TW200809209A - Probe card and glass substrate drilling method - Google Patents
Probe card and glass substrate drilling method Download PDFInfo
- Publication number
- TW200809209A TW200809209A TW96113702A TW96113702A TW200809209A TW 200809209 A TW200809209 A TW 200809209A TW 96113702 A TW96113702 A TW 96113702A TW 96113702 A TW96113702 A TW 96113702A TW 200809209 A TW200809209 A TW 200809209A
- Authority
- TW
- Taiwan
- Prior art keywords
- glass substrate
- hole
- mold
- opening
- guide hole
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 90
- 239000000758 substrate Substances 0.000 title claims description 192
- 239000011521 glass Substances 0.000 title claims description 143
- 238000000034 method Methods 0.000 title claims description 44
- 238000005553 drilling Methods 0.000 title description 3
- 239000011347 resin Substances 0.000 claims description 66
- 229920005989 resin Polymers 0.000 claims description 66
- 238000010438 heat treatment Methods 0.000 claims description 29
- 238000003780 insertion Methods 0.000 claims description 29
- 230000037431 insertion Effects 0.000 claims description 29
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 15
- 229910052799 carbon Inorganic materials 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 13
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 8
- 238000001816 cooling Methods 0.000 claims description 7
- 229910000990 Ni alloy Inorganic materials 0.000 claims description 5
- 238000007670 refining Methods 0.000 claims description 5
- QZPSXPBJTPJTSZ-UHFFFAOYSA-N aqua regia Chemical group Cl.O[N+]([O-])=O QZPSXPBJTPJTSZ-UHFFFAOYSA-N 0.000 claims description 4
- 239000007788 liquid Substances 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 229910052759 nickel Inorganic materials 0.000 claims description 4
- 239000010935 stainless steel Substances 0.000 claims description 4
- 229910001220 stainless steel Inorganic materials 0.000 claims description 4
- 238000005530 etching Methods 0.000 claims description 3
- 239000006060 molten glass Substances 0.000 claims description 3
- 238000002844 melting Methods 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- 229910052715 tantalum Inorganic materials 0.000 claims description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 2
- 229910052770 Uranium Inorganic materials 0.000 claims 1
- 239000003610 charcoal Substances 0.000 claims 1
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 claims 1
- 238000007796 conventional method Methods 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 6
- 238000003754 machining Methods 0.000 description 6
- 239000001301 oxygen Substances 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- 238000007689 inspection Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- 229910001873 dinitrogen Inorganic materials 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- 229910052707 ruthenium Inorganic materials 0.000 description 3
- 239000004575 stone Substances 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910000851 Alloy steel Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 244000166124 Eucalyptus globulus Species 0.000 description 1
- 229920000433 Lyocell Polymers 0.000 description 1
- KFVPJMZRRXCXAO-UHFFFAOYSA-N [He].[O] Chemical compound [He].[O] KFVPJMZRRXCXAO-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910021538 borax Inorganic materials 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005323 electroforming Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 238000005488 sandblasting Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035807 sensation Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000004328 sodium tetraborate Substances 0.000 description 1
- 235000010339 sodium tetraborate Nutrition 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006114160 | 2006-04-18 | ||
| JP2006315044 | 2006-11-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200809209A true TW200809209A (en) | 2008-02-16 |
| TWI328685B TWI328685B (https=) | 2010-08-11 |
Family
ID=38625050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96113702A TW200809209A (en) | 2006-04-18 | 2007-04-18 | Probe card and glass substrate drilling method |
Country Status (2)
| Country | Link |
|---|---|
| TW (1) | TW200809209A (https=) |
| WO (1) | WO2007123150A1 (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI422834B (zh) * | 2009-11-04 | 2014-01-11 | Nihon Micronics Kk | A probe guide member and a test method having a probe card and a semiconductor device using the same |
| TWI684011B (zh) * | 2016-07-28 | 2020-02-01 | 義大利商探針科技公司 | 電子裝置用探針卡 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008133089A1 (ja) * | 2007-04-20 | 2008-11-06 | Nhk Spring Co., Ltd. | 導電性接触子ユニット |
| JPWO2009130737A1 (ja) * | 2008-04-21 | 2011-08-04 | 富士通株式会社 | 検査用基板、検査用基板の製造方法、及びその検査用基板を用いた検査方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6343940B1 (en) * | 2000-06-19 | 2002-02-05 | Advantest Corp | Contact structure and assembly mechanism thereof |
| JP2002365308A (ja) * | 2001-06-08 | 2002-12-18 | Japan Electronic Materials Corp | 垂直ブレード型プローブ、垂直ブレード型プローブユニット及びそれを用いた垂直ブレード型プローブカード |
| JP3991682B2 (ja) * | 2001-12-28 | 2007-10-17 | 松下電器産業株式会社 | ガラスの精密孔あけ方法、光ファイバーコネクタ用フェルールの製造方法および磁気ディスクガラス基板の製造方法 |
| KR100791136B1 (ko) * | 2002-04-16 | 2008-01-02 | 닛폰 하츠죠 가부시키가이샤 | 도전성 접촉자용 홀더 |
| JP4905872B2 (ja) * | 2005-02-18 | 2012-03-28 | 日本発條株式会社 | 導電性接触子ユニット |
| US20090205372A1 (en) * | 2005-07-13 | 2009-08-20 | Toyko Electron Limited | Method and device for forming hole in glass substrate |
| JP5005195B2 (ja) * | 2005-07-13 | 2012-08-22 | 東京エレクトロン株式会社 | プローブカード製造方法 |
| JP4884753B2 (ja) * | 2005-11-22 | 2012-02-29 | 日本発條株式会社 | 導電性接触子ユニットおよび導電性接触子 |
-
2007
- 2007-04-18 WO PCT/JP2007/058420 patent/WO2007123150A1/ja not_active Ceased
- 2007-04-18 TW TW96113702A patent/TW200809209A/zh not_active IP Right Cessation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI422834B (zh) * | 2009-11-04 | 2014-01-11 | Nihon Micronics Kk | A probe guide member and a test method having a probe card and a semiconductor device using the same |
| TWI684011B (zh) * | 2016-07-28 | 2020-02-01 | 義大利商探針科技公司 | 電子裝置用探針卡 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2007123150A1 (ja) | 2007-11-01 |
| TWI328685B (https=) | 2010-08-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |