TW200819922A - Pattern writing apparatus, pattern writing system and pattern writing method - Google Patents
Pattern writing apparatus, pattern writing system and pattern writing method Download PDFInfo
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- TW200819922A TW200819922A TW096131424A TW96131424A TW200819922A TW 200819922 A TW200819922 A TW 200819922A TW 096131424 A TW096131424 A TW 096131424A TW 96131424 A TW96131424 A TW 96131424A TW 200819922 A TW200819922 A TW 200819922A
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- light
- region
- pattern
- substrate
- photosensitive material
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/70475—Stitching, i.e. connecting image fields to produce a device field, the field occupied by a device such as a memory chip, processor chip, CCD, flat panel display
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
200819922 九、發明說明: 【發明所屬之技術領域】 ' 本發明係關於一種利用光於基板上之感光材料描%圖 Ϋ 案之技術。 ° 【先前技術】 習知,藉由對形成於半導體基板或印刷基板、或者電漿 顯示裝置、液晶顯示裝置用之玻璃基板等(以下,稱為「= 板」)上之感光材料照射光,來進行圖案之描繪。 例如,於曰本專利特開2002_98824號公報中揭示有如 ::術·精由透過光罩對負型感光性樹脂層照射光而描绔 :案’於顯影步驟中錄非曝光部分,藉此形成液晶顯^ 衣置之感光性間隔物(photospacer)。又,於日本專 開2005-173037號公報中’液晶顯示裝置之配向控制用: =由光阻所形成。然而’於以曰本專利特開 大 號公報所述之方式轉印光㈣案之描时式中,料= 繪對象之基板增大,縣罩亦增大,因: 成本將增加。 衣直之W造 去因:曰不使用與基板同等大小之大型光罩之描緣方 形成有數個開口之比較小型的光罩= 上之感先_上照射脈衝光,—邊移動基板 脈衝光,藉此於感光材料上纟 、反覆Α射 讓-145745號公報中,m 1。於日本專利特開 Μ取砀欲日日顯不裝置之彩色 312XP/m^mmmm/96^l2/96131424 6 200819922 濾光片基板上之黑色矩陣圖案。 近年來,於製造液晶 ^ ^ m t 員不衣置用之彩色濾光片等時,右 k f用1片玻璃基板來萝#盤 〜夕㈣、 數片彩色濾光片基板(進行所 域設定於1片基板之主/面卜_㈣之數個描1 會區 表面上,猎此該數個描繪區域 圍區域即成為未描綠圖案之_ ^ W承 < 非抱繪區域(即,不可對 材料照射光之區域)。於曰太蜜 〜 “於日本專利特開2006-145745骑八 報之描緣裝置中,避開非#給 'ϋ Α 一 t閉非彳田繪區域而僅對描繪區域照射 光。 、 然而,於日本專利特開2006_145745號公報之描繪裝置 中,除負型感光材料以外亦對正型感光材料進行描繪^於 此情形時’透過具有與欲描敎圖案對應之遮光^的光 罩,對與描繪區域之圖案對應之部分以外的區域照射光。 此處,於對正型感光材料描繪圖案之情形時,必須對整個 未描繪圖案之非描繪區域照射光,然而於該描繪裝置中, •由於對負型感光材料亦照射光,故光照射區域僅限制於描 繪區域内,而難以對位於描繪區域外側之非描繪區域昭= 光。 …、、 【發明内容】 本發明之目的在於提供一種利用光於基板上之感光材 • 料上描繪圖案之圖案描繪裝置,以容易地對基板上之非描 繪區域照射光。 η 圖案描繪裝置具備:基板保持部’保持藉由在後續步驟 中部分地去除而使成為週期圖案之正型感光材料形成為 312ΧΡ/發明說明書(補件)/96-12/96131424 7 200819922 =之基板,第1光照射部’對上 有相互垂直之朝向第!方向及第 =上°又疋為具 •繪區域中、與上述圖荦對 肖之邊的長方形之描 #日4心* 部分以外照射光;以及第2 % 先a射口P ’其對上述感光材料上、 描繚區域昭射井· 1 ψ 'L田巧區域周圍之非 曰L L、射先,其中’上述第… 源;第1光罩部,根據上述 i j弟1先 1 . ^ ^ ^ 4圓茱之週期性,將來自上述第 1光源之光¥至如下區域, t , , ^ v 將上述4田繪區域於上述第 1方向上專为而成之數個分割區域之一與上 長度相等之第1照射區域十、盥 =庙 〇之 的區域,第1移動機構,相對於上述y f 4 方向相對地移動上述第"二=!域朝上述第1 或上述第1光罩部,而移動上述200819922 IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a technique for utilizing a photosensitive material on a substrate. [Prior Art] It is known to irradiate light to a photosensitive material formed on a semiconductor substrate or a printed circuit board, or a plasma display device, a glass substrate for a liquid crystal display device (hereinafter referred to as "= plate"), To paint the pattern. For example, in Japanese Laid-Open Patent Publication No. 2002-98824, it is disclosed that: the technique is performed by irradiating light to a negative photosensitive resin layer through a photomask, and the non-exposed portion is recorded in the developing step, thereby forming A photosensitive spacer (photospacer) placed on the liquid crystal display. Further, in Japanese Laid-Open Patent Publication No. 2005-173037, the alignment control of the liquid crystal display device is: = formed by a photoresist. However, in the case of the transfer of light (4) in the manner described in the Japanese Patent Laid-Open Publication No., the material of the object to be painted is increased, and the county cover is also increased because: the cost will increase. The clothing is straightforward. Because it does not use the trace of a large reticle of the same size as the substrate, a relatively small reticle with several openings is formed = the upper sense _ the upper illuminating pulse light, and the substrate pulse light is moved. Thus, in the photosensitive material, Α, and Α Α 让 145 -145745, m 1 . In Japan, the special patent is used to capture the color of the device. 312XP/m^mmmm/96^l2/96131424 6 200819922 The black matrix pattern on the filter substrate. In recent years, when manufacturing a color filter for liquid crystals, etc., the right kf uses one glass substrate to make a disk #夕 (4), a plurality of color filter substrates (the domain is set to On the surface of the conference area, the area around the conference area is the unpainted green area. The area where the material is irradiated with light.) 曰太蜜~ "In the Japanese Patent Special Open 2006-145745 riding the eight-reporting device, avoiding the non-# ϋ ϋ Α t 闭 彳 彳 彳 绘 绘 绘 而In the drawing device of the Japanese Patent Laid-Open Publication No. 2006-145745, the positive photosensitive material is drawn in addition to the negative photosensitive material, and in this case, the transmission has a corresponding pattern to be described. The light-shielding mask irradiates light to a region other than the portion corresponding to the pattern of the drawing region. Here, in the case of patterning the alignment photosensitive material, it is necessary to irradiate the non-drawing region of the entire undrawn pattern, however, In the drawing device, • due to Since the light-sensitive material is also irradiated with light, the light-irradiated region is limited only in the drawing region, and it is difficult to display the non-drawing region located outside the drawing region. [Invention] The object of the present invention is to provide a light-using device. A pattern drawing device for drawing a pattern on a photosensitive material on a substrate to easily irradiate light on a non-drawing area on the substrate. The η pattern drawing device includes: the substrate holding portion 'maintained by being partially removed in a subsequent step The positive photosensitive material that becomes the periodic pattern is formed as a substrate of 312 ΧΡ / invention specification (supplement) / 96-12/96131424 7 200819922 =, the first light illuminating portion has a direction perpendicular to the first direction and the first = ° 疋 疋 • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形 长方形昭区昭射井· 1 ψ 'L Tian Qiao area around the non-曰 LL, shooting first, which 'the above... source; the first reticle part, according to the above ij brother 1 first 1. ^ ^ ^ 4 round Cyclical, will come from The light of the first light source is in the following area, t , , ^ v, and one of the plurality of divided regions in which the four fields are formed in the first direction and the first irradiation region having the same length. In the region of the temple, the first moving mechanism relatively moves the first "second=! field toward the first or the first mask portion with respect to the yf4 direction, and moves the above
第1 /、?、射£域,並且每當匕七十[楚1 Η77 ό丄广L 母田上述弟1照射區域分別與上述數 個分別區域關於上述第i方向一致時,透過上述第 :對j第、!照射區域照射光;且上述第2光照射部具 丄弟光源,弟2光罩部,將來自上述第2光源之光導 至第2照射區域’即’於上述感光材料上於上述第2方向 延伸亚且权截上述描綠區域及上述非描緣區域之區域第 2移動機構’相對於上述感光材料朝上述第i方向相對地 移動上述第2照射區域;以及第2控制部,於上述第2职 ,區域通過上述描繪區域及上述非描繪區域時,控制上^ 第2*光罩部而變更上述第2照射區域中遮播光照射之區 域,藉此使光僅照射上述非描繪區域。根據本發明,可容 易地對基板上之非描繪區域照射光。 312XP/發明說明書(補件)/96-12/96131424 8 200819922 較佳實施形態中,上述第2光罩部具備液 crystal shutter),因此可容易地變更第 2方向上長度。 、:明之另一較佳實施形態中,於上述基板保持部 一’w代替形成有上述正型感光材料之上述基板,而保 錯由在後續步驟中部*地去除而使成為週期目案之負型 感光:料形成為層狀之基板,上述第i光照射部藉由變更The first /, ?, and the shooting range, and each time the seventeenth [Chu 1 Η 77 ό丄 L L L 母 上述 上述 上述 上述 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射 照射For j,! The second light-irradiating portion has a light source, and the second light-shielding portion guides the light from the second light source to the second light-emitting region, that is, the light-receiving material extends in the second direction. The second moving mechanism 'the second moving mechanism' that moves the green region and the non-finished region relative to the photosensitive material in the i-th direction relatively moves the second irradiation region; and the second control portion is in the second When the area passes through the drawing area and the non-drawing area, the upper 2nd mask portion is controlled to change the area in which the light is irradiated in the second irradiation area, thereby illuminating only the non-drawing area. According to the present invention, it is possible to easily irradiate light to a non-drawing area on a substrate. 312XP/Invention Manual (Supplement)/96-12/96131424 8 200819922 In the preferred embodiment, since the second mask portion is provided with a liquid crystal shutter, the length in the second direction can be easily changed. According to another preferred embodiment of the present invention, the substrate holding portion is used instead of the substrate on which the positive photosensitive material is formed, and the error-preserving is removed by the middle portion of the subsequent step to become a negative cycle item. Type photosensitive: the material is formed into a layered substrate, and the ith light irradiation unit is changed
^述第1光罩部及/或上述第1控制部之控制,而使光僅 知、射:下區域,即,在上述感光材料上被設定為具有朝向 上述第1方向及上述第2方向之邊的長方形之描繪區域 i與/述圖案對應之部分。因此,可使圖案描緣裝置之 構造簡化,並且對負型及正型感光材料描繪圖案。更佳 為,上述基板為液晶顯示裝置用之彩色滤光片基板,且利 用上述負型之上述感光材料而形成於上述彩色濾光片基Controlling the first mask portion and/or the first control unit, the light is only known to be emitted, and the lower region, that is, the photosensitive material is set to have the first direction and the second direction. The portion of the rectangular drawing area i corresponding to the pattern described above. Therefore, the configuration of the pattern drawing device can be simplified, and the pattern can be drawn for the negative and positive photosensitive materials. More preferably, the substrate is a color filter substrate for a liquid crystal display device, and is formed on the color filter substrate by using the negative photosensitive material.
於本發明之一 晶光閘(1 iquid 2照射區域之第 ,上之上述圖案為像素圖案。進而更佳為,上述基板為液 晶顯不裝置用之玻璃基板,且利用上述正型上述感光材料 而形成於上述玻璃基板上之上述圖案為用於液晶配向控 制之突起圖案。 &本發明H步另—實施形態中’於上述感光材料 上,包含上述描繪區域及與上述描繪區域相同形狀之描繪 區域的數個描繪區域,於上述第丨方向及/或上述第2方 向上相互間隔而排列’ ±述基板為根據上述數個描緣區域 而加以多倒角之預定基板,上述第丨光照射部對上述數個 描緣區域中與上述圖案對應部分以外之部分照射光,上述 312XP/發明說明書(補件)/96-12/96131424 9 200819922 外的非描繪區域照:光感上之上述數個财區域以 丨光源及/或上述第,光4弟:控制部藉由控制上述第 繪區域移動上述第〗照二並 ==二數:描 過上述第1光罩部而朝上弟1方向一致時,透 2照射區域於上㈣2方/^、射區域f射光,上述第 料,當上述第2照射區域通過上上光材 第2控制部對上述第2#先材㈣,精由上述 非描緣區域先罩部之控制,而使光僅照射上述 本發明之-個態樣係在利用光於 ,案之圖案描㈣統,於藉由在後續步驟== :而:么為週期圖案之正型感光材料形成為層狀之基板 為且.弟1光照射展置’對在上述感光材料上被設定 為具有相互垂直之朝向第1方向及第2方向之邊的長方形 之&输區域中、與上述圖料應之部分以外照射光;第2 光…射衣置,對上述感光材料上之上述描繪區域周圍之非 %區域照射光;以及搬送機構,於上述第工光照射裝置 與上述第2光照射裝置之間搬送基板;其中,上述第^光 照射褒置具備:第1基板保持部,用以保持基板;第丄光 源;第1光罩部,根據上述圖案之週期性,將來自上述第 1光源之光導向如下區域,即,將上述描繪區域於上述第 1方向上等分而成之數個分割區域之一與上述第1方向+ 度相等的第1照射區域中、與上述圖案對應之部分以外的 312XP/發明說明書(補件)/96-12/96131424 ι〇 200819922 區域;第1移動機構’相對於上 :=!動上述第1照射區域;以及第i控制ί二: 弟1先源及/或上述第1光罩部,而移動上述第 1照射區域’並且每當上述第1照射區域分別與上述數個 分割區域關於上述第丨方向—致時,透過上述第^ Γ第述!= 區域照射光;且上述第2光照射裝= 備.弟2基板保持和用以保持基板;第2光源;第 罩部:將來自上述第2光源之光導至第2照射區域,即, 上述感光材料上於上述第2方向上延伸並 繪區域及上述非描㈣域之區域;第2移動機構,相^ 上述感光材料朝上述第1方向相對地移動上述第2昭射區 域;、以及第2控制部,於上述帛2照射區域通過上⑽讀 區域及上述非描緣區域時,藉由控制上述第2光罩部而變 更上述第2照射區域中遮擋光照射之區域,而使光僅照射 上述非描纟會區域。 • 本發明之目的亦在於提供一種利用光於基板上之 材料上描繪圖案之圖案描緣方法。 之4先 ’上述目的及其他目的、特徵、態樣及優點可參照隨附圖 式並由以下本發明之詳細說明而明瞭。 【實施方式】 圖1及圖2係表示本發明第〗實施形態之圖案描繪裝置 1之構成的側視圖及俯視圖。圖案描繪裝置〗係利用光於 液晶顯示裝置用之玻璃基板9(以下,簡稱為「基板9」) 上之感光材料上描繪圖案之裝置。 312ΧΡ/發明說明書(補件)/96-12/96131424 200819922 圖3係表示基板9之俯視圖。於基板9之主表面上,藉 由在後續步驟中部分地去除而使成為週期圖案之感光^ 料形成為層狀,於該感光材料上設定有具有相互垂直之朝 向圖3中之X方向及γ方向之邊的長方形之四個描緣區域 91(圖3中以平行斜線表示)。四個描繪區域9ι形狀相同, 且於感光材料上於X方向及γ方向上相互間隔而排列。 於基板9上之感光材料上,描繪區域91周圍之格子狀 區域(即’數個描繪區域91以外之區域)形成為不描繪(形 成)週期圖案之非描繪區域92。於以下說明中,將設定於 感光材料上之非描綠區域92中、覆蓋基板9之^向之 全長而設定之部分稱為「第!非描緣區域921」,將除此 以外之部分(即,於χ方向上與描綠區域91鄰接之部 ,為「第2非描㈣域922」。於圖3中,將第!非描緣 -域921及帛2非描纷區域922分別以二點鍵線來表示曰。 基板9係根據四個描緣區域91而加以多倒角之預定美 ::’由1片基板9獲得之4片基板成為經由後續步心 終形成為 _(_ti-d_in AHgnment = ^垂直配向)型液晶顯示襄置之組裝零件即彩色遽光片基 於圖案描緣裝置!中,藉由在形成於基板9上 (即,顯影時曝光部分殘留於基板上之類型)感光材料即 阻劑上照射光’可描繪形成於彩色濾光片基板上之^ =案(即’子像素之集合)。又,於圖案描緣裝置,夢 由在形成於基板9上之正型(即,顯影時僅非曝光部分; 312XP/發明說明書(補件)/96-12/96131424 u 200819922 留於基板上之類型)感光材料上照射光,亦可描繪形成於 彩色濾光片基板上之用於液晶配向控制之突起圖案(即, •突起之集合)。於基板9中,無論是對負型感光材料進行 1彳田纟會¥ ’抑或疋對正型感光材料進行描繪時,數個描繪區 域91於感光材料上均進行同樣設定。 所謂用於液晶配向控制之突起,係指於液晶顯示裝置 中,形成於彩色濾光片基板或TFT(Thin Film Transistor,薄膜電晶體)基板之透明電極上而於施加電 壓時發揮使電場畸變作用之構造物。於液晶顯示裝置中, 利用該突起而使電場產生畸變,藉此使未施加電壓時呈垂 直配向之液晶分子於施加電壓時呈傾斜配向。藉此,可實 現具有廣視角之液晶顯示裝置。 ' 如圖1及圖2所示,圖案描繪裝置丨具備:平臺3,用 作保持基板9之基板保持部;平臺驅動機構2,設置於基 座11上,使平堂3移動及旋轉;框架12及框架13,以 •跨越平臺3及平臺驅動機構2之方式固定於基座u上; 第1光照射部4,安裝於框架12上,對基板9上之感光 材料上之數個描繪區域91(參照圖3)照射光;第2光照射 部5,安裝於框架13上,對基板9上之感光材料上:非 描繪區域92(參照圖3)照射光;以及攝像部6,用以拍攝 .平臺3上之基板9。於平臺3上,保持主表面上形成有正 .型感光材料之基板,又,亦可代替該基板而保持形成 型感光材料之基板。 又’圖案描繪裝置i具備控制該等構成之控制部。圖4 312XP/發明說明書(補件)/96-12/96B1424 200819922 係連同其他構成—/if主一 堍ra 7 表不由該控制部7實現之功能之方 塊圖。控制部7蛊诵赉 ΡΑΜ ΡΠΜ η + ^吊之龟腦同樣地,形成連接有CPU、 RAM、ROM、固定禅η、粗一上 干,頒不邛及輸入部之構成,如圖4所 不’具備控制弟1杏昭紅. 〇 . ^ 先〜射邛4之弟1控制部71、以及控 制弟2光照射部5之楚〇 ^ ^ 之弟2控制部72。於圖案描繪裝置1 中,平堂驅動機構2、第】氺日々M立 外In the first aspect of the present invention, the pattern is a pixel pattern. Further preferably, the substrate is a glass substrate for a liquid crystal display device, and the positive photosensitive material is used. The pattern formed on the glass substrate is a protrusion pattern for liquid crystal alignment control. In the H-step embodiment of the present invention, the above-mentioned drawing region and the same shape as the drawing region are included in the photosensitive material. a plurality of drawing regions of the region are arranged to be spaced apart from each other in the second direction and/or the second direction. The substrate is a predetermined substrate that is chamfered according to the plurality of edge regions, and the first light is irradiated. The portion irradiates light to a portion other than the portion corresponding to the pattern in the plurality of stroke regions, and the non-drawing region other than the above-mentioned 312XP/invention specification (supplement)/96-12/96131424 9 200819922 The financial area is controlled by a light source and/or the above, and the control unit moves the above-mentioned first picture by controlling the above-mentioned first drawing area==two numbers: the first number is described When the cover portion is aligned in the direction of the upper one, the second irradiation region emits light in the upper (four) two-side/^, the radiation region f, and the second irradiation region passes through the upper polishing material second control portion to the second portion. #先材(四), finely controlled by the above-mentioned non-snaking area first cover portion, and the light is irradiated only to the above-mentioned embodiment of the present invention in the use of light, the pattern of the pattern (four) system, by the subsequent steps == : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : In the rectangular & output region of the direction, the light is irradiated outside the portion corresponding to the above-mentioned image; the second light is placed on the lens, and the non-% region around the drawing region on the photosensitive material is irradiated with light; a mechanism for transporting a substrate between the first light irradiation device and the second light irradiation device; wherein the first light irradiation device includes: a first substrate holding portion for holding the substrate; a second light source; the first light The cover part, according to the periodicity of the above pattern, will come from The light of the first light source is directed to a region in which one of the plurality of divided regions in which the drawing region is equally divided in the first direction is equal to the first region and the first region + degrees 312XP/invention specification (supplement)/96-12/96131424 ι〇200819922 area other than the corresponding part of the pattern; the first moving mechanism 'relative to upper:=! moving the above first irradiation area; and the i-th control 二 2: The first source and/or the first mask portion move the first irradiation region ′, and each time the first irradiation region and the plurality of divided regions are aligned with respect to the second direction, Γ ! = = = 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域 区域That is, the photosensitive material extends in the second direction and forms a region between the region and the non-marking region, and the second moving mechanism relatively moves the second incident region toward the first direction. ;, and the second control department, above When the irradiation region passes through the upper (10) read region and the non-slip region, by controlling the second mask portion, the region of the second irradiation region that blocks the light irradiation is changed, and the light is irradiated only to the non-trace region. . It is also an object of the present invention to provide a method of patterning a pattern using a pattern of light on a substrate. The above and other objects, features, aspects and advantages of the invention will be apparent from the accompanying drawings. [Embodiment] Figs. 1 and 2 are a side view and a plan view showing a configuration of a pattern drawing device 1 according to a first embodiment of the present invention. The pattern drawing device is a device that draws a pattern on a photosensitive material on a glass substrate 9 (hereinafter simply referred to as "substrate 9") for a liquid crystal display device. 312ΧΡ/Invention Manual (Supplement)/96-12/96131424 200819922 FIG. 3 is a plan view showing the substrate 9. On the main surface of the substrate 9, the photosensitive material which is a periodic pattern is formed into a layer shape by being partially removed in a subsequent step, and the photosensitive material is set to have a direction perpendicular to each other in the X direction in FIG. The four trace areas 91 of the rectangle in the γ direction (indicated by parallel oblique lines in Fig. 3). The four drawing areas 9i have the same shape, and are arranged on the photosensitive material in the X direction and the γ direction. On the photosensitive material on the substrate 9, a lattice-like region around the drawing region 91 (i.e., a region other than the plurality of drawing regions 91) is formed as a non-drawing region 92 in which a periodic pattern is not drawn (formed). In the following description, a portion set in the non-green area 92 of the photosensitive material and covering the entire length of the substrate 9 is referred to as a "first! non-slip area 921", and the other portions ( That is, the portion adjacent to the green area 91 in the χ direction is the "second non-described (four) field 922". In Fig. 3, the non-stripe-domain 921 and the 帛2 non-described area 922 are respectively The two-point key line indicates 曰. The substrate 9 is pre-chamfered according to the four trace areas 91: - 'The four substrates obtained from one substrate 9 are formed into _ (_ti via the subsequent step) -d_in AHgnment = ^ Vertical alignment type liquid crystal display device assembly part, that is, a color light film based on the pattern trace device!, by being formed on the substrate 9 (ie, the type of exposed portion remaining on the substrate during development) The photosensitive material, that is, the illuminating light on the resister, can describe the case formed on the color filter substrate (ie, the 'sub-pixel set). Also, in the pattern striating device, the dream is formed on the substrate 9. Positive type (ie, only non-exposed part during development; 312XP / invention manual (supplement) / 96-12/961314 24 u 200819922 The type of light remaining on the substrate) is irradiated with light, and the protrusion pattern for liquid crystal alignment control formed on the color filter substrate (ie, the collection of protrusions) may be drawn. When drawing a negative-type photosensitive material, the drawing area 91 is similarly set on the photosensitive material. The so-called protrusion for liquid crystal alignment control is used. In a liquid crystal display device, it is formed on a transparent electrode of a color filter substrate or a TFT (Thin Film Transistor) substrate, and exhibits a structure for distorting an electric field when a voltage is applied. By using the protrusions, the electric field is distorted, whereby the liquid crystal molecules which are vertically aligned when no voltage is applied are obliquely aligned when a voltage is applied. Thereby, a liquid crystal display device having a wide viewing angle can be realized. FIG. 1 and FIG. As shown, the pattern drawing device 丨 includes a platform 3 serving as a substrate holding portion for holding the substrate 9 , and a platform driving mechanism 2 disposed on the susceptor 11 to be flat 3 moving and rotating; the frame 12 and the frame 13 are fixed to the base u by means of the platform 3 and the platform driving mechanism 2; the first light irradiation part 4 is mounted on the frame 12, and the photosensitive material on the substrate 9 is The plurality of drawing regions 91 (see FIG. 3) are irradiated with light, and the second light irradiating portion 5 is attached to the frame 13, and the non-drawing region 92 (see FIG. 3) is irradiated with light on the photosensitive material on the substrate 9; The imaging unit 6 is configured to capture the substrate 9 on the platform 3. On the platform 3, a substrate on which a positive photosensitive material is formed on the main surface is held, and a substrate on which the photosensitive material is formed may be held instead of the substrate. Further, the pattern drawing device i includes a control unit that controls these configurations. Fig. 4 312XP/invention specification (supplement)/96-12/96B1424 200819922 is a block diagram showing the functions that are not realized by the control unit 7 together with other components - /if main 堍ra 7. The control unit 7蛊诵赉ΡΑΜ η η + ^ hanging the tortoise brain is similarly formed to form a CPU, RAM, ROM, fixed zen, coarse one, and the input and the input unit, as shown in Figure 4. 'There is a control brother 1 apricot red. 〇. ^ First to shoot 4 brother 1 control unit 71, and control brother 2 light irradiation unit 5 ^ ^ ^ brother 2 control unit 72. In the pattern drawing device 1, the flat hall drive mechanism 2, the first day of the day
及攝像部6由控制部7:二弟2光照射部5 傳送至控制部7。 私制。又,來自攝像部6之輸出 如圖1及圖2所示’平臺驅動機構2具備:支撐板2ι, 可旋轉二支撐平臺3;平臺旋轉機構22,於支撐板以上 以與平堂3之主表面垂直之平臺旋轉軸221為中心使平臺 3旋轉;副掃描機構23,連同支撐板21 —併於圖2中之 :方向(以下’稱為「副掃描方向」)上移動平臺3 ;底板 ,隔著副掃描機構23而將支撐板21支撐;以及主掃描 機構25,連同支撐板21及底板24 —併於圖2中之γ方 向(以下’稱為「主掃描方向」)上移動平臺3。 、平臺旋轉機構22具備設置於平臺3之(_γ)側之線性馬 達222,線性馬達222具備固定於平臺3之(_γ)侧之側面 的移動元件、以及設置於支撐板21之上表面之固定元 件於平室彡疋轉機構22中,線性馬達222之移動元件沿 著固定元件之槽而於X方向上移動,藉此平臺3以設置^ 支撐板21上之平臺旋轉軸221為中心、,於規定角度範圍 内旋轉。 副掃描機構23具備:線性馬達231,於支撐板21之下 312ΧΡ/發明說明書(補件)/96-12/96131424 14 200819922 側(即’⑼侧),於與平臺3之主表面平行且與主 向垂直之副掃描方向上延伸;以及―對導軌咖,= 馬達231之(+Y)侧及(_γ)側於副掃描方向上延伸。n焉 達如具備固定於支撐板21之下表面之移動元件:^ 設置於歧24之上表面之固定元件,該移動元件沿著固 定元件而於副掃描方向上移動,藉此,支撐板21與平臺 3 -同沿著線性馬達231及導軌232於副掃描 移動。 口上直、暴The imaging unit 6 is transmitted from the control unit 7: the second brother 2 light irradiation unit 5 to the control unit 7. Private system. Moreover, the output from the imaging unit 6 is as shown in FIGS. 1 and 2. The platform drive mechanism 2 includes a support plate 2i, a rotatable two support platform 3, and a platform rotation mechanism 22, which is above the support plate and the main body of the flat hall 3. The vertical axis of the platform rotation axis 221 is centered to rotate the platform 3; the sub-scanning mechanism 23, together with the support plate 21, and in the direction of FIG. 2 (hereinafter referred to as "sub-scanning direction"), moves the platform 3; The support plate 21 is supported via the sub-scanning mechanism 23; and the main scanning mechanism 25, together with the support plate 21 and the bottom plate 24, moves the platform 3 in the γ direction (hereinafter referred to as "main scanning direction") in FIG. . The platform rotating mechanism 22 includes a linear motor 222 provided on the (_γ) side of the platform 3, and the linear motor 222 includes a moving member fixed to the side of the (_γ) side of the platform 3, and a fixed surface provided on the upper surface of the support plate 21. In the flat chamber twisting mechanism 22, the moving member of the linear motor 222 moves in the X direction along the groove of the fixing member, whereby the platform 3 is centered on the platform rotating shaft 221 on the support plate 21. Rotate within a specified range of angles. The sub-scanning mechanism 23 is provided with a linear motor 231 on the side of the support plate 21 312 ΧΡ / invention specification (supplement) / 96-12/96131424 14 200819922 side (ie, '(9) side), parallel to the main surface of the platform 3 and The main direction extends in the sub-scanning direction of the vertical direction; and "the (+Y) side and the (_γ) side of the motor 231 extend in the sub-scanning direction. If there is a moving member fixed to the lower surface of the support plate 21: a fixing member disposed on the upper surface of the manifold 24, the moving member moves along the fixing member in the sub-scanning direction, whereby the support plate 21 Moving along with the platform 3 - along the linear motor 231 and the guide rail 232 in the sub-scan. Straight, violent
主掃描機構25具備··線性馬達251,於底板以之下側, 於與平臺3之主表面平行之轉描方向上延伸;以及一對 ^轨252 ’於線性馬達251之⑻側及⑼側於主掃描方 向上延伸。線性馬達251具備固定於底板24之下表面之 f動元件、以及設置於基座η之上表面之固定元件,藉 由,元件沿著固定元件於主掃描方向上移動,使得底 如圖2所示’第u照射部4具備沿著副掃描方向以相 :、間距(於本實施形態中為200 mm之間距)排列並安裝於 ^ 12中之數個光學頭41。又’如圖i所示,第i光照 ^部4具備連接於各光學頭41之照明光學系統“、以及 乍^光源之雷射振盪器43及雷射驅動部44。於第i光照 =°卩4中,藉由驅動各雷射驅動部44,而自雷射振盪器 杏2出脈衝光(以下,簡稱為「光」),並將其透過照明 光學系統42而導向各光學頭41。 、=4與支撐板21及平臺3—起沿著作為移動軸之線性馬 達251及導執252於主掃描方向上直線移動。 2XP/發明 _月書(補件)/96·12/96131424 15 200819922 各光學頭41具備:射出部45,使來自雷射振盪器43 之光朝向下方射出;孔徑單元46,部分地遮擋來自射出 部45之光;以及光學系統47,將通過孔徑單元46之光 導入至设置於基板9上之感光材料上。於圖案描繪装置1 中,於描繪彩色濾光片基板之像素圖案之情況及描繪用於 液晶配向控制之突起圖案之情況時,於各光學頭41中, 變更孔徑單元46之孔徑。以下,首先就描繪像素圖案時 之光孚頭41之構成進行說明,其後,就描繪突起圖案時 之光學頭41之構成進行說明。 圖5係表示孔徑單元46之一部分之俯視圖。如圖5所 不,孔徑單元46具備:第1孔徑板461,具有數個長方 形狀透光部;一對保持部462,自(+χ)侧及(_χ)侧保持第 1孔徑板461 ;以及位置調整機構463,The main scanning mechanism 25 is provided with a linear motor 251 extending on the lower side of the bottom plate in a direction parallel to the main surface of the stage 3, and a pair of rails 252' on the (8) side and the (9) side of the linear motor 251. Extending in the main scanning direction. The linear motor 251 has a moving element fixed to the lower surface of the bottom plate 24, and a fixing element disposed on the upper surface of the base n, wherein the element moves along the fixing element in the main scanning direction, so that the bottom is as shown in FIG. The "u-th illuminating unit 4" is provided with a plurality of optical heads 41 arranged in the sub-scanning direction by a phase: a pitch (200 mm in the present embodiment) and mounted in the ^12. Further, as shown in Fig. 1, the ith illumination unit 4 includes an illumination optical system "connected to each optical head 41", and a laser oscillator 43 and a laser drive unit 44 for the light source. The ith illumination = ° In the crucible 4, pulse light (hereinafter simply referred to as "light") is emitted from the laser oscillator April 2 by driving each of the laser driving units 44, and is guided to the optical heads 41 through the illumination optical system 42. The =4 and the support plate 21 and the platform 3 move linearly in the main scanning direction along the linear motor 251 and the guide 252 which are the moving axes. 2XP/Invention_月书(补件)/96·12/96131424 15 200819922 Each optical head 41 is provided with an emitting unit 45 that emits light from the laser oscillator 43 downward, and the aperture unit 46 partially blocks the emission. The light of the portion 45; and the optical system 47 introduces light passing through the aperture unit 46 onto the photosensitive material disposed on the substrate 9. In the pattern drawing device 1, when the pixel pattern of the color filter substrate is drawn and the projection pattern for liquid crystal alignment control is drawn, the aperture of the aperture unit 46 is changed in each optical head 41. Hereinafter, the configuration of the optical head 41 when the pixel pattern is drawn will be described first, and then the configuration of the optical head 41 when the projection pattern is drawn will be described. FIG. 5 is a plan view showing a portion of the aperture unit 46. As shown in Fig. 5, the aperture unit 46 includes a first aperture plate 461 having a plurality of rectangular transmissive portions, and a pair of holding portions 462 for holding the first aperture plate 461 from the (+χ) side and the (_χ) side; And a position adjustment mechanism 463,
拟之主掃描方向及副掃描方向之位置。於第】孔徑二 中,不同尺寸之3種透光部4611、4612、4613分別沿著 副掃描方向(即,X方向)以相等間距排列有數個。於本告 施形態中’透光部4611之間距、透光部4612之間距、二 透光部4613之間距互不相同。於圖5中,為了易於理解, 對第1孔徑板461之除透光部4611〜4613以外之區域 (即’遮光部)附加平行斜線。 一位置調整機構463具備:第!調整機構偏,使第^ 徑板461與-對保持部462 一同於主掃描方向上移動;一 對導執465,於第!調整機構464之下侧於副掃描方向上 延伸;以及第2調整機構’使第!孔徑板461與保持 312XP/發明說明書(補件)/96-12/96131424 16 200819922 邛462及第1調整機構464 —同沿著導軌465於副掃描方 向上移動。於本實施形態中,第1調整機構464及第2調 整機構466,係利用線性馬達。 田圖6係表示與孔徑單元46之圖5所示部分於光學上重 且之/、他σ卩分的俯視圖。如圖6所示,孔徑單元4 6更具 備:第2孔徑板467,具有數個長方形狀之透光部;一對 保持4 468 ’自(+γ)侧及(—γ)侧保持第2孔徑板‘π ;以The position of the main scanning direction and the sub-scanning direction. In the second aperture 2, three kinds of light transmitting portions 4611, 4612, and 4613 of different sizes are arranged at equal intervals in the sub-scanning direction (i.e., the X direction). In the present embodiment, the distance between the light transmitting portions 4611, the distance between the light transmitting portions 4612, and the distance between the two light transmitting portions 4613 are different from each other. In Fig. 5, for the sake of easy understanding, parallel oblique lines are added to the regions other than the light transmitting portions 4611 to 4613 of the first aperture plate 461 (i.e., the 'light shielding portions'). A position adjustment mechanism 463 is provided with: The mechanism is biased so that the first diameter plate 461 and the pair of holding portions 462 move together in the main scanning direction; a pair of guides 465, in the first! The lower side of the adjustment mechanism 464 extends in the sub-scanning direction; and the second adjustment mechanism makes the first! The aperture plate 461 and the holding 312XP/invention specification (supplement)/96-12/96131424 16 200819922 邛 462 and the first adjustment mechanism 464 move in the sub-scanning direction along the guide rail 465. In the present embodiment, the first adjustment mechanism 464 and the second adjustment mechanism 466 utilize a linear motor. The field diagram 6 shows a plan view of the portion shown in Fig. 5 of the aperture unit 46 which is optically heavy and/or σ. As shown in FIG. 6, the aperture unit 46 further includes a second aperture plate 467 having a plurality of rectangular light-transmissive portions, and a pair of holdings 4 468' from the (+γ) side and the (-γ) side to the second. Aperture plate 'π;
j第3調整機構469,使第2孔徑板467與一對保持部 一同於副掃描方向上移動。於本實施形態中,第3調整機 構469,係利用線性馬達。 f 2孔徑板467、保持部468及第3調整機構469配置 於第1孔徑板46;1、保持部462(參照圖3)及位置調整機 構463之上方,固疋於位置調整機構Mg之第1調整 似上。帛!孔徑板術與第2孔徑板樹配置 共輛之位置。於第2孔徑板樹中,分別對應於第工孔^ 板461之數個透光部4611〜4613之尺寸不同的3種透光 部4671、4672、4673係分別沿著副掃描方向(即,χ方向) 而以相等間距排列有數個。於圖6 +,為了圖式易於理 解,利用虛線來描繪位置調整機構463及第丨孔徑板 之透光部刪〜4613。又,對第2孔徑板術之工除透光 部4671〜4673以外之區域附加平行斜線來表示。 如圖 所示,當自雷射振盪器43透過射出部45(表昭 圖1)而射出之光的照射區域451(圖6 +,以二點鍵線來 表示)中配置有第2孔徑板467之透光部4673以及盥透光 312ΧΡ/發明說明書(補件)/96-12/96131424 17 200819922 部4673部分重疊之第1孔徑板461的透光部4613時,來 自射出部45之光僅通過透光部4673與透光部4613重疊 之區域(以下,稱為「光罩設定透光部」),並透過光學系 統47 (芩照圖1 ),如圖7所示,導入至基板9上之數個長 方形狀之照射區域931。於以下說明中,將數個照射區域 9 31統稱為「照射區域9 3」。The third adjustment mechanism 469 moves the second aperture plate 467 together with the pair of holding portions in the sub-scanning direction. In the present embodiment, the third adjusting mechanism 469 uses a linear motor. The f 2 aperture plate 467, the holding portion 468, and the third adjustment mechanism 469 are disposed above the first aperture plate 46; 1, the holding portion 462 (see FIG. 3) and the position adjustment mechanism 463, and are fixed to the position adjustment mechanism Mg. 1 adjustment seems to be. silk! The position of the aperture plate and the second aperture tree configuration. In the second aperture plate tree, three kinds of light transmitting portions 4671, 4672, and 4673 having different sizes corresponding to the plurality of light transmitting portions 4611 to 4613 of the first hole plate 461 are respectively along the sub-scanning direction (ie, χ direction) and several are arranged at equal intervals. In Fig. 6 +, for the sake of easy understanding of the drawings, the position adjusting mechanism 463 and the light transmitting portion of the second aperture plate are deleted by a broken line. Further, in the second aperture plate, the areas other than the light transmitting portions 4671 to 4673 are indicated by parallel oblique lines. As shown in the figure, the second aperture plate is disposed in the irradiation region 451 (shown by the two-point key line) of the light emitted from the laser oscillator 43 through the emitting portion 45 (shown in FIG. 1). The light-transmitting portion 4673 of the 467 and the light-transmissive portion 4613 of the first aperture plate 461 partially overlapped by the portion 4673 and the light-transmitting portion 4613 of the first aperture plate 461 partially overlapped by the portion 4673, the light from the emitting portion 45 is only A region in which the light transmitting portion 4673 overlaps the light transmitting portion 4613 (hereinafter referred to as a "mask setting light transmitting portion") is transmitted through the optical system 47 (see FIG. 1), and is introduced into the substrate 9 as shown in FIG. A plurality of rectangular illumination areas 931 are provided. In the following description, a plurality of irradiation regions 9 31 are collectively referred to as "irradiation regions 9.3".
―於圖案描繪裝置1中,藉由調整第2孔則反467相對於 第1孔徑板461在副掃描方向的相對位置,來變更導入至 基板9上之光的副掃描方向之寬度(即,數個照射區域咖 各自之寬度)°又’藉由在主掃描方向上移動第丨孔徑板 及第2孔徑板467,且於來自射出部仏之光之照射區 域451中配置透光部46n、4671或透光部4612、術2, 來變更基板9之照射區域931之大小或間距等。In the pattern drawing device 1, the width of the sub-scanning direction of the light introduced into the substrate 9 is changed by adjusting the relative position of the first aperture 467 with respect to the first aperture plate 461 in the sub-scanning direction (ie, The width of each of the plurality of irradiation areas is further shifted by the movement of the second aperture plate and the second aperture plate 467 in the main scanning direction, and the light transmission portion 46n is disposed in the illumination region 451 of the light from the emission portion 4671 or the light transmitting portion 4612, 2, to change the size or pitch of the irradiation region 931 of the substrate 9.
於圖1所示之圖案騎裝置i中,利用圖4所示之控制 部7之第1控制部71控制平臺驅動機構2及第i光昭射 部4,而使基板9與平臺3 一同於⑼方向上移動,並且 對移動中之基板9之數個描繪區域91(參照圖_射光。 換言之,於基板9之數個描繪區域91上,—邊相對 板9上之感光材料於(—γ)太& 土 pq •方向上相對地移動照射區域 戈93照射光。1^ ^ 案。 、主知描方向平行延伸之條紋狀圖 次移動結束,則於停止光 3 一同於副掃描方向上僅 當平臺3朝向主掃描方向之一 照射之狀態下,使基板9與平臺 312ΧΡ/發明說明書(補件)/96-12/96131424 18 200819922 定^離(於本實施形態中,4 50職),其後一邊於 9、,-二,描相反之方向(即’(_Υ)方向)上移動基板 . 、恥射區域93照射光。於本實施形態中,以於夂 主掃夹隔副掃描之方式進行4次主掃描,藉此於基: 之感光材料上之數個描㈣域91上,僅對與像素圖案 對應之部分照射光而描緣像素圖案,而於後續步驟中實施 顯影處理,藉此將感光材料之非曝光部分自基板上去除而 修形成彩色濾光片基板之數個子像素。 其次’就描繪用於液晶配向控制之突㈣案時之各光學 碩41之構成加以說明。於描緣突起圖案時,第^光照射 部=之各光學頭41中’拆下圖5及圖6所示孔徑單元、铛 2 1孔徑板461及第2孔徑板467,並如圖8所示,於 安裝有第1孔徑板461之保持部462上安裝第3孔徑板 461a。再者,於此情形時,保持部468(參照 裝孔徑。 ♦如圖8所示,第3孔徑板461a具有與—部分突起圖案 對應之數個圓形遮光部4614,遮光部4614以外之區域成 為用以透光之透光部。於第3孔徑板461a中,遮光部4614 於主掃描方向(即,Y方向)上排列成2行,於各行中,多 個遮光部4614沿著副掃描方向(即,χ方向)以相等間距 .而排列。於圖8中’為了圖式易於理解,對遮光部4614 附以平行斜線而表示。再者,於圖8中,為了便於圖示, 將遮光部4614之間距增大且所描繪之個數少於實際個 數0 312ΧΡ/發明說明書(補件)/96-12/96131424 19 200819922 中自雷射振盪器43透過射出部45(參 T圖υ而射出之光照射至第3孔徑板她 孔徑板461a而對該光加以部分遮擋3 部45之光自描緣區域91上於 ^ ^自射出 2射£域,導人至除對應於突起圖案之部分以外之區 荦”:、二一個_域91之-部分之俯視圖。於圖 荼細繪裝置1中,利用篦1M o^ 先a射邛4之數個光學頭41, 於副掃描方向上以相 於本實施形態μ刚域上^ 於=兒= 射區域941之副掃描方向之長度設為5〇咖。 =於圖9中,對照射區域94中之非曝光區域加以塗里 而表不’又,以細線圓來表示與描 : rr部分911。再者,於圖9中,為便於圖= 、、曰之圓形部分911之個數少於實際個數。 如圖9所不’照射區域94之主掃描方 =咖圖案之週期性而對描繪區域91=) 形,分割區物圖9中利用二點鍵: 末表”不)之一個分割區域之主掃描方向之長度相等。於第 日部4中’利用數個光學頭41之第3孔徑板461a(參 j 8)’而將來自射出部45之光導 與突起圖案對應之部分以外的區域。 中除 πχρ/發明說明書(補件)/96_12/96131424 20 200819922 ,圖1所示之圖案描繪裝置1中,利用控制部7之第i 控制部71來控制平臺驅動機構2、以及作為第上光昭射 部4之光源的雷射振盈器43及雷射驅動部44,藉此,基 Γ= 臺Γ同於(+γ)方向上移動’且對移”之基: 的數個“區域91間歇性地照射光。具體而言,於基 板9之感光材料上’相對於描綠區域91於主掃描方向二 相對地連續移動照射區域94,並且每當照射區域%分別 與數個分割區域912關於主掃描方向一致時(即,每 個照射區域941之(-Υ)侧邊緣與一個分割區域912之(田一γ) 側邊緣重疊時),透過孔徑單元46之第3孔徑板4仏而 對照射區域94瞬間照射光。藉此,可於各描繪區域91中, 使感光材料上除數個圓形部分911以外之區域曝光。再 者’於圖案描繪裝置1中,亦可每當照射區域94盥分苟 區域912關於主掃摇方向一致時,停止基板9之移動,並 對停止過程中之基板9照射光。 於圖案描輕置1中,與錢像素圖案時同樣地,以於 各主掃描間插入副掃描之方式進行4次主掃描,藉此於基 板9之感光材料上之數個描繪區域91上,僅對突起圖^ 以外之部分照射光來描繪突起圖案’而藉由在後續步驟中、 實施顯影處理,將感光材料之曝光部分自基板上去除而形 成大致圓柱狀(例如,圓錐台狀)之用於液晶配向控制之^ 起。 尺 其次,說明第2光照射部5。如圖!及圖2所示,第2 光照射部5具備作為光源之高M水銀燈(以下,簡稱為「水 312XP/發明說明書(補件)/96-12/96131424 21 200819922 銀燈」)51、以及部分地遮擋來自水銀燈51之光的孔徑單 兀52,又,如圖1所示,具備將通過孔徑單元52之光導 .向被設置於基板9上之感光材料上之光學系统53。於圖 _案描繪裝置1中,當描繪上述突起圖案時,自第2光照射 部5對形成於基板上之正型感光材料照射光。 圖10A係表示孔徑單元52之俯視圖。如圖1〇A所示, 孔徑單兀52具備:第4孔徑板521,具有於副掃描方向 鲁上延伸之細長方形之開口 5211; 一對保持部522,自(+χ) 側及(-Χ)侧保持第4孔徑板521 ;位置調整機構523,調 整第4孔徑板521之主掃描方向及副掃描方向之位置;遮 光板524,配置於第4孔徑板521之上方;一對保持部 525,自(+Χ)侧及(-Χ)側保持遮光板524;以及遮光板移 動機構526,使遮光板524與一對保持部525 一同於主掃 描方向上移動。 位置調整機構523與圖5所示之位置調整機構463大小 ⑩不同,但構造相同,其具備:第4調整機構527,使第4 孔徑板521與一對保持部522 一同於主掃描方向上移動; 一對導執528 ’在第4調整機構527之下侧於副掃描方向 上延伸;以及第5調整機構529,使第4孔徑板521與保 持部522及第4調整機構527 —同沿著導轨528於副掃描 • 方向上移動。於本實施形態中,作為第4調整機構527及 • 第5調整機構529、以及遮光板移動機構526,係利用線 性馬達。遮光板移動機構526固定於位置調整機構523之 第4調整機構527上。於圖10Α中,為了圖式易於理解, 312ΧΡ/發明說明書(補件)/96-12/96131424 22 200819922 對第4孔徑板521之除開口 5211以外之區域(即,遮 以及遮光板524附加平行斜線而表示。 … 遮光板524具備:本體部…卜可藉由保持部奶而 保持兩侧之邊緣;以及兩個突出部52 =突二兩個突―為長方形板 :== 孔徑單元52,’藉由遮光板移動機 構526於(-Υ)側移動遮光板524,而如圖⑽所示 ^彳之突出部洲與第彳孔徑板切之開口奶 重豐。 1刀 如圖10Α所示,於遮光板524之突出部5242盥 之開口 52U未重疊之狀態下,水銀燈= 圖1)所射出之光通過開口 52U,而如圖11Α所示,導至 基板9上於副掃描方向上延伸之長方形狀之一個照射區 :95。照射區域95之副掃描方向之長度與基板&副; “方向之長度(即’第1非描繪區域921之副掃描方向之 長度)相等,照射區域95於副掃描方向上橫截感光材料上 之兩個描繪區域91及非描繪區域92。 又,如圖10Β所示,於遮光板524之突出部5242與第 4孔徑板521之開口 5211重疊之狀態下,自水銀燈51、所 射出之光通過開口 5211中未與突出部5242重疊之部分, 而如圖11Β所示,導至基板9上於副掃描方向上排列之長 方形狀之三個照射區域95a。三個照射區域95a之副掃^ 方向之長度分別與所對應之第2非描繪區域922的副掃2 方向之長度相等。 田 312XP/發明說明書(補件)/96-12/96131424 23 200819922 部7之第2 ϋΓ案描緣裝置1中,利用圖4所示之控制 邱5而祛/ ”2控制平臺驅動機構2及第2光照射 仆而使基板9與平臺卜㈣⑻方向上移動,並對 :動中之基,9之非描緣區域92照射光。具體而言,當 土板9上之第!非描繪區域921(即,非描 蓋基板9之副掃描方向全長而設定之部分)通過; 之下方時’如圖⑽所示’形成遮光板524之突出' =242未與第4孔捏板521之開口 5211重疊之狀態而 對覆蓋基板9之副掃描方向之全長的照射 &域9 5照射光。 二’:二板9上之第2非描繪區域922(即,非描繪區 =中除弟i非描繪區域921以外之部分)及描繪區域 广匕弟2光照射部5之下方時,如圖10B所示,形成 反,之突出部_與第4孔徑板521之開口 5211 主之狀L 1¾如圖丨1B所示’對於副掃描方向上排列之 二=照射區域95a照射光。換言之,當照射區域95通過 :、'區二91及_區域92時,藉由第2控制部72控 二孔仅單tl 52 ’變更照射區域95中遮擔照射光之區域, 猎此使光僅知射於感光材料上之非描缘區域92。 ^處,若將第/光照射部4之孔徑單元46設為第^ ^ ’又’將弟2光照射部5之孔徑單元52設為第2光 ^甘則轉描機構25兼作第1移動機構及第2移動機 古’、中該第1移動機構相對於描缘區域91而朝主掃描 «相對地和動第1光罩部之第i照射區域即照射區域 312XP/發明說明書(補件)/96-12/96131424 24 200819922 94,該第2移動機構相對 地移動第2光罩部之第=先「材料而朝主掃描方向相對 又,第丨光照射部4:夂2 = σ无予碩41之雷射振盡哭及帝 射驅動部44成為朝向第 田㈣盈-43及田 2光照射部5之水二5 =射出光之第1光源,第 第2光源。 51成為朝向第2光罩部射出光之 明其會裝置1描㈣素圖案之流程加以說 二素圖案之流程圖。於描緣像素圖案時, 即’數個描繪區域91及格子狀非描 、“域92)上塗佈有負型感光材料之基板9載置於平臺3 上,、且吸附並保持於平臺3之主表面上(步驟311)Γ :、、'後矛!1用拴制。(5 7控制攝像部6之四個對準相機 (a igmnent camera)61(參照圖丨及圖 2), 9上之四個角部附近之對準標記(省略圖示)進行拍攝1 且’利用控制部7’根據來自攝像部6之輸出 驅動機構2’藉此使平臺3於主掃描方向及副掃描方:: 移動亚且以平臺旋轉軸221為中心旋轉。藉此,基板9位 於描緣開始位置(步驟S12 )。 若基板9之對準結束,則利用控制部7之第!控制 71控制第1光照射部4,開始光之照射,且利用孔徑單°一 46部分地遮擋該光,藉此將光導向基板9上之 上與光罩設定透光部對應之照射區域93(㈣如)先材枓 其次,利用控制部7控制平臺驅動機構2,使平臺3開 始向(+Y)方向移動(步驟S14),照射區域93於(_〇方= 312XP/發明說明書(補件)/96-12/96131424 25 200819922 t相對於感光材料相對地進行主掃描,藉此將條紋狀圖案 心繪於基板9上之感光材料上。而且,當照射區域⑽之 .主掃描到達規定之移動結束位置(即,(_γ)侧描!會區域91 *之(-Υ)側邊緣)時,停止平臺3及基板9之移動(步驟 S15)並停止光之照射(步驟S16)。再者,於圖案描繪裝 置1中,當位於(+γ)側描繪區域91與(_¥)側描繪區域Μ 之間的第2非描綠區g 922通過第】光照射部4之下方 鲁枯暫止來自第1光照射部4之光的照射。 當對基板9上之感光材料的第1次主掃描結束時,確切 是否繼續對基板9描!會圖案(即,有無下一主掃描)(步: S17)。當存在下一掃描時,利用副掃描機構23使基板9 朝副掃描方向移動(步驟S171),並回到步驟S13,開始朝 基板9照射光,以及使平臺3朝(_γ)方向移動(步驟gig、 S14)。然後,於(-γ)側之移動結束位置,使平臺3之移動 及光之照射停止(步驟S15、S16)。 •=圖案描繪裝置1中,一邊向基板9照射光一邊進行之 平臺3朝主掃描方向之移動(即,對於基板9上之感光材 料的肊射區域93之主掃描),以於各主掃描間夾隔平臺3 朝副掃描方向移動之方式而僅重複規定次數(於本實=形 態中為4次)(步驟S13〜S17、S171)。然後,當於基板9 上之感光材料上描繪整個條紋狀像素圖案(步驟S17)時, •結束圖案描繪裝置1之描繪動作。於描繪有像素圖案之基 板9中,藉由在後續步驟中實施顯影處理,自基板二去^ 感光材料之非曝光部分而形成數個子像素。上述處理針對 312ΧΡ/發明說明書(補件)/96-12/96131424 26 200819922 子像素之各色重複進行,而形成RGB(Red Green Blue, 紅綠藍)3色之彩色阻劑圖案。 • 其次’就利用圖案描繪裝置1描繪突起圖案之流程加以 ^ σ兒明。圖13A及圖13B係描繪突起圖案之流程圖。於圖案 描繪裝置1中,如圖13A所示,對基板上之正型感光材料 妝射來自第1光照射部4之光後,如圖13B所示,照射來 自第2光照射部5之光。 ⑩絡T描繪突起圖案時,首先,將整個主表面(即,數個描 繪區域91及格子狀非描繪區域92)上塗佈有正型感光材 料之基板9保持於平臺3上之後,與上述步驟S12同樣 和用平臺驅動機構2朝描緣開始位置移動(步驟S21、 S22)。於圖案描繪裝置i中,於第】光照射部4之孔徑單 元46中,將第1孔徑板461及第2孔徑板預先變更 為弟3孔控板4 61 a。 若基板9之對準結束,則藉由控制部7之第1控制部 • γ控制主掃描機構25,於未自第i光照射部4之雷射振 盪器43照射光之狀態(即,熄滅狀態)下,使基板=開始 朝⑻方向移動’使照射區域94相對於描繪區域91朝 方向相對地移動(步驟S23)。 然後,當照射區域94與分割區域912關於主掃描方向 一致時’利用帛1控制部71來控制第1光照射部4田之二 射驅動部44’自雷射振盪器43瞬間射出光,並】 兀46部分地遮播該光,藉此,於位於感光材料工 之兩個描繪區域91之各個區域 入(即,照射) 312XP/發明說明書(補件)/96·】2/96! 3】424 27 200819922 側之分割區域912上之照射區域%(即, 如ΓΙ區血域912關於主掃描方向一致之數個照射區域 丄用突:圖案對應之部分以外之部分(步驟洲。 制部7’確認光照射結束之分割區域912 = (-Y)侧疋否存在未照射之分割區域91 =區:9_叫當存在下一分割區域9;;下時, 驟:用=機構25繼續移動基板9之狀態下返回至步 照射_與下一分割區域912關於主掃 ==-致1透過孔徑單元46之第3孔徑板如 =域94中除與突起圖案對應之部分以外照射光(步驟 當照射區域94之主掃㈣達規定之移動 二射光時(即,當位於感光材料之⑼侧之兩個描: 或91之各個區域上,朝位於最靠⑼侧之分割區域犯 之先照射結束時),停止平臺3及基板9之移動(步驟奶、 2對基板9上之感光材料之第1次主掃描結束時,確認 疋否㈣對基板9描_案(即,有無下— Γ)。當存在下-婦描之情形時,利用副掃描機= 土板9朝副知描方向移動(步驟S271),並返回至步驟犯3 :基板9開始朝(_Y)方向移動,直至照射區域94之 “到達(+Y)側移動結束位置而結束平臺3朝主掃描方向 =移動為止,每當照射區域94與分割區域912關於主掃 “方向一致時,對照射區域94中除與突起圖案對應之部 312XP/胃明說明書(補件)/96·12/96131424 28 200819922 分以外照射光(步驟S23〜S26)。 於圖案描緣裝置j中一、蠢、 •瞬間性的光-邊進行之孚一基板9重複照射間歇性且 .對基板9上之感先二::二掃描方向之移動(即, 主掃描間夾隔平,以於各 複規定次數(於本實施4 之==2僅7重 S271)。然後,當於基板9上 卜 •起圖㈣(步驟㈣上料完整個突 #列描緣動作。 ^束仙弟1光照射部4之-系 當立第1光照射部4之描緣結束時,利用控制部7之第2 控制邓72來控制平臺驅動機 射部5之描_置移動動:二= 嬰^ ^ , 籾% S3D。於該描繪開始位 第之非描綠區域92之(+γ)側之邊緣位於 H。此時’於第2光照射部5之孔徑 儿 形成遮光板524之突出部5242與第4孔徑板 φ 52丨之開口 5211未重疊之狀態(參照圖i〇a)。 然後,利用第2控制部72控制第2光照射部5而開如 照射光,並利用孔徑單元52之第4孔徑板52ι來部分^ 遮擋該光’藉此於感光材料上之最靠⑽側之第i非描绔 區域921上,將光導至對應於開口 5211且於副掃描方^ 上延伸之長方形狀之一個照射區域95(步驟S32)。昭射區 .域95於基板9上覆蓋第1非描繪區域921之副掃描'方: 之全長。 其次,利用第2控制部72控制主掃描機構25而使平臺 312χΡ/發明說明書(補件)/96-12/96131424 29 200819922 3,開始向( + Y)方向移動(步驟卿,照射區域95相對於感 =材料,(-Y)方向上相對地進行主掃描。然後,於感光材 .;斗上之最靠(+Y)侧之第1非描繪區域921上於(_γ)方向上 .相對地移動之照射區域95,若到達該第!非描緣區域921 與鄰接於第1非描綠區域921之(_γ)側之第2非描綠區域 ”2之間的邊界(即’若照射區域95之(_γ)侧之邊緣與該 f 1非描綠區域921之(-Υ)侧的邊緣重疊),則於第2光 籲照射部5之孔徑單元52中,利用帛2控制部72來控制遮 光板移動機構526,使遮光板524朝(-Y)方向移動,而使 遮光板524之突出部5242與第4孔徑板521之開口 “η 部分地重疊(參照圖10B)。藉此,變更來自水銀燈Η之 光的照射區域中遮播光照射之區域,將於基板9上之感光 f料上於(-Y)方向上相對移動之照射區域,自形狀對應於 第1非描緣區域921之照射區域95變更為形狀對應於第 2非描繪區域922之三個照射區域95a(參照圖11B)。 .三個照射區域95a於感光材料上之(+γ)侧之第2非描繪 區域922上,於(-γ)方向上相對地移動。而且,若照射區 域95a到達該第2非描繪區域922與鄰接於第2非描繪區 域922之(_Y)侧之第丨非描繪區域921之間的邊界(即, 若各照射區域95a之(-Υ)側之邊緣與第2非描繪區域犯2 之(-Y)侧的邊緣重疊),則於第2光照射部5之孔徑單元 .52中’利用第2控制部72來控制遮光板移動機構工526, 使遮光板524向(+Y)方向移動,而使遮光板524之突出部 5242自第4孔徑板521之開口 5211上退避(參照圖1〇A)。 312XP/發明說明書(補件)/96-12/96131424 200819922 精此’變更來自水銀燈51之光照射區域中遮擋光照射之 ^域’使照射區域之形狀自三個照射區域❿變更為對應 :開口 5211之一個照射區域95(參照圖丄1 a)。 ’於圖案犏I冒裝置i中,繼續一邊對感光材料照射光一邊 進行照射區域(即,照射區域95或照射區域心)之主掃 七田’直至平臺3到達規定移動結束位置為止,每當照射區 域到,第^非描綠區域921與第2非描繪區域㈣之間的 鲁邊界時,變更照射區域中遮擔光照射之區域,切換照射區 域95與照射區域95a(步驟S34)。藉此,於基板9上之感 光=料上二僅對非描繪區域92照射來自水銀燈51之光。 '、、、而藉由如射區域95、95a之主掃描,對整個非描繪 區域92照射光’當基板9到達移動結束位置時,停止平 至3及基板9朝主掃描方向之移動(步驟S35),並停止光 之照射(步驟S36)。如此,於感光材料上除與突起圖案對 應之部分以外之整體已照射光之基板9中,藉由在後續步 ♦驟中實施顯影處理,自基板上去除感光材料之曝光部分而 形成用於液晶配向控制之數個突起。 如以上所述,於圖案描繪裝置〗中,對基板9上之正型 f光材料描繪突起圖㈣,藉由利用第!控制部71㈣ 第1光照射部4,而使描緣區域91之數個分割區域912 之-個分割區域與主掃描方向之長度相等之照射區域Μ 於主掃描方向上相對地移動,並且每當照射區域94與分 割區域912 —致時,對照射區域94照射瞬間的光。藉/此二 當對大型基板9描繪突起圖案時,亦可不使用與基板9同 312Xp/發明說明書(補件)/96-12/96131424 31 200819922 等大小之大型光罩,而容易地對描繪區域91描繪突起圖 案。 •木又,藉由利用第2控制部72控制第2光照射部5,每 ,备來自水銀燈51之光的照射區域到達第1非描繪區域921 與第2非描繪區域922之間的邊界時,變更該照射區域中 ^擋光照射之區域,切換照射區域95與照射區域95a。 藉此,於感光材料上,可不對描繪區域9丨照射光(即,不 _會對描繪區域91造成影響),而容易地僅對形狀隨著主掃 描方向位置而變化之非描繪區域92照射光。因此,可謂 圖案杬繪裝置1尤其適用於對基板整體必然大型化並且 非柄區域形狀複雜之經多倒角乏基板的圖案描繪。 近年來,由於液晶顯示裝置之尺寸大型化,故可不使用 大型光罩而容易地描繪圖案之圖案描繪裝置丨,尤其適用 於對液晶顯示裝置用之玻璃基板描繪圖案。又,由於可容 易地僅對非描繪區域92照射光,故尤其適用於利用正型 _感光材料而形成之用於液晶配向控制之突起圖案的描繪。 於圖案描繪裝置1中,對基板9上之負型感光材料描繪 像素圖案時,利用用以描繪突起圖案之第1光照射部4, 僅對描繪區域91中與像素圖案對應之部分照射光。藉 此’可一邊使圖案描繪裝置1之構造簡化,一邊對負型及 正型感光材料描繪圖案。 • 通常,於液晶顯示裝置用之彩色濾光片基板中,在利用 正型感光材料形成用於液晶配向控制之突起圖案之前,先 利用負型感光材料形成像素圖案或黑色矩陣(black 312xp/發明說明書(補件)/96-12/96131424 32 200819922 ^ 對貞型及正型感光材料之描繪可藉由簡單之 2進行,故尤其適用於對液晶顯示裝W之彩色渡 基板的像素圖案等描繪。In the pattern riding apparatus i shown in FIG. 1, the first driving unit 7 of the control unit 7 shown in FIG. 4 controls the stage driving mechanism 2 and the i-th light emitting unit 4, so that the substrate 9 and the stage 3 are together with (9). Moving in the direction, and drawing a plurality of drawing areas 91 on the moving substrate 9 (refer to the figure _lighting. In other words, on the plurality of drawing areas 91 of the substrate 9, the side is opposite to the photosensitive material on the board 9 at (-γ) Too & soil pq • The direction of the illumination area is relatively moved by the illumination area 93. 1^ ^ Case. When the stripe-shaped map movement in which the main direction of the drawing is parallel is completed, the stop light 3 is also in the sub-scanning direction. When the platform 3 is irradiated toward one of the main scanning directions, the substrate 9 is separated from the platform 312 ΧΡ / invention manual (supplement) / 96-12/96131424 18 200819922 (in the present embodiment, 4 50 positions), Then, the substrate is moved in the opposite direction (ie, the '(Υ) direction) in the opposite direction (ie, the '(Υ) direction). The shame area 93 illuminates the light. In the present embodiment, the main scanning layer is scanned by the sub-scan. The method performs 4 main scans, thereby using a plurality of traces (four) domains on the photosensitive material 91, only the portion corresponding to the pixel pattern is irradiated with light and the pixel pattern is drawn, and in the subsequent step, development processing is performed, thereby removing the non-exposed portion of the photosensitive material from the substrate to form a color filter substrate. Next, a description will be given of the configuration of each of the optical masters 41 in the case of the projection of the liquid crystal alignment control. When the projection pattern is drawn, the optical irradiation portion of the optical illumination unit 41 is removed. As shown in FIG. 8, the aperture unit, the 孔径21 aperture plate 461, and the second aperture plate 467 are attached to the holding portion 462 to which the first aperture plate 461 is attached, and the third aperture plate 461a is attached. In this case, the holding portion 468 (see the mounting aperture). As shown in FIG. 8, the third aperture plate 461a has a plurality of circular light shielding portions 4614 corresponding to the partial projection patterns, and regions other than the light shielding portion 4614. In the third aperture plate 461a, the light shielding portions 4614 are arranged in two rows in the main scanning direction (ie, the Y direction), and in each row, the plurality of light shielding portions 4614 are scanned along the sub-scan. The directions (ie, the χ direction) are arranged at equal intervals. In Fig. 8, 'the figure is easy to understand, and the light shielding portion 4614 is indicated by parallel oblique lines. In addition, in FIG. 8, for convenience of illustration, the distance between the light shielding portions 4614 is increased and the number of depictions is less than The actual number 0 312 ΧΡ / invention manual (supplement) / 96-12/96131424 19 200819922 from the laser oscillator 43 through the injection portion 45 (the light emitted by the reference T is irradiated to the third aperture plate her aperture plate 461a The light partially blocking the three portions 45 of the light is self-exposed from the fringe region 91, and is guided to a region other than the portion corresponding to the pattern of the protrusions::, two fields Top view of the 91-part. In the drawing device 1 , a plurality of optical heads 41 of 邛 1M o ^ first a 邛 4 are used in the sub-scanning direction in the sub-scanning direction. The length of the sub-scanning direction is set to 5 〇. In Fig. 9, the non-exposed areas in the illumination area 94 are painted and not shown, and the rr portion 911 is represented by a thin line circle. Furthermore, in Fig. 9, the number of circular portions 911 for the convenience of Fig. =, 曰 is less than the actual number. As shown in Fig. 9, the main scanning side of the irradiation area 94 = the periodicity of the coffee pattern and the drawing area 91 =), the dividing area object 9 uses the two-point key: the