SG11202000654VA - Contact probe and probe unit - Google Patents

Contact probe and probe unit

Info

Publication number
SG11202000654VA
SG11202000654VA SG11202000654VA SG11202000654VA SG11202000654VA SG 11202000654V A SG11202000654V A SG 11202000654VA SG 11202000654V A SG11202000654V A SG 11202000654VA SG 11202000654V A SG11202000654V A SG 11202000654VA SG 11202000654V A SG11202000654V A SG 11202000654VA
Authority
SG
Singapore
Prior art keywords
probe
contact
unit
probe unit
contact probe
Prior art date
Application number
SG11202000654VA
Inventor
Kohei Hironaka
Kazuya Soma
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of SG11202000654VA publication Critical patent/SG11202000654VA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG11202000654VA 2017-07-28 2018-07-26 Contact probe and probe unit SG11202000654VA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017146975 2017-07-28
PCT/JP2018/028136 WO2019022204A1 (en) 2017-07-28 2018-07-26 Contact probe and probe unit

Publications (1)

Publication Number Publication Date
SG11202000654VA true SG11202000654VA (en) 2020-02-27

Family

ID=65041112

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202000654VA SG11202000654VA (en) 2017-07-28 2018-07-26 Contact probe and probe unit

Country Status (7)

Country Link
US (2) US11422156B2 (en)
JP (1) JP7413018B2 (en)
CN (1) CN110945366B (en)
PH (1) PH12020500161A1 (en)
SG (1) SG11202000654VA (en)
TW (1) TWI712801B (en)
WO (1) WO2019022204A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019022204A1 (en) * 2017-07-28 2019-01-31 日本発條株式会社 Contact probe and probe unit
KR101954086B1 (en) 2017-11-07 2019-03-06 리노공업주식회사 A test probe assembly and test socket
WO2020175346A1 (en) * 2019-02-27 2020-09-03 株式会社村田製作所 Probe member, and inspection structure for connector
JP7134904B2 (en) * 2019-03-13 2022-09-12 日本発條株式会社 Contact probe and signal transmission method
KR20220136403A (en) * 2020-03-24 2022-10-07 닛폰 하츠죠 가부시키가이샤 probe unit
US20220043029A1 (en) * 2020-08-10 2022-02-10 Xcerra Corporation Coaxial probe

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0615105B2 (en) * 1983-10-07 1994-03-02 三菱電機株式会社 Short circuit transfer arc welder
JPS6082271U (en) * 1983-11-09 1985-06-07 株式会社アドバンテスト coaxial probe contact
WO1999004274A1 (en) * 1997-07-14 1999-01-28 Nhk Spring Co., Ltd. Conductive contact
EP1209777B1 (en) * 1999-07-28 2004-06-09 Sumitomo Wiring Systems, Ltd. A wire insertion detection jig
US6902416B2 (en) * 2002-08-29 2005-06-07 3M Innovative Properties Company High density probe device
JP4251855B2 (en) * 2002-11-19 2009-04-08 株式会社ヨコオ Manufacturing method of inspection jigs for high frequency and high speed devices
KR100449204B1 (en) * 2002-11-25 2004-09-18 리노공업주식회사 Air Interface Apparatus for Use in High Frequency Probe
JP2005009925A (en) * 2003-06-17 2005-01-13 Tesu Hanbai Kk Spring probe
JP4270967B2 (en) 2003-08-20 2009-06-03 日野自動車株式会社 Engine breather equipment
JP2005127891A (en) * 2003-10-24 2005-05-19 Yokowo Co Ltd Inductor loaded inspecting probe
JP2010197402A (en) 2003-11-05 2010-09-09 Nhk Spring Co Ltd Conductive-contact holder and conductive-contact unit
JP4689196B2 (en) * 2003-11-05 2011-05-25 日本発條株式会社 Conductive contact holder, conductive contact unit
JP4535828B2 (en) * 2004-09-30 2010-09-01 株式会社ヨコオ Inspection unit manufacturing method
JP2007178163A (en) * 2005-12-27 2007-07-12 Yokowo Co Ltd Inspection unit and outer sheath tube assembly for inspection probe used for it
JP4916717B2 (en) 2005-12-27 2012-04-18 日本発條株式会社 Conductive contact holder and conductive contact unit
US7740508B2 (en) * 2008-09-08 2010-06-22 3M Innovative Properties Company Probe block assembly
JP5597108B2 (en) * 2010-11-29 2014-10-01 株式会社精研 Contact inspection jig
JP6082271B2 (en) 2013-02-22 2017-02-15 ミサワホーム株式会社 Home energy management system
JP6436711B2 (en) 2014-10-01 2018-12-12 日本発條株式会社 Probe unit
JP6475479B2 (en) * 2014-11-27 2019-02-27 株式会社ヨコオ Inspection unit
JP6625869B2 (en) * 2015-11-18 2019-12-25 株式会社日本マイクロニクス Inspection probe and probe card
WO2019022204A1 (en) * 2017-07-28 2019-01-31 日本発條株式会社 Contact probe and probe unit

Also Published As

Publication number Publication date
CN110945366B (en) 2022-08-30
TWI712801B (en) 2020-12-11
US20210156887A1 (en) 2021-05-27
CN110945366A (en) 2020-03-31
PH12020500161A1 (en) 2020-09-14
TW201910782A (en) 2019-03-16
JPWO2019022204A1 (en) 2020-05-28
US11656246B2 (en) 2023-05-23
US20220317155A1 (en) 2022-10-06
JP7413018B2 (en) 2024-01-15
WO2019022204A1 (en) 2019-01-31
US11422156B2 (en) 2022-08-23

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