TW200745540A - Device for testing edge of glass substrate and method thereof - Google Patents
Device for testing edge of glass substrate and method thereofInfo
- Publication number
- TW200745540A TW200745540A TW096120343A TW96120343A TW200745540A TW 200745540 A TW200745540 A TW 200745540A TW 096120343 A TW096120343 A TW 096120343A TW 96120343 A TW96120343 A TW 96120343A TW 200745540 A TW200745540 A TW 200745540A
- Authority
- TW
- Taiwan
- Prior art keywords
- glass substrate
- scanning
- edge
- along
- edges
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
- G01N2021/891—Edge discrimination, e.g. by signal filtering
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The present invention relates to a device for testing edge of glass substrate and method using the device for testing edge of glass substrate. The device for testing edge of glass substrate includes: a transfer part for transferring a glass substrate along a specific direction; a fixed scanning module arranged at two sides of a surface of the glass substrate and separated from the glass substrate with a distance equal to the focal length for scanning the edges of the two sides of the glass substrate in transferring; a movable scanning module rectilinearly reciprocating on the terminal part along the transferring direction of the glass substrate, wherein the movable scanning module performs scanning along the front edge of the glass substrate in a suspending state in the initial movement, and performs scanning along the back edge of the glass substrate in a suspending state in the returned movement; and a control part for collecting images scanned by the scanning modules and determining whether there are defects on the edges of the glass substrate. The present invention is able to rapidly and accurately inspect whether there are defects on the edges of the glass substrate, so as to significantly increase the inspecting efficiency.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060050635A KR100775024B1 (en) | 2006-06-07 | 2006-06-07 | Device for testing edge of glass substrate and method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200745540A true TW200745540A (en) | 2007-12-16 |
TWI336398B TWI336398B (en) | 2011-01-21 |
Family
ID=38937533
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096120343A TWI336398B (en) | 2006-06-07 | 2007-06-06 | Device for testing edge of glass substrate and method thereof |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100775024B1 (en) |
CN (1) | CN101086444B (en) |
TW (1) | TWI336398B (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100922808B1 (en) | 2009-06-02 | 2009-10-21 | 와이즈플래닛(주) | Visual encoder system using line scan camera |
JP2014061561A (en) * | 2012-09-20 | 2014-04-10 | Yaskawa Electric Corp | Robot system and article manufacturing method |
KR101416372B1 (en) | 2012-10-26 | 2014-07-08 | 기아자동차 주식회사 | Device and method for detecting surface defects of shaft |
KR20150085224A (en) * | 2014-01-15 | 2015-07-23 | 코닝정밀소재 주식회사 | Apparatus for inspecting a edge of substrate |
CN104061860A (en) * | 2014-07-04 | 2014-09-24 | 无锡吉兴汽车声学部件科技有限公司 | Automatic plane scanning device for automobile rear shelf detection device |
CN105043257A (en) * | 2015-08-10 | 2015-11-11 | 苏州听毅华自动化设备有限公司 | Automatic scanner capable of oblique scanning |
CN107064173A (en) * | 2017-01-03 | 2017-08-18 | 中国科学院上海光学精密机械研究所 | The detection means and detection method of large-scale planar optical elements beauty defects |
CN107504930B (en) * | 2017-08-10 | 2019-11-26 | 苏州玻色智能科技有限公司 | The detection device of curved surface or globoidal glass panel |
CN107884417A (en) * | 2017-12-11 | 2018-04-06 | 苏州精濑光电有限公司 | A kind of substrate edges check machine and marginal check method |
KR102580389B1 (en) * | 2018-02-13 | 2023-09-19 | 코닝 인코포레이티드 | Apparatus and method for inspecting a glass sheet |
CN109916910B (en) * | 2019-03-27 | 2022-02-25 | 中建材凯盛机器人(上海)有限公司 | Photovoltaic glass edge defect detection system and corresponding method |
CN111504221A (en) * | 2020-05-15 | 2020-08-07 | 苏州精濑光电有限公司 | Screen image focus tracking device and method thereof |
CN111474599A (en) * | 2020-05-19 | 2020-07-31 | 深圳市华星光电半导体显示技术有限公司 | Foreign matter detection device for glass substrate and detection method thereof |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10300431A (en) | 1997-04-21 | 1998-11-13 | Dainippon Printing Co Ltd | Dimension measuring device |
US6359686B1 (en) * | 1999-06-29 | 2002-03-19 | Corning Incorporated | Inspection system for sheet material |
US6610992B1 (en) | 2000-07-19 | 2003-08-26 | Clasmet | Rotating beam method and system for measuring part edges and openings |
JP3948522B2 (en) | 2003-01-30 | 2007-07-25 | 株式会社タカトリ | LCD panel polarizing plate adhesion accuracy inspection method |
KR100583701B1 (en) * | 2003-11-21 | 2006-06-08 | 브룩스오토메이션아시아(주) | Device and method for detecting broken edge of glass substrate |
JP2006110642A (en) * | 2004-10-12 | 2006-04-27 | Shiraitekku:Kk | Polishing apparatus |
KR100624029B1 (en) * | 2004-11-03 | 2006-09-15 | (주)알티에스 | Apparatus and method for processing of LCD panel |
KR100802596B1 (en) * | 2006-05-11 | 2008-02-13 | (주)와이티에스 | Laser marking system with inspecting ID position and the inspecting method therethrough |
-
2006
- 2006-06-07 KR KR1020060050635A patent/KR100775024B1/en active IP Right Grant
-
2007
- 2007-04-30 CN CN2007101077975A patent/CN101086444B/en not_active Expired - Fee Related
- 2007-06-06 TW TW096120343A patent/TWI336398B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN101086444A (en) | 2007-12-12 |
TWI336398B (en) | 2011-01-21 |
CN101086444B (en) | 2010-04-07 |
KR100775024B1 (en) | 2007-11-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |