TW200641358A - Conductive contactor unit and conductive contactor - Google Patents

Conductive contactor unit and conductive contactor

Info

Publication number
TW200641358A
TW200641358A TW095105370A TW95105370A TW200641358A TW 200641358 A TW200641358 A TW 200641358A TW 095105370 A TW095105370 A TW 095105370A TW 95105370 A TW95105370 A TW 95105370A TW 200641358 A TW200641358 A TW 200641358A
Authority
TW
Taiwan
Prior art keywords
conductive
contactors
extending
conductive contactors
guide member
Prior art date
Application number
TW095105370A
Other languages
Chinese (zh)
Other versions
TWI298789B (en
Inventor
Koji Ishikawa
Jun Tominaga
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200641358A publication Critical patent/TW200641358A/en
Application granted granted Critical
Publication of TWI298789B publication Critical patent/TWI298789B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Abstract

This invention provides a conductive contactor unit capable of dealing with a narrow spacing of contact terminals of semiconductor devices. The conductive contactor unit of this invention holds conductive conductors without hindering the characteristics of conductive contactors provided with resilient part capable of extending and retracting. The conductive contactor unit has a plurality of conductive contactors 1 for use in making an electrical contact between a plurality of electric circuitries, each contactor being formed in a plate-like shape configured to be and capable of extending and contracting in an elongate direction, and a first guide member 2a and a second guide member 2b disposed at two lateral sides of the conductive contactors 1. Guide grooves extending in the direction in which the conductive contactors 1 extend and retract are formed on the first guide member 2a and second guide member 2b. Each one of the conductive contactors 1 has two lateral side ends. The conductive contactors 1 are held in such way that the two lateral side ends of each conductive contactors 1 are fitted in the guide grooves. As a result a positional change in the direction perpendicular with the direction of extending and retracting movement of the conductive contactors. buckling or twisting of the conductive contactors is avoided when the conductive contactors 1 performs an extending and retracting movement.
TW95105370A 2005-02-18 2006-02-17 Condutive contactor unit and conductive contactor TWI298789B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005042772A JP4905872B2 (en) 2005-02-18 2005-02-18 Conductive contact unit

Publications (2)

Publication Number Publication Date
TW200641358A true TW200641358A (en) 2006-12-01
TWI298789B TWI298789B (en) 2008-07-11

Family

ID=36916528

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95105370A TWI298789B (en) 2005-02-18 2006-02-17 Condutive contactor unit and conductive contactor

Country Status (5)

Country Link
JP (1) JP4905872B2 (en)
KR (1) KR100950789B1 (en)
CN (1) CN101120257B (en)
TW (1) TWI298789B (en)
WO (1) WO2006088131A1 (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007123150A1 (en) * 2006-04-18 2007-11-01 Tokyo Electron Limited Probe card and glass substrate drilling method
JP4842733B2 (en) * 2006-08-18 2011-12-21 日本発條株式会社 Conductive contact and conductive contact unit
JP4781938B2 (en) * 2006-08-18 2011-09-28 日本発條株式会社 Conductive contact unit
JPWO2008133089A1 (en) * 2007-04-20 2010-07-22 日本発條株式会社 Conductive contact unit
JP5103566B2 (en) * 2007-11-26 2012-12-19 株式会社コーヨーテクノス Electrical contact and inspection jig having the same
TWI482975B (en) * 2011-05-27 2015-05-01 Mpi Corp Spring-type micro-high-frequency probe
KR101813006B1 (en) * 2016-01-04 2017-12-28 주식회사 아이에스시 Contactor for semiconductor test
JP2018197714A (en) * 2017-05-24 2018-12-13 山一電機株式会社 Mems type probe, and electric inspection device using the same
WO2019116512A1 (en) * 2017-12-14 2019-06-20 オムロン株式会社 Socket, inspection jig, inspection unit, and inspection device
JP7314633B2 (en) * 2019-06-11 2023-07-26 オムロン株式会社 Probe pins, inspection fixtures and inspection units
JP7318297B2 (en) * 2019-04-25 2023-08-01 オムロン株式会社 Probe pins, inspection fixtures and inspection units
JP2020180889A (en) * 2019-04-25 2020-11-05 オムロン株式会社 Probe pin, inspection jig, and inspection unit
EP3960830A4 (en) * 2019-04-26 2023-03-22 Sekisui Polymatech Co., Ltd. Electrical connecting member, and glass plate structure with terminal

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5634801A (en) * 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
JPH07311240A (en) * 1994-05-19 1995-11-28 Sony Corp Apparatus for measuring electric characteristic of electronic part
JPH11133060A (en) * 1997-10-31 1999-05-21 Tani Denki Kogyo Kk Testing terminal
JP2003045594A (en) * 2001-07-27 2003-02-14 Yamaichi Electronics Co Ltd Ic socket
CN100477887C (en) * 2003-07-24 2009-04-08 台湾莫仕股份有限公司 Method for solder planting of conducting terminal

Also Published As

Publication number Publication date
WO2006088131A1 (en) 2006-08-24
TWI298789B (en) 2008-07-11
KR100950789B1 (en) 2010-04-02
KR20070105362A (en) 2007-10-30
CN101120257B (en) 2010-05-19
JP4905872B2 (en) 2012-03-28
JP2006226907A (en) 2006-08-31
CN101120257A (en) 2008-02-06

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