200831906 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種積體電路元件測試連接=、 種裝設晴式設備之測試載板上，作為待測積二=: 轉接測5式電路板進行檢測之測試連接器結構設計。 【先前技術】 目前應用於積體電路元件測試設備中，提供待測積體 路凡件電連接測試電路板之㈣連接器設計，依接觸元 而分概有探針式、導電彈性片式、…等，其中·· 電 件 ”騎針式測試連接器主要係於一測試座裝設數伸縮式 探針，藉以組設於該測試電路板 、、' 山 低工便口亥些伸縮式探針底 知電連接該測試電路板上之接觸塾，使該待測積體電路元 件之接腳可透過伸縮式探針電連接測試電路板進行測試。 惟因該探mm錢ϋ巾❹n切針構造較複雜 而細小、精度要求高’導致其成本高，加以該伸縮式探針 不耐長時間之使用，而有使用壽命短與可能損傷測試電路 板上之接觸墊之缺點。 該導電彈性片式測試連接器主要係使用一内含有數導 線之彈性膠片’取代前述之伸縮式探針’㈣該測試連接 器之接觸元件必須具有對待測積體電路元件之接腳表面氧 化物刺穿能力，故該導電彈性片式測試連接器使用時，必 須利用取置裝置吸取之待測積體電路元件對該導電彈性片 施以高接觸壓力，方能確保導電彈性片之導線與接腳之電 連接接觸，而&高壓作用方式會造成導電彈性片之使用: 200831906 :::…電彈性片會因受熱而變形扭曲而影響測試之 精準度。 對於前述探針式測試連接器及導電彈性片 <測試連接 盗之缺點’本發明人曾設計出—種結合探針薄冑（5 〇) 及導電彈性片（6〇)之組合，如第九圖所示者，取代 前揭伸縮式探針及單一導電彈性片作為接觸元件， 探針薄膜（50)及導電彈性片（6〇)係上下疊置地= 設於測試電路板（7〇)上，其中利用該探針薄膜 人膜片（51)之數探制（52) 了^提供對 :測積體電路元件（80)之㈣（81)表面氧化物刺 牙二力’進而降低待測積體電路元件（8 〇 )施加之壓力 並旎減少導電彈性# ( 6 0 )受到測試時產生之錫渣的汙 染，延長該導電彈性片（θ 〇)之使用壽命。 / 惟前述之測試連接器中，因佈設於該探針薄膜中之产 :蔟係採取等徑塊體設計，並以敌人手㈣設於該膜片: 裝配孔中，由於該膜片係使用一薄膜或軟性薄4，具有可 壓縮或易撓曲性，且與該些探針籙間之接合面積偏:，以 致無法提供該些設於膜片中之探針簇更佳的個別探針上下 可動行程及定位效果’因而’當待測積體電路元件由取置 裝置（或手壓裝置）施壓於該探針薄膜上及其下方之導“ 彈性片電連接測試電路板時’該些探針簇會因與積體= 疋件之接腳受壓接觸位置與高低之誤差，造成該些 與導電彈性片接觸的—致性不良，進而影響電連接之精準 度’甚至可能因探針簇偏斜觸及導電彈性片中不正確 5 200831906 線，而無法電連接泪丨丨站φ μ 1 、"式電路板正確的接觸墊，造成測試錯 誤。 【發明内容】 之主要目的在於提供一種積體電路元件測試連 接器，希藉此設計’克服前揭測試連接器中，探針薄膜之 抓針族與膜片結合力不佳，易因積體電路元件接觸誤差而 偏斜之問題。 ：、Μ成前揭目#，本發明所設計之積體電路元件測試 連接ι§係用以提供積體電路元件電連接測試電路板，該測 試連接器係包括： 第導電載板，包括一第一絕緣板體及數第一導電 $ ’該第一絕緣板體上設有數扣接孔呈間隔散佈狀，該些 第導電塊上設有扣接凹部，分別扣設於該第一絕緣板體 之各扣接孔中；以及 一導電彈性片，設於該第一導電載板下方，其包括一 彈丨生片體及複數導線佈設於該彈性片體内呈特定方向間隔 排列，並電連接該第一導電載板之第一導電塊底端。 本發明藉由前述測試連接器設計，相較於先前既有之 /貝J 4»連接斋，其特點在於：本發明測試連接器中，利用該 弟導電載板之硬質第一絕緣板體上設置數個孔徑略小於 弟 導電塊之扣接孔，以及該些第一導電塊中段設置環狀 扣接凹部等設計，藉此，使該些第一導電塊可利用置入扣 接手段組設於該硬質第一絕緣板體中呈穩固地定位狀態， 如此’當該測試連接器裝設於測試電路板上，待測積體電 6 200831906 路兀件藉由取置裝置或手厘裝置施壓於該第—導電載板及 其下方之導電彈性片電連接測試電路板時，縱使該積體電 路7L件之接腳與S —導電載板之導電塊接觸位置有些微偏 差時’因該第一導電載板可具有導正待測積體電路元件之 功此，且13該些導電塊係穩固定位於硬質第—絕緣板體中 較不易偏斜’故將摩力直接傳遞至下方導電彈性片上，並 當若有積體電路元件被取置裝置(或手壓裝置)施加過大之 壓力於該第-導電載板時，㈣—導電載板之卜絕緣板 體的下方平面’將平整的貼合於導電彈性片之上，藉其彈 性片體提供緩衝彈性減壓，料該些導電塊與導電彈性片 接觸的-致性，進㈣護㈣橡料被導電塊過壓而破壞 其結構，並it過正麵冑、線電連接測言式電路S進行測試， 確保測試之準確性。 一本發明之另一目的係令該積體電路元件測試連接器進 :步包括一固定座，該固定座中設有一容置槽，提供第一 二電載板以及導電彈性片上下堆疊地置設其中，固定於測 式電路板上’该導電彈性片之面積小於該容置槽面積，使 該導電彈性片侧邊與該容置槽槽壁間具有間距，提供該導 ，膠片熱膨脹伸展之空@，用以避S導電膠片於該測試座 受到限制，因受熱膨脹時易翹曲之問題。 【實施方式】 、一如弟一、三、六圖所示，係揭示本發明積體電路元件 測试！接器之數種較佳實施例，ώ圖中可以見及，該測試 、 （1)主要係包括一第一導電載板（1〇)以及一 7 200831906 導電彈性片（20)設於該第一導電載板（10)下方， 如第六圖所示，該測試連接器（1 )尚可增設一第二導電 載板（3〇)，或如第八圖所示，進一步包括一固定座 (40)，其中： 如第一 、三、六圖所示，該第一導電載板（1〇)包 括一第一絕緣板體（1 1 )以及數第一導電塊（1 2 )， 弟、巴緣板體（1 1 )係一硬質板體，其上設有數扣接 f 孔（1 1 1 )呈間隔散佈狀，該些扣接孔（1 1 1 )之内 孔壁中形成有扣接凸部（1 1 2 )，該些第一導電塊（工 2)包括一觸接端（121)位於頂端、一底端 間 之中 段處 呈 内 凹 狀 > 該 些第 一 導 入 於該 第一 絕 緣 板 體 ( 1 1 ) 的 數 其 中該扣接 孔 ( 1 1 1 ) 之扣 接 凸 狀扣接 凹部 ( 1 2 3 ) 中 ’使該 些 位 於該 第一 絕 緣 板 體 ( 1 1 ) 上 2 )以及一環狀扣接凹部（1 2 3 )設於該觸接端（丄2 1 )與底端 r 1 〇 〇、β . ^ . ^ 電塊（ 扣接孔 部（1 不 ^ κ i ι Λ h 並使遠些第-導電塊（12)底 絕緣板體（⑴下表面，該些第一導電堍（=弟 之觸接端（i 2 ] 弟導電塊（1 2 )頂部 c 〇犬出、同高或低於該第一絕缘 (11)上表面，該此丑巴緣板體 之第—導電塊絕緣板體（11)中 底部之接腳而設。卜列方式係依據待測積體電路元件 所述之第一導電塊（1 圓球狀或半圓球柱狀，所…&端（12 2)可形成半 返之觸接端（12 1)則形成針 8 200831906 尖狀或中央内凹、周邊具有數尖齒之形 (1 2 1 )具有對積體電路元件接腳表面氧化物2 = 力，其中針尖狀之觸接端（121)適用於具有 狀接腳之待測積體電路元件（如第 3墊 五圖所示者）， 於呈中央内凹、周邊具有數尖齒之觸接端（12 , 用於具有球狀接腳之待測積體電路元 ）則適 者如第二圖所示，”該第-導電塊 觸接端（1 2 1 )低於該第一絕緣板體（丄"之上 時，對於該待測積體電路元件之球狀接腳更具有導正2 防止導電彈性片（2 〇 )被過壓之功用。 