TW200502980A - Testing integrated circuits - Google Patents

Testing integrated circuits

Info

Publication number
TW200502980A
TW200502980A TW093114154A TW93114154A TW200502980A TW 200502980 A TW200502980 A TW 200502980A TW 093114154 A TW093114154 A TW 093114154A TW 93114154 A TW93114154 A TW 93114154A TW 200502980 A TW200502980 A TW 200502980A
Authority
TW
Taiwan
Prior art keywords
resistive
open defects
diagnosing
dictionary
address decoders
Prior art date
Application number
TW093114154A
Other languages
English (en)
Inventor
Mohamed Azimane
Ananta Kumar Majhi
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of TW200502980A publication Critical patent/TW200502980A/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/54—Arrangements for designing test circuits, e.g. design for test [DFT] tools

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
TW093114154A 2003-05-22 2004-05-19 Testing integrated circuits TW200502980A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP03101472A EP1480227A1 (en) 2003-05-22 2003-05-22 Testing integrated circuits with fault dictionary

Publications (1)

Publication Number Publication Date
TW200502980A true TW200502980A (en) 2005-01-16

Family

ID=33041077

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093114154A TW200502980A (en) 2003-05-22 2004-05-19 Testing integrated circuits

Country Status (3)

Country Link
EP (1) EP1480227A1 (zh)
TW (1) TW200502980A (zh)
WO (1) WO2004105044A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI732909B (zh) * 2016-08-05 2021-07-11 美商新思科技股份有限公司 一種用於特徵化電路的電腦實作方法、電腦系統以及可讀取儲存媒體
US11099105B2 (en) 2018-02-08 2021-08-24 SCREEN Holdings Co., Ltd. Data processing method, data processing device, and non-transitory computer-readable recording medium having recorded thereon data processing program

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007156344A (ja) * 2005-12-08 2007-06-21 Toshiba Corp プラントシミュレータ
US7733109B2 (en) * 2007-10-15 2010-06-08 International Business Machines Corporation Test structure for resistive open detection using voltage contrast inspection and related methods

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6397362B1 (en) * 1997-09-24 2002-05-28 Nec Corporation Fault diagnosis method and system for a sequential circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI732909B (zh) * 2016-08-05 2021-07-11 美商新思科技股份有限公司 一種用於特徵化電路的電腦實作方法、電腦系統以及可讀取儲存媒體
US11099105B2 (en) 2018-02-08 2021-08-24 SCREEN Holdings Co., Ltd. Data processing method, data processing device, and non-transitory computer-readable recording medium having recorded thereon data processing program
TWI770348B (zh) * 2018-02-08 2022-07-11 日商斯庫林集團股份有限公司 資料處理方法、資料處理裝置以及電腦可讀取記錄媒體

Also Published As

Publication number Publication date
WO2004105044A1 (en) 2004-12-02
EP1480227A1 (en) 2004-11-24

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