TW200745985A - Process abnorality analyzing device and method thereof, and memory medium - Google Patents

Process abnorality analyzing device and method thereof, and memory medium

Info

Publication number
TW200745985A
TW200745985A TW096108739A TW96108739A TW200745985A TW 200745985 A TW200745985 A TW 200745985A TW 096108739 A TW096108739 A TW 096108739A TW 96108739 A TW96108739 A TW 96108739A TW 200745985 A TW200745985 A TW 200745985A
Authority
TW
Taiwan
Prior art keywords
abnormality
analyzing device
statistic
well
section
Prior art date
Application number
TW096108739A
Other languages
English (en)
Inventor
Toshikazu Nakamura
Shigeru Obayashi
Kenichiro Hagiwara
Yoshikazu Aikawa
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Publication of TW200745985A publication Critical patent/TW200745985A/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
    • G06Q50/04—Manufacturing
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Business, Economics & Management (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Automation & Control Theory (AREA)
  • Economics (AREA)
  • Strategic Management (AREA)
  • Manufacturing & Machinery (AREA)
  • General Health & Medical Sciences (AREA)
  • Human Resources & Organizations (AREA)
  • Marketing (AREA)
  • Primary Health Care (AREA)
  • Health & Medical Sciences (AREA)
  • Tourism & Hospitality (AREA)
  • General Business, Economics & Management (AREA)
  • Theoretical Computer Science (AREA)
  • General Factory Administration (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing And Monitoring For Control Systems (AREA)
TW096108739A 2006-03-15 2007-03-14 Process abnorality analyzing device and method thereof, and memory medium TW200745985A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006070932A JP2007250748A (ja) 2006-03-15 2006-03-15 プロセス異常分析装置および方法並びにプログラム

Publications (1)

Publication Number Publication Date
TW200745985A true TW200745985A (en) 2007-12-16

Family

ID=38594732

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096108739A TW200745985A (en) 2006-03-15 2007-03-14 Process abnorality analyzing device and method thereof, and memory medium

Country Status (4)

Country Link
US (1) US20070255442A1 (zh)
JP (1) JP2007250748A (zh)
KR (1) KR20070093842A (zh)
TW (1) TW200745985A (zh)

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TWI721314B (zh) * 2017-09-25 2021-03-11 日商斯庫林集團股份有限公司 異常檢測裝置及異常檢測方法
CN113189967A (zh) * 2021-05-06 2021-07-30 郑州轻工业大学 一种半导体制程批间控制系统的控制性能诊断方法

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JP4976996B2 (ja) * 2007-12-05 2012-07-18 ヤフー株式会社 操作状態監視方法、操作状態監視装置、及びプログラム
JP4911055B2 (ja) * 2008-02-05 2012-04-04 富士電機株式会社 バッチプロセスデータの解析装置およびそれを用いた異常検出／品質推定装置
US8364300B2 (en) * 2008-10-03 2013-01-29 Invensys Systems, Inc. Retrieving and navigating through manufacturing data from relational and time-series systems by abstracting the source systems into a set of named entities
JP5510642B2 (ja) * 2010-02-25 2014-06-04 富士電機株式会社 予測・診断モデルの構築装置
JP5855841B2 (ja) 2011-04-01 2016-02-09 株式会社日立国際電気 管理装置
CN102768511B (zh) * 2011-05-05 2014-10-29 北京三博中自科技有限公司 一种流程行业故障事件的原因搜索方法和系统
US9110452B2 (en) * 2011-09-19 2015-08-18 Fisher-Rosemount Systems, Inc. Inferential process modeling, quality prediction and fault detection using multi-stage data segregation
ES2745701T3 (es) * 2012-05-15 2020-03-03 Univ Of Lancaster Identificación de estado anómalo de sistema
CN103095488A (zh) * 2012-12-14 2013-05-08 北京思特奇信息技术股份有限公司 一种自助终端外设硬件状态监控系统及方法
CN103399572B (zh) * 2013-08-01 2016-06-08 北京全路通信信号研究设计院集团有限公司 设备故障检测方法和装置
US9971665B2 (en) 2014-03-31 2018-05-15 Honeywell International Inc. Subscription methods and systems for component information of a system
CN103926919B (zh) * 2014-04-29 2016-08-17 华东理工大学 基于小波变换和Lasso函数的工业过程故障检测方法
KR101522385B1 (ko) * 2014-05-02 2015-05-26 연세대학교 산학협력단 반도체 제조 공정에서의 이상 감지 방법, 장치 및 기록매체
US11378426B2 (en) * 2014-06-20 2022-07-05 Applied Materials, Inc. System and method for monitoring sensor linearity as part of a production process
CN104267668B (zh) * 2014-09-02 2017-05-10 上海交通大学 基于贝叶斯方法的航天阀门零件加工过程故障诊断方法
WO2016088362A1 (ja) * 2014-12-05 2016-06-09 日本電気株式会社 システム分析装置、システム分析方法および記憶媒体
CN104731056B (zh) * 2015-01-28 2018-01-05 蓝星（北京）技术中心有限公司 快速判断化工生产装置的运行稳定性的方法
KR101849894B1 (ko) * 2015-05-21 2018-04-17 닛산 지도우샤 가부시키가이샤 고장 진단 장치 및 고장 진단 방법
US10599992B1 (en) 2015-09-10 2020-03-24 EMC IP Holding Company LLC Predicting reliability of product and part combinations using machine learning based on shared model
US10175686B2 (en) * 2015-10-14 2019-01-08 Honeywell International Inc. Devices, methods, and systems for a distributed rule based automated fault detection
US20180356811A1 (en) * 2017-06-12 2018-12-13 Honeywell International Inc. Apparatus and method for automated identification and diagnosis of constraint violations
KR102382820B1 (ko) * 2017-08-09 2022-04-04 삼성에스디에스 주식회사 공정 관리 방법 및 그 장치
JP7019364B2 (ja) * 2017-09-29 2022-02-15 エヌ・ティ・ティ・コミュニケーションズ株式会社 監視装置、監視方法、監視プログラム、表示装置、表示方法および表示プログラム
CN108345284B (zh) * 2018-03-06 2020-06-16 宁波大学 一种基于两变量块的质量相关故障检测方法
ES2938488T3 (es) * 2018-06-06 2023-04-11 Siemens Ag Método y dispositivo informático para realizar una búsqueda de intervalo en datos numéricos de series temporales
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US11093315B2 (en) * 2019-03-22 2021-08-17 Toyota Motor Engineering & Manufacturing North America, Inc. Systems and methods for detecting a fault or a model mismatch
CN109991951B (zh) * 2019-04-28 2020-10-02 齐鲁工业大学 多源故障检测与诊断方法和装置
CN113433907B (zh) * 2021-06-24 2022-05-10 中国航空综合技术研究所 基于可靠性关键特性的航空机电产品设计可靠性控制方法
CN113722328B (zh) * 2021-09-03 2023-12-12 国网甘肃省电力公司庆阳供电公司 高压开关设备故障的多源时空分析算法

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Publication number Priority date Publication date Assignee Title
TWI721314B (zh) * 2017-09-25 2021-03-11 日商斯庫林集團股份有限公司 異常檢測裝置及異常檢測方法
CN113189967A (zh) * 2021-05-06 2021-07-30 郑州轻工业大学 一种半导体制程批间控制系统的控制性能诊断方法

Also Published As

Publication number Publication date
JP2007250748A (ja) 2007-09-27
US20070255442A1 (en) 2007-11-01
KR20070093842A (ko) 2007-09-19

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