TW200405405A - Vertical movement substrate processing apparatus and substrate processing system having the same - Google Patents

Vertical movement substrate processing apparatus and substrate processing system having the same Download PDF

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Publication number
TW200405405A
TW200405405A TW092122046A TW92122046A TW200405405A TW 200405405 A TW200405405 A TW 200405405A TW 092122046 A TW092122046 A TW 092122046A TW 92122046 A TW92122046 A TW 92122046A TW 200405405 A TW200405405 A TW 200405405A
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Taiwan
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substrate
processing
lifting
substrate processing
shaft
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TW092122046A
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Chinese (zh)
Inventor
Katsutoshi Nakada
Shigeru Mizukawa
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Sumitomo Prec Prod Co
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Publication of TW200405405A publication Critical patent/TW200405405A/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Weting (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • ing And Chemical Polishing (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The present invention provides a kind of substrate processing apparatus that has the function of conveying substrates from one position toward the other position in the processing line, and has the capability of efficiently processing substrate during the conveying operation. The substrate processing apparatus (10) is composed of the frame shape housing (11), the processing mechanism (20) and the vertical movement mechanism (40). The housing (11) is provided with substrate inlet (11a) and substrate outlet (11b) disposed at both upper and lower positions. The processing mechanism (20) is disposed inside the housing (11) and includes the followings: the conveying support-mechanism for accommodating and supporting the substrate conveyed-into from substrate inlet (11a) as well as the substrate expelled from substrate outlet (11b); the support frame platform (21) for supporting the support and convey mechanism; the substrate inclining mechanism for tilting the substrate which is supported by the conveying support mechanism; and the processing-fluid spurting mechanism, which is disposed above the conveying support mechanism for spurting the processing fluid to the substrate that is tilted through the use of substrate inclining mechanism. The vertical movement mechanism (40) supports the processing mechanism (20) and moves it along the vertical direction, so as to make it pass through the substrate inlet (11a) and substrate outlet (11b).

Description

ZUU4U^4U^ 玖、發明說明: 【發明所屬之技術領域】 :發明有關基板處理裝置’用以對於半導體⑷晶圓 、液晶玻璃基板、光罩用 皁用破璃基板、先碟用基板等各種基 ’邊使其移動(邊搬運)邊進行既定處理;並關於連 數個處理裝置所構成的基板處理系統。 【先前技術】 ^如,在液晶玻璃基板的製程中,進行顯影液的塗佈 的=、用於剝離光阻膜的剝離液的塗佈 =處理’在各濕式製程處理期間,進行洗淨處理和乾燥 另外,作為用於上述各處理的處理農置,在目前ZUU4U ^ 4U ^ 发明, Description of the invention: [Technical field to which the invention belongs]: Invented a substrate processing device 'for semiconductor wafers, liquid crystal glass substrates, glass substrates for photomasks, glass substrates for soap, etc. The substrate is subjected to predetermined processing while being moved (transported), and a substrate processing system including a plurality of processing apparatuses. [Prior art] ^ For example, in the manufacturing process of the liquid crystal glass substrate, the application of the developing solution =, the application of the peeling solution for peeling the photoresist film = treatment 'is performed during each wet process treatment Treatment and drying In addition, as a treatment farm for each of the above processes,

的:理裝置’係將基板放置於搬運輥上,藉由上述搬運J 將基板沿水平方向搬運㈣其進行處理。此外,也: 為了連續地進行上述各處理,而將各處理裝置加以連接而 構成之圖1 5所示的基板處理系統。 圖15是表^習知例的基板處理㈣的基本構成的 回,如圖15所示,基板處理系統2〇〇由美 、 、基板處理部2G5和基板搬運部21()構成。基板投 排出部201由載置台202和移載裝i 204構成,载置二 202載置收納複數個基板的£ 2Q3,移載裝置_從二 上的"。3的内部’逐片地取出基板,; 入到基板處理部205’從基板處理部2〇5取出已結束處理 200405405 的基板,將其儲存於匣203内。另外,移載裝置2〇4通常 ^幾械手臂(㈣⑷構成,該機械手臂可沿載置台2〇2 = 邊方向移動。 基板處理部205由相互平行地併設的第1處理部 和第2處理部2〇7i£ 2條處理線構成,第i處理部挪牙 第2處理部207如圖16所示,具有分別沿箭頭方向搬運^ 板的棱數個搬運輥208,可藉由搬運輥2〇8,邊 對其進行既定的處理。例如,第】處理部2〇6是== 打蝕刻$理的處理冑,在搬運中的基板上,塗佈蝕刻液。 此外’第、2處理部m由水洗處理部ma和乾燥處理部 〇7b構成’在水洗處理部ma中’將洗淨水供給於基板 ,在乾燥處理部207b中,向基板供給乾燥用氣體。 上述基板搬運部210是將第1處理部m處理過的基 板搬運至帛2處理部m的機構,其包括:方向切換裝置 211,用來切換從第1處理部讓排出的基板的搬運方向, 並對錢行搬運;複數個搬運輥212,用來沿上述排出方 向搬運從方向切換裝署9〗彳 換辰置211排出的基板;及方向切換 213 ’用、來切換㈣運槪212搬運的基板的搬運方向並將該 基板搬運到第2處理部2 〇 7。 、 如圖1 7所示,方& + 4么 向切換凌置211包括:複數個第丨搬 運輥214,用來在盥椹成筮7 + ”楫成弟1處理部2〇6的搬運輥2 搬運面相同的水平面内,沿相同的搬運方向搬運基 昇降器215,設置於第 運報214的搬運面^上下H114之間,用來從第1搬 〇上下方向大出退回;及複數組第2 200405405 搬運輥216,相互對向設置於第丨搬運輥214的上方,具 有與第1搬運輥214的中心軸相垂直的中心軸,以將基板 κ搬運到搬運輥212側。另外,相互對向的第2搬運輥 可沿相互接近/離開的方向移動。另外,在圖中,符號 21 7表示阻止基板κ移動的止動件。 根據方向切換裝置211,藉由第i搬運輥214將從第工 處理部206排出的基板κ沿上述排出方向搬運,直至與止 動件217接觸。此時,昇降器215從第i搬運輕214的搬 運面向下退回。接著,#降器215從第1搬運輕214的搬 運面向上犬出’藉此,使基板K上昇到圖1 7中的2點鏈線 斤丁的位置此日守,帛2搬運親216位於相互離開的位置 :接著1 2搬運輕216移動到相互接近的位置,然後, 昇U15下Ρ牛。藉此’基板Κ處於被第2搬運秦m 6支 樓的狀態,然後,藉由帛2搬運輥216,沿與第丨搬運親 214的搬運方向相垂直的方向、即朝向搬運輥川側搬運 排出基板。這樣,切換了基板κ的搬運方向。 特別是,方向切換裝置213也具備與方向切換裝置 大致相同的構成,用來切換由搬運報2丄2搬運的基板^ 的搬運方向,將其搬運至第2處理部2。7,雖然這一點在 未圖示。 圖15所示,在基板處理系統2 0 0中,第1處理部 土板搬運部21 〇和第2處理部2〇7以俯視呈c字形設 由移載裝i m從£ 203取出的基板κ,首先投入到 第1處理206。接著’邊沿箭頭方向在第1處理部206 200405405 内搬運基S K,邊對該基板進行既定的處理(㈣處理), 然後,在基板搬運冑210中,切換其搬運方向,並㈣美 板投入至f 2處理部207。而且,邊沿箭頭方向在第:二 理部m内搬運基板κ,邊對該基板進行既定的處理(水^ 處理和乾燥處理),然後,由移載裝置204再次將其儲存於 E 203 内。 【發明内容】 仁是在第1處理部206和第2處理部207中,若在 搬運中’基板K的姿勢發生變化,例如若相對於搬運方向 朝與^相垂直的方向傾斜時,則不能進行精度良好的處理 方、疋’在目丽,如圖16所示,在搬運輥208的兩端部的 幸昆上形成凸㈣2G8a,可藉由凸緣部2G8a對搬運中的基 板,K的姿勢進行控制。該情況對於第1搬運輥214和第土2 運氈216來况,也是相同的。但是,若設置這樣的凸緣 & 08a則凸緣部2〇8a造成妨礙,不能在搬運輥2〇8的 搬運面内,切換基板κ的搬運方向。於是,在上述的方向 ㈣裝置21卜213中’將基板κ±頂昇至凸緣部啊的 上端上方,切換其搬運方向。 另外,由於上述原因,在以使基板Κ #降的方式構成 的基⑽運部21〇巾’不能在該部進行基板κ的處理,因 此士 /、進行基板κ的搬運。即,例如在該部進行基板的洗 守’若使基Κ昇降,則產生使從喷嘴喷射的洗淨液較 200405405 強的部位及不那麼強的部位,洗淨效果產生差異。 因此,在目前的基板處理系統2〇〇中,如上所述,在 基板搬運部210中不對基板κ進行處理,但另一方面,由 於該情況卻產生下列問題。 即,例如,如圖15所示的例那樣,在第i處理部2〇6 ,對基板K進行蝕刻處理後,若未洗淨就對其進行搬運, 則由於送至第2處理部2G7的搬運時間的差異,钮刻進行 的:呈度不Θ,不能高精度卿刻進行控制。由於基板搬 運部210具有由使基板κ昇降的機構及使第2搬運親叫 移動的機構所構成之複雜的動作機構,故很 搬運時間進行控制。 货度地對 二外,例如,在第1處理部的最終步驟為洗淨步 ^ ,月況下,若不進行乾燥地搬運基板κ,則在 生乾燥不均勻的狀態,或產生污點,基板κ成為不良品。 而且,在上述習知的基板處理系統2〇〇中, 方向搬運水平支樓狀態的基Κ,邊㈣刻液:7 : 樣的各種處理液供給至該基板κ,但 平7艳 在乂樣將處理液供給至水平姿勢的基板κ的 在基板Κ的表面上產+卢搜、广&、广、ώ /下’難以 〜 產生處理液的液流,最初供給的處理、為 印召於基Κ的表面上’故難以更換連續供給 ’ 液,另外也存在處理上費時、不能進行均句理斤的處理 。 7處理之問題 善 另方面,右向基板K供給大量的處理 处里液的更換性,但使用大量的處理液, /夜,雖然可改 疋沒有效率的 20040540^ ’另二導致儲存該處理液的容器大型化、裝置大型化。 ,1在上述習知的基板處理系、统測巾,由於平行 地併设第1處理部206和第 弟2處理部207這兩條處理線, 故逖存在裝置的設置效率差的問題。 本發明是針對上述實際情況而開發出的,本發明的目 的在於提供-種基板處理裝置,其具有從其中—條處理線 向另-條處理線搬運基板的功能、且能有效地對搬運中的 基板進行處理;並提供具㈣u㈣板處理系統。: The processing device 'is to place the substrate on a conveying roller, and the substrate is conveyed in the horizontal direction by the above-mentioned conveying J for processing. In addition, the substrate processing system shown in Fig. 15 is also constructed by connecting the processing apparatuses in order to continuously perform the above-mentioned processes. Fig. 15 shows the basic structure of a substrate processing unit according to a conventional example. As shown in Fig. 15, the substrate processing system 2000 is composed of a substrate processing unit 2G5 and a substrate transfer unit 21 (). The substrate casting and discharging unit 201 is composed of a mounting table 202 and a transfer mounting i 204, and the second mounting 202 mounts 2Q3 for accommodating a plurality of substrates. In the interior of 3, the substrates are taken out one by one, and the substrate processing unit 205 'is taken out of the substrate processing unit 205 and the substrates that have finished processing 200405405 are stored in the cassette 203. In addition, the transfer device 204 is generally composed of several robot arms (the robot arm can be moved in the lateral direction of the mounting table 202). The substrate processing section 205 includes a first processing section and a second processing arranged in parallel with each other. Section 207i is composed of two processing lines. As shown in FIG. 16, the i-th processing section moves teeth. The second processing section 207 has a plurality of conveying rollers 208 for conveying the ^ plate in the direction of the arrow. The conveying roller 2 can be used. 〇8, while carrying out the predetermined processing. For example, the first processing section 206 is a processing step for etching, and the etchant is applied on the substrate being transported. In addition, the second processing section m is composed of a water washing processing unit ma and a drying processing unit 07b, and the washing water is supplied to the substrate in the water washing processing unit ma, and the drying processing unit 207b supplies a drying gas to the substrate. The substrate transfer unit 210 is configured to A mechanism for transporting the substrate processed by the first processing unit m to the processing unit m, including: a direction switching device 211 for switching the transport direction of the substrate discharged from the first processing unit, and transporting money; Transporting rollers 212 for transporting the slaves in the discharge direction Switching and loading 9: change the substrates discharged from the set 211; and switch 213 'to switch the transfer direction of the substrates transported by the transport unit 212 and transfer the substrates to the second processing unit 207. As shown in FIG. 7, the square & + 4 direction switch 211 includes: a plurality of first conveying rollers 214 for conveying on the conveying roller 2 of the processing unit 2 of the processing unit 7 + ”楫 成 弟 1” Within the same horizontal plane, the base lifter 215 is transported in the same transport direction, and is arranged between the transport surface ^ up and down H114 of the transport report 214, and is used to return from the first transport 〇 up and down; and the second in the complex array 200405405 The conveying rollers 216 are disposed opposite to each other above the first conveying roller 214 and have a central axis perpendicular to the central axis of the first conveying roller 214 to convey the substrate κ to the conveying roller 212 side. The second conveying rollers can move in directions approaching / removing from each other. In addition, in the figure, reference numeral 21 7 indicates a stopper that prevents the substrate κ from moving. According to the direction switching device 211, the i-th conveying roller 214 will move from the first The substrate κ discharged from the processing unit 206 is conveyed in the above-mentioned discharge direction, Until it comes into contact with the stopper 217. At this time, the lifter 215 is retracted downward from the conveyance surface of the i-th conveyance light 214. Then, the #Descender 215 is raised upward from the conveyance surface of the first conveyance light 214. K rises to the position of the two-point chain line caterer in Fig. 17. At this date, 帛 2 carrying pro 216 is located at a position away from each other: then 1 2 carrying light 216 moves to a position close to each other, and then, U15 rises to P In this way, the substrate K is in the state of being transported by the second branch of the Qin m 6 branch, and then, by the second transport roller 216, in a direction perpendicular to the transport direction of the second transporter 214, that is, toward the transport roller. The side substrate is discharged. In this way, the conveyance direction of the substrate κ is switched. In particular, the direction switching device 213 also has a structure substantially the same as that of the direction switching device. The direction switching device 213 is used to switch the conveyance direction of the substrate ^ conveyed by the conveyance report 2 丄 2 and convey it to the second processing unit 2.7. Not shown. As shown in FIG. 15, in the substrate processing system 2000, the first processing unit slab conveying unit 21 〇 and the second processing unit 207 are arranged in a c-shape in plan view, and the substrate κ taken out from the transfer unit im from £ 203 First, it is invested in the first process 206. Next, the substrate SK is transported in the first processing unit 206 200405405 along the direction of the arrow, and the substrate is subjected to a predetermined treatment (㈣ treatment). Then, the substrate is transferred in the substrate transfer unit 210, and the transfer direction is changed. f 2Processing section 207. Furthermore, the substrate κ is transported in the second processing unit m in the direction of the arrow, and the substrate is subjected to predetermined processing (water treatment and drying processing), and then stored in E 203 by the transfer device 204. [Summary of the Invention] In the first processing unit 206 and the second processing unit 207, if the posture of the 'substrate K changes during transportation, for example, if it is tilted in a direction perpendicular to the ^ relative to the transportation direction, it cannot be A processing step with good accuracy is performed in Miri, as shown in FIG. 16, and protrusions 2G8a are formed on the two ends of the conveying roller 208, and the flange 2G8a can be used to transport the substrate, K Posture control. This situation is also the same for the first conveying roller 214 and the second soil conveying felt 216. However, if such a flange & 08a is provided, the flange portion 208a causes an obstacle, and the conveyance direction of the substrate κ cannot be switched within the conveyance surface of the conveyance roller 208. Then, in the above-mentioned direction ㈣devices 21 and 213 ', the substrate κ ± is lifted above the upper end of the flange portion, and the conveyance direction thereof is switched. In addition, due to the above-mentioned reasons, the substrate transporter 21, which is configured to lower the substrate K #, cannot perform the processing of the substrate κ in this section, and therefore the substrate κ is transported. That is, for example, if the substrate is cleaned in this section, if the substrate K is raised and lowered, a part where the cleaning liquid sprayed from the nozzle is stronger than 200405405 and a part not so strong are generated, and the cleaning effect is different. Therefore, in the current substrate processing system 2000, as described above, the substrate κ is not processed in the substrate transfer unit 210, but on the other hand, the following problems arise due to this situation. That is, for example, as in the example shown in FIG. 15, after the substrate K is etched in the i-th processing section 206, if it is transported without being cleaned, it is sent to the second processing section 2G7. The difference in the carrying time is performed by the button cutting: the degree is not Θ, and it cannot be controlled with high precision. Since the substrate transfer unit 210 has a complicated operation mechanism composed of a mechanism for raising and lowering the substrate κ and a mechanism for moving the second carrier, the transport time is controlled. For example, if the final step of the first processing section is a washing step ^, if the substrate κ is transported without drying under the monthly conditions, it will be unevenly dried or stained. κ becomes defective. Furthermore, in the conventional substrate processing system 2000 described above, the substrate K in the state of a horizontal branch is transported in the direction, and the edge-cutting solution: 7: various processing liquids of the same kind are supplied to the substrate κ, but the flat 7-color is in the shape of the substrate. It is difficult to supply the processing liquid to the substrate κ in the horizontal position on the surface of the substrate κ + LU Sou, Kuang & Kuang, Xie / Xia 'difficult ~ A liquid flow of the processing liquid is generated. On the surface of the substrate, 'it is difficult to replace the continuous supply' liquid, and there are also processing that is time-consuming and cannot be performed. 7Problems of processing On the other hand, the right side supplies a large amount of processing liquid to the substrate K, but a large amount of processing liquid is used. / Night, although it can be changed to an inefficient 20040540 ^ 'Another is the storage of the processing liquid. Larger containers and larger equipment. In the above-mentioned conventional substrate processing system and uniform measuring towel, since two processing lines of a first processing unit 206 and a second processing unit 207 are arranged in parallel, there is a problem that the installation efficiency of the device is poor. The present invention has been developed in view of the above-mentioned actual situation, and an object of the present invention is to provide a substrate processing apparatus having a function of transferring substrates from one processing line to another processing line, and can effectively carry Processing of the substrate; and provide a plate processing system.

術手段及 用於達成上述目的之本發明有關一種昇降式基板處理 裝置’其特徵在於具備·· 框體狀殼體’係具有上下併設的基板投入口及基板排 出〇 ; 處理機構,係内裝於殼體内;其具有··搬運支樓機構 ,用來收納並支撐從基板投入口搬入的基板,且從基板排 出口排出該基板;支撐架台,用來支撐搬運支撐機構;基 板傾斜機構,用來使被搬運支樓機構支樓的基板傾斜;卩鲁 處理流體喷出機構,設於搬運支撐機構的上方,用來將處 理流體噴到藉基板傾斜機構而傾斜的基板上;及 昇降機構,用來支撐處理機構,並使處理機構沿上下 方向昇降,使處理機構經過基板投入口和基板排出口。 依據上述昇降式基板處理裝置,藉由昇降機構,使處 理機構沿上下方向昇降,經過基板投入口和基板排出口。 而且,當處理機構經過基板投入口時,從基板投入口,收 11 200405405 納自前一步驟的處理部排出的基板並對其進行支撐,按照 移動到基板排出口之前的既定時間,從處理流體喷出機構 ’將處理流體噴出到基板上。藉此,對基板進行既定的處 里在處理後,將其從上述基板排出口排出並搬運到下一 步驟的處理部。另外’在噴出處理流體、進行既定的處理 的期間,透過基板傾斜機構,使基板相對水平面傾斜既定 角度。 這樣,依據該昇降式基板處 一一 w々、Μ Ί又又得The method and the present invention for achieving the above-mentioned object are related to a lifting type substrate processing apparatus 'characterized by having a frame-shaped case' having a substrate input port and a substrate discharge side by side; a processing mechanism, which is internally installed Inside the housing; it has a transfer support mechanism to store and support the substrate carried in from the substrate input port, and to discharge the substrate from the substrate discharge port; a support stand to support the transfer support mechanism; a substrate tilt mechanism, It is used to tilt the substrate of the branch of the branch mechanism being transported; the Lulu processing fluid ejection mechanism is provided above the transport support mechanism to spray the processing fluid onto the substrate tilted by the substrate tilt mechanism; and the lifting mechanism , Used to support the processing mechanism, and make the processing mechanism rise and fall in the up-down direction, so that the processing mechanism passes through the substrate input port and the substrate discharge port. According to the above-mentioned lifting-type substrate processing apparatus, the processing mechanism is moved up and down by the lifting mechanism, and passes through the substrate input port and the substrate discharge port. Furthermore, when the processing mechanism passes through the substrate input port, the substrate discharged from the processing unit in the previous step is taken up and supported from the substrate input port, and sprayed from the processing fluid at a predetermined time before moving to the substrate discharge port. The ejection mechanism 'ejects the processing fluid onto the substrate. Thereby, after the substrate is processed in a predetermined place, it is discharged from the substrate discharge port and transferred to the processing unit in the next step. In addition, while the processing fluid is being ejected and a predetermined process is performed, the substrate is tilted by a predetermined angle with respect to the horizontal plane through the substrate tilting mechanism. In this way, according to the lifting substrate,

板的搬運支撐機構及將處理流體噴出到受支撐的基板上 處理流體喷出機構所構成的整個處理機構昇#,二在搬 基板時’基板與處理流體喷出機構之間的位置關係不變 因此’例如,在對基板進行洗淨的情況下,可將從處理 體$出機構噴出的洗淨液Α致均勾地供給到基板上的各 分’可進行均勻的洗淨。The board supporting mechanism and the entire processing mechanism constituted by the processing fluid ejection mechanism that ejects the processing fluid onto the supported substrate. The position relationship between the substrate and the processing fluid ejection mechanism does not change when the substrate is moved. Therefore, "for example, when the substrate is cleaned, the cleaning liquid A ejected from the processing body discharge mechanism can be uniformly supplied to each of the points on the substrate," which enables uniform cleaning.

另外,由於能以由昇降機構使處理機構昇降的這種 :的動作搬運基板’故其速度控制容易,因此,即使在』 订钱刻等處理的情況下,仍可高精度地對其進行控制。 到:面HI向已傾斜的基板噴出處理流體,故供 1面上的處理流體因基板的傾斜而產… 液級,透過該液流,基板表面上的處理产雕 給的新的處理流體更換。這 :::’斤由連續# 用,处丨 透過该處理流體的更換竹 月匕、量的處理流體,在較短 、 表面進行處理。 ’均㈣對基板 還有,近年來,伴隨基板的大型化,存在用於對其進 12 200405405 行處理的處理流體的使用量、處理時間增加的趨勢,μ =所述,;過使基板傾斜’對其進行處理,可減小處理流 ⑱的使用里’達到裝置小型化的目的,可降低處理成本。 在本^明中,在上述處理流體中,包括顯影液、㈣ 液、用於剝離光阻膜的剝離液、洗淨用的洗淨水、乾焊用 的氣體等這些對基板進行處理用的各種流體,可將上述各 種處理流體供給到基板上,對其進行處理。In addition, since the processing mechanism can be lifted and lowered by the lifting mechanism, the speed of the substrate can be easily controlled. Therefore, it can be controlled with high accuracy even in the case of processing such as "order money engraving". . To: Surface HI ejects the processing fluid to the substrate that has been tilted, so the processing fluid on one side is produced by the tilt of the substrate ... The liquid level, through this liquid flow, the new processing fluid produced by the processing on the substrate surface is replaced . This ::: 斤 由 CW # is used to replace the bamboo dagger and the amount of processing fluid through the processing fluid, and the treatment is performed on a shorter surface. 'Homogeneous also has substrates. In recent years, with the increase in the size of substrates, there has been a tendency that the amount of processing fluid used to process them and the processing time will increase, μ = said; 'Processing it can reduce the use of processing flow' to achieve the purpose of miniaturization of the device and reduce processing costs. In this specification, the above-mentioned processing fluid includes a developer, a bath, a peeling liquid for peeling a photoresist film, a washing water for washing, a gas for dry welding, and the like. For various fluids, the above-mentioned various processing fluids can be supplied to a substrate and processed.

但是,基板的傾斜角度,係用來控制液流在基板表面 上流下的速度,換言之,用來控制處理液在基板表面上滞 留的時間,在該速度適當時,可獲得所需的處理效果。 按照該含義,在上述處理液喷出機構是以喷出作為處 理流體的姓刻液的方式構成的情況下,藉上述基板傾斜機 構而傾斜的基板,相對於水平面的傾斜角度最好在】。至 7.5。的範圍内(更佳在2。至5。的範圍内)。採用該範圍的原 因在於:若上述傾斜角度超過7_5。,則液流的速度過快,However, the inclination angle of the substrate is used to control the speed at which the liquid flow flows down the substrate surface. In other words, it is used to control the residence time of the processing liquid on the substrate surface. When the speed is appropriate, the desired processing effect can be obtained. According to this meaning, in a case where the processing liquid ejection mechanism is configured to eject a last name liquid as a processing fluid, the substrate inclined by the substrate tilting mechanism preferably has an inclination angle with respect to a horizontal plane]. To 7.5. Range (more preferably in the range of 2. to 5.). The reason for adopting this range is that if the above-mentioned tilt angle exceeds 7_5. , The speed of the flow is too fast,

即,基板表面上的蝕刻液的滯留時間過短,反之,在傾斜 角度不足1。的情況下’液流的速度過慢,即,基板表面的 钮刻液滯留較長時間’在任何一種情況下,均不能充分地 進行處理,蝕刻液的使用量增大。 還有,在上述基板的傾斜角度在〗。至7·5。的範圍内 勺t月;兄下若將其換异為在該基板表面上流下的钱刻液的 加速度,則該加速度是在重力加速度的〇· 〇8倍至〇. 13倍 的範圍内,在更佳的2。至5。的範圍内的情況下,上述蝕刻 液的加速度疋在重力加速度的〇 · Μ倍至〇 ·⑽倍的範圍内 13 200405405 另外,在上述處理流體喰屮 、 贺出機構疋以可喷出作為處理 流體的洗淨液或剝離液的方々 万式構成的情況下,藉上述基板 傾斜機構而傾斜的基板,相對 了 y、水十面的傾斜角度最好在 45。至75。的範圍内(更佳是在5 至70的範圍内)。採用該 範圍的原因在於:若上述傾钭自 、 貝斜角度超過75。,則液流的速 度過快’即’基板表面上的洗參 J况斤液或剝離液的滯留時間過 ^ ’反之’在傾斜角度不足45。的情況下,液流的速度過That is, the residence time of the etchant on the substrate surface is too short, and conversely, the inclination angle is less than one. In the case of 'the speed of the liquid flow is too slow, that is, the button liquid on the substrate surface stays for a long time', in any case, the treatment cannot be performed sufficiently, and the amount of the etchant used increases. In addition, the inclination angle of the substrate is within a range. To 7.5. If it is changed to the acceleration of the money engraving liquid flowing down on the surface of the substrate, the acceleration is in the range of 0.88 to 0.13 times the acceleration of gravity. In the better 2. To 5. In the case of within the range, the acceleration 疋 of the etching solution is within the range of 0 · M times to 0 · ⑽ times the acceleration of gravity. 13 200405405 In addition, the processing fluid 喰 屮 and the discharge mechanism 疋 are treated as ejectable. In the case of a square cleaning solution of a fluid washing liquid or a peeling liquid, the tilt angle of the substrate tilted by the substrate tilting mechanism with respect to y and water is preferably 45. To 75. Range (more preferably in the range of 5 to 70). The reason for adopting this range is that if the tilt angle above 75 °. , The speed of the liquid flow is too fast ', that is, the retention time of the washing solution or the stripping solution on the substrate surface is too high. ^' Otherwise ', the tilt angle is less than 45. The speed of the flow

慢,即,基板表面的姓刻液滞留較長時間,在任何一種情 況下’均不能充分地進行處理 ^ j处主冼淨液、剝離液的使用量 增大。 主另外,在上述基板的傾斜角度在45。至75。的範圍内的 f月況下’ #將其換异為洗淨液、剝離液在該基板表面上流 I的加速度,則該加速度是在重力加速度的0.7倍至〇.97 勺範圍内,在更佳的5 5。至7 0。的範圍内的情況下,上述 洗淨液、剝離液的加速度是在重力加速度的〇· Μ倍至 〇· 94倍的範圍内。 以使藉處 在與基板 即,在基 匕外’上述處理機構也可以具備擺動機構, 理流體噴出機構而喷出的處理流體的喷出方向, 的傾斜方向平行、且與基板正交的平面内擺動, 板的傾斜的上方和下方之間擺動。 若這樣,當使處理流體的喷出方向朝向基板的傾斜上 方毛b動& ’透過上述擺動,處理流體滯留於基板表面上的 乍用θ大’且當使處理流體的喷出方向朝向基板的傾斜下 14 200405405 =動透過錢動,在基板表面上留下的處理流體的 2度:大,處理液的滞留和流下在整個基板表面反覆地產 、言樣透過„亥作用,可在較短時間内,且以更少量的 處理流體,均句地對整個基板表面進行處理。 另外,該搬運支擇機構,係用來在收納基板後,使所 收納的基板沿基板的搬人/排出方向反覆前後運動。 :上述般’在昇降式基板處理裝置中,可將從處理流 ,贺出機構喷出的處理流體大致均勾地供給到基板上的各 部分上’❻另—方面’存在像在處理流體本身中有例如壓 力較向的部位和較低的部位這樣產生不均勻的情況,但是 在這樣的情況下’不能對基板進行嚴格意義上的均質處理 〇Slow, that is, the last name engraving solution on the substrate surface stays for a long time, and in either case, the treatment cannot be sufficiently performed. Mainly, the inclination angle of the substrate is 45. To 75. Under the conditions of f in the range of '', it is changed to the acceleration of the cleaning solution and the stripping solution flowing on the surface of the substrate. Then, the acceleration is in the range of 0.7 times to 0.97 of the acceleration of gravity. Good 5 5 To 7 0. In the case of within the range, the acceleration of the washing liquid and the peeling liquid is in the range of OM times to 0.94 times the acceleration of gravity. The above-mentioned processing mechanism may be provided with a swing mechanism, a processing fluid discharge mechanism, and a direction in which the processing fluid is discharged from the substrate, that is, the inclined direction is parallel to the plane perpendicular to the substrate. Swing inside, swing between the tilted top and bottom of the board. In this case, when the ejection direction of the processing fluid is directed toward the inclined upper side of the substrate, " through the above-mentioned swing, the initial application θ of the process fluid remaining on the substrate surface is large " and when the ejection direction of the processing fluid is directed toward the substrate. Under the inclination of 14 200405405 = 2 degrees of processing fluid left on the surface of the substrate by moving through the money: large, the retention and flow of the processing liquid is repeated on the entire surface of the substrate, and it can be transmitted in a shorter time. Within a short period of time, the entire substrate surface is treated with a smaller amount of processing fluid. In addition, the conveyance selection mechanism is used to move the stored substrates along the substrate carrying / discharging direction after the substrates are stored. It moves back and forth repeatedly: As mentioned above, in the lifting type substrate processing apparatus, the processing fluid ejected from the processing stream and the discharge mechanism can be substantially uniformly supplied to each part on the substrate. In the processing fluid itself, there are cases where unevenness occurs, such as a part where the pressure is relatively low and a part where the pressure is low, but in this case, 'the substrate cannot be strictly sensed. The homogenization square

於疋,如上所述,若沿 納、支撐於搬運支撐機構上 的前後運動,能將碰到基板 化’對基板進行均質的處理 均勻的平均化處理也可透過 動來進行。 該搬入/排出方向反覆地使收 的基板前後運動,則透過基板 的處理流體的壓力不均勻平均 。此外,該處理流體的壓力不 上述處理流體的喷出方向的擺 S另夕卜,上述昇降式基板處理裝置中,該殼體,係被分 二構件〜基板的搬入/排出方向分隔為驅動室和處理室 十2個至,並在具有基板投入口和基板排出口的處理室設 置處理機構,且在驅動室設置昇降機構; 在刀&構件,沿上下方向形成將處理室和驅動室連通 的開口部; 15 为隔構件所形成的開立 別”l * ’開口 °p的沿上下方向的兩緣部,分 別壬同狀,並且在該一對 刀 μ 對各同狀部的相互對向的面上形成 /口上下方向的缺口槽; 取 處理機構的支撐架a, 的、鱼 /、σ精由設於分隔構件的開口部内 的連、、、°具,與昇降機構連結; 在連結具連接有帶狀的片體,其設置 之間’並且設置成朝向連結具的上方和下方延伸,::: 緣部分別從缺口槽插人筒狀部内; -兩側 而成越動室和處理室係由分隔構件、連結具、及片體分隔 w含的顯影液、㈣液、㈣液等的腐轴 1* 生車父1¾ ’右其附著於昇p备撼播 …力Pr二 則存在該昇降機構損壞 ”力^彳貝的危險。於是,如±所述般,若設有昇 構的驅動室和設有處理機構的處理室透過分隔構件、遠社 具和片體而分隔,則可防止處理室所使用的處理流體^ 驅動室’可防止因虚理、;☆辦 U蜃理机體造成的昇降機構損壞的情、兄 特別是’由於採用下述的所謂迷宮結構,其中,將沿:二 於分隔構件上的開口部的上下方向的緣部形成為筒:者2 且以朝向連結具的上方和下方延伸的方式設置的片體 側緣部’從形成於上述筒狀部的缺口槽中插入該筒狀部内 ,故可使驅動室和處理室這兩者的氣密性提高。 而且,也可設置有複數組上述開口部、連結具和片體 。另外,若設置將上述筒狀部内的氣體棑出的排氣機構, 由於對於從上述片體與缺口槽之間的間隙侵入筒狀部 的 16 200405405 處理流體,可透過上述排氣機構進行排氣,故可更確實地 防止處理流體侵入驅動室。 貝 ▲另外,上述片體可形成無端環狀。另外,也可分別在 该片體的上部側和下部側,設置對片體進行搂取/送出的 捲取/送出機構,隨著藉昇降樯盖 、 一丄 有稭幵降祛構而幵降的片體的運動, 猎由捲取/送出機構對片體進 m 遇可如此般 構成,即,該捲取/送出機構 + 佶Μ π 土 你由捲取片體的捲取軸和 轉的驅動機構構成;驅動機構,係用來在捲取 = '出方向旋轉時’僅使制動力作用於捲取轴,且在使 軸在捲取方向旋轉時,透過摩擦離 給捲取軸。依櫨兮嫉兩/、、,, 叩將動力傳遞 ^ 據 /达出機構,片體不產生穸弛《Τ 將其捲取、送出。 卜座生籑弛,可 再者,該驅動機構,係具有:與 輪;盥你叙各认4t人 卞史、、、口 U文動齒 ^動回輪嚙合之驅動齒輪;與 籬入哭·如# ^ 7功回輪連結之摩捧 …與摩擦離合器連結之旋轉轴;2個單向離入: 分別與旋轉轴的兩端部連結,以容許=向離合裔, 旋轉;滑輪,透迟+ 轉軸僅往一個方向 輪透過其中一個單向離 捲繞於滑輪之偉動由册 與凝轉軸連結; 構件;該2個單向離入… 個早向硪合器之支撐 +勹離合杰,係用來 轴往捲取方向旋轉的方向旋轉,且=轴朝者使捲取 軸往送出方向旋轉的方^絲♦ ^轉轴朝著使捲取 機構而旋動。 、°疋’且傳動皮帶’係藉由昇降 下ϋ:二依據上述結構的昇降式基板處理裝置m 下述基板處理系統, 、置可形成 °亥基板處理系統的結構是:上下併設 17 200405405 f第1基板處理裝置和第2基板處理裝置,係邊以水平狀 態或傾斜狀態移動基板邊對該基板進行處理;將第i基板 處理裳置的基板排出部和昇降式基板處理裝置的基板投入 才連接’將第2基板處理裝置的基板投人部和昇降式基 板處理裝置的基板排出口相連接;使基板依序經過第】^ 板處理裝置、昇降式基板處理裝置、第2基板處理裝置。 ^在同—水平面内併設第1基板處理裝置和第2基板處 理裝置的習知處理系統相比較,設置空間較小。 【貫施方式】 :面根據圖式來說明本發明的具體實施方式。圖丄是 二 ::發明的一個實施方式的基板處理系統 S 2疋其俯視圖。另外,圖3是表 的=基板處理裝置的概略構成的前剖面圖,= 其側剖面圖。另;概略構成的前剖面圖,圖5是 剖面圖,圖7是“3中:沿圖5中的㈣方向的俯視 8是沿圖”的:RV Α方向的俯視剖面圖,圖 是沿圖7中的DD⑽ 向的俯視剖面圖。此外,圖3也 中的DD~DD方向的剖面圖。 :°兒月本例的基板處理系統1的構成。 入/二二本例的基板處理系統1由基板投 板處理袭置7,、 ^ °又的第1基板處理裝置6和第2基 以及昇降式基板處理梦 入/排出部2由〇構成。基板投 。4和移载裝置3構成,該載置台4 18 200405405 者收納複數個基板的£ 5,該移載裝置3逐片地從 产理^置台4上龍5内取出基板,將其投入第1基板 6,且從第2基板處理裝置7取出已處理完成的 2板’將其存放於E 5中。另外’移置3由可沿載置 。,4的長邊方向(箭頭所示方向)移動的機械手臂構成。另 外,匣5透過未圖示的AGV等的搬運裝置搬運。 相對^第1基板處理裝置6在其基板投人側具有使基板 以平狀態傾斜!。至7.5。之角度(在本例中為巧的基 反_'斜機構部’並且還具有以基板繼續傾斜之狀態沿箭頭 所不方向搬運傾斜的基板的傾斜搬運部。另一方面,第2 ,板處理裝置7沿箭頭所示方向依序具有:基板傾斜機構 部’用以接受從昇降式基板處理裝置1Q排出的基板,再使 該基板大幅度傾斜為45。至75。的角度(在本例中為7〇。); 傾斜搬運部’用來以基板繼續傾斜之狀態沿箭頭所示方向 搬運傾斜的基板;及將傾斜的基板返回水平狀態的傾斜返 回機構部。而且在本財,帛1基板處理裝置以邊搬運基 板邊對基板進行姓刻的方式構成,第2基板處理裝置7以 邊搬運該基板邊對該基板進行洗淨及乾燥的方式構成。 如圖3、圖7及圖8所示,上述昇降式基板處理裝置 1〇由呈框體狀的殼體1卜設置於殼體11内的處理機構20 及昇降機構40等構成。另外,在殼體丨丨中,形成有開口 部Ua和開口部llbl 口部Ua與第i基板處理裝置6 的内部連通,開口冑llb與第2基板處理裝置7的内部連 通。另外’殼體11由支柱12支撐’將殼體u的内部,分 19 200405405 隔為處理室A和驅動室b,在處理室A中設置有處理機構 2 0,在驅動室B中設有昇降機構4 0。 上述處理機構20由蝕刻裝置22和支撐蝕刻裝置22的 支撐架台21構成。蝕刻裝置22如圖4〜圖6所示,包括 •框體狀外殼23 ’其一側面設置有搬入/排出基板&的開 口部23a ;設置於外殼23内部的複數個搬運輥26 ;及設置 於搬運輥26上方的複數個喷嘴29、與設置於搬運輥26的 下方且與複數個噴嘴29相同的複數個喷嘴3〇。 在最接近上述開口部23a的搬運輥26上,設置有夾持 輥27,夾持輥27抵接於搬運輥26的上部,以夹持基板κ ,透過這些搬運輥26和夾持輥27的正反向旋轉,將基板 K從開口部23a搬入,從開口部23a排出。 另外,搬運輥26的旋轉軸263的兩端部以可旋轉的方 工、支姜方、基口 33上,在基台33上設置有導引親34,藉以 限:基板K在與基κ的搬運方向相垂直的方向上移動。 土 〇 33係中央部透過連接構件%可擺動地支撐於支撐 構件35(豎設於外殼23 堝+人姐从 丞。33之一端部則透 朴° 38,與驅動缸37的活塞桿37a卡合,基板33 措此可沿與基板κ的搬運方向相垂直的方向傾斜。 上?:動由油壓缸或氣覆缸構成,透過使其活塞 /、基板K的搬運方向相垂直的方向傾 地使搬運軺9 β 、…措此,同樣 椠26上的基板κ傾斜。 平面的傾钭&曰i 为外基台33相對於水 戶、斜角攻好在1〇至7 + 杜1主U的乾圍内,在本例中,設定 20 ^UU4U5405As described above, if the front-back movement is supported and supported on the conveyance support mechanism as described above, the substrate can be homogeneously processed when it touches the substrate. The uniform average processing can also be performed by movement. When the loading / unloading direction repeatedly moves the received substrate back and forth, the pressure of the processing fluid passing through the substrate is uneven and uniform. In addition, the pressure of the processing fluid is not the same as the swinging direction of the discharge direction of the processing fluid. In the above-mentioned lifting substrate processing apparatus, the housing is divided into a driving chamber by a two-member-to-board carrying / discharging direction. There are 12 processing chambers, and a processing mechanism is provided in a processing chamber having a substrate input port and a substrate discharge port, and a driving mechanism is provided in the driving chamber. The knife & member is formed to communicate between the processing chamber and the driving chamber in the vertical direction. The opening part 15 is an opening formed by the partition member. The two edges of the opening ° p in the up-down direction are in the same shape, and the pair of knives μ pair each other in the same shape. The notch groove formed in the upward / downward direction is taken; the supporting frame a of the processing mechanism is taken, and the fish /, σ are connected to the lifting mechanism by the connecting, ..., and ... tools provided in the opening of the partition member; The connecting piece is connected with a strip-shaped sheet body, which is disposed between and is arranged to extend above and below the connecting piece: ::: The edge portions are respectively inserted into the cylindrical portion from the notch grooves; And processing room The partition member, the coupling device, and the sheet body are separated by the rotting shaft 1 * of the developer, liquid, and liquid, etc. * The right car is attached to the lifter and it is ready to be broadcast ... There is a lifting mechanism in Pr. Danger of "damaging" force ^ 彳. Therefore, as described in the ±, if the driving chamber provided with the lifting structure and the processing chamber provided with the processing mechanism are separated by the partition member, the remote gear and the sheet body, the processing fluid used in the processing chamber can be prevented ^ Driving chamber 'It can prevent the damage of the lifting mechanism caused by the hypothesis; ☆ handle the body, especially the' so-called labyrinth structure, in which, it will be along: the opening of the partition member The edge portion in the vertical direction is formed as a tube: The sheet-side edge portion '2' provided in such a manner as to extend upward and downward of the connector is inserted into the tube portion from a notch formed in the tube portion, so that The airtightness of both the driving chamber and the processing chamber is improved. In addition, a plurality of the openings, a connector, and a sheet body may be provided. In addition, if an exhaust mechanism is provided to blow out the gas in the cylindrical portion, the 16 200405405 processing fluid that has penetrated into the cylindrical portion from the gap between the sheet body and the notch groove can be exhausted through the exhaust mechanism. Therefore, it is possible to more reliably prevent the processing fluid from entering the driving chamber. ▲ In addition, the above-mentioned sheet body can form an endless ring. In addition, a coiling / feeding mechanism for picking up / feeding out the sheet body may be provided on the upper side and the lower side of the sheet body, respectively. The movement of the film body can be constituted by the coiling / feeding mechanism for the film entry, which is that the coiling / feeding mechanism + 佶 Μ π soil is taken by the coiling shaft and rotation of the coil The driving mechanism is constituted; the driving mechanism is used to make the braking force act on the winding shaft only when the winding = 'outward rotation', and when the shaft is rotating in the winding direction, it is separated from the winding shaft by friction. Relying on the two / ,,,, and 动力, the power is transmitted ^ According to the / reach mechanism, the film body does not produce relaxation "T Take it up and send it out. The seat is relaxed, but again, the drive mechanism has: a wheel; a driving gear that meshes with a 4t person who has a history of history; a driving gear that meshes with a moving tooth; and a cry · Such as # ^ 7 gangs connected to the power return wheel… rotation shaft connected to the friction clutch; 2 one-way disengagement: respectively connected to both ends of the rotation shaft to allow = to the clutch, to rotate; pulley, transparent The late + rotating shaft only goes to one direction wheel through one of the one-way separations. The great movement wound on the pulley is connected with the condensing shaft; the component; the two one-way openings ... the support of the early-direction coupler + the clutch , It is used to rotate the shaft in the direction of the winding direction, and the square shaft that the axiser rotates the winding shaft in the sending direction ^ ^ The rotating shaft rotates toward the winding mechanism. , ° 疋 'and the drive belt' are lifted and lowered: two lifting substrate processing devices according to the above structure m the following substrate processing system, the structure can be formed ° ° substrate processing system is: up and down 17 200405405 f The first substrate processing apparatus and the second substrate processing apparatus process the substrate while moving the substrate in a horizontal state or an inclined state; the substrate discharge unit of the i-th substrate processing rack and the substrate of the lift-type substrate processing apparatus are put into operation. The connection 'connects the substrate input part of the second substrate processing apparatus and the substrate discharge port of the lifting substrate processing apparatus; and passes the substrate through the first substrate processing apparatus, the lifting substrate processing apparatus, and the second substrate processing apparatus in this order. ^ Compared with the conventional processing system in which the first substrate processing device and the second substrate processing device are arranged in the same horizontal plane, the installation space is small. [Performance Mode]: Specific embodiments of the present invention will be described based on the drawings. FIG. 2 is a top view of a substrate processing system S 2 according to an embodiment of the invention. FIG. 3 is a front cross-sectional view of a schematic configuration of the substrate processing apparatus, and a side cross-sectional view thereof. In addition, a front cross-sectional view of a schematic structure, FIG. 5 is a cross-sectional view, and FIG. 7 is a “3: a plan view in the ㈣ direction in FIG. 5 is a view in FIG. Top sectional view in DD⑽ direction in 7. In addition, FIG. 3 is a cross-sectional view taken along the DD-DD direction. : ° The structure of the substrate processing system 1 of this example. The substrate processing system 1 of this example is composed of a substrate casting processing unit 7, a first substrate processing apparatus 6 and a second substrate, and a lifting substrate processing dream inlet / outlet unit 2 composed of 0. Substrate cast. 4 and a transfer device 3, the mounting table 4 18 200405405 accommodates a plurality of substrates £ 5, the transfer device 3 one by one to take out the substrate from the processing table 4 on the dragon 5 and put it into the first substrate 6 and take out the processed 2 plates from the second substrate processing apparatus 7 and store them in E5. In addition, 'shift 3' can be placed along. , 4 is composed of a robot arm that moves in the long-side direction (the direction shown by the arrow). The cassette 5 is transported by a transport device such as an AGV (not shown). In contrast, the first substrate processing apparatus 6 has a substrate-inclined side that tilts the substrate in a flat state! . To 7.5. The angle (in this example, it is the base-reverse _'sloping mechanism part ', and it also has a tilting conveying part which transports a tilted substrate in a direction not indicated by the arrow while the substrate continues to tilt. On the other hand, the second, the plate processing The device 7 has, in the order indicated by the arrow, a substrate tilting mechanism portion 'for receiving a substrate discharged from the lifting substrate processing apparatus 1Q, and further tilting the substrate to an angle of 45 ° to 75 ° (in this example) It is 70.); The tilting conveyance unit 'is used to transport tilted substrates in the direction shown by the arrow while the substrates continue to tilt; and the tilt return mechanism unit that returns the tilted substrates to the horizontal state. Also, in this case, 1 substrate The processing device is configured to engrav a substrate while conveying the substrate, and the second substrate processing device 7 is configured to clean and dry the substrate while conveying the substrate. As shown in FIG. 3, FIG. 7, and FIG. The above-mentioned lifting substrate processing apparatus 10 is composed of a housing 1 having a frame shape, a processing mechanism 20 and a lifting mechanism 40 provided in the housing 11, and the like. In addition, an opening is formed in the housing 丨 丨. Ua The opening llbl and the opening Ua are in communication with the inside of the i-th substrate processing apparatus 6, and the opening 胄 llb is in communication with the inside of the second substrate processing apparatus 7. In addition, 'the casing 11 is supported by the pillar 12' and the inside of the casing u is divided into 19 200405405 is divided into a processing chamber A and a driving chamber b. A processing mechanism 20 is provided in the processing chamber A, and a lifting mechanism 40 is provided in the driving chamber B. The processing mechanism 20 is supported by the etching device 22 and the supporting etching device 22 The gantry 21 is constituted. As shown in FIGS. 4 to 6, the etching device 22 includes a frame-shaped case 23 ′, one side of which is provided with an opening 23 a for carrying in / discharging a substrate &26; and a plurality of nozzles 29 provided above the conveyance roller 26, and a plurality of nozzles 30 provided under the conveyance roller 26 and the same as the plurality of nozzles 29. On the conveyance roller 26 closest to the opening 23a, A nip roller 27 is provided. The nip roller 27 abuts on the upper portion of the transfer roller 26 to hold the substrate κ. The substrate K is carried in through the opening 23a through the forward and reverse rotation of the transfer roller 26 and the nip roller 27. And discharged from the opening 23a. In addition, the conveying roller 2 The two ends of the rotating shaft 263 of 6 are rotatable square, square, and base 33, and a guide 34 is provided on the base 33, so that the substrate K is in a direction opposite to the transport direction of the base κ. It moves vertically. The central part of the soil 〇33 series is swingably supported by the support member 35 through the connection member (upright in the shell 23 pot + sister from 丞. One end of 33 is transparent ° 38, and the drive cylinder The piston rod 37a of 37 is engaged, and the substrate 33 can be tilted in a direction perpendicular to the conveying direction of the substrate κ. Upper ?: The hydraulic cylinder or air-cylinder is used to move the piston / and substrate K When the direction is perpendicular, the conveyance β9 β is tilted so that the substrate κ on the 椠 26 is also inclined. The inclination of the plane & i is that the outer abutment 33 is angled to the Mito within 10 to 7 + Du 1 main U. In this example, set 20 ^ UU4U5405

汉1 π搬:連季昆 分貫賀29分別固定於盥夫 圖示的姓刻液供給源連接的複數個供給管28上,將從^述 :虫刻液供給源(未圖示)供給至各供給管Μ的姓Han 1 π move: Lian Jikun branch Guan He 29 is fixed to a plurality of supply tubes 28 connected to the last name liquid supply source shown by the husband, and will be supplied from: Insect liquid supply source (not shown) Surname to each supply tube

=的上面(W。上述供給管28—沿基W 的搬運方向的方式,2個供給管以既定間隔排列成-排, :且供給管28列在以與基…傾斜角相同的角度傾斜 =平面内併設為多列,形成於其兩端部的支撐部= 上 (W. The above supply pipe 28—in the transport direction of the base W, the two supply pipes are arranged in a row at a predetermined interval, and the supply pipes 28 are arranged to be inclined at the same angle as the base ... Supporting portions formed in multiple rows in the plane and formed at both ends thereof

:過:承1〇"皮支撑構件_支樓成可旋轉。而且,各供 ::2?:可藉由擺動装置,繞其轴中心正反向旋轉:、 樣,猎由供給營9βΑΑτΓ~ κ的搬運方向相垂直的平二=轉’各喷嘴29在與基板 刻液的噴射方^在^^^’從各喷嘴^喷射的姓 如圖6和圖9二上:方和下方之間擺動。 達⑴…上述擺動裝置110包括:驅動馬 驅動馬達lu輸出轴⑴a上之旋轉板112;: 过 : 承 1〇 " Leather support member_ 支 楼 成 rotatable. Moreover, each supply :: 2 ?: can be rotated forward and backward about its axis center by a swinging device :, so, hunting by the supply direction of the supply camp 9βΑΑτΓ ~ κ is perpendicular to the two = turn 'each nozzle 29 is in contact with The spraying side of the substrate engraving liquid ^ is ^^^ ', and the surname sprayed from each nozzle ^ is shown in Figure 6 and Figure 9 above: swinging between the square and the bottom. ⑴… The above-mentioned swinging device 110 includes: a driving horse driving motor lu on the output shaft 之 a of the rotating plate 112;

112中心位置:乂了繞軸中心旋轉的方式豎設於偏離旋轉軸 2内:置的位置;第1驅動轴⑴,其一端設置於外殼 ,“設置於外殼23之外;第2桿115,其以可繞 ,方式豎設於第1旋轉轴114的另-端側外: 邛,弟1連桿i J 6,苴 n -起…固第2驅動轴118,:既定=_2桿:15連接在 ⑽平行的方式 /既&間隔、且與支樓構件 又、冓成上述各列的供給管2 8、2 8之η 的下方位置;複數個第2連桿uw/ 28 28之間 與上述各供认在其一端形成有分別 ” 28的支樓部…卡合的卡合孔117a,在 21 其另一端則突設有卡合軸 11Q 117b,卡合軸117b嵌插於第2 合軸U9a,2卡合孔U8a中;卡合構件119,其具有卡 :合軸119a卡合於各第2驅動軸118中的缺 二:及支撐構件12。,其固接於第】驅動轴 忒為部,用以支撐卡合構件 的(T以士人 稱仵119。另外,圖9是沿圖6 的GG-GG方向的側剖面圖。 出軸、ι:: #驅動馬達111旋轉,則其旋轉驅動力透過輸 出軸111a,傳遞給旋轉板 Μ β 2其奴轉,伴隨旋轉板112112 center position: 乂 It is erected in a way that rotates around the center of the shaft. It is erected in the position deviated from the rotation axis 2: The position of the first drive shaft ⑴, one end of which is set at the housing, "set outside the housing 23; It can be erected in a rotatable manner on the other side of the first rotation shaft 114: 邛, the first link i J 6, 苴 n-from ... to the second drive shaft 118 ,: fixed = _2 lever: 15 Connected in a parallel manner / both & space and below the supply pipe 2 8, 2 8 of the above-mentioned columns; and between the plurality of second links uw / 28 28 At the one end of each of the above-mentioned confessions, a 28-story branch section ... engagement engagement hole 117a is provided, and at the other end, an engagement shaft 11Q 117b is protruded, and the engagement shaft 117b is inserted into the second engagement The shafts U9a, 2 are in the engaging holes U8a; the engaging member 119 is provided with an engaging member: the engaging member 119a, which is engaged with each of the second driving shafts 118, and the supporting member 12. It is fixed to the first driving shaft 忒 as a part to support the engaging member (T 士人 人 仵 119. In addition, FIG. 9 is a side sectional view taken along the GG-GG direction in FIG. 6. 出 轴 、 ι :: #The driving motor 111 rotates, and its rotational driving force passes through the output shaft 111a and is transmitted to the rotating plate M β 2 and its slave rotation, accompanied by the rotating plate 112

的方疋轉,透過第113、第 第1驅動轴⑴沿並軸線方V: 16和弟2桿115,使 ,芒笛】 ,、軸線方向别後運動(往復運動)。而且 右弟1驅動軸114沿直細飧古△乂从 過軸線方向前後運動’則其動力透 過支撐構件丨2 〇、卡合構件彳 ^ 使第 9,傳遞給第2驅動軸118, 使弟2驅動軸118前後驅動。而 的前後運動,透過第2連:二第2驅動軸118 -χ ^ 與第2驅動軸1 Μ連接 : = 如上述般’沿正反向繞其轴中心旋轉,使固Through the 113th and 1st drive shafts ⑴ along the parallel axis V: 16 and the second pole 115, make, 芒 flute], move in the axial direction (reciprocating). In addition, the right brother 1 driving shaft 114 moves back and forth along the straight axis from the direction of the passing axis, and its power passes through the supporting member 丨 2 〇, the engaging member 彳 ^ to transfer the ninth to the second driving shaft 118, so that 2 The drive shaft 118 is driven forward and backward. The forward and backward motion of the second drive shaft is connected to the second drive shaft 1 Μ through the second connection: the second drive shaft 118 -χ ^: = As above, ′ rotates in the forward and reverse directions around the center of the shaft to make the solid

::動?的各㈣29在與基板“—平面 設置於搬運輥26的下方的卜;十、& t y, 述各贺噶⑽固定於連接 在上核刻液供給源(未圖示)上的複數個 過這些各供給管31 目d上透 , 從上述蝕刻液供給源(未圖示)#終 的蝕刻液朝向基板K的下面噴射。 ㈡丁 Κ、、、,。 板Κ槲,靈士 “, ^射另外’各供給管31沿基 板以運方向併設’透過固定構件⑽ :支樓構件103支樓。另外,在支撐構件m:= ‘測基板](的有無的感測器%。 22 200405405 此外,在上述外殼23的下端部,設置有集液槽24, 集液槽24透過開口部23b相互連通,從各噴嘴29、3〇喷 射的蝕刻液回收於集液槽24,透過排出管25適當地排出 在上述驅動室B内,豎設有支架17,支架17由方管 形成,呈縱向格子狀,在支架丨7上,設置有昇降機構4〇 。另外,支架17透過托架18,安裝於支柱12上。 上述昇降機構40包括:昇降台44,透過連結具55、 56及57 58,與支撐架台21連接;一對導執45,併設於 構成支架17 @縱棧的上述處理室a側的面上;滑動構件 46,以可沿各導執45移動的方式分別與各導執45卡合, 並且固定於昇降台44 ;滾珠螺桿41,以可旋轉且盘導執 ^保持平行的方式支樓於支架17;螺帽^,以與滾珠螺 桿螺合的方式固定於昇降台44;伺服馬達43,固定於 支架17上,用以旋轉、驅動滾珠螺桿41。 若透過上述祠服馬達43使滾珠螺桿41旋轉,則盘盆 =㈣帽42沿滾珠螺桿41移動(昇降),與螺帽42連結 4:卜口 “、透過連結具55、56及57、58連結於昇降台 上的支撐架台21、及支撑於支撐架台; 22三者與螺帽42 —起昇降。 U置 驅動室B和處理室A透過分隔構件以、14 。在分隔構件山、“之間,及分隔構件14、16之門刀: 別形成開口部,以位於各開口部内的方式,分 結具55、5fi β r 、刀別汉置有連 8。另外’形成各開口部的分隔構件 23 ZUU4U^4U^ 1 4的兩側緣部 的各緣部、、形成筒狀,在與其對向的分隔構件 另外,在分隔構^4沿該緣部,分別設置有筒狀構件!3。 的各對向面上二的兩侧緣的筒狀部15與筒狀構件!3 刀別形成沿上下方向的缺口槽。 此外,在μ、+、、 述筒狀構件13二隔構件14的兩側緣的筒狀部15和上 65、66。片體以沿該間隙’分別設置有帶狀的片體 ή 66,係兩側緣分別從上述缺口槽彳#Λ ~ 狀部15、筒狀構件 从 匕插入筒 58從内外面被連結具55、56及5?、:: Each dysprosium 29 is disposed below the conveying roller 26 in a plane with the substrate; X. & ty, each suga is fixed to a supply source (not shown) connected to the upper nuclear etching liquid A plurality of the supply tubes 31 pass through each of the supply tubes, and the etching solution from the above-mentioned etching solution supply source (not shown) # is sprayed toward the lower surface of the substrate K. 丁丁 Κ ,,,,. In addition, each of the supply pipes 31 is arranged along the substrate in the direction of transportation, and the transmission fixing member ⑽: branch building member 103 branch building. In addition, the support member m: = 'Measuring board] (% of sensors. 22 200405405 In addition, a liquid collecting tank 24 is provided at the lower end portion of the housing 23, and the liquid collecting tanks 24 communicate with each other through the opening 23b. The etching liquid sprayed from each of the nozzles 29 and 30 is recovered in the liquid collecting tank 24, and is appropriately discharged into the driving chamber B through the discharge pipe 25. A bracket 17 is vertically installed, and the bracket 17 is formed by a square tube in a longitudinal grid shape. A lifting mechanism 40 is provided on the bracket 丨 7. In addition, the bracket 17 is mounted on the pillar 12 through the bracket 18. The above-mentioned lifting mechanism 40 includes a lifting table 44 through a link 55, 56 and 57 58 and The support stand 21 is connected; a pair of guides 45 are provided on the surface of the processing chamber a side of the bracket 17 @longitudinal stack; and a sliding member 46 is respectively movable with each guide 45 And fixed to the lifting table 44; the ball screw 41 is rotatably supported on the bracket 17 in a manner that the disk guide is held in parallel; the nut ^ is fixed to the lifting table 44 in a screwed manner with the ball screw; servo Motor 43, fixed on bracket 17, used to rotate and drive the ball screw 41. If the ball screw 41 is rotated through the temple clothes motor 43, the pan = cap 42 moves (lifts) along the ball screw 41, and is connected to the nut 42 4: 口 口 ", through the connecting devices 55, 56 and 57 , 58 are connected to the support stand 21 on the lifting platform, and are supported on the support stand 22; the three are raised and lowered together with the nut 42. The U drive room B and the processing room A pass through the partition member, 14. In the partition member mountain, "Between, and the door knives of the partition members 14, 16: Do not form openings, so that they are located in each of the openings, and they are divided into 55, 5fi β r, and the knife is connected with 8. In addition, 'the openings are formed The partition members 23 ZUU4U ^ 4U ^ 1 4 are formed in a cylindrical shape at each of the edge portions of the two sides, and the partition members opposite to each other are provided with cylindrical members along the edges of the partition structure 4 ! 3. The cylindrical portion 15 and the cylindrical member of the two side edges of the two facing surfaces of the opposite surface! 3 The knife forms a notch groove in the vertical direction. In addition, the cylindrical member 13 is separated by μ, +, and the cylindrical member 13. The cylindrical parts 15 and the upper 65 and 66 on both side edges of the member 14. The sheet bodies are provided with strip-shaped sheet bodies along the gaps, respectively. 66, the edges of the two sides are respectively inserted from the above-mentioned notch groove 彳 # Λ ~ 形 部 15, the cylindrical member is inserted into the cylinder 58 from the dagger 58, and the inner and outer parts are connected by 55, 56 and 5 ?,

、66的各上端…心下固接於這些構件。而且,片體65 構了〇上。^ = 1 肖部分別捲取於後述的捲取/送出機 適合排氣機構,:::::::1狀_^ 片體65、66採用耐磨性°/广租排出。另外,在本例中, 製的片材。但是,並:对腐錄佳的鐵氟龍(註冊商標) 、’不限於此,可採用例如不銹鋼製的片 材0 这樣’上述驅動室Β和處理室Α實質上透過分隔構件 11&、14、16、筒狀構件 13、13、連結具 55、56、57、58 、片體65、66分隔。 、,還有’如® 7所示,在昇降台44上安裝驅動馬達6〇 ’亚且連接平衡塊5Q。驅動馬達6Q透過托架Μ,固定於 昇降台44上,以透過傳動皮帶61 ’驅動蝕刻裝置22的搬 運軏26。另一方面,平衡塊5〇由導引桿51和本體構 成4導引桿51以與導軌45相平行的方式固定於支架u 上’該本體52以可沿導引桿51移動的方式卡合於導引桿 24 200405405 51,並且卡合於昇降台44。 上述捲取/送出機構70如圖3所示, 的上部和下部這2個部分上,具體來說,如圖δ所支示 捲取轴72、76、與捲取軸72、76這兩者連接的驅動軸η 、驅動驅動軸71的齒輪85等構成。 上述捲取轴72、76分別透過托架75、79可旋轉地被 牙。而且,片體66依序經過以可旋轉的方式支樓於托架 75上的導引輥73、74,其端部捲取於捲取軸72上,片體 65依序經過以可旋轉的方式支撐於托架79上的導引親77 、78 ’其端部捲取於捲取軸76上。 上述齒輪85如圖10所示,固定於轉矩保持器(t〇r轉 啊)86上。旋轉軸81穿過轉矩保持器86,旋轉軸η 由固定於托架84上的轴承9。和單向離合器87支撐。另外 ’在旋轉轴81的端部,透過單向離合器88,固定有滑輪 8〇。此外,齒輪85與固定於驅動 勒軸71上的齒輪89嚙合。 此外,單向離合器87、88具有^ ^ ρ、+、》# + ’限制上述碇轉軸81的旋轉 方向的功能。在本例中,在L ^ , 在叹置於上部的捲取/送出機構 7;的情況下’限制旋轉軸81沿箭頭E方向旋轉,且容許 旋轉軸81沿箭頭F方向旋轉,力% W在设置於下部的捲取/送出 機構70的情況下,限制旋韓鉍 疋轉軸81沿箭頭F方向旋轉,且 容許旋轉軸81沿箭頭E方向祐結 L . 疑轉。此外,轉矩保持器86 疋所謂的摩擦離合器,其對旋糙 疋轉軸81施加既定的制動力。 另外,如圖3所示’無端狀的傳動皮帶82繞過於上下 設置的上述滑· 80、8G,傳動皮帶82由固接於上述螺帽 25 200405405 42上的保持件83保持。 八 、月/、有上述構成的基板處理系統1的動作。另 ^ 、土板處理裝置1 〇處於圖3中的以實線所示的狀 悲。 將其::d:裝置3,5中’依序取出基板κ ’ 基板處理農置理裝置6。將已投入的基板瓦在第1 内,透過基板傾斜機構部,使基板相對於 (-刻處理;:::搬運,邊對其進行既定的處理 。 依序將其從第1基板處理裝置6排出 1“二者”已“非出的基板κ依序通過昇降式基板處理裝置 運輕2“二、Γ部1進入㈣裝置22内,在搬 W作用下,搬入内部。 ’預=對Γ:Γ22内的基台33,透過上述挺… 裝置6排心Α _ 7°’㈣斜狀11從第1基板處理 钮刻裝置22 / ^ Κ ’在維持該傾斜狀態的狀態下被搬入 +均冶傾斜方向滑落。而且,— ,'同時,亍㈣理和㈣置二:“㈣入結束 給二源(未圖示)分別向供給管28、31供 …的:;Γ 28上的噴嘴29和設置於供給 行钱刻。另外敍刻液’對基板尺的表面進 ^ Κ的背面噴射韻刻液的原因在於 26 200405405 ,在不這樣的情況下,蝕刻液部分地從基板κ的表面蔓延 ,在該背面上形成污點,透過對整個背面噴蝕刻液,可防 止形成污點。而且,在蝕刻中,透過擺動裝置11〇,使各 供給官28繞其軸中心正反向旋轉,使從各喷嘴29噴射的 蝕刻液的噴射方向在基板κ的傾斜上方和下方之間擺動。 、而且,若進行既定時間的蝕刻,則停止從蝕刻液供給 源(未圖示)供給蝕刻液,並停止因擺動裝置110產生的噴The upper ends of 66, 66 are fixed to these members below the heart. Further, the sheet body 65 is constructed. ^ = 1 Shaw is taken up by a winding / feeding machine described later. It is suitable for the exhaust mechanism. ::::::: 1 shape_ ^ The pieces 65 and 66 are exhausted with abrasion resistance / wide rent. In addition, in this example, the produced sheet. However, it is not limited to: Teflon (registered trademark) with good decay, "It is not limited to this, and a sheet 0 made of stainless steel, for example," may be used. The driving chamber B and the processing chamber A substantially pass through the partition member 11 &, 14, 16, the cylindrical members 13, 13, the connectors 55, 56, 57, 58 and the sheet bodies 65, 66 are separated. And, as shown in ® 7, a driving motor 60 is mounted on the lifting table 44 and connected to a weight 5Q. The drive motor 6Q passes through the bracket M and is fixed to the lifting table 44 to drive the transporting unit 26 of the etching device 22 through the transmission belt 61 '. On the other hand, the weight 50 is composed of a guide rod 51 and a main body. The guide rod 51 is fixed to the bracket u in a manner parallel to the guide rail 45. The main body 52 is engaged so as to be movable along the guide rod 51. On the guide rod 24 200405405 51, and is engaged with the lifting table 44. The winding / feeding mechanism 70 is shown in FIG. 3, and the upper and lower parts are specifically, as shown in FIG. Δ, the winding shafts 72 and 76 and the winding shafts 72 and 76. The connected drive shaft η, a gear 85 that drives the drive shaft 71 and the like are configured. The winding shafts 72 and 76 are rotatably passed through the brackets 75 and 79, respectively. In addition, the sheet body 66 sequentially passes the guide rollers 73 and 74 supported on the bracket 75 in a rotatable manner, and its ends are wound on the take-up shaft 72, and the sheet body 65 passes in order to be rotatable. The guide members 77 and 78 ′ supported on the bracket 79 are wound on the take-up shaft 76. As shown in FIG. 10, the gear 85 is fixed to a torque retainer (t0r rotation) 86. The rotation shaft 81 passes through the torque retainer 86, and the rotation shaft η is supported by a bearing 9 fixed to the bracket 84. And one-way clutch 87 is supported. In addition, a pulley 80 is fixed to the end of the rotary shaft 81 through a one-way clutch 88. In addition, the gear 85 meshes with a gear 89 fixed to the drive shaft 71. In addition, the one-way clutches 87 and 88 have a function of restricting the rotation direction of the yaw shaft 81 described above. In this example, in the case of L ^, with the winding / feeding mechanism 7 placed at the upper part; 'restrict the rotation axis 81 to rotate in the direction of arrow E, and allow the rotation axis 81 to rotate in the direction of arrow F, force% W In the case of the take-up / feed-out mechanism 70 provided at the lower portion, the rotation of the rotating shaft 81 is restricted in the direction of arrow F, and the rotation shaft 81 is allowed to rotate in the direction of arrow E. Suspicious rotation. The torque retainer 86 is a so-called friction clutch that applies a predetermined braking force to the rotary shaft 81. In addition, as shown in FIG. 3 ', the endless transmission belt 82 bypasses the above-mentioned slides · 80, 8G, which are provided vertically. The transmission belt 82 is held by a holder 83 fixed to the nut 25 200405405 42. 8. Operation of the substrate processing system 1 having the above-mentioned structure. In addition, the soil plate processing device 10 is in a state shown by a solid line in FIG. 3. Take out the :: d: devices 3 and 5 to sequentially remove the substrate κ 'and the substrate processing agricultural treatment device 6. Put the substrate tile that has been put into the first, pass through the substrate tilt mechanism, and make the substrate relative to (-engraving processing; :::: conveying, and carry out the predetermined processing on it. Sequentially remove it from the first substrate processing device 6 Discharge 1 "both" and "non-existing substrates κ are sequentially transported through the lifting substrate processing device 2" 2. The Γ section 1 enters the ㈣ device 22 and is moved into the interior under the action of W. 'Pre = to Γ : The abutment 33 in Γ22 passes through the above-mentioned device ... The device 6 is centered A _ 7 ° '㈣ oblique 11 from the first substrate processing button engraving device 22 / ^ Κ' is moved into the + state while maintaining the inclined state And slid in the oblique direction. And,-, 'At the same time, the management and the second set: "The end of the supply to the two sources (not shown) to the supply pipes 28, 31, respectively :; nozzle 29 on Γ 28 And set to supply money for engraving. In addition, the reason why the engraving liquid sprays the engraving liquid on the back surface of the substrate ruler is 26 200405405. If this is not the case, the etchant will partially spread from the surface of the substrate κ A stain is formed on the back surface, and the formation of a stain can be prevented by spraying the entire back surface with an etching solution. Furthermore, during the etching, each supply officer 28 is rotated forward and backward about its axis through the swinging device 11 to swing the spraying direction of the etching solution sprayed from each nozzle 29 between the upper and lower sides of the substrate κ. In addition, if the etching is performed for a predetermined time, the supply of the etching solution from an etching solution supply source (not shown) is stopped, and the spray generated by the swinging device 110 is stopped.

嘴29的擺動。而且,職刻處理在㈣裝置22下降完成 之前的期間結束。 另方面,蝕刻裝置22的下降是透過昇降機構4〇白 伺服馬,43驅動而進行的。即’若透過祠服馬達a,令 滾朱螺才干41沿下降方向旋轉,則與其螺合的螺帽42沿、巧 珠螺桿41下收 I: ° 4 _ 争,與螺帽42連接的昇降台44、透過連& $ 55、56 及 57、u 咖—曰々 ^ ^ - 一忒幵降台44連接的支撐架台21、 擇於支擇架台支 。 上的钱刻裝置22三者與螺帽42 一起下 若螺帽42 nr π 傳動皮帶82 I則透過保持件83,與螺帽42連結的 56及57、58 ;月’碩C的方向旋動。另外,若連結具55、 方移動,伴隨該1,固定於其上的片體65、66 一起朝向下 ,送出片H 65動’從設置於上部的捲取/送出機構7〇 捲取/送出機構:上將片體65、66捲取於設置於下部的 下面’使用 /送出動作。圖圖1〇來更詳述捲取,送出機構7〇的捲取 回1 0是設置於上部和下部的捲取/送出機構Swing of the mouth 29. In addition, the job processing ends in a period before the lowering of the cymbal 22 is completed. On the other hand, the lowering of the etching device 22 is performed by a 40-horizon servo motor driven by a lifting mechanism 43. That is, if the burial snail talent 41 is rotated in the descending direction through the temple clothing motor a, the nut 42 that is screwed with it will be closed along the Qiaozhu screw 41: ° 4 Table 44, through the connection & $ 55, 56 and 57, u coffee — said 々 ^ ^-a support stand 21 connected to the descending table 44, choose to support the stand. The three money engraving devices 22 and the nut 42 are lowered together. If the nut 42 nr π transmission belt 82 I is passed through the holder 83, 56 and 57, 58 connected to the nut 42; rotate in the direction of the moon 'Shuo C. . In addition, if the link 55 and the square are moved, the sheet bodies 65 and 66 fixed to them are directed downward along with this 1, and the sheet H 65 is moved from the coiling / feeding mechanism 70 provided at the upper part to the coiling / feeding. Mechanism: The upper and lower sheets 65 and 66 are taken up and placed on the lower surface of the lower part to be used / sent out. Figure 10 shows the winding in more detail. The rewinding mechanism 10 of the feeding mechanism 70 is a coiling / feeding mechanism provided at the upper and lower portions.

27 200405405 勺俯視剖面圖。另外,雖然根據圖 .. μ ^ 丁 已說明連結具57 8和片體66,但是,對於連結具55 ,也是相同的。 56和片體65來說 首先,說明設置於上部的捲取/送出機構70。在設置 於上部的捲取/送出機構70中,若 疋、、、口具57、58下隆, 則在片體66上產生張力,對捲取軸 =:轉動力。該旋轉動力依序透過與捲取轴72 驅動軸71、固定於其上的齒輪88、 、夂驻亡本认or 一回輪88嚙合的齒輪 5 女4有回輪8 5的轉矩禪牲哭 q β /曰丄、 ]轉矩保持益86,傳遞給旋轉軸81。 但疋’由於透過單向離人突、07 早。離口裔87,限制旋轉軸81沿箭頭ε 所不的方向旋轉,故阻止相 阻止相@方向的旋轉。藉此,作用於 片體β Θ上的張力逐漸辦大 、 … 斤曰大’傳遞給轉矩保持器86的轉矩 增大。 若作用於齒輪85的μ祐士认 ορ 〇轉矩大於既定的值,則轉矩保持器 8 6容許齒輪8 5沿轉矩作用 1 r A ^ 用方向靛轉。藉此,齒輪85沿箭 頭E所示的方向旋轉,齒於 & ττ _ 輪88、驅動軸71和捲取軸72分 別沿前頭Η所示的方向旋 > π 丄一女 疋轉伙捲取軸72送出片體66。 迫樣,由於在產生既定的 、、 張力的狀態下送出片體66,故在 送出時,不產生鬆他。 另一方面,若伴隨螺 3讲-的技® r 士人’、目42的下降,傳動皮帶82沿圖 3所不的前頭C方向旋榦, ’則滑輪80受到箭頭Ε方向的旋 轉動力’但疋透過介於滑 人-〇〇 A A m 、 輪80和旋轉軸81之間的單向離 ό益8 8的作用’滑輪只η ,,,^ Μ #认 相對旋轉轴81,沿箭頭Ε所示方 向自由旋轉。滑輪80在μ古 〆又有妨礙的情況下,伴隨傳動皮帶 28 200405405 82,沿箭頭E所示的方向旋轉 81沿箭頭E所示方向的旋轉, 方向的旋轉。因此,單向離合 箭頭E所示的方向自由旋轉。 。早向離合器88限制旋轉軸 但是,容許其沿箭頭F所示 器88可相對旋轉軸81,沿 以下說明設置於下27 200405405 Top view of spoon. In addition, although the connection tool 57 8 and the sheet body 66 have been described based on the drawings..., The same is true for the connection tool 55. 56 and sheet body 65 First, the take-up / feed-out mechanism 70 provided at the upper portion will be described. In the take-up / feed-out mechanism 70 provided at the upper part, if the mouthpieces 57 and 58 are swollen, tension is generated on the sheet body 66 and the take-up shaft =: rotational force. The rotation power is transmitted through the gear 72 meshing with the take-up shaft 72, the drive shaft 71, the gear 88 fixed to it, and the gear 88, which is meshed with a return wheel 88. Weep q β / 丄,] Torque keeps gain 86, which is transmitted to the rotating shaft 81. But 疋 ’because of the one-way breakout, 07 is early. From the mouth 87, the rotation axis 81 is restricted from rotating in the direction not indicated by the arrow ε, so the phase is prevented from rotating in the direction @. Thereby, the tension acting on the sheet body β Θ gradually increases, and the torque transmitted to the torque retainer 86 increases. If the torque acting on the gear 85 recognizes that the torque is greater than a predetermined value, the torque retainer 86 allows the gear 85 to inversely rotate in the torque direction 1 r A ^. With this, the gear 85 rotates in the direction shown by the arrow E, and the teeth & ττ _ wheel 88, the drive shaft 71, and the take-up shaft 72 are rotated in the directions shown by the front head, respectively. The take-up shaft 72 sends out the sheet body 66. Forcibly, because the sheet body 66 is sent out under a predetermined tension state, no looseness is generated when it is sent out. On the other hand, if the descent of the snail 3 -® 人士 ', head 42 is lowered, the transmission belt 82 is spin-dried in the direction of the front C as shown in FIG. 3, and then' the pulley 80 receives the rotational power in the direction of the arrow E '. But through the action of the one-way separation between the sliding man-〇〇AA m, the wheel 80 and the rotation axis 81 'the pulley only η ,,, ^ Μ # recognize the relative rotation axis 81, along the arrow E Free rotation in the direction shown. When the pulley 80 is obstructed again, with the transmission belt 28 200405405 82, the pulley 80 rotates in the direction shown by the arrow E. 81 The rotation in the direction shown by the arrow E, the direction of rotation. Therefore, the direction shown by the one-way clutch arrow E is free to rotate. . The early clutch 88 restricts the rotation axis. However, it is allowed to be opposed to the rotation axis 81 along the arrow F as shown by the arrow F.

下部的捲取/送出機構7取:达出機構70。在設置东 82沿上述箭w所示方冑42下降,傳動皮禪 示方向的旋轉動力。如上所疋滑輪82受到箭頭μ 出機…情況下1向離二在:置於下部的捲取/这 箭頭F所示方向的旋轉,且容 轉。因此,若滑輪82受到箭頭E 所不方向的知 旋轉…相同方向旋轉。若旋轉轴:向:,旋轉動力’則 ,^ s 1沿箭頭F所+古 向紋轉,則其旋轉動力透過轉矩保持器、I齒輪8… 輪88,傳遞給驅動軸71 " ^ 示方向旋轉,將片㈣捲取於:取The lower coiling / feeding mechanism 7 takes: a reaching mechanism 70. In the setting east 82, the square cymbal 42 shown by the above-mentioned arrow w descends, and the rotational power in the direction of the leather zen is transmitted. As shown above, the pulley 82 is subjected to the arrow μ out of the machine ... In the case of 1 to 2 away: the coiling placed in the lower part / the direction indicated by the arrow F, and the capacity is allowed to rotate. Therefore, if the pulley 82 is subjected to a known rotation in a direction not indicated by the arrow E, the rotation is performed in the same direction. If the rotation axis: direction :, rotation power 'then, ^ s 1 turns along the arrow F + ancient direction, then its rotation power is transmitted to the drive shaft 71 through the torque retainer, I gear 8 ... wheel 88 " ^ Rotate in the direction shown in the

動/本例中’以捲取軸72的捲取速度大於片體66和傳 :82的移動速度的方式,設定捲取轴?2的轴徑、滑 =〇的直徑及齒輪85和齒輪88之間的齒輪傳動比。若捲 二72的捲取速度大於片體66的移動速度,則作用於片 版66的張力逐漸增大,傳遞給轉矩保持器⑽的轉矩增大 如上所述,若作用於齒輪85的轉矩大於既定的值,則轉 =保持器86容許齒輪85沿轉矩作用方向旋轉。藉此,齒 =5與旋轉軸81處於滑移狀態,旋轉軸8ι在沒有妨礙的 兄下,伴fi过滑輪8 〇而沿箭頭E所示方向旋轉。這樣,由 29 200405405 於片體66在產生既定的張力的狀態下捲取,故在捲取時不 產生鬆弛。 $ 如以上詳述般 刻裝置22的下降, 體 65 、 66 〇 若採用本捲取/送出機構7〇,伴隨蝕 可在沒有鬆他的情況下,捲取和送出片 另外,如上所述,若蝕刻裝置22 ^、 直“下降到下降端,則名 m運輥2 6沿排出方向旋轉,將某杯^ … 子暴板開口部23&排出, 攸喊體1 1的開口部1 1 b,將兮其4c; Γ h 將°亥基板U運到第2基板處sIn this example, 'the winding speed of the winding shaft 72 is greater than the moving speed of the plate 66 and the transmission speed 82, and the shaft diameter of the winding shaft 2 and the diameter of the slip = 0 and the gear 85 and gear 88 are set. Gear ratio between. If the winding speed of the volume two 72 is greater than the moving speed of the plate body 66, the tension acting on the plate 66 gradually increases, and the torque transmitted to the torque holder 增大 increases as described above. If the torque is greater than a predetermined value, then the turn = retainer 86 allows the gear 85 to rotate in the torque acting direction. Thereby, the tooth = 5 and the rotating shaft 81 are in a sliding state, and the rotating shaft 8m rotates in the direction shown by the arrow E with the pulley 80 through the unobstructed brother. In this way, since the sheet body 66 is wound up with a predetermined tension from 29 200405405, there is no slack in the winding up. $ As described in detail above, the lowering of the device 22, the body 65, 66 〇 If the take-up / feed-out mechanism 70 is used, the accompanying eclipse can take up and send out the film without loosening it. In addition, as described above, If the etching device 22 ^ is lowered to the descending end, the roller 266 is rotated in the discharge direction to discharge a cup ^ ... the sub-bulk opening 23 & the opening 1 1 b , H will be 4c; Γ h to transport the substrate U to the second substrate s

裝置7中。另外,圖3中的2 极处J ”,、fi鍵線表不蝕刻裝置22到a 下降端的狀態。 /置u到4 40的伺服馬達43 透過與上述相反的 的捲取/送出機構 70 ’送出片體65 右基板K的排出完成,則昇降機構 進行驅動,使蝕刻裝置22上昇。此時, 驅動,將片體65、66捲取於設置在下部 70上’從設置於下部的捲取/送出機構 、66 ° 而且,若颠刻裝置22到達In device 7. In addition, in Fig. 3 at J 2 ", the fi key wire indicates the state of the falling end of the etching device 22 to a. / The servo motor 43 of u to 4 40 passes the winding / feeding mechanism 70 'opposite to the above. The sheet body 65 is ejected and the right substrate K is ejected. Then, the lifting mechanism is driven to raise the etching device 22. At this time, the sheet body 65 and 66 are driven to be wound on the lower part 70, and taken from the lower part. / Feeding mechanism, 66 ° and, if the engraving device 22 arrives

板“說以後的動作。另外;7而,則反覆進行上述 利用平衡塊50減輕作用於二在敍刻裝置22昇降時’ 践I作用於伺服馬達43上的負載。 面,在第2基板處理裝置 機構部使從昇降式㈣處 ’ &基板·The board "says the subsequent actions. In addition, 7; then, the above-mentioned use of the weight 50 to repeatedly reduce the load acting on the servo motor 43 when the engraving device 22 is raised and lowered is used. The surface is processed on the second substrate. Device mechanism section from the lifting type '& substrate ·

傾斜為70。的角戶,、^ 置1〇排出的基板K更大幅J 板[邊對其進㈣=傾斜狀態下沿箭頭方向搬運』 理後,透㈣钭返Dr 錢處理和乾燦處理^ 第一 返回到水平狀態,然後… 透過移载裝13再㈣存於歴 30 200405405 5内。這樣’在本例的基板處理系統1中,儲存於匿5内: 的基板κ依序經過第】基板處理裝置6、昇降式基板處理 裝置1〇和第2基板處理裝置7’藉此,對其進行既定的處 理’再次將其儲存於匣5的内部。 —如以上詳述般’由於本例的基板處理系统1的結構是 ’第1基板處理裝置6和第2基板處理裝£ 7併設於上下 處’透過昇降式基板處理裝置1G將它們連接,所以盘第】 基板處理裝置6和第2基板處理裝置7併設在同一水平面 内的上述習知的處理系統200相比較,其設置空間可變小 % 月匕有效率地設置該系統。 另外,在本例的昇降式基板處理裝置丨〇中,由於可使 搬運、支擇基板K的搬運親26和向基板κ噴射㈣液的喷 嘴別、30所構成的蝕刻裝置22的整體昇降,故在搬運基 板K時,基板κ與喷嘴29、30的位置關係不變,因此,二 大致均勻地將從噴嘴29、30噴射的蝕刻液供給基板κ的各 部分,藉此,可進行沒有污點的蝕刻處理。 此外,由於以透過昇降機構40使蝕刻裝置22昇降的 % 這種單一動作來搬運基板κ,另外,透過伺服馬達43、滾 珠螺桿41和螺帽42所構成的可進行高精度地控制的機構 ,使該基板Κ昇降,所以可高精度地對其速度進行控制。 還有’由於可相對已傾斜的基板Κ,噴射蝕刻液,故 供給基板Κ表面的蝕刻液,產生因基板κ的傾斜而朝向下 方流動的液流,透過該液流’基板κ表面的蝕刻液逐漸由 繼續供給的新的蝕刻液更換,透過該蝕刻液的更換作用, 31 200405405 以/里的蝕刻液,可在較短時間内,均勻地對基板κ的表 面進行蝕刻處理。 又The tilt is 70. The angle of the substrate K, which is discharged by 10, is larger than that of the J plate. [The edge is moved in the direction of the arrow when it is tilted.] After the processing, the money is returned to Dr. Go to the horizontal state, and then store it in 歴 30 200405405 5 through transfer 13. In this way, in the substrate processing system 1 of this example, the substrate κ is stored in the substrate 5 in order through the first substrate processing device 6, the lifting substrate processing device 10, and the second substrate processing device 7 '. It performs a predetermined process' and stores it inside the cassette 5 again. —As detailed above ', since the structure of the substrate processing system 1 of this example is' the first substrate processing apparatus 6 and the second substrate processing apparatus 7 are installed at the upper and lower positions', they are connected through the lifting substrate processing apparatus 1G, so [Plate] Compared with the conventional processing system 200 in which the substrate processing apparatus 6 and the second substrate processing apparatus 7 are arranged in the same horizontal plane, the installation space can be reduced by 100%, and the system can be efficiently installed. In addition, in the lifting-type substrate processing apparatus of this example, the whole of the etching apparatus 22 constituted by the transporting carrier 26 for transporting and supporting the substrate K and the nozzles 30 for spraying liquid on the substrate κ can be lifted and lowered. Therefore, when the substrate K is conveyed, the positional relationship between the substrate κ and the nozzles 29 and 30 does not change. Therefore, the etching solution sprayed from the nozzles 29 and 30 is supplied to each portion of the substrate κ substantially uniformly, thereby enabling no staining. Etching process. In addition, the substrate κ is conveyed in a single operation of raising and lowering the etching device 22 by the lifting mechanism 40. In addition, the mechanism can be controlled with high precision by a servo motor 43, a ball screw 41, and a nut 42. Since the substrate K is raised and lowered, its speed can be controlled with high accuracy. In addition, since the etchant can be sprayed with respect to the substrate K which has been inclined, the etchant supplied on the surface of the substrate K generates a liquid flow which flows downward due to the inclination of the substrate κ, and passes through the liquid flow. Gradually replaced by the new etching solution that is continuously supplied. Through the replacement effect of this etching solution, the etching solution of 31 200405405 or more can uniformly etch the surface of the substrate κ in a relatively short period of time. also

再者由於使各喷嘴2 9擺動,可使從這些喷嘴噴射的 =J液的喷射方向在基板的傾斜上方和下方之間擺動,故 當使蝕刻液的噴射方向朝向基板的傾斜上方擺動時,透過 2擺動,使蝕刻液滯留於基板κ的表面上的作用增大,^ 田使蝕刻液的噴射方向朝向基板κ的傾斜下方擺動時,透 l /‘重力在基板Κ白勺表面上流下的钱刻液的速度辦大 她夜的滯留與流下在基板κ的整個表面的範圍内‘覆地 進行,透過該作用,可在較短時間内,以更少量的_液 句勻地對基板κ的整個表面進行钱刻處理。 另外’近年來,伴隨基板大型化,存在著用於對其進 行蝕刻的蝕刻液的使用量 '蝕刻時間增加的㈣,但:, 透過如上述般使基& κ傾斜、對其進行似彳,可減少2 用量,將裝置小型化,可降低處理成本。 '、Furthermore, since the nozzles 29 are swung, the spraying direction of the J liquid sprayed from these nozzles can be swung between the upper and lower slopes of the substrate. Therefore, when the spraying direction of the etching liquid is swung toward the upper slope of the substrate, Through 2 swings, the effect of the etching solution remaining on the surface of the substrate κ is increased. When the swing direction of the etching solution is tilted downward of the substrate κ, the gravity of 1 / 'flows down on the surface of the substrate κ. The speed of Qian Keye's solution will make her stay and flow down over the entire surface of the substrate κ over the entire surface. Through this effect, the substrate κ can be uniformly applied to the substrate κ in a smaller amount of time in a shorter period of time. The entire surface is engraved with money. In addition, "in recent years, with the increase in the size of substrates, the amount of etching solution used to etch them" has increased the etching time. However, the substrate & , Can reduce the amount of 2, the device is miniaturized, and the processing cost can be reduced. ',

上述喷嘴29的擺動角度 内,而且,擺動速度最好為i 至10秒。 ,最好在90。至12〇。的範圍 次,擺動動作的時間為2秒 還有,若#刻液的腐㈣極高,其從#刻裝置22 ,附著於昇降機構40上’則存在該昇降機構4〇損壞:並 使其功能受損的危險。依據本例的昇降式基板處理裝 ,由於透過分隔構件lla、14、16、筒狀構件Η、; 結具 55、56、57、58、片體 65、66 分 刀1同叹置有昇降機構 40的驅動室B和設置有蝕刻裝置22 处理至A,故可防止 32 200405405 特別是由於採用下述的 構對筒狀部15和筒狀構件13D=宮結構,而^排氣相 止餘刻液侵入驅動室B的、内部進打排氣,可確實阴 件Ua、14、16之間所形成;1 °该迷宮結構是,在分隔摘 ^ 々開口部的上下方向的緣部, = 筒狀構件13,並且將固接於連結 w、56及57、58上的月鞅α nWithin the swing angle of the nozzle 29, the swing speed is preferably i to 10 seconds. , Preferably at 90. To 12 o. Range of time, the time of the swing action is 2 seconds, and if the rot of # 刻 液 is extremely high, it is attached to the lifting mechanism 40 from the # 刻 装置 22, there is damage to the lifting mechanism 40: and make it Danger of impaired function. According to the lifting type substrate processing device of this example, since the partition members 11a, 14, 16, and the cylindrical member Η are connected; the bindings 55, 56, 57, 58, and the blades 65, 66 are equipped with a lifting mechanism. The driving chamber B of 40 and the etching device 22 are provided to process A, so it can be prevented. 32 200405405 Especially because the cylindrical structure 15 and the cylindrical member 13D = the palace structure are adopted in the following structure, the exhaust gas is left for a while. The liquid invades the drive chamber B, and the internal intake and exhaust can be formed between the female parts Ua, 14, and 16; 1 ° This labyrinth structure is the edge in the vertical direction of the opening of the partition ^ 々, = tube Like member 13 and fixed to the joints w, 56 and 57, 58

筒狀部15和筒狀構件13上的:σ、:^ 、 J研口槽插入内部。 以上已說明本發明的一個實 的具體態樣不限定於此。 ' ;’但本發明可採用 例如,在上述例中 取/送出機構70捲取 65、66形成無端環狀, 旋動。 配s餘刻裝置2 2的昇降,透過捲 送出片體65、66,但也可將片體 配a蝕刻襞置2 2的昇降,使它們 — 卜在上述例中,在汁降式基板處理裝f 1 〇中是The σ,: ^, and J-groove grooves on the cylindrical portion 15 and the cylindrical member 13 are inserted inside. The actual embodiment of the present invention described above is not limited to this. ';' However, the present invention can be used, for example, in the above example, the take-out / feed-out mechanism 70 takes up 65, 66 to form an endless loop, and rotates. Equipped with the lifting and lowering device 22, the sheet body 65, 66 is fed out through the roll, but the sheet body can also be equipped with an etching and lifting 2 2 lifter to make them — in the above example, the substrate is processed in a drop-down type. F 1 〇

丁姓刻處理,但也可進行洗淨、剝離處理等其他的處理 :不限定於此。在此情況中’第1基板處理裝置6和第 基板處理7也是同樣的。 此外,在進行洗淨、剝離處理的情況下,藉驅動缸Η 而=斜=基板κ的傾斜角度,最好在45。至75。的範圍内( 更仫的疋55至70。)。這樣做的原因在於:若傾斜角度超 過75,則液流的速度過快,即,基板Κ表面的洗淨液、 剝離液的滯留時間過短,反之’若傾斜角度不足45。,則 33 200405405 液流的速度過慢,即,、、丰、、致 立 洗淨液、剝離液長時間地滯留於基 板 K上’在上述任一籍抹 種h況下’均不能充分地進行處理, 洗淨液、剝離液的使用量增大。 還有,也可在基板κ的㈣處理中,正反向連續地切 換搬運輕26的旋轉,使得基以沿搬入/排出方向以既定 距離讀運動。若採用此方式,即使在從各喷嘴29、30喷 出的#刻液的噴射詈、哈Μ两、 ▼射里复射壓力不均勻的情況下,透過使 基板Κ前後運動,可使基板κ上面的上述不均句平均化, 可對基板Κ進行均勻的蝕刻處理。 再者,在上述處理機構2G内實施的處理,如上所述, =二刻後的後續步驟,在沒有因㈣液的附著造成的 況下,也可不將上述殼體心分隔為 “口驅動室B’將上述昇降機構4〇換作圖 的昇降機構130。 口 U所不 轉轴^該昇降機構130包括:驅動馬達⑶,」根下側旋 .2祀上川:互千灯地’置’且在其兩端部安裝有鏈輪132 :上側旋轉轴135,分別設置於下側旋轉轴⑶的上方 ’在相同的兩端部上安褒有鏈輪134;傳動轴136 過斜齒輪將驅動馬達131的旋 刀別透 J 33 ·纟γ 傳‘給各下側旋轉軸 3, ^撐敍刻裝置22之支撐架台139;分別固定 12之4個導引板137;複數個輕138, 方 7刀別導引複數個輥138 ; 4根 ,鏈輪—上,,接心:架:=: 34 200405405 ’另一端固接於支撐架台139的下部。 依據該昇降機構13〇,在驅動馬達丨31進行正反向旋 轉τ其疑轉動力透過傳動軸1 3 6,傳遞給各下側旋轉軸 133,分別使各下側旋轉軸133繞軸中心旋轉,伴隨旋轉軸 133的叙轉,透過鏈輪132,使鏈條140旋轉,支撐蝕刻裝 置22的支撐架台139由各導引板137及各輥138導向,朝 上方或下方移動,即,使其昇降。 足锒’依據該昇降機構Ding's name is engraved, but other treatments such as washing and peeling can also be performed: it is not limited to this. In this case, the 'first substrate processing apparatus 6 and the first substrate processing 7 are the same. In addition, when the cleaning and peeling treatment is performed, it is preferable that the angle of inclination = the inclination of the substrate κ is 45 by driving the cylinder Η. To 75. Range (more 仫 55 to 70.). The reason for this is that if the inclination angle exceeds 75, the speed of the liquid flow is too fast, that is, the residence time of the cleaning liquid and the stripping liquid on the substrate K surface is too short; otherwise, if the inclination angle is less than 45. , 33 200405405 The speed of the liquid flow is too slow, that is, the cleaning liquid and the peeling liquid are left on the substrate K for a long time 'Under any of the above-mentioned application conditions h' When processed, the amount of washing liquid and peeling liquid used increases. Also, during the processing of the substrate κ, the rotation of the conveyance light 26 can be continuously switched in the forward and reverse directions, so that the substrate can read the movement at a predetermined distance in the loading / unloading direction. If this method is adopted, even when the # 刻 of the liquid is sprayed from each of the nozzles 29, 30, and the pressure is not uniform, the substrate κ can be moved forward and backward by moving the substrate κ forward and backward. The above uneven sentence is averaged, and the substrate K can be uniformly etched. In addition, as described above, the processing performed in the above-mentioned processing mechanism 2G = the next step after two minutes, without the above-mentioned case core being partitioned into a "mouth drive chamber" without being caused by the adhesion of the mash. B 'The lifting mechanism 130 described above is replaced by the lifting mechanism 130. The lifting shaft 130 at the mouth of the gate ^ The lifting mechanism 130 includes: a drive motor ⑶, "under the root side rotation. 2 Sacred River: Mutually lightly" set " And sprocket 132 is installed at both ends: the upper rotating shafts 135 are respectively arranged above the lower rotating shafts ⑶, and sprockets 134 are installed on the same both ends; the driving shaft 136 is driven by the helical gear The rotary knife of the motor 131 penetrates J 33 · 纟 γ and transmits it to each of the lower rotation shafts 3, ^ support stand 139 of the engraving device 22; 4 guide plates 137 of 12 are fixed respectively; a plurality of light 138, square 7 knives do not guide a plurality of rollers 138; four, sprocket—upper, center: frame: =: 34 200405405 'The other end is fixed to the lower part of the support frame 139. According to the lifting mechanism 13, forward and reverse rotations are performed on the driving motor 31. The suspected rotational force is transmitted to the lower rotation shafts 133 through the transmission shafts 1 3 and 6, and each lower rotation shaft 133 is rotated around the center of the shaft. With the revolving of the rotating shaft 133, the chain 140 is rotated through the sprocket 132, and the supporting stand 139 supporting the etching device 22 is guided by each guide plate 137 and each roller 138 and moves upward or downward, that is, makes it rise and fall .足 锒 ’according to the lifting mechanism

比車乂 ’可“結構,可降低其製造成本w 另外,作為採用本發明的昇降式基板處理裝置的基 處理系統的另—態樣,可舉出圖13和圖14所示的類型 二圖Λ3所示’基板處理系 '统150由基板投入/排出裝 乾式處理裝置丨6〇、蝕刻_洗淨裝置工Μ構成。 匣181 ή/:入/排出裝置151由載置收納有複數個基板 Ε 1 81的载置台、 移載裝 2和搬運基板的移載裝置153構成It can be constructed more than a car, which can reduce its manufacturing cost. In addition, as another aspect of the base processing system using the lifting substrate processing apparatus of the present invention, the second type diagram shown in FIG. 13 and FIG. 14 can be cited. The 'substrate processing system' system 150 shown in Λ3 is composed of a substrate processing unit for loading / discharging a dry processing device, 60, and an etching / cleaning device. The box 181 /: the loading / discharging unit 151 includes a plurality of substrates on which it is stored. Ε 1 81 constitutes a mounting table, a transfer device 2, and a transfer device 153 for transferring a substrate.

設置的移#换、以可在軌道154上沿長邊方向移動的方』 移動到3维^手内臂155構成。移載機械手f 155具備1 置於該手臂二狀=意位置的手臂㈣,在將基板, 152上的匣181 ' 進仃下述處理,即,從載置^ 理裝置1 60、鞋幻逐片地取出基板’將其投入到乾式肩 、蛛洗 ,並在乾式處理裝置]fin #出的基板再次儲存Μ⑻内 送基板的處理。' 和⑽1 卜洗淨裝置17G之間進行移 35 200405405 ^㈣式處理裝置⑽針對基板進行去光阻的處理、 成膜處理荨乾式製程。另外 ,,入㈣a 透過自動搬運車⑽ 搬入載置台152上,並從載置台152上搬出。 ,,A |J:先淨4置170如圖14所示,具有框體狀的殼體 八内邛具有劃分形成為基板接收部〗7〗、 運部172、姓刻部173、λ 降搬 基板上汁搬運部174、基板乾燥部 反推出冑176等所構成的複數個區域,透過移载 參 155將基板搬入基板接收部m,從基板推出部 1 7 6將基板排出。 上述基板接收部171、基板下降搬運部172、钱刻部 八基板上汁搬運部174、基板乾燥冑175及基板推出部 7刀別具有圖16所示之複數個搬運輥208,搬入基板接 =則基板透過搬運謂沿箭頭所示方向搬運,依 、、工、過基板下降搬運部172、㈣部173、基板上昇搬運部 4、基板乾燥# 175,搬運給基板推出部176。 、、述基板下降搬運部172及基板上昇搬運部⑺具有 與上述的昇降式基板處理裝置10大致相同的結構。而且, 在蝕刻-洗淨裝詈】7n + i f u中,在基板下降搬運部1 72及蝕刻部 中進订姓刻處理’在基板上昇搬運部1 74中進行洗淨 处理,在基板乾燥部175中進行乾燥處理。 【圖式簡單說明】 (一)圖式部分 圖1疋表不本發明的一個實施方式的基板處理系统的 36 200405405 概略構成的前視圖。 圖2是表示本實施方式的基板處理系統的概略構成的 俯視圖。 圖3是表示本實施方式的昇降式基板處理裝置的概略 構成的前剖面圖。 圖4是表示本實施方式的蝕刻裝置的概略構成的前剖 圖5是表示本實施方式的蝕刻裝置的概略構成的側剖 面圖。 圖6是沿圖5中的cc-cc方向的俯視剖面圖。 圖7是沿圖3中的AA-AA方向的俯視剖面圖。 圖8是沿圖3中的BB_BB方向的俯視剖面圖。 圖9是沿圖6中的gg-GG方向的側剖面圖。 圖1〇是本實施方式的捲取/送出機構的俯視剖面圖。 圖11是表示本發明的其他實施方式的昇降機構的概略 構成的前剖面圖。 圖12是沿圖U中的EE_EE方向的俯視剖面圖。 圖13是表示本發明的其他實施方式的基板處理系統的 概略構成的俯視圖。 圖14是沿圖13中的FF方向的側視圖。 圖15疋表不習知例的基板處理系統的概略構成的俯視 圖。 圖16是表示習知例的搬運輥的前視圖。 圖Π是表示習知例的方向切換裝置的概略構成的示意 37 200405405 圖 (二)元件代表符號 1 基板處理系統 2 基板投入/排出部 5 匣 6 第1基板處理裝置 7 第2基板處理裝置 10 昇降式基板處理裝置 11a 、14、16 分隔構件 13 筒狀構件 15 筒狀部 20 處理機構 21 支撐架台 22 蝕刻裝置 26 搬運輥 29 ^ 30 喷嘴 33 基台 37 驅動缸 40 昇降機構 41 滾珠螺桿 42 螺帽 43 伺服馬達 65、 66片體 70 捲取/送出機構 72、 76捲取軸 80 滑輪 82 傳動皮帶 85 ^ 80 齒輪 87、 88單向離合器 86 轉矩保持器 110 搖動裝置 114 移動軸 117 第2連桿 118 第2驅動軸 119 卡合構件。The set shift # is formed by moving the track 154 in the long-side direction to the three-dimensional inner arm 155. The transfer robot f 155 has 1 arm 置于 placed in the two positions of the arm, and the box 181 ′ on the substrate 152 is subjected to the following processing, that is, from the mounting device 1 60, the shoe magic Take out the substrate one by one and put it into the dry shoulder, spider wash, and store the substrate in the dry processing device] fin # again to process the substrate. '' And ⑽ 1 cleaning device 17G 35 200405405 ^ ㈣ type processing device ⑽ for the substrate to remove the photoresist processing, film formation processing netting process. In addition, the entry ㈣a is transferred to and from the mounting base 152 by an automatic truck ⑽. ,, A | J: Firstly set 4 as shown in Figure 14, as shown in Figure 14, with a frame-shaped housing eight inner hulls divided into substrate receiving sections [7], transport section 172, last name engraved section 173, λ The substrate on-board juice conveying section 174, the substrate drying section pushes back a plurality of areas composed of 胄 176, etc., the substrate is transferred into the substrate receiving section m through the transfer parameter 155, and the substrate is discharged from the substrate pushing section 176. The above-mentioned substrate receiving section 171, substrate descending conveying section 172, money engraving section, eight substrate on-board conveying section 174, substrate drying section 175, and substrate ejecting section 7 have a plurality of conveying rollers 208 as shown in FIG. Then, the substrate is conveyed in the direction indicated by the arrow through the conveying means, and is conveyed to the substrate ejection portion 176 in accordance with the substrate descending conveying portion 172, the ridge portion 173, the substrate rising conveying portion 4, the substrate drying # 175. The substrate lowering and conveying unit 172 and the substrate raising and lowering unit ⑺ have substantially the same structures as those of the above-mentioned elevating substrate processing apparatus 10. Furthermore, in the etching-cleaning device] 7n + ifu, the last name engraving process is performed in the substrate lowering conveying section 1 72 and the etching section. The cleaning process is performed in the substrate rising conveying section 1 74 and the substrate drying section 175 Drying is performed in the middle. [Brief Description of the Drawings] (I) Schematic Part FIG. 1 is a front view showing a schematic structure of a substrate processing system according to an embodiment of the present invention. Fig. 2 is a plan view showing a schematic configuration of a substrate processing system according to the present embodiment. Fig. 3 is a front cross-sectional view showing a schematic configuration of a lifting-type substrate processing apparatus according to the present embodiment. Fig. 4 is a front sectional view showing a schematic configuration of an etching apparatus according to this embodiment. Fig. 5 is a side sectional view showing a schematic configuration of an etching apparatus according to this embodiment. FIG. 6 is a top cross-sectional view taken along a cc-cc direction in FIG. 5. FIG. 7 is a top cross-sectional view taken along the AA-AA direction in FIG. 3. FIG. 8 is a top cross-sectional view taken along the BB_BB direction in FIG. 3. FIG. 9 is a side sectional view taken along the gg-GG direction in FIG. 6. FIG. 10 is a plan cross-sectional view of the winding / feeding mechanism according to the present embodiment. Fig. 11 is a front sectional view showing a schematic configuration of a lifting mechanism according to another embodiment of the present invention. FIG. 12 is a plan sectional view taken along the EE_EE direction in FIG. Fig. 13 is a plan view showing a schematic configuration of a substrate processing system according to another embodiment of the present invention. FIG. 14 is a side view along the FF direction in FIG. 13. Fig. 15 is a plan view showing a schematic configuration of a substrate processing system according to a conventional example. FIG. 16 is a front view of a conventional conveyance roller. Figure Π is a schematic diagram showing the general configuration of a conventional direction switching device. 37 200405405 Figure (II) Symbols for components 1 Substrate processing system 2 Substrate loading / discharging unit 5 Cassette 6 First substrate processing device 7 Second substrate processing device 10 Lifting type substrate processing device 11a, 14, 16 partition member 13 cylindrical member 15 cylindrical portion 20 processing mechanism 21 support stand 22 etching device 26 conveying roller 29 ^ 30 nozzle 33 base 37 driving cylinder 40 lifting mechanism 41 ball screw 42 screw Cap 43 Servo motor 65, 66 Sheet body 70 Winding / feeding mechanism 72, 76 Winding shaft 80 Pulley 82 Transmission belt 85 ^ 80 Gear 87, 88 One-way clutch 86 Torque retainer 110 Swing device 114 Moving shaft 117 2nd The link 118 is a second drive shaft 119 engaging member.

3838

Claims (1)

200405405 拾、申請專利範圍: 1.-種昇降式基板處理裝置,其特徵在於具備: 框體狀殼體,係具有上下併設的基板投入口及基板排 出口; 處理機構,係内裝於轉辨m U Ώ丄 、双體内,其具有:搬運支撐機構 ,用來收納並支撐從基板投入舻 双仅八口搬入的基板,且從基板排 出口排出忒基’支撐架台,用來支撐搬運支撐機構;基 板傾斜機構’用來使被搬運切機構支撐的基板傾斜;及200405405 Scope of patent application: 1. A lifting type substrate processing device, which is characterized by having: a frame-shaped housing with a substrate input port and a substrate discharge port arranged side by side; a processing mechanism, which is built in m U Ώ 丄, double body, which has: a transport support mechanism to store and support the substrates that are carried in from the substrate into the 舻 double eight port, and to discharge the base support frame from the substrate discharge port to support the transport support Mechanism; the substrate tilting mechanism 'is used to tilt the substrate supported by the transport cutting mechanism; and 處理流體喷出機構,設於搬運去 做逆叉棕機構的上方,用來將處 理流體噴到藉基板傾斜機構施以傾斜的基板上;及 升降機才冓用來支撐處理機構,並使處理機構沿上下 方向昇降,使處理機構經過基板投入口和基板排出口。 2·如申清專利範圍第1工盲 显 步1貝之幵降式基板處理裴置,其 中,該處理流體喷出機構,係用來 ’、 、· 丹货用不嘴出作為處理流體的蝕 刻液;該基板傾斜機構,传用才w杰甘 #知用來使基板以相對於水平面成 1°至7· 5°範圍内的角度傾斜。The processing fluid ejection mechanism is provided above the counter-brown mechanism for conveying the processing fluid onto the substrate tilted by the substrate tilting mechanism; and the elevator is used to support the processing mechanism and make the processing mechanism It moves up and down to pass the processing mechanism through the substrate input port and the substrate discharge port. 2 · For example, in the application of the patent, the first step is to blindly display the step-down substrate processing method of Pei Zhi, in which the processing fluid ejection mechanism is used for the processing fluid that is not used as a processing fluid. Etching solution; the substrate tilting mechanism is used to make the substrate tilt at an angle in the range of 1 ° to 7.5 ° with respect to the horizontal plane. 3·如申請專利範圍第1項之昇降式基板處理褒置, 中,該處理流體喷出機構,係用來喷出作為^流體^ 刻液,该基板傾斜機構,係用來使基板傾斜成,>其板十 斜方向流動的處理流體的加速度在重力加速二 0.13倍的範圍内。 · 4.如申請專利範圍第!項之昇降式基板處理穿置,』 中’該處理流體噴出機構,係用來喷出作為處理流體的;; 淨液或剝m基板傾斜機構,係使基板^目對於水号 39 200405405 面成45。至75。範圍内的角度傾斜。 5.如申請專利範圍第】項之昇降式基板處理裝置,盆 中,該處理流體喷出機構,係用來喷出作為處理流^ 淨液或剝離液;該基板傾斜機構,係用來使基板傾斜成/ 沿基板傾斜方向流動的處理流體的加速度在重速= 0.7倍至0.97倍的範圍内。 逆度的 6.?請專利範圍第】項之昇降式基板 中,該處理機構,係具備擺動機構,以 出、 機構而喷出的處理流體的噴出方向,在 :⑽ 平行、且與基板正交的平面内擺動。—1斜方向 7二"專利範圍第^項之昇降式基板 中,該搬運支撐機構,係用 衣置其 基板沿基板的搬入/排出…:、,内基板後’使所收納的 /那出方向反覆前後運動。 8 ·如申請專利筋囹势 中,兮M俨孫 〗之昇降式基板處理裝置 宁孩叙體,係被分隔構件,、、从 其 隔為驅動室和處理室’ /口土 、^入/排出方向分 也#山 十2個室,並在具有基板投入口夺 板排出口的處理室設置 和基 構; 置處理機構,且在驅動室設置昇降機 在分隔構件,沿上 的開口部; 下方向形成將處理室和驅動室連通 分隔構件所形成的 別呈筒狀,並且在該一;::的沿上下方向的兩緣部,分 沿上下方向的缺口槽;對各同狀部的相互對向的面上形成 處理機構的支撐架 係糟由設於分隔構件的開口立 XJt\^ 200405405 内的連結具,與昇降機構連結; 在連結具連接有帶狀的片體,其設置於該_ 之間,並且設置成朝向連結且 。狀D 日〕上方和下方延伸,发 緣部分別從缺口槽插入筒狀部内; 一 > 驅動室和處理室得由八 而成。 至係由刀隔構件、連結具、及片體分p, 9. 如申請專利範圍第8項之昇降式基板處理裝 設置有複數組開口部、連結具、及片體。 ’、 10. 如申請專利範圍第8項之昇降式基板處理裳置 具有排出筒狀部内的氣體的排氣機構。 ’、 11. 如申請專利範圍第8項之昇降式基板處理裝置,盆 中,該片體形成為無端環狀。 /、 12. 如申請專利範圍第8項之昇降式基板處理裝置,並 中2別在σ亥片體的上部側和下部側,設置對片體進行捲 取/运出的捲取/送出機構,隨著藉昇降機構*昇降的片 體的運動,猎由捲取/送出機構對片體進行捲取/送出。 13·如申請專利範圍第12項之昇降式基板處理裝置, 其中’ β捲取/ $出機構’係、由捲取片體的捲取軸和使捲 取軸旋轉的驅動機構構成; 驅動機構,倍用办^ 、 末在捲取軸往送出方向旋轉時,僅使 制動力作用於捲取紅,D ^ i 且在使捲取軸往播取方向旋轉時, 透過摩擦離合器,將動力傳遞給捲取軸。 , η.如申請專利範圍第13項之昇降式基板處理裳置, 其中’該驅動機構係具有:與捲取軸連結之從動窗輪;與 41 200405405 從動齒輪喻人$ σ之驅動齒輪;與驅動齒輪連結 ’·與摩擦離合哭瑱砝夕7手擦離合器 °。連疋轉軸;2個單向離合器,分別盥 方疋轉軸的兩端卹、击& 刀別與 滑輪,透過复中袖^ # u万向叔轉,· 一中一個早向離合器,與旋轉軸連 滑輪之傳動皮帶·力埂、,。,捲繞於 ,及支撐另一個單向離合器之支撐構件· 捲取係料㈣㈣著使捲取轴往往 往送出方向==制旋轉軸朝著使搂-往 傳動皮帶’係藉由昇降機構而旋動。 15. —種基板處理系統,其特徵在於·· 具備申請專利範圍第i項之昇降式基板處理襄置; 〃上下併設有第!基板處理裝置和第2基板處理裳置, 係邊以水平狀態或傾斜狀態移動基板邊對該基板進行處理 J :::丨基板處理裝置的基板排出部和昇降式基板處理 衣置的基板投入口相連接,· 將第2基板處理裝置的基板投入部和昇降式基板處理 I置的基板排出口相連接; 使基板依序經過第i基板處理裝置、昇降式基板處理 裝置、第2基板處理裝置。 拾壹、圖式: 如次頁 423. If the lifting substrate processing device of item 1 of the scope of patent application, in which the processing fluid ejection mechanism is used to eject as a ^ fluid ^ etching liquid, the substrate tilting mechanism is used to tilt the substrate into The acceleration of the processing fluid flowing in the oblique direction of the plate is within a range of 0.13 times the acceleration of gravity. · 4. If the scope of patent application is the first! The lifting substrate processing and placement of the item, "" The processing fluid ejection mechanism is used to eject as a processing fluid ;; the liquid cleaning or peeling substrate tilting mechanism is to make the substrate ^ mesh for water number 39 200405405 surface into 45. To 75. Angles within range are tilted. 5. If the lifting type substrate processing device according to item [Scope of the patent application], in the basin, the processing fluid ejection mechanism is used to eject the processing fluid ^ as a cleaning liquid or a peeling liquid; the substrate tilting mechanism is used to make The acceleration of the processing fluid in which the substrate is tilted / flowed in the substrate tilting direction is in a range of a gravity speed = 0.7 times to 0.97 times. 6.? In the liftable substrate of item 6.?, The processing mechanism is provided with a swing mechanism, and the discharge direction of the processing fluid discharged by the mechanism is: ⑽ parallel to the substrate. Swing in the plane of intersection. —1. In the oblique direction of the substrate of the second category of the patent, the conveying support mechanism is to carry in and discharge the substrate along the substrate with clothes ...:, after the inner substrate Outward and backward movements. 8 · As in the patent application, the lift-type substrate processing device Ning Hao styles, is a partitioned component, separated from it by a driving room and a processing room '/ 口 土, ^ 入 / Discharge direction points # 山 十 2 chambers, and set up and infrastructure in the processing room with the board input port and the plate outlet; set the processing mechanism, and set the elevator in the drive room in the partition member, along the upper opening; downward direction Form a cylindrical shape formed by connecting the processing chamber and the driving chamber with a partition member, and in this one :: the two edge portions in the up-down direction are divided into the notch grooves in the up-down direction; each of the same-shaped portions is opposite to each other The supporting frame system forming the processing mechanism on the facing surface is connected to the lifting mechanism by a linking device provided in the opening stand XJt \ ^ 200405405 of the partition member; a band-shaped sheet body is connected to the linking device and is provided in the _ Between, and set to connect and. Shape D day] extended above and below, the hair edge part is inserted into the cylindrical part from the notch groove; a > the driving chamber and the processing chamber must be made of eight. It is divided by the blade partition member, the connection tool, and the sheet body. 9. The lifting substrate processing device such as the item No. 8 of the patent application is provided with a plurality of array openings, the connection tool, and the sheet body. ', 10. The lifting substrate processing apparatus according to item 8 of the scope of patent application has an exhaust mechanism for exhausting gas in the cylindrical portion. ′, 11. For example, in the case of a lifting substrate processing device of the eighth aspect of the patent application, the sheet body is formed into an endless ring. / 、 12. If the lifting substrate processing device of item 8 of the scope of patent application, and the middle 2 is located on the upper side and the lower side of the σHai sheet, a coiling / feeding mechanism for rolling / unloading the sheet is provided. With the movement of the sheet body raised and lowered by the lifting mechanism *, hunting is performed by the reeling / feeding mechanism to rewind / feed the sheet body. 13. The lifting type substrate processing apparatus according to item 12 of the scope of patent application, wherein the 'β winding / $ out mechanism' is composed of a winding shaft of the winding sheet body and a driving mechanism for rotating the winding shaft; the driving mechanism When the winding shaft is rotated in the sending direction, only the braking force is applied to the winding red, D ^ i, and when the winding shaft is rotated in the broadcasting direction, the power is transmitted through the friction clutch. Give the reel. , Η. For example, the lift-type substrate processing rack of item 13 of the patent application scope, wherein 'the driving mechanism has: a driven window wheel connected to the take-up shaft; and a driving gear of 41 200405405 driven gear $ σ Connected to the drive gear '· Friction clutch with friction clutch 7 hand rub clutch °. Flail shaft; 2 one-way clutches, respectively, the two ends of the shaft of the square shaft, slam & knife and pulley, through the middle sleeve ^ # u 万向 叔叔, · One early one clutch, and rotation Transmission belts of shaft-connected pulleys , Winding, and supporting members supporting another one-way clutch · The winding system holds the winding shaft in the direction that the winding shaft is always sent out == the rotating shaft is oriented toward the 搂 -to the transmission belt 'by the lifting mechanism Swirl. 15. —A substrate processing system, characterized in that it has the lifting substrate processing equipment of item i of the patent application scope; The substrate processing apparatus and the second substrate processing rack are used to process the substrate while moving the substrate in a horizontal state or an inclined state. J ::: 丨 The substrate discharge section of the substrate processing apparatus and the substrate input port of the lifting substrate processing clothes To connect, connect the substrate input part of the second substrate processing device and the substrate discharge port of the lifting substrate processing unit I; pass the substrate in order through the i-th substrate processing device, the lifting substrate processing device, and the second substrate processing device . Pick up, schema: as next page 42
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CN101615576B (en) * 2004-07-19 2012-07-04 三星电子株式会社 Substrate treating apparatus and substrate treating method using the same
JP4629460B2 (en) * 2005-03-02 2011-02-09 パナソニック株式会社 Cleaning method and cleaning apparatus
KR101298220B1 (en) * 2012-01-20 2013-08-22 주식회사 엠엠테크 Surface treating system for a substrate having a compact structure and surface treating method for the substrate
CN103400790B (en) * 2013-08-14 2016-05-11 上海华力微电子有限公司 Conveyer in wet-chemical cleaning equipment
CN104588346A (en) * 2013-11-01 2015-05-06 谭建忠 Swing cleaning technology
JP6330998B2 (en) 2014-02-17 2018-05-30 株式会社Screenホールディングス Substrate processing equipment
CN104076622A (en) * 2014-06-16 2014-10-01 京东方科技集团股份有限公司 Developing unit
JP6896588B2 (en) * 2017-11-06 2021-06-30 株式会社Screenホールディングス Board delivery system and board delivery method
JP7291030B2 (en) * 2018-09-06 2023-06-14 株式会社荏原製作所 Substrate processing equipment
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