及 該導電彈性片（20)係包括_彈性片體（ 及複數導線（2 2 )佈設於該彈性片體（2工）内呈卜 方向間隔排列，使其具有在特定方向之電性傳導功能= 述之特定方向可為垂直狀或與彈性片體之下表面呈 角度，該傾斜角度（0)介於5〇〇〜9〇0,該些導線（2 2 ) 之上下端略突出於該彈性片體（21)之上表面及 面，該導電彈性片（20)係設於該第一導電載又 〇)下方’該第一導電載板（10)之各第-導電塊（玉 2)底端（122)觸接下方之導電彈性“2〇)之 線（2 2 )上端。 等 本發明測試連接器於使用時，該測試連接器（x ) 適用之待測積體電路凡件（3 )底部接腳（3 A )型式， 可為球形、墊形、腳形、…等型式，如第二…五圖所 不，該第一導電載板（10)及導電彈性片（20)係上 9 200831906 下併置地組設於測試設備的測試電路板（2 )上，提供待 測積體電路元件（3)藉由取置裝置（5)(或手動裝 置）移置其上並施以一壓力，使該待測積體電路元件 (3 )底部的數接腳（3 A )分別對應觸接該第一導電栽 板（10)相對應第一導電塊（12)之觸接端（1 2 1)，該些第一導電塊（12)再藉由該導電彈性片 0 )特定方向傳導特性，電連接下方測試電路板（2 )的 … 相對應之接觸墊（2 A )，其中藉由該導電彈性片（2 0 )提供待測積體電路元件（3 )自上方壓抵其上之緩衝 彈性；其次，由測試設備之測試系統透過該測試電路板 (2 )及測試連接器（1 )對該待測積體電路元件（3 ) 進行測試，用以判斷該積體電路元件（3 )之功能是否正 確。 如第六圖所示，係揭示本發明測試連接器於導電彈性 片（20)下方增設第二導電載板（3〇)之另一較佳實 施例，所增設之第二導電載板（3 〇)構造大致上與前述 第一導電載板（1 〇)相同，其包括一具有數扣接孔（3 1 1 )之硬質第二絕緣板體（3 1 )以及數第二導電塊 (3 2 )分別扣設於該第二絕緣板體（3丄）之扣接孔 (3 1 1 )卜該些扣接孔（3 1 !)中各具有扣接凸部 (3 1 2 )，该些第二導電塊（3 2 )中段係形成一環狀 扣接凹部（3 2 2 )，使該些第二導電塊（3 2 )分別裝 設於該第二絕緣板體（3 i )的數扣接孔（3 2丄）中^ 並為該扣接孔（3 1 1 )之扣接凸部（3丄2 )扣入該環 10 .200831906 狀扣接凹部（3 2 2 )中定位。 前述中，該些第二導電塊（3 2 )之頂、底端分別突 出於該第二絕緣板體（3 1)上、下表面，該些第二導電 塊（3 2 )底端可為半圓球狀或半圓球柱狀等，該第一導 電塊（3 2 )頂端為墊狀。 。亥增δ又之弟一導電載板（3 〇 )係設於該導電彈性片 (2 0 )下方，利用該導電彈性片（2 〇 )中複數呈特定 方向傳導之導線（2 2)連接於該第一導電載板（1 〇) 之第一導電塊（1 2 )與第二導電載板（3 〇 )相對應之 第_導電塊（3 2 )之間，如此，如第七圖所示，該測試 連接器（1 )組没於測試電路板（2 )上，係以下方第一 導電載板（30)之第二導電塊（32)底端（321) 觸接該測試電路板（2 )相對應之接觸墊（2 A )，以上 方第一導電載板（1 〇)之第一導電塊（丄2)之觸接端 (1 2 1 )提供待測積體電路元件（3 )底部接腳（3 A )觸接之用。 如第八圖所示，係揭示本創作測試連接器（1 )進一 步包括一固定座（4 0 )之較佳實施例，該固定座（4 〇)中具有一容置槽（41)，提供該第一導電載板（工 0)以及導電彈性片（20)上下堆疊地置設其中，或是 提供該第一導電載板（10)、導電彈性片（2〇)以及 第二導電載板（30)上下堆疊地置設其中（圖未示）， 並藉由該固定座（4 0 )結合螺絲固設於該測試電路板 (2)上，該固定座（40)尚可於該容置槽（41)上 11 200831906 端形成-元件置入槽（42)，該元件置入槽（ 部對應於待測積體電路元件 氏 上尺寸漸増之開口"3上端則形成朝 ,、 1 3 )，以便於待測積體電路元 ⑴藉由取置裝置…（或手動裝置）對位置二 二"(〇)之元件置入槽（42”，電連接該第-導 1 〇 )之第—導電塊（1 2 )(如第二、四、 五、七圖所示）。 前述中，該導電彈性片（2Q)之面積略小於該固定 座（40)之容置槽（4ι、工姓 1 )面積，使該導電彈性片（2 0 )側邊與該容置槽（4 1 )槽 兮道以、 丄i間具有間距，用以提供 邊導㈣生片（20)因熱膨脹之伸展空@，使該導電彈 性片（2 〇 )在使用過程中可維持良好的平坦性，確保積 體電路元件測試之正確性。 ’'、 【圖式簡單說明】 第一圖係本發明積體電路元件測試連 實施例之平面示意圖。 I弟1 乂仏 第二圖係第一圖所示積體電路元件測試連 佳實施例之使用狀態參考圖。 昂孕乂200831906 IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to an integrated circuit component test connection =, a test carrier on a device equipped with a clear device, as a product to be tested ==: transfer test 5 The test connector structure design for the board to be tested. [Prior Art] At present, it is applied to the integrated circuit component test equipment, and provides the (four) connector design of the electrical connection test circuit board of the integrated circuit to be tested. According to the contact element, there are probe type, conductive elastic type, ...etc., ································································································ The pin bottom is electrically connected to the contact pad on the test circuit board, so that the pin of the integrated circuit component to be tested can be electrically connected to the test circuit board through the telescopic probe for testing. The structure is relatively complicated and small, and the precision is high, which leads to high cost, and the telescopic probe is not resistant to long-term use, and has the shortcomings of short service life and may damage the contact pads on the test circuit board. The test connector is mainly used to replace the aforementioned telescopic probe with an elastic film containing a plurality of wires. (4) The contact element of the test connector must have the surface of the pin of the circuit component to be measured. The piercing capability is such that when the conductive elastic type test connector is used, the conductive elastic piece must be subjected to high contact pressure by the integrated circuit component to be tested by the taking device, so as to ensure the wire of the conductive elastic piece and the connection. The electrical connection of the foot is contacted, and the high-pressure action mode will cause the use of the conductive elastic piece: 200831906::...The electroelastic piece will be deformed by heat and will affect the accuracy of the test. For the aforementioned probe type test connector and Conductive elastic sheet <Testing the shortcomings of connection thief' The inventors have designed a combination of a combination of a thin probe (5 〇) and a conductive elastic sheet (6 〇), as shown in the ninth figure, replacing the previous The telescopic probe and the single conductive elastic piece are used as the contact elements, and the probe film (50) and the conductive elastic piece (6〇) are stacked on top of each other on the test circuit board (7〇), wherein the probe film is used The number of diaphragms (51) is probed (52) to provide: (4) (81) surface oxide squeezing force of the measuring body circuit component (80) and thereby reducing the integrated circuit component to be tested (8 〇) Applying pressure and reducing conductive flexibility # ( 6 0 ) The contamination of the tin slag generated during the test, prolonging the service life of the conductive elastic sheet (θ 〇) / / In the above test connector, due to the distribution in the probe film: 蔟The equal-diameter block design is adopted, and the enemy hand (4) is placed in the diaphragm: the assembly hole, because the diaphragm is made of a film or a soft thin 4, has compressibility or flexibility, and with the probes The joint area of the turn is biased so that the upper and lower movable strokes and positioning effects of the individual probes provided in the patch are not provided. Therefore, when the integrated circuit component to be tested is taken by the device (or The hand press device is pressed on the probe film and under the guide "when the elastic piece is electrically connected to the test circuit board", the probe clusters are pressed and contacted with the pin of the integrated body = the device. The error causes the poor contact with the conductive elastic sheet, which in turn affects the accuracy of the electrical connection. It may even be that the probe cluster is deflected and touches the incorrect 5 200831906 line in the conductive elastic sheet, and the tears cannot be electrically connected. Station φ μ 1 , " circuit board correct contact , Resulting in test errors. SUMMARY OF THE INVENTION The main object of the present invention is to provide an integrated circuit component test connector, which is designed to overcome the poor bonding force between the grasping needle family and the diaphragm of the probe film in the front test connector. The problem that the circuit components are skewed due to contact errors. The integrated circuit component test connection designed by the present invention is used to provide an integrated circuit component electrical connection test circuit board. The test connector includes: a first conductive carrier, including a The first insulating plate body and the plurality of first conductive plates are provided with a plurality of fastening holes spaced apart from each other, and the first conductive blocks are provided with fastening recesses respectively, and are respectively fastened to the first insulating plate Each of the fastening holes of the body; and a conductive elastic piece disposed under the first conductive carrier, comprising a spring-like green body and a plurality of wires disposed in the elastic body in a particular direction, and electrically connected Connecting the bottom end of the first conductive block of the first conductive carrier. The present invention is characterized by the foregoing test connector design, which is characterized in that: in the test connector of the present invention, the hard first insulating plate body of the conductive carrier plate is used in the test connector of the present invention. A plurality of fastening holes having a slightly smaller aperture than the second conductive block and a ring-shaped fastening recess are disposed in the middle of the first conductive blocks, so that the first conductive blocks can be assembled by using the fastening means The rigid first insulating plate body is stably positioned, so that when the test connector is mounted on the test circuit board, the integrated electrical component to be tested is applied by a pick-up device or a hand-held device. When the first conductive substrate and the conductive elastic sheet under the conductive board are electrically connected to the test circuit board, even if the contact between the pin of the integrated circuit 7L and the conductive block of the S-conductive carrier is slightly different, The first conductive carrier may have the function of guiding the integrated circuit components to be tested, and 13 the conductive blocks are stably fixed in the hard first insulating plate body, so that the friction is directly transmitted to the lower conductive Elastic sheet, and if there is When the body circuit component is subjected to excessive pressure on the first conductive carrier by the device (or the hand pressing device), (4) the lower plane of the insulating plate of the conductive carrier plate is flatly bonded to the conductive elastic plate. In the above, the elastic sheet is provided with a buffer elastic decompression, and the conductive blocks are in contact with the conductive elastic sheet, and the (four) protective (four) rubber is over-pressed by the conductive block to destroy the structure, and it is turned over. The line is electrically connected to the test circuit S for testing to ensure the accuracy of the test. Another object of the invention is that the integrated circuit component test connector comprises: a fixing seat, wherein the fixing seat is provided with a receiving groove, and the first two electric carrier plates and the conductive elastic piece are stacked on top of each other Wherein, the area of the conductive elastic sheet is smaller than the area of the accommodating groove, so that the side of the conductive elastic piece has a space between the side of the accommodating groove and the groove of the accommodating groove, and the guide is provided, and the film is thermally expanded and stretched. Empty @, used to avoid S conductive film in the test seat is limited, due to the problem of easy warping when heated. [Embodiment] As shown in the figures of the first, third, and sixth figures, the integrated circuit component test of the present invention is disclosed! The preferred embodiment of the connector is as shown in the figure. The test, (1) mainly includes a first conductive carrier (1〇) and a 7200831906 conductive elastic sheet (20). A conductive carrier (10), as shown in the sixth figure, the test connector (1) can be added with a second conductive carrier (3), or as shown in the eighth figure, further including a fixed seat (40), wherein: as shown in the first, third, and sixth figures, the first conductive carrier (1〇) includes a first insulating plate body (1 1 ) and a plurality of first conductive blocks (1 2 ), The bar edge plate body (1 1 ) is a rigid plate body, and a plurality of fastening f holes (1 1 1 ) are arranged in a spaced manner, and fastening holes are formed in the inner hole walls of the fastening holes (1 1 1 ). a convex portion (1 1 2 ), the first conductive block (2) includes a contact end (121) at a top end, and a middle portion between the bottom ends is concave-shaped; the first introduction is in the first a number of the insulating plate body (1 1 ), wherein the fastening hole (1 1 3 ) of the fastening hole (1 1 1 ) is located in the first insulating plate body (1) 1) Upper 2) and an annular fastening recess (1 2 3 ) are provided at the contact end (丄2 1 ) and the bottom end r 1 〇〇, β . ^ . ^ Electric block (fastening hole portion (1 Not ^ κ i ι Λ h and make the bottom of the first - conductive block (12) the bottom of the plate body ((1) lower surface, the first conductive 堍 (= brother's contact end (i 2) brother conductive block (1 2 The top c 〇 dog out, the same height or lower than the upper surface of the first insulation (11), the ugly edge of the plate body - the conductive block insulating plate body (11) in the bottom of the pin is set. The method is formed according to the first conductive block (1 spherical or semi-spherical column shape, and the ... & end (12 2) can form a semi-return contact end (12 1) according to the integrated circuit component to be tested. Needle 8 200831906 A pointed or central concave shape with a plurality of sharp teeth on the periphery (1 2 1 ) has