last table "no" is the main part of the divided area The length of the scanning direction is equal. In the first day portion 4, 'the third aperture plate 461a (refer to j 8)' of the plurality of optical heads 41 is used, and the light guide from the emitting portion 45 is a region other than the portion corresponding to the projection pattern. In addition to the πχρ/invention specification (supplement)/96_12/96131424 20 200819922, in the pattern drawing device 1 shown in Fig. 1, the i-th control unit 71 of the control unit 7 controls the stage driving mechanism 2 and as the first light illuminating The laser vibrator 43 and the laser driving unit 44 of the light source of the portion 4, whereby the base Γ = the same as the base in the (+ γ) direction and the "shift" group: Specifically, the light is irradiated on the photosensitive material of the substrate 9 in a relatively continuous manner with respect to the green area 91 in the main scanning direction, and each time the irradiation area % is associated with the plurality of divided areas 912, respectively. When the main scanning directions are the same (that is, the (-Υ) side of each of the irradiation areas 941 When the edge overlaps with the (Tianyi γ) side edge of one of the divided regions 912, the third aperture plate 4 of the aperture unit 46 is used to instantaneously illuminate the illumination region 94. Thereby, in each of the drawing regions 91, The photosensitive material is exposed in areas other than the plurality of circular portions 911. Further, in the pattern drawing device 1, the movement of the substrate 9 may be stopped each time the irradiation region 94 and the branching region 912 coincide with respect to the main scanning direction. The substrate 9 is irradiated with light during the stop process. In the same manner as in the case of the money pixel pattern, the main scanning is performed four times by inserting the sub-scan between the main scanning lines, thereby performing the main scanning on the substrate 9. On the plurality of drawing areas 91 on the photosensitive material, only the portion other than the protrusion pattern is irradiated with light to draw the protrusion pattern', and by performing development processing in the subsequent step, the exposed portion of the photosensitive material is removed from the substrate. The liquid crystal alignment control is formed in a substantially columnar shape (for example, a truncated cone shape). Next, the second light irradiation unit 5 will be described. As shown in Fig. 2 and Fig. 2, the second light irradiation unit 5 is provided as a light source. High M mercury lamp (Hereinafter, it is simply referred to as "water 312XP/invention specification (supplement)/96-12/96131424 21 200819922 silver lamp") 51, and an aperture unit 52 partially blocking the light from the mercury lamp 51, and, as shown in Fig. 1, The optical system 53 is provided with a light guide that passes through the aperture unit 52 toward the photosensitive material disposed on the substrate 9. In the drawing device 1 of the drawing, when the projection pattern is drawn, the positive photosensitive material formed on the substrate is irradiated with light from the second light irradiation portion 5. FIG. 10A is a plan view showing the aperture unit 52. As shown in FIG. 1A, the aperture unit 52 has a fourth aperture plate 521 having a thin rectangular opening 5211 extending in the sub-scanning direction; a pair of holding portions 522 from the (+χ) side and (- The fourth aperture plate 521 is held by the side, and the position adjustment mechanism 523 adjusts the positions of the fourth aperture plate 521 in the main scanning direction and the sub-scanning direction; the light shielding plate 524 is disposed above the fourth aperture plate 521; and a pair of holding portions 525, the light shielding plate 524 is held from the (+Χ) side and the (-Χ) side, and the light shielding plate moving mechanism 526 moves the light shielding plate 524 together with the pair of holding portions 525 in the main scanning direction. The position adjustment mechanism 523 is different in size from the position adjustment mechanism 463 shown in FIG. 5, but has the same structure. The fourth adjustment mechanism 527 is provided to move the fourth aperture plate 521 together with the pair of holding portions 522 in the main scanning direction. The pair of guides 528' extend in the sub-scanning direction on the lower side of the fourth adjustment mechanism 527; and the fifth adjustment mechanism 529 causes the fourth aperture plate 521 to be along with the holding portion 522 and the fourth adjustment mechanism 527. The guide rail 528 moves in the sub-scanning direction. In the present embodiment, a linear motor is used as the fourth adjustment mechanism 527 and the fifth adjustment mechanism 529 and the light shielding plate moving mechanism 526. The visor moving mechanism 526 is fixed to the fourth adjusting mechanism 527 of the position adjusting mechanism 523. In FIG. 10A, for the sake of easy understanding of the drawings, 312 ΧΡ / invention specification (supplement) / 96-12/96131424 22 200819922 for the fourth aperture plate 521 except the opening 5211 (ie, the cover and the visor 524 are added in parallel) It is indicated by oblique lines. The visor 524 is provided with: a body portion ... which can hold the edges of both sides by holding the milk; and two protrusions 52 = two protrusions - a rectangular plate: == aperture unit 52, 'The visor 524 is moved by the visor moving mechanism 526 on the (-Υ) side, and as shown in Fig. 10, the embossing section of the 部 部 与 与 与 与 与 与 。 。 。 。 。 。 1 1 1 1 1 1 1 1 1 1 1 1 1 In a state where the opening 52U of the protruding portion 5242 of the light shielding plate 524 is not overlapped, the light emitted by the mercury lamp = FIG. 1) passes through the opening 52U, and as shown in FIG. 11A, is guided to the substrate 9 to extend in the sub-scanning direction. One of the rectangular areas of illumination: 95. The length of the sub-scanning direction of the irradiation region 95 is equal to the length of the substrate & the "direction" (that is, the length of the sub-scanning direction of the first non-drawing region 921), and the irradiation region 95 is cross-sectioned on the photosensitive material in the sub-scanning direction. The two drawing areas 91 and the non-drawing area 92. As shown in FIG. 10A, the light emitted from the mercury lamp 51 and the light emitted from the protruding portion 5242 of the light shielding plate 524 and the opening 5211 of the fourth aperture plate 521 are overlapped. Through the portion of the opening 5211 that is not overlapped with the protruding portion 5242, as shown in FIG. 11A, three rectangular irradiation regions 95a arranged in the sub-scanning direction on the substrate 9 are guided to the third irradiation region 95a. The length of the direction is equal to the length of the sub-scan 2 direction of the corresponding second non-drawing area 922. Field 312XP/Invention Manual (Supplement)/96-12/96131424 23 200819922 Part 2 of the second file description device In the first embodiment, the control unit 2 and the second light irradiation servo are controlled by the control unit 5 and the second light irradiation unit shown in Fig. 4, and the substrate 9 and the table (4) (8) are moved in the direction, and the base of the movement is 9 The non-striking region 92 illuminates the light. Specifically, when the earth board 9 is on the first! The non-drawing area 921 (that is, the portion where the sub-scanning direction of the non-drawing substrate 9 is set in the sub-scanning direction) passes; when it is below, 'the protrusion of the visor 524 is formed as shown in FIG. 10 (= 242) and the fourth hole is not pressed. The opening 5211 of the 521 is superimposed, and the irradiation/amplitude field 9 of the entire length of the sub-scanning direction of the cover substrate 9 is irradiated with light. In the second ': the second non-drawing area 922 on the second board 9 (that is, the non-drawing area = the part other than the non-drawing area 921) and the drawing area 2 below the light irradiation part 5, as shown in the figure As shown in Fig. 10B, the projections _ and the openings 5211 of the fourth aperture plate 521 are formed in the same manner as shown in Fig. 1B, and the light is irradiated to the second illumination region 95a. In other words, when the irradiation region 95 passes through: the 'region two 91 and the _ region 92, the second control unit 72 controls the two holes to only change the area of the irradiation region 95 to illuminate the light, and the light is hunted. Only the non-striking region 92 on the photosensitive material is known. In the case where the aperture unit 46 of the first light irradiation unit 4 is set to the first and second, the aperture unit 52 of the light irradiation unit 5 is set to be the second light, and the scanning mechanism 25 doubles as the first movement. In the mechanism and the second moving machine, the first moving mechanism is scanned toward the main scanning zone with respect to the stroke area 91. The irradiation area 312XP/invention specification (repair) of the i-th irradiation area of the first and second mask portions is relatively /96-12/96131424 24 200819922 94, the second moving mechanism relatively moves the first mask portion of the second mask portion to "the material is opposite to the main scanning direction, and the third light irradiation portion 4: 夂2 = σ The laser beam of the singer 41 is swayed and the illuminating drive unit 44 is the first light source that emits light toward the first (fourth) ray-43 and the field 2 illuminating unit 5, and the second light source. The second mask portion emits light, and the flow chart of the device (1) pattern is used to describe the pattern of the two-color pattern. When the pixel pattern is drawn, that is, 'several drawing regions 91 and grid-like non-drawing, "domain 92) The substrate 9 coated with the negative photosensitive material is placed on the platform 3, and is adsorbed and held on the main surface of the platform 3 (step 311) Γ :, , 'after ! 1 with tied system. (5 7 control four imaging cameras (a igmnent camera) 61 (see FIG. 2 and FIG. 2), and aligning marks (not shown) near the four corners of the image capturing unit 1 for shooting 1 and ' The control unit 7' rotates the stage 3 in the main scanning direction and the sub-scanning side in the main scanning direction and the sub-scanning side by the control unit 7'. The substrate 9 is rotated around the platform rotation axis 221. The edge start position (step S12). When the alignment of the substrate 9 is completed, the first light irradiation unit 4 is controlled by the first control 71 of the control unit 7, and the light is irradiated, and the aperture is partially blocked by the aperture unit 46. Light, thereby guiding the light to the illumination area 93 corresponding to the light-shielding setting light-transmitting portion on the substrate 9 ((4)), and controlling the platform driving mechanism 2 by the control unit 7 to start the platform 3 (+ Y) direction movement (step S14), the irradiation area 93 is relatively scanned with respect to the photosensitive material at (_〇方=312XP/invention specification (supplement)/96-12/96131424 25 200819922 t, thereby streaking The pattern is drawn on the photosensitive material on the substrate 9. Moreover, when the area (10) is irradiated. When the scanning reaches the predetermined movement end position (that is, the (_γ) side drawing area 91 * (-Υ) side edge), the movement of the stage 3 and the substrate 9 is stopped (step S15) and the irradiation of the light is stopped (step S16). Further, in the pattern drawing device 1, the second non-green area g 922 located between the (+γ) side drawing area 91 and the (_¥) side drawing area 通过 passes through the first light irradiation unit 4 When the first main scanning of the photosensitive material on the substrate 9 is completed, whether or not the substrate 9 is finally drawn is displayed (that is, whether there is a next or not). Main scanning) (Step: S17). When there is a next scan, the sub-scanning mechanism 23 is used to move the substrate 9 in the sub-scanning direction (step S171), and the process returns to step S13 to start the irradiation of the light toward the substrate 9, and to make the platform 3 moves in the (_γ) direction (steps gig, S14). Then, at the movement end position on the (-γ) side, the movement of the stage 3 and the irradiation of light are stopped (steps S15, S16). The movement of the platform 3 in the main scanning direction while irradiating the substrate 9 with light (ie, for The main scanning of the light-emitting region 93 of the photosensitive material on the substrate 9 is repeated only a predetermined number of times (in this case, four times in the present embodiment) so that the inter-sliding platform 3 moves in the sub-scanning direction. Steps S13 to S17 and S171) Then, when the entire stripe-shaped pixel pattern is drawn on the photosensitive material on the substrate 9 (step S17), the drawing operation of the pattern drawing device 1 is ended. In the substrate 9 on which the pixel pattern is drawn By performing development processing in a subsequent step, a plurality of sub-pixels are formed from the non-exposed portions of the photosensitive material. The above processing is repeated for each color of the sub-pixel of 312 ΧΡ / invention specification (supplement) / 96-12/96131424 26 200819922, and a color resist pattern of three colors of RGB (Red Green Blue, red green blue) is formed. • Next, the process of drawing the pattern of the protrusions by the pattern drawing device 1 is given. 13A and 13B are flow charts depicting a pattern of protrusions. In the pattern drawing device 1, as shown in FIG. 13A, the positive-type photosensitive material on the substrate is made to illuminate the light from the first light-irradiating portion 4, and then the light from the second light-irradiating portion 5 is irradiated as shown in FIG. 13B. . When the 10 pattern T is used to describe the protrusion pattern, first, after the substrate 9 coated with the positive photosensitive material on the entire main surface (that is, the plurality of drawing areas 91 and the grid-shaped non-drawing area 92) is held on the stage 3, Step S12 is also moved to the stroke start position by the platform drive mechanism 2 (steps S21, S22). In the pattern drawing device i, the first aperture plate 461 and the second aperture plate are previously changed to the third aperture control plate 4 61 a in the aperture unit 46 of the first light irradiation unit 4. When the alignment of the substrate 9 is completed, the main control unit 25 is controlled by the first control unit γ of the control unit 7, and the laser is not irradiated from the laser oscillator 43 of the i-th light irradiation unit 4 (that is, the light is extinguished). In the state), the substrate=starts moving in the (8) direction. The irradiation region 94 is relatively moved in the direction with respect to the drawing region 91 (step S23). Then, when the irradiation region 94 and the divided region 912 are aligned with respect to the main scanning direction, the first light irradiation unit 4 is controlled to emit light from the laser oscillator 43 by the first light irradiation unit 44 by the first control unit 71. The 兀46 partially covers the light, thereby entering (ie, illuminating) the 312XP/invention specification (supplement)/96·] 2/96! 3 in each of the two drawing areas 91 of the photosensitive material work. 】 424 27 200819922 The area of the illumination area on the side of the segmentation area 912 (that is, if the area of the blood area 912 is consistent with the main scanning direction, the number of the irradiation areas is different from the part corresponding to the pattern (step. 7' Confirmation of the divided area of the end of light irradiation 912 = (-Y) side 疋 No un-irradiated divided area 91 = area: 9_called when there is a next divided area 9;; when: Next: Continue with = mechanism 25 In the state of moving the substrate 9, returning to the step irradiation_with respect to the next divided region 912 with respect to the main scan ==- 1 through the third aperture plate of the aperture unit 46, such as the = field 94, the illumination light is emitted except for the portion corresponding to the protrusion pattern ( Step when the main sweep (four) of the illumination area 94 reaches the prescribed moving dihthron (ie, When the first shots on the (9) side of the photosensitive material are on the (9) side, and the first irradiation is performed toward the divided area on the most (9) side, the movement of the stage 3 and the substrate 9 is stopped (step milk, 2 pairs) When the first main scan of the photosensitive material on the substrate 9 is completed, it is confirmed whether or not (4) the substrate 9 is drawn (that is, whether or not there is a —-Γ). When there is a case of the lower-woman, the sub-scanner = soil is used. The plate 9 moves in the direction of the sub-learning (step S271), and returns to step 3: the substrate 9 starts moving in the (_Y) direction until the "arrival (+Y) side movement end position of the irradiation region 94 ends the platform 3 toward In the main scanning direction=moving, each time the irradiation area 94 and the divided area 912 are aligned with respect to the main scanning direction, the portion corresponding to the protrusion pattern in the irradiation area 94 is 312XP/stomach specification (supplement)/96·12/ 96131424 28 200819922 Partially irradiated light (steps S23 to S26). In the patterning device j, a stupid, instantaneous light-edge is repeated for intermittent irradiation of the substrate 9 and the sense of the substrate 9 First two:: the movement of the two scanning directions (ie, the main scanning is evenly spaced, so that Each of the predetermined number of times (==2 in the present embodiment 4 = only 7 weight S271). Then, on the substrate 9 on the basis of the picture (four) (step (four) feed the complete protrusion # column description edge action. ^束仙弟1 When the light irradiation unit 4 ends the stroke of the first light irradiation unit 4, the second control Deng 72 of the control unit 7 controls the display of the platform driving machine unit 5 to move the movement: two = baby ^ ^ , 籾% S3D. The edge of the (+γ) side of the non-greening area 92 at the beginning of the drawing is located at H. At this time, the protrusion 5242 of the light shielding plate 524 is formed at the aperture of the second light irradiation portion 5. A state in which the opening 5211 of the fourth aperture plate φ 52 未 does not overlap (see FIG. 1A). Then, the second control unit 72 controls the second light irradiation unit 5 to turn on the light, and partially shields the light by the fourth aperture plate 52 of the aperture unit 52, thereby being on the most (10) side of the photosensitive material. On the i-th non-descriptive area 921, light is guided to a rectangular one of the irradiation areas 95 corresponding to the opening 5211 and extending on the sub-scanning side (step S32). The area 95 is overlaid on the substrate 9 over the entire length of the sub-scanning side of the first non-drawing area 921. Next, the second control unit 72 controls the main scanning mechanism 25 to cause the platform 312χΡ/invention specification (supplement)/96-12/96131424 29 200819922 3 to start moving in the (+Y) direction (stepwise, the irradiation area 95 is relatively The main scanning is performed relatively in the sense=material, (-Y) direction, and then on the first non-drawing area 921 on the most (+Y) side of the photosensitive material in the (_γ) direction. When the ground moving region 95 reaches the boundary between the second non-slip region 921 and the second non-green region 2 adjacent to the (_γ) side of the first non-green region 921 (ie, if The edge of the (_γ) side of the region 95 overlaps the edge on the (-Υ) side of the f 1 non-green area 921, and the 控制2 control unit 72 is used in the aperture unit 52 of the second light-irradiating portion 5. The shutter moving mechanism 526 is controlled to move the shutter 524 in the (-Y) direction, and the projection 5242 of the shutter 524 and the opening of the fourth aperture plate 521 are partially overlapped with each other (see FIG. 10B). , changing the area irradiated by the light from the illumination area of the mercury lamp, on the photosensitive material on the substrate 9 in the (-Y) direction In the irradiation region to be moved, the irradiation region 95 corresponding to the first non-striking region 921 is changed to three irradiation regions 95a having a shape corresponding to the second non-drawing region 922 (see FIG. 11B). Three irradiation regions 95a The second non-drawing region 922 on the (+γ) side of the photosensitive material moves relatively in the (-γ) direction. Further, when the irradiation region 95a reaches the second non-drawing region 922 and is adjacent to the second non- The boundary between the second non-drawing area 921 on the (_Y) side of the drawing area 922 (that is, if the edge of the (-Υ) side of each of the irradiation areas 95a and the second non-drawing area are 2 (-Y) side In the aperture unit .52 of the second light irradiation unit 5, the second control unit 72 controls the shutter movement mechanism 526 to move the shutter 524 in the (+Y) direction to form the shutter. The protruding portion 5242 of the 524 is retracted from the opening 5211 of the fourth aperture plate 521 (refer to FIG. 1A). 312XP/Invention Manual (Repair)/96-12/96131424 200819922 This is to change the light irradiation area from the mercury lamp 51. The area of the occlusion light illumination changes the shape of the illumination area from three illumination areas 对 to Should be: one of the openings 5211 of the irradiation area 95 (refer to FIG. 1 a). In the pattern i, the apparatus i continues to irradiate the light-emitting material while irradiating the light-emitting area (ie, the irradiation area 95 or the irradiation area core). The main sweep of the seven fields until the platform 3 reaches the predetermined movement end position, and when the irradiation area reaches the lu-border between the second non-drawing green area 921 and the second non-drawing area (four), the light irradiation is changed in the irradiation area. In the area, the irradiation area 95 and the irradiation area 95a are switched (step S34). Thereby, the light from the mercury lamp 51 is irradiated only to the non-drawing area 92 on the light-sensing material on the substrate 9. ',, and by the main scanning of the shot areas 95, 95a, the entire non-drawing area 92 is irradiated with light 'When the substrate 9 reaches the movement end position, the movement of the flat to 3 and the substrate 9 in the main scanning direction is stopped (steps) S35), and stopping the irradiation of light (step S36). In this way, in the substrate 9 which is irradiated with light other than the portion corresponding to the protrusion pattern on the photosensitive material, the developing portion is removed in the subsequent step, and the exposed portion of the photosensitive material is removed from the substrate to form a liquid crystal. Several protrusions of the alignment control. As described above, in the pattern drawing device, the protrusion pattern (4) is drawn on the positive-type f-light material on the substrate 9, by using the first! The control unit 71 (4) the first light irradiation unit 4, and the irradiation area in which the divided areas of the plurality of divided areas 912 of the stroke area 91 are equal to the length of the main scanning direction are relatively moved in the main scanning direction, and each time When the irradiation area 94 coincides with the divided area 912, the irradiation area 94 is irradiated with instantaneous light. By drawing a pattern of protrusions on the large substrate 9, it is also possible to easily draw the area without using a large reticle of the same size as the substrate 312Xp/invention specification (supplement)/96-12/96131424 31 200819922. 91 depicts a pattern of protrusions. In addition, when the second light irradiation unit 5 is controlled by the second control unit 72, the irradiation area of the light from the mercury lamp 51 reaches the boundary between the first non-drawing area 921 and the second non-drawing area 922. The area in which the light is irradiated is changed in the irradiation area, and the irradiation area 95 and the irradiation area 95a are switched. Thereby, it is possible to illuminate the non-drawing area 92 whose shape changes with the position of the main scanning direction, without illuminating the drawing area 9 ( on the photosensitive material (that is, without affecting the drawing area 91). Light. Therefore, it can be said that the pattern drawing device 1 is particularly suitable for pattern drawing of a multi-chamfered substrate which is inevitably enlarged in size as a whole substrate and which has a complicated shape of a non-shank region. In recent years, the size of the liquid crystal display device has increased in size, so that the pattern drawing device 容易 can be easily drawn without using a large reticle, and is particularly suitable for drawing a pattern on a glass substrate for a liquid crystal display device. Further, since the non-drawing area 92 can be easily irradiated with light, it is particularly suitable for the drawing of the projection pattern for liquid crystal alignment control formed by the positive-type photosensitive material. In the pattern drawing device 1, when the pixel pattern is drawn on the negative photosensitive material on the substrate 9, the first light irradiation portion 4 for drawing the projection pattern irradiates only the portion corresponding to the pixel pattern in the drawing region 91. By this, it is possible to draw a pattern on the negative and positive photosensitive materials while simplifying the structure of the pattern drawing device 1. • Generally, in a color filter substrate for a liquid crystal display device, a pixel pattern or a black matrix (black 312xp/invention) is formed using a negative photosensitive material before forming a protrusion pattern for liquid crystal alignment control using a positive photosensitive material. Instruction Manual (Supplement)/96-12/96131424 32 200819922 ^ The drawing of the 贞-type and positive-type photographic materials can be performed by the simple 2, so it is especially suitable for depicting the pixel pattern of the color-transparent substrate of the liquid crystal display device. .
二人」兒明本發明之第2實施形態之圖案描綠裝置。第 2貝加形恶之圖案描緣裝置代替圖i所示圖案描繪褒置1 之第一2光照射部5之孔徑單元52,而具備圖14A中俯視 圖所不之孔徑單兀52a。其他構成均與圖i所示圖案描纷 裝置上才目同,故於以下說明中附加相同符號。A two-person pattern greening device according to a second embodiment of the present invention. The second beak pattern pattern drawing device is provided with the aperture unit 52 of the first two light irradiation unit 5 of the first embodiment instead of the aperture unit 52 of the first two light irradiation unit 5 of Fig. 14A. The other configurations are the same as those of the pattern drawing device shown in Fig. i, and the same reference numerals are attached to the following description.
於第2貫施形態之圖案描綠裝£中,亦與第工實施形態 同k地’ m於作為液晶顯示裝置用之彩色濾光片基板 之基板9(參照目1)上的正型感光材料,描緣用於液晶配 向控制之突起圖案,並利用第2光照射部5僅對感光材料 上之非描繪區域92(參照圖3)照射光。利用第2實施形態 之圖案描繪裝置之第2光照射部5朝非描繪區域92之光 的照射,除了切換照射區域95與照射區域95a(參照圖11A 及圖11B)之方法呈現不同以外,其餘與第i實施形態相 同0 如圖14A所示,孔徑單元52a代替圖i〇A所示之孔徑單 元52之第4孔徑板521及遮光板524,而具備多通道液 曰曰光閘5 21 a ’其猎由對液晶分子施加或去除電場,而使 液晶分子之排列產生變化,藉此來透光或遮光。又,孔徑 單元52a與圖10A所示孔徑單元52同樣地,具備:一對 保持部522,自(+X)侧及(-X)側保持液晶光閘521a;以及 312XP/發明說明書(補件)/96-12/96131424 33 200819922 位置調整機構523,調整液晶光閘521a之主掃描方向及 副掃描方向之位置。 . 液晶光閘52h具有於副掃描方向上延伸之細長方形狀 *之透光部5212,將來自水銀燈51 (參照圖1)之光透過該 透光部5212,經由光學系統53(;參照圖丨)導至基板9上 之感光材料,而照射至第i非描繪區域921上之一個昭射 區域95(參照圖11A)。於圖14A中,為了圖式易於理解, 鲁對液晶光閘521a之除透光部5212以外之區域(即,遮光 部)附以平行斜線來表示(圖14B中亦同)。 於第2光照射部5中,藉由利用控制部7之第2控制部 72(芩照圖4)控制液晶光閘521a,而使透光部5212之液 晶分子之排列方向發生變化,並對一部分透光部5212或 者整個透光部5212遮擋光。於第2實施形態之圖案描繪 裝,中,對第2非描繪區域922(參照圖3)照射光時,^ 由第2控制部72控制液晶光閘52ia,而如圖14B所示, φ對透光。卩5212部分遮光。藉此,變更來自水銀燈51之光 之照射區域中遮擋光照射之區域,而僅對第2非描繪區域 922上之照射區域95a(參照圖11B)照射光。又當對感 光材料之光的照射停止時,對整個透光部5 212遮光。 於該圖案描繪装置中,與第丨實施形態同樣地,可不使 *用大型光罩而對描繪區域91容易地描繪突起圖案。又, ,可容易地僅對非描缘區域92照射光,而不會對描繪區域 91造成影響。 於第2實施形態之圖案描繪裝置中,尤其藉由控制液晶 312XP/發明說明書(補件)/96-12/96131424 34 200819922 = Bfla來變更透光部5212之㈣部分,而可容易地變 】::射區域95a之副掃描方向之長度。其 非描㈣域92之第2非描繪區域922之副掃描方向= 不同的多種基板(例如,描㈣域91之尺寸不同者、或者 1片基板上描繪區域91之個數 ^ 對非讀區域92照射光⑽不时)^’可容易地僅 其次,說明本發明之第3實施形態之圖案描㈣統。圖 15:表示第3實施形態之圖案描繪系统1〇〇之構成的圖。 圖案描㈣統刚具備:第1光照射裝置m,僅對基板 9上之感光材料上之描矣會區域91(參照圖3)照射光;第2 光…、射衣i 102 ’僅對感光材料上之非描繪區域92(參照 圖3)妝射光,以及作為搬送機構之搬送臂1 ,於第1光 照f裝置101與第2光照射裝置102之間搬送基板9。 第1光如、射裝置1 〇 1為自目j所$之圖案描繪裝置工省 略第2光照射部5及第2控制部72之構成,帛2光照射 裝置102 $自圖案描繪裝置i省略第i光照射部4及第! 控制部71之構成。於圖案描㈣統_巾,利用第i光 知射^置ΗΠ ’對基板9進行與利用_案描繪裝置i之第 1光照射部4之光照射同樣的處理,利用帛2光照射裝置 102,對基板9進行與利用圖案描繪裝置1之第2光照射 邛5之光照射同樣的處理。帛j光照射裝置】〇1及第2光 知射1置102之平堂3分別成為圖案描繪系統1 〇〇之第1 基板保持部及第2基板保持部。 於第1光照射裝置101中,對設置有負型感光材料之基 312XP/發明說明書(補件)/96-12/96131424 35 200819922 板9 ’透過第1孔徑板461及第2孔徑板467(參照圖5及 圖6)而照射光,藉此描繪液晶顯示裝置用之彩色濾光片 基板之像素圖案。 又’於第1光照射裝置1 〇1中,對設置有正型感光材料 之基板9 ’透過第3孔徑板461 a(參照圖8)而照射光,藉 此對描緣區域91之除與用於液晶配向控制之突起圖案對 應的部分以外照射光。該基板9由搬送臂1〇3自第1光照 射裝置101搬出而搬入至第2光照射裝置1〇2。於第2光 照射裝置102中,進行基板9之對準後,透過第4孔徑板 521(參知圖10A)而照射光,並利用遮光板524(參照圖ι〇Β) 變更照射區域中遮擋光照射之區域,藉此僅對非描繪區域 92照射光。再者,於圖案描繪系統丨〇〇中,亦可代替搬 送臂103而設置其他搬送機構。 於圖案描繪系統100中,可與第1實施形態同樣地,不 使用大型光罩而容易地於描繪區域91上描繪突起圖案。 又可谷易地僅對非描緣區域92照射光,而不會對描緣 區域91造成影響。 於圖案描繪系統1〇〇之第2光照射裝置1〇2中,可與第 2實施形態同樣地,代替第4孔徑板521及遮光板524而 設置多通道液晶光閘521a。藉此,可容易地變更照射區 域之副掃描方向之長度,而可更容易地向非描繪區域犯 照射光。 以上,就本發明之實施㈣進行了說明,但本發明並不 限定於上述實施形態,可進行各種變更。 312XP/發明說明書(補件)/96-12/96131424 36 200819922 例如,於上述實施形態之圖案描繪裝置中, 料處於停止狀態之平臺3移動第i光照射部4及== ’、、、:邛5 ’而使來自第1光照射咅"之光照射區域、及來 料=1部5之光照射區域相對於基板9上之感光材 :圖”置中,利用第2光照射部5對正型感光材 日會區域92之光照射’未必需要於利用第1光 逸'/ 4對該感㈣料上之騎區域91的光照射結束後 * 如’可與對描繪區域91所進行之照射區域94的 者:二主掃描同時對非描繪區域92照射光,或 # ’。、W ;田%區域91照射光之前對非描繪區域92照射 部:二繪區域92照射光亦可與利用第1光照射In the second embodiment, the pattern is similar to the first embodiment, and is also positively sensitized on the substrate 9 (see Table 1) which is a color filter substrate for a liquid crystal display device. The material is drawn to the projection pattern of the liquid crystal alignment control, and the second light irradiation unit 5 irradiates only the non-drawing area 92 (see FIG. 3) on the photosensitive material with light. The irradiation of the light in the non-drawing region 92 by the second light-irradiating portion 5 of the pattern drawing device according to the second embodiment is different from the method of switching the irradiation region 95 and the irradiation region 95a (see FIGS. 11A and 11B). As in the i-th embodiment, as shown in FIG. 14A, the aperture unit 52a is provided with a multi-channel liquid shutter 5 21 a instead of the fourth aperture plate 521 and the light shielding plate 524 of the aperture unit 52 shown in FIG. 'Hunting by applying or removing an electric field to liquid crystal molecules causes a change in the arrangement of liquid crystal molecules, thereby transmitting or blocking light. Further, similarly to the aperture unit 52 shown in FIG. 10A, the aperture unit 52a includes a pair of holding portions 522 that hold the liquid crystal shutters 521a from the (+X) side and the (-X) side; and 312XP/invention manual (supplements) /96-12/96131424 33 200819922 The position adjustment mechanism 523 adjusts the positions of the main scanning direction and the sub-scanning direction of the liquid crystal shutter 521a. The liquid crystal shutter 52h has a light-transmissive portion 5212 which is elongated in the sub-scanning direction*, and transmits light from the mercury lamp 51 (refer to FIG. 1) through the light-transmitting portion 5212 via the optical system 53 (refer to FIG. The photosensitive material on the substrate 9 is irradiated to one of the illuminating regions 95 on the i-th non-drawing region 921 (see FIG. 11A). In Fig. 14A, for the sake of easy understanding of the drawing, the area other than the light transmitting portion 5212 (i.e., the light shielding portion) of the liquid crystal shutter 521a is indicated by parallel oblique lines (the same applies to Fig. 14B). In the second light irradiation unit 5, the liquid crystal shutter 521a is controlled by the second control unit 72 (see FIG. 4) of the control unit 7, and the arrangement direction of the liquid crystal molecules of the light transmitting portion 5212 is changed. A part of the light transmitting portion 5212 or the entire light transmitting portion 5212 blocks light. In the pattern drawing device of the second embodiment, when the second non-drawing region 922 (see FIG. 3) is irradiated with light, the second control unit 72 controls the liquid crystal shutter 52ia, and as shown in FIG. 14B, φ pairs Light transmission.卩5212 part of the shading. Thereby, the area in which the light is irradiated from the irradiation light of the mercury lamp 51 is changed, and only the irradiation area 95a (see Fig. 11B) on the second non-drawing area 922 is irradiated with light. Further, when the irradiation of the light of the photosensitive material is stopped, the entire light transmitting portion 5 212 is shielded from light. In the pattern drawing device, similarly to the second embodiment, the projection pattern can be easily drawn to the drawing region 91 without using a large photomask. Moreover, it is possible to easily illuminate only the non-striking region 92 without affecting the drawing region 91. In the pattern drawing device of the second embodiment, the (fourth) portion of the light transmitting portion 5212 is changed by controlling the liquid crystal 312XP/invention specification (supplement)/96-12/96131424 34 200819922 = Bfla, and can be easily changed. :: The length of the sub-scanning direction of the shot area 95a. The sub-scanning direction of the second non-drawing area 922 of the non-drawing (four) field 92 = the number of different substrates (for example, the size of the drawing (four) field 91 or the number of the drawing areas 91 on one substrate ^ the non-reading area 92 illumination light (10) may be used from time to time. The pattern description (fourth) of the third embodiment of the present invention can be easily described. Fig. 15 is a view showing the configuration of the pattern drawing system 1 of the third embodiment. The pattern drawing (4) is provided with the first light irradiation device m, and only the tracing area 91 (refer to FIG. 3) on the photosensitive material on the substrate 9 is irradiated with light; the second light..., the shot i 102' is only sensitive to light. The non-drawing area 92 (see FIG. 3) on the material is used to illuminate the light, and the transfer arm 1 as a transport mechanism transports the substrate 9 between the first illumination f device 101 and the second light irradiation device 102. The first light illuminating device 1 〇1 is a configuration of the second light illuminating unit 5 and the second control unit 72, and the 光2 light illuminating device 102$ is omitted from the pattern drawing device i. The i-th light irradiation unit 4 and the first! The configuration of the control unit 71. In the pattern drawing (four) system, the same processing as the light irradiation of the first light irradiation unit 4 by the drawing device i is performed by the ith light irradiation device, and the 帛2 light irradiation device 102 is used. The substrate 9 is subjected to the same processing as the light irradiation by the second light irradiation 邛 5 of the pattern drawing device 1. The 光j light irradiation device 〇1 and the second light illuminating device 1 are respectively the first substrate holding portion and the second substrate holding portion of the pattern drawing system 1 . In the first light irradiation device 101, the substrate 312XP/invention specification (supplement)/96-12/96131424 35 200819922 plate 9' provided with the negative photosensitive material passes through the first aperture plate 461 and the second aperture plate 467 ( The pixel pattern of the color filter substrate for a liquid crystal display device is drawn by irradiating light with reference to FIGS. 5 and 6). Further, in the first light irradiation device 1 〇1, the substrate 9' provided with the positive photosensitive material is irradiated with light through the third aperture plate 461a (see FIG. 8), thereby dividing the edge region 91. The portion corresponding to the protrusion pattern for the liquid crystal alignment control is irradiated with light. The substrate 9 is carried out from the first light-emitting device 101 by the transfer arm 1〇3, and is carried into the second light-irradiating device 1〇2. After the alignment of the substrate 9 is performed in the second light irradiation device 102, the fourth aperture plate 521 (see FIG. 10A) is irradiated with light, and the light shielding plate 524 (see FIG. The area where the light is irradiated, whereby only the non-drawing area 92 is irradiated with light. Further, in the pattern drawing system, another transfer mechanism may be provided instead of the transfer arm 103. In the pattern drawing system 100, as in the first embodiment, the projection pattern can be easily drawn on the drawing region 91 without using a large reticle. It is also possible to illuminate only the non-striking region 92 without affecting the strut region 91. In the second light irradiation device 1A2 of the pattern drawing system 1A, the multi-channel liquid crystal shutter 521a can be provided instead of the fourth aperture plate 521 and the light shielding plate 524 as in the second embodiment. Thereby, the length of the sub-scanning direction of the irradiation area can be easily changed, and the light can be more easily irradiated to the non-drawing area. Although the fourth embodiment of the present invention has been described above, the present invention is not limited to the above embodiment, and various modifications can be made. 312XP/Invention Manual (Supplement)/96-12/96131424 36 200819922 For example, in the pattern drawing device of the above embodiment, the stage 3 in which the material is stopped is moved by the i-th light irradiation unit 4 and == ', ,,邛5', the light irradiation region from the first light irradiation and the light irradiation region of the incoming material=1 is printed with respect to the photosensitive material on the substrate 9: "the picture" is centered, and the second light irradiation portion 5 is used. The light irradiation of the positive-type photosensitive material meeting area 92 is not necessarily required to be performed after the light irradiation of the riding area 91 on the sensing (four) material by the first light ray '/ 4' The person in the irradiation area 94: the two main scanning simultaneously irradiates the non-drawing area 92 with light, or # ', W; the field % area 91 illuminates the non-drawing area 92 before the light is irradiated: the second drawing area 92 illuminates the light Using the first light irradiation
Si =::_同’藉由在基板9之移動過 1 丁里複恥射_間光而進行。 於圖案描繪裝置之繁彳本 元46之第i孔徑板461及;:;二中:亦可代替孔徑^ 晶光閘。於此情形時,利丄徑板467,例如使用液 控制作為第丨光罩部之孔:;::7之第1控制 照射區域94與描…9= 46之該液晶光閉’每當 曰# pm 之各分割區域912 一致時,液 :先間㈣開閉,對照射區域94照射光。又,作為先 第、43及雷射驅動部44與該液晶光閘-同由 於:宰二壯控制,藉此可對照射區域94照射瞬間光。 圖宰類似中,當負型及正型感光材料上所描綠之 似%亦可不變更第1光照射部4之孔徑,而變更 312汾/__書(補件)/96·12/96⑶似 37 200819922 第1控制部71對光源或平臺驅動機構2之控制,來對兩 感光材料描綠圖案。 於上述實施形態之圖案描繪裝置以及第3實施形態之 圖案描繪系統1〇〇之第】光照射裝置1〇1中,亦可與第1 光照射部4(及第2光照射部5)分開單獨地設置對基板9 照射光之其他光照射部,以代替第】光照射部4,利用該 光照射部來對負型感光材料描繪圖案。 利用圖案描繪裝置及圖案描繪系統1〇〇描繪圖案之基 板,並非限定於感光材料上設定有四個描繪區域91之基 板,亦可為感光材料上僅設定有一個描繪區域之基板。 又,亦可對感光材料上設定有於主掃描方向及/或副掃描 方向上相互間隔而排列之數個描繪區域(即,包含一個描 繪區域及與該描繪區域形狀相同之一個以上描繪區域的 數個描繪區域)之基板進行描繪。 於上述實施形態之圖案描繪裝置中,亦可利用第丨光照 射部4,驗晶顯示裝置用之彩色濾光片基板描繪除像素 圖案以外之其他圖案(例如,與黑色矩陣或感光性間隔物 對應之圖案)。又’亦可利用第!光照射部4及第2光照 射部5,對液晶顯示裝置用之TFT(Thin Fi lm 基板描繪用於液晶配向控制之突起圖案或用於tft佈線 之蝕刻之光阻圖案(圖案描繪系統i 〇〇中亦同)。 圖案描緣裝置及圖案描繪系統1〇〇亦可用於對電裝顯 示裝置或有機EL顯示裝置等平面顯示襄置用之基板描繪 圖案。又’圖案描繪裝置及圖案描繪系統1〇〇除平面顯示 312XP/發明說明書(補件)/96-12/96131424 38 200819922 裝置用之玻璃基板以外,亦可用於對半導體基板或印刷佈 線基板、或者光罩用之玻璃基板等描繪圖案。 以上詳細描述並說明了本發明,但所述說明僅為例示性 而並非限定性者。因此,可認為只要不脫離本發明之範 圍’便可具有多種變形及態樣。 【圖式簡單說明】 圖1係第1實施形態之圖案描繪裝置之侧視圖。Si =::_ is carried out by the movement of the substrate 9 over 1 D. For the pattern drawing device, the i-th aperture plate 461 of the unit 46 and the second: can also replace the aperture ^ crystal shutter. In this case, the slab 467, for example, uses the liquid control as the hole of the second reticle portion: :: 7 of the first control illuminating region 94 and the liquid crystal light of the drawing 9=46 is turned on every time 曰When each of the divided regions 912 of # pm is identical, the liquid: first (four) opens and closes, and the irradiation region 94 is irradiated with light. Further, as the first, 43 and laser driving sections 44, the liquid crystal shutters are controlled by the same, whereby the irradiation region 94 can be irradiated with the instantaneous light. In the similar figure, if the green color on the negative and positive photosensitive materials is %, the aperture of the first light irradiation unit 4 may not be changed, and the 312 汾/__ book (supplement)/96·12/96 (3) is changed. Like 37 200819922 The first control unit 71 controls the light source or the platform driving mechanism 2 to draw a green pattern on the two photosensitive materials. In the patterning device of the above-described embodiment and the first light irradiation device 1〇1 of the pattern drawing system 1 according to the third embodiment, the first light irradiation unit 4 (and the second light irradiation unit 5) may be separated from each other. Instead of the first light irradiation unit 4, a light irradiation unit that irradiates light to the substrate 9 is separately provided, and the negative light-sensitive material is drawn with a pattern by the light irradiation unit. The substrate on which the pattern is drawn by the pattern drawing device and the pattern drawing system 1 is not limited to the substrate on which the four drawing regions 91 are set on the photosensitive material, and may be a substrate in which only one drawing region is set on the photosensitive material. Further, a plurality of drawing regions (that is, one drawing region and one or more drawing regions having the same shape as the drawing region) may be disposed on the photosensitive material with the main scanning direction and/or the sub-scanning direction spaced apart from each other. The substrate of several drawing areas is drawn. In the pattern drawing device of the above-described embodiment, the third light irradiation unit 4 may be used, and the color filter substrate for the crystal display device may be drawn with a pattern other than the pixel pattern (for example, with a black matrix or a photosensitive spacer). Corresponding pattern). Also, you can use the first! The light-irradiating portion 4 and the second light-irradiating portion 5 are used for a TFT for a liquid crystal display device (Thin Film substrate is used to draw a projection pattern for liquid crystal alignment control or a photoresist pattern for etching of a tft wiring (pattern drawing system i 〇 The pattern drawing device and the pattern drawing system 1 can also be used for a substrate drawing pattern for a flat display device such as an electric display device or an organic EL display device. A 'pattern drawing device and a pattern drawing system In addition to the flat glass display 312XP/invention manual (supplement)/96-12/96131424 38 200819922 In addition to the glass substrate for the device, it can also be used to draw a pattern on a semiconductor substrate, a printed wiring board, or a glass substrate for a photomask. The present invention has been described and illustrated in detail hereinabove, but the description is intended to be illustrative and not restrictive. Fig. 1 is a side view of the pattern drawing device of the first embodiment.
圖2係圖案描緣裝置之俯視圖。 圖3係表示基板之俯視圖。Figure 2 is a plan view of the patterning device. Fig. 3 is a plan view showing a substrate.
圖4係連同其他構成一併表示由控制部所實現之功 之方塊圖。 、 圖5係表示孔徑單元之一部分之俯視圖。 圖6係表示孔徑單元之另一部分之俯視圖。 圖7係表示基板上之照射區域之俯視圖。 圖8係表示孔徑單元之一部分之俯視圖。 圖9係表示描繚區域之一部分之俯視圖。 圖10A係表示孔徑單元之俯視圖。 圖10B係孔徑單元之俯視圖。 圖11A係表示基板上之照射區域之俯視圖。 圖11B係表示基板上之照射區域之俯視圖。 圖12係表示描繪像素圖案之流程圖。 圖13A係表示描繪突起圖案之流程圖。 圖13B係表示描繪突起圖案之流程圖。 圖14A係孔徑單元之俯視圖。 312XP/發明說明書(補件)/96-12/96131424 39 200819922 圖14B係孔徑單元之俯視圖。 圖15係表示圖案描繪系統之構成圖。Fig. 4 is a block diagram showing the work realized by the control unit together with other components. Figure 5 is a plan view showing a portion of the aperture unit. Figure 6 is a plan view showing another portion of the aperture unit. Fig. 7 is a plan view showing an irradiation area on a substrate. Figure 8 is a plan view showing a portion of the aperture unit. Figure 9 is a plan view showing a portion of the tracing area. Fig. 10A is a plan view showing an aperture unit. Fig. 10B is a plan view of the aperture unit. Fig. 11A is a plan view showing an irradiation region on a substrate. Fig. 11B is a plan view showing an irradiation area on a substrate. Figure 12 is a flow chart showing the depiction of a pixel pattern. Fig. 13A is a flow chart showing the pattern of protrusions. Fig. 13B is a flow chart showing the pattern of protrusions. Figure 14A is a plan view of the aperture unit. 312XP/Invention Manual (Supplement)/96-12/96131424 39 200819922 Figure 14B is a plan view of the aperture unit. Fig. 15 is a view showing the configuration of a pattern drawing system.
【主要元件符號說明】 1 圖案描繪裝置 2 平堂驅動機構 3 平臺 4 第1光照射部 5 第2光照射部 6 攝像部 7 控制部 9 基板 11 基座 12、13 框架 21 支撐板 22 平臺旋轉機構 23 副掃描機構 24 底板 25 主掃描機構 41 光學頭 42 照明光學系統 43 雷射振盪器 44 雷射驅動部 45 射出部 46 、 52 、 52a 孔徑單元 312XP/發明說明書(補件)/96-12/96131424 40 200819922 47、53 光學系統 51 高壓水銀燈 61 對準排列相機 71 第1控制部 72 第2控制部 91 描繪區域 92 非描纟會區域 93 、 94 、 95 、 95a 、 451 、 93卜 941 照射區域 100 圖案描繪系統 101 第1光照射裝置 102 第2光照射裝置 103 搬送臂 221 平臺旋轉軸 222 、 23卜 251 線性馬達[Description of main component symbols] 1 Pattern drawing device 2 Flat drive mechanism 3 Platform 4 First light irradiation unit 5 Second light irradiation unit 6 Imaging unit 7 Control unit 9 Substrate 11 Base 12, 13 Frame 21 Support plate 22 Platform rotation Mechanism 23 Sub-scanning mechanism 24 Base plate 25 Main scanning mechanism 41 Optical head 42 Illumination optical system 43 Laser oscillator 44 Laser drive unit 45 Injection unit 46, 52, 52a Aperture unit 312XP / Invention manual (supplement) / 96-12 /96131424 40 200819922 47, 53 Optical system 51 High-pressure mercury lamp 61 Alignment camera 71 First control unit 72 Second control unit 91 Drawing area 92 Non-draw area 93, 94, 95, 95a, 451, 93 Bu 941 Area 100 pattern drawing system 101 First light irradiation device 102 Second light irradiation device 103 Transfer arm 221 Platform rotation shaft 222, 23 251 Linear motor
導軌 第1孔徑板 第3孔徑板 保持部 位置調整機構 第1調整機構 弟2調整機構 第2孔徑板 第3調整機構 第4孔徑板 232 、 252 、 465 、 528 • 461 461a 462 、 468 、 522 、 525 463 、 523 464 466 467 469 521 312XP/發明說明書(補件)/96-12/96131424 41 200819922Rail first aperture plate third aperture plate holding portion position adjustment mechanism first adjustment mechanism 2 adjustment mechanism second aperture plate third adjustment mechanism fourth aperture plates 232, 252, 465, 528 • 461 461a 462 , 468 , 522 , 525 463 , 523 464 466 467 469 521 312XP / invention manual (supplement) /96-12/96131424 41 200819922
521a 524 526 527 529 911 912 921 922 4611 、 4612 、 4613 、 4671 4614 5211 5241 5242 液晶光閘 遮光板 遮光板移動機構 第4調整機構 弟5調整機構 圓形部分 分割區域 第1非描繪區域 第2非描繪區域 4672、4673、5212 透光部 遮光部 開口 本體部 突出部521a 524 526 527 529 911 912 921 922 4611 , 4612 , 4613 , 4671 4614 5211 5241 5242 LCD shutter visor moving mechanism 4th adjustment mechanism brother 5 adjustment mechanism circular part division area 1st non-drawing area 2nd non Drawing area 4672, 4673, 5212 light transmitting portion light shielding portion opening body portion protruding portion
312XP/發明說明書(補件)/96-12/96131424 42312XP/Invention Manual (supplement)/96-12/96131424 42
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TWI495959B (en) * | 2010-12-22 | 2015-08-11 | Tokyo Electron Ltd | Local exposure method and local exposure apparatus |
CN110783231A (en) * | 2018-07-31 | 2020-02-11 | 东京毅力科创株式会社 | Substrate processing apparatus, substrate processing method, and storage medium |
CN112415858A (en) * | 2019-08-21 | 2021-02-26 | 株式会社斯库林集团 | Drawing method and drawing device |
CN113752696A (en) * | 2020-06-01 | 2021-12-07 | 住友重机械工业株式会社 | Image data generating device and image data generating method |
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WO2009145032A1 (en) | 2008-05-28 | 2009-12-03 | 凸版印刷株式会社 | Method for producing color filter, method for producing substrate with pattern, and small photomask |
JP5762903B2 (en) * | 2011-09-16 | 2015-08-12 | 株式会社ブイ・テクノロジー | Exposure equipment |
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JP3938714B2 (en) * | 2002-05-16 | 2007-06-27 | 大日本スクリーン製造株式会社 | Exposure equipment |
JP4201178B2 (en) * | 2002-05-30 | 2008-12-24 | 大日本スクリーン製造株式会社 | Image recording device |
JP4020248B2 (en) * | 2002-06-06 | 2007-12-12 | 大日本スクリーン製造株式会社 | Optical drawing apparatus and optical drawing method |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI495959B (en) * | 2010-12-22 | 2015-08-11 | Tokyo Electron Ltd | Local exposure method and local exposure apparatus |
CN110783231A (en) * | 2018-07-31 | 2020-02-11 | 东京毅力科创株式会社 | Substrate processing apparatus, substrate processing method, and storage medium |
CN112415858A (en) * | 2019-08-21 | 2021-02-26 | 株式会社斯库林集团 | Drawing method and drawing device |
CN113752696A (en) * | 2020-06-01 | 2021-12-07 | 住友重机械工业株式会社 | Image data generating device and image data generating method |
CN113752696B (en) * | 2020-06-01 | 2022-12-06 | 住友重机械工业株式会社 | Image data generating device and image data generating method |
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