SG140520A1 - Vertical type high frequency probe card - Google Patents

Vertical type high frequency probe card

Info

Publication number
SG140520A1
SG140520A1 SG200702127-2A SG2007021272A SG140520A1 SG 140520 A1 SG140520 A1 SG 140520A1 SG 2007021272 A SG2007021272 A SG 2007021272A SG 140520 A1 SG140520 A1 SG 140520A1
Authority
SG
Singapore
Prior art keywords
grounding
probe
signal
circuits
probe card
Prior art date
Application number
SG200702127-2A
Other languages
English (en)
Inventor
Hsin-Hung Lin
Wei-Cheng Ku
Chien-Liang Chen
Shih-Cheng Wu
Ming-Chi Chen
Hendra Sudin
Original Assignee
Mjc Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mjc Probe Inc filed Critical Mjc Probe Inc
Publication of SG140520A1 publication Critical patent/SG140520A1/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG200702127-2A 2006-08-18 2007-03-22 Vertical type high frequency probe card SG140520A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95130518A TW200811444A (en) 2006-08-18 2006-08-18 Vertical high frequency probe card

Publications (1)

Publication Number Publication Date
SG140520A1 true SG140520A1 (en) 2008-03-28

Family

ID=39205053

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200702127-2A SG140520A1 (en) 2006-08-18 2007-03-22 Vertical type high frequency probe card

Country Status (2)

Country Link
SG (1) SG140520A1 (https=)
TW (1) TW200811444A (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI385392B (zh) * 2008-12-12 2013-02-11 High-frequency vertical probe device and its application of high-speed test card
TWI416121B (zh) * 2009-11-04 2013-11-21 Mjc Probe Inc 探針卡
TW201239365A (en) * 2011-03-22 2012-10-01 Mpi Corp High frequency coupling signal adjustment manner and test device thereof
KR102682284B1 (ko) * 2018-08-29 2024-07-10 삼성디스플레이 주식회사 프로브 카드 및 이를 포함하는 테스트 장치
TW202035995A (zh) * 2019-03-18 2020-10-01 旺矽科技股份有限公司 探針裝置
CN112710878B (zh) * 2019-10-24 2024-02-27 台湾中华精测科技股份有限公司 可拆式高频测试装置及其垂直式探针头

Also Published As

Publication number Publication date
TW200811444A (en) 2008-03-01
TWI301543B (https=) 2008-10-01

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