an integral 2 = force on the surface of the integrated circuit component pin, wherein the tip-shaped contact end (121) is suitable for having The integrated circuit component to be tested (as shown in Figure 3, Figure 5) is a contact end with a centered concave and a few pointed teeth (12 for the ball-shaped pin to be tested) Integrated circuit element) As shown in the second figure, "the first conductive block contact end (1 2 1 ) is lower than the first insulating plate body (on the upper side, the spherical pin for the integrated circuit component to be tested) It has a guiding function 2 to prevent the conductive elastic piece (2 〇) from being over-pressed. And the conductive elastic piece (20) includes an elastic sheet body (and a plurality of wires (2 2 ) are disposed on the elastic piece body (2 work) The inner direction is arranged in a direction to make it have an electrical conduction function in a specific direction. The specific direction may be vertical or at an angle to the lower surface of the elastic sheet. The inclination angle (0) is between 5〇〇. 〜9〇0, the lower end of the wire (2 2 ) slightly protrudes from the upper surface and the surface of the elastic piece body (21), and the conductive elastic piece (20) is disposed under the first conductive load The bottom end (122) of each of the first conductive blocks (Jade 2) of the first conductive carrier (10) contacts the upper end of the line (2 2 ) of the conductive elastic "2" below. When the test connector of the present invention is used, the test connector (x) is suitable for the integrated circuit to be tested (3), the bottom pin (3 A) type, which may be spherical, cushion, foot, etc. The first conductive carrier (10) and the conductive elastic sheet (20) are juxtaposed on the test circuit board (2) of the test equipment, and are provided in the second, fifth, and fifth embodiments. The measuring body circuit component (3) is displaced by the holding device (5) (or the manual device) and applied with a pressure to make the number of pins at the bottom of the integrated circuit component (3) to be tested (3 A) Correspondingly contacting the first conductive plate (10) corresponding to the first conductive block (12) of the contact end (1 2 1), the first conductive block (12) and the conductive elastic sheet a specific direction conduction characteristic, electrically connected to the contact pad (2 A ) of the lower test board (2), wherein the integrated circuit component (3) is provided by the conductive elastic sheet (20) from above The cushioning elasticity is pressed against it; secondly, the test system of the test equipment passes the test circuit board (2) and the test connector (1) to test the test Circuit device (3) for testing, to determine whether the integrated circuit elements (3) the function correctly. As shown in the sixth figure, another preferred embodiment of the second conductive carrier (3) is provided under the conductive elastic sheet (20) of the test connector of the present invention, and the second conductive carrier (3) is added. The structure is substantially the same as the first