TW200600802A - Method for correcting measurement error and instrument for measuring characteristics of electronic component - Google Patents

Method for correcting measurement error and instrument for measuring characteristics of electronic component

Info

Publication number
TW200600802A
TW200600802A TW094102017A TW94102017A TW200600802A TW 200600802 A TW200600802 A TW 200600802A TW 094102017 A TW094102017 A TW 094102017A TW 94102017 A TW94102017 A TW 94102017A TW 200600802 A TW200600802 A TW 200600802A
Authority
TW
Taiwan
Prior art keywords
state
measuring
jig
signal line
electronic component
Prior art date
Application number
TW094102017A
Other languages
English (en)
Other versions
TWI279557B (en
Inventor
Taichi Mori
Gaku Kamitani
Hiroshi Tomohiro
Original Assignee
Murata Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co filed Critical Murata Manufacturing Co
Publication of TW200600802A publication Critical patent/TW200600802A/zh
Application granted granted Critical
Publication of TWI279557B publication Critical patent/TWI279557B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49764—Method of mechanical manufacture with testing or indicating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW094102017A 2004-05-25 2005-01-24 Method for correcting measurement error and instrument for measuring characteristics of electronic component TWI279557B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2004155172 2004-05-25
JP2004192561 2004-06-30
JP2004291990 2004-10-04

Publications (2)

Publication Number Publication Date
TW200600802A true TW200600802A (en) 2006-01-01
TWI279557B TWI279557B (en) 2007-04-21

Family

ID=35451002

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094102017A TWI279557B (en) 2004-05-25 2005-01-24 Method for correcting measurement error and instrument for measuring characteristics of electronic component

Country Status (6)

Country Link
US (1) US7885779B2 (zh)
JP (1) JP4009876B2 (zh)
CN (1) CN100549705C (zh)
DE (1) DE112005001211B4 (zh)
TW (1) TWI279557B (zh)
WO (1) WO2005116669A1 (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4670549B2 (ja) * 2005-08-25 2011-04-13 株式会社村田製作所 測定誤差の補正方法
WO2008065791A1 (fr) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. Procédé de correction d'erreur de caractéristiques hautes fréquences d'un composant électronique
KR101152046B1 (ko) * 2008-02-05 2012-07-03 가부시키가이샤 무라타 세이사쿠쇼 측정오차의 보정방법 및 전자부품특성 측정장치
CN102901943B (zh) * 2011-12-24 2015-01-07 许继电气股份有限公司 一种基于区域电网的采样数据异常检测及过电流保护方法
JP5876348B2 (ja) * 2012-03-27 2016-03-02 東京エレクトロン株式会社 ヒータ素線検査方法
KR101946252B1 (ko) 2014-03-04 2019-02-11 가부시키가이샤 무라타 세이사쿠쇼 전기 회로망의 s 파라미터 도출 방법
JP6281726B2 (ja) 2014-03-04 2018-02-21 株式会社村田製作所 測定誤差の補正方法及び電子部品特性測定装置
CN104111435B (zh) * 2014-07-21 2017-03-15 福建火炬电子科技股份有限公司 一种测试夹具误差剔除方法
CN104297597B (zh) * 2014-10-20 2017-01-18 中国电子科技集团公司第四十一研究所 一种移除双端口网络中测试夹具效应的新方法
TW202115413A (zh) * 2019-09-30 2021-04-16 日商愛德萬測試股份有限公司 維護裝置、維護方法及記錄有維護程式之記錄媒體

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6347382B1 (en) * 1998-11-30 2002-02-12 Advantest Corp. Multi-port device analysis apparatus and method
US7065134B2 (en) * 2001-08-27 2006-06-20 Gennum Corporation Adaptive equalizer with large data rate range
JP3558074B2 (ja) 2001-12-10 2004-08-25 株式会社村田製作所 測定誤差の補正方法、電子部品の良否判定方法および電子部品特性測定装置
JP2003294820A (ja) * 2002-03-29 2003-10-15 Agilent Technologies Japan Ltd 測定装置、測定装置の校正方法および記録媒体
US6876935B2 (en) * 2002-09-24 2005-04-05 Murata Manufacturing Co., Ltd. Method for correcting measurement error, method of determining quality of electronic component, and device for measuring characteristic of electronic component
US7500161B2 (en) * 2003-06-11 2009-03-03 Agilent Technologies, Inc. Correcting test system calibration and transforming device measurements when using multiple test fixtures

Also Published As

Publication number Publication date
US20070084035A1 (en) 2007-04-19
WO2005116669A1 (ja) 2005-12-08
CN101006350A (zh) 2007-07-25
TWI279557B (en) 2007-04-21
US7885779B2 (en) 2011-02-08
CN100549705C (zh) 2009-10-14
DE112005001211B4 (de) 2017-07-13
JPWO2005116669A1 (ja) 2008-04-03
DE112005001211T5 (de) 2009-05-28
JP4009876B2 (ja) 2007-11-21

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