SU1310753A1 - Device for functional checking of large-scale integrated circuits - Google Patents

Abstract

The invention relates to instrumentation engineering and can be used for functional control of large integrated circuits and digital devices. The purpose of the invention is to increase production / control, which is achieved by simply eliminating the device. For this purpose, sensors 8.1–8 were added to the device. The control object was installed and the formers 9.1-- 9.p of control pulses (according to the number of 3.1-З.п electronic isolation blocks). The device also contains a test sequence generator 1, channel 2 test signals, channel 4 reference signals, blocks 5.1-5. Comparison, working position 6, containing the terminals dp of connection of the test product, the display unit 7. At the same time, the control of products in each working position does not affect the control in any other working position, which is equivalent to the use of several testers of functional control. 1 il. (L rfi with f cd with

Description

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The invention relates to an instrumentation technique and can be used for the functional control of large integrated circuits (LSIs) and digital devices.

The purpose of the invention is to improve the performance of the control. By eliminating just the device.

The drawing shows a block diagram of the device functional control LSI.

The device contains a test sequence generator connected via channel 2 of test signals in parallel to the inputs of blocks 3.1-3.a of electronic isolation, which are elements of the correction of pulse circuits, and through channel 4 of reference signals in parallel to the first inputs of blocks 5.1-5. , which are gated numeric comparators, working position 6, containing terminals for connecting the test product, the input of which is connected to the outputs of the 3.1-Z.p electronic isolation and the outputs to the second inputs of the unit 5.1-1.5P comparison, display unit 7, the first inputs of which are connected to the outputs of blocks 5.1-5.P comparison and sensors 8.1-З.п of installation of the test object, connected to the inputs of drivers 9.1-9. П control pulses , the first outputs of which are connected to the corresponding inputs of the blocks 5.1-З.п comparison. The second inputs of the formers 9.1-9. The control pulses are connected to the second inputs of the display unit 7.

The device works as follows.

The test sequence generator 1 runs continuously in cyclic mode. The product under test is installed at working position 6, and the corresponding sensor 8.1 is triggered, which starts the driver 9.1, producing three time-distributed signals. On the first signal, the indication in block 7, corresponding to this position, is reset. After the time required for the tested product to enter the operating mode expires, shaper 9.i generates a second signal, which gives permission to the 5.1 comparator to compare the signals coming from the product

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with the reference signals of channel 4. If the signals do not correspond, the comparison unit 5.1 fixes in the indication block 7 the Marriage sign for a given working

positions, if the product is working properly during the entire cycle of the test sequence, there comes a moment when the third signal appears at the output of the shaper 9.i

blocks the digital comparators of the comparison block 5.1 and records in the display block 7 the feature Fit for this working position. The product under test can be removed from the working position and replaced by a new one, while at the time of the replacement the previous control indication is retained, and when the product is completely installed, the display of this working position goes out. If a device with an input short circuit is installed in the working position, this only changes the operation mode of the corresponding correction element of the electronic isolation unit, but does not affect the operation of channel 2 of the test signals.

Thus, the control of products in each working position does not affect the control in any other working position, which is equivalent to the use of several functional control testers.

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o r mula inventions

Functional control device — large integrated circuits containing a test pattern generator, the first outputs of which are connected to the inputs of the corresponding electronic isolation blocks, the outputs of which are connected to the corresponding terminals for connecting the inputs of the control unit, the second outputs of the test sequence generator comparison, the second inputs of which X are connected to the corresponding 5Q terminals to connect the outputs of the test object, the indicator block The first inputs of which are connected to the outputs of the respective comparison units are distinguished by the fact that, in order to increase the control performance, sensors of the control object installation and pulse control units were introduced in it by the number of electric terminals 131357534

of the sensor outputs, the outputs of which are connected to the second installations of the control object are connected to the inputs of the display unit, and the second to the inputs of the corresponding shape-outputs are connected to the resolution of the corresponding control pulses, the first comparison units.

Claims (1)

The claims of comparison blocks 5.1-5.η. The second inputs of the drivers 9.1-9.η of the control pulses are connected to the second inputs of the display unit 7. I The device operates as follows. ’ The test sequence generator 1 runs continuously in a cyclic mode. The test product is installed in operating position 6, and the corresponding sensor 8.i is triggered, which triggers the shaper 9.1, which generates three time-distributed signals. At the first signal, the indication in block 7, corresponding to this position, is set to its initial state. After the time required for the tested product to enter the operating mode has passed, the driver 9.i generates a second signal that allows the comparison unit 5.i to compare the signals received from the product, Functional control device of large integrated circuits, containing a test sequence generator, the first outputs of which are connected to the inputs of the corresponding electronic isolation blocks, the outputs of which are connected to the corresponding terminals for connecting the inputs of the monitoring object, the second outputs of the test sequence generator are connected to the first inputs of the corresponding comparison blocks the second inputs of which are connected to the corresponding 5θ terminals for connecting the outputs of the control object, the display unit , the first inputs of which are connected to the outputs of the corresponding comparison units, which differs by 55 in that, in order to increase the monitoring performance, the sensors of the installation of the object of control and the shapers of control pulses by the number of electronic isolation blocks, the outputs of the sensors of the installation of the object are introduced into it control are connected to the inputs of the corresponding shapers of control pulses, the first outputs of which are connected to the second inputs of the display unit, and the second outputs to the inputs of the resolution of the respective blocks Nia.