TW200720462A - Multiple zone sputtering target created through conductive and insulation bonding - Google Patents
Multiple zone sputtering target created through conductive and insulation bondingInfo
- Publication number
- TW200720462A TW200720462A TW095138619A TW95138619A TW200720462A TW 200720462 A TW200720462 A TW 200720462A TW 095138619 A TW095138619 A TW 095138619A TW 95138619 A TW95138619 A TW 95138619A TW 200720462 A TW200720462 A TW 200720462A
- Authority
- TW
- Taiwan
- Prior art keywords
- bonded
- conductive
- sputtering target
- target
- multiple zone
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3423—Shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3435—Target holders (includes backing plates and endblocks)
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3438—Electrodes other than cathode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3441—Dark space shields
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US73393905P | 2005-11-04 | 2005-11-04 | |
US11/399,122 US20070056845A1 (en) | 2005-09-13 | 2006-04-06 | Multiple zone sputtering target created through conductive and insulation bonding |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200720462A true TW200720462A (en) | 2007-06-01 |
Family
ID=38475304
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095138619A TW200720462A (en) | 2005-11-04 | 2006-10-19 | Multiple zone sputtering target created through conductive and insulation bonding |
Country Status (3)
Country | Link |
---|---|
US (1) | US20070056845A1 (zh) |
TW (1) | TW200720462A (zh) |
WO (1) | WO2007102882A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI585837B (zh) * | 2011-10-12 | 2017-06-01 | 歐瑞康先進科技股份有限公司 | 濺鍍蝕刻室及濺鍍方法 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9127362B2 (en) | 2005-10-31 | 2015-09-08 | Applied Materials, Inc. | Process kit and target for substrate processing chamber |
US8647484B2 (en) * | 2005-11-25 | 2014-02-11 | Applied Materials, Inc. | Target for sputtering chamber |
US8968536B2 (en) * | 2007-06-18 | 2015-03-03 | Applied Materials, Inc. | Sputtering target having increased life and sputtering uniformity |
US7901552B2 (en) | 2007-10-05 | 2011-03-08 | Applied Materials, Inc. | Sputtering target with grooves and intersecting channels |
US8968537B2 (en) | 2011-02-09 | 2015-03-03 | Applied Materials, Inc. | PVD sputtering target with a protected backing plate |
US11600477B2 (en) * | 2020-12-14 | 2023-03-07 | Applied Materials, Inc. | Gas injection process kit to eliminate arcing and improve uniform gas distribution for a PVD process |
JP2022108909A (ja) * | 2021-01-14 | 2022-07-27 | 東京エレクトロン株式会社 | 成膜装置及び成膜方法 |
Family Cites Families (69)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT1113873B (it) * | 1978-04-12 | 1986-01-27 | Battelle Memorial Institute | Procedimento per la fabbricazione di elettrodi per pile a combustibile,dispositivo per l'attuazione del procedimento elettrodi ottenuti mediante il detto procedimento |
US4272355A (en) * | 1980-02-26 | 1981-06-09 | International Business Machines Corporation | Process of bonding sputtering targets to target electrodes |
US4415427A (en) * | 1982-09-30 | 1983-11-15 | Gte Products Corporation | Thin film deposition by sputtering |
US4517070A (en) * | 1984-06-28 | 1985-05-14 | General Motors Corporation | Magnetron sputtering cathode assembly and magnet assembly therefor |
US4610775A (en) * | 1985-07-26 | 1986-09-09 | Westinghouse Electric Corp. | Method and apparatus for clearing short-circuited, high-voltage cathodes in a sputtering chamber |
US5230459A (en) * | 1992-03-18 | 1993-07-27 | Tosoh Smd, Inc. | Method of bonding a sputter target-backing plate assembly assemblies produced thereby |
US5282943A (en) * | 1992-06-10 | 1994-02-01 | Tosoh Smd, Inc. | Method of bonding a titanium containing sputter target to a backing plate and bonded target/backing plate assemblies produced thereby |
US5693203A (en) * | 1992-09-29 | 1997-12-02 | Japan Energy Corporation | Sputtering target assembly having solid-phase bonded interface |
US5328585A (en) * | 1992-12-11 | 1994-07-12 | Photran Corporation | Linear planar-magnetron sputtering apparatus with reciprocating magnet-array |
US5439524A (en) * | 1993-04-05 | 1995-08-08 | Vlsi Technology, Inc. | Plasma processing apparatus |
JPH06346234A (ja) * | 1993-06-08 | 1994-12-20 | Anelva Corp | スパッタリング装置 |
US5614055A (en) * | 1993-08-27 | 1997-03-25 | Applied Materials, Inc. | High density plasma CVD and etching reactor |
US6199259B1 (en) * | 1993-11-24 | 2001-03-13 | Applied Komatsu Technology, Inc. | Autoclave bonding of sputtering target assembly |
US5474667A (en) * | 1994-02-22 | 1995-12-12 | Materials Research Corporation | Reduced stress sputtering target and method of manufacturing therefor |
US5798029A (en) * | 1994-04-22 | 1998-08-25 | Applied Materials, Inc. | Target for sputtering equipment |
US5628869A (en) * | 1994-05-09 | 1997-05-13 | Lsi Logic Corporation | Plasma enhanced chemical vapor reactor with shaped electrodes |
WO1996015283A1 (en) * | 1994-11-15 | 1996-05-23 | Tosoh Smd, Inc. | Method of bonding targets to backing plate member |
US5593082A (en) * | 1994-11-15 | 1997-01-14 | Tosoh Smd, Inc. | Methods of bonding targets to backing plate members using solder pastes and target/backing plate assemblies bonded thereby |
WO1997003221A1 (en) * | 1995-07-10 | 1997-01-30 | Cvc Products, Inc. | Magnetron cathode apparatus and method for sputtering |
US5658442A (en) * | 1996-03-07 | 1997-08-19 | Applied Materials, Inc. | Target and dark space shield for a physical vapor deposition system |
US5819434A (en) * | 1996-04-25 | 1998-10-13 | Applied Materials, Inc. | Etch enhancement using an improved gas distribution plate |
US6274015B1 (en) * | 1996-12-13 | 2001-08-14 | Honeywell International, Inc. | Diffusion bonded sputtering target assembly with precipitation hardened backing plate and method of making same |
KR100252210B1 (ko) * | 1996-12-24 | 2000-04-15 | 윤종용 | 반도체장치 제조용 건식식각장치 |
US5981899A (en) * | 1997-01-17 | 1999-11-09 | Balzers Aktiengesellschaft | Capacitively coupled RF-plasma reactor |
US5942042A (en) * | 1997-05-23 | 1999-08-24 | Applied Materials, Inc. | Apparatus for improved power coupling through a workpiece in a semiconductor wafer processing system |
WO1998058099A1 (de) * | 1997-06-13 | 1998-12-23 | Balzers Hochvakuum Ag | Verfahren zur herstellung beschichteter werkstücke, verwendungen des verfahrens und anlage hierfür |
EP0918351A1 (en) * | 1997-11-19 | 1999-05-26 | Sinvaco N.V. | Improved planar magnetron with moving magnet assembly |
EP0921152B1 (en) * | 1997-12-02 | 2006-04-05 | Ciba SC Holding AG | Polyolefin materials having enhanced surface durability and methods of making the same by exposure to radiation |
US20020011215A1 (en) * | 1997-12-12 | 2002-01-31 | Goushu Tei | Plasma treatment apparatus and method of manufacturing optical parts using the same |
US6093293A (en) * | 1997-12-17 | 2000-07-25 | Balzers Hochvakuum Ag | Magnetron sputtering source |
KR100279963B1 (ko) * | 1997-12-30 | 2001-04-02 | 윤종용 | 반도체소자제조용가스디퓨져및이를설치한반응로 |
US6579431B1 (en) * | 1998-01-14 | 2003-06-17 | Tosoh Smd, Inc. | Diffusion bonding of high purity metals and metal alloys to aluminum backing plates using nickel or nickel alloy interlayers |
GB9808825D0 (en) * | 1998-04-24 | 1998-06-24 | Nimbus Communications Int Ltd | A disk recording system and a method of controlling the rotation of a turntable in such a disk recording system |
US20010045352A1 (en) * | 1998-05-14 | 2001-11-29 | Robinson Raymond S. | Sputter deposition using multiple targets |
JP2924891B1 (ja) * | 1998-05-15 | 1999-07-26 | 日本電気株式会社 | スパッタリング装置 |
US6073577A (en) * | 1998-06-30 | 2000-06-13 | Lam Research Corporation | Electrode for plasma processes and method for manufacture and use thereof |
US6182603B1 (en) * | 1998-07-13 | 2001-02-06 | Applied Komatsu Technology, Inc. | Surface-treated shower head for use in a substrate processing chamber |
US6619131B2 (en) * | 1998-07-16 | 2003-09-16 | Unaxis Balzers Ag | Combination pressure sensor with capacitive and thermal elements |
US6451185B2 (en) * | 1998-08-12 | 2002-09-17 | Honeywell International Inc. | Diffusion bonded sputtering target assembly with precipitation hardened backing plate and method of making same |
US6071389A (en) * | 1998-08-21 | 2000-06-06 | Tosoh Smd, Inc. | Diffusion bonded sputter target assembly and method of making |
US6749103B1 (en) * | 1998-09-11 | 2004-06-15 | Tosoh Smd, Inc. | Low temperature sputter target bonding method and target assemblies produced thereby |
