TW200802534A - Substrate processing apparatus and substrate processing method - Google Patents
Substrate processing apparatus and substrate processing methodInfo
- Publication number
- TW200802534A TW200802534A TW96107285A TW96107285A TW200802534A TW 200802534 A TW200802534 A TW 200802534A TW 96107285 A TW96107285 A TW 96107285A TW 96107285 A TW96107285 A TW 96107285A TW 200802534 A TW200802534 A TW 200802534A
- Authority
- TW
- Taiwan
- Prior art keywords
- drying
- substrate
- substrate processing
- remove
- rinse liquid
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
Abstract
The substrate processing apparatus provides the first processing solvent supply means 12 to supply the etchant because of peel as for the changing in quality layer 207, and the second processing solvent supply means 13 that supplies the solution for removal from the resist pattern 206 as for the unnecessary resist, and the third processing solvent supply means 15 in which the rinse liquid to remove the etchant or the solution supplied on the substrate is supplied, and the drying means 11 to process drying to remove the rinse liquid on the substrate, and the control means 17 that does motion control of the drying means 11. When the drying means 11 processes the drying to remove the rinse liquid for which is used to remove the etchant from the substrate, the control means 17 stops the drying process with the rinse liquid remains at least in all aspects of the substrate.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006057516A JP4674904B2 (en) | 2006-03-03 | 2006-03-03 | Substrate processing apparatus and substrate processing method |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200802534A true TW200802534A (en) | 2008-01-01 |
TWI346973B TWI346973B (en) | 2011-08-11 |
Family
ID=38459194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096107285A TWI346973B (en) | 2006-03-03 | 2007-03-02 | Substrate processing apparatus and substrate processing method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4674904B2 (en) |
TW (1) | TWI346973B (en) |
WO (1) | WO2007100099A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9601358B2 (en) | 2014-08-15 | 2017-03-21 | SCREEN Holdings Co., Ltd. | Substrate treatment apparatus, and substrate treatment method |
TWI587928B (en) * | 2010-10-13 | 2017-06-21 | 東京應化工業股份有限公司 | Coating apparatus and coating method |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007273826A (en) * | 2006-03-31 | 2007-10-18 | Tokyo Electron Ltd | Reflow method, pattern formation method, and manufacturing method of tft element for liquid crystal display |
JP2010103551A (en) * | 2009-12-17 | 2010-05-06 | Tokyo Electron Ltd | Substrate processing device |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3616584B2 (en) * | 2000-06-12 | 2005-02-02 | 鹿児島日本電気株式会社 | Pattern forming method and display device manufacturing method using the same |
JP4410951B2 (en) * | 2001-02-27 | 2010-02-10 | Nec液晶テクノロジー株式会社 | Pattern forming method and manufacturing method of liquid crystal display device |
JP3810056B2 (en) * | 2001-03-22 | 2006-08-16 | 東京エレクトロン株式会社 | Substrate processing method, development processing method, and substrate processing apparatus |
JP3741655B2 (en) * | 2002-03-04 | 2006-02-01 | 東京エレクトロン株式会社 | Liquid processing method and liquid processing apparatus |
JP2004134627A (en) * | 2002-10-11 | 2004-04-30 | Seiko Epson Corp | Process for removing organic layer |
JP2005159293A (en) * | 2003-09-18 | 2005-06-16 | Nec Kagoshima Ltd | Device and method for treating substrate |
JP2005251989A (en) * | 2004-03-04 | 2005-09-15 | Sharp Corp | Substrate processing apparatus |
JP2006013228A (en) * | 2004-06-28 | 2006-01-12 | Toshiba Corp | Substrate processing method and substrate processor |
JP4524744B2 (en) * | 2004-04-14 | 2010-08-18 | 日本電気株式会社 | Method for forming organic mask and pattern forming method using the organic mask |
-
2006
- 2006-03-03 JP JP2006057516A patent/JP4674904B2/en not_active Expired - Fee Related
-
2007
- 2007-03-02 TW TW096107285A patent/TWI346973B/en not_active IP Right Cessation
- 2007-03-02 WO PCT/JP2007/054075 patent/WO2007100099A1/en active Application Filing
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI587928B (en) * | 2010-10-13 | 2017-06-21 | 東京應化工業股份有限公司 | Coating apparatus and coating method |
US9601358B2 (en) | 2014-08-15 | 2017-03-21 | SCREEN Holdings Co., Ltd. | Substrate treatment apparatus, and substrate treatment method |
US10096493B2 (en) | 2014-08-15 | 2018-10-09 | SCREEN Holdings Co., Ltd. | Substrate treatment apparatus, and substrate treatment method |
Also Published As
Publication number | Publication date |
---|---|
JP4674904B2 (en) | 2011-04-20 |
WO2007100099A1 (en) | 2007-09-07 |
TWI346973B (en) | 2011-08-11 |
JP2007235025A (en) | 2007-09-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |