TW200938843A - Improved testing jig for integrated circuits - Google Patents

Improved testing jig for integrated circuits Download PDF

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Publication number
TW200938843A
TW200938843A TW97108166A TW97108166A TW200938843A TW 200938843 A TW200938843 A TW 200938843A TW 97108166 A TW97108166 A TW 97108166A TW 97108166 A TW97108166 A TW 97108166A TW 200938843 A TW200938843 A TW 200938843A
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Taiwan
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grounding
hole
signal
probe
power supply
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TW97108166A
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Chinese (zh)
Inventor
yu-dong Hu
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yu-dong Hu
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Priority to TW97108166A priority Critical patent/TW200938843A/en
Publication of TW200938843A publication Critical patent/TW200938843A/en

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Abstract

Disclosed is an improved testing jig for integrated circuits, comprising: a body which assembled by stacking at least tow pads and two conductive bodies sandwiching the two pads therebetween. The body is provided at a location corresponding to the to-be-tested integrated circuits with plural through holes, each mounted with power probes, signal probes and grounding probes therein. The through holes mounted with the signal probes and grounding probes are each electroplated with a metal conductive layer. As such, one side of the body can be connected to a testing circuit board, so that one ends of the probes are connected to the testing circuits. The to-be-tested object is then mounted to another side of the body so that the to-be-tested object is connected to another ends of the probes, so as to be electrically connected to the testing circuits, to allow testing of RF digital signals.

Description

200938843 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種改良型積體電路之改良型檢測治 具,尤指一種可用於檢測積體電路之射頻(RF)數位訊號 之檢測治具者。 无則技術 ❹ 按,一般傳統之積體電路的檢測治具,例如:中華民 國發明專利公告第20061 21 02號專利’其揭露有:導電構 件,具有適合安裝於設有檢驗電路之電路板上之第一表面 ’以及適合與欲檢驗之裝置相對_ 係㈣古㈣之第-表面’該導電構件 糸形成有具有第一直徑之第一 該篦一矣貝牙札該第—貫穿孔係將 ° 〇該第二表面連通;接觸式探針,包含.且右 第二直徑之管狀本體,該第二直徑係比第 〜、 具係了縮回地由該管狀本體之一端凸出;第一权拔 办戚有第—貫穿孔,且至少與該導電 相對,將該第一千之第一表面 第貫穿孔與第二貫穿孔連通,使# 探針保持於該導# m q ± 使侍該接觸式 一端凸出;以及,哲- 從該第二貫穿孔之 端與該第一貫 叶得该管狀本體之一 nnx 牙孔同心;俾可用於檢測積體雷% RF)數位信號 體電路之射頻( <檢蜊’並執行高可靠度之檢 雜訊影響。 微測而不會受到 惟,該習知# .日丨二 ^ 積體電路檢測治具雖可執行古7主 測而不會受到雜 矾仃阿可靠度之檢 訊影響,但是其係由第一保持件、第二保 5 200938843 持件及導電構件構成主 針不易安_ ,導致主體結構複雜、接觸式探 密佈件對於諸多細長 ,非常不便利。極為不易’其整體製作不易而成本高 【發明内容】 發明人有鐘於前述先前技術中習知積體電路 ㈣缺點,而提供本發明積體電路之改良型檢測治具= © 期能摒除先前技術所產生的缺失。 、本發明之一目的,係提供一種積體電路之改良型檢測 治具,以用於檢測積體電路之射頻(RF)數位訊號,而且 構造簡單、製作容易、成本低廉。 根據上述之目的,本發明之改良型檢測治具,其係設 有一本體,該本體包含有呈上下堆疊結合之至少二墊塊與 二導電體,該二導電體分別位於該等墊塊的上、下方,並 將該等墊塊夾固於其間;該本體在對應待測積體電路的位 〇 置上,設有多數個貫穿孔,該等貫穿孔分別安裝有電源探 針、訊號探針及接地探針;其中,安裝訊號探針與接地探 針的貫穿孔各鍍設有金屬導電層。使用時,可將本體的一 面與一檢測機具的檢測電路板相接,使電源探針、訊號探 針及接地探針的一端與檢測電路板相對應的檢測電路電 氣連接,再將待檢測物安裝於本體的另一面,使待檢測物 的電源插腳、訊號插腳及接地插腳分別與電源探針、訊號 探針及接地探針的另一端電氣連接。如此,待檢測物即能 200938843 藉由本發明之檢測治具與檢測電路電氣連接,而進行射頻 (RF)數位訊號的電氣檢測作業’並達成檢測治具構造簡 單、製作容易且成本低廉之目的。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效,在 以下配合參考圖式之四個較佳實施例詳細說明當中,將可 清楚的呈現。 第1圖至第4圖分別繪示本發明改良型治具第一較佳 實施例之立體圖、分解圖、分解放大圖及剖面示意圖。如 該等圖式所示,本發明之改良型檢測治具,其設有一本體 1’該本體1包含有呈上下堆疊結合之三墊塊la與二導電體 lb,該二導電體lb分別位於該等墊塊la的上、下方,並以 例如第一螺絲1 6將該等墊塊夾固於其間。 本體1在對應待檢測物之積體電路(未圖示)的位置上 ,*又有多數個電源貫穿孔11、多數個訊號貫穿孔丨2及多數 個接地貫穿孔1 3 ;該等貫穿孔丨丨、丨2、丨3分別安裝有電源 探針2、訊號探針3及接地探針4,且各貫穿孔的内徑分別 大於各探針的外徑。 二墊塊la之訊號貫穿孔12的内壁鍍設有一第二金屬 導電層17,使得訊號貫穿孔12形成天然的電磁波遮蔽體, 避免對訊號探針2訊號傳遞上的干擾。三墊塊13之接地貫 穿孔13的内壁則鍍設有一第三金屬導電層18,以與接地探 針4相互電氣連接,形成可導電的接地迴路。 200938843 本體1包含多數塾塊la及二導電體lb,再於墊塊的必 要位置鍍上金屬導電層,其非為一體的金屬材質。此種結 構,除了可降低材質成本之外,尤其,其塾塊13可選自例 如塑穆的絕緣材料,此錄奸^^ ^ 矸Α種材質在實施諸多貫穿孔n、12 、13的设置上較為簡易。因此,本發明之本體卜在施作 上,具有材料成本低及對於貫穿孔易於製作的優點。 又由於上述諸貫穿孔係呈矩陣密佈,且具有一定的長 Ο 度該諸多密佈的貫穿孔由其上端至下端仍要維持精準的 軸向位置係極其不胃。而本發明將本體α成上多數墊塊 la與上、下二導電體113再予組合,此種結構,可將各貫穿 孔的長度先予減短再予接長成所要求的長度;其分別對於 較短長度之貫穿孔的設置’可以獲得較為精準的效果。因 此依據本發明此種結構,對於諸貫穿孔丨丨、12、13可以獲 得較為精準的軸向位置。 電源探針2的上、下端分別設有可彈性向外凸出或向 内縮入之一電源上針頭21與一電源下針頭22;在實施上, 該電源上、針頭之間套設有一第一導電彈簧23,使得該電 源上、下針頭21、22的外端部可彈性凸出或縮入於電源貫 穿孔11。電源上、下針頭21、22上各套設有一第一絕緣固 定座24,該等第一絕緣固定座24並分別固設於二導電體lb 的電源貫穿孔11,使電源探針2與本體1相互電氣絕緣,而 在電源貫穿孔11内的電源探針2則以空氣與本體i保持絕 緣。 訊號探針3設有一金屬管35’在該金屬管35之管内的 200938843 上、下端分別設有可彈性向外凸出或向内縮入之一訊號上 針頭31與一訊號下針頭32;在實施上,該訊號上、下針頭 之間套設有一第二導電彈簧33,使得該訊號上、下針頭31 、32的外端部可彈性凸出或縮入於訊號貫穿孔12。訊號上 、下針頭31、32各套設有一第二絕緣固定座34,該等第二 絕緣固定座34並分別固設於二導電體lb的訊號貫穿孔12 ’使訊號探針3與本體1相互電氣絕緣,而在訊號貫穿孔12 内的訊號探針3則以空氣與本體1保持絕緣。 接地探針4的上、下端分別設有可彈性向外凸出或向 内縮入之一接地上針頭41與一接地下針頭42;在實施上, 該接地上、下接頭之間套設有一第三導電彈簧43,使得該 接地上、下針頭41、42的外端部可彈性凸出或縮入於接地 貫穿孔13,並與本體}相互電氣連接’形成可導電的接地 迴路。接地上、下針頭41、42與本體1的電氣連接,其可 行之實施方式之一係,於接地上、下針頭41、42各套設有 ❹ 導電固定座44,該等導電固定座44並分別固設於二導電 體的接地貫穿孔13,使得接地探針4與本體丨相互電氣連接 〇 π參閱第3圖及第4圖所示,電源上、下針頭21、22 各設有一外徑較大的第一擋止體26 ;訊號上、下針頭” 、32亦各設有一外徑較大的第二擋止體36,同樣地,接地 上下針頭41、42亦各設有一外徑較大的第三擋止體46 ,該等擋止體26、36、46可分別受第一導電彈簧23、第二 導電彈簧33及第三導電彈普43的端部所抵靠,並分別抵播 9 200938843 於第一絕緣固定座2 4、筮-站& ™ 一 座第—絕緣固定座34及導電固定座44 因此上述各針頭的外端部乃可藉由各導電彈簧的彈力, 彈凸出於各貝穿孔外,並分別受第一絕緣固定座Μ、第 二絕緣固定座34及導電固定座44所播止;或被㈣而彈性 縮入於各貫穿孔内。 2參閱第8圖至第1〇圖所示,本體】之墊塊^及導電體 lb各叹有至少二個定位孔14與至少二螺絲穿孔1 5,當本體 1與檢測機具(未圖示)的檢測電路板5相接時,可利用定位 梢5!固定於定位孔14並導入於檢測電路板5所設的安裝孔 使本體1疋位於檢測電路板5的檢測電路5 3上,嗣再利 用第-螺絲52穿入本體!的螺絲穿孔j 5,並螺合於檢測 電路板5所設的螺絲孔55上,使本體被鎖固於檢測電路板5 上。 藉上述構件的組成,當進行檢測一待檢測的積體電路 (圖中未示,以下稱待檢測物)時,可將本體丨的一面( ❹底面)與檢測電路板5相接,使電源探針2、訊號探針3及接 針4的端與檢測電路板5相對應的檢測電路5 3電氣 連接;再將待檢測物安裝於本體!的另一面,使待檢測物 的電源插腳、訊號插腳及接地插腳分別與電源探針2、訊 號探針3及接地探針4另一端電氣連接;如此,待檢測物即 施藉由本發明之改良型檢測治具與檢測電路電氣連接,而 進行射頻(RF)數位訊號的電氣檢測作業。 請參閱第5圖所示,其繪示本發明改良型檢測治具第 —實施例的部份剖面示意圖。該第二實施例具有與上述第 10 200938843 一實施例相似的結構’不同者在於,在該第二實施例當中 ,其訊號探針3之金屬管35的兩端各形成有一包口 該 包口包覆於第二擋止體36的外端部,以撞住該擋止體π 。依此構造’可使整體體訊號探針3自成一單體,而更便 於裝配。 請參閱第6圖所示,其繪示本發明改良型檢測治具第 三實施例的部份剖面示意圖,其顯示接地上、下針頭41 、42與本體1電氣連接的另一實施例,其係將二導電體ib ® 之接地貫穿孔1 3設成口徑較小的接地探針孔口 13β,而接 地上、下針頭41 ' 42的外端部位於該接地探針孔口丨3a, 並與其電氣連接。 請參閱第7圖所示,其繪示本發明改良型檢測治具第 四實施例的部份剖面示意圖。該第四實施例係以第三實施 例為基礎,再如同第二實施例一樣,於訊號探針3之金屬 管35的兩端各形成有一包口 37,其包覆於第二擋止體36 的外端部,以擋住該第二擋止體36,而使訊號探針3自成 一單體。 本發明雖已藉由上述較佳實施例加以詳細說明,惟以 上所述者’僅為本發明之較佳實施例而已,當不能以此限 &本發明實施之範圍,即大凡依本發明中請專利範圍及發 明說明内容所作簡單的等效變化與修飾,皆仍屬本發明專 利涵蓋之範圍内。 200938843 【圖式簡單說明】 第1圖係檢· - 、不本發明改良型檢測治具的立體外觀圖並 顯示部份剖面示意圖。 第2圖你冷-丄% 、臀不本發明改良型檢測治具第一實施例的部 份分解圖。 第3圖你給 — & 、、’不第2圖所示分解圖的部份放大圖。 第4圖係綸-丄# 臀不本發明改良型檢測治具第一實施例的部 份剖面示意圖。 ® 第5圖係給 、'常不本發明改良型檢測治具第二實施例的部 份剖面示意圖。 第6圖係餘 、臀不本發明改良型檢測治具第三實施例的部 份剖面示意圖。 第7圖倍給 、臀不本發明改良型檢測治具第四實施例的部 份剖面示意圖。 第8圖你給^ — '、聲不本發明改良型檢測治具與檢測電路板的 組裝示意圖。 〇 第9圖係给-丄# 、臀不本發明改良型檢測治具與檢測電路板之 沿疋位梢t 向的組裝剖面示意圖。 第1 0圖孫^ . VL '、臀不本發明改良型檢測治具與檢測電路板 t/σ第一螺絲方向的組裝剖面示意圖。 【主要元件符號說明】 1.本體 la.墊塊 12 200938843 lb.導電體 11.電源貫穿孔 1 2.訊號貫穿孔 13. 接地貫穿孔 13a.接地探針孔口 14. 定位孔 1 5.螺絲穿孔 1 6.第一螺絲 © 17.第二金屬導電層 18.第三金屬導電層 2.電源探針 21. 電源上針頭 22. 電源下針頭 23. 第一導電彈簧 24. 第一絕緣固定座 26.第一擋止體 ® 3.訊號探針 31. 訊號上接頭 32. 訊號下接頭 33. 第二導電彈簧 34. 第二絕緣固定座 35. 金屬管 36. 第二檔止體 37. 包口 13 200938843 4. 接地探針 41.接地上針頭 42. 接地下針頭 43. 第三導電彈簧 44. 導電固定座 46.第三擋止體 5. 檢測電路板 51.定位梢 ❹ 52.第二螺絲 5 3.檢測電路 54.安裝孔 5 5.螺絲孔 14200938843 IX. Description of the Invention: [Technical Field] The present invention relates to an improved inspection tool for an improved integrated circuit, and more particularly to a detection tool for detecting a radio frequency (RF) digital signal of an integrated circuit. By. There is no technology ❹, generally the traditional integrated circuit detection fixture, for example: the Republic of China invention patent publication No. 20061 21 02 'the disclosure of which: conductive members, suitable for installation on a circuit board with a test circuit The first surface 'and is adapted to be opposite to the device to be inspected _ (4) the first surface of the ancient (four) - the conductive member is formed with the first diameter of the first one, the first The second surface is in contact with the second surface; the contact probe comprises: a tubular body of a right second diameter, the second diameter being protruded from one end of the tubular body than the first and the second; The first through-hole is connected to the second through-hole and the # probe is held at the guide #mq± One end of the contact type protrudes; and, the end of the second through hole is concentric with the nnx hole of the first body of the tubular body; the 俾 can be used to detect the integrated body RF% digital signal body circuit RF ( < check 'and execute high The influence of the noise detection. Micro-testing will not be affected, the Xizhi #. 