TW200507638A - Image defect correction apparatus and method - Google Patents

Image defect correction apparatus and method

Info

Publication number
TW200507638A
TW200507638A TW093113668A TW93113668A TW200507638A TW 200507638 A TW200507638 A TW 200507638A TW 093113668 A TW093113668 A TW 093113668A TW 93113668 A TW93113668 A TW 93113668A TW 200507638 A TW200507638 A TW 200507638A
Authority
TW
Taiwan
Prior art keywords
correction
vertical line
charge coupled
correction value
pixel
Prior art date
Application number
TW093113668A
Other languages
English (en)
Inventor
Keijirou Itakura
Toshiya Fujii
Akiyoshi Kohno
Yoshiaki Kato
Original Assignee
Matsushita Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Ind Co Ltd filed Critical Matsushita Electric Ind Co Ltd
Publication of TW200507638A publication Critical patent/TW200507638A/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16L—PIPES; JOINTS OR FITTINGS FOR PIPES; SUPPORTS FOR PIPES, CABLES OR PROTECTIVE TUBING; MEANS FOR THERMAL INSULATION IN GENERAL
    • F16L25/00—Constructive types of pipe joints not provided for in groups F16L13/00 - F16L23/00 ; Details of pipe joints not otherwise provided for, e.g. electrically conducting or insulating means
    • F16L25/0036—Joints for corrugated pipes
    • F16L25/0063—Joints for corrugated pipes with two corrugated pipes being directly connected to each other
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16L—PIPES; JOINTS OR FITTINGS FOR PIPES; SUPPORTS FOR PIPES, CABLES OR PROTECTIVE TUBING; MEANS FOR THERMAL INSULATION IN GENERAL
    • F16L15/00—Screw-threaded joints; Forms of screw-threads for such joints
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/667—Camera operation mode switching, e.g. between still and video, sport and normal or high- and low-resolution modes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW093113668A 2003-05-15 2004-05-14 Image defect correction apparatus and method TW200507638A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003137758 2003-05-15
JP2004120413A JP3914216B2 (ja) 2003-05-15 2004-04-15 画像欠陥補正装置、及び、画像欠陥補正方法

Publications (1)

Publication Number Publication Date
TW200507638A true TW200507638A (en) 2005-02-16

Family

ID=33032397

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093113668A TW200507638A (en) 2003-05-15 2004-05-14 Image defect correction apparatus and method

Country Status (7)

Country Link
US (1) US7483063B2 (zh)
EP (1) EP1478175B1 (zh)
JP (1) JP3914216B2 (zh)
KR (1) KR20040098587A (zh)
CN (1) CN100411427C (zh)
DE (1) DE602004022482D1 (zh)
TW (1) TW200507638A (zh)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006148441A (ja) * 2004-11-18 2006-06-08 Konica Minolta Photo Imaging Inc 撮像装置
US9318053B2 (en) * 2005-07-04 2016-04-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and driving method thereof
JP4859223B2 (ja) 2006-10-24 2012-01-25 キヤノン株式会社 画像欠陥補正装置、画像欠陥補正方法、及びプログラム
JP5222625B2 (ja) * 2007-06-01 2013-06-26 富士フイルム株式会社 撮像装置
CN101557473B (zh) * 2008-04-11 2011-07-27 鸿富锦精密工业（深圳）有限公司 摄像装置及其亮度调节方法
US20110013053A1 (en) * 2008-09-29 2011-01-20 Rui Chen Defective pixel detection and correction
JP2010139782A (ja) 2008-12-11 2010-06-24 Sony Corp 表示装置、表示装置の駆動方法およびプログラム
JP5335614B2 (ja) * 2009-08-25 2013-11-06 株式会社日本マイクロニクス 欠陥画素アドレス検出方法並びに検出装置
JP5379664B2 (ja) * 2009-12-11 2013-12-25 キヤノン株式会社 画像表示装置およびその制御方法
JP5673142B2 (ja) * 2011-01-27 2015-02-18 セイコーエプソン株式会社 電気光学装置及び電子機器
CN102497575B (zh) * 2011-12-09 2013-11-27 中国科学院长春光学精密机械与物理研究所 一种多片面阵ccd的筛选测试系统
CN107004260A (zh) * 2014-12-12 2017-08-01 爱克发医疗保健公司 用于校正直接射线照相图像中的有瑕疵像素伪影的方法
CN105262963B (zh) * 2015-10-15 2018-10-16 上海集成电路研发中心有限公司 暗像素阵列、替换控制电路系统及方法
CN109565558B (zh) * 2016-07-29 2021-03-26 奥林巴斯株式会社 图像处理装置、图像处理方法和存储介质

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4400734A (en) * 1981-10-28 1983-08-23 Eastman Kodak Company Column defect compensating apparatus for CCD image sensor
JPH01253372A (ja) * 1988-04-01 1989-10-09 Victor Co Of Japan Ltd テレビジョンカメラ
KR950008698B1 (ko) * 1992-06-09 1995-08-04 현대전자산업 주식회사 반도체소자의 필드산화막 형성방법
JPH0738799A (ja) 1993-07-20 1995-02-07 Matsushita Electric Ind Co Ltd 手振れ補正装置
DE19734717A1 (de) * 1997-08-11 1999-02-25 Sirona Dental Systems Gmbh Verfahren zur Kompensation des Dunkelstroms bei der Erstellung von zahnärztlichen Panorama- und/oder cephalometrischen Schichtaufnahmen
US6819358B1 (en) * 1999-04-26 2004-11-16 Microsoft Corporation Error calibration for digital image sensors and apparatus using the same
JP3773773B2 (ja) * 1999-10-27 2006-05-10 三洋電機株式会社 画像信号処理装置及び画素欠陥の検出方法
EP1143706A3 (en) * 2000-03-28 2007-08-01 Fujitsu Limited Image sensor with black level control and low power consumption
US6747697B1 (en) * 2000-07-12 2004-06-08 Koninklijke Philips Electronics, N.V. Method and apparatus for digital image defect correction and noise filtering
US6741754B2 (en) * 2001-02-19 2004-05-25 Eastman Kodak Company Correcting for defects in a digital image taken by an image sensor caused by pre-existing defects in two pixels in adjacent columns of an image sensor
US6900836B2 (en) * 2001-02-19 2005-05-31 Eastman Kodak Company Correcting defects in a digital image caused by a pre-existing defect in a pixel of an image sensor
JP2003023570A (ja) * 2001-07-06 2003-01-24 Sanyo Electric Co Ltd 画像データの修正方法及び画像信号処理装置
JP2003078821A (ja) * 2001-08-31 2003-03-14 Hitachi Kokusai Electric Inc 撮像装置
US6987577B2 (en) * 2001-09-14 2006-01-17 Eastman Kodak Company Providing a partial column defect map for a full frame image sensor
US6873728B2 (en) * 2002-01-16 2005-03-29 Eastman Kodak Company Vertical black line removal implementation
US7015961B2 (en) * 2002-08-16 2006-03-21 Ramakrishna Kakarala Digital image system and method for combining demosaicing and bad pixel correction

Also Published As

Publication number Publication date
EP1478175A1 (en) 2004-11-17
KR20040098587A (ko) 2004-11-20
CN100411427C (zh) 2008-08-13
US7483063B2 (en) 2009-01-27
CN1574915A (zh) 2005-02-02
US20040263649A1 (en) 2004-12-30
EP1478175B1 (en) 2009-08-12
JP2004364266A (ja) 2004-12-24
JP3914216B2 (ja) 2007-05-16
DE602004022482D1 (de) 2009-09-24

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