TW200622240A - Apparatus and method for inspecting minute structure - Google Patents
Apparatus and method for inspecting minute structureInfo
- Publication number
- TW200622240A TW200622240A TW094130884A TW94130884A TW200622240A TW 200622240 A TW200622240 A TW 200622240A TW 094130884 A TW094130884 A TW 094130884A TW 94130884 A TW94130884 A TW 94130884A TW 200622240 A TW200622240 A TW 200622240A
- Authority
- TW
- Taiwan
- Prior art keywords
- detected
- minute structure
- section
- chip
- minute
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C99/00—Subject matter not provided for in other groups of this subclass
- B81C99/0035—Testing
- B81C99/005—Test apparatus
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
- G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/269—Various geometry objects
- G01N2291/2695—Bottles, containers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/269—Various geometry objects
- G01N2291/2697—Wafer or (micro)electronic parts
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004265385A JP2006078435A (ja) | 2004-09-13 | 2004-09-13 | 微小構造体の検査装置および微小構造体の検査方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200622240A true TW200622240A (en) | 2006-07-01 |
Family
ID=36059969
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094130884A TW200622240A (en) | 2004-09-13 | 2005-09-08 | Apparatus and method for inspecting minute structure |
Country Status (7)
Country | Link |
---|---|
US (1) | US20080302185A1 (zh) |
EP (1) | EP1801578A4 (zh) |
JP (1) | JP2006078435A (zh) |
KR (1) | KR20070062979A (zh) |
NO (1) | NO20071802L (zh) |
TW (1) | TW200622240A (zh) |
WO (1) | WO2006030716A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115877165A (zh) * | 2023-03-09 | 2023-03-31 | 合肥晶合集成电路股份有限公司 | 一种wat测试设备及其管控方法 |
TWI800401B (zh) * | 2021-06-17 | 2023-04-21 | 美商天工方案公司 | 具有殘餘應力補償及聲阻之回饋控制的聲學裝置 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4573794B2 (ja) * | 2005-03-31 | 2010-11-04 | 東京エレクトロン株式会社 | プローブカードおよび微小構造体の検査装置 |
WO2007061056A1 (ja) * | 2005-11-25 | 2007-05-31 | Matsushita Electric Works, Ltd. | センサ装置及びその製造方法 |
EP1953817B1 (en) | 2005-11-25 | 2012-10-31 | Panasonic Corporation | Sensor device and method for manufacturing same |
WO2007061054A1 (ja) * | 2005-11-25 | 2007-05-31 | Matsushita Electric Works, Ltd. | ウェハレベルパッケージ構造体、および同パッケージ構造体から得られるセンサ装置 |
EP3257809A1 (en) * | 2005-11-25 | 2017-12-20 | Panasonic Intellectual Property Management Co., Ltd. | Wafer level package structure and production method therefor |
CN100581984C (zh) * | 2007-12-28 | 2010-01-20 | 中国科学院上海微系统与信息技术研究所 | 基于电镀工艺的微机械测试探卡及制作方法 |
EP3007863B1 (en) * | 2013-06-12 | 2018-08-08 | Atlas Copco Industrial Technique AB | A method for diagnosing a torque impulse generator |
JP6954528B2 (ja) * | 2017-06-29 | 2021-10-27 | 株式会社フジタ | 検査対象物の状態評価装置および状態評価方法 |
JP6954527B2 (ja) * | 2017-06-29 | 2021-10-27 | 株式会社フジタ | 検査対象物の状態評価装置および状態評価方法 |
JP2019184341A (ja) * | 2018-04-05 | 2019-10-24 | 東芝三菱電機産業システム株式会社 | 電力変換システムおよび遮断器診断装置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6080759A (ja) * | 1983-10-07 | 1985-05-08 | Showa Electric Wire & Cable Co Ltd | 接着状態試験方法 |
US4816125A (en) * | 1987-11-25 | 1989-03-28 | The Regents Of The University Of California | IC processed piezoelectric microphone |
US5152401A (en) * | 1989-10-13 | 1992-10-06 | The United States Of America As Representd By The Secretary Of Agriculture | Agricultural commodity condition measurement |
US6295870B1 (en) * | 1991-02-08 | 2001-10-02 | Alliedsignal Inc. | Triaxial angular rate and acceleration sensor |
JPH08278292A (ja) * | 1995-03-31 | 1996-10-22 | Sumitomo Sitix Corp | シリコンウェーハの検査方法 |
JPH09196682A (ja) * | 1996-01-19 | 1997-07-31 | Matsushita Electric Ind Co Ltd | 角速度センサと加速度センサ |
JPH1090050A (ja) * | 1996-09-20 | 1998-04-10 | Toshiba Corp | 回転駆動機構を備えた電子機器の検査装置、及び動作異常検出方法 |
JPH10174373A (ja) * | 1996-12-09 | 1998-06-26 | Meidensha Corp | 電気機器の劣化診断装置 |
JPH11248619A (ja) * | 1998-03-06 | 1999-09-17 | Akira Kawai | 固体表面の微小付着物の物性評価方法 |
US6507187B1 (en) * | 1999-08-24 | 2003-01-14 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Ultra-sensitive magnetoresistive displacement sensing device |
US6629448B1 (en) * | 2000-02-25 | 2003-10-07 | Seagate Technology Llc | In-situ testing of a MEMS accelerometer in a disc storage system |
US6567715B1 (en) * | 2000-04-19 | 2003-05-20 | Sandia Corporation | Method and system for automated on-chip material and structural certification of MEMS devices |
JP4456723B2 (ja) * | 2000-04-28 | 2010-04-28 | 佐藤工業株式会社 | コンクリート健全度判定方法及び装置 |
US6595058B2 (en) * | 2001-06-19 | 2003-07-22 | Computed Ultrasound Global Inc. | Method and apparatus for determining dynamic response of microstructure by using pulsed broad bandwidth ultrasonic transducer as BAW hammer |
AU2003237839A1 (en) * | 2002-05-13 | 2003-11-11 | University Of Florida | Resonant energy mems array and system including dynamically modifiable power processor |
JP2004130449A (ja) * | 2002-10-10 | 2004-04-30 | Nippon Telegr & Teleph Corp <Ntt> | Mems素子及びその製造方法 |
-
2004
- 2004-09-13 JP JP2004265385A patent/JP2006078435A/ja active Pending
-
2005
- 2005-09-08 TW TW094130884A patent/TW200622240A/zh unknown
- 2005-09-09 US US11/662,478 patent/US20080302185A1/en not_active Abandoned
- 2005-09-09 WO PCT/JP2005/016663 patent/WO2006030716A1/ja active Application Filing
- 2005-09-09 KR KR1020077005724A patent/KR20070062979A/ko not_active Application Discontinuation
- 2005-09-09 EP EP05782028A patent/EP1801578A4/en not_active Ceased
-
2007
- 2007-04-03 NO NO20071802A patent/NO20071802L/no not_active Application Discontinuation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI800401B (zh) * | 2021-06-17 | 2023-04-21 | 美商天工方案公司 | 具有殘餘應力補償及聲阻之回饋控制的聲學裝置 |
CN115877165A (zh) * | 2023-03-09 | 2023-03-31 | 合肥晶合集成电路股份有限公司 | 一种wat测试设备及其管控方法 |
Also Published As
Publication number | Publication date |
---|---|
NO20071802L (no) | 2007-06-06 |
EP1801578A4 (en) | 2008-07-30 |
US20080302185A1 (en) | 2008-12-11 |
KR20070062979A (ko) | 2007-06-18 |
JP2006078435A (ja) | 2006-03-23 |
WO2006030716A1 (ja) | 2006-03-23 |
EP1801578A1 (en) | 2007-06-27 |
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