日丨二^ Integrated circuit detection fixture can perform the ancient 7 main test without the miscellaneous test of reliability Influence, but it is difficult to install the main needle by the first holding member, the second holding 5 200938843 holding member and the conductive member, resulting in a complicated main body structure, and the contact type inspecting cloth is very inconvenient for many slenders. The overall fabrication is not easy and the cost is high. [Inventors] The inventors have the disadvantages of the conventional integrated circuit (4) in the prior art, and the improved inspection tool for providing the integrated circuit of the present invention = © can eliminate the prior art An object of the present invention is to provide an improved detection tool for an integrated circuit for detecting a radio frequency (RF) digital signal of an integrated circuit, which is simple in structure, easy to manufacture, and low in cost. The object of the present invention is to provide a modified test fixture comprising a body, the body comprising at least two pads and two conductors stacked on top of each other, the two conductors being respectively located The upper and lower parts of the pad are clamped between the blocks; the body is provided with a plurality of through holes on the position of the corresponding integrated circuit to be tested, and the through holes are respectively installed with power supply The pin, the signal probe and the grounding probe; wherein the through hole of the mounting signal probe and the grounding probe are respectively plated with a metal conductive layer. When used, one side of the body can be connected to the detecting circuit board of the detecting device. One end of the power probe, the signal probe and the grounding probe are electrically connected to the detecting circuit corresponding to the detecting circuit board, and then the object to be detected is mounted on the other side of the body, so that the power pin, the signal pin and the ground of the object to be detected are grounded. The pins are electrically connected to the other ends of the power probe, the signal probe and the ground probe respectively. Thus, the object to be detected can be electrically connected to the detection circuit by the detection fixture of the present invention, and the radio frequency (RF) digital signal is The electrical inspection operation 'achieves the purpose of the detection fixture is simple in construction, easy to manufacture and low in cost. The above and other technical contents, features and effects of the present invention will be apparent from the following detailed description of the preferred embodiments of the present invention. 1 to 4 are respectively a perspective view, an exploded view, an exploded enlarged view and a cross-sectional view of a first preferred embodiment of the improved jig of the present invention. As shown in the drawings, the improved inspection jig of the present invention is provided with a body 1'. The body 1 comprises three pads 1a and 2bs lb stacked on top of each other. The two conductors lb are respectively located. The spacers la are up and down, and the spacers are sandwiched therebetween by, for example, a first screw 16. The body 1 has a plurality of power supply through holes 11, a plurality of signal through holes 丨2 and a plurality of ground through holes 13 in a position corresponding to an integrated circuit (not shown) of the object to be detected; the through holes The power probe 2, the signal probe 3, and the ground probe 4 are respectively mounted on the 丨丨, 丨2, and 丨3, and the inner diameters of the through holes are respectively larger than the outer diameters of the respective probes. A second metal conductive layer 17 is plated on the inner wall of the signal through hole 12 of the two pads, so that the signal through hole 12 forms a natural electromagnetic wave shielding body to avoid interference on the signal transmission of the signal probe 2. The inner wall of the three-pad 13 is plated with a third metal conductive layer 18 for electrical connection with the ground probe 4 to form an electrically conductive ground loop. 200938843 The body 1 comprises a plurality of slabs la and two conductors lb, and is further plated with a metal conductive layer at a necessary position of the spacer, which is not an integral metal material. Such a structure, in addition to reducing the material cost, in particular, the block 13 can be selected from, for example, an insulating material of plastic mold, and the material of the cast material is implemented in a plurality of through holes n, 12, and 13 It is relatively simple. Therefore, the body of the present invention has the advantages of low material cost and ease of fabrication for the through holes. Moreover, since the through-holes are densely arranged in a matrix and have a certain degree of longitude, the plurality of dense through-holes are maintained in a precise axial position from the upper end to the lower end. In the present invention, the body a is formed into a plurality of pads 1a and the upper and lower conductors 113 are combined. In this structure, the length of each through hole can be shortened and then lengthened to a desired length; For the setting of the through-holes of shorter lengths respectively, a more accurate effect can be obtained. Therefore, according to the structure of the present invention, a more precise axial position can be obtained for the through holes 12, 12, 13. The upper and lower ends of the power probe 2 are respectively provided with a needle 21 and a power supply needle 22 which are elastically outwardly protruded or inwardly retracted; in practice, the power supply and the needle are sleeved between the needles A conductive spring 23 allows the outer ends of the upper and lower needles 21, 22 of the power supply to be elastically projected or retracted into the power supply through hole 11. Each of the upper and lower needles 21 and 22 of the power supply is provided with a first insulating holder 24, and the first insulating holders 24 are respectively fixed to the power supply through holes 11 of the two conductors lb, so that the power supply probe 2 and the body 1 is electrically insulated from each other, and the power supply probe 2 in the power supply through-hole 11 is insulated from the body i by air. The signal probe 3 is provided with a metal tube 35'. The upper and lower ends of the 200938843 in the tube of the metal tube 35 are respectively provided with an elastically outwardly projecting or inwardly retracting a signal upper needle 31 and a signal lower needle 32; In practice, a second conductive spring 33 is disposed between the upper and lower needles of the signal, so that the outer ends of the upper and lower needles 31 and 32 of the signal can be elastically protruded or retracted into the signal through hole 12. Each of the upper and lower needles 31 and 32 is provided with a second insulating holder 34, and the second insulating holders 34 are respectively fixed to the signal through holes 12' of the two conductors lb to make the signal probe 3 and the body 1 They are electrically insulated from each other, and the signal probe 3 in the signal through-hole 12 is insulated from the body 1 by air. The upper and lower ends of the grounding probe 4 are respectively provided with an elastically outwardly protruding or inwardly retracting one of the grounding needle 41 and a grounding lower needle 42; in practice, the grounding upper and lower joints are sleeved between each other. The third conductive spring 43 is such that the outer end portions of the grounding upper and lower needles 41, 42 can be elastically protruded or retracted into the ground through-hole 13 and electrically connected to the body to form an electrically conductive ground loop. One of the possible embodiments of the grounding of the upper and lower needles 41, 42 and the body 1 is that the grounding and lower needles 41, 42 are respectively provided with a conductive seat 44, and the conductive fixing seats 44 are The grounding probes 4 are respectively fixed to the grounding through holes 13 of the two conductors, so that the grounding probes 4 and the body 丨 are electrically connected to each other. Referring to FIGS. 3 and 4, the upper and lower needles 21 and 22 of the power supply are each provided with an outer diameter. The first upper stopper body 26; the upper and lower needles 32 and 32 are also respectively provided with a second stopper body 36 having a larger outer diameter. Similarly, the grounding upper and lower needles 41 and 42 are also respectively provided with an outer diameter. a large third stopper body 46, wherein the stoppers 26, 36, 46 are respectively abutted by the ends of the first conductive spring 23, the second conductive spring 33, and the third conductive spring 43 respectively Broadcast 9 200938843 in the first insulating holder 2 4, 筮-站 & TM a first insulating holder 34 and a conductive fixing seat 44. Therefore, the outer ends of the above-mentioned needles can be elastically bent by the elastic force of the respective conductive springs. The first insulating fixing seat, the second insulating fixing seat 34 and the conductive fixing seat are respectively received by the perforation of each shell. 44 is broadcasted; or (4) elastically retracted into each through hole. 2 Referring to Figures 8 to 1 , the body block and the conductor lb each have at least two positioning holes 14 And at least two screw holes 15 , when the body 1 is connected to the detecting circuit board 5 of the detecting device (not shown), can be fixed to the positioning hole 14 by the positioning tip 5! and is introduced into the mounting of the detecting circuit board 5 The hole is disposed on the detecting circuit 53 of the detecting circuit board 5, and then penetrates the screw hole j 5 of the main body by the first screw 52, and is screwed onto the screw hole 55 of the detecting circuit board 5, The body is locked on the detecting circuit board 5. By the composition of the above components, when detecting an integrated circuit to be detected (not shown in the figure, hereinafter referred to as a detecting object), one side of the body can be turned (( The bottom surface is connected to the detecting circuit board 5, and the power probe 2, the signal probe 3 and the end of the pin 4 are electrically connected to the detecting circuit 53 corresponding to the detecting circuit board 5; and the object to be detected is mounted on the body! On the other side, the power pin, signal pin and ground pin of the object to be tested are respectively connected to the power supply. 