conductive carrier (1 〇), and includes a hard second insulating plate body (31) having a plurality of fastening holes (31) and a plurality of second conductive blocks (3) 2) fastening holes (3 1 1 ) respectively fastened to the second insulating plate body (3丄), each of the fastening holes (3 1 !) having a fastening protrusion (3 1 2 ), The middle portions of the second conductive blocks (3 2 ) form an annular fastening recess (3 2 2 ), and the second conductive blocks (3 2 ) are respectively mounted on the second insulating plate body (3 i ) The number of the fastening holes (3 2 丄) is the same as that of the fastening protrusions (3 1 2) of the fastening holes (3 1 1 ), and the ring 10 is positioned in the 200831906-shaped fastening recess (3 2 2 ) . In the foregoing, the top and bottom ends of the second conductive blocks (3 2 ) respectively protrude from the upper and lower surfaces of the second insulating plate body (31), and the bottom ends of the second conductive blocks (32) may be A semi-spherical or semi-spherical column or the like, and the top end of the first conductive block (32) has a pad shape. . A conductive carrier (3 〇) is disposed under the conductive elastic sheet (20), and is connected to the plurality of conductive wires (2 2) in a specific direction by the conductive elastic sheet (2 )) The first conductive block (1 2 ) of the first conductive carrier (1 )) is between the first conductive block (3 2 ) corresponding to the second conductive carrier (3 ,), and thus, as shown in the seventh figure The test connector (1) is not on the test circuit board (2), and the bottom end (321) of the second conductive block (32) of the first conductive carrier (30) contacts the test circuit board. (2) the corresponding contact pad (2 A ), the integrated circuit component to be tested is provided by the contact end (1 2 1 ) of the first conductive block (丄2) of the first conductive carrier (1 上方) above ( 3) The bottom pin (3 A) is used for contact. As shown in the eighth figure, it is disclosed that the present test connector (1) further includes a preferred embodiment of a fixing base (40) having a receiving groove (41) provided therein. The first conductive carrier (O) and the conductive elastic sheet (20) are disposed one above another, or the first conductive carrier (10), the conductive elastic sheet (2), and the second conductive carrier are provided. (30) being placed on the upper and lower stacks (not shown), and being fixed to the test circuit board (2) by means of the fixing base (40), the fixing seat (40) is still available for the capacity The groove (41) is formed on the end of the 11/31/31, and the component is placed in the groove (42). The component is placed in the groove (the portion corresponding to the opening of the integrated circuit component to be measured), and the upper end is formed toward the opening, 3 3), so that the integrated circuit element (1) to be tested is placed into the slot (42" by means of the pick-up device (or manual device) for the component of the position two (", electrically connected to the first guide 1") The first - the conductive block (12) (as shown in the second, fourth, fifth, and seventh figures). In the foregoing, the area of the conductive elastic sheet (2Q) is slightly smaller than the fixed (40) The area of the receiving groove (4ι, worker name 1) is such that the side of the conductive elastic piece (20) and the receiving groove (4 1 ) have a space between the groove and the 丄i for providing The side guide (4) green sheet (20) is stretched by the thermal expansion @, so that the conductive elastic sheet (2 〇) can maintain good flatness during use, and ensure the correctness of the integrated circuit component test. '', BRIEF DESCRIPTION OF THE DRAWINGS The first drawing is a schematic plan view of an embodiment of the integrated circuit component test of the present invention. The first drawing is a reference diagram of the use state of the integrated circuit component test shown in the first figure. Angyang
第三圖係本發明積體電路元件測試連接 實施例之平面示意圖。 一 H 70件測試連接器第二較 元件測試連接器第二較 第四圖係第三圖所示積體電路 佳實施例之使用狀態參考圖。 第五圖係第三圖所示積體電路 佳實施例之另一使用狀態參考圖。 12 200831906 。第八圖係本發明積體電路元件測試連接器增設第二導 電載，之第三較佳實施例之平面示意圖。 第七圖係第六圖所示積體電路元件測試連接器第三較 仏貫施例之使用狀態參考圖。 第八圖係本發明積I# Φ _ 、體電路凡件測試連接器增設固定座 弟四較佳實施例之平面示意圖。 第九圖係已知積體電路元件 Ύ二—表 圍。 彳千/則武連接器之平面不思 【主要元件符號說明】 (1 )測試連接器 (2 A)接觸墊 (3 )積體電路元件 (5 )取置裝置 (1 0 )第一導電載板 (1 1 1 )扣接孔 (1 2 )第一導電塊 (1 2 2 )底端 (2 〇 )導電彈性片 (2 2 )導線 (3〇)第二導電載板 (3 1 1 )扣接孔 (3 2 )第二導電塊 (3 2 2 )扣接凹部 (4 〇 )固定座 (2 )測試電路板 (3 A )接腳 (1 1 )第一絕緣板體 (1 1 2 )扣接凸部 (1 2 1 )觸接端 (1 2 3 )扣接凹部 (2 1 )彈性片體 (3 1 )第二絕緣板體 (3 1 2 )扣接凸部 (3 2 1 )底端 (3 2 3 )頂端 (41)容置槽 13 200831906The third figure is a schematic plan view of an embodiment of the test circuit component test connection of the present invention. A H 70-piece test connector, a second component test connector, a second, fourth, and a third embodiment of the integrated circuit shown in FIG. The fifth figure is another use state reference diagram of the preferred embodiment of the integrated circuit shown in the third figure. 12 200831906. Figure 8 is a plan view showing a third preferred embodiment of the integrated circuit component test connector of the present invention. Fig. 7 is a view showing the state of use of the third comparative embodiment of the integrated circuit component test connector shown in Fig. 6. The eighth figure is a schematic plan view of the preferred embodiment of the present invention. The ninth figure is a known integrated circuit component.彳千/则武连接的平面不思 [Main component symbol description] (1) Test connector (2 A) contact pad (3) Integrated circuit component (5) Pickup device (1 0) First conductive carrier (1 1 1 ) fastening hole (1 2 ) first conductive block (1 2 2 ) bottom end (2 〇) conductive elastic piece (2 2 ) wire (3 〇) second conductive carrier plate (3 1 1 ) buckle Contact hole (3 2 ) second conductive block (3 2 2 ) fastening recess (4 〇) fixing seat (2) test circuit board (3 A ) pin (1 1 ) first insulating plate body (1 1 2 ) Buttoning protrusion (1 2 1 ) contact end (1 2 3 ) fastening recess (2 1 ) elastic sheet body (3 1 ) second insulating plate body (3 1 2 ) fastening convex portion (3 2 1 ) Bottom end (3 2 3 ) top end (41) receiving groove 13 200831906