SG11201902745RA - Optimizing training sets used for setting up inspection-related algorithms - Google Patents
Optimizing training sets used for setting up inspection-related algorithmsInfo
- Publication number
- SG11201902745RA SG11201902745RA SG11201902745RA SG11201902745RA SG11201902745RA SG 11201902745R A SG11201902745R A SG 11201902745RA SG 11201902745R A SG11201902745R A SG 11201902745RA SG 11201902745R A SG11201902745R A SG 11201902745RA SG 11201902745R A SG11201902745R A SG 11201902745RA
- Authority
- SG
- Singapore
- Prior art keywords
- inspection
- algorithm
- international
- california
- defects
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N5/00—Computing arrangements using knowledge-based models
- G06N5/01—Dynamic search techniques; Heuristics; Dynamic trees; Branch-and-bound
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/24—Optical enhancement of defects or not directly visible states, e.g. selective electrolytic deposition, bubbles in liquids, light emission, colour change
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/26—Acting in response to an ongoing measurement without interruption of processing, e.g. endpoint detection, in-situ thickness measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95676—Masks, reticles, shadow masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Software Systems (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Evolutionary Computation (AREA)
- Artificial Intelligence (AREA)
- General Engineering & Computer Science (AREA)
- Computing Systems (AREA)
- Data Mining & Analysis (AREA)
- Mathematical Physics (AREA)
- Medical Informatics (AREA)
- Signal Processing (AREA)
- Computational Linguistics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Analysis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Complex Calculations (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IN201641035490 | 2016-10-17 | ||
US201762477248P | 2017-03-27 | 2017-03-27 | |
US15/782,820 US10267748B2 (en) | 2016-10-17 | 2017-10-12 | Optimizing training sets used for setting up inspection-related algorithms |
PCT/US2017/057029 WO2018075547A1 (en) | 2016-10-17 | 2017-10-17 | Optimizing training sets used for setting up inspection-related algorithms |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201902745RA true SG11201902745RA (en) | 2019-05-30 |
Family
ID=66656811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201902745RA SG11201902745RA (en) | 2016-10-17 | 2017-10-17 | Optimizing training sets used for setting up inspection-related algorithms |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP6833027B2 (zh) |
KR (1) | KR102293789B1 (zh) |
CN (1) | CN109844919B (zh) |
IL (1) | IL265744B (zh) |
SG (1) | SG11201902745RA (zh) |
TW (1) | TWI752100B (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10677586B2 (en) * | 2018-07-27 | 2020-06-09 | Kla-Tencor Corporation | Phase revealing optical and X-ray semiconductor metrology |
US11468553B2 (en) * | 2018-11-02 | 2022-10-11 | Kla Corporation | System and method for determining type and size of defects on blank reticles |
WO2020166076A1 (ja) * | 2019-02-15 | 2020-08-20 | 株式会社日立ハイテク | 構造推定システム、構造推定プログラム |
TWI694250B (zh) * | 2019-03-20 | 2020-05-21 | 英業達股份有限公司 | 表面缺陷偵測系統及其方法 |
US20230175981A1 (en) * | 2020-06-12 | 2023-06-08 | Hitachi High-Tech Corporation | Method for Defect Inspection, System, and Computer-Readable Medium |
KR102203222B1 (ko) * | 2020-10-08 | 2021-01-14 | (주)이랑텍 | Ai 학습 기반 rf 필터 자동 튜닝 시스템 및 방법 |
CN116344378B (zh) * | 2023-03-31 | 2024-01-23 | 江苏神州新能源电力有限公司 | 一种光伏板生产用智能检测系统及其检测方法 |
CN116666248B (zh) * | 2023-07-26 | 2023-11-17 | 北京象帝先计算技术有限公司 | 测试结果异常确定方法、装置、电子设备及可读存储介质 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7061601B2 (en) * | 1999-07-02 | 2006-06-13 | Kla-Tencor Technologies Corporation | System and method for double sided optical inspection of thin film disks or wafers |
JP4908995B2 (ja) * | 2006-09-27 | 2012-04-04 | 株式会社日立ハイテクノロジーズ | 欠陥分類方法及びその装置並びに欠陥検査装置 |
US10043264B2 (en) * | 2012-04-19 | 2018-08-07 | Applied Materials Israel Ltd. | Integration of automatic and manual defect classification |
US8948494B2 (en) * | 2012-11-12 | 2015-02-03 | Kla-Tencor Corp. | Unbiased wafer defect samples |
TWI525317B (zh) | 2013-10-08 | 2016-03-11 | 國立清華大學 | 整合影像分析與資料挖礦之自動光學檢測缺陷影像分類方法 |
US9518932B2 (en) * | 2013-11-06 | 2016-12-13 | Kla-Tencor Corp. | Metrology optimized inspection |
US9613411B2 (en) * | 2014-03-17 | 2017-04-04 | Kla-Tencor Corp. | Creating defect classifiers and nuisance filters |
US9286675B1 (en) * | 2014-10-23 | 2016-03-15 | Applied Materials Israel Ltd. | Iterative defect filtering process |
US10012599B2 (en) * | 2015-04-03 | 2018-07-03 | Kla-Tencor Corp. | Optical die to database inspection |
CN106409711B (zh) * | 2016-09-12 | 2019-03-12 | 佛山市南海区广工大数控装备协同创新研究院 | 一种太阳能硅晶片缺陷检测系统及方法 |
-
2017
- 2017-10-17 CN CN201780063543.XA patent/CN109844919B/zh active Active
- 2017-10-17 KR KR1020197013523A patent/KR102293789B1/ko active IP Right Grant
- 2017-10-17 JP JP2019520517A patent/JP6833027B2/ja active Active
- 2017-10-17 TW TW106135435A patent/TWI752100B/zh active
- 2017-10-17 SG SG11201902745RA patent/SG11201902745RA/en unknown
-
2019
- 2019-04-01 IL IL265744A patent/IL265744B/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR102293789B1 (ko) | 2021-08-24 |
JP6833027B2 (ja) | 2021-02-24 |
KR20190057402A (ko) | 2019-05-28 |
IL265744B (en) | 2021-06-30 |
JP2020500422A (ja) | 2020-01-09 |
CN109844919A (zh) | 2019-06-04 |
TW201825883A (zh) | 2018-07-16 |
CN109844919B (zh) | 2020-12-11 |
TWI752100B (zh) | 2022-01-11 |
IL265744A (en) | 2019-06-30 |
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