentation 1394 139450.doc -45-

Claims (1)

200948881 七、申請專利範圍: 2個環結構之 一種聚合物粒子,其係藉由聚合至少具有 月曰環式化合物這一單體所得者。 2.如請求項1之聚合物粒子 環結構或三環結構。 其中上述至少2個環結構為雙 其中上述單體為丙烯酸系 3·如請求項1或2之聚合物粒子 單體。 ❹ 、項1至3中任一項之聚合物粒子,其中壓縮恢復率 為Ο/。μ下,且經壓縮10%時之壓縮彈性模數為 980〜4,9〇〇N/mm2之範圍内。 5.如叫求項4之聚合物粒子,其中壓縮恢復率為〜之 範圍内。 6. 子’其係藉由聚合具有至少2 的單官能單體與多官能單體所 如印求項1或2之聚合物粒 個環結構之脂環式化合物 得者。 參 ο〆東項6之聚合物粒子’其係藉由聚合包含20〜90重量 八有至少2個環結構之脂環式化合物的單官能單體與 • 8〇重里〇/〇之多官能單體的單體成分所得者》 月长項1或2之聚合物粒子,其係藉由聚合具有至少2 個袞、、’"*構之脂環式化合物的多官能單體所得者。 上叫求項8之聚合物粒子,其係藉由聚合包含2〇重量%以 ^具有至少2個環結構之脂環式化合物的多官能單體 的單體成分所得者。 叫求項1或2之聚合物粒子,其係藉由聚合具有至少2 139450.doc 200948881 個環結構之脂環式化合物的單官能單體與具有至少2個 環結構之脂環式化合物的多官能單體所得者。 11 12 13. 14. 15. 16. 一種導電性粒子,其且右知咬七 八百如印求項1或2之聚合物粒子與 被覆該聚合物粒子之表面之金屬層。 如請求項11之導雷性知之 子’其中壓縮恢復率為45%以 下。 如請求項11之導電性粒子,苴 具〒上述金屬層之外表面為 包含鎳之金屬層、包含# s 3鈀之金屬層或包含低熔點金屬之 金屬層。 其包含如請求項11之導電性粒子 一種異向性導電材料 與黏合劑樹脂。 、第2連接對 之如請求項 一種連接構㈣,其包含帛1連接對象構件 象構件、以及將第i與第2連接對象構件連接 11之導電性粒子。 一種連接構造體 象構件以及將第 上述連接部係 成。 ,其包含第1連接對象構件、第2連接對 1與第2連接對象構件連接之連接部, 由如請求項14之異向性導電材料所形 139450.doc200948881 VII. Patent application scope: A polymer particle of two ring structures obtained by polymerizing a monomer having at least a cyclic ruthenium compound. 2. The polymer particle ring structure or tricyclic structure of claim 1. Wherein at least two of the above ring structures are double, wherein the above monomer is an acrylic acid. 3. The polymer particle monomer of claim 1 or 2. The polymer particles according to any one of items 1 to 3, wherein the compression recovery ratio is Ο/. The compressive elastic modulus at μ and compressed by 10% is in the range of 980 to 4, 9 〇〇 N/mm 2 . 5. The polymer particle of claim 4, wherein the compression recovery ratio is in the range of ~. 6. The sub-" is obtained by polymerizing an alicyclic compound having a polymer particle ring structure of at least 2, such as a monofunctional monomer and a polyfunctional monomer. The polymer particles of the group 6 are polymerized by polymerizing a monofunctional monomer comprising 20 to 90 parts by weight of an alicyclic compound having at least 2 ring structures and a polyfunctional monomer of 8 〇 〇 〇 / 〇 The monomer component of the body is a polymer particle of the term 1 or 2, which is obtained by polymerizing a polyfunctional monomer having at least two alicyclic compounds of the oxime, '"* structure. The polymer particles of the above item 8 are obtained by polymerizing a monomer component comprising 2% by weight of a polyfunctional monomer having an alicyclic compound having at least two ring structures. Polymer particles of claim 1 or 2 which are obtained by polymerizing a monofunctional monomer having an alicyclic compound having at least 2 139450.doc 200948881 ring structures and an alicyclic compound having at least 2 ring structures. The result of the functional monomer. 11 12 13. 14. 15. 16. An electroconductive particle which has a right to bite seven or eight hundred polymer particles of the item 1 or 2 and a metal layer covering the surface of the polymer particle. For example, in the case of claim 11, the compression recovery rate is 45% or less. The electroconductive particle of claim 11, wherein the outer surface of the metal layer is a metal layer containing nickel, a metal layer containing #s3 palladium or a metal layer containing a low melting point metal. It comprises the electrically conductive particles of claim 11 an anisotropic conductive material and a binder resin. The second connection pair is as claimed. A connection structure (four) includes a 帛1 connection target member and an electroconductive particle that connects the i-th and second connection target members. A connecting structure body member and a coupling portion. The connection portion including the first connection target member and the second connection pair 1 and the second connection target member is formed by the anisotropic conductive material as claimed in claim 14 139450.doc
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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1149628A1 (en) * 2000-04-28 2001-10-31 Akzo Nobel N.V. Chemical product and method
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