TW200730841A - Insert, test tray and semiconductor test device - Google Patents

Insert, test tray and semiconductor test device

Info

Publication number
TW200730841A
TW200730841A TW095137073A TW95137073A TW200730841A TW 200730841 A TW200730841 A TW 200730841A TW 095137073 A TW095137073 A TW 095137073A TW 95137073 A TW95137073 A TW 95137073A TW 200730841 A TW200730841 A TW 200730841A
Authority
TW
Taiwan
Prior art keywords
section
insert
reception
test
test device
Prior art date
Application number
TW095137073A
Other languages
Chinese (zh)
Other versions
TWI422841B (en
Inventor
Sayaka Sugano
Akihiko Ito
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200730841A publication Critical patent/TW200730841A/en
Application granted granted Critical
Publication of TWI422841B publication Critical patent/TWI422841B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

An insert is provided, which accommodates a tested semiconductor element 100 in a semiconductor test device. The insert includes a frame section 520, an IC reception section 530, a connection section and a guide section. The IC reception section 530 supports the tested semiconductor element 100. The connection section mutually connects the frame section 520 and the IC reception section 530 when their relative position is changed. The guide section, in a specified period, guides the IC reception section 530 to a relatively specified position relating to the frame section 520.
TW095137073A 2005-10-13 2006-10-05 Insert, test tray and semiconductor test device TWI422841B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2005/018845 WO2007043177A1 (en) 2005-10-13 2005-10-13 Insert, test tray and semiconductor testing apparatus

Publications (2)

Publication Number Publication Date
TW200730841A true TW200730841A (en) 2007-08-16
TWI422841B TWI422841B (en) 2014-01-11

Family

ID=37942446

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095137073A TWI422841B (en) 2005-10-13 2006-10-05 Insert, test tray and semiconductor test device

Country Status (5)

Country Link
JP (1) JP4972557B2 (en)
KR (1) KR100966169B1 (en)
CN (1) CN101283283B (en)
TW (1) TWI422841B (en)
WO (1) WO2007043177A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI468707B (en) * 2012-03-26 2015-01-11 Jae Hak Lee Insert for handler with mesh sheet and insert for handler
TWI624672B (en) * 2011-09-06 2018-05-21 精工愛普生股份有限公司 Handler and part inspection apparatus

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102221670A (en) * 2010-04-13 2011-10-19 中芯国际集成电路制造(上海)有限公司 Ball grid array test socket
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling
JP2013185892A (en) 2012-03-07 2013-09-19 Advantest Corp Socket, socket board and electronic component testing device
KR101337418B1 (en) * 2012-07-11 2013-12-06 리노공업주식회사 A test handler
CN104251922B (en) * 2013-06-27 2017-05-03 深圳市江波龙电子有限公司 Limiting frame, chip testing device and chip testing method
JP6809978B2 (en) * 2017-04-28 2021-01-06 株式会社アドバンテスト Carrier for electronic component testing equipment
JP2019007783A (en) * 2017-06-22 2019-01-17 株式会社テセック Electronic component alignment device
KR20210067612A (en) * 2019-11-29 2021-06-08 (주)테크윙 Test handler
CN114371321B (en) * 2022-01-21 2023-04-14 江西福昌发电路科技有限公司 PCB hole opening performance testing method
KR20230157096A (en) * 2022-05-09 2023-11-16 (주)포인트엔지니어링 The Electro-conductive Contact Pin And Test Device Having The Same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2940858B2 (en) * 1995-10-18 1999-08-25 株式会社アドバンテスト IC test equipment
US6369595B1 (en) * 1999-01-21 2002-04-09 Micron Technology, Inc. CSP BGA test socket with insert and method
JP4222442B2 (en) * 1999-07-16 2009-02-12 株式会社アドバンテスト Insert for electronic component testing equipment
TW530159B (en) * 1999-07-16 2003-05-01 Advantest Corp Insert for electric devices testing apparatus
JP4451992B2 (en) * 2001-02-28 2010-04-14 株式会社アドバンテスト Electronic component conveying medium for testing, electronic component testing apparatus and testing method
JP2003315408A (en) * 2002-04-18 2003-11-06 Mitsubishi Electric Corp Test board for testing semiconductor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI624672B (en) * 2011-09-06 2018-05-21 精工愛普生股份有限公司 Handler and part inspection apparatus
TWI468707B (en) * 2012-03-26 2015-01-11 Jae Hak Lee Insert for handler with mesh sheet and insert for handler

Also Published As

Publication number Publication date
CN101283283A (en) 2008-10-08
JPWO2007043177A1 (en) 2009-04-16
CN101283283B (en) 2010-09-29
KR20080057340A (en) 2008-06-24
TWI422841B (en) 2014-01-11
KR100966169B1 (en) 2010-06-25
WO2007043177A1 (en) 2007-04-19
JP4972557B2 (en) 2012-07-11

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