SG11202006479PA - Cantilever probe head and corresponding contact probe - Google Patents
Cantilever probe head and corresponding contact probeInfo
- Publication number
- SG11202006479PA SG11202006479PA SG11202006479PA SG11202006479PA SG11202006479PA SG 11202006479P A SG11202006479P A SG 11202006479PA SG 11202006479P A SG11202006479P A SG 11202006479PA SG 11202006479P A SG11202006479P A SG 11202006479PA SG 11202006479P A SG11202006479P A SG 11202006479PA
- Authority
- SG
- Singapore
- Prior art keywords
- probe
- corresponding contact
- cantilever
- head
- probe head
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06727—Cantilever beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT201800001170A IT201800001170A1 (it) | 2018-01-17 | 2018-01-17 | Testa di misura di tipo cantilever e relativa sonda di contatto |
PCT/EP2019/050837 WO2019141633A1 (en) | 2018-01-17 | 2019-01-14 | Cantilever probe head and corresponding contact probe |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202006479PA true SG11202006479PA (en) | 2020-08-28 |
Family
ID=62044830
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202006479PA SG11202006479PA (en) | 2018-01-17 | 2019-01-14 | Cantilever probe head and corresponding contact probe |
Country Status (10)
Country | Link |
---|---|
US (1) | US11333681B2 (zh) |
EP (1) | EP3740764B1 (zh) |
JP (2) | JP2021512283A (zh) |
KR (1) | KR20200109349A (zh) |
CN (1) | CN111587377B (zh) |
IT (1) | IT201800001170A1 (zh) |
PH (1) | PH12020551091A1 (zh) |
SG (1) | SG11202006479PA (zh) |
TW (1) | TWI815846B (zh) |
WO (1) | WO2019141633A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT201800001173A1 (it) * | 2018-01-17 | 2019-07-17 | Technoprobe Spa | Sonda di contatto di tipo cantilever e relativa testa di misura |
US11719719B2 (en) * | 2021-06-16 | 2023-08-08 | Bruker Nano, Inc. | Metrology probe with built-in angle and method of fabrication thereof |
CN114324988B (zh) * | 2021-07-28 | 2024-03-01 | 苏州联讯仪器股份有限公司 | 探针座 |
JP2023141024A (ja) * | 2022-03-23 | 2023-10-05 | 株式会社日本マイクロニクス | プローブ、プローブ保持装置およびプローブの製造方法 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3094007B2 (ja) * | 1998-06-02 | 2000-10-03 | 日本電子材料株式会社 | プローブ及びこのプローブを用いたプローブカード |
US6917525B2 (en) * | 2001-11-27 | 2005-07-12 | Nanonexus, Inc. | Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
JP3392079B2 (ja) * | 1999-08-09 | 2003-03-31 | 日本電子材料株式会社 | プローブカード |
JP2004294063A (ja) * | 2003-03-25 | 2004-10-21 | Ngk Insulators Ltd | プローブ及びプローブカード |
US6956389B1 (en) * | 2004-08-16 | 2005-10-18 | Jem America Corporation | Highly resilient cantilever spring probe for testing ICs |
TWI263293B (en) * | 2005-09-28 | 2006-10-01 | Star Techn Inc | Probe card for integrated circuits |
JP2007218840A (ja) * | 2006-02-20 | 2007-08-30 | Fujitsu Ltd | プローブ、プローブカード及び検査装置 |
JP5113392B2 (ja) * | 2007-01-22 | 2013-01-09 | 株式会社日本マイクロニクス | プローブおよびそれを用いた電気的接続装置 |
JP5069542B2 (ja) * | 2007-12-03 | 2012-11-07 | 株式会社日本マイクロニクス | プローブカード |
TW201028695A (en) * | 2009-01-22 | 2010-08-01 | King Yuan Electronics Co Ltd | Probe card |
TWI388840B (zh) * | 2009-02-26 | 2013-03-11 | Star Techn Inc | 積體電路測試卡 |
TWI447397B (zh) * | 2010-05-17 | 2014-08-01 | Star Techn Inc | 探針卡 |
CN102692528B (zh) * | 2011-03-24 | 2015-05-13 | 旺矽科技股份有限公司 | 悬臂式探针卡 |
JP6103821B2 (ja) * | 2012-05-29 | 2017-03-29 | 株式会社日本マイクロニクス | 通電試験用プローブ |
JP2014016204A (ja) * | 2012-07-06 | 2014-01-30 | Micronics Japan Co Ltd | 電気的接触子及び電気的接触子の接触方法 |
CN103543304B (zh) * | 2012-07-13 | 2016-05-18 | 旺矽科技股份有限公司 | 高频探针卡 |
ITMI20122023A1 (it) * | 2012-11-28 | 2014-05-29 | Technoprobe Spa | Sonda di contatto a sbalzo [cantilever] per una testa di misura |
JP6360502B2 (ja) * | 2015-07-31 | 2018-07-18 | 日本電子材料株式会社 | プローブカード |
IT201800001173A1 (it) * | 2018-01-17 | 2019-07-17 | Technoprobe Spa | Sonda di contatto di tipo cantilever e relativa testa di misura |
-
2018
- 2018-01-17 IT IT201800001170A patent/IT201800001170A1/it unknown
-
2019
- 2019-01-14 EP EP19700314.8A patent/EP3740764B1/en active Active
- 2019-01-14 JP JP2020539201A patent/JP2021512283A/ja active Pending
- 2019-01-14 SG SG11202006479PA patent/SG11202006479PA/en unknown
- 2019-01-14 CN CN201980008173.9A patent/CN111587377B/zh active Active
- 2019-01-14 WO PCT/EP2019/050837 patent/WO2019141633A1/en active Search and Examination
- 2019-01-14 KR KR1020207023513A patent/KR20200109349A/ko not_active Application Discontinuation
- 2019-01-14 TW TW108101404A patent/TWI815846B/zh active
-
2020
- 2020-07-08 PH PH12020551091A patent/PH12020551091A1/en unknown
- 2020-07-16 US US16/931,183 patent/US11333681B2/en active Active
-
2023
- 2023-09-22 JP JP2023159086A patent/JP2023169352A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2019141633A1 (en) | 2019-07-25 |
TW201932848A (zh) | 2019-08-16 |
TWI815846B (zh) | 2023-09-21 |
JP2023169352A (ja) | 2023-11-29 |
CN111587377A (zh) | 2020-08-25 |
EP3740764A1 (en) | 2020-11-25 |
PH12020551091A1 (en) | 2021-09-06 |
US20200348336A1 (en) | 2020-11-05 |
EP3740764B1 (en) | 2022-08-10 |
CN111587377B (zh) | 2023-07-14 |
JP2021512283A (ja) | 2021-05-13 |
US11333681B2 (en) | 2022-05-17 |
IT201800001170A1 (it) | 2019-07-17 |
KR20200109349A (ko) | 2020-09-22 |
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