TW200507073A - PECVD silicon-rich oxide layer for reduced UV charging - Google Patents

PECVD silicon-rich oxide layer for reduced UV charging

Info

Publication number
TW200507073A
TW200507073A TW093119381A TW93119381A TW200507073A TW 200507073 A TW200507073 A TW 200507073A TW 093119381 A TW093119381 A TW 093119381A TW 93119381 A TW93119381 A TW 93119381A TW 200507073 A TW200507073 A TW 200507073A
Authority
TW
Taiwan
Prior art keywords
oxide layer
reduced
charging
rich oxide
pecvd silicon
Prior art date
Application number
TW093119381A
Other languages
English (en)
Other versions
TWI376729B (en
Inventor
Minh-Van Ngo
Mark T Ramshbey
Tazrien Kamal
Pei-Yuan Gao
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Publication of TW200507073A publication Critical patent/TW200507073A/zh
Application granted granted Critical
Publication of TWI376729B publication Critical patent/TWI376729B/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/30—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B99/00—Subject matter not provided for in other groups of this subclass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/314—Inorganic layers
    • H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
    • H01L21/31604—Deposition from a gas or vapour
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76829—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76829—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers
    • H01L21/76834—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers formation of thin insulating films on the sidewalls or on top of conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66825—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a floating gate
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
    • H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
    • H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H01L21/02274—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
  • Formation Of Insulating Films (AREA)
TW093119381A 2003-07-11 2004-06-30 Pecvd silicon-rich oxide layer for reduced uv charging TWI376729B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/617,451 US7060554B2 (en) 2003-07-11 2003-07-11 PECVD silicon-rich oxide layer for reduced UV charging

Publications (2)

Publication Number Publication Date
TW200507073A true TW200507073A (en) 2005-02-16
TWI376729B TWI376729B (en) 2012-11-11

Family

ID=33564966

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093119381A TWI376729B (en) 2003-07-11 2004-06-30 Pecvd silicon-rich oxide layer for reduced uv charging

Country Status (7)

Country Link
US (1) US7060554B2 (zh)
EP (1) EP1644974B1 (zh)
JP (1) JP4871127B2 (zh)
KR (1) KR20060030896A (zh)
CN (1) CN100373592C (zh)
TW (1) TWI376729B (zh)
WO (1) WO2005010984A2 (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7157331B2 (en) * 2004-06-01 2007-01-02 Macronix International Co., Ltd. Ultraviolet blocking layer
KR100683852B1 (ko) * 2004-07-02 2007-02-15 삼성전자주식회사 반도체 소자의 마스크롬 소자 및 그 형성 방법
US7335610B2 (en) * 2004-07-23 2008-02-26 Macronix International Co., Ltd. Ultraviolet blocking layer
US20060052369A1 (en) * 2004-09-07 2006-03-09 The Regents Of The University Of Michigan Compositions and methods relating to novel compounds and targets thereof
US7732923B2 (en) * 2004-12-30 2010-06-08 Taiwan Semiconductor Manufacturing Company, Ltd. Impurity doped UV protection layer
US7602003B2 (en) * 2005-04-27 2009-10-13 United Microelectronics Corp. Semiconductor device structure for reducing hot carrier effect of MOS transistor
US7755197B2 (en) * 2006-02-10 2010-07-13 Macronix International Co., Ltd. UV blocking and crack protecting passivation layer
US7662712B2 (en) * 2006-02-10 2010-02-16 Macronix International Co., Ltd. UV blocking and crack protecting passivation layer fabricating method
US20070296027A1 (en) * 2006-06-21 2007-12-27 International Business Machines Corporation Cmos devices comprising a continuous stressor layer with regions of opposite stresses, and methods of fabricating the same
JP5110820B2 (ja) 2006-08-02 2012-12-26 キヤノン株式会社 光電変換装置、光電変換装置の製造方法及び撮像システム
US20080124855A1 (en) * 2006-11-05 2008-05-29 Johnny Widodo Modulation of Stress in ESL SiN Film through UV Curing to Enhance both PMOS and NMOS Transistor Performance
KR100779400B1 (ko) * 2006-12-20 2007-11-23 동부일렉트로닉스 주식회사 반도체 소자 및 그 제조방법
JP4876231B2 (ja) * 2008-04-11 2012-02-15 スパンション エルエルシー 半導体装置の製造方法
CN101616560B (zh) * 2008-06-27 2012-05-23 深圳富泰宏精密工业有限公司 金属壳体及其制造方法
US7741663B2 (en) * 2008-10-24 2010-06-22 Globalfoundries Inc. Air gap spacer formation
US8927359B2 (en) * 2013-02-21 2015-01-06 Taiwan Semiconductor Manufacturing Company, Ltd. Multi-composition dielectric for semiconductor device
US20150206803A1 (en) * 2014-01-19 2015-07-23 United Microelectronics Corp. Method of forming inter-level dielectric layer

Family Cites Families (15)

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Publication number Priority date Publication date Assignee Title
US5128279A (en) * 1990-03-05 1992-07-07 Vlsi Technology, Inc. Charge neutralization using silicon-enriched oxide layer
US5290727A (en) * 1990-03-05 1994-03-01 Vlsi Technology, Inc. Method for suppressing charge loss in EEPROMs/EPROMS and instabilities in SRAM load resistors
US5602056A (en) * 1990-03-05 1997-02-11 Vlsi Technology, Inc. Method for forming reliable MOS devices using silicon rich plasma oxide film
US5534731A (en) * 1994-10-28 1996-07-09 Advanced Micro Devices, Incorporated Layered low dielectric constant technology
US6274429B1 (en) * 1997-10-29 2001-08-14 Texas Instruments Incorporated Use of Si-rich oxide film as a chemical potential barrier for controlled oxidation
US6344413B1 (en) * 1997-12-22 2002-02-05 Motorola Inc. Method for forming a semiconductor device
JP2000353757A (ja) * 1999-06-10 2000-12-19 Mitsubishi Electric Corp 不揮発性半導体記憶装置およびその製造方法
US6559007B1 (en) * 2000-04-06 2003-05-06 Micron Technology, Inc. Method for forming flash memory device having a tunnel dielectric comprising nitrided oxide
JP2001338976A (ja) * 2000-05-26 2001-12-07 Fujitsu Ltd 半導体装置の製造方法
US20020111014A1 (en) * 2001-02-13 2002-08-15 Jeng Pei Reng Planarization method of inter-layer dielectrics and inter-metal dielectrics
US6348407B1 (en) * 2001-03-15 2002-02-19 Chartered Semiconductor Manufacturing Inc. Method to improve adhesion of organic dielectrics in dual damascene interconnects
CN1235283C (zh) * 2001-07-26 2006-01-04 旺宏电子股份有限公司 防止氮化物内存单元被充电的制造方法及其装置
US7098107B2 (en) * 2001-11-19 2006-08-29 Saifun Semiconductor Ltd. Protective layer in memory device and method therefor
US6774432B1 (en) * 2003-02-05 2004-08-10 Advanced Micro Devices, Inc. UV-blocking layer for reducing UV-induced charging of SONOS dual-bit flash memory devices in BEOL
US6833581B1 (en) * 2003-06-12 2004-12-21 Spansion Llc Structure and method for preventing process-induced UV radiation damage in a memory cell

Also Published As

Publication number Publication date
CN100373592C (zh) 2008-03-05
WO2005010984A2 (en) 2005-02-03
KR20060030896A (ko) 2006-04-11
EP1644974A2 (en) 2006-04-12
WO2005010984A3 (en) 2005-03-24
JP4871127B2 (ja) 2012-02-08
JP2007516598A (ja) 2007-06-21
TWI376729B (en) 2012-11-11
EP1644974B1 (en) 2011-06-15
US20050006712A1 (en) 2005-01-13
CN1823414A (zh) 2006-08-23
US7060554B2 (en) 2006-06-13

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