MX2009006226A - Metodos y sistema para medir un objeto. - Google Patents
Metodos y sistema para medir un objeto.Info
- Publication number
- MX2009006226A MX2009006226A MX2009006226A MX2009006226A MX2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A
- Authority
- MX
- Mexico
- Prior art keywords
- measuring
- rotary scan
- range sensor
- includes positioning
- geometric parameters
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Abstract
Un método para medir un objeto incluye posicionar el objeto en una plataforma movible, realizar un escaneo giratorio del objeto con un sensor del rango y determinar parámetros geométricos del objeto con base en el escaneo giratorio.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/642,076 US7768655B2 (en) | 2006-12-20 | 2006-12-20 | Methods and system for measuring an object |
PCT/US2007/085994 WO2008076608A1 (en) | 2006-12-20 | 2007-11-30 | Method and system for measuring an object |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2009006226A true MX2009006226A (es) | 2009-06-22 |
Family
ID=39154015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2009006226A MX2009006226A (es) | 2006-12-20 | 2007-11-30 | Metodos y sistema para medir un objeto. |
Country Status (8)
Country | Link |
---|---|
US (1) | US7768655B2 (es) |
EP (1) | EP2095066A1 (es) |
JP (1) | JP2010513927A (es) |
CN (1) | CN101611291B (es) |
AU (1) | AU2007334217A1 (es) |
CA (1) | CA2672475A1 (es) |
MX (1) | MX2009006226A (es) |
WO (1) | WO2008076608A1 (es) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7876454B2 (en) * | 2006-12-20 | 2011-01-25 | General Electric Company | Method and system for measurement of a cutting tool |
CN101358825B (zh) * | 2007-08-01 | 2010-09-29 | 鸿富锦精密工业(深圳)有限公司 | 端面跳动测量仪 |
WO2009113068A1 (en) * | 2008-03-12 | 2009-09-17 | Optimet, Optical Metrology Ltd. | Intraoral imaging system and method based on conoscopic holography |
US7924439B2 (en) * | 2008-09-29 | 2011-04-12 | General Electric Company | Method and system for parameter extraction of a cutting tool |
US10274263B2 (en) * | 2009-04-09 | 2019-04-30 | General Electric Company | Method and apparatus for improved cooling of a heat sink using a synthetic jet |
US9478479B2 (en) | 2010-10-26 | 2016-10-25 | General Electric Company | Thermal management system and method |
US9615482B2 (en) * | 2009-12-11 | 2017-04-04 | General Electric Company | Shaped heat sinks to optimize flow |
US8112172B2 (en) * | 2009-04-29 | 2012-02-07 | General Electric Company | Method and system for gash parameter extraction of a cutting tool |
US9325974B2 (en) | 2011-06-07 | 2016-04-26 | Creaform Inc. | Sensor positioning for 3D scanning |
CN102322818A (zh) * | 2011-08-11 | 2012-01-18 | 武汉材料保护研究所 | 一种用光学三维形貌仪测量机械加工车刀片vb值的方法 |
CN103017677B (zh) * | 2011-09-23 | 2015-07-15 | 通用电气公司 | 测量刀具的刀刃轮廓的方法 |
JP6429772B2 (ja) | 2012-07-04 | 2018-11-28 | クレアフォーム・インコーポレイテッドCreaform Inc. | 3d走査および位置決めシステム |
EP2875314B1 (en) | 2012-07-18 | 2017-08-16 | Creaform Inc. | System and method for 3d scanning of the surface geometry of an object |
KR101448510B1 (ko) * | 2014-04-10 | 2014-10-14 | 순환엔지니어링 주식회사 | 스테이지의 직각도 측정 시스템 및 이를 이용한 스테이지의 홈 포지셔닝 방법 |
DE102014111240A1 (de) * | 2014-08-07 | 2016-02-11 | Walter Maschinenbau Gmbh | Verfahren und Vorrichtung zur Bestimmung wenigstens eines Modellparameters eines virtuellen Werkzeugmodells eines Werkzeugs |
DE102015105999B4 (de) | 2015-04-20 | 2016-11-10 | Walter Maschinenbau Gmbh | Verfahren und Vorrichtung zur materialabtragenden Bearbeitung eines Werkzeuges |
JP6691837B2 (ja) * | 2016-06-27 | 2020-05-13 | 株式会社キーエンス | 測定装置 |
WO2018027259A1 (en) | 2016-08-08 | 2018-02-15 | Bionics Institute | Systems and methods for monitoring neural activity |
DE102017106741B4 (de) * | 2017-03-29 | 2019-11-14 | Jenoptik Industrial Metrology Germany Gmbh | Oberflächenmessgerät |
JP7144450B2 (ja) | 2017-05-22 | 2022-09-29 | ディープ・ブレイン・スティムレーション・テクノロジーズ・ピーティーワイ・リミテッド | 神経活動をモニタするためのシステム及び方法 |
DE102018103420A1 (de) | 2018-02-15 | 2019-08-22 | Jenoptik Industrial Metrology Germany Gmbh | Messgerät zur Oberflächen- oder Konturmessung |
CN109444937B (zh) * | 2018-08-08 | 2021-04-02 | 北京木业邦科技有限公司 | 树木建模及抚育方法、装置、电子设备及存储介质 |
DE102020108182A1 (de) | 2019-05-07 | 2020-11-12 | Jenoptik Industrial Metrology Germany Gmbh | Oberflächenmessgerät |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
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DE2015694B2 (de) * | 1970-04-02 | 1971-11-11 | Exatest Meßtechnik GmbH, 5090 Le verkusen | Verfahren zur beruehrungslosen messung der breite oder lage eines gegenstandes mittels eines sichtstrahls |
US3692414A (en) * | 1971-02-24 | 1972-09-19 | Harry L Hosterman | Non-contacting measuring probe |
DD218672A1 (de) * | 1982-07-07 | 1985-02-13 | Ilmenau Tech Hochschule | Optisch-beruehrungslose mehrkordinaten-antasteinrichtung |
US4745290A (en) * | 1987-03-19 | 1988-05-17 | David Frankel | Method and apparatus for use in making custom shoes |
US4736247A (en) * | 1987-05-04 | 1988-04-05 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Range and range rate system |
US5369286A (en) * | 1989-05-26 | 1994-11-29 | Ann F. Koo | Method and apparatus for measuring stress in a film applied to surface of a workpiece |
DE9110287U1 (es) * | 1991-08-20 | 1991-10-02 | Siemens Ag, 8000 Muenchen, De | |
JPH05164525A (ja) * | 1991-12-16 | 1993-06-29 | Tokyo Boeki Kk | レーザ式座標測定装置の測定ヘッド |
JP2503919B2 (ja) * | 1993-10-29 | 1996-06-05 | 日本電気株式会社 | 異物検査装置 |
US5477371A (en) * | 1993-12-13 | 1995-12-19 | Shafir Production Systems Ltd. | Three-dimensional, non-contact scanning apparatus and method |
JP3378401B2 (ja) * | 1994-08-30 | 2003-02-17 | 株式会社日立メディコ | X線装置 |
US5568260A (en) * | 1995-03-31 | 1996-10-22 | General Electric Company | Precision non-contact measurement system for curved workpieces |
US5846081A (en) * | 1995-08-23 | 1998-12-08 | Bushway; Geoffrey C. | Computerized instrument platform positioning system |
JPH09178441A (ja) * | 1995-12-27 | 1997-07-11 | Technol Res Assoc Of Medical & Welfare Apparatus | 3次元形状測定装置 |
US6788807B1 (en) * | 1998-02-13 | 2004-09-07 | Minolta Co., Ltd. | Three dimensional information measurement method and apparatus |
US6185030B1 (en) * | 1998-03-20 | 2001-02-06 | James W. Overbeck | Wide field of view and high speed scanning microscopy |
JP2000329531A (ja) * | 1999-03-17 | 2000-11-30 | Minolta Co Ltd | 三次元形状計測装置および同方法 |
JP2003262510A (ja) * | 2002-03-08 | 2003-09-19 | Center For Advanced Science & Technology Incubation Ltd | 三次元形状測定方法及び三次元スキャナ |
DE10211070A1 (de) * | 2002-03-13 | 2003-09-25 | Gurny Broesch Andrea | Vorrichtung zum Vermessen eines Messobjekts |
US6862099B2 (en) * | 2002-04-05 | 2005-03-01 | Varco I/P | Tubular ovality testing |
JP4029178B2 (ja) * | 2003-01-22 | 2008-01-09 | 日本鋳鉄管株式会社 | 渦流探傷方法およびその装置 |
US20040263863A1 (en) * | 2003-01-27 | 2004-12-30 | Rogers William E | System and method for design and manufacture of custom face masks |
DE102004014153A1 (de) * | 2004-03-23 | 2005-10-13 | IBTL - Ing. Büro Lang & Armlich GmbH | Koordinatenmessgerät mit Wechseloptik |
-
2006
- 2006-12-20 US US11/642,076 patent/US7768655B2/en not_active Expired - Fee Related
-
2007
- 2007-11-30 MX MX2009006226A patent/MX2009006226A/es active IP Right Grant
- 2007-11-30 CN CN2007800515862A patent/CN101611291B/zh not_active Expired - Fee Related
- 2007-11-30 AU AU2007334217A patent/AU2007334217A1/en not_active Abandoned
- 2007-11-30 CA CA002672475A patent/CA2672475A1/en not_active Abandoned
- 2007-11-30 WO PCT/US2007/085994 patent/WO2008076608A1/en active Application Filing
- 2007-11-30 EP EP07864943A patent/EP2095066A1/en not_active Withdrawn
- 2007-11-30 JP JP2009543020A patent/JP2010513927A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
AU2007334217A1 (en) | 2008-06-26 |
EP2095066A1 (en) | 2009-09-02 |
CN101611291A (zh) | 2009-12-23 |
CA2672475A1 (en) | 2008-06-26 |
JP2010513927A (ja) | 2010-04-30 |
US20080148590A1 (en) | 2008-06-26 |
WO2008076608A1 (en) | 2008-06-26 |
US7768655B2 (en) | 2010-08-03 |
CN101611291B (zh) | 2012-04-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Grant or registration |