TWI315790B - - Google Patents

Info

Publication number
TWI315790B
TWI315790B TW96103274A TW96103274A TWI315790B TW I315790 B TWI315790 B TW I315790B TW 96103274 A TW96103274 A TW 96103274A TW 96103274 A TW96103274 A TW 96103274A TW I315790 B TWI315790 B TW I315790B
Authority
TW
Taiwan
Application number
TW96103274A
Other languages
Chinese (zh)
Other versions
TW200831906A (en
Original Assignee
Win Way Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Win Way Technology Co Ltd filed Critical Win Way Technology Co Ltd
Priority to TW96103274A priority Critical patent/TW200831906A/en
Publication of TW200831906A publication Critical patent/TW200831906A/en
Application granted granted Critical
Publication of TWI315790B publication Critical patent/TWI315790B/zh

Links

TW96103274A 2007-01-30 2007-01-30 Connector for IC testing TW200831906A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96103274A TW200831906A (en) 2007-01-30 2007-01-30 Connector for IC testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96103274A TW200831906A (en) 2007-01-30 2007-01-30 Connector for IC testing

Publications (2)

Publication Number Publication Date
TW200831906A TW200831906A (en) 2008-08-01
TWI315790B true TWI315790B (en) 2009-10-11

Family

ID=44818732

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96103274A TW200831906A (en) 2007-01-30 2007-01-30 Connector for IC testing

Country Status (1)

Country Link
TW (1) TW200831906A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101706331B1 (en) * 2014-10-17 2017-02-15 주식회사 아이에스시 Test socket
CN111308306A (en) * 2020-03-12 2020-06-19 深圳市江波龙电子股份有限公司 Wafer testing device and wafer testing method
CN113783002B (en) * 2020-06-09 2023-09-12 三赢科技（深圳）有限公司 Protection connector and lens module
CN112881896A (en) * 2021-02-07 2021-06-01 荀露 Conductive assembly and testing device

Also Published As

Publication number Publication date
TW200831906A (en) 2008-08-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees