TW200508616A - Probe unit for inspecting flat panel display device - Google Patents

Probe unit for inspecting flat panel display device

Info

Publication number
TW200508616A
TW200508616A TW093123310A TW93123310A TW200508616A TW 200508616 A TW200508616 A TW 200508616A TW 093123310 A TW093123310 A TW 093123310A TW 93123310 A TW93123310 A TW 93123310A TW 200508616 A TW200508616 A TW 200508616A
Authority
TW
Taiwan
Prior art keywords
pins
column electrodes
probe unit
probe
support plate
Prior art date
Application number
TW093123310A
Other languages
Chinese (zh)
Inventor
Hiroyuki Takizawa
Noboru Nagano
Original Assignee
Tokyo Cathode Lab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Cathode Lab filed Critical Tokyo Cathode Lab
Publication of TW200508616A publication Critical patent/TW200508616A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

This invention provides a probe unit capable of assuring a good electrical contact. The probe unit is for inspecting a liquid crystal display panel having a plurality of column electrodes (44), the probe unit containing a plurality of probe pins supported by an upper support plate (14) and a lower support plate (16). The probe pins include lower pins (32) inserted in lower holes (16a) formed in the lower support plate (16) and are adapted to contact the column electrodes (44), and connecting portions (34) which connect upper pins (30) and lower pins (32). The connecting portions (34) are capable of bending by resilient deformation. When the probe pins are caused to contact the column electrodes (44) the tips of the lower pins (32) are caused to move a fine distance on the column electrodes (44) because of the bending of the connecting portions (34). By this movement a small amount of the surface of the column electrodes (44) can be removed by scratch and a good electrical contact can be assured.
TW093123310A 2003-08-06 2004-08-06 Probe unit for inspecting flat panel display device TW200508616A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003287658A JP2005055343A (en) 2003-08-06 2003-08-06 Probe device for flat-panel display inspection

Publications (1)

Publication Number Publication Date
TW200508616A true TW200508616A (en) 2005-03-01

Family

ID=34366575

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093123310A TW200508616A (en) 2003-08-06 2004-08-06 Probe unit for inspecting flat panel display device

Country Status (4)

Country Link
JP (1) JP2005055343A (en)
KR (1) KR20050016101A (en)
CN (1) CN1580787A (en)
TW (1) TW200508616A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI620938B (en) * 2017-07-21 2018-04-11 中華精測科技股份有限公司 Probe device

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101160531A (en) * 2005-04-12 2008-04-09 科技探索有限公司 Contact probe for a testing head having vertical probes for semiconductor integrated electronic devices
JP4823617B2 (en) * 2005-09-09 2011-11-24 日本発條株式会社 Conductive contact and method for manufacturing conductive contact
JP2007078380A (en) * 2005-09-12 2007-03-29 Fujitsu Ltd Probe card
KR100766296B1 (en) * 2006-02-23 2007-10-11 주식회사 파이컴 Probe block and probe assembly having the block
KR100752938B1 (en) * 2006-08-03 2007-08-30 마이크로 인스펙션 주식회사 Contact type probe used a ball
KR100909348B1 (en) 2008-11-21 2009-07-24 김석희 Probe needle for semiconductor test and probe card
JP5372706B2 (en) * 2009-11-04 2013-12-18 株式会社日本マイクロニクス Probe needle guide member, probe card having the same, and semiconductor device testing method using the same
CN107003335B (en) * 2015-01-04 2020-05-22 金日 Contact testing device
CN106932615B (en) * 2017-04-28 2024-02-13 尼得科精密检测设备(浙江)有限公司 Inspection jig and inspection apparatus provided with the same
CN109342242B (en) * 2018-10-26 2021-04-06 陈仕铮 Screen detection device is used in production of car display screen
JP2020197439A (en) * 2019-06-03 2020-12-10 日本電産サンキョー株式会社 Device inspection apparatus
JP7523994B2 (en) * 2020-08-24 2024-07-29 株式会社日本マイクロニクス Electrical contact structure of electrical contact and electrical connection device
CN112362914B (en) * 2020-10-28 2024-08-16 广州国显科技有限公司 Flexible circuit board for test and crimping test method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3187855B2 (en) * 1991-03-27 2001-07-16 株式会社日本マイクロニクス Display panel prober
JPH04364054A (en) * 1991-06-11 1992-12-16 Toshiba Corp Inspecting device
JPH0649994U (en) * 1992-11-20 1994-07-08 有限会社テクノプローブ Vertical probe card
JPH09326426A (en) * 1996-06-06 1997-12-16 Nippon Maikuronikusu:Kk Apparatus and method for testing wafers
JPH10206464A (en) * 1997-01-24 1998-08-07 Mitsubishi Materials Corp Probe apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI620938B (en) * 2017-07-21 2018-04-11 中華精測科技股份有限公司 Probe device

Also Published As

Publication number Publication date
JP2005055343A (en) 2005-03-03
CN1580787A (en) 2005-02-16
KR20050016101A (en) 2005-02-21

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