SG154594G - Floating gate memories - Google Patents

Floating gate memories

Info

Publication number
SG154594G
SG154594G SG154594A SG154594A SG154594G SG 154594 G SG154594 G SG 154594G SG 154594 A SG154594 A SG 154594A SG 154594 A SG154594 A SG 154594A SG 154594 G SG154594 G SG 154594G
Authority
SG
Singapore
Prior art keywords
floating gate
gate memories
memories
floating
gate
Prior art date
Application number
SG154594A
Other languages
English (en)
Inventor
Fabio Beltram
Federico Capasso
Roger J Malik
Nitin J Shah
Original Assignee
At & T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US07/209,466 priority Critical patent/US4905063A/en
Priority to CA000600514A priority patent/CA1327078C/en
Priority to EP89306058A priority patent/EP0348099B1/de
Priority to DE68917807T priority patent/DE68917807T2/de
Priority to JP1156639A priority patent/JPH0272673A/ja
Priority to US07/447,286 priority patent/US4945393A/en
Application filed by At & T Corp filed Critical At & T Corp
Priority to SG154594A priority patent/SG154594G/en
Priority to HK5095A priority patent/HK5095A/xx
Publication of SG154594G publication Critical patent/SG154594G/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/80—Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
    • H01L29/802—Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with heterojunction gate, e.g. transistors with semiconductor layer acting as gate insulating layer, MIS-like transistors
    • H01L29/803—Programmable transistors, e.g. with charge-trapping quantum well
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/903—FET configuration adapted for use as static memory cell

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
SG154594A 1988-06-21 1994-10-21 Floating gate memories SG154594G (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
US07/209,466 US4905063A (en) 1988-06-21 1988-06-21 Floating gate memories
CA000600514A CA1327078C (en) 1988-06-21 1989-05-24 Floating gate memories
EP89306058A EP0348099B1 (de) 1988-06-21 1989-06-15 Speicheranordnung mit schwebendem Gate
DE68917807T DE68917807T2 (de) 1988-06-21 1989-06-15 Speicheranordnung mit schwebendem Gate.
JP1156639A JPH0272673A (ja) 1988-06-21 1989-06-19 メモリー装置、メモリー回路、光検知装置
US07/447,286 US4945393A (en) 1988-06-21 1989-12-07 Floating gate memory circuit and apparatus
SG154594A SG154594G (en) 1988-06-21 1994-10-21 Floating gate memories
HK5095A HK5095A (en) 1988-06-21 1995-01-12 Floating gate memories

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/209,466 US4905063A (en) 1988-06-21 1988-06-21 Floating gate memories
SG154594A SG154594G (en) 1988-06-21 1994-10-21 Floating gate memories

Publications (1)

Publication Number Publication Date
SG154594G true SG154594G (en) 1995-03-17

Family

ID=26664455

Family Applications (1)

Application Number Title Priority Date Filing Date
SG154594A SG154594G (en) 1988-06-21 1994-10-21 Floating gate memories

Country Status (7)

Country Link
US (1) US4905063A (de)
EP (1) EP0348099B1 (de)
JP (1) JPH0272673A (de)
CA (1) CA1327078C (de)
DE (1) DE68917807T2 (de)
HK (1) HK5095A (de)
SG (1) SG154594G (de)

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FR2818012B1 (fr) 2000-12-12 2003-02-21 St Microelectronics Sa Dispositif semi-conducteur integre de memoire
US6909151B2 (en) * 2003-06-27 2005-06-21 Intel Corporation Nonplanar device with stress incorporation layer and method of fabrication
US7456476B2 (en) * 2003-06-27 2008-11-25 Intel Corporation Nonplanar semiconductor device with partially or fully wrapped around gate electrode and methods of fabrication
US7268058B2 (en) * 2004-01-16 2007-09-11 Intel Corporation Tri-gate transistors and methods to fabricate same
US7154118B2 (en) * 2004-03-31 2006-12-26 Intel Corporation Bulk non-planar transistor having strained enhanced mobility and methods of fabrication
US7027557B2 (en) * 2004-05-13 2006-04-11 Jorge Llacer Method for assisted beam selection in radiation therapy planning
US7579280B2 (en) * 2004-06-01 2009-08-25 Intel Corporation Method of patterning a film
US7042009B2 (en) 2004-06-30 2006-05-09 Intel Corporation High mobility tri-gate devices and methods of fabrication
US7348284B2 (en) * 2004-08-10 2008-03-25 Intel Corporation Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow
US7422946B2 (en) 2004-09-29 2008-09-09 Intel Corporation Independently accessed double-gate and tri-gate transistors in same process flow
US7332439B2 (en) * 2004-09-29 2008-02-19 Intel Corporation Metal gate transistors with epitaxial source and drain regions
US20060086977A1 (en) 2004-10-25 2006-04-27 Uday Shah Nonplanar device with thinned lower body portion and method of fabrication
US7518196B2 (en) 2005-02-23 2009-04-14 Intel Corporation Field effect transistor with narrow bandgap source and drain regions and method of fabrication
US20060202266A1 (en) * 2005-03-14 2006-09-14 Marko Radosavljevic Field effect transistor with metal source/drain regions
US7858481B2 (en) * 2005-06-15 2010-12-28 Intel Corporation Method for fabricating transistor with thinned channel
US7547637B2 (en) * 2005-06-21 2009-06-16 Intel Corporation Methods for patterning a semiconductor film
US7279375B2 (en) * 2005-06-30 2007-10-09 Intel Corporation Block contact architectures for nanoscale channel transistors
US7402875B2 (en) * 2005-08-17 2008-07-22 Intel Corporation Lateral undercut of metal gate in SOI device
US7479421B2 (en) * 2005-09-28 2009-01-20 Intel Corporation Process for integrating planar and non-planar CMOS transistors on a bulk substrate and article made thereby
US20070090416A1 (en) * 2005-09-28 2007-04-26 Doyle Brian S CMOS devices with a single work function gate electrode and method of fabrication
US20070090408A1 (en) * 2005-09-29 2007-04-26 Amlan Majumdar Narrow-body multiple-gate FET with dominant body transistor for high performance
US7485503B2 (en) 2005-11-30 2009-02-03 Intel Corporation Dielectric interface for group III-V semiconductor device
US20070152266A1 (en) * 2005-12-29 2007-07-05 Intel Corporation Method and structure for reducing the external resistance of a three-dimensional transistor through use of epitaxial layers
US7494850B2 (en) * 2006-02-15 2009-02-24 International Business Machines Corporation Ultra-thin logic and backgated ultra-thin SRAM
US8143646B2 (en) 2006-08-02 2012-03-27 Intel Corporation Stacking fault and twin blocking barrier for integrating III-V on Si
DE102006059110A1 (de) * 2006-12-08 2008-06-12 Technische Universität Berlin Speicherzelle und Verfahren zum Speichern von Daten
US20080157225A1 (en) * 2006-12-29 2008-07-03 Suman Datta SRAM and logic transistors with variable height multi-gate transistor architecture
US8320191B2 (en) 2007-08-30 2012-11-27 Infineon Technologies Ag Memory cell arrangement, method for controlling a memory cell, memory array and electronic device
US8362566B2 (en) 2008-06-23 2013-01-29 Intel Corporation Stress in trigate devices using complimentary gate fill materials
GB201418888D0 (en) * 2014-10-23 2014-12-10 Univ Lancaster Improvements relating to electronic memory devices
US9590084B2 (en) * 2014-11-26 2017-03-07 Taiwan Semiconductor Manufacturing Company, Ltd. Graded heterojunction nanowire device
US11448692B2 (en) 2018-08-16 2022-09-20 Taiwann Semiconductor Manufacturing Company Ltd. Method and device for wafer-level testing
US11073551B2 (en) * 2018-08-16 2021-07-27 Taiwan Semiconductor Manufacturing Company Ltd. Method and system for wafer-level testing
DE102021106795A1 (de) * 2020-10-16 2022-04-21 Taiwan Semiconductor Manufacturing Company, Ltd. Verfahren und vorrichtung für eine prüfung auf waferebene
JP2022145020A (ja) 2021-03-19 2022-10-03 キオクシア株式会社 メモリシステム
CN113594167B (zh) * 2021-07-29 2024-03-12 上海集成电路制造创新中心有限公司 非易失性可编程异质结存储器

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CA1215975A (en) * 1981-11-02 1986-12-30 Paul W. Collins Process for preparing delta 2,3 and delta 3,4 prostaglandins
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JPS6235572A (ja) * 1985-08-08 1987-02-16 Omron Tateisi Electronics Co 半導体不揮発性メモリ素子
FR2600821B1 (fr) * 1986-06-30 1988-12-30 Thomson Csf Dispositif semi-conducteur a heterojonction et double canal, son application a un transistor a effet de champ, et son application a un dispositif de transductance negative
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US4766473A (en) * 1986-12-29 1988-08-23 Motorola, Inc. Single transistor cell for electrically-erasable programmable read-only memory and array thereof

Also Published As

Publication number Publication date
CA1327078C (en) 1994-02-15
JPH0272673A (ja) 1990-03-12
HK5095A (en) 1995-01-20
EP0348099B1 (de) 1994-08-31
EP0348099A2 (de) 1989-12-27
DE68917807D1 (de) 1994-10-06
US4905063A (en) 1990-02-27
EP0348099A3 (en) 1990-08-22
DE68917807T2 (de) 1995-01-05

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