SG11201706456WA - Device and vision inspection method - Google Patents

Device and vision inspection method

Info

Publication number
SG11201706456WA
SG11201706456WA SG11201706456WA SG11201706456WA SG11201706456WA SG 11201706456W A SG11201706456W A SG 11201706456WA SG 11201706456W A SG11201706456W A SG 11201706456WA SG 11201706456W A SG11201706456W A SG 11201706456WA SG 11201706456W A SG11201706456W A SG 11201706456WA
Authority
SG
Singapore
Prior art keywords
inspection method
vision inspection
vision
inspection
Prior art date
Application number
SG11201706456WA
Inventor
Hong Jun You
Kyeong Hwan Baek
Sung Ha Jang
Original Assignee
Jt Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020150191013A external-priority patent/KR102059140B1/en
Priority claimed from KR1020150191078A external-priority patent/KR102059139B1/en
Application filed by Jt Corp filed Critical Jt Corp
Priority claimed from PCT/KR2016/001243 external-priority patent/WO2016129870A1/en
Publication of SG11201706456WA publication Critical patent/SG11201706456WA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
SG11201706456WA 2015-02-10 2016-02-04 Device and vision inspection method SG11201706456WA (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR20150020102 2015-02-10
KR1020150191013A KR102059140B1 (en) 2015-02-10 2015-12-31 Device handler, and vision inspection method
KR1020150191078A KR102059139B1 (en) 2015-12-31 2015-12-31 Vision inspection method
PCT/KR2016/001243 WO2016129870A1 (en) 2015-02-10 2016-02-04 Component handler and vision inspection method

Publications (1)

Publication Number Publication Date
SG11201706456WA true SG11201706456WA (en) 2017-09-28

Family

ID=57850633

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201706456WA SG11201706456WA (en) 2015-02-10 2016-02-04 Device and vision inspection method

Country Status (3)

Country Link
CN (1) CN107209128B (en)
SG (1) SG11201706456WA (en)
TW (1) TWI624660B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113160112B (en) * 2020-12-30 2024-02-02 苏州特文思达科技有限公司 Intelligent recognition and detection method for steel grating products based on machine learning

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000074845A (en) * 1998-08-27 2000-03-14 Fujitsu Ltd Bump inspection method and bump inspection device
KR20010108632A (en) * 2000-05-30 2001-12-08 한종훈 Apparatus and Method for Inspecting Solder Ball of Semiconductor Device
CN101484917A (en) * 2006-06-30 2009-07-15 Pnn医疗公司 Method of identification of an element in two or more images
KR100869539B1 (en) * 2007-04-13 2008-11-19 (주)제이티 Apparatus for inspecting semiconductor
KR101012139B1 (en) * 2008-12-31 2011-02-07 (주)제이티 Vision inspection apparatus
KR101134985B1 (en) * 2009-03-05 2012-04-09 (주)제이티 Vision inspection apparatus
KR101133188B1 (en) * 2009-03-27 2012-04-09 (주)제이티 Sorting Apparatus for Semiconductor Device and Sorting Method for the Same
KR101108672B1 (en) * 2009-05-12 2012-01-25 (주)제이티 Vision inspection apparatus and vision inspection method therefor
KR101454319B1 (en) * 2010-05-10 2014-10-28 한미반도체 주식회사 Singulation Apparatus for Manufacturing Semiconductor Packages
KR101273094B1 (en) * 2011-01-28 2013-06-17 한국과학기술원 The measurement method of PCB bump height by using three dimensional shape detector using optical triangulation method
KR102046080B1 (en) * 2012-08-14 2019-11-18 (주)제이티 Device Handler
WO2016129870A1 (en) * 2015-02-10 2016-08-18 (주)제이티 Component handler and vision inspection method

Also Published As

Publication number Publication date
CN107209128A (en) 2017-09-26
TWI624660B (en) 2018-05-21
TW201640097A (en) 2016-11-16
CN107209128B (en) 2021-03-09

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