2. The other end of the signal probe 3 and the grounding probe 4 are electrically connected; thus, the object to be detected is electrically connected to the detecting circuit by the improved detecting jig of the present invention, and the electrical detecting operation of the radio frequency (RF) digital signal is performed. Please refer to FIG. 5, which is a partial cross-sectional view showing the first embodiment of the improved test fixture of the present invention. The second embodiment has a structure similar to that of the above-mentioned 10th 200938843 embodiment. In the second embodiment, the two ends of the metal tube 35 of the signal probe 3 are formed with a bag opening, and the bag is wrapped around the outer end of the second blocking body 36 to hit the blocking body. π. According to this configuration, the whole body signal probe 3 can be made into a single unit, which is easier to assemble. Referring to FIG. 6, a partial cross-sectional view of a third embodiment of the improved test fixture of the present invention is shown, showing another embodiment in which the grounding upper and lower needles 41, 42 are electrically connected to the body 1, The grounding through hole 13 of the two conductors ib ® is set as a grounding probe hole 13β having a small diameter, and the outer ends of the grounding upper and lower needles 41' 42 are located at the grounding probe opening 丨3a, and Electrically connected to it. Referring to Figure 7, there is shown a partial cross-sectional view of a fourth embodiment of the improved test fixture of the present invention. The fourth embodiment is based on the third embodiment, and as in the second embodiment, a plurality of mouths 37 are formed at the two ends of the metal tube 35 of the signal probe 3, which are wrapped around the second blocking body. The outer end of 36 blocks the second stop 36 to make the signal probe 3 self-contained. The present invention has been described in detail by the preferred embodiments of the present invention, but the foregoing description is only a preferred embodiment of the present invention, and the scope of the invention is not limited thereto. The simple equivalent changes and modifications made in the patent scope and the description of the invention are still within the scope of the invention. 200938843 [Simple description of the drawing] Fig. 1 is a schematic view showing a three-dimensional appearance of the improved inspection jig of the present invention and showing a partial cross-sectional view. Fig. 2 is a partial exploded view of the first embodiment of the improved test fixture of the present invention. In Figure 3, you give - & , , ' not a partial enlarged view of the exploded view shown in Figure 2. Fig. 4 is a cross-sectional view showing a portion of the first embodiment of the modified test fixture of the present invention. ® Figure 5 is a schematic cross-sectional view of a portion of the second embodiment of the improved test fixture of the present invention. Fig. 6 is a schematic cross-sectional view showing a portion of the third embodiment of the modified test fixture of the present invention. Fig. 7 is a cross-sectional view showing a portion of the fourth embodiment of the improved test fixture of the present invention. Figure 8 shows the assembly diagram of the improved test fixture and the test board of the invention. 〇 Fig. 9 is a schematic cross-sectional view of the assembly of the improved test fixture and the detection circuit board along the tip of the clamp in the present invention. Figure 1 0 Figure Sun ^ . VL ', hip not according to the invention, the improved test fixture and the detection circuit board t / σ first screw direction assembly profile. [Main component symbol description] 1. Main body la. spacer 12 200938843 lb. Conductor 11. Power supply through hole 1 2. Signal through hole 13. Ground through hole 13a. Ground probe hole 14. Positioning hole 1 5. Screw Perforation 1 6. First screw © 17. Second metal conductive layer 18. Third metal conductive layer 2. Power supply probe 21. Power supply needle 22. Power supply needle 23. First conductive spring 24. First insulation holder 26. First stop body 3. 3. Signal probe 31. Signal upper connector 32. Signal lower connector 33. Second conductive spring 34. Second insulating holder 35. Metal tube 36. Second stop 37. Port 13 200938843 4. Grounding probe 41. Grounding needle 42. Grounding down needle 43. Third conductive spring 44. Conductive fixing seat 46. Third blocking body 5. Detection circuit board 51. Positioning tip 52. Second Screw 5 3. Detection circuit 54. Mounting hole 5 5. Screw hole 14

Claims (1)

200938843 十、申請專利範圍: 檟趑電路之改良型檢測治具,裝設於一檢測 機具之檢測電路板與一韓;油丨*搞挪 ^待檢測之積體電路之間,該檢測治 具包括: -本體’該本體包含有呈上下堆疊結合之至少二墊塊 與二導電體,該二導電體分別位於該等墊塊的上、下方, 並將該等塾塊夾固於宜p弓+也丨士 穴U於其間,該本體在對應該待檢測之積體 電路的位置上,設有多數個雷调嘗空夕备L t 7双1U冤/康頁穿孔、多數個訊號貫穿 ⑬ 孔及多數個接地貫穿孔;· 只才Τϋ,邊导墊塊之訊唬貫穿孔的内壁鍍 設有-第二金屬導電層,該等塾塊之接地貫穿孔的内壁鑛 設有一第三金屬導電層; 多數個電源探針,安裝於該電源貫穿孔,該電源貫穿 孔的内徑大於該電源探針的外徑;該電源探針的上、下端 分別設有一電源上針頭與一電源下針頭,其彼此間套設有 一第一導電彈簧,該電源上、下針頭的外端部彈性向外凸 出或向内縮入於該電源貫穿孔;該電源上、下針頭各套設 有一第一絕緣固定座,其並分別固設於該二導電體的電源 貫穿孔,該電源探針乃與該本體相互電氣絕緣; 多數個訊號探針,安裝於該訊號貫穿孔,該訊號貫穿 孔的内徑大於該訊號探針的外徑;該訊號探針設有一金屬 管,且於該金屬管之管内的上、下端分別設有—訊號上針 頭與一訊號下針頭,其彼此間套設有一第二導電彈簧,該 訊號上、下針頭的外端部彈性向外凸出或向内縮入於該訊 號貫穿孔;該訊號上、下針頭各套設有一第二絕緣固定座 15 200938843 ’其並分別固設於該二導電體的訊號貫穿孔,該訊號探針 • 乃與該本體相互電氣絕緣;以及 多數個接地探針,安裝於該接地貫穿孔,該接地貫穿 孔的内徑大於該接地探針的外徑;該接地探針的上、下端 分別設有一接地上針頭與一接地下針頭,其彼此間套設有 一第三導電彈簧’該接地上、下針頭的外端部彈性向外凸 出或向内縮入於該接地貫穿孔;該接地上、下針頭與該本 體相互電氣連接,形成可導電之接地迴路。 ❹ 2、 如申請專利範圍第丨項所述積體電路之改良型 檢測治具,其中該接地上、下針頭各套設有一導電固定座 ,其並分別固設於該二導電體的接地貫穿孔。 3、 如中請專利範圍帛1肖所述積體電路之改良型 檢測…具,其中該二導電體之接地貫穿孔為口徑較小的接 地探針孔口,該接地上、下針頭的外端部位於該接地 w 孔口。 、、如中ff專利範圍f 1帛所述積體電路之改良型 檢測治具,其中該電诉 Μ 、下針頭各設有一外徑較大的第 一播止―體,其抵撞於續笛 田、这第一絕緣固定座與該第一 的端部之間。 守电评黃 5如申凊專利範圍帛1帛所述積體電路之改良型 16 200938843 檢測/σ具,其中該訊號上、下針頭各設有一外徑較大的第 一擋止體,其抵擋於該第二絕緣固定座與該第二導電彈簧 的端部之間。 6、如申請專利範圍第2項所述積體電路之改良型 檢測治具,其中該接地上、下針頭各設有一外徑較大的第 二擋止體,其抵擋於該導電固定座與該第三導電彈簧的端 部之間。 ❺ 7、 如申請專利範圍第3項所述積禮電路之改良型 檢測治具,其中該接地上、下針頭各設有一外徑較大的第 二擋止體’其抵擋於該接地探針孔口與該第三導電彈簧的 端部之間。 8、 如申請專利範圍第5項所述積體電路之改良型 檢測治具,其中該金屬管的兩端各形成一包口’該包口包 ® 覆於該第二擋止體的外端部。 9、 如申請專利範圍第1項所述改良型積體電路之 檢測治具’其中該本體之墊塊及導電體各設有至少二固定 孔與至少二螺絲穿孔^ 17200938843 X. Patent application scope: The improved inspection tool of the circuit is installed on the detection circuit board of a testing machine and a Han; the oil 丨* engages in the detection of the integrated circuit to be detected, the test fixture The method includes: - a body comprising: at least two pads and two conductors stacked on top of each other, the two conductors are respectively located above and below the blocks, and the blocks are clamped to the p-bow + also the gentleman's hole U in the middle, the body in the position corresponding to the integrated circuit to be detected, there are a lot of thunder to taste the empty evening L t 7 double 1U 冤 / Kang page perforation, most of the signal through 13 a hole and a plurality of grounding through holes; · only the inner wall of the signal through hole of the side guide block is plated with a second metal conductive layer, and a third metal is disposed on the inner wall of the grounding through hole of the block a plurality of power supply probes are mounted on the power supply through hole, the inner diameter of the power supply through hole is larger than the outer diameter of the power supply probe; the upper and lower ends of the power supply probe are respectively provided with a power supply needle and a power supply a needle, which is sleeved with each other a conductive spring, the outer end portion of the upper and lower needles of the power supply elastically protrudes outwardly or inwardly into the power supply through hole; the upper and lower needles of the power supply are respectively provided with a first insulating fixing seat, which are respectively fixed The power probe is electrically insulated from the body of the two power conductors; the plurality of signal probes are mounted on the signal through hole, and the inner diameter of the signal through hole is larger than the outer diameter of the signal probe The signal probe is provided with a metal tube, and the upper and lower ends of the tube of the metal tube are respectively provided with a signal upper needle and a signal lower needle, and a second conductive spring is sleeved between the two, the signal is up and down. The outer end of the needle is elastically protruded outwardly or inwardly into the signal through hole; the upper and lower needles of the signal are respectively provided with a second insulating holder 15 200938843 'which is respectively fixed to the two conductors a signal through hole, the signal probe is electrically insulated from the body; and a plurality of grounding probes are mounted on the ground through hole, the inner diameter of the ground through hole being larger than the outer diameter of the ground probe; The upper and lower ends of the probe are respectively provided with a grounding needle and a grounding lower needle, which are sleeved with a third conductive spring. The outer ends of the grounding upper and lower needles are elastically outwardly convex or inwardly retracted. The grounding through hole; the grounding upper and lower needles are electrically connected to the body to form an electrically conductive ground loop. ❹ 2. The improved test fixture of the integrated circuit according to the scope of the patent application, wherein each of the grounding upper and lower needles is provided with a conductive fixing seat, which is respectively fixed to the grounding of the two electric conductors. hole. 3. The improved detection type of the integrated circuit according to the patent scope 帛1, wherein the grounding through hole of the two conductors is a grounding probe aperture having a small diameter, and the grounding of the upper and lower needles The end is located at the ground w port. And the improved detection tool of the integrated circuit of the ff patent range f 1帛, wherein the electric sputum and the lower needle are respectively provided with a first broadcast body having a larger outer diameter, which is contiguous The flute, between the first insulating mount and the first end.守电评黄5, as in the patent scope of the application, 改良1帛, the improved type 16 200938843 detection / sigma, wherein the upper and lower needles of the signal are each provided with a first outer stop having a larger outer diameter, Resisting between the second insulating holder and the end of the second conductive spring. 6. The improved test fixture of the integrated circuit of claim 2, wherein the grounding upper and lower needles are each provided with a second outer stop having a larger outer diameter, which is resisted by the conductive fixed seat and Between the ends of the third conductive spring. ❺ 7. The improved inspection jig of the gift circuit according to claim 3, wherein the grounding upper and lower needles are respectively provided with a second outer stop having a larger outer diameter, which is resisted by the grounding probe. The aperture is between the end of the third conductive spring. 8. The improved inspection fixture of the integrated circuit of claim 5, wherein the metal tube has a mouth formed at each end of the metal tube. The package is covered on the outer end of the second stopper. unit. 9. The test fixture of the improved integrated circuit according to claim 1 wherein the spacer and the conductor of the body are provided with at least two fixing holes and at least two screw holes.
TW97108166A 2008-03-07 2008-03-07 Improved testing jig for integrated circuits TW200938843A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112605913A (en) * 2020-12-03 2021-04-06 九江市海纳电讯技术有限公司 Duplexer processing is with location frock of PCBA plate body

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112605913A (en) * 2020-12-03 2021-04-06 九江市海纳电讯技术有限公司 Duplexer processing is with location frock of PCBA plate body

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