TW200831906A - Connector for IC testing - Google Patents
Connector for IC testing Download PDFInfo
- Publication number
- TW200831906A TW200831906A TW96103274A TW96103274A TW200831906A TW 200831906 A TW200831906 A TW 200831906A TW 96103274 A TW96103274 A TW 96103274A TW 96103274 A TW96103274 A TW 96103274A TW 200831906 A TW200831906 A TW 200831906A
- Authority
- TW
- Taiwan
- Prior art keywords
- conductive
- integrated circuit
- circuit component
- test connector
- plate body
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 94
- 239000000523 sample Substances 0.000 description 16
- 238000010586 diagram Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000006837 decompression Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000010977 jade Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000002893 slag Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96103274A TW200831906A (en) | 2007-01-30 | 2007-01-30 | Connector for IC testing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96103274A TW200831906A (en) | 2007-01-30 | 2007-01-30 | Connector for IC testing |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200831906A true TW200831906A (en) | 2008-08-01 |
TWI315790B TWI315790B (enrdf_load_stackoverflow) | 2009-10-11 |
Family
ID=44818732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW96103274A TW200831906A (en) | 2007-01-30 | 2007-01-30 | Connector for IC testing |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200831906A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI588493B (zh) * | 2014-10-17 | 2017-06-21 | Isc股份有限公司 | 測試座 |
CN111308306A (zh) * | 2020-03-12 | 2020-06-19 | 深圳市江波龙电子股份有限公司 | 一种晶圆测试装置和晶圆测试方法 |
CN112881896A (zh) * | 2021-02-07 | 2021-06-01 | 荀露 | 导电组件及测试装置 |
CN113783002A (zh) * | 2020-06-09 | 2021-12-10 | 三赢科技(深圳)有限公司 | 保护连接器及镜头模组 |
-
2007
- 2007-01-30 TW TW96103274A patent/TW200831906A/zh not_active IP Right Cessation
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI588493B (zh) * | 2014-10-17 | 2017-06-21 | Isc股份有限公司 | 測試座 |
CN111308306A (zh) * | 2020-03-12 | 2020-06-19 | 深圳市江波龙电子股份有限公司 | 一种晶圆测试装置和晶圆测试方法 |
CN113783002A (zh) * | 2020-06-09 | 2021-12-10 | 三赢科技(深圳)有限公司 | 保护连接器及镜头模组 |
US11483455B2 (en) | 2020-06-09 | 2022-10-25 | Triple Win Technology (Shenzhen) Co. Ltd. | Protective connector and lens module |
TWI802802B (zh) * | 2020-06-09 | 2023-05-21 | 新煒科技有限公司 | 鏡頭模組 |
CN113783002B (zh) * | 2020-06-09 | 2023-09-12 | 三赢科技(深圳)有限公司 | 保护连接器及镜头模组 |
CN112881896A (zh) * | 2021-02-07 | 2021-06-01 | 荀露 | 导电组件及测试装置 |
Also Published As
Publication number | Publication date |
---|---|
TWI315790B (enrdf_load_stackoverflow) | 2009-10-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |