SU614367A1 - Флуоресцентный рентгеновский спектрометр - Google Patents
Флуоресцентный рентгеновский спектрометрInfo
- Publication number
- SU614367A1 SU614367A1 SU752174672A SU2174672A SU614367A1 SU 614367 A1 SU614367 A1 SU 614367A1 SU 752174672 A SU752174672 A SU 752174672A SU 2174672 A SU2174672 A SU 2174672A SU 614367 A1 SU614367 A1 SU 614367A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- sample
- ray
- spectrometer
- circle
- distance
- Prior art date
Links
- 239000013078 crystal Substances 0.000 claims description 12
- 230000005855 radiation Effects 0.000 claims description 7
- 238000004876 x-ray fluorescence Methods 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 230000035945 sensitivity Effects 0.000 claims 3
- 230000004907 flux Effects 0.000 claims 2
- 238000005286 illumination Methods 0.000 claims 2
- 101000711237 Homo sapiens Serpin I2 Proteins 0.000 claims 1
- 102100034076 Serpin I2 Human genes 0.000 claims 1
- 238000011835 investigation Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 150000002739 metals Chemical class 0.000 claims 1
- 238000002601 radiography Methods 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU752174672A SU614367A1 (ru) | 1975-09-26 | 1975-09-26 | Флуоресцентный рентгеновский спектрометр |
| US05/724,231 US4091282A (en) | 1975-09-26 | 1976-09-17 | X-ray fluorescence spectrometer |
| NLAANVRAGE7610384,A NL172594C (nl) | 1975-09-26 | 1976-09-17 | Een met roentgenstralen werkende fluorescentiespectrometer. |
| DE2642637A DE2642637C2 (de) | 1975-09-26 | 1976-09-22 | Röntgenfluoreszenzspektrometer |
| GB39475/76A GB1564534A (en) | 1975-09-26 | 1976-09-23 | Ray fluorescence spectrometer |
| FR7628628A FR2325926A1 (fr) | 1975-09-26 | 1976-09-23 | Spectrometre radioscopique a fluorescence |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU752174672A SU614367A1 (ru) | 1975-09-26 | 1975-09-26 | Флуоресцентный рентгеновский спектрометр |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU614367A1 true SU614367A1 (ru) | 1978-07-05 |
Family
ID=20632495
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU752174672A SU614367A1 (ru) | 1975-09-26 | 1975-09-26 | Флуоресцентный рентгеновский спектрометр |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4091282A (OSRAM) |
| DE (1) | DE2642637C2 (OSRAM) |
| FR (1) | FR2325926A1 (OSRAM) |
| GB (1) | GB1564534A (OSRAM) |
| NL (1) | NL172594C (OSRAM) |
| SU (1) | SU614367A1 (OSRAM) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4417355A (en) * | 1981-01-08 | 1983-11-22 | Leningradskoe Npo "Burevestnik" | X-Ray fluorescence spectrometer |
| NL8300420A (nl) * | 1983-02-04 | 1984-09-03 | Philips Nv | Roentgen analyse apparaat. |
| US4785470A (en) * | 1983-10-31 | 1988-11-15 | Ovonic Synthetic Materials Company, Inc. | Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis |
| NL8700488A (nl) * | 1987-02-27 | 1988-09-16 | Philips Nv | Roentgen analyse apparaat met saggitaal gebogen analyse kristal. |
| GB2214769A (en) * | 1988-03-04 | 1989-09-06 | Le N Proizv Ob Burevestnik | Multichannel x-ray spectrometer |
| RU94022820A (ru) * | 1994-06-14 | 1996-04-10 | К.В. Анисович | Рентгеновский флюоресцентный спектрометр |
| DE29517080U1 (de) * | 1995-10-30 | 1997-03-06 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80636 München | Vorrichtung für die Röntgenfluoreszenzmikroskopie |
| EP2162732A1 (en) * | 2007-03-15 | 2010-03-17 | X-ray Optical Systems, INC. | Small spot and high energy resolution xrf system for valence state determination |
| CN109716115B (zh) | 2016-09-15 | 2023-01-06 | 华盛顿大学 | X射线光谱仪及使用方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2805343A (en) * | 1954-07-12 | 1957-09-03 | Andrew R Lang | Diffractometer |
| US2805341A (en) * | 1954-07-12 | 1957-09-03 | Andrew R Lang | Diffractometer |
| GB1148646A (en) * | 1967-02-16 | 1969-04-16 | Cambridge Instr Co Ltd | X-ray microanalysers |
-
1975
- 1975-09-26 SU SU752174672A patent/SU614367A1/ru active
-
1976
- 1976-09-17 US US05/724,231 patent/US4091282A/en not_active Expired - Lifetime
- 1976-09-17 NL NLAANVRAGE7610384,A patent/NL172594C/xx not_active IP Right Cessation
- 1976-09-22 DE DE2642637A patent/DE2642637C2/de not_active Expired
- 1976-09-23 FR FR7628628A patent/FR2325926A1/fr active Granted
- 1976-09-23 GB GB39475/76A patent/GB1564534A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1564534A (en) | 1980-04-10 |
| DE2642637A1 (de) | 1977-04-07 |
| NL172594B (nl) | 1983-04-18 |
| FR2325926A1 (fr) | 1977-04-22 |
| FR2325926B1 (OSRAM) | 1978-11-03 |
| DE2642637C2 (de) | 1982-02-11 |
| NL172594C (nl) | 1983-09-16 |
| NL7610384A (nl) | 1977-03-29 |
| US4091282A (en) | 1978-05-23 |
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