TW200745540A - Device for testing edge of glass substrate and method thereof - Google Patents

Device for testing edge of glass substrate and method thereof

Info

Publication number
TW200745540A
TW200745540A TW096120343A TW96120343A TW200745540A TW 200745540 A TW200745540 A TW 200745540A TW 096120343 A TW096120343 A TW 096120343A TW 96120343 A TW96120343 A TW 96120343A TW 200745540 A TW200745540 A TW 200745540A
Authority
TW
Taiwan
Prior art keywords
glass substrate
scanning
edge
along
edges
Prior art date
Application number
TW096120343A
Other languages
Chinese (zh)
Other versions
TWI336398B (en
Inventor
Woon-Young Baek
Sun-Bok Na
Original Assignee
K C Tech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by K C Tech Co Ltd filed Critical K C Tech Co Ltd
Publication of TW200745540A publication Critical patent/TW200745540A/en
Application granted granted Critical
Publication of TWI336398B publication Critical patent/TWI336398B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
    • G01N2021/891—Edge discrimination, e.g. by signal filtering

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention relates to a device for testing edge of glass substrate and method using the device for testing edge of glass substrate. The device for testing edge of glass substrate includes: a transfer part for transferring a glass substrate along a specific direction; a fixed scanning module arranged at two sides of a surface of the glass substrate and separated from the glass substrate with a distance equal to the focal length for scanning the edges of the two sides of the glass substrate in transferring; a movable scanning module rectilinearly reciprocating on the terminal part along the transferring direction of the glass substrate, wherein the movable scanning module performs scanning along the front edge of the glass substrate in a suspending state in the initial movement, and performs scanning along the back edge of the glass substrate in a suspending state in the returned movement; and a control part for collecting images scanned by the scanning modules and determining whether there are defects on the edges of the glass substrate. The present invention is able to rapidly and accurately inspect whether there are defects on the edges of the glass substrate, so as to significantly increase the inspecting efficiency.
TW096120343A 2006-06-07 2007-06-06 Device for testing edge of glass substrate and method thereof TWI336398B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060050635A KR100775024B1 (en) 2006-06-07 2006-06-07 Device for testing edge of glass substrate and method thereof

Publications (2)

Publication Number Publication Date
TW200745540A true TW200745540A (en) 2007-12-16
TWI336398B TWI336398B (en) 2011-01-21

Family

ID=38937533

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096120343A TWI336398B (en) 2006-06-07 2007-06-06 Device for testing edge of glass substrate and method thereof

Country Status (3)

Country Link
KR (1) KR100775024B1 (en)
CN (1) CN101086444B (en)
TW (1) TWI336398B (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100922808B1 (en) 2009-06-02 2009-10-21 와이즈플래닛(주) Visual encoder system using line scan camera
JP2014061561A (en) * 2012-09-20 2014-04-10 Yaskawa Electric Corp Robot system and article manufacturing method
KR101416372B1 (en) 2012-10-26 2014-07-08 기아자동차 주식회사 Device and method for detecting surface defects of shaft
KR20150085224A (en) * 2014-01-15 2015-07-23 코닝정밀소재 주식회사 Apparatus for inspecting a edge of substrate
CN104061860A (en) * 2014-07-04 2014-09-24 无锡吉兴汽车声学部件科技有限公司 Automatic plane scanning device for automobile rear shelf detection device
CN105043257A (en) * 2015-08-10 2015-11-11 苏州听毅华自动化设备有限公司 Automatic scanner capable of oblique scanning
CN107064173A (en) * 2017-01-03 2017-08-18 中国科学院上海光学精密机械研究所 The detection means and detection method of large-scale planar optical elements beauty defects
CN107504930B (en) * 2017-08-10 2019-11-26 苏州玻色智能科技有限公司 The detection device of curved surface or globoidal glass panel
CN107884417A (en) * 2017-12-11 2018-04-06 苏州精濑光电有限公司 A kind of substrate edges check machine and marginal check method
KR102580389B1 (en) * 2018-02-13 2023-09-19 코닝 인코포레이티드 Apparatus and method for inspecting a glass sheet
CN109916910B (en) * 2019-03-27 2022-02-25 中建材凯盛机器人（上海）有限公司 Photovoltaic glass edge defect detection system and corresponding method
CN111504221A (en) * 2020-05-15 2020-08-07 苏州精濑光电有限公司 Screen image focus tracking device and method thereof
CN111474599A (en) * 2020-05-19 2020-07-31 深圳市华星光电半导体显示技术有限公司 Foreign matter detection device for glass substrate and detection method thereof

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10300431A (en) 1997-04-21 1998-11-13 Dainippon Printing Co Ltd Dimension measuring device
US6359686B1 (en) * 1999-06-29 2002-03-19 Corning Incorporated Inspection system for sheet material
US6610992B1 (en) 2000-07-19 2003-08-26 Clasmet Rotating beam method and system for measuring part edges and openings
JP3948522B2 (en) 2003-01-30 2007-07-25 株式会社タカトリ LCD panel polarizing plate adhesion accuracy inspection method
KR100583701B1 (en) * 2003-11-21 2006-06-08 브룩스오토메이션아시아(주) Device and method for detecting broken edge of glass substrate
JP2006110642A (en) * 2004-10-12 2006-04-27 Shiraitekku:Kk Polishing apparatus
KR100624029B1 (en) * 2004-11-03 2006-09-15 (주)알티에스 Apparatus and method for processing of LCD panel
KR100802596B1 (en) * 2006-05-11 2008-02-13 (주)와이티에스 Laser marking system with inspecting ID position and the inspecting method therethrough

Also Published As

Publication number Publication date
CN101086444A (en) 2007-12-12
TWI336398B (en) 2011-01-21
CN101086444B (en) 2010-04-07
KR100775024B1 (en) 2007-11-08

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Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees