SG44493A1 - Device testint system with cable pivot - Google Patents

Device testint system with cable pivot

Info

Publication number
SG44493A1
SG44493A1 SG1996000946A SG1996000946A SG44493A1 SG 44493 A1 SG44493 A1 SG 44493A1 SG 1996000946 A SG1996000946 A SG 1996000946A SG 1996000946 A SG1996000946 A SG 1996000946A SG 44493 A1 SG44493 A1 SG 44493A1
Authority
SG
Singapore
Prior art keywords
test head
testint
cable pivot
cable
pivot
Prior art date
Application number
SG1996000946A
Other languages
English (en)
Inventor
Alyn R Holt
Robert E Matthiessen
Original Assignee
Intest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Corp filed Critical Intest Corp
Publication of SG44493A1 publication Critical patent/SG44493A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/20—Preparation of articles or specimens to facilitate testing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/0025—Means for supplying energy to the end effector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37404—Orientation of workpiece or tool, surface sensor
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/40—Robotics, robotics mapping to robotics vision
    • G05B2219/40082—Docking, align object on end effector with target
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/45—Nc applications
    • G05B2219/45089—Testing robot

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Flexible Shafts (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Bridges Or Land Bridges (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SG1996000946A 1990-07-25 1991-07-24 Device testint system with cable pivot SG44493A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/558,144 US5030869A (en) 1990-07-25 1990-07-25 Device testing system with cable pivot

Publications (1)

Publication Number Publication Date
SG44493A1 true SG44493A1 (en) 1997-12-19

Family

ID=24228401

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996000946A SG44493A1 (en) 1990-07-25 1991-07-24 Device testint system with cable pivot

Country Status (7)

Country Link
US (1) US5030869A (ko)
EP (1) EP0468906B1 (ko)
JP (1) JP2546937B2 (ko)
KR (1) KR0167780B1 (ko)
AT (1) ATE135114T1 (ko)
DE (1) DE69117608T2 (ko)
SG (1) SG44493A1 (ko)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5600258A (en) * 1993-09-15 1997-02-04 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US5440943A (en) * 1993-09-15 1995-08-15 Intest Corporation Electronic test head manipulator
US6057695A (en) * 1993-09-15 2000-05-02 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US5561386A (en) * 1994-02-23 1996-10-01 Fujitsu Limited Chip tester with improvements in handling efficiency and measurement precision
WO1996026446A1 (en) * 1995-02-23 1996-08-29 Aesop, Inc. Manipulator for automatic test equipment test head
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
US5606262A (en) * 1995-06-07 1997-02-25 Teradyne, Inc. Manipulator for automatic test equipment test head
MY144519A (en) 2000-03-01 2011-09-30 Intest Corp Vertical counter balanced test head manipulator
KR100368574B1 (ko) * 2000-06-22 2003-01-24 메카텍스 (주) 피씨 베이스 모듈아이씨 테스트 핸들러의 위치변환장치
DE60115268T2 (de) 2000-09-20 2006-06-01 Intest Ip Corp. Positionierer für elektronische testköpfe
KR100393744B1 (ko) * 2000-12-02 2003-08-02 하나제약 주식회사 1,2,3,9-테트라하이드로-9-메틸-3-[(2-메틸-1ｈ-이미다졸-1-일)메틸]-4ｈ-카바졸-4-온의 제조방법
US6766996B1 (en) 2001-07-16 2004-07-27 Reid-Ashman Manufacturing, Inc. Manipulator
EP1410048B1 (en) * 2001-07-16 2010-12-29 inTEST Corporation Test head docking system and method
US6646431B1 (en) 2002-01-22 2003-11-11 Elite E/M, Inc. Test head manipulator
DE20214629U1 (de) * 2002-09-20 2002-11-21 esmo AG, 83022 Rosenheim Verschiebbare Befestigungsplatte
US8350584B2 (en) * 2006-12-29 2013-01-08 Intest Corporation Test head positioning system and method
TWI439709B (zh) 2006-12-29 2014-06-01 Intest Corp 用於使負載沿平移軸線平移之操縱器與負載定位系統
US8212578B1 (en) 2008-03-17 2012-07-03 Intest Corporation Test head positioner system
US8981807B2 (en) 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
US20140317453A1 (en) 2011-07-12 2014-10-23 Intest Corporation Method and apparatus for docking a test head with a peripheral
CN103274127B (zh) * 2013-06-19 2015-11-25 苏州信亚科技有限公司 Led灯搁置结构
CN105680293A (zh) * 2016-04-20 2016-06-15 国网新疆电力公司阿克苏供电公司 一种高效网线头排线工具
DE102017118980B4 (de) * 2017-04-23 2018-11-08 Franka Emika Gmbh Vorrichtung und Verfahren zur elektrischen Prüfung eines elektrischen Bauteils
CN116593863B (zh) * 2023-05-09 2023-12-22 上海捷策创电子科技有限公司 一种用于芯片测试的滑轨式探针接口板的锁紧装置
CN117990960B (zh) * 2024-04-07 2024-07-23 新乡市德源电子科技有限公司 一种线损检测装置及方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3128887A (en) * 1960-02-25 1964-04-14 Mechanical manipulators for the displacement of
US4080851A (en) * 1977-04-19 1978-03-28 The Raymond Lee Organization, Inc. Variable racket wrench
US4160207A (en) * 1977-06-27 1979-07-03 Haines Fred E Printed circuit board tester with removable head
US4517512A (en) * 1982-05-24 1985-05-14 Micro Component Technology, Inc. Integrated circuit test apparatus test head
US4588346A (en) * 1982-08-25 1986-05-13 Intest Corporation Positioner for maintaining an object in a substantially weightless condition
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
US4650391A (en) * 1985-02-25 1987-03-17 Amp Incorporated Electrical connector pick-up station
US4665360A (en) * 1985-03-11 1987-05-12 Eaton Corporation Docking apparatus
DE3615941A1 (de) * 1986-05-12 1987-11-19 Willberg Hans Heinrich Geraet zum pruefen von elektronischen bauelementen, insbesondere ic's
EP0308348B1 (fr) * 1987-09-17 1993-02-10 Schlumberger Industries Appareil manipulateur de tête de test pour équipement de test automatique
US4893074A (en) * 1988-05-13 1990-01-09 Intest Corporation Electronic device testing system

Also Published As

Publication number Publication date
US5030869A (en) 1991-07-09
DE69117608T2 (de) 1996-11-07
ATE135114T1 (de) 1996-03-15
DE69117608D1 (de) 1996-04-11
JP2546937B2 (ja) 1996-10-23
EP0468906A2 (en) 1992-01-29
JPH04232879A (ja) 1992-08-21
EP0468906A3 (en) 1992-08-19
KR0167780B1 (ko) 1999-03-20
EP0468906B1 (en) 1996-03-06
KR920003064A (ko) 1992-02-29

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