SG153023A1 - Method of measuring focus of a lithographic projection apparatus - Google Patents

Method of measuring focus of a lithographic projection apparatus

Info

Publication number
SG153023A1
SG153023A1 SG200808820-5A SG2008088205A SG153023A1 SG 153023 A1 SG153023 A1 SG 153023A1 SG 2008088205 A SG2008088205 A SG 2008088205A SG 153023 A1 SG153023 A1 SG 153023A1
Authority
SG
Singapore
Prior art keywords
projection apparatus
lithographic projection
measuring focus
focus
measuring
Prior art date
Application number
SG200808820-5A
Other languages
English (en)
Inventor
Gerardus Carolus Johannus Hofmans
Hubertus Antonius Geraets
Zellenrath Mark
Sven Gennar Krister Magnusson
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of SG153023A1 publication Critical patent/SG153023A1/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70616—Monitoring the printed patterns
    • G03F7/70641—Focus
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70491—Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
    • G03F7/70516—Calibration of components of the microlithographic apparatus, e.g. light sources, addressable masks or detectors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70681—Metrology strategies
    • G03F7/70683—Mark designs

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
SG200808820-5A 2007-11-20 2008-11-19 Method of measuring focus of a lithographic projection apparatus SG153023A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US99650607P 2007-11-20 2007-11-20

Publications (1)

Publication Number Publication Date
SG153023A1 true SG153023A1 (en) 2009-06-29

Family

ID=40297849

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200808820-5A SG153023A1 (en) 2007-11-20 2008-11-19 Method of measuring focus of a lithographic projection apparatus

Country Status (7)

Country Link
US (2) US8289516B2 (de)
EP (1) EP2063321A3 (de)
JP (1) JP2009152563A (de)
KR (1) KR100985834B1 (de)
CN (1) CN101446772B (de)
SG (1) SG153023A1 (de)
TW (1) TWI383273B (de)

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TWI383273B (zh) * 2007-11-20 2013-01-21 Asml Netherlands Bv 微影投射裝置之焦點測量方法及微影投射裝置之校準方法
JP5094517B2 (ja) * 2008-04-11 2012-12-12 キヤノン株式会社 露光装置、測定方法、安定化方法及びデバイスの製造方法
US9046788B2 (en) * 2008-05-19 2015-06-02 International Business Machines Corporation Method for monitoring focus on an integrated wafer
NL2005719A (en) * 2009-12-18 2011-06-21 Asml Netherlands Bv Method of measuring properties of dynamic positioning errors in a lithographic apparatus, data processing apparatus, and computer program product.
EP2458441B1 (de) 2010-11-30 2022-01-19 ASML Netherlands BV Messverfahren, Vorrichtung und Substrat
KR20140068970A (ko) 2011-08-31 2014-06-09 에이에스엠엘 네델란즈 비.브이. 포커스 보정을 결정하는 방법, 리소그래피 처리 셀 및 디바이스 제조 방법
WO2015090839A1 (en) * 2013-12-17 2015-06-25 Asml Netherlands B.V. Inspection method, lithographic apparatus, mask and substrate
CN105334703B (zh) * 2014-08-07 2017-05-24 无锡华润上华科技有限公司 一种曝光单元的排布方法
US10923442B2 (en) * 2017-03-10 2021-02-16 Drexel University Protecting analog circuits with parameter biasing obfuscation
EP3447580A1 (de) 2017-08-21 2019-02-27 ASML Netherlands B.V. Verfahren zur kalibrierung von fokusmessungen, messverfahren und metrologievorrichtung, lithographisches system und vorrichtungsherstellungsverfahren
IL273110B2 (en) 2017-09-11 2024-03-01 Asml Netherlands Bv Patterning methods and devices and devices for measuring focus performance of a lithographic device, method of device manufacture
US10451564B2 (en) * 2017-10-27 2019-10-22 Applied Materials, Inc. Empirical detection of lens aberration for diffraction-limited optical system
CN108827188B (zh) * 2018-09-07 2020-04-14 苏州瑞霏光电科技有限公司 一种基于无掩模光刻机的三维轮廓显微测量方法
JP7320986B2 (ja) * 2019-05-22 2023-08-04 キヤノン株式会社 露光装置及び物品の製造方法
JP7309639B2 (ja) * 2020-03-13 2023-07-18 キオクシア株式会社 半導体装置製造システム、半導体装置製造プログラム、及び半導体装置の製造方法
KR20230003194A (ko) 2020-05-29 2023-01-05 에이에스엠엘 네델란즈 비.브이. 기판, 패터닝 디바이스 및 계측 장치

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US4645338A (en) * 1985-04-26 1987-02-24 International Business Machines Corporation Optical system for focus correction for a lithographic tool
JPH0478126A (ja) * 1990-07-20 1992-03-12 Canon Inc 自動焦点検出装置
US5789118A (en) * 1992-08-21 1998-08-04 Intel Corporation Method and apparatus for precision determination of phase-shift in a phase-shifted reticle
EP0721608B1 (de) * 1994-08-02 2003-10-01 Koninklijke Philips Electronics N.V. Verfahren zur wiederholten abbildung eines maskenmusters auf einem substrat
JPH1055946A (ja) * 1996-08-08 1998-02-24 Nikon Corp 露光条件測定方法
TWI256484B (en) * 2000-02-23 2006-07-01 Asml Netherlands Bv Method of measuring aberration in an optical imaging system
TW500987B (en) * 2000-06-14 2002-09-01 Asm Lithography Bv Method of operating an optical imaging system, lithographic projection apparatus, device manufacturing method, and device manufactured thereby
JP2002050562A (ja) 2000-08-03 2002-02-15 Mitsubishi Electric Corp 半導体製造装置、半導体装置の製造方法、及び半導体装置
EP1256843A1 (de) * 2001-05-08 2002-11-13 ASML Netherlands B.V. Verfahren zur Eichung eines lithographischen Apparats
EP1256849A1 (de) * 2001-05-08 2002-11-13 ASML Netherlands B.V. Verfahren zur Eichung eines lithographischen Apparats
TW594431B (en) * 2002-03-01 2004-06-21 Asml Netherlands Bv Calibration methods, calibration substrates, lithographic apparatus and device manufacturing methods
US6885429B2 (en) * 2002-06-28 2005-04-26 Asml Holding N.V. System and method for automated focus measuring of a lithography tool
JP3550394B2 (ja) * 2002-07-16 2004-08-04 沖電気工業株式会社 焦点ずれ測定方法及び焦点位置合わせ方法
JP2005537507A (ja) * 2002-08-30 2005-12-08 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 細線印刷のためのリソグラフィ方法
JP2004170947A (ja) 2002-11-06 2004-06-17 Matsushita Electric Ind Co Ltd 露光マスク、フォーカス測定方法、露光装置管理方法及び電子デバイスの製造方法
US7289198B2 (en) * 2003-01-07 2007-10-30 Intel Corporation Process compensation for step and scan lithography
JP3854234B2 (ja) 2003-02-24 2006-12-06 株式会社東芝 フォーカスモニタ方法及びマスク
EP1457828A3 (de) 2003-03-10 2009-04-22 ASML Netherlands B.V. Überwachung von Fokuspunkten in einem lithographischen Projektionsapparat
EP2296041A3 (de) 2003-05-30 2013-01-23 Omnivision Technologies, Inc. Lithografische Systeme und Verfahren mit erweiterter Fokustiefe
JP4208686B2 (ja) 2003-09-29 2009-01-14 富士通マイクロエレクトロニクス株式会社 半導体装置の製造方法
US7113256B2 (en) 2004-02-18 2006-09-26 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method with feed-forward focus control
EP1769092A4 (de) 2004-06-29 2008-08-06 Europ Nickel Plc Verbesserte auslaugung von grundmetallen
US7420676B2 (en) * 2004-07-28 2008-09-02 Asml Netherlands B.V. Alignment method, method of measuring front to backside alignment error, method of detecting non-orthogonality, method of calibration, and lithographic apparatus
US7564556B2 (en) * 2007-04-02 2009-07-21 Taiwan Semiconductor Manufacturing Company Method and apparatus for lens contamination control
TWI383273B (zh) * 2007-11-20 2013-01-21 Asml Netherlands Bv 微影投射裝置之焦點測量方法及微影投射裝置之校準方法

Also Published As

Publication number Publication date
KR20090052284A (ko) 2009-05-25
US8289516B2 (en) 2012-10-16
US20130003031A1 (en) 2013-01-03
US20090135389A1 (en) 2009-05-28
EP2063321A2 (de) 2009-05-27
KR100985834B1 (ko) 2010-10-08
TW200933314A (en) 2009-08-01
JP2009152563A (ja) 2009-07-09
US8436998B2 (en) 2013-05-07
EP2063321A3 (de) 2017-07-12
TWI383273B (zh) 2013-01-21
CN101446772A (zh) 2009-06-03
CN101446772B (zh) 2011-02-16

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