TW200741226A - Calibration apparatus, calibration method, testing apparatus, and testing method - Google Patents

Calibration apparatus, calibration method, testing apparatus, and testing method

Info

Publication number
TW200741226A
TW200741226A TW096108214A TW96108214A TW200741226A TW 200741226 A TW200741226 A TW 200741226A TW 096108214 A TW096108214 A TW 096108214A TW 96108214 A TW96108214 A TW 96108214A TW 200741226 A TW200741226 A TW 200741226A
Authority
TW
Taiwan
Prior art keywords
calibration
testing
electronic device
component
calibrating
Prior art date
Application number
TW096108214A
Other languages
English (en)
Inventor
Kiyotaka Ichiyama
Masahiro Ishida
Takahiro Yamaguchi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200741226A publication Critical patent/TW200741226A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
TW096108214A 2006-03-10 2007-03-09 Calibration apparatus, calibration method, testing apparatus, and testing method TW200741226A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/371,849 US7554332B2 (en) 2006-03-10 2006-03-10 Calibration apparatus, calibration method, testing apparatus, and testing method

Publications (1)

Publication Number Publication Date
TW200741226A true TW200741226A (en) 2007-11-01

Family

ID=38478906

Family Applications (2)

Application Number Title Priority Date Filing Date
TW096108214A TW200741226A (en) 2006-03-10 2007-03-09 Calibration apparatus, calibration method, testing apparatus, and testing method
TW096108201A TWI409477B (zh) 2006-03-10 2007-03-09 抖動測量裝置、電子元件以及測試裝置

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW096108201A TWI409477B (zh) 2006-03-10 2007-03-09 抖動測量裝置、電子元件以及測試裝置

Country Status (5)

Country Link
US (2) US7554332B2 (zh)
JP (2) JP5066075B2 (zh)
DE (1) DE112007000571T5 (zh)
TW (2) TW200741226A (zh)
WO (1) WO2007105562A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8415979B2 (en) 2010-11-04 2013-04-09 Mediatek Inc. Differential driver with calibration circuit and related calibration method
TWI570418B (zh) * 2014-11-26 2017-02-11 環鴻科技股份有限公司 量測信號延遲時間之裝置及方法

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Publication number Priority date Publication date Assignee Title
DE102006007617A1 (de) * 2005-02-14 2006-08-24 Advantest Corp. Jittermessvorrichtung, Jittermessverfahren, Prüfvorrichtung und Elektronische Vorrichtung
US7352190B1 (en) * 2006-10-17 2008-04-01 Advantest Corporation Calibration apparatus, calibration method, and testing apparatus
US7957698B2 (en) * 2008-03-11 2011-06-07 Mediatek Inc. Demodulator with output level calibration
US8026726B2 (en) * 2009-01-23 2011-09-27 Silicon Image, Inc. Fault testing for interconnections
JP5218535B2 (ja) * 2010-12-09 2013-06-26 横河電機株式会社 パルス信号受信装置及び伝送システム

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JPH0413273A (ja) * 1990-05-01 1992-01-17 Canon Inc 画像信号の再生装置
JP2536404B2 (ja) * 1993-05-31 1996-09-18 日本電気株式会社 半導体集積回路装置
JPH0964278A (ja) * 1995-08-24 1997-03-07 Fujitsu Ltd 半導体集積回路及びその試験方法
CN1209631C (zh) * 1998-01-30 2005-07-06 波峰有限公司 用于抖动分析的方法
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US6594595B2 (en) 2001-04-03 2003-07-15 Advantest Corporation Apparatus for and method of measuring cross-correlation coefficient between signals
JP2003179142A (ja) 2001-12-10 2003-06-27 Nec Microsystems Ltd ジッタ検査回路を搭載した半導体装置およびそのジッタ検査方法
JP4045105B2 (ja) * 2002-01-30 2008-02-13 株式会社日立産機システム パルス幅変調方法、電力変換装置、およびインバータ装置
DE10219916A1 (de) * 2002-05-03 2003-12-04 Infineon Technologies Ag Testanordnung mit Testautomat und integriertem Schaltkreis sowie Verfahren zur Ermittlung des Zeitverhaltens eines integrierten Schaltkreises
US7359468B2 (en) * 2002-05-17 2008-04-15 Broadcom Corporation Apparatus for synchronizing clock and data between two domains having unknown but coherent phase
JP2004013273A (ja) 2002-06-04 2004-01-15 Ntt Comware Corp ユーザ認証システム、ユーザ認証方法、ユーザ認証プログラムおよび記録媒体
JP4152710B2 (ja) 2002-10-01 2008-09-17 株式会社アドバンテスト ジッタ測定装置、及び試験装置
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JP2004226191A (ja) 2003-01-22 2004-08-12 Sharp Corp 高周波集積回路テスト装置
US7206343B2 (en) * 2003-01-24 2007-04-17 Intersil Americas Inc. High resolution digital pulse width modulator for DC-DC voltage converter
US6928127B2 (en) * 2003-03-11 2005-08-09 Atheros Communications, Inc. Frequency synthesizer with prescaler
DE60311576T2 (de) 2003-08-20 2007-08-16 Verigy (Singapore) Pte. Ltd. Spektrale Jitter-Analyse mit Jitter-Modulation-Wellenform-Analyse
US7136773B2 (en) 2003-12-16 2006-11-14 Advantest Corporation Testing apparatus and testing method
JP4266350B2 (ja) 2004-02-12 2009-05-20 株式会社ルネサステクノロジ テスト回路
JP2006003255A (ja) 2004-06-18 2006-01-05 Anritsu Corp ジッタ測定方法およびジッタ測定装置
GB0416627D0 (en) * 2004-07-26 2004-08-25 Toric Ltd Anti-jitter circuits
JP2006064667A (ja) * 2004-08-30 2006-03-09 Renesas Technology Corp 半導体検査装置
JP4692012B2 (ja) * 2005-02-18 2011-06-01 三菱電機株式会社 コンバ−タ制御装置
JP2006342042A (ja) 2005-05-13 2006-12-21 Ideal Star Inc Ｄｎａ内包炭素クラスターとその製造装置及び製造方法
DE102005024649B4 (de) * 2005-05-25 2007-04-12 Infineon Technologies Ag Vorrichtung und Verfahren zum Messen von Jitter
US8068538B2 (en) * 2005-11-04 2011-11-29 Advantest Corporation Jitter measuring apparatus, jitter measuring method and test apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8415979B2 (en) 2010-11-04 2013-04-09 Mediatek Inc. Differential driver with calibration circuit and related calibration method
TWI570418B (zh) * 2014-11-26 2017-02-11 環鴻科技股份有限公司 量測信號延遲時間之裝置及方法

Also Published As

Publication number Publication date
JPWO2007105564A1 (ja) 2009-07-30
JP4954193B2 (ja) 2012-06-13
JP5066075B2 (ja) 2012-11-07
TWI409477B (zh) 2013-09-21
US20070236284A1 (en) 2007-10-11
US8204165B2 (en) 2012-06-19
US20070211795A1 (en) 2007-09-13
TW200741225A (en) 2007-11-01
US7554332B2 (en) 2009-06-30
WO2007105562A1 (ja) 2007-09-20
DE112007000571T5 (de) 2009-01-22
JPWO2007105562A1 (ja) 2009-07-30

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