EP1118095B1 (de) * | 1998-09-30 | 2015-02-25 | Oerlikon Advanced Technologies AG | Vakuumbehandlungskammer und verfahren zur oberflächenbehandlung |
US6521108B1 (en) * | 1998-12-29 | 2003-02-18 | Tosoh Smd, Inc. | Diffusion bonded sputter target assembly and method of making same |
US6344420B1 (en) * | 1999-03-15 | 2002-02-05 | Kabushiki Kaisha Toshiba | Plasma processing method and plasma processing apparatus |
JP3595853B2 (ja) * | 1999-03-18 | 2004-12-02 | 日本エー・エス・エム株式会社 | プラズマcvd成膜装置 |
US6228438B1 (en) * | 1999-08-10 | 2001-05-08 | Unakis Balzers Aktiengesellschaft | Plasma reactor for the treatment of large size substrates |
US8696875B2 (en) * | 1999-10-08 | 2014-04-15 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
US6780794B2 (en) * | 2000-01-20 | 2004-08-24 | Honeywell International Inc. | Methods of bonding physical vapor deposition target materials to backing plate materials |
US6510263B1 (en) * | 2000-01-27 | 2003-01-21 | Unaxis Balzers Aktiengesellschaft | Waveguide plate and process for its production and microtitre plate |
US6961490B2 (en) * | 2000-01-27 | 2005-11-01 | Unaxis-Balzers Aktiengesellschaft | Waveguide plate and process for its production and microtitre plate |
US6502530B1 (en) * | 2000-04-26 | 2003-01-07 | Unaxis Balzers Aktiengesellschaft | Design of gas injection for the electrode in a capacitively coupled RF plasma reactor |
US6287437B1 (en) * | 2000-05-05 | 2001-09-11 | Alcatel | Recessed bonding of target for RF diode sputtering |
US6383573B1 (en) * | 2000-05-17 | 2002-05-07 | Unaxis Balzers Aktiengesellschaft | Process for manufacturing coated plastic body |
KR100332314B1 (ko) * | 2000-06-24 | 2002-04-12 | 서성기 | 박막증착용 반응용기 |
US6725522B1 (en) * | 2000-07-12 | 2004-04-27 | Tosoh Smd, Inc. | Method of assembling target and backing plates |
US7063773B2 (en) * | 2000-08-17 | 2006-06-20 | Tosoh Smd, Inc. | High purity sputter targets with target end-of-life indication and method of manufacture |
US6840427B2 (en) * | 2000-09-11 | 2005-01-11 | Tosoh Smd, Inc. | Method of manufacturing sputter targets with internal cooling channels |
JP3905295B2 (ja) * | 2000-10-02 | 2007-04-18 | 日鉱金属株式会社 | 高純度コバルトターゲットと銅合金製バッキングプレートとの拡散接合ターゲット組立体及びその製造方法 |
JP2004514066A (ja) * | 2000-11-27 | 2004-05-13 | ユナキス・トレーディング・アクチェンゲゼルシャフト | 厚さがならい削りされた、rfマグネトロン用ターゲット |
US6692619B1 (en) * | 2001-08-14 | 2004-02-17 | Seagate Technology Llc | Sputtering target and method for making composite soft magnetic films |
US6793733B2 (en) * | 2002-01-25 | 2004-09-21 | Applied Materials Inc. | Gas distribution showerhead |
US6709557B1 (en) * | 2002-02-28 | 2004-03-23 | Novellus Systems, Inc. | Sputter apparatus for producing multi-component metal alloy films and method for making the same |
US6848608B2 (en) * | 2002-10-01 | 2005-02-01 | Cabot Corporation | Method of bonding sputtering target materials |
US7270713B2 (en) * | 2003-01-07 | 2007-09-18 | Applied Materials, Inc. | Tunable gas distribution plate assembly |
US6878242B2 (en) * | 2003-04-08 | 2005-04-12 | Guardian Industries Corp. | Segmented sputtering target and method/apparatus for using same |
US6806651B1 (en) * | 2003-04-22 | 2004-10-19 | Zond, Inc. | High-density plasma source |
JP4246547B2 (ja) * | 2003-05-23 | 2009-04-02 | 株式会社アルバック | スパッタリング装置、及びスパッタリング方法 |
WO2005024891A2 (en) * | 2003-09-10 | 2005-03-17 | Unaxis Balzers Ag | Voltage non-uniformity compensation method for high frequency plasma reactor for the treatment of rectangular large area substrates |
US20050103620A1 (en) * | 2003-11-19 | 2005-05-19 | Zond, Inc. | Plasma source with segmented magnetron cathode |
-
2006
- 2006-04-06 US US11/399,122 patent/US20070056845A1/en not_active Abandoned
- 2006-10-19 TW TW095138619A patent/TW200720462A/zh unknown
- 2006-10-19 WO PCT/US2006/060069 patent/WO2007102882A2/en active Application Filing
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI585837B (zh) * | 2011-10-12 | 2017-06-01 | 歐瑞康先進科技股份有限公司 | 濺鍍蝕刻室及濺鍍方法 |
Also Published As
Publication number | Publication date |
---|---|
WO2007102882A3 (en) | 2007-12-27 |
US20070056845A1 (en) | 2007-03-15 |
WO2007102882A2 (en) | 2007-09-13 |
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