TW200826140A - Techniques for confining electrons in an ion implanter - Google Patents

Techniques for confining electrons in an ion implanter Download PDF

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Publication number
TW200826140A
TW200826140A TW096144413A TW96144413A TW200826140A TW 200826140 A TW200826140 A TW 200826140A TW 096144413 A TW096144413 A TW 096144413A TW 96144413 A TW96144413 A TW 96144413A TW 200826140 A TW200826140 A TW 200826140A
Authority
TW
Taiwan
Prior art keywords
array
magnets
magnet
ion beam
ion
Prior art date
Application number
TW096144413A
Other languages
English (en)
Chinese (zh)
Inventor
Donna L Smatlak
Gordon C Angel
Rajesh Dorai
Original Assignee
Varian Semiconductor Equipment
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Semiconductor Equipment filed Critical Varian Semiconductor Equipment
Publication of TW200826140A publication Critical patent/TW200826140A/zh

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26—Bombardment with radiation
    • H01L21/263—Bombardment with radiation with high-energy radiation
    • H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/026—Means for avoiding or neutralising unwanted electrical charges on tube components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/004—Charge control of objects or beams
    • H01J2237/0041—Neutralising arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/05—Arrangements for energy or mass analysis
    • H01J2237/055—Arrangements for energy or mass analysis magnetic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/15—Means for deflecting or directing discharge
    • H01J2237/152—Magnetic means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/31701—Ion implantation

Landscapes

  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Physical Vapour Deposition (AREA)
  • Particle Accelerators (AREA)
TW096144413A 2006-12-07 2007-11-23 Techniques for confining electrons in an ion implanter TW200826140A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/568,000 US7655922B2 (en) 2006-12-07 2006-12-07 Techniques for confining electrons in an ion implanter

Publications (1)

Publication Number Publication Date
TW200826140A true TW200826140A (en) 2008-06-16

Family

ID=39272141

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096144413A TW200826140A (en) 2006-12-07 2007-11-23 Techniques for confining electrons in an ion implanter

Country Status (6)

Country Link
US (1) US7655922B2 (enExample)
JP (1) JP5397624B2 (enExample)
KR (1) KR20090095603A (enExample)
CN (1) CN101584017B (enExample)
TW (1) TW200826140A (enExample)
WO (1) WO2008073747A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7888652B2 (en) * 2006-11-27 2011-02-15 Nissin Ion Equipment Co., Ltd. Ion implantation apparatus
US7851767B2 (en) * 2007-03-21 2010-12-14 Advanced Ion Beam Technology, Inc. Beam control assembly for ribbon beam of ions for ion implantation
WO2009155082A1 (en) * 2008-05-30 2009-12-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University A radio-frequency-free hybrid electrostatic/magnetostatic cell for transporting, trapping, and dissociating ions in mass spectrometers
JP2011198738A (ja) * 2010-02-23 2011-10-06 Nissin Ion Equipment Co Ltd 複数の磁場集中部材をカバーする保護部材を備えたイオンビーム照射装置用磁石
CN102446679A (zh) * 2010-10-13 2012-05-09 北京中科信电子装备有限公司 新型大倾角单片式注入离子注入机离子光学系统
JP5495236B2 (ja) * 2010-12-08 2014-05-21 国立大学法人京都大学 イオンビーム照射装置及びイオンビーム発散抑制方法
WO2013071110A1 (en) * 2011-11-09 2013-05-16 E/G Electrograph Inc. Magnetic field reduction apparatus and magnetic plasma flood system for ion beam processing
CA2882118C (en) 2012-08-16 2021-01-12 Douglas F. Barofsky Electron source for an rf-free electromagnetostatic electron-induced dissociation cell and use in a tandem mass spectrometer
JP6207418B2 (ja) * 2014-02-10 2017-10-04 住友重機械イオンテクノロジー株式会社 高エネルギーイオン注入装置、ビーム平行化器、及びビーム平行化方法
JP6596798B2 (ja) * 2014-10-21 2019-10-30 国立研究開発法人理化学研究所 アンジュレータ磁石列及びアンジュレータ
CN116666179B (zh) * 2023-06-21 2023-12-12 广东省新兴激光等离子体技术研究院 分析磁铁结构及宽幅离子源

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4731598A (en) 1987-08-24 1988-03-15 The United States Of America As Represented By The Secretary Of The Army Periodic permanent magnet structure with increased useful field
US5206516A (en) 1991-04-29 1993-04-27 International Business Machines Corporation Low energy, steered ion beam deposition system having high current at low pressure
JP3054302B2 (ja) 1992-12-02 2000-06-19 アプライド マテリアルズ インコーポレイテッド イオン注入中の半導体ウェハにおける帯電を低減するプラズマ放出システム
US5703375A (en) 1996-08-02 1997-12-30 Eaton Corporation Method and apparatus for ion beam neutralization
JP3204920B2 (ja) 1997-03-22 2001-09-04 川崎重工業株式会社 永久磁石型偏向磁石装置および電子蓄積リング
GB2331179B (en) * 1997-11-07 2002-03-20 Applied Materials Inc Method of preventing negative charge build up on a substrate being implanted w ith positive ions and ion implantation apparatus for performing such a method
US6703628B2 (en) * 2000-07-25 2004-03-09 Axceliss Technologies, Inc Method and system for ion beam containment in an ion beam guide
US6414329B1 (en) 2000-07-25 2002-07-02 Axcelis Technologies, Inc. Method and system for microwave excitation of plasma in an ion beam guide
JP3869680B2 (ja) * 2001-05-29 2007-01-17 株式会社 Ｓｅｎ−Ｓｈｉ・アクセリス カンパニー イオン注入装置
JP3840108B2 (ja) 2001-12-27 2006-11-01 株式会社 Ｓｅｎ−Ｓｈｉ・アクセリス カンパニー イオンビーム処理方法及び処理装置
US6879109B2 (en) * 2003-05-15 2005-04-12 Axcelis Technologies, Inc. Thin magnetron structures for plasma generation in ion implantation systems
US6891174B2 (en) 2003-07-31 2005-05-10 Axcelis Technologies, Inc. Method and system for ion beam containment using photoelectrons in an ion beam guide
JP4305499B2 (ja) * 2006-11-27 2009-07-29 日新イオン機器株式会社 イオン注入装置

Also Published As

Publication number Publication date
CN101584017B (zh) 2010-12-08
JP2010512620A (ja) 2010-04-22
KR20090095603A (ko) 2009-09-09
JP5397624B2 (ja) 2014-01-22
US7655922B2 (en) 2010-02-02
WO2008073747A1 (en) 2008-06-19
CN101584017A (zh) 2009-11-18
US20080135775A1 (en) 2008-06-12

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