SU1814445A1 - Method for manufacturing semiconductor structures with stepped shape of polycrystalline silicon islands - Google Patents

Method for manufacturing semiconductor structures with stepped shape of polycrystalline silicon islands

Info

Publication number
SU1814445A1
SU1814445A1 SU4868794/25A SU4868794A SU1814445A1 SU 1814445 A1 SU1814445 A1 SU 1814445A1 SU 4868794/25 A SU4868794/25 A SU 4868794/25A SU 4868794 A SU4868794 A SU 4868794A SU 1814445 A1 SU1814445 A1 SU 1814445A1
Authority
SU
USSR - Soviet Union
Prior art keywords
polycrystalline silicon
layer
thickness
component interconnection
semiconductor structures
Prior art date
Application number
SU4868794/25A
Other languages
Russian (ru)
Inventor
С.И. Гайдук
С.В. Балбуцкий
В.Н. Чаусов
В.А. Сасновский
Original Assignee
Научно-производственное объединение "Интеграл"
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Научно-производственное объединение "Интеграл" filed Critical Научно-производственное объединение "Интеграл"
Priority to SU4868794/25A priority Critical patent/SU1814445A1/en
Application granted granted Critical
Publication of SU1814445A1 publication Critical patent/SU1814445A1/en

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  • Drying Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

FIELD: microelectronics; LSIC and VISIC manufacturing process. SUBSTANCE: in forming semiconductor structures with stepped shape of polycrystalline silicon islands, photoresists mask is etched selectively with respect to polycrystalline silicon layer and mask configuration is varied by forming step relative to edge of polycrystalline silicon island; step width, depth of blind (surface) anisotropic etching of polycrystalline silicon, thickness of component interconnection layer, and thickness of polycrystalline silicon layer are interrelated by expression h-h+h<X<h-h, where his thickness of polycrystalline silicon layer; x is width of photoresist mask step relative to edge of polycrystalline silicon island or depth of blind anisotropic etching of polycrystalline silicon layer; his thickness of component interconnection layer; his minimal permissible thickness of continuous layer of component interconnection. EFFECT: improved reproducibility of linear dimensions of polycrystalline silicon islands and reduced break probability in component interconnection layer. 5 dwg
SU4868794/25A 1990-09-26 1990-09-26 Method for manufacturing semiconductor structures with stepped shape of polycrystalline silicon islands SU1814445A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU4868794/25A SU1814445A1 (en) 1990-09-26 1990-09-26 Method for manufacturing semiconductor structures with stepped shape of polycrystalline silicon islands

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU4868794/25A SU1814445A1 (en) 1990-09-26 1990-09-26 Method for manufacturing semiconductor structures with stepped shape of polycrystalline silicon islands

Publications (1)

Publication Number Publication Date
SU1814445A1 true SU1814445A1 (en) 1996-09-10

Family

ID=60538279

Family Applications (1)

Application Number Title Priority Date Filing Date
SU4868794/25A SU1814445A1 (en) 1990-09-26 1990-09-26 Method for manufacturing semiconductor structures with stepped shape of polycrystalline silicon islands

Country Status (1)

Country Link
SU (1) SU1814445A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2593633C1 (en) * 2015-05-14 2016-08-10 Федеральное государственное автономное образовательное учреждение высшего образования "Дальневосточный федеральный университет" Method of forming ordered structures on surface of semiconductor substrates
CN116364827A (en) * 2023-05-29 2023-06-30 江西兆驰半导体有限公司 Mini LED and preparation method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2593633C1 (en) * 2015-05-14 2016-08-10 Федеральное государственное автономное образовательное учреждение высшего образования "Дальневосточный федеральный университет" Method of forming ordered structures on surface of semiconductor substrates
CN116364827A (en) * 2023-05-29 2023-06-30 江西兆驰半导体有限公司 Mini LED and preparation method thereof
CN116364827B (en) * 2023-05-29 2023-08-29 江西兆驰半导体有限公司 Mini LED and preparation method thereof

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