SG115292G - Integrated circuit with a frequency dividing test function - Google Patents

Integrated circuit with a frequency dividing test function

Info

Publication number
SG115292G
SG115292G SG1152/92A SG115292A SG115292G SG 115292 G SG115292 G SG 115292G SG 1152/92 A SG1152/92 A SG 1152/92A SG 115292 A SG115292 A SG 115292A SG 115292 G SG115292 G SG 115292G
Authority
SG
Singapore
Prior art keywords
integrated circuit
frequency dividing
test function
dividing test
function
Prior art date
Application number
SG1152/92A
Other languages
English (en)
Original Assignee
Seikosha Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seikosha Kk filed Critical Seikosha Kk
Publication of SG115292G publication Critical patent/SG115292G/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G04—HOROLOGY
    • G04D—APPARATUS OR TOOLS SPECIALLY DESIGNED FOR MAKING OR MAINTAINING CLOCKS OR WATCHES
    • G04D7/00—Measuring, counting, calibrating, testing or regulating apparatus
    • G04D7/12—Timing devices for clocks or watches for comparing the rate of the oscillating member with a standard
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G04—HOROLOGY
    • G04G—ELECTRONIC TIME-PIECES
    • G04G3/00—Producing timing pulses
    • G04G3/02—Circuits for deriving low frequency timing pulses from pulses of higher frequency

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Electric Clocks (AREA)
SG1152/92A 1986-06-03 1992-11-04 Integrated circuit with a frequency dividing test function SG115292G (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61128967A JPH0752214B2 (ja) 1986-06-03 1986-06-03 分周テスト機能付集積回路

Publications (1)

Publication Number Publication Date
SG115292G true SG115292G (en) 1993-01-29

Family

ID=14997839

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1152/92A SG115292G (en) 1986-06-03 1992-11-04 Integrated circuit with a frequency dividing test function

Country Status (7)

Country Link
US (1) US4801875A (cs)
JP (1) JPH0752214B2 (cs)
KR (1) KR900008604B1 (cs)
DE (1) DE3717292A1 (cs)
GB (1) GB2192466B (cs)
HK (1) HK11393A (cs)
SG (1) SG115292G (cs)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5095267A (en) * 1990-03-19 1992-03-10 National Semiconductor Corporation Method of screening A.C. performance characteristics during D.C. parametric test operation
US5039602A (en) * 1990-03-19 1991-08-13 National Semiconductor Corporation Method of screening A.C. performance characteristics during D.C. parametric test operation
JP2745869B2 (ja) * 1991-07-11 1998-04-28 日本電気株式会社 可変クロック分周回路
JP6304472B2 (ja) * 2013-02-12 2018-04-04 セイコーエプソン株式会社 半導体集積回路、発振器、電子機器、移動体および半導体集積回路の検査方法
US11879939B2 (en) 2022-02-08 2024-01-23 Nxp B.V. System and method for testing clocking systems in integrated circuits

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57201885A (en) * 1981-06-08 1982-12-10 Seiko Instr & Electronics Ltd Electronic circuit

Also Published As

Publication number Publication date
US4801875A (en) 1989-01-31
DE3717292A1 (de) 1987-12-10
GB2192466B (en) 1990-04-25
HK11393A (en) 1993-02-19
GB8707964D0 (en) 1987-05-07
KR880000837A (ko) 1988-03-29
GB2192466A (en) 1988-01-13
JPH0752214B2 (ja) 1995-06-05
KR900008604B1 (ko) 1990-11-26
JPS62285078A (ja) 1987-12-10
DE3717292C2 (cs) 1989-08-17

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