TW200534188A - A measuring apparatus with plural modules - Google Patents

A measuring apparatus with plural modules Download PDF

Info

Publication number
TW200534188A
TW200534188A TW093137455A TW93137455A TW200534188A TW 200534188 A TW200534188 A TW 200534188A TW 093137455 A TW093137455 A TW 093137455A TW 93137455 A TW93137455 A TW 93137455A TW 200534188 A TW200534188 A TW 200534188A
Authority
TW
Taiwan
Prior art keywords
data
parallel
signal
modules
controller
Prior art date
Application number
TW093137455A
Other languages
English (en)
Chinese (zh)
Inventor
Takuya Otani
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of TW200534188A publication Critical patent/TW200534188A/zh

Links

Classifications

    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C19/00—Electric signal transmission systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4282—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
    • G06F13/4295—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus using an embedded synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
TW093137455A 2004-03-18 2004-12-03 A measuring apparatus with plural modules TW200534188A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004079036A JP2005265630A (ja) 2004-03-18 2004-03-18 測定器

Publications (1)

Publication Number Publication Date
TW200534188A true TW200534188A (en) 2005-10-16

Family

ID=34987678

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093137455A TW200534188A (en) 2004-03-18 2004-12-03 A measuring apparatus with plural modules

Country Status (5)

Country Link
US (1) US20050210170A1 (enExample)
JP (1) JP2005265630A (enExample)
KR (1) KR20060044386A (enExample)
CN (1) CN1670782A (enExample)
TW (1) TW200534188A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070002893A1 (en) * 2005-07-01 2007-01-04 Neff Robert M R Input/output (I/O) interface for high-speed data converters
JP4835935B2 (ja) * 2007-01-05 2011-12-14 横河電機株式会社 データ転送回路および半導体試験装置
JP2010145271A (ja) * 2008-12-19 2010-07-01 Yokogawa Electric Corp 半導体試験装置
US8706439B2 (en) 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method
CN110275851B (zh) * 2019-07-19 2020-02-07 广州波视信息科技股份有限公司 一种数据串并转换装置、延时器及数据处理方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4542420A (en) * 1984-01-24 1985-09-17 Honeywell Inc. Manchester decoder
US5134702A (en) * 1986-04-21 1992-07-28 Ncr Corporation Serial-to-parallel and parallel-to-serial converter
JP2880364B2 (ja) * 1993-02-25 1999-04-05 株式会社日立製作所 自動車用エンジン制御装置
US5493657A (en) * 1993-06-21 1996-02-20 Apple Computer, Inc. High speed dominant mode bus for differential signals
US5854591A (en) * 1996-09-13 1998-12-29 Sony Trans Com, Inc. System and method for processing passenger service system information
DE10082824T1 (de) * 1999-08-17 2002-02-28 Advantest Corp Adapter zum Steuern einer Meßvorrichtung, eine Meßvorrichtung, eine Steuervorrichtung für eine Meßvorrichtung, ein Verfahren zum Verarbeiten der Messung und ein Aufzeichnungsmedium

Also Published As

Publication number Publication date
CN1670782A (zh) 2005-09-21
KR20060044386A (ko) 2006-05-16
JP2005265630A (ja) 2005-09-29
US20050210170A1 (en) 2005-09-22

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